CN114675121A - Automatic batch testing device for chip capacitors and using method - Google Patents
Automatic batch testing device for chip capacitors and using method Download PDFInfo
- Publication number
- CN114675121A CN114675121A CN202210430208.1A CN202210430208A CN114675121A CN 114675121 A CN114675121 A CN 114675121A CN 202210430208 A CN202210430208 A CN 202210430208A CN 114675121 A CN114675121 A CN 114675121A
- Authority
- CN
- China
- Prior art keywords
- testing
- test
- sliding rail
- capacitor
- stacking
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
- G01R31/016—Testing of capacitors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention discloses an automatic batch testing device for chip capacitors and a using method thereof, the device comprises a console, wherein the middle part of the console top is longitudinally provided with a first sliding rail, a second sliding rail is transversely arranged above the first sliding rail, the first sliding rail is slidably connected with a tray and used for placing a capacitor testing board, the second sliding rail is slidably connected with a sliding block, the outer side of the sliding block is provided with a third sliding rail, the third sliding rail is slidably connected with a testing end, the testing end is connected with a testing instrument through a lead, and the testing instrument is electrically connected with a computer; the tray, the sliding block and the test end are driven by a motor to move longitudinally, transversely and vertically respectively, and the motor is connected with a computer. When the stacking test device is used, a stacking statement is set through a computer, an arch-shaped trigger position is formulated, the operation test contact reaches a stacking starting point and sends an in-place signal, the test is started, a stacking point which runs out is set according to the stacking, and the test is completed. The invention improves the detection efficiency of the small-volume chip capacitor and realizes the automatic and batch test of the chip capacitor.
Description
Technical Field
The invention belongs to the technical field of capacitor testing, and particularly relates to an automatic batch testing device for chip capacitors and a using method of the automatic batch testing device.
Background
With the rapid development of electronic science and technology, the capacitor is also more and more precise in manufacturing and smaller in size. The detection of present chip capacitor correlation parameter still presss from both sides through artifical a slice ground clamp and gets the condenser and detect, because the detection volume is big, not only wastes time and energy, the operation requirement is high, and detection efficiency is low moreover, is difficult to satisfy automatic test, high detection ability's demand. Therefore, it is necessary to research an automatic batch testing apparatus for chip capacitors to realize automatic, batch and fast testing of parameters related to capacitors and to improve production efficiency.
Disclosure of Invention
The invention aims to provide an automatic batch testing device for chip capacitors and a using method thereof, which improve the automatic testing capability of the existing chip capacitors and realize automatic, batch and quick detection of the chip capacitors.
The technical scheme adopted by the invention is that the automatic batch testing device for the chip capacitors comprises a console, a testing instrument, a testing end and a computer, wherein a first sliding rail is longitudinally arranged in the middle of the console surface, a second sliding rail is transversely arranged above the first sliding rail through a support, a tray is slidably connected on the first sliding rail and used for placing a capacitor testing board, a sliding block is slidably connected on the second sliding rail, a third sliding rail is arranged on the outer side of the sliding block, the third sliding rail is slidably connected with the testing end, the testing end is connected with the testing instrument through a lead, and the testing instrument is electrically connected with the computer; the tray, the sliding block and the test end are driven by a motor to move longitudinally, transversely and vertically respectively, and the motor is connected with a computer.
The computer system controls the first sliding rail, the second sliding rail and the third sliding rail to cooperatively move, and the test end is moved to a corresponding test station, so that the test end is automatically connected with the capacitor to be tested, and the automatic test of the capacitor is completed.
Preferably, a plurality of testing stations are arranged on the capacitor testing board in a matrix manner, each testing station comprises a placing area and a contact area, the size of each placing area is matched with that of a capacitor, the contact areas are arranged on two sides of each placing area, copper sheets are arranged at the bottoms of two ends of each placing area and correspond to capacitor pole plates, and the copper sheets extend to the contact areas; the chip capacitors are convenient to place in batches, and the copper sheets are arranged in the placing area and the contact area, so that the contact area between the testing end and the capacitor pole plate to be tested is increased, and the connection stability is improved.
Preferably, the testing end comprises a connecting plate, a connector and a testing contact, the upper part of the connecting plate is connected with the third sliding rail, the connector is installed at the bottom of the connecting plate, and the testing contact is arranged downwards in the middle of the connector; the connecting plate, the connector and the test contact are detachably and fixedly connected, so that maintenance and part replacement are facilitated, and resource conservation is facilitated.
Preferably, the test contacts are distributed in a triangular shape corresponding to the test stations, and the top ends of the two test contacts corresponding to the contact area are connected with the lead; the electric connection between the test contact and the capacitor plate to be tested is ensured.
Preferably, the connecting plate is L-shaped and comprises a bottom plate and a side plate, the upper part of the side plate is connected with the third sliding rail, the lower part of the side plate is provided with a wire guide hole, the bottom plate is positioned below the sliding block and is spaced from the sliding block by a preset distance, and the bottom plate is provided with a mounting hole; the wires appear through the wire guide hole from the bottom plate top for device compact structure, the operation is smooth and easy.
Preferably, the connector is in a boss shape, the upper part of the connector is matched with the mounting hole, the upper part of the connector is hollow, the top end of the connector is provided with an opening, and the upper part of the connector extends to the upper part of the bottom plate through the mounting hole and the rear lower part of the connector is connected with the bottom plate through a screw; the boss-shaped connector is convenient for directly being connected with the bottom plate, the upper part of the boss-shaped connector is hollow, after the boss-shaped connector is connected with the bottom plate, the upper part of the boss-shaped connector protects the connection of the test contact and the wire, the wire is prevented from being interfered and influenced, the connection stability is guaranteed, and the arrangement of the wire is facilitated.
Preferably, the matching capacitor test board in the middle of the tray is provided with a groove, two sides of the groove are respectively provided with a notch, a rotating part is arranged between two ends of the notch and the groove, and the capacitor test board is clamped and fixed with the tray through the groove; the manual hand can conveniently fix the capacitor test board on the tray and take down the capacitor test board directly through the notch.
The use method of the automatic batch testing device for the chip capacitors comprises the following procedures:
s1: setting a stacking statement through computer software, and setting the row number and the column number of a test station matrix;
s2: setting the stacking stroke number and designating a stacking priority shaft;
s3: setting a stacking starting point and a stacking interval, formulating an arch-shaped trigger position, and preparing to operate;
s4: running the test contact to reach the stacking starting point and sending a position signal to start testing;
s5: and (4) setting a finished stacking point according to stacking to finish the test.
Preferably, when the test data is zero or exceeds a set threshold range, each slide rail on the console executes a reset operation command to stop the test and return to the original position.
Compared with the prior art, the invention has the beneficial effects that:
1) through the arrangement of the first sliding rail, the second sliding rail and the third sliding rail and the control of a computer system, the testing end and the capacitor testing board move cooperatively, so that the testing contact is correspondingly connected with a plurality of capacitors to be tested, the testing is completed, the detection efficiency of small-volume chip capacitors is improved, and the automatic and batch testing of the chip capacitors is realized;
2) the tray is arranged on the first sliding rail and used for placing a capacitor test board provided with a plurality of stations to be tested, and a placing area and a contact area are respectively arranged on each station to be tested, so that not only is the placement of a capacitor convenient, but also the contact stability of a capacitor pole plate and a test end is ensured, the monitoring efficiency is effectively improved, and meanwhile, the accuracy of a test result is ensured;
3) the testing end is formed by connecting a connecting plate, a connector and testing contacts, so that the assembly, disassembly, maintenance and replacement are convenient, the upper part of the connector adopts a hollow boss structure, the connection between the testing contacts and the conducting wire is protected from being interfered, the electric connectivity is stable and reliable, in addition, the contacts adopt triangular distribution, the arrangement corresponding to a testing station is realized, one of the testing contacts is used for pressing and fixing a capacitor to be tested, and the effective and reliable testing result is ensured;
4) the tray is simple in structure, the capacitor test board is limited to be fixed in the groove, the capacitor is prevented from being shifted, and the capacitor test board is convenient to take and place due to the design of the notches at the two ends.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic diagram of a capacitor test board structure according to the present invention;
FIG. 3 is a schematic diagram of a testing end structure according to the present invention;
FIG. 4 is a schematic view of a connector structure according to the present invention;
FIG. 5 is a schematic view of a tray structure according to the present invention;
FIG. 6 is a flow chart of the present invention;
the labels in the figure are: 1. the device comprises a control console, 2, a test instrument, 3, a test end, 301, a connecting plate, 3011, a wire guide hole, 302, a connector, 303, a test contact, 4, a computer, 5, a first sliding rail, 6, a support, 7, a second sliding rail, 8, a tray, 801, a groove, 802, a notch, 803, a rotary part, 9, a capacitor test board, 901, a placement area, 902, a contact area, 10, a slider, 11 and a third slider.
Detailed Description
The invention will be further explained in conjunction with the drawings attached to the specification in order to facilitate better understanding by those skilled in the art.
Example 1
As shown in fig. 1-5, an automatic batch testing device for chip capacitors comprises a console 1, a testing instrument 2, a testing end 3 and a computer 4, wherein a first sliding rail 5 is longitudinally arranged in the middle of the console 1, a second sliding rail 7 is transversely arranged above the first sliding rail 5 through a support 6, the second sliding rail 7 is perpendicular to the first sliding rail 5, a tray 8 is slidably connected onto the first sliding rail 5 and used for placing a capacitor testing board 9, and the capacitor testing board 9 is provided with a plurality of testing stations arranged in a matrix and used for placing capacitors to be tested. A sliding block 10 is connected on the second sliding rail 7 in a sliding manner, a third sliding rail 11 is arranged on the outer side of the sliding block 10, the third sliding rail 11 is connected with a testing end 3 in a sliding manner, the testing end 3 is connected with a testing instrument 2 through a lead, and the testing instrument 2 is electrically connected with a computer 4; the tray 8, the slider 10 and the test end 3 are driven by a motor to move longitudinally, transversely and vertically respectively, the motor is connected with the computer 4, the computer system controls the first sliding rail 5, the second sliding rail 7 and the third sliding rail 11 to move cooperatively, and the test end 3 is moved to a corresponding test station, so that the test end 3 is electrically connected with a polar plate of a capacitor to be tested, and the automatic test of the capacitor is completed. Because the stations to be tested are arranged in a matrix, the test end 3 and the tray 8 are driven by the second sliding rail 7, the third sliding rail 11 and the first sliding rail 5 respectively to correspondingly move transversely, vertically and longitudinally, so that the test end 3 is sequentially connected with the capacitor on each station to be tested, and rapid batch test is realized.
The test station comprises a placing area 901 and a contact area 902, the placing area 901 is matched with a capacitor in size, a chip capacitor can be conveniently and directly placed, the contact area 902 is arranged on two sides of the placing area 901, copper sheets are arranged at the bottoms of two ends of the placing area 901 corresponding to the capacitor pole plates and extend to the contact area 902, the contact area between the test end 3 and the capacitor pole plates to be tested can be increased, and the connection stability can be improved.
The testing end 3 comprises a connecting plate 301, a connector 302 and a testing contact 303, the upper part of the connecting plate 301 is connected with the third sliding rail 11, the connector 302 is installed at the bottom, and the testing contact 303 is arranged downwards in the middle of the connector 302; the connecting plate 301, the connector 302 and the test contact 303 are detachably and fixedly connected, so that maintenance and part replacement are facilitated, and resource saving is facilitated.
Specifically, the test contacts 303 are distributed in a triangular manner corresponding to the test stations, the top ends of the two test contacts 303 corresponding to the contact area 902 are connected with the lead, the two test contacts 303 are used for electrically connecting the copper sheet, so that the electrical connection between the test contacts 303 and the pole plates of the capacitor to be tested is ensured, the test of the capacitor is completed, and the other test contact 303 is used for fixing the capacitor to be tested, so that the test result is prevented from being influenced by the deviation in the test process.
The connecting plate 301 is L-shaped and comprises a bottom plate and side plates, the upper portions of the side plates are connected with the third sliding rails 11, the lower portions of the side plates are provided with wire holes 3011, the bottom plate is located below the sliding blocks 10 and is spaced from the sliding blocks 10 at a preset distance, the bottom plate is provided with mounting openings, and wires are led out from the upper portions of the bottom plate through the wire holes 3011, so that the device is compact in structure and smooth in operation.
The connector 302 is in a boss shape, the upper part of the connector 302 is matched with the mounting opening, the upper part of the connector 302 is hollow, the top end of the connector is provided with an opening, and the upper part of the connector 302 extends to the upper part of the bottom plate through the mounting opening and the rear lower part of the connector is connected with the bottom plate through screws; the boss-shaped connector 302 is convenient for being directly connected with the bottom plate, the upper part of the boss-shaped connector is hollow, after the boss-shaped connector is connected with the bottom plate, the upper part protection test contact 303 is connected with the wire, the wire is prevented from being interfered to influence the connection stability, and the arrangement of the wire is facilitated.
Tray 8 middle part matching capacitor tests board is equipped with recess 801, and notch 802 is seted up respectively to recess 801 both sides, is equipped with gyration portion 803 between notch 802 both ends and the recess 801, and the capacitor tests board 9 passes through recess 801 and tray 8 block is fixed, and gyration portion 803 is fixed capacitor tests board 9 in recess 801, prevents the skew, directly fixes capacitor tests board 9 on tray 8 and takes off through notch 802 convenient to the staff.
Example 2
The use method of the automatic batch testing device for the chip capacitors comprises the following procedures:
s1: setting a stacking statement through computer software, and setting the row number and the column number of a test station matrix;
s2: setting the stacking stroke number and designating a stacking priority shaft;
s3: setting a stacking starting point and a stacking interval, formulating an arch-shaped trigger position, and preparing to operate;
s4: running the test contact to reach the stacking starting point and sending a position signal to start testing;
s5: and (4) setting a finished stacking point according to stacking to finish the test.
Preferably, when the test data is zero or exceeds a set threshold range, each slide rail on the console executes a reset operation command to stop the test and return to the original position.
Claims (9)
1. The automatic batch testing device for the chip capacitors is characterized by comprising a control console (1), a testing instrument (2), a testing end (3) and a computer (4), wherein a first sliding rail (5) is longitudinally arranged in the middle of the table top of the control console (1), a second sliding rail (7) is transversely arranged above the first sliding rail (5) through a support (6), the first sliding rail (5) is connected with a tray (8) in a sliding mode and used for placing a capacitor testing plate (9), a sliding block (10) is connected on the second sliding rail (7) in a sliding mode, a third sliding rail (11) is arranged on the outer side of the sliding block (10), the third sliding rail (11) is connected with the testing end (3) in a sliding mode, the testing end (3) is connected with the testing instrument (2) through a conducting wire, and the testing instrument (2) is electrically connected with the computer (4); the tray (8), the sliding block (10) and the testing end (3) are driven by a motor to move longitudinally, transversely and vertically respectively, and the motor is connected with the computer (4).
2. The automatic batch test device for the chip capacitor as claimed in claim 1, wherein the capacitor test board (9) is provided with a plurality of test stations arranged in a matrix, each test station comprises a placement area (901) and a contact area (902), the placement area (901) is matched with the capacitor in size, the contact areas (902) are arranged on two sides of the placement area (901), the bottoms of two ends of the placement area (901) are provided with copper sheets corresponding to capacitor plates, and the copper sheets extend to the contact areas (902).
3. The automatic batch testing device for the chip capacitor as claimed in claim 2, wherein the testing terminal (3) comprises a connecting plate (301), a connector (302) and a testing contact (303), the upper part of the connecting plate (301) is connected with the third sliding rail (11), the connector (302) is installed at the bottom, and the testing contact (303) is arranged downwards in the middle of the connector (302).
4. The automatic batch test device for chip capacitors as claimed in claim 3, wherein the test contacts (303) are distributed in a triangular shape corresponding to the test stations, and the top ends of the two test contacts (303) corresponding to the contact area (902) are connected with wires.
5. The automatic batch test device for the chip capacitor as claimed in claim 3, wherein the connecting plate (301) is L-shaped and comprises a bottom plate and a side plate, the upper part of the side plate is connected with the third sliding rail (11), the lower part of the side plate is provided with a wire guide hole (3011), the bottom plate is positioned below the sliding block (11) and is spaced from the sliding block (11) by a preset distance, and the bottom plate is provided with a mounting hole.
6. The automatic batch test device for chip capacitors as claimed in claim 5, wherein the connector (302) is in the shape of a boss, the upper portion of the connector (302) is matched with the mounting opening, the upper portion of the connector (302) is hollow, the top end of the connector is provided with an opening, and the upper portion of the connector (302) extends to the upper portion of the bottom plate through the mounting opening and then the lower portion of the connector extends to the lower portion of the bottom plate and is connected with the bottom plate through screws.
7. The automatic batch testing device for the chip capacitors as claimed in claim 1, wherein the matching capacitor testing board (9) in the middle of the tray (8) is provided with a groove (801), two sides of the groove (801) are respectively provided with a notch (802), a rotating part (803) is arranged between two ends of the notch (802) and the groove (801), and the capacitor testing board (9) is clamped and fixed with the tray (8) through the groove (801).
8. The use method of the automatic batch test device for chip capacitors as claimed in any one of claims 1 to 7, characterized by comprising the following procedures:
s1: setting a stacking statement through computer software, and setting the row number and the column number of a test station matrix;
s2: setting the stacking stroke number and designating a stacking priority shaft;
s3: setting a stacking starting point and a stacking interval, formulating an arch-shaped trigger position, and preparing to operate;
s4: running the test contact to reach the stacking starting point and sending a position signal to start testing;
s5: and (4) setting a finished stacking point according to stacking to finish the test.
9. The use of the device for automatic batch testing of chip capacitors as claimed in, wherein when the test data is zero or exceeds a set threshold range, each slide rail on the console executes a reset operation command to stop the test and return to the original position.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210430208.1A CN114675121A (en) | 2022-04-22 | 2022-04-22 | Automatic batch testing device for chip capacitors and using method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210430208.1A CN114675121A (en) | 2022-04-22 | 2022-04-22 | Automatic batch testing device for chip capacitors and using method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114675121A true CN114675121A (en) | 2022-06-28 |
Family
ID=82081065
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210430208.1A Pending CN114675121A (en) | 2022-04-22 | 2022-04-22 | Automatic batch testing device for chip capacitors and using method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114675121A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116679183A (en) * | 2023-08-03 | 2023-09-01 | 深圳市诺泰芯装备有限公司 | IGBT product testing method and device |
-
2022
- 2022-04-22 CN CN202210430208.1A patent/CN114675121A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116679183A (en) * | 2023-08-03 | 2023-09-01 | 深圳市诺泰芯装备有限公司 | IGBT product testing method and device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN205958695U (en) | Novel PCB board automatic testing machine of structure | |
| CN114675121A (en) | Automatic batch testing device for chip capacitors and using method | |
| CN203929909U (en) | Transformer voltage-withstand test mechanism | |
| CN207992412U (en) | A kind of phone charger test system | |
| CN207992345U (en) | A kind of phone charger test equipment | |
| CN211627683U (en) | Automatic test system for contact resistance curve of bipolar plate of fuel cell | |
| CN209198614U (en) | A kind of Novel circuit board test fixture | |
| CN207992346U (en) | A kind of phone charger test device | |
| CN215833511U (en) | A general device that bears for test of paster components and parts electrical performance | |
| CN113358935B (en) | Capacitance testing device | |
| CN211965047U (en) | Device for rapidly detecting height of rotor | |
| CN108646133B (en) | Manufacturing method of wiring device for detecting polarity of current transformer | |
| CN212364516U (en) | Test fixture of simulation circuit board of encapsulation all around | |
| CN210181163U (en) | Novel wisdom household electrical appliances AI chip test device | |
| CN109445415B (en) | Precision testing equipment for P L C input/output channel | |
| CN220207703U (en) | Detection device for circuit board production | |
| CN112034256A (en) | Coil testing device | |
| CN217238349U (en) | Automatic test station switching device for transformer test | |
| CN206161683U (en) | Strong adaptability's circuit board short circuit test platform | |
| CN212872775U (en) | IC testing device | |
| CN218272572U (en) | Automatic test equipment for interelectrode voltage resistance of PTC heating module of new energy automobile | |
| CN213875929U (en) | PCB testing device | |
| CN211905614U (en) | Automatic test equipment and detection device thereof | |
| CN218848207U (en) | Electricity core and protection shield test fixture | |
| CN215005751U (en) | Circuit board voltage-withstand test frame and circuit board voltage-withstand test device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |