CN113884849A - Method and device for testing light-emitting diode device - Google Patents
Method and device for testing light-emitting diode device Download PDFInfo
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- CN113884849A CN113884849A CN202010554619.2A CN202010554619A CN113884849A CN 113884849 A CN113884849 A CN 113884849A CN 202010554619 A CN202010554619 A CN 202010554619A CN 113884849 A CN113884849 A CN 113884849A
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Abstract
The application is applicable to the technical field of semiconductor photoelectricity, and provides a method and a device for testing a light-emitting diode device, wherein the method comprises the following steps: inputting a test voltage to a light emitting diode device, acquiring a light emitting area of the light emitting diode device emitting light based on the test voltage, and determining performance parameters of the light emitting diode device based on the test voltage and the light emitting area. The method and the device can improve the accuracy of testing the light-emitting diode device.
Description
Technical Field
The application belongs to the technical field of semiconductor photoelectric technology, and particularly relates to a method and a device for testing a light-emitting diode device.
Background
With the continuous development of semiconductor optoelectronic technology, various Light Emitting Diode (LED) devices are widely used. In order to ensure the reliability of the light emitting diode device, the light emitting diode device generally needs to be tested.
In the prior art, a light emitting area of a light emitting diode device capable of emitting light may be preset based on a structure of the light emitting diode device, and then, in a test process, a performance parameter of the light emitting diode device is determined based on a test voltage provided to the light emitting diode device and a preset light emitting area.
However, the stability of light emission of different led devices may be different, and the stability of light emission is not considered in the process of presetting the light emitting area, so the accuracy of the performance parameters measured by the above test method is low.
Disclosure of Invention
The embodiment of the application provides a method and a device for testing a light-emitting diode device, which can solve the problem that the accuracy of performance parameters obtained by measurement is low.
In a first aspect, an embodiment of the present application provides a method for testing a light emitting diode device, including:
inputting a test voltage to the light emitting diode device;
acquiring a light emitting area of the light emitting diode device emitting light based on the test voltage;
determining a performance parameter of the light emitting diode device based on the test voltage and the light emitting area.
In a possible implementation manner of the first aspect, the obtaining a light emitting area where the light emitting diode device emits light based on the test voltage includes:
acquiring a light emitting image of the light emitting diode device emitting light based on the test voltage;
determining the light emitting area based on the light emitting image.
In a possible implementation manner of the first aspect, the determining the light-emitting area based on the light-emitting image includes:
carrying out binarization processing on the luminous image to obtain a binary image corresponding to the luminous image;
determining the light-emitting area based on the number of pixels of the white area in the binary image and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light-emitting diode device corresponding to each pixel in the light-emitting image.
In a possible implementation manner of the first aspect, the inputting a test voltage to the light emitting diode device includes:
inputting at least one of the test voltages to the light emitting diode devices, respectively;
the obtaining of the light emitting area of the light emitting diode device emitting light based on the test voltage includes:
respectively acquiring the light emitting areas of the light emitting diode devices emitting light under the test voltages;
determining a performance parameter of the light emitting diode device based on the test voltage and the light emitting area, comprising:
and respectively determining performance parameters corresponding to the test voltages based on at least one test voltage and at least one light-emitting area.
In a possible implementation manner of the first aspect, before the inputting the test voltage to the light emitting diode device, the method further includes:
and pre-burning the light emitting diode device.
In a possible implementation manner of the first aspect, before the inputting the test voltage to the light emitting diode device, the method further includes:
acquiring a light emitting spectrum of the light emitting diode device;
and determining that the light-emitting diode device emits light normally based on the light-emitting spectrum.
In one possible implementation form of the first aspect, the performance parameter includes at least one of a current density, a current efficiency, and an external quantum efficiency.
In a second aspect, an embodiment of the present application provides a testing apparatus for a light emitting diode device, including:
the input module is used for inputting test voltage to the light-emitting diode device;
the first obtaining module is used for obtaining the light emitting area of the light emitting diode device based on the test voltage;
a first determination module for determining a performance parameter of the light emitting diode device based on the test voltage and the light emitting area.
In a possible implementation manner of the second aspect, the first obtaining module is further configured to:
acquiring a light emitting image of the light emitting diode device emitting light based on the test voltage;
determining the light emitting area based on the light emitting image.
In a possible implementation manner of the second aspect, the first obtaining module is further configured to:
carrying out binarization processing on the luminous image to obtain a binary image corresponding to the luminous image;
determining the light-emitting area based on the number of pixels of the white area in the binary image and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light-emitting diode device corresponding to each pixel in the light-emitting image.
In a possible implementation manner of the second aspect, the input module is further configured to input at least one of the test voltages to the light emitting diode devices respectively;
the first obtaining module is further configured to obtain the light emitting areas of the light emitting diode devices emitting light under the test voltages, respectively;
the first determining module is further configured to determine a performance parameter corresponding to each of the test voltages respectively based on at least one of the test voltages and at least one of the light emitting areas.
In a possible implementation manner of the second aspect, the method further includes:
and the pre-burning module is used for pre-burning the light emitting diode device.
In a possible implementation manner of the second aspect, the method further includes:
the second acquisition module is used for acquiring the light-emitting spectrum of the light-emitting diode device;
and the second determination module is used for determining that the light-emitting diode device emits light normally based on the light-emitting spectrum.
In one possible implementation form of the second aspect, the performance parameter includes at least one of a current density, a current efficiency, and an external quantum efficiency.
In a third aspect, an embodiment of the present application provides a terminal device, including: a computing device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor implements the method according to any of the first aspect when executing the computer program.
In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, including: computer readable storage medium, having stored thereon a computer program, characterized in that the computer program, when being executed by a processor, carries out the method according to any of the first aspect.
In a fifth aspect, the present application provides a computer program product, which when run on a terminal device, causes the terminal device to execute the method of any one of the above first aspects.
Compared with the prior art, the embodiment of the application has the advantages that: in this embodiment, a test voltage may be input to the light emitting diode device, and a light emitting area of the light emitting diode device that emits light based on the test voltage may be obtained, so that the performance parameter of the light emitting diode device may be determined based on the test voltage and the light emitting area corresponding to the test voltage. Since the light emitting area is an accurate value obtained based on the provided test voltage, the accuracy of the light emitting area is not affected by the stability of light emission of the light emitting diode device, and the accuracy of the performance parameter determined based on the test voltage and the light emitting area is higher.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
Fig. 1 is a schematic flowchart illustrating a method for testing a light emitting diode device according to an embodiment of the present disclosure;
fig. 2 is a schematic structural diagram of a quantum dot light emitting diode device according to an embodiment of the present disclosure;
FIG. 3 is a schematic structural diagram of a test device according to an embodiment of the present application;
FIG. 4 is a schematic view of a luminescent image provided by an embodiment of the present application;
FIG. 5 is a schematic diagram of a binary image according to an embodiment of the present application;
fig. 6 is a functional block diagram of a testing apparatus for a light emitting diode device according to an embodiment of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
Before explaining the present application in detail, an application scenario of the present application will be described.
The Light Emitting Diode device may include a Quantum Dot Light Emitting Diode (QLED) device, an Organic Light Emitting Diode (OLED) device, and the like, and in order to ensure the reliability of the Light Emitting Diode device, the Light Emitting Diode device is usually required to be tested. Moreover, the stability of light emission of different light emitting diode devices may be different, for example, when the QLED emits light (especially blue light), the problem of continuous variation of the light emitting area may occur, so that the accuracy of the result tested by the testing method in the prior art is low.
To solve this problem, the present application provides a test system for a light emitting diode device, the system comprising a test device and a computing device communicatively connected. The test device may be used to provide a hardware environment for testing the light emitting diode device, such as a recess for placing the light emitting diode device, a contact for providing a test voltage to the light emitting diode device, etc., and may include an integrating sphere measurement device, a silicon photodiode measurement device, or other types of test devices. The computing device may be used to provide a software environment for testing the light emitting diode device, such as setting a test voltage and performing related data calculations, etc.
An image sensor, such as a Charge-coupled Device (CCD) or a Complementary Metal Oxide Semiconductor (CMOS), may be disposed in the test Device at a position opposite to the led test Device, so as to obtain an image of the led when emitting light, and determine a light emitting area of the led and an area of the light emitting area. Of course, in practical applications, the light emitting area of the light emitting diode device may be determined in other manners.
It should be noted that the computing device may include a Mobile phone, a tablet Computer, a wearable device, an in-vehicle device, a notebook Computer, an Ultra-Mobile Personal Computer (UMPC), a netbook, a Personal Digital Assistant (PDA), and other devices with data computing capability, and the embodiment of the present application does not limit the specific type of the computing device.
It should also be noted that, in practical applications, the test device may also be integrated with the computing device.
The method for testing the light-emitting diode device can be applied to computing equipment, the computing equipment is used for controlling the testing device to input testing voltage to the light-emitting diode device, and the light-emitting area of the light-emitting diode device, which emits light based on the testing voltage, is obtained, so that the performance parameters of the light-emitting diode device can be determined based on the testing voltage and the light-emitting area corresponding to the testing voltage. Since the light emitting area is an accurate value obtained based on the provided test voltage, the accuracy of the light emitting area is not affected by the stability of light emission of the light emitting diode device, and the accuracy of the performance parameter determined based on the test voltage and the light emitting area is higher.
The present application will be specifically described below with reference to the above application scenarios. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments.
Fig. 1 is a schematic flow chart illustrating a method for testing a light emitting diode device according to the present application. It should be noted that the testing method for the light emitting diode device described in the present application is not limited by the specific sequence shown in fig. 1 and described below, and it should be understood that, in other embodiments, the sequence of some steps in the testing method for the light emitting diode device described in the present application may be interchanged according to actual needs, or some steps may be omitted or deleted. The flow shown in fig. 1 will be explained in detail below.
The light emitting diode device to be tested, the test device, and the computing device may be prepared, such as connecting the test device and the computing device, placing the light emitting diode device within the test device, opening a test interface in the computing device, and so on.
For example, referring to fig. 2, a schematic structural diagram of a quantum dot light emitting diode device 100 provided in the present application includes a rectangular substrate 110 and 4T-shaped electrodes 120 disposed on the same side of the substrate, one end of each electrode 120 extends out of the substrate 110, and the other end extends into the substrate 110, wherein one end extending into the substrate 110 is provided with quantum dots so as to be able to emit light and form a light emitting region, for example, the area of the region is 0.004 square cm, but if the region does not completely emit light, the light emitting area of the region is smaller than 0.004 square cm. Referring to fig. 3, a schematic structural diagram of a testing device 200 provided in the present application is shown, the testing device 200 includes an upper cover 210 and a base 220, wherein the base 220 is provided with a groove for placing the qd-led device 100, and the shape of the groove matches with the shape of the qd-led device 100, and the groove includes a contact point contacting with each electrode 120. The quantum dot light emitting diode device 100 shown in fig. 2 may be placed with the electrode 220 side facing down in the base of the test device 200, and then the cover 210 is closed.
In order to ensure that the light emitting diode device can normally emit light, the light emitting diode device may be burned in.
The burn-in may refer to an operation of inputting a first designated voltage or a designated current to the light emitting diode device for a first preset time period before the light emitting diode device normally emits light.
It should be noted that the first specific voltage and the first preset time period may be determined in advance based on the light emitting material of the tested light emitting diode device, and taking the blue light quantum dot device (i.e. the quantum dot light emitting diode device of the blue light emitting material) as shown in fig. 2 as an example, the first specific voltage may be 5 volts, and the first preset time period may be 3 seconds.
And 103, acquiring the light-emitting spectrum of the light-emitting diode device, and determining that the light-emitting diode device emits light normally based on the light-emitting spectrum.
In order to ensure that the light emitting diode device can normally emit light and to ensure that the test device can normally detect the light emitting diode device, the light emitting spectrum of the light emitting diode device can be obtained.
The second specified voltage can be input into the light emitting diode device and continuously kept for a second preset time, the light emitting spectrum of the light emitting diode device is detected through the testing device, and when the light emitting spectrum is not smooth, the second specified voltage and the second preset time can be adjusted until the light emitting spectrum is smooth. If the light emitting spectrum of the light emitting diode device can be detected through the test device, the light emitting spectrum is smooth, and the peak is in the range of the preset peak, the light emitting diode device can be determined to be normally emitted, and meanwhile, the test device can be determined to be capable of normally detecting the light emitting diode device.
It should be noted that the second specified voltage, the second preset time duration and the preset peak range may be determined in advance based on the tested light emitting diode device, taking the quantum dot light emitting diode device shown in fig. 2 as an example, the second specified voltage may be 4 volts, the second preset time duration may be 100 milliseconds, and if the quantum dot light emitting diode device emits blue light, the preset peak range corresponding to the blue light may be between 450 and 480 nanometers.
It should be noted that, in practical applications, at least one of the steps 101 and 103 may be omitted, for example, after the step 101 is executed once, a plurality of tests on the light emitting diode device may be performed, and in the case of performing continuous tests on the same light emitting diode device, the step 102 may not be repeatedly executed to perform the burn-in, or in the case of determining that the light emitting diode device and the test device are normal through other methods, the step 103 may be omitted.
In order to test the performance of the light emitting diode device, a voltage may be input to the light emitting diode device.
Different test voltages can be input to the light emitting diode device according to different test modes and corresponding modes. For example, in the constant current test mode, the current density of the light emitting diode device may be controlled to be constant, and the test voltage input to the light emitting diode device may be changed, so that a plurality of different test voltages preset in sequence may be input; in the constant voltage test mode, the test voltage of the light emitting diode device can be controlled to be constant, and the test current input to the light emitting diode device is changed, so that a preset test voltage can be input; in the constant luminance test mode, the luminance of the light emitting diode device can be kept constant by changing the test voltage input to the light emitting diode device, and therefore, a plurality of different test voltages which are set in advance in sequence can also be input.
It should be noted that, the magnitude of each test voltage in the different test modes may be obtained by setting according to the test requirement and the tested led device in advance, and the magnitude of the test voltage is not specifically limited in this embodiment of the application.
Optionally, at least one test voltage may be input to the light emitting diode devices, so as to obtain performance parameters of the light emitting diode devices at different test voltages through subsequent testing steps.
The method includes the steps of inputting a test voltage to the light emitting diode device in sequence according to a specific step length by taking a third specific voltage as a starting point and a fourth specific voltage as a step length in a voltage stepping mode, and obtaining performance parameters of the light emitting diode device under a plurality of test voltages through subsequent steps. The light-emitting diode device is tested in a voltage stepping mode, the change condition of the performance parameters of the light-emitting diode device along with the continuous increase of the test voltage can be obtained, and the accuracy of testing the light-emitting diode device is further improved.
It should be noted that the third specific voltage, the fourth specific voltage and the specific step size can be set in advance, for example, the third specific voltage may be-0.6 v, the specific step size may be 0.2 v, and the fourth specific voltage may be 6 v, so that the performance parameters of the light emitting diode device at 34 test voltages can be measured.
And 105, acquiring the light emitting area of the light emitting diode device based on the test voltage.
Because the light emitting stability of different light emitting diode devices is different, the light emitting conditions of different light emitting diode devices are possibly different under the same test voltage, so that the light emitting area of the light emitting diode device under the current test voltage can be obtained, and the accuracy of subsequently determining the performance parameters of the light emitting diode device is improved.
Alternatively, a light emission image of the light emitting diode device emitting light based on the test voltage may be acquired, and the light emission area may be determined based on the light emission image.
The light-emitting image may be an image obtained by photographing the light-emitting diode device, and the light-emitting image may indicate the light-emitting condition of the light-emitting diode device.
The light emitting area may be an area of an area where the light emitting diode device actually emits light. Because of the influence of the light emitting stability of the light emitting diode device, the light emitting area can be smaller than or equal to the total light emitting area of the light emitting diode device, taking the quantum dot light emitting diode device as an example, when the test voltage is continuously increased, the light emitting area of the quantum dot light emitting diode device is also continuously increased, the black spot (namely a black area which does not emit light) is continuously reduced until the light emitting area is equal to the total light emitting area, namely, all the light emitting areas of the quantum dot light emitting diode device emit light.
As can be seen from the foregoing, an image sensor may be provided in the test device, and thus, when the light emitting diode device emits light based on the test voltage, an image of light emission of the light emitting diode device may be acquired by the image sensor.
It should be noted that the acquired luminescence image may be sampled and quantized by an analog-to-digital converter, so that the luminescence image is converted into a digital signal, and then the digital signal may be stored in a storage medium such as an image memory.
Optionally, binarization processing may be performed on the light-emitting image to obtain a binary image corresponding to the light-emitting image, and the light-emitting area may be determined based on the number of pixels in the white region in the binary image and a preset mapping relationship.
The preset mapping relationship is used for indicating the area of the light-emitting diode device corresponding to each pixel in the light-emitting image.
It should be noted that the preset mapping relationship may be determined in advance. Since the distance between the image sensor and the light emitting diode device is fixed after the image sensor and the light emitting diode device are placed, the light emitting diode device is photographed by the image sensor, and the actual area corresponding to each pixel in the image in the light emitting diode device is a constant for different images obtained by photographing. Therefore, in an alternative embodiment, after the image sensor and the light emitting diode device are placed, the image sensor may capture an image of the light emitting diode device, and the ratio between the area of the light emitting diode device and each pixel, that is, the area size corresponding to each pixel, may be determined by dividing the area of the light emitting diode device by the pixel of the image of the light emitting diode device. Accordingly, the preset mapping relationship may be expressed as y ═ ax, where y may denote a light emitting area, x may denote the number of pixels, and a may denote a ratio between an area of the light emitting diode device and each pixel.
For example, the area of the light emitting diode device is 0.004 square centimeter, the light emitting diode device is photographed, the obtained image includes 40 ten thousand pixels, the area size corresponding to each pixel may be 0.004/400000, and the preset mapping relationship may be represented as y ═ x 0.004/400000. Then if the white area in a certain binary image includes 20 ten thousand pixels, the light emitting area of the light emitting diode device can be determined to be 0.002 square centimeters based on the preset mapping relationship.
The pixel gray value in the luminescent image may be obtained through an image processing program (e.g., a PictureBox control, a control for image processing), and then binary extraction is performed to obtain a binary image, where the binary image includes comparing the pixel gray value with a preset gray value threshold, and if the pixel gray value is less than or equal to the preset gray value threshold, the pixel gray value is updated to 0, that is, converted to a black pixel, and if the pixel gray value is greater than the preset gray value threshold, the pixel gray value is updated to 1, that is, converted to a white pixel. Wherein a black pixel in the binary image indicates that the light emitting diode device does not emit light at the corresponding location, and a white pixel indicates that the light emitting diode device emits light at the corresponding location. When determining the area of the white region in the binary image, the number of pixels included in the white region may be determined (or the area of the white region may be represented by the number of pixels included in the white region) according to the area of the white region, and then the number of pixels is multiplied by the preset area ratio, thereby obtaining the light-emitting area.
It should be noted that the preset gray value threshold may be determined in advance.
For example, taking the quantum dot light emitting diode device shown in fig. 2 as an example, under a certain test voltage, the obtained light emission image is as shown in fig. 4, fig. 4 is converted into a binary image, and the obtained binary image is as shown in fig. 5, and as can be seen from fig. 5, the current light emission area is only about 30%.
Alternatively, as can be seen from the foregoing, at least one test voltage may be input to the light emitting diode devices, and then the light emitting areas of the light emitting diode devices emitting light at the test voltages may be obtained, so that the corresponding light emitting areas may be obtained for each test voltage.
When the test voltage and the corresponding light emitting area are obtained, the performance parameters of the led device may be determined through the following steps, and it should be noted that in practical applications, the performance parameters of the led device corresponding to the test voltage may be determined through the following steps every time a test voltage and a light emitting area corresponding to the test voltage are determined, that is, the step 104 and the step 106 are performed in a circulating manner, or of course, a plurality of test voltages and light emitting areas corresponding to the test voltages may be obtained, and the performance parameters corresponding to the test voltages are determined through the following steps, that is, the step 104 and the step 105 are performed in a circulating manner, and then the step 106 is performed. That is, in practical applications, each time one test voltage and a corresponding light-emitting area are determined, the corresponding performance parameter may be determined, or a plurality of test voltages and corresponding light-emitting areas may be continuously determined, and then the performance parameter corresponding to each test voltage may be determined.
And 106, determining the performance parameters of the light-emitting diode device based on the test voltage and the light-emitting area.
Because the light-emitting area is the accurate area of the actual light emission of the light-emitting diode device under the test voltage, the performance parameters of the light-emitting diode device can be accurately determined based on the test voltage and the light-emitting area.
The performance parameter may be indicative of a performance of the light emitting diode device, and the performance parameter may include at least one of a current density, a current efficiency, and an external quantum efficiency.
The current density is a physical quantity of the intensity and the flowing direction of the current at a certain point in the circuit, and the current density of the light-emitting diode device can be determined by the following formula 1:
JDi/a (formula 1)
Wherein, JDIs the current density; i is the current flowing through the light emitting diode device and may be determined based on the test voltage;and a is the light emitting area of the light emitting diode device.
The current efficiency may be a ratio of an amount of a substance actually deposited or dissolved on an electrode at the time of electrolysis to a theoretically calculated deposition or dissolution amount, and the current efficiency of the light emitting diode device may be determined by the following equation 2:
ηA＝L/JD(formula 2)
Wherein eta isATo be current efficiency; and L is the luminous brightness of the LED device and can be obtained by testing the device.
The external quantum efficiency may be the ratio of the number of collected electrons to the number of all incident photons when a photon strikes the surface of the photosensitive device, some of which excite the photosensitive material to generate electron-hole pairs to form a current. The current density of the light emitting diode device can be determined by the following equation 3:
wherein q is the base charge; h is the Planck constant; c is the speed of light in vacuum; λ is the wavelength; g (lambda) is a human eye vision function; s (lambda) is the normalized electroluminescence spectrum.
Under any test voltage, the current flowing through the light-emitting diode device is determined based on the test voltage, and the obtained light-emitting area is substituted into the formula 1-3, so that the performance parameters of the light-emitting diode device, such as current density, current efficiency, external quantum efficiency and the like, can be determined, and the current density can be corrected in real time according to the determined light-emitting area so as to test the light-emitting diode device under the preset current density.
In this embodiment, a test voltage may be input to the light emitting diode device, and a light emitting area of the light emitting diode device that emits light based on the test voltage may be obtained, so that the performance parameter of the light emitting diode device may be determined based on the test voltage and the light emitting area corresponding to the test voltage. Since the light emitting area is an accurate value obtained based on the provided test voltage, the accuracy of the light emitting area is not affected by the stability of light emission of the light emitting diode device, and the accuracy of the performance parameter determined based on the test voltage and the light emitting area is higher.
Fig. 6 is a functional block diagram of a testing apparatus 600 for a light emitting diode device provided in the present application. It should be noted that the basic principle and the resulting technical effect of the testing apparatus 600 for a light emitting diode device provided in the embodiment of the present application are the same as those of the corresponding method embodiments described above, and for a brief description, the corresponding contents in the method embodiments may be referred to for the parts not mentioned in the embodiment of the present application. The testing apparatus 600 for a light emitting diode device includes an input module 610, a first obtaining module 620 and a first determining module 630.
An input module 610, configured to input a test voltage to the led device;
a first obtaining module 620, configured to obtain a light emitting area of the light emitting diode device emitting light based on the test voltage;
a first determining module 630, configured to determine a performance parameter of the light emitting diode device based on the test voltage and the light emitting area.
Optionally, the first obtaining module 620 is further configured to:
acquiring a light emitting image of the light emitting diode device emitting light based on the test voltage;
the light-emitting area is determined based on the light-emitting image.
Optionally, the first obtaining module 620 is further configured to:
carrying out binarization processing on the luminous image to obtain a binary image corresponding to the luminous image;
determining the light-emitting area based on the number of pixels in the white area in the binary image and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light-emitting diode device corresponding to each pixel in the light-emitting image.
Optionally, the input module is further configured to input at least one test voltage to the light emitting diode devices respectively;
the first obtaining module is further configured to obtain the light emitting areas of the light emitting diode devices emitting light under the test voltages respectively;
the first determining module is further configured to determine performance parameters corresponding to the test voltages respectively based on at least one of the test voltages and at least one of the light emitting areas.
Optionally, the apparatus 600 for testing a light emitting diode device further includes:
and the pre-burning module is used for pre-burning the light emitting diode device.
Optionally, the apparatus 600 for testing a light emitting diode device further includes:
the second acquisition module is used for acquiring the light-emitting spectrum of the light-emitting diode device;
and the second determination module is used for determining that the light-emitting diode device emits light normally based on the light-emitting spectrum.
Optionally, the performance parameter includes at least one of current density, current efficiency, and external quantum efficiency.
It should be noted that, for the information interaction, execution process, and other contents between the above-mentioned devices/units, the specific functions and technical effects thereof are based on the same concept as those of the embodiment of the method of the present application, and specific reference may be made to the part of the embodiment of the method, which is not described herein again.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working processes of the units and modules in the system may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
An embodiment of the present application further provides a computing device, where the computing device includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, the processor implementing the steps of any of the various method embodiments described above when executing the computer program.
The embodiments of the present application further provide a computer-readable storage medium, where a computer program is stored, and when the computer program is executed by a processor, the computer program implements the steps in the above-mentioned method embodiments.
The embodiments of the present application provide a computer program product, which when executed on a computing device, enables the computing device to implement the steps in the above method embodiments.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, all or part of the processes in the methods of the embodiments described above can be implemented by a computer program, which can be stored in a computer-readable storage medium and can implement the steps of the embodiments of the methods described above when the computer program is executed by a processor. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code to a photographing apparatus/terminal apparatus, a recording medium, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), an electrical carrier signal, a telecommunications signal, and a software distribution medium. Such as a usb-disk, a removable hard disk, a magnetic or optical disk, etc. In certain jurisdictions, computer-readable media may not be an electrical carrier signal or a telecommunications signal in accordance with legislative and patent practice.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus/network device and method may be implemented in other ways. For example, the above-described apparatus/network device embodiments are merely illustrative, and for example, the division of the modules or units is only one logical division, and there may be other divisions when actually implementing, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not implemented. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It should also be understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
As used in this specification and the appended claims, the term "if" may be interpreted contextually as "when", "upon" or "in response to" determining "or" in response to detecting ". Similarly, the phrase "if it is determined" or "if a [ described condition or event ] is detected" may be interpreted contextually to mean "upon determining" or "in response to determining" or "upon detecting [ described condition or event ]" or "in response to detecting [ described condition or event ]".
Furthermore, in the description of the present application and the appended claims, the terms "first," "second," "third," and the like are used for distinguishing between descriptions and not necessarily for describing or implying relative importance.
Reference throughout this specification to "one embodiment" or "some embodiments," or the like, means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the present application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," or the like, in various places throughout this specification are not necessarily all referring to the same embodiment, but rather "one or more but not all embodiments" unless specifically stated otherwise. The terms "comprising," "including," "having," and variations thereof mean "including, but not limited to," unless expressly specified otherwise.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (10)
1. A method of testing a light emitting diode device, comprising:
inputting a test voltage to the light emitting diode device;
acquiring a light emitting area of the light emitting diode device emitting light based on the test voltage;
determining a performance parameter of the light emitting diode device based on the test voltage and the light emitting area.
2. The method of claim 1, wherein the obtaining a light emitting area over which the light emitting diode device emits light based on the test voltage comprises:
acquiring a light emitting image of the light emitting diode device emitting light based on the test voltage;
determining the light emitting area based on the light emitting image.
3. The method of claim 2, wherein said determining the light-emitting area based on the light-emitting image comprises:
carrying out binarization processing on the luminous image to obtain a binary image corresponding to the luminous image;
determining the light-emitting area based on the number of pixels of the white area in the binary image and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light-emitting diode device corresponding to each pixel in the light-emitting image.
4. The method of claim 1, wherein inputting a test voltage to the light emitting diode device comprises:
inputting at least one of the test voltages to the light emitting diode devices, respectively;
the obtaining of the light emitting area of the light emitting diode device emitting light based on the test voltage includes:
respectively acquiring the light emitting areas of the light emitting diode devices emitting light under the test voltages;
determining a performance parameter of the light emitting diode device based on the test voltage and the light emitting area, comprising:
and respectively determining performance parameters corresponding to the test voltages based on at least one test voltage and at least one light-emitting area.
5. The method of claim 1, prior to the inputting a test voltage to the light emitting diode device, further comprising:
and pre-burning the light emitting diode device.
6. The method of claim 1, prior to the inputting a test voltage to the light emitting diode device, further comprising:
acquiring a light emitting spectrum of the light emitting diode device;
and determining that the light-emitting diode device emits light normally based on the light-emitting spectrum.
7. The method of any of claims 1-6, wherein the performance parameter comprises at least one of current density, current efficiency, and external quantum efficiency.
8. An apparatus for testing a light emitting diode device, comprising:
the input module is used for inputting test voltage to the light-emitting diode device;
the first obtaining module is used for obtaining the light emitting area of the light emitting diode device based on the test voltage;
a first determination module for determining a performance parameter of the light emitting diode device based on the test voltage and the light emitting area.
9. A computing device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the method of any of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1 to 7.
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