CN113928604B - Device and method for testing performance of high-temperature heat shield of deep space exploration spacecraft - Google Patents
Device and method for testing performance of high-temperature heat shield of deep space exploration spacecraft Download PDFInfo
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- CN113928604B CN113928604B CN202111216067.5A CN202111216067A CN113928604B CN 113928604 B CN113928604 B CN 113928604B CN 202111216067 A CN202111216067 A CN 202111216067A CN 113928604 B CN113928604 B CN 113928604B
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B64—AIRCRAFT; AVIATION; COSMONAUTICS
- B64G—COSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
- B64G7/00—Simulating cosmonautic conditions, e.g. for conditioning crews
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M99/00—Subject matter not provided for in other groups of this subclass
- G01M99/002—Thermal testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
Abstract
The invention provides a device and a method for testing the performance of a high-temperature heat shield of a deep space exploration spacecraft, wherein the device comprises a heat shield to be detected, a test bench, a lamp array assembly, a reflecting screen, a liquid nitrogen vacuum tank assembly, a heating temperature measuring assembly and a mass spectrum tester assembly; the high-temperature heat shield to be tested, the reflecting screen and the lamp array assembly are all arranged on the test bench, and the reflecting screen is positioned between the high-temperature heat shield to be tested and the lamp array assembly; the test bed is arranged in the liquid nitrogen vacuum tank assembly, the heating temperature measuring assembly is connected with the high-temperature heat shield to be tested, and the mass spectrum tester assembly is connected with the high-temperature heat shield to be tested. The invention has convenient installation and wide application range, and is suitable for testing different temperature areas, especially high temperature areas, of the high-temperature heat shield or other heat-insulating components.
Description
Technical Field
The invention relates to a thermal control technology of a spacecraft, in particular to a device and a method for testing the performance of a high-temperature heat shield of a deep space exploration spacecraft.
Background
The high thrust engine of the spacecraft mostly adopts the steps of mixing and burning the combustion agent and the oxidant, and injecting high-temperature and high-speed gas to generate thrust so as to realize the purposes of track change and the like. The first Mars detector undergoes multiple acceleration, rail change and deceleration on the ground fire transfer rail, the throat temperature can reach 1200 ℃ when the rail control engine works, strong heat radiation is generated on stars, and the generated exhaust plume also influences the normal work of an in-satellite load instrument; when the engine does not work, the star faces to a 4K space cold black background heat sink, and in order to ensure the safety of the star and equipment, the star needs to be subjected to heat insulation design. The multi-layer heat insulation assembly which is mostly adopted at present is generally composed of a plurality of high-temperature and medium-temperature units, wherein the high-temperature units use high-temperature resistant metal foils and fiber layers as reflecting layers and spacing layers, the reflecting layers are stainless steel foils, nickel foils and the like, and the medium-temperature units use lighter aluminum foils as reflecting layers. For thermal protection in the vicinity of the engine, it is self-evident that the performance of the aircraft is a significant measure of ensuring the reliability of the product, since it is blocked from high temperatures entering the interior of the aircraft.
The multi-layer heat insulation assembly has been studied for heat insulation performance at low temperature by the lan state physical institute, the university of Zhejiang and the like, and the method used is a heat protection flat plate method or a similar method, namely a contact heating method, and the study purpose is to measure the heat leakage under the low temperature condition. In the performance test method of the multi-layer heat insulation assembly provided by the research of five-hospital and Shanghai silicate of spaceflight, a heating wire, a heating plate and a heating rod are adopted for contact heating, the test temperature is limited by the heat source temperature resistance, and the simulation test cannot be carried out on the temperature environment of the high-temperature heat shield reaching 1000 ℃.
The patent document with the publication number of CN102765488A discloses a manned spacecraft atmospheric pressure heat test system and a method for carrying out an atmospheric pressure heat test by using the same. However, the patent document still has the defect of limited heat source resistance and small application range.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a device and a method for testing the performance of a high-temperature heat shield of a deep space exploration spacecraft.
The invention provides a performance testing device for a high-temperature heat shield of a deep space exploration spacecraft, which comprises a heat shield to be detected, a test bench, a lamp array assembly, a reflecting screen, a liquid nitrogen vacuum tank assembly, a heating temperature measuring assembly and a mass spectrum tester assembly, wherein the test bench is arranged on the heat shield;
the high-temperature heat shield to be tested, the reflecting screen and the lamp array assembly are all arranged on the test bench, and the reflecting screen is positioned between the high-temperature heat shield to be tested and the lamp array assembly;
the test bed is arranged in the liquid nitrogen vacuum tank assembly, the heating temperature measuring assembly is connected with the high-temperature heat shield to be tested, and the mass spectrum tester assembly is connected with the high-temperature heat shield to be tested.
Preferably, the lamp array assembly comprises a heat source, an insulating high-temperature-resistant plate and a lamp array frame;
the insulating high temperature resistant plate is arranged on the lamp array frame, and the heat source is arranged on the insulating high temperature resistant plate.
Preferably, the heat source is an infrared quartz lamp.
Preferably, the infrared quartz lamps are arranged in a plurality, and the infrared quartz lamps are uniformly distributed on the insulating high-temperature-resistant plate in a front-back cross close arrangement.
Preferably, the insulating high temperature resistant plate is a mica sheet.
Preferably, a temperature measuring element is arranged in the high-temperature heat shield to be measured, and the temperature measuring element is connected with the heating temperature measuring component through a tank penetrating cable.
Preferably, the temperature measuring element is arranged on the high-temperature side, the low-temperature side and the middle layer of the heat shield to be measured;
the temperature measuring element is stuck and fixed by adopting silicon rubber, the low temperature side and the middle layer are fixed on the high temperature side by adopting a double connection mode of gluing and welding.
The invention also provides a testing method based on the deep space exploration spacecraft high-temperature heat shield performance testing device, which comprises the following steps:
test preparation working steps: manufacturing a multi-layer test piece and a lamp array assembly according to the processing of a test object, installing the multi-layer test piece and the lamp array assembly to a test bed, and placing the test bed into a liquid nitrogen vacuum tank assembly to finish the test of a necessary power supply and a heating temperature measuring assembly;
establishing a testing environment: the liquid nitrogen vacuum tank assembly starts vacuumizing, liquid nitrogen is introduced, and the heat sink is cooled to be below K;
and an equivalent heat conductivity coefficient testing step: starting one row or two rows of lamps in the front and rear rows of lamp assemblies according to the requirement, heating the multi-layer test piece, controlling heating power, enabling the temperature of a hot surface to be at different temperatures, waiting for temperature balance, and obtaining the internal temperature distribution of the multi-layer test piece at different temperatures;
and a thermal shock testing step: closing the lamp array assembly, starting two rows of lamp tubes of the lamp array assembly after the multi-layer hot surface is reduced to a preset initial temperature, simulating the starting-up operation of a high-power engine or a radiation heat source, heating the multi-layer test piece in a high power mode, closing the lamp array assembly after the multi-layer test piece is heated for a period of time equal to the working time of the engine or the radiation heat source, and recording data of each measuring point of the heat shield to be detected in the thermal shock process;
and a heat insulation performance analysis step: analyzing and calculating the multilayer equivalent heat conductivity coefficient according to the temperature distribution in the multilayer test piece obtained in the equivalent heat conductivity coefficient testing step;
and a temperature-resistant impact performance analysis step: analyzing the effectiveness of a thermal shock test according to the data obtained in the thermal shock test step, and analyzing and predicting the low-temperature side temperature rise rate under the rail condition;
and a temperature resistance analysis step: judging whether the material property inside the high-temperature heat shield is changed according to the temperature rise and balance curves obtained in the equivalent heat conductivity testing step and the thermal shock testing step, if the temperature curve of a certain measuring point is distorted in the test, recording the temperature value of the corresponding measuring point when the temperature curve is changed, and checking the state of a test piece after the test is finished and the vacuum tank is opened to confirm whether the material is changed.
Preferably, in the equivalent heat conductivity coefficient testing step, the test working conditions are finished from low temperature to high temperature one by one.
Preferably, in the thermal shock testing step, the highest temperature, the heating rate and the multilayer internal temperature distribution reached by each measuring point of the high-temperature heat shield in the thermal shock process are recorded.
Compared with the prior art, the invention has the following beneficial effects:
1. the device has simple structure and convenient construction, can process special devices, and can expand the number of test positions and lamp arrays according to the needs so as to meet the requirements of completing the test of test pieces of different types and different batches of products at one time;
2. the invention adopts non-contact high heat flux density heating, and has the advantages of high simulation fidelity and high test result confidence;
3. the testing method and the analysis method are simple, and the product performance can be rapidly and comprehensively evaluated;
4. the invention has convenient installation and wide application range, and is suitable for testing different temperature areas, especially high temperature areas, of the high-temperature heat shield or other heat-insulating components;
5. the invention has the advantages of high simulation fidelity and high test result confidence;
6. the invention can measure and analyze the condensable and volatilizing property of the material under the condition of extremely high vacuum temperature or extremely low vacuum temperature, and can indirectly judge the influence of volatilizing the material under the condition of high vacuum temperature on the photoelectric equipment;
7. the invention has simple structure and simple testing method, has various thermal performance and volatility analysis functions, and can rapidly and comprehensively evaluate the comprehensive performance of the product.
Drawings
Other features, objects and advantages of the present invention will become more apparent upon reading of the detailed description of non-limiting embodiments, given with reference to the accompanying drawings in which:
FIG. 1 is a schematic diagram of a testing apparatus of the present invention;
FIG. 2 is a schematic diagram of the structure of the lamp array assembly of the present invention;
FIG. 3 is a schematic diagram of a method for fixing a temperature measuring element on the surface of a metal foil at a high temperature side;
FIG. 4 is a graph of an exemplary equivalent thermal conductivity test of the present invention.
The figure shows:
test bench 1 mica insulation board 9
Heat shield 2 lamp array frame 10 to be detected
High temperature side metal foil 11 of lamp array assembly 3
Metal wing 12 of reflecting screen 4
Instant adhesive 502 adhesive 13 of liquid nitrogen vacuum tank assembly 5
Heating temperature measuring component 6 temperature measuring element head 14
High-temperature inorganic adhesive 15 of mass spectrum tester assembly 7
Heat source 8
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the present invention, but are not intended to limit the invention in any way. It should be noted that variations and modifications could be made by those skilled in the art without departing from the inventive concept. These are all within the scope of the present invention.
Example 1:
as shown in fig. 1 to 4, the device for testing the performance of the high-temperature heat shield of the deep space exploration spacecraft provided by the embodiment comprises a heat shield 2 to be detected, a test bench 1, a lamp array assembly 3, a reflection screen 4, a liquid nitrogen vacuum tank assembly 5, a heating temperature measuring assembly 6 and a mass spectrum tester assembly 7, wherein the heat shield 2 to be detected, the reflection screen 4 and the lamp array assembly 3 are all arranged on the test bench 1, the reflection screen 4 is arranged between the heat shield 2 to be detected and the lamp array assembly 3, the test bench 1 is arranged in the liquid nitrogen vacuum tank assembly 5, the heating temperature measuring assembly 6 is connected with the heat shield 2 to be detected, and the mass spectrum tester assembly 7 is connected with the heat shield 2 to be detected.
The lamp array assembly 3 comprises a heat source 8, an insulating high temperature resistant plate 9 and a lamp array frame 10, wherein the insulating high temperature resistant plate 9 is arranged on the lamp array frame 10, the heat source 8 is arranged on the insulating high temperature resistant plate 9, the heat source 8 is a plurality of infrared quartz lamps, the infrared quartz lamps are uniformly arranged on the insulating high temperature resistant plate 9 in a front-back crossed close arrangement, and the insulating high temperature resistant plate 9 is a mica thin plate.
The heat shield 2 to be detected is internally provided with a temperature measuring element 16, the temperature measuring element 16 is connected with the heating temperature measuring component 6 through a tank penetrating cable, the temperature measuring element 16 is arranged on the high temperature side, the low temperature side and the middle layer of the heat shield 2 to be detected, the temperature measuring element 16 is fixed on the low temperature side and the middle layer by adopting silicon rubber adhesion, and the temperature measuring element 16 is fixed on the high temperature side by adopting a double connection mode of gluing and welding.
The invention also provides a testing method based on the deep space exploration spacecraft high-temperature heat shield performance testing device, which comprises the following steps:
test preparation working steps: and manufacturing a multi-layer test piece and lamp array assembly 3 according to the processing of a test object, installing the multi-layer test piece and lamp array assembly 3 to a test stand 1, and placing the test stand into a liquid nitrogen vacuum tank assembly 5 to complete the test of a necessary power supply and heating temperature measuring assembly 6.
Establishing a testing environment: the liquid nitrogen vacuum tank assembly 5 starts to vacuumize, liquid nitrogen is introduced, and the heat sink is cooled to be below 100K.
And an equivalent heat conductivity coefficient testing step: and starting one or two rows of lamps in the front and rear rows of lamps of the front and rear lamp array assembly 3 according to the requirement, heating the multi-layer test piece, controlling heating power, enabling the temperature of a hot surface to be at different temperatures, waiting for temperature balance, and obtaining the internal temperature distribution of the multi-layer test piece at different temperatures, wherein the test working condition is finished from low temperature to high temperature one by one.
And a thermal shock testing step: after the multi-layer hot surface is reduced to the preset initial temperature, the lamp array assembly 3 is closed, two rows of lamp tubes of the lamp array assembly 3 are opened, a high-power engine or a radiation heat source is simulated to start up to work, the multi-layer test piece is heated in a high power mode, after the multi-layer test piece is heated for a period of time equal to the working time of the engine or the radiation heat source, the lamp array assembly 3 is closed, data of each test point of the high-temperature heat shield 2 to be tested in a thermal shock process are recorded, and the highest temperature, the heating rate and the multi-layer internal temperature distribution reached by each test point of the high-temperature heat shield in the thermal shock process are recorded.
And a heat insulation performance analysis step: and analyzing and calculating the multilayer equivalent heat conductivity coefficient according to the internal temperature distribution of the multilayer test piece obtained in the equivalent heat conductivity coefficient testing step.
And a temperature-resistant impact performance analysis step: and analyzing the effectiveness of the thermal shock test according to the data obtained in the thermal shock test step, and analyzing and predicting the low-temperature side temperature rise rate under the rail condition.
And a temperature resistance analysis step: judging whether the material property inside the high-temperature heat shield is changed according to the temperature rise and balance curves obtained in the equivalent heat conductivity testing step and the thermal shock testing step, if the temperature curve of a certain measuring point is distorted in the test, recording the temperature value of the corresponding measuring point when the temperature curve is changed, and checking the state of a test piece after the test is finished and the vacuum tank is opened to confirm whether the material is changed.
Example 2:
the present embodiment will be understood by those skilled in the art as a more specific description of embodiment 1.
A performance testing device for a high-temperature heat shield of a deep space exploration spacecraft comprises the following parts: the liquid nitrogen vacuum container, the test bench, the infrared lamp array, the reflecting screen, the temperature measuring element, the temperature measuring heating system, accessories and the like.
The test bed is provided with two hanging beams, one hanging beam uses steel wires to hang the multi-layer heat insulation assembly to be tested, the other hanging beam hangs the lamp array assembly, and the rear side of the lamp array assembly is provided with a reflecting screen. The test bed is fixed on a guide rail of a liquid nitrogen vacuum container. The high-temperature heat shield is internally provided with a temperature measuring element, the lead wire is connected with the tank penetrating cable and is connected with the temperature measuring system outside the tank after being led out, and the lamp array power wire is connected with the programmable power supply after being led out.
The heat source of the lamp array component is an infrared quartz lamp, the lamp tubes are arranged on an insulating high-temperature-resistant plate on the lamp array frame, the insulating high-temperature-resistant plate is preferably a mica thin plate, and the insulating high-temperature-resistant plate is uniformly distributed in a front-back cross close arrangement. The reflecting screen is arranged on the back side of the lamp array, and the reflecting screen is made of high-reflectivity metal material and can bear high temperature.
The measuring range of the temperature measuring element is as follows: -200-1200 ℃, such as nickel chromium-nickel silicon type thermocouples; the temperature measuring element is arranged on the high-temperature side, the low-temperature side and the middle layer of the multi-layer test piece, the middle layer or the low-temperature side area with the test temperature not higher than 200 ℃ can be fixed by adopting adhesion such as silicone rubber; the temperature measuring element on the high temperature side metal foil adopts a double connection mode of gluing and welding, the gluing glue is high temperature inorganic glue, and the welding mode is spot welding. The specific pasting mode is as follows:
a) Polishing the metal foil sticking position properly by using sand paper, dipping alcohol by using gauze, removing excessive materials and airing;
b) And placing the head of the temperature measuring element at a pasting position, and temporarily fixing the head by using the instant adhesive.
c) The small wing pieces made of the same material as the high-temperature side metal foil are fixed on the outer side of the head of the temperature measuring element in a spot welding mode, so that the range of the head is covered;
d) Gluing the whole head, filling the space between the head of the temperature measuring element and the metal wing pieces with colloid, and covering the metal wing pieces;
e) The metal tab fixing head lead-out wire is fixed by spot welding using the same method.
The vacuum tank is internally provided with a condensable volatile monitoring probe which is connected with the mass spectrum monitoring device outside the tank, so that the weight and the type of the condensable volatile of the material in the tank are measured in real time, and the escape condition of the condensable volatile of the material under the condition of extremely high temperature or extremely low temperature of the material in vacuum test can be analyzed. An optical pollution monitoring lens is placed in the vacuum tank, a spectrum reflectivity curve of 250 nm-16000 nm is measured before and after entering and exiting the vacuum tank, and the change is compared, so that the influence of volatilization of materials at a high temperature in vacuum on photoelectric equipment is indirectly judged.
A performance test method for a high-temperature heat shield of a deep space exploration spacecraft comprises the following steps:
step one, test preparation work
And processing and manufacturing a plurality of layers and lamp array components according to the test object, mounting the lamp array components on a test bench, and placing the test bench into a liquid nitrogen vacuum tank to complete the test of a necessary power supply and temperature measuring system.
Step two, establishing a test environment
The vacuum tank starts to vacuumize, liquid nitrogen is introduced, and the temperature is reduced to below 100K by heat sink;
step three, equivalent thermal conductivity testing
Starting one or two rows of front and rear lamp arrays in front and rear rows of lamp tubes according to requirements, heating a multi-layer test piece, controlling heating power, enabling the temperature of a hot surface to be at different temperatures, waiting for temperature balance, obtaining multi-layer internal temperature distribution at different temperatures, and completing test working conditions from low temperature to high temperature one by one;
step four, thermal shock testing
And closing the lamp array, starting two rows of lamp tubes of the lamp array after the multi-layer hot surface is reduced to the preset initial temperature, simulating the starting up operation of a high-power engine or a radiation heat source, heating the multi-layer test piece in a high power mode, and closing the lamp array after the multi-layer test piece is heated for a period of time equal to the working time of the engine or the radiation heat source. And recording the data of the highest temperature, the heating rate, the multilayer internal temperature distribution and the like of each measuring point of the high-temperature heat shield in the thermal shock process.
Step five, analyzing heat insulation performance
Analyzing and calculating the multilayer equivalent heat conductivity coefficient according to the temperature distribution inside the multilayer test piece obtained in the step three;
step six, temperature and impact resistance analysis
And (3) analyzing the effectiveness of the thermal shock test according to the data obtained in the step four, and analyzing and predicting the low-temperature side temperature rise rate under the rail condition.
Step seven, temperature resistance analysis
Judging whether the material property inside the high-temperature heat shield is changed according to the temperature rise and balance curves obtained in the third and fourth steps, if the temperature curve of a certain measuring point is distorted in the test, recording the temperature value of the corresponding measuring point when the temperature curve is changed. After the test is finished and the vacuum tank is opened, the state of the test piece is checked to determine whether the material is changed.
Example 3:
the present embodiment will be understood by those skilled in the art as more specific descriptions of embodiment 1 and embodiment 2.
The testing device comprises a test bench, a high-temperature heat shield to be tested, a lamp array assembly, a reflecting screen, a liquid nitrogen vacuum tank system, a heating and temperature measuring system and accessories such as a mass spectrometer and a probe. The lamp array assembly consists of an infrared quartz lamp, a mica insulating plate and a lamp array frame.
The heat shield to be detected and the lamp array assembly are placed on a test bed through a hanging method, a reflecting screen is additionally arranged after the heat shield to be detected, the test bed is placed in a liquid nitrogen vacuum tank during test, and the heating power of the lamp array and the temperature measurement of different position measuring points in a multilayer are controlled through a heating temperature measuring system and accessories; the mass spectrum tester is arranged outside the tank and connected with the probe in the tank through a cable; in the lamp array assembly, electrodes at two ends of an infrared quartz lamp are connected to a mica insulating plate in a threaded manner, and lamp tubes are arranged on two sides of a mica plate in a crossed and closely-arranged manner, so that contact between the lamp arrays is avoided. The mica insulation board is arranged on the lamp array frame.
The fixing method of the thermocouple head of the high-temperature side metal foil surface temperature measuring element comprises the following steps: the head of the temperature measuring element is temporarily fixed by using the instant adhesive 502 adhesive, the head is covered by a metal fin made of the same material as the multi-layer surface, and the high-temperature inorganic adhesive is filled. The thermocouple outgoing line of the temperature measuring element is fixed by spot welding with a metal foil fin by the same method.
The size of the heat shield to be detected is preferably 300mm multiplied by 300mm, and the size of the lamp array assembly is at least 100mm larger than that of the heat shield to be detected. When the test device is installed, the high-temperature side of the heat shield to be detected is ensured to be opposite to the middle area of the infrared lamp array, so that the heat flux density of the surface of the multi-layer high-temperature side is as uniform as possible. And pasting temperature measuring elements on each layer in the heat shield to be detected according to the requirement, wherein the temperature measuring elements on the high-temperature side metal foil are pasted by adopting high-temperature glue, and the head and the outgoing line are fixed by spot welding by using fins made of the same metal.
The condensable volatile monitoring probe is placed in the tank and connected with the monitoring and recording equipment outside the tank. And (5) measuring the spectral reflectance curve of the optical pollution monitoring lens between 250nm and 16000nm, and placing the optical pollution monitoring lens into a vacuum tank.
The test support is placed in a liquid nitrogen vacuum tank, after necessary heating and temperature measuring system test is carried out, the tank is closed for vacuumizing, and liquid nitrogen is introduced for cooling. And after the temperature of the base parts around the heat sink is not higher than 100K, carrying out different temperature working condition tests one by one from low temperature to high temperature.
And (3) starting an infrared lamp array, adjusting the power of the lamp array, heating the multi-layer high-temperature side to the temperature of the designed working condition, such as 100 ℃, 200 ℃, 300 ℃, 500 ℃, keeping the temperature of other temperature measuring points in the high-temperature heat shield stable, and recording the balance temperature. The test temperature is generally not more than 1000 ℃.
After the test is completed, the lamp array is turned off, and the high-temperature heat shield is reduced to a preset initial temperature of-100 ℃. And (5) starting the lamp array according to the power of the test outline, heating the high-temperature heat shield in a high power mode, and closing the lamp array after heating for 2000 s.
In the whole test process, the probe in the tank collects the condensable volatile matters in the test process in real time, a real-time curve is formed through the mass spectrum tester outside the tank, the types of the condensable volatile matters are analyzed, and the condensable volatile properties of the test component materials can be compared and analyzed under the conditions of extremely high temperature or extremely low temperature in vacuum. After the material is taken out of the tank, the spectral reflectance curve of the optical pollution monitoring lens is measured at 250 nm-16000 nm, and compared with the measurement result before the material is taken in the tank, so that the influence of the volatilization of the material at the vacuum high temperature on the photoelectric equipment can be indirectly judged.
In the test method provided by the embodiment of the invention, the principle of measuring the equivalent heat conductivity coefficient is as follows:
the equivalent thermal conductivity of the high temperature heat shield is an important parameter characterizing the thermal insulation properties of the high temperature heat shield.
When calculating equivalent heat conductivity coefficient, the multilayer structure is regarded as a continuous solid flat plate with the thickness delta, and the equivalent heat conductivity lambda is derived by applying Fourier heat conductivity law eq The calculation formula:
wherein T is L Is the low temperature side temperature, T H Is the low temperature side temperature, T 0 For heat sink temperature, in the test herein, for a multilayer that is exposed to radiant heat flow on one side (high temperature side) alone in a vacuum heat sink environment, the radiant heat flow on the low temperature side and the outside is equal to the heat flow Φ in the multilayer, which can be expressed as:
φ＝σε(T L 4 -T 0 4 ) (2)
the emissivity of the low-temperature reflecting layer is epsilon, and sigma is Boltzmann constant. Substituting (1) into formula (2) to obtain:
and the equivalent heat conductivity coefficient can be rapidly calculated for the high-low temperature side balance temperature measured under each working condition, and a curve is drawn to study the change rule of the heat insulation performance of the component along with the temperature.
In the test method provided by the embodiment of the invention, the analysis method of the thermal shock performance of the high-temperature heat shield is as follows:
and the temperature curve in the thermal shock test is observed, so that the thermal shock performance characterization quantities such as the temperature rising rate, the response delay time, the highest temperature and the like of each layer in the high-temperature heat shield can be obtained through analysis.
In the test method provided by the embodiment of the invention, the method for analyzing the temperature resistance of the high-temperature heat shield material comprises the following steps:
when the high-temperature heat shield is tested step by step from low temperature to high temperature, the temperature curve is generally a smooth curve, if the curve is distorted, the characteristics of the materials in the multiple layers are changed, and the materials are burnt and cracked at high temperature, so that the heat conductivity coefficient is suddenly increased, and according to the position of the measuring point where the curve distortion occurs at first, after the combination test is finished, the real object is checked, and the temperature resistance characteristics of each material in the high-temperature heat shield can be analyzed.
The device is suitable for testing the performance of the high-temperature heat shield of the spacecraft, when the device is used for testing the performance of the high-temperature heat shield, a test piece to be tested is hung on a special test bed, an infrared lamp array and a reflecting screen are arranged on the outer side of the test piece, the test piece is arranged in a vacuum tank, the current of the infrared lamp array is controlled, the temperature of the hot surface of the test piece is adjusted, the temperature data in the high-temperature heat shield under different temperature working conditions can be obtained through temperature measuring points arranged in the test piece, the equivalent heat conductivity coefficient and the temperature change rule of the test piece under each temperature working condition can be calculated through theoretical analysis and deduction, and the thermal shock and the temperature resistance performance can be evaluated.
The invention has convenient installation and wide application range, and is suitable for testing different temperature areas, especially high temperature areas, of the high-temperature heat shield or other heat-insulating components; the simulation method has the advantages of high simulation fidelity and high test result confidence; the testing device can also measure and analyze the condensable and volatilizing property of the material under the conditions of extremely high vacuum temperature or extremely low vacuum temperature, and can indirectly judge the influence of volatilization of the material under the vacuum high temperature on the photoelectric equipment; the testing device has a simple structure and a simple testing method, has various thermal performance and volatility analysis functions, and can rapidly and comprehensively evaluate the comprehensive performance of the product.
In the description of the present application, it should be understood that the terms "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate orientations or positional relationships based on the orientations or positional relationships illustrated in the drawings, merely to facilitate description of the present application and simplify the description, and do not indicate or imply that the devices or elements being referred to must have a specific orientation, be configured and operated in a specific orientation, and are not to be construed as limiting the present application.
The foregoing describes specific embodiments of the present invention. It is to be understood that the invention is not limited to the particular embodiments described above, and that various changes or modifications may be made by those skilled in the art within the scope of the appended claims without affecting the spirit of the invention. The embodiments of the present application and features in the embodiments may be combined with each other arbitrarily without conflict.
Claims (9)
1. The performance test method for the high-temperature heat shield of the deep space exploration spacecraft is characterized by comprising a performance test device for the high-temperature heat shield of the deep space exploration spacecraft, wherein the performance test device for the high-temperature heat shield of the deep space exploration spacecraft comprises a heat shield (2) to be detected, and further comprises a test bench (1), a lamp array assembly (3), a reflecting screen (4), a liquid nitrogen vacuum tank assembly (5), a heating temperature measuring assembly (6) and a mass spectrum tester assembly (7);
the high-temperature heat shield (2) to be tested, the reflecting screen (4) and the lamp array assembly (3) are arranged on the test bed (1), and the reflecting screen (4) is positioned between the high-temperature heat shield (2) to be tested and the lamp array assembly (3);
the test bed (1) is arranged in the liquid nitrogen vacuum tank assembly (5), the heating temperature measuring assembly (6) is connected with the high-temperature heat screen (2) to be detected, and the mass spectrum tester assembly (7) is connected with the high-temperature heat screen (2) to be detected;
the method comprises the following steps:
test preparation working steps: manufacturing a multi-layer test piece and a lamp array assembly (3) according to the processing of a test object, installing the multi-layer test piece and the lamp array assembly to a test stand (1), and placing the test stand into a liquid nitrogen vacuum tank assembly (5) to finish the test of a necessary power supply and heating temperature measuring assembly (6);
establishing a testing environment: the liquid nitrogen vacuum tank assembly (5) starts vacuumizing, liquid nitrogen is introduced, and the temperature is reduced to below 100K by heat sink;
and an equivalent heat conductivity coefficient testing step: starting one or two rows of front and rear rows of lamp tubes of the front and rear lamp array assembly (3) according to the requirement, heating the multi-layer test piece, controlling heating power, enabling the temperature of a hot surface to be at different temperatures, waiting for temperature balance, and obtaining the internal temperature distribution of the multi-layer test piece at different temperatures;
and a thermal shock testing step: closing the lamp array assembly (3), starting two rows of lamp tubes of the lamp array assembly (3) after the multi-layer hot surface is reduced to a preset initial temperature, simulating the starting-up operation of a high-power engine or a radiation heat source, heating the multi-layer test piece in a high power mode, closing the lamp array assembly (3) after the multi-layer test piece is heated for a period of time equal to the working time of the engine or the radiation heat source, and recording data of each measuring point of the high-temperature heat shield (2) to be measured in the thermal shock process;
and a heat insulation performance analysis step: analyzing and calculating the multilayer equivalent heat conductivity coefficient according to the temperature distribution in the multilayer test piece obtained in the equivalent heat conductivity coefficient testing step;
and a temperature-resistant impact performance analysis step: analyzing the effectiveness of a thermal shock test according to the data obtained in the thermal shock test step, and analyzing and predicting the low-temperature side temperature rise rate under the rail condition;
and a temperature resistance analysis step: judging whether the material property inside the high-temperature heat shield is changed according to the temperature rise and balance curves obtained in the equivalent heat conductivity testing step and the thermal shock testing step, if the temperature curve of a certain measuring point is distorted in the test, recording the temperature value of the corresponding measuring point when the temperature curve is changed, and checking the state of a test piece after the test is finished and the vacuum tank is opened to confirm whether the material is changed.
2. The method for testing the performance of the high-temperature heat shield of the deep space exploration spacecraft according to claim 1, wherein in the equivalent heat conductivity coefficient testing step, the test working conditions are finished from low temperature to high temperature one by one.
3. The method for testing the performance of the high-temperature heat shield of the deep space exploration spacecraft according to claim 1, wherein the thermal shock testing step records the highest temperature reached by each measuring point of the high-temperature heat shield, the heating rate and the multilayer internal temperature distribution in the thermal shock process.
4. The method for testing the performance of the high-temperature heat shield of the deep space exploration spacecraft according to claim 1, wherein the lamp array assembly (3) comprises a heat source (8), an insulating high-temperature-resistant plate (9) and a lamp array frame (10);
the insulating high temperature resistant plate (9) is arranged on the lamp array frame (10), and the heat source (8) is arranged on the insulating high temperature resistant plate (9).
5. The method for testing the performance of the high-temperature heat shield of the deep space exploration spacecraft according to claim 4, wherein the heat source (8) is an infrared quartz lamp.
6. The method for testing the performance of the high-temperature heat shield of the deep space exploration spacecraft according to claim 5, wherein a plurality of infrared quartz lamps are arranged, and the infrared quartz lamps are uniformly distributed on an insulating high-temperature resistant plate (9) in a front-back cross close-packed manner.
7. The method for testing the performance of the high-temperature heat shield of the deep space exploration spacecraft according to claim 4, wherein the insulating high-temperature resistant plate (9) is a mica thin plate.
8. The deep space exploration spacecraft high-temperature heat shield performance test method according to claim 1, wherein a temperature measuring element (16) is arranged in the high-temperature heat shield (2) to be tested, and the temperature measuring element (16) is connected with the heating temperature measuring component (6) through a tank penetrating cable.
9. The deep space exploration spacecraft high temperature heat shield performance test method according to claim 8, characterized in that the temperature measuring element (16) is arranged at the high temperature side, the low temperature side and the middle layer of the high temperature heat shield (2) to be detected;
the temperature measuring element (16) is stuck and fixed by adopting silicon rubber, the low temperature side and the middle layer are fixed by adopting a double connection mode of gluing and welding, and the temperature measuring element (16) is fixed on the high temperature side.
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| JP2002138904A (en) * | 2000-11-01 | 2002-05-17 | Ishikawajima Harima Heavy Ind Co Ltd | Aerodynamic heating simulating apparatus |
| CN102765488A (en) * | 2012-08-01 | 2012-11-07 | 北京卫星环境工程研究所 | Ordinary-pressure thermal test system and method of manned spacecraft |
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