CN113933687B - Convenient test seat and test method thereof - Google Patents
Convenient test seat and test method thereof Download PDFInfo
- Publication number
- CN113933687B CN113933687B CN202111192938.4A CN202111192938A CN113933687B CN 113933687 B CN113933687 B CN 113933687B CN 202111192938 A CN202111192938 A CN 202111192938A CN 113933687 B CN113933687 B CN 113933687B
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- seat
- test
- circuit board
- convenient
- test seat
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Abstract
The invention relates to the technical field of test seats, in particular to a convenient test seat and a test method thereof, which comprises the following steps: pre-drawing a circuit board suitable for the distance between the burning seats; according to the circuit layout of the circuit board, the chip burning seat is directly connected to the circuit board through the convenient testing seat, and each pin is respectively connected to the corresponding bonding pad through a wire; the method comprises the following steps that a convenient test seat is selected according to the requirement of a chip burning seat, and the convenient test seat is divided into a main part and a second part, wherein the main part can be independently used, the second part can be freely disassembled, and the main part is connected to be used when the second part is needed, so that an auxiliary function is achieved; according to the invention, the circuit board suitable for the distance between the burning seats is drawn, and the chip burning seats are directly connected to the circuit board through the convenient test seats, so that the welding is more convenient, more convenient and more efficient, the loss of the chip in the chip welding and welding processes is reduced, and the device is more suitable for beginners to use; the times of insufficient soldering and missing soldering and the reject ratio during testing are reduced, and the time consumed by testing is shortened.
Description
Technical Field
The invention relates to the technical field of test seats, in particular to a convenient test seat and a test method thereof.
Background
The test socket is a standard test device for testing the electrical property and the electrical connection of the device to check the defects in production and manufacture and the defects of the device; in fact, the chip socket, which is defined less complex, is simply an interconnector for meeting certain test requirements of a certain chip. The static connector is a static connector between an integrated circuit and a printed circuit board, and can facilitate the replacement and test of a chip.
However, the existing one-time password chip cannot be repeatedly burned, the program needs to be burned and welded again after each change, the chip is easily damaged, a circuit board bonding pad falls off, and the chip pin rosin joint causes test errors, so that the time for checking the circuit is consumed.
Disclosure of Invention
Solves the technical problem
Aiming at the defects in the prior art, the invention provides the convenient test socket and the test method thereof, and solves the problems that the OTP chip cannot be repeatedly burned, the program needs to be burned and welded again every time the program is changed, the chip is easily damaged, a circuit board bonding pad falls off, and the chip pin rosin joint causes test errors, so that the circuit can be checked in a time-consuming manner.
Technical scheme
In order to achieve the purpose, the invention is realized by the following technical scheme:
in a first aspect, the invention discloses a convenient test socket testing method, which comprises the following steps:
s1: pre-drawing a circuit board suitable for the distance between the burning seats;
s2: according to the circuit layout of the circuit board in the S1, the chip burning seat is directly connected to the circuit board through the convenient test seat, and each pin is respectively connected to the corresponding bonding pad through a wire;
s21: selecting a convenient test seat according to the requirement of the chip burning seat in the S2, wherein the convenient test seat is divided into a main part and a second part, the main part can be independently used, the second part can be freely detached, and the main part is connected to play an auxiliary function when the second part is required;
s3: connecting the test board to a row bus of 1.27mm by adopting a distance of 2.54mm to 1.27mm, welding row pins on the circuit board to be tested, and finally directly connecting the circuit board to the row pins;
s4: judging according to a circuit board pre-drawn in S1, if the space distribution of the components is dense and the size of the components is large, the convenient test seat cannot be directly accommodated;
s5: after the circuit board cannot directly accommodate the convenient test seat, a smaller circuit board is connected through the flat cable.
Furthermore, the pin is used for leading out the connection with peripheral circuits from the internal circuit of the integrated circuit; the pads are used to form a pad pattern of the circuit board.
Furthermore, the chip burning seat and the convenient testing seat are connected to the bonding pad through the pins in a wire connection mode according to circuit board circuit layout.
Furthermore, the row of female with the row of needle is the one kind of connector, convenient test socket passes through 2.54mm and changes 1.27mm interval's connector and be connected to 1.27 mm's row female, will arrange female with board-to-board mode connection on the row needle simultaneously.
Furthermore, the flat cable is used for replacing a large-volume wire harness, and is also used for data transmission in the movable part and the movable area.
Furthermore, when the elements on the surface of the pre-drawn circuit board are distributed densely or the elements have large volumes, the pre-drawn circuit board is directly connected with the circuit board through the flat cable; wherein, what the winding displacement adopted is double-end winding displacement.
In a second aspect, the invention discloses a convenient test socket, which is an implementation structure for realizing the test method of the convenient test socket in any one aspect of the first aspect, and comprises a lower test socket and an upper test socket, wherein the front surface of the lower test socket is provided with a built-in groove, and a fixed plate is arranged in the built-in groove in a sliding manner through a sliding block and a return spring; the bottom end part of the upper test seat is fixedly provided with a connecting shaft column through a group of arc-shaped connecting blocks, the two end parts of the connecting shaft column are respectively provided with a mounting groove, the inner cavity of each mounting groove is fixedly connected with an inserting block through a telescopic spring, and the outer side of each inserting block is fixedly provided with a pushing and shifting block and extends to the outer side of the inserting block through the connecting shaft column; the upper test seat is rotatably installed at the top of the lower test seat through the connecting shaft column, the telescopic spring and the inserting block.
Furthermore, the opposite sides of the lower test seat are provided with connecting grooves, and the inserting blocks are inserted in the connecting grooves; an incomplete gear is rotatably mounted on the outer side of the middle part of the connecting shaft column through a rotating shaft, an arc-shaped tooth groove matched with the incomplete gear is formed in the top of the lower test seat, and the incomplete gear is meshed with the arc-shaped tooth groove; the top end of the upper test seat is rotatably connected with a clamping plate through a rotating shaft, and the clamping plate connected through the rotating shaft is connected with two opposite surfaces of the upper test seat through a torsion spring.
Furthermore, the opposite sides of the inner cavity of the built-in groove are provided with sliding grooves, the two sides of the fixed plate are fixedly provided with sliding blocks matched with the sliding grooves, and the sliding blocks are slidably arranged inside the sliding grooves.
Furthermore, a return spring is fixedly connected to the top wall of the inner cavity of the sliding groove, and one end, far away from the top wall of the inner cavity of the sliding groove, of the return spring is connected with the top of the sliding block.
Advantageous effects
Compared with the known public technology, the technical scheme provided by the invention has the following beneficial effects:
1. according to the invention, by drawing the circuit board suitable for the distance between the burning seats and directly connecting the chip burning seats to the circuit board through the convenient test seat, the welding time is shortened, the welding is more convenient and efficient, the loss of the chip in the chip welding and welding process is reduced, and the device is suitable for beginners to use; the times of insufficient soldering and missing soldering and the reject ratio during testing are reduced, and the time consumed by testing is shortened; in addition, a connector with the distance of 2.54mm to 1.27mm is connected to a row bus with the distance of 1.27mm, so that the phenomenon that repeated welding of chips and loss of a circuit board and repeated welding of welding pads cause falling is reduced, and the problem that other components are touched by mistake when the chips are welded to cause circuit damage is solved.
2. The convenient test seat is divided into the main part and the second part, and the inserting block is arranged in the connecting groove for assembly, so that the convenient test seat and the connecting groove can be conveniently and freely disassembled and assembled; the inserting block is supported by the telescopic spring, the inserting block can be freely pushed by the pushing and shifting block, the clamping plates are connected by the torsion spring, the fixing plates are connected by the return spring, and the front ends of the fixing plates can be stably clamped into the bottoms of the clamping plates so as to ensure the stability of the convenient test seat; in addition, incomplete gear and mutual cooperation of arc tooth's socket to test the seat and test the angle between the seat down in the regulation, the top of having avoided last test seat to test the seat under appears skidding the phenomenon.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
FIG. 1 is a schematic diagram of a test flow of a test socket according to the present invention;
FIG. 2 is a schematic perspective view of a test socket according to the present invention;
FIG. 3 is a schematic diagram of a main portion of the test socket of the present invention;
FIG. 4 is an enlarged view of the structure at A of FIG. 3;
FIG. 5 is a schematic perspective view of a second part of the test socket of the present invention;
FIG. 6 is a schematic structural view of the assembly member of the present invention;
the reference numerals in the drawings represent: 1. a lower test seat; 2. a fixing plate; 3. mounting a test seat; 4. clamping a plate; 5. an arc-shaped connecting block; 6. connecting the shaft columns; 7. an incomplete gear; 8. pushing the shifting block; 9. an insertion block; 10. mounting grooves; 11. a tension spring; 12. connecting grooves; 13. an arc-shaped tooth groove; 14. a built-in groove; 15. a sliding groove; 16. a return spring; 17. and a slider.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention. It is to be understood that the embodiments described are only a few embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The present invention will be further described with reference to the following examples.
Example 1
The embodiment provides a convenient test socket testing method, as shown in fig. 1, including the following steps:
s1: pre-drawing a circuit board suitable for the distance between the burning seats;
s2: according to the circuit layout of the circuit board in the S1, the chip burning seat is directly connected to the circuit board through the convenient test seat, and each pin is respectively connected to the corresponding bonding pad through a wire;
s21: selecting a convenient test seat according to the requirement of the chip burning seat in the S2, wherein the convenient test seat is divided into a main part and a second part, the main part can be independently used, the second part can be freely detached, and the main part is connected to play an auxiliary function when the second part is required;
s3: connecting the test board to a row bus of 1.27mm by adopting a distance of 2.54mm to 1.27mm, welding row pins on the circuit board to be tested, and finally directly connecting the circuit board to the row pins;
s4: judging according to a circuit board pre-drawn in S1, if the space distribution of the components is dense and the size of the components is large, the convenient test seat cannot be directly accommodated;
s5: after the circuit board cannot directly accommodate the convenient test seat, a smaller circuit board is connected through the flat cable.
In the embodiment, the pin is used for leading out the wiring with a peripheral circuit from an internal circuit of the integrated circuit; the pads are used to form a pad pattern of the circuit board.
According to the circuit layout of the circuit board, the chip burning seat and the convenient testing seat are connected to the bonding pad through the pins in a wire connection mode.
Female and the row needle of this embodiment all are one kind of connector, and convenient test socket is connected to 1.27 mm's row mother through the connector that 2.54mm changes 1.27mm interval, will arrange the mother and connect on row needle with the board-to-board mode simultaneously.
The flat cable of the embodiment is used for replacing a wire harness lead with a larger volume, and is also used for data transmission in a movable part and a movable area.
In the embodiment, when the elements on the surface of the pre-drawn circuit board are densely distributed or the elements have large volumes, the pre-drawn circuit board is directly connected with the circuit board through the flat cable; wherein, the winding displacement adopts the double-end winding displacement.
In the embodiment, the convenient test seat is divided into a main part and a second part, and the main part and the second part are assembled by arranging the inserting block in the connecting groove, so that the main part and the second part can be freely disassembled and assembled; the main part can independently test the chip, and the second part can be connected with the main part and plays a role of assisting the main part in testing the chip.
According to the invention, by drawing the circuit board suitable for the distance between the burning seats and directly connecting the chip burning seats to the circuit board through the convenient test seat, the welding time is shortened, the welding is more convenient and efficient, the loss of the chip in the chip welding and welding process is reduced, the device is more suitable for beginners to use, the times of insufficient soldering and missing soldering and the reject ratio during testing are reduced, and the time consumed by testing is shortened.
The connector with the distance of 2.54mm to 1.27mm is connected to the row bus with the distance of 1.27mm, so that the phenomena of repeated welding of chips, loss of circuit boards and falling of welding pads caused by multiple times of welding are reduced, and the problem of circuit damage caused by mistaken collision of other components during welding of the chips is solved.
Example 2
In a specific implementation layer, the convenient test socket of this embodiment has a structure of implementing any one of the convenient test socket test methods of embodiment 1, as shown in fig. 2 to 4, and includes a lower test socket 1 and an upper test socket 3, a built-in groove 14 is formed in the front surface of the lower test socket 1, and a fixing plate 2 is slidably mounted inside the built-in groove 14 through a sliding block 17 and a return spring 16.
As shown in fig. 5 to 6, a connecting shaft column 6 is fixedly installed at the bottom end of the upper test seat 3 through a group of arc-shaped connecting blocks 5, mounting grooves 10 are respectively formed at two end portions of the connecting shaft column 6, an inner cavity of each mounting groove 10 is fixedly connected with an insertion block 9 through a telescopic spring 11, and a pushing block 8 is fixedly installed at the outer side of each insertion block 9 and penetrates through the connecting shaft column 6 to extend to the outer side of the corresponding insertion block; wherein, the upper test seat 3 is rotatably arranged at the top of the lower test seat 1 through the connecting shaft column 6, the telescopic spring 11 and the inserting block 9.
The present embodiment is assembled by dividing the portable test socket into a main portion and a second portion, and arranging the plug block 9 in the connection groove 10, so as to facilitate the free disassembly and assembly between the two.
This embodiment is supported by expanding spring 11 because of grafting piece 9, and the accessible pushes away shifting block 8 and freely promotes grafting piece 9, and cardboard 4 is connected by torsion spring, and fixed plate 2 is connected by reset spring 16, and the card that 2 front ends of fixed plate can be stable goes into the bottom of cardboard 4 to ensure the stability of convenient test seat.
In the invention, when testing the chip, the chip to be tested is placed in the inner side of the lower test seat 1, and the convenient test seat is directly connected to the circuit board, so that the welding time is shortened, the welding is more convenient and efficient, the loss of the chip in the chip welding and welding process is reduced, and the chip testing device is more suitable for beginners to use; when needed, the upper test socket 3 is connected to the lower test socket 1 for use, so as to play a role in assisting the lower test socket 1 in testing the chip.
Example 3
In a specific implementation aspect, the embodiment provides a convenient test socket, as shown in fig. 3 to 6, connection grooves 12 are formed on opposite sides of the lower test socket 1, and the insertion block 9 is inserted into the connection grooves 12; an incomplete gear 7 is rotatably mounted on the outer side of the middle part of the connecting shaft column 6 through a rotating shaft, an arc-shaped tooth groove 13 which is matched with the incomplete gear 7 is formed in the top of the lower test seat 1, and the incomplete gear 7 is meshed with the arc-shaped tooth groove 13; the top end of the upper testing seat 3 is rotatably connected with a clamping plate 4 through a rotating shaft, and the clamping plate 4 connected through the rotating shaft and two opposite surfaces of the upper testing seat 3 are connected through a torsion spring.
In this embodiment, sliding grooves 15 have all been seted up to the opposite side of built-in groove 14 inner chamber, and the equal fixed mounting in both sides of fixed plate 2 has the sliding block 17 that suits with sliding grooves 15, and sliding block 17 slidable mounting is in the inside of sliding grooves 15.
The top wall of the inner cavity of the sliding groove 15 is fixedly connected with a return spring 16, and one end of the return spring 16, which is far away from the top wall of the inner cavity of the sliding groove 15, is connected with the top of a sliding block 17.
According to the invention, the inserting block 9 is supported by the telescopic spring 11, the inserting block 9 can be freely pushed by the pushing and shifting block 8, the clamping plate 4 is connected by the torsion spring, the fixing plate 2 is connected by the return spring 16, and the front end of the fixing plate 2 can be stably clamped into the bottom of the clamping plate 4, so that the stability of the convenient test seat is ensured.
The incomplete gear 7 and the arc-shaped tooth socket 13 are matched with each other, so that the angle between the upper test seat 3 and the lower test seat 1 can be adjusted conveniently, and the phenomenon that the upper test seat 3 slips at the top of the lower test seat 1 is avoided.
In conclusion, by drawing the circuit board suitable for the distance between the burning seats and directly connecting the chip burning seats to the circuit board through the convenient test seat, the welding time is shortened, the welding is more convenient and efficient, the loss of the chip in the chip welding and welding process is reduced, and the method is suitable for beginners to use; the times of insufficient soldering and missing soldering and the reject ratio during testing are reduced, and the time consumed by testing is shortened; in addition, a connector with the distance of 2.54mm to 1.27mm is connected to a row bus with the distance of 1.27mm, so that the phenomena of repeated welding of chips, loss of circuit boards and falling caused by repeated welding of bonding pads are reduced, and the problem of circuit damage caused by mistakenly touching other components during welding of the chips is solved.
The convenient test seat is divided into a main part and a second part, and the convenient test seat is assembled by arranging the inserting block in the connecting groove, so that the convenient test seat and the connecting groove can be freely disassembled and assembled; the inserting block is supported by the telescopic spring, the inserting block can be freely pushed by the pushing and shifting block, the clamping plates are connected by the torsion spring, the fixing plates are connected by the return spring, and the front ends of the fixing plates can be stably clamped into the bottoms of the clamping plates so as to ensure the stability of the convenient test seat; in addition, incomplete gear and mutual cooperation of arc tooth's socket to test the seat and test the angle between the seat down in the regulation, the top of having avoided last test seat to test the seat under appears skidding the phenomenon.
The above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (6)
1. The convenient test seat test method is characterized by comprising the following steps:
s1: pre-drawing a circuit board suitable for the distance between the burning seats;
s2: according to the circuit layout of the circuit board in the S1, the chip burning seat is directly connected to the circuit board through the convenient test seat, and each pin is respectively connected to the corresponding bonding pad through a wire;
s21: selecting a convenient test seat according to the requirement of the chip burning seat in the S2, wherein the convenient test seat is divided into a main part and a second part, the main part can be independently used, the second part can be freely detached, and the main part is connected to play an auxiliary function when the second part is required;
s3: connecting the test board to a row mother board with the length of 1.27mm by adopting the distance of 2.54mm to 1.27mm, then welding a row pin on the circuit board to be tested, and finally directly connecting the row pin on the row pin;
s4: judging according to a circuit board drawn in advance in S1, if the space distribution of the components is dense and the volume of the components is large, the convenient test seat cannot be directly accommodated;
s5: after the circuit board cannot directly accommodate the convenient test seat, a smaller circuit board is connected through the flat cable;
the pin is used for leading out wiring with a peripheral circuit from an internal circuit of the integrated circuit; the pad is used for forming a pad pattern of the circuit board;
the chip burning seat and the convenient testing seat are connected to the bonding pad in a wire connection mode through the pins according to circuit layout of a circuit board;
the convenient test seat comprises a lower test seat (1) and an upper test seat (3), wherein a built-in groove (14) is formed in the front face of the lower test seat (1), and a fixed plate (2) is installed inside the built-in groove (14) in a sliding mode through a sliding block (17) and a return spring (16); a connecting shaft column (6) is fixedly installed at the bottom end of the upper test seat (3) through a group of arc-shaped connecting blocks (5), mounting grooves (10) are formed in two end portions of the connecting shaft column (6), an inner cavity of each mounting groove (10) is fixedly connected with an inserting block (9) through a telescopic spring (11), and a pushing and shifting block (8) is fixedly installed on the outer side of each inserting block (9) and penetrates through the connecting shaft column (6) to extend to the outer side of the inserting block; the upper test seat (3) is rotatably arranged at the top of the lower test seat (1) through a connecting shaft column (6), a telescopic spring (11) and an inserting block (9);
the opposite sides of the lower test seat (1) are provided with connecting grooves (12), and the inserting block (9) is inserted into the connecting grooves (12); an incomplete gear (7) is rotatably mounted on the outer side of the middle part of the connecting shaft column (6) through a rotating shaft, an arc-shaped tooth groove (13) matched with the incomplete gear (7) is formed in the top of the lower test seat (1), and the incomplete gear (7) is meshed with the arc-shaped tooth groove (13); the top end part of the upper test seat (3) is rotatably connected with a clamping plate (4) through a rotating shaft, and the clamping plate (4) connected through the rotating shaft is connected with two opposite surfaces of the upper test seat (3) through a torsion spring.
2. The handy test socket test method of claim 1, wherein the row of female connectors and the row of pins are one type of connectors, and the handy test socket is connected to the row of female connectors of 1.27mm through connectors of 2.54mm to 1.27mm spacing, and the row of female connectors is connected to the row of pins in a plate-to-plate manner.
3. The portable test socket testing method of claim 1, wherein the ribbon cable is used to replace bulky harness wires, and also used for data transmission in active components and active areas.
4. The test method for the convenient test socket according to claim 1, wherein when the elements on the surface of the pre-drawn circuit board are densely distributed or the elements have large volumes, the pre-drawn circuit board is directly connected with the circuit board through the flat cable; wherein, what the winding displacement adopted is double-end winding displacement.
5. The convenient test socket test method according to claim 4, wherein sliding grooves (15) are formed in opposite sides of an inner cavity of the built-in groove (14), sliding blocks (17) corresponding to the sliding grooves (15) are fixedly mounted on two sides of the fixing plate (2), and the sliding blocks (17) are slidably mounted inside the sliding grooves (15).
6. The test method for the convenient test socket according to claim 5, wherein a return spring (16) is fixedly connected to the top wall of the inner cavity of the sliding groove (15), and one end of the return spring (16) far away from the top wall of the inner cavity of the sliding groove (15) is connected with the top of the sliding block (17).
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| Application Number | Priority Date | Filing Date | Title |
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| CN202111192938.4A CN113933687B (en) | 2021-10-13 | 2021-10-13 | Convenient test seat and test method thereof |
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| CN202111192938.4A CN113933687B (en) | 2021-10-13 | 2021-10-13 | Convenient test seat and test method thereof |
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| CN113933687B true CN113933687B (en) | 2022-08-19 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US6844749B2 (en) * | 2002-07-18 | 2005-01-18 | Aries Electronics, Inc. | Integrated circuit test probe |
| CN201194023Y (en) * | 2008-04-07 | 2009-02-11 | 比亚迪股份有限公司 | Integrated circuit testing apparatus |
| CN207396551U (en) * | 2017-11-09 | 2018-05-22 | 中航（重庆）微电子有限公司 | A kind of test fixture |
| CN210572517U (en) * | 2019-05-16 | 2020-05-19 | 福州拓威电子科技有限公司 | Electronic component testing device convenient to use |
| CN211044107U (en) * | 2019-10-24 | 2020-07-17 | 福建星网智慧科技有限公司 | Flash switching structure based on FPC |
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