CN113961030A - Adjustable voltage source for ion chromatography system - Google Patents
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- CN113961030A CN113961030A CN202111182248.0A CN202111182248A CN113961030A CN 113961030 A CN113961030 A CN 113961030A CN 202111182248 A CN202111182248 A CN 202111182248A CN 113961030 A CN113961030 A CN 113961030A
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- 238000004255 ion exchange chromatography Methods 0.000 title abstract description 16
- 238000004804 winding Methods 0.000 claims description 9
- 238000001914 filtration Methods 0.000 claims description 3
- 230000033228 biological regulation Effects 0.000 abstract description 3
- 230000007613 environmental effect Effects 0.000 abstract description 3
- 238000012544 monitoring process Methods 0.000 abstract description 3
- 230000006641 stabilisation Effects 0.000 abstract description 3
- 238000011105 stabilization Methods 0.000 abstract description 3
- 229910044991 metal oxide Inorganic materials 0.000 abstract 1
- 150000004706 metal oxides Chemical class 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
- 238000012360 testing method Methods 0.000 description 38
- 150000002500 ions Chemical class 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000005070 sampling Methods 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 3
- 230000005764 inhibitory process Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000004128 high performance liquid chromatography Methods 0.000 description 2
- 239000003112 inhibitor Substances 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 230000008929 regeneration Effects 0.000 description 2
- 238000011069 regeneration method Methods 0.000 description 2
- 239000002253 acid Substances 0.000 description 1
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- 238000004458 analytical method Methods 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 238000004587 chromatography analysis Methods 0.000 description 1
- 238000004440 column chromatography Methods 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 238000007872 degassing Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 239000003651 drinking water Substances 0.000 description 1
- 235000020188 drinking water Nutrition 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
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- 238000001802 infusion Methods 0.000 description 1
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/04—Preparation or injection of sample to be analysed
- G01N30/16—Injection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/60—Construction of the column
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Abstract
The invention discloses an adjustable voltage source for an ion chromatography system, which belongs to the technical field of environmental protection monitoring and comprises an MOS (metal oxide semiconductor) tube, a transformer and a comparator, wherein the grid electrode of the MOS tube is connected with an MCPWM (micro-pulse-width modulation) output pin of a single chip microcomputer, the source electrode of the MOS tube is connected with the negative input end of the comparator, and the drain electrode of the MOS tube is connected with one end of a primary coil of the transformer. The invention has the advantages of simple circuit structure, similar output voltage ripples and lower cost, reduces chips such as a PWM controller chip, an ADC chip, an operational amplifier and the like, simultaneously reduces the control on the SPI of a single chip microcomputer, increases the MCPWM output, the MCPWM interruption and the ADC voltage acquisition control, uses the on-chip PWM and the on-chip ADC to further realize the PID regulation, has relatively complex program control, can better realize the voltage stabilization output, keeps the output voltage of a voltage source in a constant range, and is worthy of popularization and use.
Description
Technical Field
The invention relates to the technical field of environmental monitoring, in particular to an adjustable voltage source for an ion chromatography system.
Background
Ion chromatography is one of high performance liquid chromatography, also called High Performance Ion Chromatography (HPIC) or modern ion chromatography, which is different from traditional ion exchange chromatography column chromatography mainly in that resin has very high crosslinking degree and low exchange capacity, sample introduction volume is very small, and a plunger pump is used for conveying leacheate to generally carry out on-line automatic continuous conduction monitoring on leacheate. As with conventional HPLC instruments, ion chromatographs are also typically fabricated as individual cell units and then assembled according to analytical requirements. The most basic components are a voltage source, a mobile phase reservoir, a high pressure infusion pump, a sample injector, a chromatography column, a detector and a data processing system. In addition, a mobile phase online degassing device, an automatic sample introduction system, a mobile phase inhibition system, a post-column reaction system, a full-automatic control system and the like can be configured as required.
The working process of the ion chromatograph is as follows: the liquid pump delivers the mobile phase to the analysis system at a stable flow rate (or pressure), the sample is introduced by a sample injector before the chromatographic column, the mobile phase carries the sample into the chromatographic column, each component in the chromatographic column is separated and flows to a detector along with the mobile phase in sequence, the inhibition ion chromatography adds an inhibition system before a conductivity detector, namely, another high-pressure liquid pump delivers the regeneration liquid to an inhibitor, the background conductivity of the mobile phase is reduced in the inhibitor, then the effluent is introduced into a conductivity detection cell, and the detected signal is sent to a data system for recording, processing and storing. The non-suppressive ion chromatograph does not use a suppressor and a high-pressure pump for conveying the regeneration liquid, so the structure of the device is relatively much simpler and the price is much cheaper. The ion chromatography is mainly used for analyzing environmental samples, including anions and cations in samples such as surface water, drinking water, rainwater, domestic sewage, industrial wastewater, acid sediment, atmospheric particulates and the like, and impurities in water and reagents related to the microelectronic industry
The adjustable voltage source for the ion chromatography system at present has certain problems, such as the need of using an independent PWM controller chip, an ADC chip, an operational amplifier chip and the like, and the control is difficult when the output voltage is required to be kept in a constant range along with the change of the load. To this end, an adjustable voltage source for an ion chromatography system is proposed.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: how to solve the problem that the existing adjustable voltage source for the ion chromatography system needs to use an independent PWM controller chip, an ADC chip, an operational amplifier chip and voltage stabilization control, and the adjustable voltage source for the ion chromatography system is provided.
The invention solves the technical problems by the following technical scheme, and the invention comprises an MOS tube, a transformer and a comparator, wherein a grid electrode of the MOS tube is connected with an MCPWM output pin of a singlechip, a source electrode of the MOS tube is connected with a negative input end of the comparator, a drain electrode of the MOS tube is connected with one end of a primary coil of the transformer, the other end of the primary coil of the transformer is connected with a set power supply end, a positive input end of the comparator is connected with a reference voltage end, an output end of the comparator is connected with a MCPWM quick interruption pin of the singlechip, two groups of secondary coils of the transformer are respectively a first secondary coil and a second secondary coil, wherein the first secondary coil is used for connecting a load, and the second secondary coil is connected with a voltage acquisition pin of an ADC on the singlechip.
Furthermore, the adjustable voltage source further comprises a gate driver, the gate driver is arranged between the output pin of the single chip microcomputer MCPWM and the gate of the MOS tube, and the amplitude of the MCPWM wave is improved through the gate driver.
Furthermore, a pull-down resistor is arranged between the gate driver and the output pin of the single chip microcomputer MCPWM, and the MOS tube is in a turn-off state when not controlled through the pull-down resistor.
Furthermore, the output branches of the first secondary winding and the second secondary winding are both provided with rectifier diodes.
Furthermore, the source output voltage of the MOS tube is input into the negative input end of the comparator through RC filtering.
Furthermore, when the voltage at the negative input terminal of the comparator does not reach the upper limit voltage, the output is at a high level, and when the voltage reaches the upper limit voltage, the output is at a low level.
Furthermore, the single chip microcomputer MCPWM quick interruption pin is in a single chip microcomputer internal hardware triggering mode, and when the comparator outputs a low level, the single chip microcomputer MCPWM quick interruption pin is set to be low, so that the MCPWM waveform is quickly turned off.
Furthermore, a load is added to the output end of the first secondary coil, and the load is adjusted through an electronic load, wherein the load is in a range of 0 omega to infinity omega.
Furthermore, the adjustable voltage source further comprises a PID control module, wherein the PID control module takes voltage data acquired by a voltage acquisition pin of the ADC on the single chip microcomputer as input, and controls the MCPWM waveform output by the MCPWM output pin of the single chip microcomputer according to the set output voltage of the first secondary coil.
Compared with the prior art, the invention has the following advantages: this ion is adjustable voltage source for chromatographic system, circuit structure is comparatively simple, the output voltage ripple is close, the cost is lower, PWM controller chip has been reduced, the ADC chip, chips such as fortune is put, the control to singlechip SPI has been reduced simultaneously, MCPWM output has been increased, MCPWM is interrupted, ADC voltage acquisition control, use on-chip PWM and on-chip ADC, and then realize PID regulation, program control is complicated relatively, but can realize steady voltage output better, make the output voltage of voltage source keep in a invariable scope, be worth using widely.
Drawings
FIG. 1 is a schematic diagram of an adjustable voltage source arrangement in an embodiment of the invention;
FIG. 2 is a schematic diagram of a PID control flow in an embodiment of the invention.
Detailed Description
The following examples are given for the detailed implementation and specific operation of the present invention, but the scope of the present invention is not limited to the following examples.
As shown in fig. 1 to 2, the present embodiment provides a technical solution: an adjustable voltage source for an ion chromatography system, comprising: the single-chip microcomputer MCPWM output pin 1 and MCABORT quick interrupt pin 2, an OCADC pin 3 of an ADC on the single-chip microcomputer, a test point TP (test point) 4-11, a grounding point 12-18, a resistor 19(22 omega), a resistor 20(10k omega), a resistor 21(22 omega), a resistor 22(100k omega), a resistor 23(18k omega), a resistor 24(1k omega), a resistor 25(0.5 omega), a resistor 26(1k omega), a resistor 27(10k omega), a resistor 28(2.7k omega), a capacitor 29(100nF), a capacitor 30(4.7uF), a capacitor 31(470uF), a 5V power supply end 32, a 3V power supply end 33 and a 36V power supply end 34, a power output end 35(CUR-PWR), a grid driver 36(UCC27519), a comparator 37(TL331), rectifier diodes 38-39, an MOS tube 40 and a transformer 41.
In this embodiment, when performing the MCPWM output debugging, the resistor 19 connected between the output pin 1 of the single chip MCPWM and the gate driver 36(UCC27519) is turned off, so that the MOS transistor 40 is always in the off state. And configuring software, setting duty ratio, and checking whether the waveform is consistent with the setting by using the oscilloscope.
In this embodiment, the amplitude of the 100KHz MCPWM wave output by the single chip MCPWM output pin 1 is 3.3V, and in order to increase the driving capability, the gate driver UCC27519 is selected to increase the amplitude of the MCPWM wave to 5V.
In this embodiment, the MOS transistor 40 is an N-channel MOS transistor (FDD10N20L), the magnitude of the input on current is controlled, and a pull-down resistor, i.e., a resistor 19, is added to the output pin 1 of the single chip microcomputer MCPWM to keep the MOS transistor 40 in an off state when not controlled.
In this embodiment, the MCPWM fast interrupt function is configured when mcbort fast interrupt debugging is performed, and the test point 6 is short-circuited with the 3.3V power supply on the PCB by using tweezers to test the fast interrupt function. And welding a resistor 19 connected with the output pin 1 of the single chip microcomputer MCPWM and a gate driver 36(UCC27519), adjusting the duty ratio and testing the quick interrupt function.
In the embodiment, the specific details of the test points 4-11 are as follows:
test point 4: a single chip microcomputer PWM output test point;
test point 5: a single chip microcomputer MCPWM fast interrupt pin test point;
test point 6: a single-chip microcomputer ADC voltage acquisition test point;
test point 7: a MOS tube grid electrode test point;
test point 8: a negative input terminal test point of the comparator;
test point 9: a current-limiting resistance end test point;
test point 10: a feedback voltage output test point;
test point 11: and a voltage output terminal test point.
In this embodiment, when the voltage at the negative input terminal of the comparator 37 does not reach the upper limit voltage, the output is 3.3V (high level), and when the average current of the conducting loop of the MOS transistor 40 exceeds 500mA, after the RC filtering, the voltage at the negative input terminal of the comparator 37 exceeds 0.5V, and the output of the comparator 37 is low level. The output end of the comparator 37 is connected with an MCABORT (micro channel pulse width modulation) quick interrupt pin MCABORT of the single chip microcomputer, the MCABORT pin is in a hardware triggering mode inside the single chip microcomputer, and when the comparator 37 outputs a low level, the MCABORT pin on the single chip microcomputer is set to be low, so that the MCPWM waveform is quickly turned off, and overcurrent protection operation is completed.
In this embodiment, in order to prevent the voltage at the negative input terminal of the comparator 37 from being unstable and causing the comparator 37 to trigger erroneously, positive feedback is introduced to form a hysteresis comparator, and the threshold voltage range is 0.496V to 0.545V.
In this embodiment, a dummy load is added at the output of the test point 11, the resistance of the dummy load is determined according to the actual test,
in this embodiment, the single chip microcomputer can be used for 36V voltage input, and the test input voltage is adjusted by an adjustable power supply (IT 6302 power supply of ITECH, two channels are connected in series, and each channel is 18V); the load is adjusted by the electronic load, and the load range is 0 omega to infinity omega.
In this embodiment, when performing fault test on the adjustable voltage source, four parts are mainly performed: 1. full output duty ratio test, 2, load short circuit test, 3, transformer short circuit test, 4, MCPWM low frequency output test;
during full output duty ratio test, the MCPWM wave frequency is 100KHz, the input voltage is 36V, the load is 0R, and the output duty ratio is 100%;
during load short circuit test, the MCPWM wave frequency is 100KHz, the input voltage is 36V, the load is 0R, and the output duty ratio is 1;
during the short-circuit test of the transformer, the MCPWM wave frequency is 100KHz, the input voltage is 36V, the input end of the transformer is in short circuit, the load is 85R, and the output duty ratio is 100%;
during MCPWM low-frequency output test, the MCPWM wave frequency is 100Hz, the input voltage is 36V, the load is 85R, and the output duty ratio is 1.
In the bookIn the embodiment, when ADC voltage acquisition and debugging are carried out, the ADC on a single chip is 12 bits, the voltage division ratio of the voltage of a test point 10 to the voltage of a test point 6 is 11:1, a voltage division resistor (resistors 26 and 27) is not suitable to be overlarge, the voltage division resistor (resistor 26) at a ground end is equivalently connected with a sampling resistor inside the ADC in parallel, and the sampling precision is influenced if the voltage division resistor (resistor 26) is overlarge; when ADC collects value VadcAfter the determination, the calculation formula of the feedback voltage value of the test point 10 is as follows: vol＝(Vadc/4096) 3.3 x 11; firstly, configuring software to output fixed voltage, measuring a feedback voltage value of a test point 10 by using a universal meter, comparing the feedback voltage value with a voltage value calculated by an ADC (analog-to-digital converter), and if the feedback voltage value is equal to the voltage value calculated by the ADC, normally acquiring the AD voltage. The frequency of the ADC working clock is not too high, the frequency of the ADC working clock is set to 96/4/24-1.0 MHZ, AD conversion can be completed after 65uS is triggered and sampled every time, and the sampling rate of each channel is about 1 KSPS.
In this embodiment, since the load is variable during the PID control, if the open loop processing is performed according to the data collected by the ADC, the set voltage can be changed with the change of the load by directly setting the specific duty ratio to correspond to the specific output voltage, and the output voltage cannot be constant when the load is changed, so the PID adjustment is required. Since the circuit input voltage is 36V, the relationship between the duty ratio P and the output voltage set value Vset is: vset 36/P, and the set voltage is set according to this equation. Vol, i.e., the actual output voltage value, is calculated from the voltage value sampled by the ADC, and then a deviation error between Vset and Vol is Vset-Vol. The deviation is subjected to PID control, so that the deviation is reduced and controlled within 0.01V. The PID control formula is as follows:
the formula represents a duty ratio deviation value calculation method at the time k, wherein kp, ki and kd respectively represent proportional, integral and differential coefficients, PID (proportion integration differentiation) is required to be adjusted, and the PID sampling period is set to be 100 mS. Calculated PerrorCompensating for P, i.e. P + PerrorAnd as a set value, carrying out closed-loop regulation on the MCPWM wave duty ratio output by the MCPWM output pin 1 of the singlechip. In a reasonable wayThe precision of the output voltage of the power supply output end 35 of the adjustable voltage source reaches 0.01V under the proportional, integral and differential coefficients.
To sum up, the adjustable voltage source for the ion chromatography system of the above embodiment has the advantages of simple circuit structure, similar output voltage ripple, low cost, reduction of chips such as a PWM controller chip, an ADC chip and an operational amplifier, reduction of control over a single chip SPI, increase of MCPWM output, MCPWM interruption, ADC voltage acquisition control, use of on-chip PWM and on-chip ADC, and further realization of PID adjustment, relatively complex program control, but better realization of voltage stabilization output, and keeping the output voltage of the voltage source in a constant range, and is worth being popularized and used.
Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
Claims (9)
1. The utility model provides an ion is adjustable voltage source for chromatographic system, its characterized in that, includes MOS pipe, transformer, comparator, the grid and the singlechip MCPWM output pin of MOS pipe are connected, the source electrode with the negative input end of comparator is connected, the drain electrode with the primary winding one end of transformer is connected, the primary winding other end of transformer is connected with the settlement power end, the reference voltage end is connected to the positive input of comparator, the output and the singlechip MCPWM fast interrupt pin of comparator are connected, the secondary winding of transformer is two sets of, is first secondary winding, second secondary winding respectively, and wherein first secondary winding is used for connecting the load, and the voltage acquisition pin of second secondary winding and the singlechip on-chip ADC is connected.
2. The adjustable voltage source of claim 1, wherein: the adjustable voltage source further comprises a grid driver, the grid driver is arranged between the output pin of the single chip microcomputer MCPWM and the grid of the MOS tube, and the amplitude of the MCPWM wave is improved through the grid driver.
3. The adjustable voltage source of claim 2, wherein: and a pull-down resistor is arranged between the gate driver and the MCPWM output pin of the singlechip, and the MOS tube is in a turn-off state when not controlled by the pull-down resistor.
4. The adjustable voltage source of claim 1, wherein: and the output branches of the first secondary coil and the second secondary coil are provided with rectifier diodes.
5. The adjustable voltage source of claim 1, wherein: and the source electrode output voltage of the MOS tube is input into the negative input end of the comparator through RC filtering.
6. The adjustable voltage source of claim 1, wherein: when the voltage of the negative input end of the comparator does not reach the upper limit voltage, the output of the comparator is high level, and when the voltage of the negative input end of the comparator reaches the upper limit voltage, the output of the comparator is low level.
7. The adjustable voltage source of claim 6, wherein: the single-chip microcomputer MCPWM quick interruption pin is in a single-chip microcomputer internal hardware triggering mode, and when the comparator outputs a low level, the single-chip microcomputer MCPWM quick interruption pin is set to be low, so that the MCPWM waveform is quickly turned off.
8. The adjustable voltage source of claim 1, wherein: and adding a load at the output end of the first secondary coil, wherein the load is adjusted through an electronic load, and the load range is 0 omega to infinity omega.
9. The adjustable voltage source of claim 1, wherein: the adjustable voltage source further comprises a PID control module, the PID control module takes voltage data collected by a voltage collecting pin of an ADC on the single chip microcomputer as input, and controls MCPWM waveforms output by an MCPWM output pin of the single chip microcomputer according to the set output voltage of the first secondary coil.
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2021
- 2021-10-11 CN CN202111182248.0A patent/CN113961030A/en active Pending
Patent Citations (6)
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| US20070076456A1 (en) * | 2005-08-12 | 2007-04-05 | Samsung Electro-Mechanics Co., Ltd. | Constant voltage circuit for power adapter |
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