CN113916507A - Device and method for testing small-space high-integration infrared common-aperture optical system - Google Patents
Device and method for testing small-space high-integration infrared common-aperture optical system Download PDFInfo
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- CN113916507A CN113916507A CN202111179708.4A CN202111179708A CN113916507A CN 113916507 A CN113916507 A CN 113916507A CN 202111179708 A CN202111179708 A CN 202111179708A CN 113916507 A CN113916507 A CN 113916507A
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Abstract
The invention relates to a device and a method for testing a small-space high-integration infrared common-aperture optical system, wherein the device comprises: the device comprises a collimator, a fixing module, a theodolite, an infrared imaging module and a data processing module; the collimator is used for providing infrared parallel light and is provided with a target; the fixing module is used for setting an optical system to be tested; the theodolite is used for calibrating the collimator tube to be coaxial with the optical system; the infrared imaging module is used for collecting an infrared image of the target at the position of an optical focal plane of the optical system; the data processing module is used for calculating the focal length of the optical system according to the infrared image acquired by the infrared imaging module, the size of the target and the focal length of the collimator. The invention can complete the test of optical index with high precision under the condition of using basic instruments and equipment as little as possible.
Description
Technical Field
The invention relates to the technical field of infrared optics, in particular to a device and a method for testing a small-space high-integration infrared common-aperture optical system.
Background
Different from a transmission type optical system, an infrared common-aperture turn-back type optical system is often complex in light path, and particularly, a small-space high-integration-level medium-long wave infrared common-aperture turn-back type optical system is constrained by conditions such as space size of the optical system in a related index testing process, a common testing instrument cannot be adapted to the system, and related testing is difficult to complete. Therefore, in order to overcome the above disadvantages, it is necessary to provide an index testing technique suitable for a small-space high-integration infrared common-aperture foldback optical system.
Disclosure of Invention
The invention aims to provide an index testing device and method suitable for a small-space high-integration infrared common-aperture turn-back optical system aiming at least part of defects.
In order to achieve the above object, the present invention provides a testing apparatus for a small-space high-integration infrared common-aperture optical system, comprising:
the collimator is used for providing infrared parallel light and is provided with a target;
the fixing module is used for setting an optical system to be tested;
the theodolite is used for calibrating the collimator tube to be coaxial with the optical system;
the infrared imaging module is used for acquiring an infrared image of the target at the position of an optical focal plane of the optical system;
and the data processing module is used for calculating the focal length of the optical system according to the infrared image acquired by the infrared imaging module, the size of the target and the focal length of the collimator.
Optionally, the small-space high-integration infrared common-aperture optical system testing device further comprises a two-dimensional turntable;
the two-dimensional turntable is used for bearing the fixing module so as to adjust and control the position of the optical system and measure the angle information of the two-dimensional turntable;
the data processing module is also used for calculating the view field of the optical system according to the infrared images acquired by the infrared imaging module at different positions of the optical system.
Optionally, the target is circular or cross-shaped.
Optionally, the infrared imaging module is an infrared imaging core, and the infrared imaging core is connected with an industrial personal computer.
Optionally, the fixing module comprises a fixing tool and a trimming frame.
The invention also provides a test method of the small-space high-integration infrared common-aperture optical system, which is realized by adopting the test device of the small-space high-integration infrared common-aperture optical system, and comprises the following steps:
the testing device of the small-space high-integration infrared common-aperture optical system and the optical system to be tested are arranged, and a theodolite is utilized to calibrate a collimator tube to be coaxial with the optical system;
moving an infrared imaging module to an optical focal plane position of an optical system, arranging a target at the collimator, and acquiring an infrared image of the target through the infrared imaging module;
and identifying according to the infrared image acquired by the infrared imaging module, determining the size of the image formed by the target, and calculating the focal length of the optical system by combining the size of the target and the focal length of the collimator.
Optionally, the calibrating the collimator coaxial with the optical system by using a theodolite includes:
firstly, adjusting the theodolite to be coaxial with the collimator;
and adjusting the fixing module to enable the optical system to be coaxial with the theodolite.
Optionally, the moving the infrared imaging module to the optical focal plane position of the optical system includes:
moving the infrared imaging module and collecting corresponding infrared images;
and determining a corresponding point spread function based on the acquired infrared image, judging whether the infrared imaging module is located at the optical focal plane position of the optical system or not according to the point spread function, and if not, continuously moving the infrared imaging module until the infrared imaging module is located at the optical focal plane position of the optical system.
Optionally, identifying according to the infrared image acquired by the infrared imaging module, and determining the size of the image formed by the target include:
identifying an image formed by the target according to the infrared image acquired by the infrared imaging module;
determining a size of a circumscribed rectangle of an image made by the target;
determining a dimension of a circumscribed rectangle of the target;
and calculating the focal length of the optical system by combining the focal length of the collimator, wherein the expression is as follows:
wherein L represents a side length of a circumscribed rectangle of the target, L represents a corresponding side length of a circumscribed rectangle of an image formed by the target, and f1Denotes the focal length of the collimator, f2Representing the focal length of the optical system.
Optionally, if the testing apparatus for a small-space high-integration infrared common-aperture optical system includes a two-dimensional turntable, the method further includes:
and regulating and controlling the position of the optical system through the two-dimensional turntable, and measuring the angle information of the two-dimensional turntable to enable the target formed by the collimator to move in the optical view field, so as to determine the view field of the optical system.
The technical scheme of the invention has the following advantages: the invention provides a device and a method for testing a small-space high-integration infrared common-aperture optical system, which can solve the problem that the test of a small-space high-integration medium-long wave infrared common-aperture turn-back type optical system is limited without high-end special equipment, can finish the test of optical indexes with higher precision under the condition of using as few and basic instruments as possible, and provides technical support for researching and designing the small-space high-integration infrared common-aperture turn-back type optical system.
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FIG. 1 is a schematic diagram illustrating steps of a method for testing a small-space high-integration infrared common-aperture optical system according to an embodiment of the present invention;
FIG. 2(a) shows an infrared image corresponding to a circular target in an embodiment of the present invention;
FIG. 2(b) shows the recognition result of the image of the circular target in FIG. 2 (a);
fig. 3 is a schematic diagram illustrating the principle of the focal length calculation in the embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
As described above, in the actual index testing process of the small-space high-integration-level medium-long-wave infrared common-aperture return type optical system, due to the constraints of conditions such as space size, common testing instruments such as theodolite and three-coordinate equipment cannot be adapted to the optical system and complete the test, so that higher-end equipment is required, and non-professional units cannot have related testing conditions. Therefore, it becomes one of the difficult problems in the industry to research an index testing method suitable for a small-space high-integration medium-long wave infrared common-aperture reentry type optical system. In view of this, the present invention provides a technical solution for implementing a small-space high-integration infrared common-aperture optical system test by using a basic device.
The embodiment of the invention provides a testing device for a small-space high-integration infrared common-aperture optical system, which comprises: the device comprises a collimator, a fixing module, a theodolite, an infrared imaging module and a data processing module. Specifically, wherein:
the collimator is used for providing infrared parallel light, and the collimator is provided with a target; the fixing module is used for setting (namely fixing) a small-space high-integration infrared common-aperture optical system (an optical system for short) to be tested; the theodolite is used for calibrating the collimator tube to be coaxial with the optical system; the infrared imaging module is used for collecting an infrared image of the target at the position of an optical focal plane of the optical system; the data processing module is used for calculating the focal length of the optical system according to the infrared image acquired by the infrared imaging module, the size of the target and the focal length of the collimator.
The invention provides a testing device aiming at the problem that the test of a small-space high-integration-level medium-long wave infrared common-aperture reentry type optical system is limited, and the testing device can finish the test of optical indexes with higher precision under the condition of using as few basic instruments as possible.
Preferably, the testing device further comprises a two-dimensional turntable, wherein the two-dimensional turntable is used for bearing the fixing module so as to regulate and control the position of the optical system and measure the angle information of the two-dimensional turntable; correspondingly, the data processing module is also used for calculating the field of view of the optical system according to the infrared images collected by the infrared imaging module at different positions of the optical system. The two-dimensional turntable equipment has an angle information measuring function, and the field of view of the optical system can be determined by controlling the two-dimensional turntable to enable the target formed by the collimator to move in the optical field of view.
Preferably, the target may be circular or cross-shaped for ease of handling calculations, the circular or cross-shaped target being easily calibrated and also facilitating subsequent calculation of the focal length of the optical system in conjunction with the dimensions of the target. The circular target can remove the direction opposite sex influence from the formed target, and is beneficial to judging the relation between an optical axis and the normal line of the target surface of a detector (namely an infrared imaging module) when the optical focal plane of an optical system is debugged, and the circular target should be adjusted to be coaxial theoretically; the cross target is beneficial to carrying out a visual field test, the width of the cross target is limited, the length of the cross target is obvious, and when the cross target is adjusted to the edge of the visual field, the cross target is beneficial to judging whether the pixel is just overlapped with the first column/row pixel or just disappears outside the visual field.
Preferably, infrared imaging module is infrared imaging core, and infrared imaging core is connected with the industrial computer, and the industrial computer can control infrared imaging core to the infrared image that infrared imaging core gathered is stored, so that follow-up processing is carried out. At present, for a small-space high-integration infrared common-aperture optical system, due to space constraint, an actual optical index testing instrument is difficult to match with the small-space high-integration infrared common-aperture optical system, a common optical testing method is not suitable, and an imaging device of an advanced high-end special testing instrument is large in size and also difficult to test. The infrared imaging machine core has the advantages of small volume, low cost, easy operation and wider application prospect.
Preferably, the fixing module comprises a fixing tool and a trimming frame. The fixing tool and the trimming frame are low in cost, elements of the optical system to be tested can be fixed through the fixing tool and the trimming frame, and each element can be adjusted according to needs (during calibration).
As shown in fig. 1 to fig. 3, the present invention further provides a method for testing a small-space high-integration infrared common-aperture optical system, which is implemented by using the device for testing a small-space high-integration infrared common-aperture optical system according to any one of the above embodiments, and specifically includes the following steps:
The method for testing the small-space high-integration infrared common-aperture optical system can complete high-precision optical index testing and processing under the condition of using as few basic instruments and equipment as possible.
Preferably, in step 100, the calibrating the collimator coaxial with the optical system by using a theodolite further comprises:
firstly, adjusting the theodolite to be coaxial with a collimator;
and then adjusting the fixed module to enable the optical system to be coaxial with the theodolite.
The theodolite can be used for quickly completing coaxial calibration of the collimator tube and the optical system, the optical axis of the optical system and the optical axis of the collimator tube are coaxial, otherwise, a test error can be caused, the final result is incorrect, and the theodolite is easily available basic instrument equipment.
Preferably, in step 102, moving the infrared imaging module to the optical focal plane position of the optical system further includes:
moving the infrared imaging module and collecting corresponding infrared images;
and determining a corresponding point spread function based on the acquired infrared image, judging whether the current infrared imaging module is in the optical focal plane position of the optical system according to the point spread function, and if not, continuously moving the infrared imaging module until the infrared imaging module is in the optical focal plane position of the optical system. The optical transfer function can be determined in the assembling process of the optical system, the edge gradient of a target in an image and the corresponding point spread function are calculated based on the collected infrared image, and the edge gradient and the corresponding point spread function are compared with the parameters of the optical system to judge so as to determine whether the current position is in the optical focal plane. The infrared imaging module is moved to the position of the optical focal plane of the optical system, and then the preparation work of the test can be completed, so that the imaging and the calculation processing can be carried out subsequently.
Preferably, in step 104, identifying according to the infrared image acquired by the infrared imaging module, and determining the size of the image formed by the target, further includes:
identifying an image formed by a target in the infrared image according to the infrared image acquired by the infrared imaging module;
determining the size of a circumscribed rectangle of an image formed by the target;
determining the size of a circumscribed rectangle of the target;
and calculating the focal length of the optical system by combining the focal length of the collimator, wherein the expression is as follows:
wherein L represents the side length of the circumscribed rectangle of the target, L represents the corresponding side length of the circumscribed rectangle of the image formed by the target, and f1Denotes the focal length of the collimator, f2Indicating the focal length of the optical system.
The present invention can utilize software such as Matlab, etc. to read and process data of infrared images, and complete the identification of target targets by a target identification method in the prior art, i.e. identify images of the targets, as shown in fig. 2(a) and 2 (b). For a circular target, the widest target pixel numbers in the X direction and the Y direction (namely the side length of the X-direction external rectangle and the side length of the Y-direction external rectangle) can be simultaneously calculated, and the corresponding row number and column number are marked, so that the required processing and data review are facilitated. Calculating according to the calculation principle shown in fig. 3, wherein for a circular target, l represents the side length of a circumscribed rectangle of the target, namely the diameter of the circular target; for the cross-shaped target, i.e. the length of the target in the X direction/Y direction, L selects the length of the corresponding X direction/Y direction of the circumscribed rectangle of the image formed by the target.
Preferably, the method of the present invention can also be used for measuring an optical field of view, and in particular, if the small-space high-integration infrared common-aperture optical system testing apparatus includes a two-dimensional turntable, the method further includes:
the position of the optical system is regulated and controlled through the two-dimensional rotary table, and the angle information of the two-dimensional rotary table is measured, so that the target formed by the collimator tube moves in the optical view field, and the view field of the optical system is further determined.
In summary, the invention provides a device and a method for testing a small-space high-integration infrared common-aperture optical system, which can solve the problem that the test of a small-space high-integration medium-long wave infrared common-aperture turn-back optical system is limited without high-end special equipment, can finish the test of optical indexes with higher precision under the condition of using as few and basic instruments and equipment as possible, and provide technical support for researching and designing the small-space high-integration medium-long wave infrared common-aperture turn-back optical system.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. The utility model provides a little high integration infrared common aperture optical system testing arrangement which characterized in that includes:
the collimator is used for providing infrared parallel light and is provided with a target;
the fixing module is used for setting an optical system to be tested;
the theodolite is used for calibrating the collimator tube to be coaxial with the optical system;
the infrared imaging module is used for acquiring an infrared image of the target at the position of an optical focal plane of the optical system;
and the data processing module is used for calculating the focal length of the optical system according to the infrared image acquired by the infrared imaging module, the size of the target and the focal length of the collimator.
2. The testing device for the small-space high-integration infrared common-aperture optical system according to claim 1, characterized in that: the device also comprises a two-dimensional rotary table;
the two-dimensional turntable is used for bearing the fixing module so as to adjust and control the position of the optical system and measure the angle information of the two-dimensional turntable;
the data processing module is also used for calculating the view field of the optical system according to the infrared images acquired by the infrared imaging module at different positions of the optical system.
3. The testing device for the small-space high-integration infrared common-aperture optical system according to claim 1, characterized in that:
the target is circular or cross-shaped.
4. The testing device for the small-space high-integration infrared common-aperture optical system according to claim 1, characterized in that:
the infrared imaging module is an infrared imaging machine core, and the infrared imaging machine core is connected with the industrial personal computer.
5. The testing device for the small-space high-integration infrared common-aperture optical system according to claim 1, characterized in that:
the fixed module comprises a fixed tool and a trimming frame.
6. A method for testing a small-space high-integration infrared common-aperture optical system is characterized by being realized by adopting the small-space high-integration infrared common-aperture optical system testing device as claimed in any one of claims 1 to 5, and comprising the following steps of:
the testing device of the small-space high-integration infrared common-aperture optical system and the optical system to be tested are arranged, and a theodolite is utilized to calibrate a collimator tube to be coaxial with the optical system;
moving an infrared imaging module to an optical focal plane position of an optical system, arranging a target at the collimator, and acquiring an infrared image of the target through the infrared imaging module;
and identifying according to the infrared image acquired by the infrared imaging module, determining the size of the image formed by the target, and calculating the focal length of the optical system by combining the size of the target and the focal length of the collimator.
7. The method for testing the small-space high-integration infrared common-aperture optical system according to claim 6, wherein the calibrating the collimator tube to be coaxial with the optical system by using the theodolite comprises:
firstly, adjusting the theodolite to be coaxial with the collimator;
and adjusting the fixing module to enable the optical system to be coaxial with the theodolite.
8. The method for testing the small-space high-integration infrared common-aperture optical system according to claim 6, wherein the moving the infrared imaging module to the optical focal plane position of the optical system comprises:
moving the infrared imaging module and collecting corresponding infrared images;
and determining a corresponding point spread function based on the acquired infrared image, judging whether the infrared imaging module is located at the optical focal plane position of the optical system or not according to the point spread function, and if not, continuously moving the infrared imaging module until the infrared imaging module is located at the optical focal plane position of the optical system.
9. The method for testing the small-space high-integration infrared common-aperture optical system according to claim 6, wherein the identifying according to the infrared image collected by the infrared imaging module and the determining of the size of the image formed by the target comprise:
identifying an image formed by the target according to the infrared image acquired by the infrared imaging module;
determining a size of a circumscribed rectangle of an image made by the target;
determining a dimension of a circumscribed rectangle of the target;
and calculating the focal length of the optical system by combining the focal length of the collimator, wherein the expression is as follows:
wherein L represents a side length of a circumscribed rectangle of the target, L represents a corresponding side length of a circumscribed rectangle of an image formed by the target, and f1Denotes the focal length of the collimator, f2Representing the focal length of the optical system.
10. The method for testing a small-space high-integration infrared common-aperture optical system according to claim 6,
if the testing device for the small-space high-integration infrared common-aperture optical system comprises a two-dimensional turntable, the method further comprises the following steps:
and regulating and controlling the position of the optical system through the two-dimensional turntable, and measuring the angle information of the two-dimensional turntable to enable the target formed by the collimator to move in the optical view field, so as to determine the view field of the optical system.
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