CN113820576B - Method and device for testing light-emitting diode device - Google Patents
Method and device for testing light-emitting diode device Download PDFInfo
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- CN113820576B CN113820576B CN202010555755.3A CN202010555755A CN113820576B CN 113820576 B CN113820576 B CN 113820576B CN 202010555755 A CN202010555755 A CN 202010555755A CN 113820576 B CN113820576 B CN 113820576B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
Abstract
The application provides a method and a device for testing a light emitting diode device, and relates to the technical field of semiconductor photoelectricity. The technical scheme provided by the application can improve the accuracy of measuring the brightness of the light-emitting diode device.
Description
Technical Field
The present application relates to the field of semiconductor photoelectric technology, and in particular, to a method and apparatus for testing a light emitting diode device.
Background
With the continuous development of semiconductor photoelectric technology, various light emitting diode (Light Emitting Diode, LED) devices are also becoming more and more widely used. Brightness is an important parameter for light emitting diode devices, and thus it is often desirable to test the brightness of light emitting diode devices during testing and use.
In the prior art, the brightness of a certain area of the light emitting diode device can be directly read as the brightness of the light emitting diode device by a brightness meter under the condition of driving the light emitting diode device.
However, due to the influence of factors such as the device structure and the manufacturing process of the light emitting diode device, the brightness of the light emitting diode is not uniform when the light emitting diode emits light, so that the brightness read by the prior art is difficult to accurately represent the real brightness of the light emitting diode device.
Disclosure of Invention
In view of the above, the present application provides a method and apparatus for testing a light emitting diode device to improve the accuracy of measuring brightness.
In order to achieve the above purpose, the present application adopts the following technical scheme:
in a first aspect, an embodiment of the present application provides a method for testing a light emitting diode device, including:
acquiring a first image of a light emitting diode device and a first brightness of the light emitting diode device;
driving the light emitting diode device to acquire a second image of the light emitting diode device;
a second brightness of the light emitting diode device is determined based on the first brightness, the first image, and the second image.
Optionally, the first brightness is the brightness of the light emitting diode device at a preset position, and the second brightness is the average brightness of the light emitting diode device.
Optionally, the acquiring the first image of the light emitting diode device and the first brightness of the light emitting diode device includes:
acquiring the first image and the first brightness under the condition that the light emitting diode device is not driven under the current external illumination;
the driving the light emitting diode device includes:
and keeping the current external illumination condition unchanged and driving the light emitting diode device.
Optionally, the determining the second brightness of the light emitting diode device based on the first brightness, the first image, and the second image includes:
and determining the second brightness based on the first brightness, the pixel characteristics of the first image at the preset position and the pixel characteristics of the second image.
Optionally, the first image and the second image comprise a gray scale map, and the pixel feature comprises a gray scale value;
the determining the second brightness based on the first brightness, the pixel characteristic of the first image at the preset position and the pixel characteristic of the second image includes:
determining the gray value of the first image at the preset position;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value of the second image.
Optionally, the determining the second brightness based on the first brightness, the gray value of the first image at the preset position, and the gray value of the second image includes:
determining the brightness distribution of the light emitting diode device in the second image based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image;
the second brightness is determined based on a brightness distribution of the light emitting diode device in the second image.
Optionally, the determining the second brightness based on the first brightness, the gray value of the first image at the preset position, and the gray value of the second image includes:
determining an average gray value of the second image based on the gray value distribution of the second image;
and determining the brightness corresponding to the average gray value of the second image based on the first brightness and the gray value of the first image at the preset position, and determining the brightness corresponding to the average gray value as the second brightness.
Optionally, the determining the second brightness based on the first brightness, the gray value of the first image at the preset position, and the gray value of the second image includes:
Determining the gray value of the first image at the preset position as a gray value threshold;
acquiring gray value distribution of the second image larger than the gray value threshold;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image larger than the gray value threshold.
Optionally, the preset position is a geometric center of the first image.
Optionally, before said driving the light emitting diode device, further comprising:
and presintering the light emitting diode device.
Optionally, the method further comprises:
determining the second brightness as a starting brightness;
and measuring the time period spent by the light-emitting diode device when the initial brightness is reduced to the preset brightness, and determining the time period as the service life of the light-emitting diode device.
Optionally, the current external lighting condition has a lighting intensity greater than 0, and further includes:
determining an actual light emitting area of the light emitting diode device based on pixel characteristics of the first image;
the driving the light emitting diode device includes:
determining a test current input to the light emitting diode device based on the actual supposed light emitting area and a preset current density;
And driving the light emitting diode device based on the test current.
Optionally, the determining, based on the pixel characteristics of the first image, an actual light emitting area of the light emitting diode device includes:
performing edge detection on the first image, and determining the number of pixels corresponding to the actually supposed luminous area of the light-emitting diode device in the first image;
and determining the actual light-emitting area based on the pixel number and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light-emitting diode device corresponding to each pixel in the first image.
In a second aspect, an embodiment of the present application provides an apparatus for testing a light emitting diode device, including:
the acquisition module is used for acquiring a first image of the light-emitting diode device and first brightness of the light-emitting diode device; driving the light emitting diode device to acquire a second image of the light emitting diode device;
and a determining module for determining a second brightness of the light emitting diode device based on the first brightness, the first image and the second image.
Optionally, the first brightness is the brightness of the light emitting diode device at a preset position, and the second brightness is the average brightness of the light emitting diode device.
Optionally, the acquiring module is further configured to:
acquiring the first image and the first brightness under the condition that the light emitting diode device is not driven under the current external illumination;
and keeping the current external illumination condition unchanged and driving the light emitting diode device.
Optionally, the determining module is further configured to:
and determining the second brightness based on the first brightness, the pixel characteristics of the first image at the preset position and the pixel characteristics of the second image.
Optionally, the first image and the second image comprise a gray scale map, and the pixel feature comprises a gray scale value;
the determining module is further configured to:
determining the gray value of the first image at the preset position;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value of the second image.
Optionally, the determining module is further configured to:
determining the brightness distribution of the light emitting diode device in the second image based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image;
the second brightness is determined based on a brightness distribution of the light emitting diode device in the second image.
Optionally, the determining module is further configured to:
determining an average gray value of the second image based on the gray value distribution of the second image;
and determining the brightness corresponding to the average gray value of the second image based on the first brightness and the gray value of the first image at the preset position, and determining the brightness corresponding to the average gray value as the second brightness.
Optionally, the determining module is further configured to:
determining the gray value of the first image at the preset position as a gray value threshold;
acquiring gray value distribution of the second image larger than the gray value threshold;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image larger than the gray value threshold.
Optionally, the preset position is a geometric center of the first image.
Optionally, the method further comprises:
and the presintering module is used for presintering the light-emitting diode device.
Optionally, the determining module is further configured to determine the second brightness as a starting brightness;
further comprises:
and the measuring module is used for measuring the time spent by the light-emitting diode device when the initial brightness is reduced to the preset brightness, and determining the time as the service life of the light-emitting diode device.
Optionally, the illumination intensity of the current external illumination condition is greater than 0, and the determining module is further configured to determine, based on the pixel characteristics of the first image, an actual light-emitting area of the light-emitting diode device;
the acquisition module is further configured to:
determining a test current input to the light emitting diode device based on the actual supposed light emitting area and a preset current density;
and driving the light emitting diode device based on the test current.
Optionally, the determining module is further configured to:
performing edge detection on the first image, and determining the number of pixels corresponding to the actually supposed luminous area of the light-emitting diode device in the first image;
and determining the actual light-emitting area based on the pixel number and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light-emitting diode device corresponding to each pixel in the first image.
In a third aspect, embodiments of the present application provide a computing device comprising: a memory and a processor, the memory for storing a computer program; the processor is configured to perform the method of the first aspect or any implementation of the first aspect when the computer program is invoked.
In a fourth aspect, an embodiment of the present application provides a computer readable storage medium, on which a computer program is stored, which when executed by a processor implements the method according to the first aspect or any implementation of the first aspect.
In a fifth aspect, embodiments of the present application provide a computer program product, which when run on a computing device, causes the computing device to perform any of the above-described first aspects.
In the embodiment of the application, the first image and the first brightness of the light emitting diode device can be obtained, and then the light emitting diode device is driven to obtain the second image of the light emitting diode device, so that the second brightness of the light emitting diode device can be accurately determined according to the second image under the condition of driving the light emitting diode device by taking the first image and the first brightness as references. Compared with a mode of only acquiring the brightness at a certain position of the light-emitting diode device to represent the actual brightness of the light-emitting diode device, the accuracy of acquiring the brightness of the light-emitting diode device is remarkably improved.
Drawings
FIG. 1 is a flow chart of a method for testing a light emitting diode device according to an embodiment of the present application;
FIG. 2 is a schematic diagram of an LED device according to an embodiment of the present application;
FIG. 3 is a schematic diagram of another embodiment of an LED device;
FIG. 4 is a schematic diagram of another embodiment of an LED device;
FIG. 5 is a schematic diagram of another embodiment of an LED device;
fig. 6 is a schematic structural diagram of an apparatus for testing a light emitting diode device according to an embodiment of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth such as the particular system architecture, techniques, etc., in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
In order to facilitate understanding of the technical solution in the embodiment of the present application, the application scenario of the embodiment of the present application is first described below.
The Light Emitting Diode device may include a quantum dot Light Emitting Diode (Quantum Dot Light Emitting Diodes, QLED) device, an Organic Light-Emitting Diode (OLED) device, and the like, according to a Light Emitting principle; devices of structures such as a top-down emission, an inverted bottom emission, and an inverted top emission may be included according to the device structure.
The manufacturing process of the light-emitting diode device with the front-end bottom emission structure comprises the steps of firstly depositing a hole injection layer on a transparent anode substrate, then depositing a hole transport layer on the hole injection layer, then depositing a quantum dot light-emitting layer on the hole transport layer, then depositing an oxide electron transport layer on the quantum dot light-emitting layer, and finally depositing a metal cathode on the electron transport layer, wherein the reflection of the cathode to visible light is not lower than 98%; the manufacturing process of the light emitting diode device of the front-end top emission structure may include, first, depositing a hole injection layer on a transparent anode substrate, then, depositing a hole transport layer on the hole injection layer, and then, depositing a quantum dot light emitting layer on the hole transport layer; then depositing an oxide electron transport layer on the quantum dot luminescent layer, and finally depositing a cathode on the electron transport layer, wherein the transmission of the cathode to visible light is not less than 90%; the manufacturing process of the light emitting diode device of the inverted bottom emission structure may include, first, depositing an electron transport layer on a cathode substrate, then depositing a quantum dot light emitting layer on the electron transport layer, then depositing a hole transport layer on the quantum dot light emitting layer, then depositing a hole injection layer on the hole transport layer, and finally depositing a metal anode on the hole injection layer, the anode reflecting not less than 98% of visible light; the manufacturing process of the light emitting diode device of the inverted top emission type and the like structure may include first depositing an electron transport layer on a cathode substrate, then depositing a quantum dot light emitting layer on the electron transport layer, then depositing a hole transport layer on the quantum dot light emitting layer, then depositing a hole injection layer on the hole transport layer, and finally depositing an anode on the hole injection layer, wherein the transmission of anode visible light is not less than 90%.
During testing or use of a light emitting diode device, it is often necessary to measure the brightness of the light emitting diode device, which is represented by a brightness meter in the prior art. However, as can be seen from the above description, the led devices may have different structures based on different manufacturing processes, which may result in different uniformity of light emission of the led devices with different structures, so that the brightness of a certain position of the led device is not representative any more, and thus the accuracy of the brightness of the resulting led device is low.
To solve this technical problem, the present application provides a system for testing light emitting diode devices, which may include a test device and a computing device in communication. The test device may be used to provide a hardware environment for testing the light emitting diode device, such as a recess for placement of the light emitting diode device, contact points for providing a test voltage to the light emitting diode device, etc., and may include an integrating sphere measurement device, a silicon diode measurement device, or other types of test devices. The computing device may be used to provide a software environment for testing the light emitting diode devices, such as setting test voltages and performing related data calculations, etc.
An image sensor, such as a Charge-coupled Device (CCD) or a complementary metal oxide semiconductor (Complementary Metal Oxide Semiconductor, CMOS), may be disposed in the test Device at a position opposite to the light emitting diode test Device, so that an image of the light emitting diode Device when light is emitted can be acquired, and a determination of a light emitting area of the light emitting diode Device and an area of the light emitting area can be performed. Of course, in practical applications, the actual light emitting area of the light emitting diode device may be determined in other ways.
It should be noted that, the computing device may include a mobile phone, a tablet computer, a wearable device, a vehicle-mounted device, a notebook computer, an Ultra-mobile personal computer (Ultra-Mobile Personal Computer, UMPC), a netbook, a personal digital assistant (Personal Digital Assistant, PDA), and the like, which have data computing capabilities, and the embodiment of the present application does not limit the specific type of the computing device.
It should also be noted that in practical applications, the test device may also be integrated with the computing device.
The method for testing the light-emitting diode device can be applied to computing equipment in the test system. The first image and the first brightness of the light emitting diode device can be obtained, and then the light emitting diode device is driven to obtain the second image of the light emitting diode device, so that the second brightness of the light emitting diode device can be accurately determined according to the second image under the condition of driving the light emitting diode device by taking the first image and the first brightness as references. Compared with a mode of only acquiring the brightness at a certain position of the light-emitting diode device to represent the actual brightness of the light-emitting diode device, the accuracy of acquiring the brightness of the light-emitting diode device is remarkably improved.
The present application will be specifically described below in connection with the above application scenario. The following embodiments may be combined with each other, and some embodiments may not be repeated for the same or similar concepts or processes.
Referring to fig. 1, a flowchart of a method for testing a light emitting diode device according to an embodiment of the application is shown. It should be noted that the method is not limited by the specific order shown in fig. 1 and described below, and it should be understood that, in other embodiments, the order of some steps in the method may be interchanged according to actual needs, or some steps in the method may be omitted or deleted. The method comprises the following steps:
step 101, test environment preparation.
The light emitting diode device to be tested, the test device, and the computing device may be prepared, such as connecting the test device and the computing device, placing the light emitting diode device within the test device, opening a test interface in the computing device, and so forth.
Step 102, burn-in is performed on the led device.
In order to ensure that the light emitting diode device can emit light normally, the light emitting diode device may be pre-burned.
The burn-in may refer to an operation of inputting a first designated voltage or a designated current to the light emitting diode device for a first preset period of time before the light emitting diode device emits light normally.
It should be noted that the determination of the luminescent material based on the measured light emitting diode device may be achieved by the first specified voltage, the specified current or the first preset time period.
For example, for a blue light quantum dot device, a specified current of 2mA (milliamp) may be input to the blue light quantum dot device (i.e., a quantum dot light emitting diode device of blue light emitting material) for 2 minutes, thereby pre-lighting the blue light quantum dot device until no more macroscopic change occurs in light emitting area thereof; for a green light quantum dot device, a specified current of 2mA may be input to the green light quantum dot device for 5 minutes until no more macroscopic change in its light emitting area occurs. For a red light quantum dot device, a specified current of 2mA may be input to the red light quantum dot device for 8 minutes until no more macroscopic change in its light emitting area occurs.
Step 103, obtaining the light-emitting spectrum of the light-emitting diode device, and determining that the light-emitting diode device emits light normally based on the light-emitting spectrum.
In order to ensure that the light emitting diode device can emit light normally, and in order to ensure that the test device can detect the light emitting diode device normally, the light emitting spectrum of the light emitting diode device can be obtained.
And when the light emitting spectrum is not smooth, the second designated voltage and the second preset duration can be adjusted until the light emitting spectrum is smooth. If the light emitting spectrum of the light emitting diode device can be detected through the test device, the light emitting spectrum is smooth, and the peak is in the preset peak range, the light emitting diode device can be determined to emit light normally, and meanwhile, the test device can be determined to detect the light emitting diode device normally.
It should be noted that, the second specified voltage, the second preset duration and the preset peak range may be determined in advance based on the tested light emitting diode device, and taking the blue light quantum dot device as an example, the second specified voltage may be 4 v, the second preset duration may be 100 ms, and the corresponding preset peak range may be between 450 and 480 nm.
It should be noted that, in practical applications, at least one of the steps 101 to 103 may be omitted, for example, after performing step 101 once, a plurality of tests of the led devices may be performed, where the same led device is continuously tested, step 102 may not be repeatedly performed to burn in, or step 103 may be omitted where it is determined that the led device and the test device are normal through other means.
Step 104, under the condition that the external light is currently applied and the light emitting diode device is not driven, acquiring a first image of the light emitting diode device and a first brightness of the light emitting diode device.
In order to facilitate the comparison of the light emitting diode devices before and after driving under the same external illumination condition, the influence of external illumination in a test environment on the light emission of the measured light emitting diode devices is reduced, so that the accuracy of determining the brightness of the light emitting diode devices is improved, and the first image and the first brightness of the light emitting diode devices can be obtained under the condition that the light emitting diode devices are not driven under the current external illumination.
The light emitting diode device is placed in the testing device for testing, so that the front illumination condition can be a closed light-tight dark environment, and of course, light from other external light sources, such as sunlight or lamplight, can be included. And the less the illumination intensity of the external illumination condition is, the less the disturbance to the determination of the brightness of the diode device is.
The first image may include a gray scale image or a color image.
Alternatively, the first brightness may be a brightness of the light emitting diode device at a preset position.
It should be noted that the preset position may be obtained by setting in advance, for example, since the center of the led device is usually necessarily illuminated, the preset position may be the geometric center of the first image, so as to facilitate the subsequent reference to determine the brightness when the led device is driven.
Wherein the computing device may obtain a first image of the light emitting diode device through an image sensor (such as a CCD) provided in the test device, and read the luminance of the preset position through a luminance meter. Alternatively, in other embodiments, the computing device may retrieve the stored first image and the brightness of the preset location from memory.
Of course, in practical applications, the first luminance may also be the luminance of any position of the light emitting diode device, or the first luminance may also be the average luminance of all the actual light emitting areas or part of the actual light emitting areas of the light emitting diode device when the first image is acquired.
In addition, in another possible implementation manner, the first image and the first brightness may be acquired under other illumination conditions and driving conditions, for example, the first image and the first brightness may be acquired under a specific external illumination condition without driving the light emitting diode device.
Step 105, keeping the current external illumination condition unchanged and driving the light emitting diode device to obtain a second image of the light emitting diode device.
The test environment may be maintained after performing step 104 and a test voltage may be input to the light emitting diode device to drive the light emitting diode device, and then a second image of the light emitting diode device may be acquired. That is, step 104 and step 105 may differ only in whether or not to drive the light emitting diode device.
It should be noted that, the purpose of keeping the current external illumination condition unchanged and driving the led device is to reduce the interference of the external illumination on the measurement of the brightness of the led device as much as possible, so as to further improve the accuracy of measuring the brightness. In practical applications, the external illumination condition may be omitted, or the measured brightness may be corrected according to the external illumination condition during the subsequent processing.
It should be further noted that the manner of acquiring the second image may be the same as that of acquiring the first image, and the image type of the second image may also be the same as that of the first image, for example, may include at least one of a gray scale image and a color image.
Alternatively, a test current input to the light emitting diode device may be determined based on an actually supposed light emitting area and a preset current density, and the light emitting diode device may be driven based on the test current.
Since it is necessary to refer to the area of the light emitting diode device that should be emitted when the light emitting diode device is tested, such as calculating the current density. Although a theoretical light-emitting area should be designed when designing the light-emitting diode device, in an actual manufacturing process, the light-emitting material may not entirely cover the light-emitting layer, such as a burr or an irregular area may occur at an edge of the electrode, resulting in an actual light-emitting area that is smaller than the designed theoretical light-emitting area. Therefore, in order to accurately control a test current for driving the light emitting diode device, thereby improving the accuracy and reliability of the test of the light emitting diode device, an actual light emitting area of the light emitting diode device may be determined.
It should be noted that, the actually supposed light emitting area may be an area actually covered by the light emitting material in the light emitting layer of the light emitting diode device, that is, an area actually having light emitting capability of the light emitting diode device.
When the illumination intensity of the external illumination condition in which the first image is obtained is greater than 0, the actual light emitting area of the light emitting diode device may be determined based on the pixel characteristics of the first image. When the illumination intensity of the external illumination condition for acquiring the first image is equal to 0, the undriven light emitting diode device can be shot through white light shooting, a third image (the external illumination condition when acquiring the third image can be different from the external illumination condition when acquiring the second image) is acquired, then edge detection is performed on the third image based on the pixel characteristics of the third image, so that the actually supposed light emitting area is obtained, wherein the white light shooting can acquire the color image of the shot object through supplementing the white light source.
For example, as shown in fig. 2, the led device has a black stripe-shaped region at the upper left corner edge thereof, which may not emit light due to burrs at the edge of the device electrode or irregularities in the edge of the device electrode, as can be seen from fig. 2. The light emitting diode device is shot through CCD white light shooting, the obtained third image is shown in fig. 3, and the edge detection is carried out on the third image, so that the actually supposed light emitting area can be determined. It should be appreciated that although fig. 3 is a gray scale, the third image actually captured may be colored.
Taking the example of determining the actual light emitting area of the light emitting diode device based on the pixel characteristics of the first image, edge detection can be performed on the first image, the number of pixels corresponding to the actual light emitting area of the light emitting diode device in the first image is determined, and the actual light emitting area is determined based on the number of pixels and a preset mapping relation, wherein the preset mapping relation can be used for indicating the area of the light emitting diode device corresponding to each pixel in the first image.
Where an image edge represents the ending of one region in the image and the beginning of another region, the set of pixels between adjacent regions in the image may constitute the edge of the image, which may be understood as the set of pixels where the gray scale of the image spatially abrupt. The image edge has two elements, namely: direction and magnitude. The pixel value along the edge direction changes more smoothly; the pixel values vary considerably along the direction perpendicular to the edges. Based on this variation, the first and second derivatives can be used to describe and detect edges. Therefore, the first image may be subjected to edge detection to obtain one or more closed regions composed of pixels corresponding to the actually supposed light emitting region, and the number of pixels corresponding to the actually supposed light emitting region may be determined by counting the pixels in the closed regions.
It should be noted that, the preset mapping relationship may be determined in advance, since the distance between the image sensor and the light emitting diode device is fixed after the image sensor and the light emitting diode device are placed, the light emitting diode device is shot by the image sensor, and for different images obtained by shooting, the actual area corresponding to each pixel in the image in the light emitting diode device is a constant. Thus, in an alternative embodiment, after the image sensor and the led device are placed, the image of the led device may be obtained by photographing the led device through the image sensor, and the ratio between the area of the led device and each pixel, that is, the size of the area corresponding to each pixel, may be determined by dividing the area of the led device by the pixels of the image of the led device. Accordingly, the preset mapping relationship may be expressed as y=ax, where y may represent an actual light emitting area, x may represent the number of pixels, and a may represent a ratio between an area of the light emitting diode device and each pixel.
For example, the area of the light emitting diode device is 0.004 square centimeter, the light emitting diode device is photographed, the obtained image includes 40 ten thousand pixels, the size of the area corresponding to each pixel can be 0.004/400000, and the preset mapping relationship can be expressed as y=x 0.004/400000. Then, if the number of pixels corresponding to the actually supposed light emitting area in the first image is 39 ten thousand, it may be determined that the actually supposed light area of the light emitting diode device is 0.0039 square centimeters based on the preset mapping relation.
It should be noted that, the preset current density may be set in advance according to the test requirements such as the test mode. The current density is the physical quantity of the current intensity and the flowing direction at a certain point in the circuit. In the constant current test mode, the current density may be maintained constant and the test voltage input to the light emitting diode device may be changed during the driving and testing of the light emitting diode device; in the constant voltage test mode, a constant test voltage of the light emitting diode device may be given, and a plurality of preset current densities may be determined in advance, and a test current input to the light emitting diode device may be changed according to the preset current densities; in the constant brightness test mode, the brightness of the light emitting diode device may be maintained constant by varying a test voltage input to the light emitting diode device and controlling a test current according to a current density set in advance.
When the preset current density and the actually supposed light emitting area are determined, the test current inputted to the light emitting diode device may be determined by the following formula 1:
I＝a·J D (equation 1)
Wherein J is D Is the current density; i is a test current input to the light emitting diode device; a is the actual area of the light emitting diode device that should emit light.
Step 106, determining the second brightness of the light emitting diode device based on the first brightness, the pixel characteristic of the first image at the preset position and the pixel characteristic of the second image.
Wherein the second luminance may be an average luminance of the light emitting diode device (all actual light emitting areas or partial actual light emitting areas). Of course, in practical applications, the second brightness may also be the brightness of the light emitting diode device at any position.
Since the resulting image can reflect information such as color and brightness of the light emitting diode device when photographing and imaging the light emitting diode device, the color and brightness of the light emitting diode device can be reflected in the image when the light emitting diode device does not emit light and emits light. The brightness of the light emitting diode device at any position corresponds to the pixel characteristics of the same position in the obtained image. Therefore, if the correspondence between the brightness of the same position of the light emitting diode device and the pixel characteristic, such as the correspondence between the brightness of the preset position and the pixel characteristic of the first image at the preset position, is determined, the brightness of the light emitting diode device at any position can be determined according to the pixel characteristic of the second image at any position.
Wherein the pixel characteristic may comprise a pixel value. If the first image or the second image is a gray scale image, the pixel characteristic may include a gray scale value; if the first image or the second image is a color image, the pixel characteristic may comprise pixel values of at least one color channel.
Alternatively, the gray value of the first image at the preset position may be determined, where the gray value of the first image at the preset position corresponds to the brightness (i.e., the first brightness) of the light emitting diode device at the preset position, and the second brightness is determined based on the brightness of the light emitting diode device at the preset position, the gray value of the first image at the preset position, and the gray value of the second image.
The position of the luminance meter (i.e., the preset position) and the position of the image sensor may be determined, the relative position of the luminance meter and the image sensor is determined according to the position of the luminance meter and the position of the image sensor, and then the preset position in the first image is determined based on the position of the image sensor and the relative position.
Taking the second brightness as the average brightness of all the actual light emitting areas of the light emitting diode device and taking the first brightness as the brightness of the preset position as an example, when determining the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image, the second brightness of the light emitting diode device can be determined by any one of the following modes:
In one mode, the brightness distribution of the light emitting diode device in the second image is determined based on the brightness of the light emitting diode device in the preset position, the gray value of the first image in the preset position, and the gray value distribution of the second image, and the second brightness of the light emitting diode device is determined based on the brightness distribution of the light emitting diode device in the second image.
According to the ratio between the brightness of the light emitting diode device at the preset position and the gray value of the first image at the preset position, determining the brightness corresponding to each gray value according to the gray value of the second image at each position, namely determining the brightness of the light emitting diode device at each position of the second image, and then carrying out normal distribution calculation on the brightness of the light emitting diode device at each position of the second image to obtain the second brightness of the light emitting diode.
It should be noted that, in practical applications, the light emitting diode device may also include a more complex correspondence between brightness and gray values at the same location.
Optionally, since a part of the area of the light emitting diode device may not emit light, in order to reduce statistics on gray values of the non-light emitting area and improve calculation efficiency, edge detection may be performed on the second image, so as to determine an image area corresponding to an actual light emitting area of the light emitting diode device in the second image, determine a brightness distribution of the light emitting diode device in the actual light emitting area based on brightness of the light emitting diode device at a preset position, a gray value of the first image at the preset position, and a gray value distribution of the image area, and determine a second brightness of the light emitting diode device based on the brightness distribution of the light emitting diode device in the actual light emitting area.
Note that the actual light emitting region may be a region where the light emitting diode device actually emits light when driven, and the area of the actual light emitting region may be smaller than or equal to the actual light emitting area.
In another aspect, an average gray value of the second image is determined based on the gray value distribution of the second image, a luminance corresponding to the average gray value of the second image is determined based on the luminance of the light emitting diode device at the preset position and the gray value of the first image at the preset position, and the luminance corresponding to the average gray value is determined as the second luminance of the light emitting diode device.
The gray values of the second image at each position can be subjected to normal distribution calculation to determine an average gray value of the second image, and then the second brightness of the light emitting diode device is determined according to the average gray value of the second image according to the proportional relation between the brightness of the light emitting diode device at the preset position and the gray value of the first image at the preset position.
Alternatively, since the first image is obtained under the condition that the light emitting diode device is not driven and the second image is obtained under the condition that the light emitting diode device is driven under the same external illumination condition, the area of the second image having the gray value lower than the gray value of the preset position in the first image can be regarded as non-light emission, and the area of the gray value smaller than the gray value of the preset position in the first image can be ignored when determining the second brightness of the light emitting diode device based on the second image, thereby further improving the reliability of determining the brightness of the light emitting diode device. Therefore, when determining the second brightness of the light emitting diode device based on the brightness of the light emitting diode device at the preset position, the gray value of the first image at the preset position and the gray value distribution of the second image, the gray value of the first image at the preset position can be determined as the gray value threshold value, the gray value distribution of the second image larger than the gray value threshold value is obtained, and the second brightness of the light emitting diode device is determined based on the brightness of the light emitting diode device at the preset position, the gray value of the first image at the preset position and the gray value distribution of the second image larger than the gray value threshold value.
The gray value of the first image at the preset position can be subtracted from the gray value of the second image at each position, so that the normalization processing of the gray value in the second image is realized, and the gray value distribution of the second image larger than the gray value threshold value is obtained.
Of course, the brightness threshold of the light emitting diode device at the preset position of the first image may be determined, after the brightness distribution of the light emitting diode device in the second image is determined, the brightness of the light emitting diode device at the preset position of the first image is subtracted from each brightness value, so as to implement normalization processing on the brightness of the light emitting diode device in the second image, obtain the brightness distribution of the light emitting diode device in the second image greater than the brightness threshold, and then determine the second brightness of the light emitting diode device.
For example, for a light emitting diode device enclosed in a test device, the first image acquired may be as shown in fig. 4 and the second image as shown in fig. 5. Wherein the first image is acquired under the condition of the undriven light emitting diode device, and thus the image is black. Fig. 5 is obtained under the condition that the light emitting diode device is driven, and as can be seen from comparison with fig. 4, there is a part of the region where the gray value is high, and thus it can be determined that the light emitting diode device emits light in this part of the region. If the gray value and the corresponding brightness of the arbitrary position in the first image are determined, the brightness corresponding to the gray value at the arbitrary position in fig. 5 can be determined according to the proportional relationship between the gray value and the brightness.
In some embodiments, when the first image and the second image are color images, the first image and the second image may be converted into gray scale images, and then the brightness of the light emitting diode device may be determined in the above manner.
And step 107, determining the second brightness as the initial brightness, measuring the time spent by the light-emitting diode device when the initial brightness is reduced to the preset brightness, and determining the time as the service life of the light-emitting diode device.
The preset brightness may be determined in advance, for example, the preset brightness may be 90% or 95% of the initial brightness. Of course, in practical applications, the preset brightness may be other values, and the magnitude of the preset brightness is not specifically limited in the embodiments of the present application.
The embodiment of the application can accurately input the test current to the light-emitting diode device and accurately determine the brightness of the light-emitting diode device, so that the brightness change of the light-emitting diode device in the test process can also be accurately determined, and the accuracy of determining the service life can be obviously improved.
For example, the operating lives of the light emitting diode devices 1 and 2 were tested by the test methods provided in the prior art and the embodiments of the present application, respectively, and the test results are shown in table 1 below. Wherein the third column is the initial brightness of the light emitting diode device, and the unit is cd (candela)/m 2 (square meter); the fourth column is the length of time required for the brightness of the light emitting diode device to decrease from the initial brightness to 90% of the initial brightness; the fifth column is the length of time required for the luminance of the light emitting diode device to decrease from the initial luminance to 90% of the initial luminance when the initial luminance is converted to 1Knit (kilonit).
TABLE 1
As can be seen from table 1, the test method provided in the embodiment of the application can more accurately measure the initial brightness of the led device, so that the finally determined lifetime of the led device (i.e. the fifth column of data in table 1) is also more accurate than the prior art.
Of course, in practical applications, other performance parameters of the led device, such as at least one of current efficiency and external quantum efficiency, may also be tested.
The current efficiency may be a ratio of an amount of a substance actually deposited or dissolved on an electrode at the time of electrolysis to a precipitation or dissolution amount calculated by theory, and the current efficiency of the light emitting diode device may be determined by the following equation 2:
η A ＝L/J D (equation 2)
Wherein eta A Is current efficiency; l is the luminous brightness of the LED device and can be tested by a testing deviceTo (d).
The external quantum efficiency may be the ratio of the number of electrons collected to the number of all incident photons, when photons are incident on the surface of the photosensitive device, some of the photons excite the photosensitive material to generate electron-hole pairs to form a current. The current density of the light emitting diode device may be determined by the following equation 3:
wherein q is a basic charge; h is a Planck constant; c is the speed of light in vacuum; lambda is the wavelength; g (lambda) is the photopic vision function of the human eye; s (lambda) is the normalized electroluminescent spectrum.
In the embodiment of the application, the first image and the first brightness of the light emitting diode device can be obtained, and then the light emitting diode device is driven to obtain the second image of the light emitting diode device, so that the second brightness of the light emitting diode device can be accurately determined according to the second image under the condition of driving the light emitting diode device by taking the first image and the first brightness as references. Compared with a mode of only acquiring the brightness at a certain position of the light-emitting diode device to represent the actual brightness of the light-emitting diode device, the accuracy of acquiring the brightness of the light-emitting diode device is remarkably improved.
Based on the same inventive concept, as an implementation of the method, the embodiment of the present application provides a device for testing a light emitting diode device, where the embodiment of the device corresponds to the embodiment of the method, for convenience of reading, details of the embodiment of the method are not repeated one by one, but it should be clear that the device in the embodiment can correspondingly implement all the details of the embodiment of the method.
Referring to fig. 6, a schematic structural diagram of an apparatus 600 for testing a light emitting diode device according to an embodiment of the present application is shown in fig. 6, where the apparatus provided in this embodiment includes:
An acquisition module 601, configured to acquire a first image of a light emitting diode device and a first brightness of the light emitting diode device; driving the light emitting diode device to obtain a second image of the light emitting diode device;
a determining module 602 is configured to determine a second luminance of the light emitting diode device based on the first luminance, the first image, and the second image.
Optionally, the first brightness is the brightness of the light emitting diode device at a preset position, and the second brightness is the average brightness of the light emitting diode device.
Optionally, the obtaining module is further configured to:
acquiring the first image and the first brightness under the condition that the light emitting diode device is not driven under the current external illumination;
the current external illumination condition is kept unchanged and the light emitting diode device is driven.
Optionally, the determining module is further configured to:
the second brightness is determined based on the first brightness, the pixel characteristics of the first image at the preset position, and the pixel characteristics of the second image.
Optionally, the first image and the second image comprise a gray scale map, the pixel feature comprising a gray scale value;
the determination module is also for:
determining the gray value of the first image at the preset position;
The second brightness is determined based on the first brightness, the gray value of the first image at the preset position, and the gray value of the second image.
Optionally, the determining module is further configured to:
determining the brightness distribution of the light emitting diode device in the second image based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image;
the second luminance is determined based on a luminance distribution of the light emitting diode device in the second image.
Optionally, the determining module is further configured to:
determining an average gray value of the second image based on the gray value distribution of the second image;
and determining the brightness corresponding to the average gray value of the second image based on the first brightness and the gray value of the first image at the preset position, and determining the brightness corresponding to the average gray value as the second brightness.
Optionally, the determining module is further configured to:
determining the gray value of the first image at the preset position as a gray value threshold;
acquiring gray value distribution of the second image larger than the gray value threshold;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image larger than the gray value threshold.
Optionally, the preset position is a geometric center of the first image.
Optionally, the method further comprises:
and the presintering module is used for presintering the light-emitting diode device.
Optionally, the determining module is further configured to determine the second brightness as a starting brightness;
further comprises:
and the measuring module is used for measuring the time spent by the light-emitting diode device when the initial brightness is reduced to the preset brightness, and determining the time as the service life of the light-emitting diode device.
Optionally, the illumination intensity of the current external illumination condition is greater than 0, and the determining module is further configured to determine, based on the pixel characteristics of the first image, an actual light emitting area of the light emitting diode device;
the acquisition module is also used for:
determining a test current input to the light emitting diode device based on the actual light emitting area and a preset current density;
based on the test current, the light emitting diode device is driven.
Optionally, the determining module is further configured to:
performing edge detection on the first image, and determining the number of pixels corresponding to the actually supposed light emitting area of the light emitting diode device in the first image;
and determining the actual luminous area based on the number of pixels and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light emitting diode device corresponding to each pixel in the first image.
The apparatus 600 for testing a light emitting diode device according to the present embodiment may perform the above-mentioned method embodiments, and its implementation principle and technical effects are similar, and will not be described herein.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, the specific names of the functional units and modules are only for distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.
The embodiment of the application also provides a computing device, which comprises: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, which when executed by the processor performs the steps of any of the various method embodiments described above.
Embodiments of the present application also provide a computer readable storage medium storing a computer program which, when executed by a processor, implements steps for implementing the various method embodiments described above.
Embodiments of the present application provide a computer program product that when run on a computing device causes the mobile computing device to perform steps that may be implemented as described in the various method embodiments above.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application may implement all or part of the flow of the method of the above embodiments, and may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the computer program may implement the steps of each of the method embodiments described above. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code to a photographing device/terminal apparatus, recording medium, computer Memory, read-Only Memory (ROM), random access Memory (RAM, random Access Memory), electrical carrier signals, telecommunications signals, and software distribution media. Such as a U-disk, removable hard disk, magnetic or optical disk, etc. In some jurisdictions, computer readable media may not be electrical carrier signals and telecommunications signals in accordance with legislation and patent practice.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus/network device and method may be implemented in other manners. For example, the apparatus/network device embodiments described above are merely illustrative, e.g., the division of the modules or units is merely a logical functional division, and there may be additional divisions in actual implementation, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection via interfaces, devices or units, which may be in electrical, mechanical or other forms.
It should be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It should also be understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
As used in the present description and the appended claims, the term "if" may be interpreted as "when..once" or "in response to a determination" or "in response to detection" depending on the context. Similarly, the phrase "if a determination" or "if a [ described condition or event ] is detected" may be interpreted in the context of meaning "upon determination" or "in response to determination" or "upon detection of a [ described condition or event ]" or "in response to detection of a [ described condition or event ]".
Furthermore, the terms "first," "second," "third," and the like in the description of the present specification and in the appended claims, are used for distinguishing between descriptions and not necessarily for indicating or implying a relative importance.
Reference in the specification to "one embodiment" or "some embodiments" or the like means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," and the like in the specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments" unless expressly specified otherwise. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless expressly specified otherwise.
The above embodiments are only for illustrating the technical solution of the present application, and not for limiting the same; although the application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.
Claims (15)
1. A method of testing a light emitting diode device, comprising:
acquiring a first image of a light emitting diode device and first brightness of the light emitting diode device, wherein the first brightness is the brightness of the light emitting diode device at a preset position;
driving the light emitting diode device to acquire a second image of the light emitting diode device;
and determining a second brightness based on the first brightness, the pixel characteristics of the first image at the preset position and the pixel characteristics of the second image.
2. The method of claim 1, wherein the second luminance is an average luminance of the light emitting diode device.
3. The method of claim 1 or 2, wherein the acquiring a first image of a light emitting diode device and a first brightness of the light emitting diode device comprises:
acquiring the first image and the first brightness under the condition that the light emitting diode device is not driven under the current external illumination;
the driving the light emitting diode device includes:
and keeping the current external illumination condition unchanged and driving the light emitting diode device.
4. The method of claim 1, wherein the first image and the second image comprise gray scale images and the pixel features comprise gray scale values;
The determining the second brightness based on the first brightness, the pixel characteristic of the first image at the preset position and the pixel characteristic of the second image includes:
determining the gray value of the first image at the preset position;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value of the second image.
5. The method of claim 4, wherein the determining the second luminance based on the first luminance, the gray value of the first image at the preset location, and the gray value of the second image comprises:
determining the brightness distribution of the light emitting diode device in the second image based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image;
the second brightness is determined based on a brightness distribution of the light emitting diode device in the second image.
6. The method of claim 4, wherein the determining the second luminance based on the first luminance, the gray value of the first image at the preset location, and the gray value of the second image comprises:
Determining an average gray value of the second image based on the gray value distribution of the second image;
and determining the brightness corresponding to the average gray value of the second image based on the first brightness and the gray value of the first image at the preset position, and determining the brightness corresponding to the average gray value as the second brightness.
7. The method of claim 4, wherein the determining the second luminance based on the first luminance, the gray value of the first image at the preset location, and the gray value of the second image comprises:
determining the gray value of the first image at the preset position as a gray value threshold;
acquiring gray value distribution of the second image larger than the gray value threshold;
and determining the second brightness based on the first brightness, the gray value of the first image at the preset position and the gray value distribution of the second image larger than the gray value threshold.
8. The method of claim 1, wherein the predetermined location is a geometric center of the first image.
9. The method of claim 1, further comprising, prior to said driving said light emitting diode device:
And presintering the light emitting diode device.
10. The method according to any one of claims 1-9, further comprising:
determining the second brightness as a starting brightness;
and measuring the time period spent by the light-emitting diode device when the initial brightness is reduced to the preset brightness, and determining the time period as the service life of the light-emitting diode device.
11. The method of claim 10, wherein the current external lighting condition has a lighting intensity greater than 0, further comprising:
determining an actual light emitting area of the light emitting diode device based on pixel characteristics of the first image;
the driving the light emitting diode device includes:
determining a test current input to the light emitting diode device based on the actual supposed light emitting area and a preset current density;
and driving the light emitting diode device based on the test current.
12. The method of claim 11, wherein determining an actual area that the light emitting diode device should emit light based on the pixel characteristics of the first image comprises:
performing edge detection on the first image, and determining the number of pixels corresponding to the actually supposed luminous area of the light-emitting diode device in the first image;
And determining the actual light-emitting area based on the pixel number and a preset mapping relation, wherein the preset mapping relation is used for indicating the area of the light-emitting diode device corresponding to each pixel in the first image.
13. An apparatus for testing a light emitting diode device, comprising:
the acquisition module is used for acquiring a first image of the light-emitting diode device and first brightness of the light-emitting diode device; driving the light-emitting diode device to obtain a second image of the light-emitting diode device, wherein the first brightness is the brightness of the light-emitting diode device at a preset position;
and the determining module is used for determining a second brightness based on the first brightness, the pixel characteristic of the first image at the preset position and the pixel characteristic of the second image.
14. A computing device, comprising: a memory and a processor, the memory for storing a computer program; the processor is configured to perform the method of any of claims 1-12 when the computer program is invoked.
15. A computer readable storage medium, on which a computer program is stored, which computer program, when being executed by a processor, implements the method according to any of claims 1-12.
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