CN113984895A - Intelligent ultrasonic flaw detector and probe adjusting method thereof - Google Patents
Intelligent ultrasonic flaw detector and probe adjusting method thereof Download PDFInfo
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Abstract
The invention relates to the technical field of ultrasonic flaw detectors, and particularly discloses an intelligent ultrasonic flaw detector and a probe adjusting method thereof.A user panel and a display screen are arranged on the front surface of a flaw detector body, an alarm charging indicator lamp and an instrument keyboard are sequentially arranged on the display screen from top to bottom, a battery module is detachably mounted in the flaw detector body, a power socket, a reset key, a communication interface, a receiving probe socket and a transmitting probe socket are arranged at the top of the flaw detector body, the receiving probe socket and the transmitting probe socket are used for connecting probes, the communication interface is convenient for the transmission of flaw detector data files, and the reset key is convenient for the startup and shutdown of the flaw detector; the method can quickly, conveniently, nondestructively and accurately detect, position, evaluate and diagnose various defects (cracks, inclusions, air holes and the like) in the workpiece.
Description
Technical Field
The invention relates to the technical field of ultrasonic flaw detectors, and particularly discloses an intelligent ultrasonic flaw detector and a probe adjusting method thereof.
Background
The ultrasonic flaw detector is a portable industrial nondestructive flaw detector, and can quickly, conveniently, nondestructively and accurately detect, position, evaluate and diagnose various defects (cracks, looseness, air holes, inclusions and the like) in a workpiece. The device can be used in a laboratory and an engineering field. The method is widely applied to industries such as boilers, pressure vessels, aerospace, aviation, electric power, petroleum, chemical engineering, marine petroleum, pipelines, war industry, ship manufacturing, automobiles, mechanical manufacturing, metallurgy, metal processing industry, steel structures, railway traffic, nuclear power, colleges and universities.
Ultrasonic flaw detectors are widely used, but in the actual flaw detection process, pulse reflection type ultrasonic flaw detectors are most widely used. Generally, in a uniform material, the existence of defects causes discontinuity of the material, the discontinuity often causes inconsistency of acoustic impedance, and the reflection theorem shows that ultrasonic waves are reflected on an interface of two media with different acoustic impedances, the amount of energy reflected back is related to the difference of the acoustic impedances of the media on two sides of the interface and the orientation and the size of the interface, and the pulse test ultrasonic flaw detector is designed according to the principle.
The abscissa of the display screen of the current portable pulse reflection type ultrasonic flaw detector is the propagation time or propagation distance of ultrasonic waves in a detected material, and the ordinate is the amplitude of ultrasonic reflected waves. A flaw exists in a steel workpiece, an interface between different media is formed between the flaw and steel materials due to the existence of the flaw, acoustic impedances between the interfaces are different, when transmitted ultrasonic waves meet the interface, reflection occurs, the reflected energy is received by a probe, a waveform of a reflected wave is displayed at a certain position of an abscissa in a display screen, the position of the abscissa is the depth of the flaw in the detected material, and the height and the shape of the reflected wave are different due to different flaws, so that the nature of the flaws is reflected. When the portable ultrasonic flaw detector is used for detecting defects, the defects that the service life of the conventional portable ultrasonic flaw detector is short due to poor sealing performance of the conventional portable ultrasonic flaw detector is found, and various defects (cracks, inclusions, air holes and the like) in a workpiece can not be detected, positioned, evaluated and diagnosed quickly, conveniently, undamaged and accurately.
Disclosure of Invention
In view of the above, the present invention provides an intelligent ultrasonic flaw detector and a probe adjustment method thereof, which can quickly, conveniently, nondestructively, and accurately detect, locate, evaluate, and diagnose various defects (cracks, inclusions, pores, etc.) inside a workpiece, in order to solve the above problems of the conventional portable ultrasonic flaw detector.
In order to achieve the purpose, the invention provides the following technical scheme:
the utility model provides an intelligence ultrasonic flaw detector, including the appearance body of detecting a flaw, the front of the appearance body of detecting a flaw is equipped with user panel and display screen, display screen from the top down has set gradually warning charge indicator and instrument keyboard, this internal demountable installation of appearance of detecting a flaw has battery module, appearance body top of detecting a flaw is provided with supply socket, the reset key, communication interface, receiving probe socket, the transmitting probe socket, the receiving probe socket, the transmitting probe socket is used for connecting probe, communication interface is convenient for detect appearance data file's transmission, the reset key is convenient for detect the switch on and off of appearance.
Furthermore, the side of the flaw detector body is provided with a protective adhesive tape for preventing the flaw detector body from water inflow, and the protective adhesive tape is provided with anti-skid lines.
Further, the instrument keyboard comprises a digital rotary wheel and a shortcut keyboard.
Further, the back of the flaw detector body is rotatably provided with a rotating support, and the rotating support is rotatably arranged on the back of the flaw detector body in a hinged mode.
Furthermore, the display screen is a high-definition true color liquid crystal display screen.
Furthermore, an interface dust cover is arranged on the flaw detector body outside the communication interface.
Further, an upper hanging column and a lower hanging column which are convenient for installing hanging ropes are respectively arranged on the upper part and the lower part of the peripheral side of the flaw detector body.
A method for adjusting a probe on an intelligent ultrasonic flaw detector comprises the following steps:
A. connecting the probe with an instrument, pressing a starting power key on an instrument keyboard, starting the instrument and entering a working state;
B. entering a probe type parameter functional group, respectively setting the probe type, the probe frequency and the probe size, and setting other parameters in the calibration process or after the calibration is finished;
C. entering a probe calibration function, and starting to measure the zero offset, the front edge and the sound velocity, the refraction angle and the material sound velocity of the probe by pressing a confirmation key;
D. and manufacturing a DAC curve and an AVG curve after zero offset adjustment is finished.
Further, when the probe type in the step B is an inclined probe, the sound velocity of the material is automatically adjusted to 3230m/s, the angle of the probe is automatically set to K2, the frequency of the probe is 2.5MHz, and the size of the probe is 13 x 13 mm; when the probe type is a straight probe, the material sound velocity is automatically adjusted to 5920m/s, the probe angle is automatically set to 0 degree, the probe frequency is 2.5MHz, and the probe size is 20 mm.
The working principle and the beneficial effects of the scheme are as follows:
1. the intelligent ultrasonic flaw detector disclosed by the invention is specially designed for a severe field environment, and is firm and durable. The unique sealing design makes it able to resist moisture, sand blown by wind, dust, oil stain and other pollution in various harsh environments from the sea to the desert. The special anti-splashing design is waterproof and oilproof, and can work in rainy days. The unique rotating bracket with any angle is convenient to use. The defect echo parameters (distance, horizontal, vertical, wave amplitude, dB equivalent value and flat-bottom hole equivalent value) are displayed in real time, flaw detection information is clear at a glance, and the conversion of the flat-bottom hole with quantitative defects can be automatically completed. The Chinese display device has the advantages of full Chinese display, master-slave menu, fast keys and digital flying shuttle spinning wheels, convenience in operation and advanced technology. The high-definition true color liquid crystal display screen is adopted, the screen brightness is clear, the background color can be selected according to the environment, and the liquid crystal brightness can be freely set so as to adapt to different operating environments. The high-performance security battery module is convenient to disassemble and assemble, so that the continuous working time of the instrument can reach more than 12 hours.
2. The intelligent ultrasonic flaw detector disclosed by the invention can quickly, conveniently, nondestructively and accurately detect, position, evaluate and diagnose various defects (cracks, inclusions, air holes and the like) in a workpiece. The device can be used in a laboratory and an engineering field. The instrument can be widely applied to the fields of ferrous metallurgy, metal material processing, chemical engineering and the like which need defect detection and quality control, and also widely applied to in-service safety inspection and service life assessment in the fields of aerospace, railway traffic, boiler pressure vessels and the like.
Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention. The objectives and other advantages of the invention may be realized and attained by the means of the instrumentalities and combinations particularly pointed out hereinafter.
Drawings
FIG. 1 is a front view of an intelligent ultrasonic flaw detector of the present invention;
FIG. 2 is a side view of the intelligent ultrasonic flaw detector of the present invention;
FIG. 3 is a rear view of the intelligent ultrasonic flaw detector of the present invention;
FIG. 4 is a top view of the intelligent ultrasonic flaw detector of the present invention;
FIG. 5 is a flow chart of the operation of the intelligent ultrasonic flaw detector of the present invention.
The drawings are numbered as follows: the device comprises a protective rubber strip 1, a display screen 2, a digital rotary wheel 3, an alarm charging indicator lamp 4, a shortcut keyboard 5, an upper hanging column 6, a lower hanging column 7, an interface dust cover 8, a rotary support 9, a battery module 10, a power socket 11, a reset key 12, a communication interface 13, a receiving probe socket 14 and a transmitting probe socket 15.
Detailed Description
The following is further detailed by way of specific embodiments:
an intelligence ultrasonic flaw detector as shown in fig. 1 ~ 4, including the appearance body of detecting a flaw, the front of the appearance body of detecting a flaw is equipped with user panel and display screen 2, and display screen 2 from the top down has set gradually the warning charge pilot lamp 4 and instrument keyboard, and display screen 2 is the true color liquid crystal display 2 of high definition. The instrument keyboard comprises a digital rotary wheel 3 and a shortcut keyboard 5. A battery module 10 is detachably mounted in the flaw detector body, a power socket 11, a reset key 12, a communication interface 13, a receiving probe socket 14 and a transmitting probe socket 15 are arranged at the top of the flaw detector body, the receiving probe socket 14 and the transmitting probe socket 15 are used for connecting probes, the communication interface 13 is convenient for transmission of flaw detector data files, and the reset key 12 is convenient for startup and shutdown of the flaw detector. The side of the flaw detector body is provided with a protective rubber strip 1 for preventing the flaw detector body from water inflow, and the protective rubber strip 1 is provided with anti-skid lines. An interface dustproof cover 8 is arranged on the flaw detector body outside the communication interface 13 to prevent the communication interface from entering impurities. The upper part and the lower part of the periphery of the flaw detector body are respectively provided with an upper hanging column 6 and a lower hanging column 7 which are convenient for installing hanging ropes.
When the echo peak value in the current gate exceeds the gate height (higher than the gate height during wave-entering alarm or lower than the gate height during wave-losing alarm), a red indicator lamp in the alarm indicator lamps is lightened for alarm;
when the ultrasonic flaw detector is charged, the power indicator lamp in the alarm charging indicator lamp 4 displays red; after the charging is finished, the indicator lamp is displayed as green (when an external power supply is available); and after the external power supply is disconnected, the power indicator lamp is turned off.
The instrument keyboard is designed with two operation modes of a digital spinning wheel 3 and a shortcut keyboard 5, and all control instructions sent by flaw detection personnel to the flaw detector are completed through the operation of the shortcut keyboard 5 or the operation of the digital spinning wheel 3. In the process of operating the shortcut keyboard 5 or the digital rotary wheel 3, the flaw detector automatically identifies different meanings of each key according to different states and executes the instruction of an operator. Where a knob press is a function of the confirmation key. < step > refers to a gain step. Automatic refers to automatic gain. The cancel key, pressed without a dialog box, functions as a full screen key.
The operation mode of 5 keys of the shortcut keyboard is single click, and the operation method comprises the following steps: in order to press the key lightly, the key is released immediately to be bounced.
After the function item selection key is selected, pressing the function item selection key to move a cursor upwards and downwards to select a corresponding function item; and the increase and the decrease of the parameters are realized in the dialog box. Function shortcut key: the number of the keys (channel, freezing, widening, gain, gate, sound path, probe, storage and automatic video) is 9, and the corresponding special function can be started quickly or the corresponding function parameter interface can be accessed quickly. In the use process of the instrument, parameters such as gain, a gate, a detection range, probe zero offset, a K value and the like are required to be changed frequently, and when the parameters are adjusted, quick selection and switching can be realized through a function shortcut key. The direction key in the shortcut keyboard 5 changes the parameter adjustment step length or turns pages of the list during dialog; the rapid adjustment of the gate width is achieved without a dialog box.
The digital flying shuttle spinning wheel can adjust parameters more quickly and conveniently. The operating modes of the spinning wheel are divided into three types, namely: clockwise rotation, counterclockwise rotation, single click. Clockwise rotation: increasing the selected parameter value and switching menu options, mainly used for parameter adjustment; the gate can be moved to the right when the screen is full. And (3) rotating anticlockwise: reducing the selected parameter value and switching options, mainly used for parameter adjustment; the gate can be moved leftwards when the screen is full. Clicking: the single-click operation method is to slightly press down the spinning wheel and then release the spinning wheel to bounce. The function of which is the same as the confirmation key.
The back of the flaw detector body is rotatably provided with a rotating support 9 similar to a mobile phone support, and the rotating support 9 is rotatably arranged on the back of the flaw detector body in a hinged mode. When the ultrasonic flaw detector is used for flaw detection, a proper visual angle can be obtained by adjusting the rotating angle of the rotating bracket 9 so as to more conveniently and comfortably control the instrument, and the angle of the rotating bracket 9 can be randomly adjusted.
The battery module 10 is detachably mounted in the flaw detector body, the battery is the special high-capacity lithium battery module 10, online charging is achieved, and flaw detection personnel can use the device conveniently. In addition, the device can be independently charged off line, thereby realizing the double-electric double-charging function, and meeting the requirements of long-time continuous work and field operation. A power socket 11 is arranged at the top of the flaw detector body, and the flaw detector can be powered by an external special power adapter or a special lithium ion battery pack. Under the condition that the battery is installed, the flaw detector is connected to the power adapter, the power supply of the flaw detector is automatically cut off by the internal battery after the flaw detector is started, and the flaw detector is powered by the power adapter.
Before flaw detection work is carried out by using the flaw detector, a proper probe and a probe line need to be connected, and the probe line of the flaw detector is a coaxial cable of 75 omega.
The top of the flaw detector is provided with two BNC (or C9) probe sockets which are probe connection sockets. When a single probe (a single crystal straight probe or a single crystal inclined probe) is used, the probe line can be connected to any probe socket on the top of the instrument; when using a twin probe (one wafer transmitting, the other wafer receiving) or a penetration probe (two probes, one transmitting and the other receiving), the transmitting probe wires are connected to the transmitting probe sockets 15 (labeled "T") and the receiving probe wires are connected to the receiving probe sockets 14 (labeled "T/R"). The quality of the probe line has corresponding influence on the result of the instrument index test. When the instrument uses the bimorph probe, the transmitting probe line and the receiving probe line are incorrectly connected, and the return loss or the wave form disorder can be caused.
The communication interface is a USB high-speed communication transmission interface. The USB flash disk can work in a USB flash disk mode, and the USB flash disk can be connected with an instrument and a computer through a USB cable to realize data and file transmission; the USB Host can also work in a USB Host mode to operate an external USB flash disk. The detection data of the flaw detector can also be transmitted wirelessly through Bluetooth, and can be in Bluetooth wireless communication with matched mobile phone APP software or computer software to quickly transmit flaw detection reports and channel parameters.
In the power-off state, the instrument can be automatically started up by pressing the reset key for more than one second. And displaying system starting information on the instrument screen. After the system is started, the instrument automatically enters a flaw detection interface.
In the power-on state, the instrument can be powered off by pressing the reset key for more than 1 second. The instrument can automatically save flaw detection parameters (stored in a default system file) when being shut down, and the instrument does not need any key operation or immediately cut off the power supply during the shutdown process so as to prevent the system file from being damaged. If the system file is damaged due to some reason, the instrument works abnormally, and the instrument can be automatically restored to the factory setting for repair. After the instrument is shut down, the calibrated and set flaw detection parameters cannot be lost, and after the instrument is started next time, the instrument can automatically restore the parameter setting by using the file stored before the instrument is shut down last time. When the battery voltage is too low, the battery icon on the screen can flash and display, and then the flaw detector can be automatically shut down and power off.
Before flaw detection work is carried out by using the flaw detector, a proper probe and a probe line need to be connected, and the probe line of the flaw detector is a coaxial cable of 75 omega.
The top of the flaw detector is provided with two BNC (or C9) probe sockets which are probe connection sockets. When a single probe (a single crystal straight probe or a single crystal inclined probe) is used, the probe line can be connected to any probe socket on the top of the instrument; when using a twin probe (one wafer transmitting, the other wafer receiving) or a penetration probe (two probes, one transmitting and the other receiving), the transmitting probe wires are connected to the transmitting probe sockets 15 (labeled "T") and the receiving probe wires are connected to the receiving probe sockets 14 (labeled "T/R"). The quality of the probe line has corresponding influence on the result of the instrument index test. When the instrument uses the bimorph probe, the transmitting probe line and the receiving probe line are incorrectly connected, and the return loss or the wave form disorder can be caused.
The communication interface is a USB high-speed communication transmission interface. The USB flash disk can work in a USB flash disk mode, and the USB flash disk can be connected with an instrument and a computer through a USB cable to realize data and file transmission; the USB Host can also work in a USB Host mode to operate an external USB flash disk. The detection data of the flaw detector can also be transmitted wirelessly through Bluetooth, and can be in Bluetooth wireless communication with matched mobile phone APP software or computer software to quickly transmit flaw detection reports and channel parameters.
In the power-off state, the instrument is automatically powered on by pressing the reset key 12 for more than one second. And displaying system starting information on the instrument screen. After the system is started, the instrument automatically enters a flaw detection interface.
In the power-on state, the instrument can be powered off by pressing the reset key for more than 121 seconds. The instrument can automatically save flaw detection parameters (stored in a default system file) when being shut down, and the instrument does not need any key operation or immediately cut off the power supply during the shutdown process so as to prevent the system file from being damaged. If the system file is damaged due to some reason, the instrument works abnormally, and the instrument can be automatically restored to the factory setting for repair. After the instrument is shut down, the calibrated and set flaw detection parameters cannot be lost, and after the instrument is started next time, the instrument can automatically restore the parameter setting by using the file stored before the instrument is shut down last time. When the battery voltage is too low, the battery icon on the screen can flash and display, and then the flaw detector can be automatically shut down and power off.
The calibration of the flaw detection system mainly comprises the following important parameters:
1. zero offset (probe delay). The piezoelectric wafer in the probe is very fragile and can not be in direct contact and friction with a workpiece, so that a protective film or a wedge block for protecting the wafer is arranged in front of the wafer, and zero offset refers to the propagation time of an ultrasonic beam in the protective film or the wedge block. For transverse wave oblique probe contact inspection, zero offset calibration is an essential procedure before any inspection task is performed. The inclined probes are various in types, different in structural size and different in K value required by different detection objects, so that the sound path in a wedge block (organic glass) is different in size, and the incident point of each transverse wave inclined probe is measured to determine a zero offset value. The angle probe also needs to be recalibrated after a period of use as the wedge wears during use.
2. The speed of sound. Digital ultrasonic flaw detectors locate defects by measuring the time of propagation (one pass) of an ultrasonic wave in a workpiece, multiplied by the speed of propagation of the ultrasonic wave inside such workpiece. Therefore, the accurate measurement of the propagation velocity of the ultrasonic wave in the workpiece is of great importance to the defect positioning accuracy.
3. The probe front (point of incidence) is tilted. For an oblique probe, since the acoustic beam enters the workpiece at an oblique incidence, the distance from the intersection point of the main acoustic beam incident on the workpiece surface to the front end of the probe, i.e., the front edge, needs to be measured. After the front edge distance is measured, when the horizontal distance of the defect is measured in the flaw detection process of the inclined probe, the positioning can be directly started from the front end of the probe.
4. Angle probe K value (angle of refraction). For a tilted probe, the acoustic beam is obliquely incident. The inclined probe is mainly used for positioning the defects through the calculation of the triangular relation of three coordinates of a sound path distance, a horizontal distance and a depth distance. Therefore, accurate measurement of the refraction angle of the sound beam is very important for the precision of the flaw detection positioning of the oblique probe. It is customary in China to express the angle of refraction of the sound beam of the angle probe by the tangent value (the ratio of the horizontal distance to the depth distance) -namely the K value of the angle of refraction of the sound beam.
5. DAC curve, AVG curve. The AVG curve is a curve describing the direct relation among the reflection distance, the wave amplitude and the equivalent of the sound beam, is mainly used for determining the equivalent size of the defect according to the time and the wave amplitude of the reflected echo of the defect, and is an effective means for quantifying the defect during flaw detection.
FIG. 5 is a flow chart of the operation of the intelligent ultrasonic flaw detector.
Example 1
Taking the automatic adjustment of the oblique probe as an example, the workpiece is a steel plate welding seam with the thickness of 30 mm.
A method for adjusting a probe on an intelligent ultrasonic flaw detector comprises the following steps:
A. connecting the oblique probe with an instrument, pressing a starting power key on an instrument keyboard, starting the instrument and entering a working state;
B. entering a probe type parameter functional group, respectively setting the probe type, the probe frequency and the probe size, and setting other parameters in the adjusting process or after the adjusting is finished; the sound velocity of the material is automatically adjusted to 3230m/s, the angle of the probe is automatically set to K2, the frequency of the probe is 2.5MHz, and the size of the probe is 13 x 13 mm;
the automatic adjustment of the oblique probe is divided into a CSK-1A method and a two-hole method, wherein the CSK-1A method is that the probe is moved on a CSK-IA test block, the probe is stabilized and fixed when the highest echo of R50 appears in a gate B (if the gate is not movable in the gate), the R100 echo is raised (or lowered) to 80%, and the horizontal distance from the front end of the probe to the circle center is input. The value of the leading edge of the probe is read according to the scale on the probe and entered into a pop-up dialog box, and then confirmation is selected. The instrument will automatically calculate the result and end the calibration zeroth out-of-focus routine. The probe is moved back and forth over the CSK-IA block so that the highest echo of the Φ 50 hole appears in the gate (if the gate is not movable within the gate). The gain is adjusted to make the echo height about 80% of the screen height, the instrument automatically calculates the refraction angle according to the recorded echo position and displays the calibration result.
The calibration method of the two-hole method is to input the depth values of two holes first. The highest wave for the first hole is then found and the input horizontal distance from the hole to the leading edge of the probe, which requires manual measurement by a ruler, is entered. The highest wave for the second hole is then found, and the input horizontal distance from the hole to the leading edge of the probe, which requires manual measurement by a ruler, is entered. And (3) completing calibration, and obtaining four relevant parameters of the oblique probe: probe zero, probe leading edge, probe angle and material sound velocity.
C. Entering a probe calibration function, and starting to measure the zero offset, the front edge and the sound velocity, the refraction angle and the material sound velocity of the probe by pressing a confirmation key;
D. and manufacturing a DAC curve after zero offset adjustment is finished. In the process of manufacturing the DAC, various parameters such as a gate, a gain and a detection range can be adjusted, but calibrated parameters such as probe parameters (a probe zero point and a K value) and a sound velocity are not required to be adjusted.
Example 2
Taking the automatic adjustment of the straight probe as an example, the workpiece is a steel forging with the thickness of 200 mm.
A method for adjusting a probe on an intelligent ultrasonic flaw detector comprises the following steps:
A. connecting the straight probe with an instrument, pressing a starting power key on an instrument keyboard, starting the instrument and entering a working state;
B. entering a probe type parameter functional group, respectively setting the probe type, the probe frequency and the probe size, and setting other parameters in the adjusting process or after the adjusting is finished; the sound velocity of the material is automatically adjusted to 5920m/s, the angle of the probe is automatically set to 0 degree, the frequency of the probe is 2.5MHz, and the size of the probe is 20 mm;
the straight probe is automatically tuned to enter a calibration zero-offset sound velocity procedure. Starting echo path input 100mm, ending echo path input 200mm, selecting and confirming, moving the probe on a CSK-IA test block, automatically stabilizing the probe when the highest echo with a large flat bottom at the position of 100mm appears in a gate (if the gate is not movable in the gate), pressing a gain key to enable the height of the internal wave of the gate to be 80% of the screen height, and then selecting to continuously record the position of the wave. At the moment, the position of the gate can be automatically adjusted to the position of the secondary echo. Pressing the automatic gain key makes the secondary wave height in the door reach about 80% of the screen height, and then selecting the next step to record the secondary echo position.
After the echo positions are recorded twice, the instrument can automatically calculate the zero offset of the used probe and the sound velocity of the workpiece. The calibration zero-bias speed routine automatically ends.
C. Entering a probe calibration function, and starting to measure the zero offset, the front edge and the sound velocity, the refraction angle and the material sound velocity of the probe by pressing a confirmation key;
D. and (5) manufacturing an AVG curve after zero offset adjustment is finished. When an AVG curve is made, only the value after one time of the near field region is theoretically calculated, and the value before one time of the near field region is displayed as a straight line. If the thickness of the test block is small, multiple waves are needed to make the required echo behind one time of the near field region. If the prepared AVG curve needs to be modified, the AVG → the modified AVG can be entered, and then the AVG curve modification program is entered by pressing the enter key. And finishing the adjustment work of the straight probe.
The foregoing is merely an example of the present invention and common general knowledge of known specific structures and features of the embodiments is not described herein in any greater detail. It should be noted that, for those skilled in the art, without departing from the structure of the present invention, several changes and modifications can be made, which should also be regarded as the protection scope of the present invention, and these will not affect the effect of the implementation of the present invention and the practicability of the present invention.
Claims (7)
1. The utility model provides an intelligence ultrasonic flaw detector which characterized in that: including the appearance body of detecting a flaw, the front of the appearance body of detecting a flaw is equipped with user panel and display screen, display screen from the top down has set gradually warning charge indicator and instrument keyboard, this internal demountable installation of appearance of detecting a flaw has battery module, appearance body top of detecting a flaw is provided with supply socket, the reset key, communication interface, receiving probe socket, transmitting probe socket is used for connecting probe, communication interface is convenient for the transmission of appearance data file of detecting a flaw, the reset key is convenient for the switching on and shutting down of appearance of detecting a flaw, instrument keyboard includes digital spinning wheel and swift keyboard, the back of the appearance body of detecting a flaw rotates installs runing rest, runing rest adopts articulated mode to rotate to install at appearance body back of detecting a flaw.
2. The intelligent ultrasonic flaw detector of claim 1, wherein: the side of the flaw detector body is provided with a protective rubber strip for preventing the flaw detector body from water inflow, and the protective rubber strip is provided with anti-skid lines.
3. The intelligent ultrasonic flaw detector of claim 1, wherein: the display screen is a high-definition true color liquid crystal display screen.
4. The intelligent ultrasonic flaw detector of claim 1, wherein: and an interface dustproof cover is arranged on the flaw detector body outside the communication interface.
5. The intelligent ultrasonic flaw detector of claim 1, wherein: the upper part and the lower part of the periphery of the flaw detector body are respectively provided with an upper hanging column and a lower hanging column which are convenient for installing hanging ropes.
6. A method for adjusting a probe on an intelligent ultrasonic flaw detector is characterized by comprising the following steps: the method comprises the following steps:
A. connecting the probe with an instrument, pressing a starting power key on an instrument keyboard, starting the instrument and entering a working state;
B. entering a probe type parameter functional group, respectively setting the probe type, the probe frequency and the probe size, and setting other parameters in the calibration process or after the calibration is finished;
C. entering a probe calibration function, and starting to measure the zero offset, the front edge and the sound velocity, the refraction angle and the material sound velocity of the probe by pressing a confirmation key;
D. and manufacturing a DAC curve and an AVG curve after zero offset adjustment is finished.
7. The method for adjusting the probe of the intelligent ultrasonic flaw detector according to claim 6, wherein: when the probe type in the step B is an inclined probe, the sound velocity of the material is automatically adjusted to 3230m/s, the angle of the probe is automatically set to K2, the frequency of the probe is 2.5MHz, and the size of the probe is 13 x 13 mm; when the probe type is a straight probe, the material sound velocity is automatically adjusted to 5920m/s, the probe angle is automatically set to 0 degree, the probe frequency is 2.5MHz, and the probe size is 20 mm.
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| CN117451953A (en) * | 2023-12-26 | 2024-01-26 | 国网山东省电力公司莱州市供电公司 | Overhead line wire inspection flaw detector |
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Effective date of registration: 20230613 Address after: No. 356 Yunfu Road, Beibei District, Chongqing, 400700 Applicant after: Libo Xinyi precision electronics (Chongqing) Co.,Ltd. Address before: 402283 1-1-3, building 3, runwan, No. 24, Jinyuan Road, zone B, Luohuang Industrial Park, Jiangjin District, Chongqing Applicant before: Kailibo automation equipment (Chongqing) Co.,Ltd. |