Disclosure of Invention
In order to solve the technical problems, the invention aims to provide a single cell voltage inspection acquisition terminal of a fuel cell stack, which can be quickly assembled and disassembled, can absorb stack assembly errors and can stably operate for a long time.
In order to achieve the purpose, the invention adopts the following technical scheme:
the utility model provides a fuel cell pile monocell voltage patrols and examines collection terminal, includes fixed bolster, probe integrated component and PCB plug connector, and a plurality of probe integrated component intervals set up on the fixed bolster, and the probe integrated component passes through the wire and is connected with the PCB plug connector, the probe integrated component includes probe base and probe, the probe base is fixed on the support, and sets up a plurality of through holes on the probe base, the probe sets up in the through hole, the probe includes the probe cover and inserts the probe head of establishing in the probe cover, and still is equipped with the spring between probe cover and the probe head.
Preferably, a probe seat is further arranged in the through hole of the probe base, the probe seat is sleeved on the outer side of the probe, and one end of the probe seat is connected with the lead.
Preferably, the diameter of the probe head is 0.25-1.5 mm, and the probe head is in a flat-head cylindrical shape, a pointed needle shape, a round head shape or a multi-convex shape.
Preferably, the pitch of the through holes on the probe base is the same as the installation pitch of the bipolar plate of the single cell stack to be tested.
Preferably, the through hole in the probe base comprises a wire guide hole for a wire to pass through and a mounting hole for the probe seat to insert, and the inner diameter of the mounting hole is larger than that of the wire guide hole.
Preferably, the fixing support is formed by splicing two identical support frames, an installation groove for installing the probe base is formed in the middle of each support frame, and a gap for a lead to pass through is reserved on the splicing surfaces of the two support frames.
As the preferred scheme, two support frames are fastened through first screws, and waist-shaped holes convenient for second screws to penetrate are further formed in the two ends of each support frame.
Preferably, the probe base is made of high-strength insulating materials, and comprises bakelite, epoxy resin boards, PEI boards or PPS boards.
Preferably, the probe seat is made of brass, phosphor bronze or carbon steel, and the surface of the probe seat is plated with nickel, gold or rhodium gold.
Preferably, the probe head and the probe sleeve are made of brass, phosphor bronze or carbon steel, and the surfaces of the probe head and the probe sleeve are plated with nickel, gold or rhodium gold.
Compared with the prior art, the invention has the beneficial effects that: the invention can be nondestructively, efficiently and stably arranged in a pile voltage detection area on the basis of not modifying the pile structure, stably outputs voltage detection signals, and can be suitable for graphite bipolar plate piles and metal bipolar plate piles with reserved detection grooves or without reserved detection grooves by changing the types of the probes.
Detailed Description
It should be noted that the following detailed description is exemplary and is intended to provide further explanation of the disclosure. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, elements, and/or combinations thereof, unless the context clearly indicates otherwise.
Further, in the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, unless otherwise specified, "a plurality" means two or more unless explicitly defined otherwise.
In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless otherwise expressly stated or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
The invention will be further illustrated with reference to the following examples and drawings:
as shown in fig. 1 to 5, this embodiment provides a fuel cell stack monocell voltage patrols and examines collection terminal, including fixed bolster 4, probe integrated piece and PCB plug connector 5, a plurality of probe integrated piece intervals set up on fixed bolster 4, and the probe integrated piece passes through wire 6 and is connected with PCB plug connector 5, the probe integrated piece includes probe base 1 and probe 3, probe base 1 fixes on support 4, and sets up a plurality of through-holes on the probe base 1, probe 3 sets up in the through-hole, probe 3 includes probe cover 33 and inserts the probe head 31 of establishing in probe cover 33, and still is equipped with spring 32 between probe cover 33 and the probe head 31. The probe base is characterized in that a probe base 2 is further arranged in the through hole of the probe base 1, the probe base 2 is sleeved on the outer side of the probe 3, and one end of the probe base 2 is connected with the lead 6.
The probe seat is used for installing a probe, connecting the probe and a PCB plug connector as shown in figure 4, transmitting a bipolar plate voltage signal detected by the probe to the PCB plug connector and consists of a metal base sleeve and a lead at the tail part, wherein the metal base sleeve is made of high-conductivity materials such as brass, phosphor bronze and the like or carbon steel such as SK-4 and the like, and is treated by processes such as surface nickel plating, gold plating, rhodium gold plating and the like, so that the surface contact strip resistance is reduced. The lead is made of high-conductivity materials such as gold, brass, silver and the like and is connected to the PCB connector.
The probe is a metal terminal used for directly contacting with the galvanic pile bipolar plate and comprises a probe sleeve, a probe head and a spring, the diameter of the probe head is 0.25-1.5 mm, the form of the probe head is shown in figure 10, and a flat-head cylinder (G), a sharp needle shape (C), a round head shape (B), a multi-bump shape (A) and the like can be adopted. The probe head can move within a stroke range of 0-2 mm, and can generate mounting pretightening force which is more than or equal to 10gf through the spring, so that the probe head is in close contact with the bipolar plate, the contact resistance of the probe head and the bipolar plate is reduced, the detection precision is improved, stable contact is maintained in long-term operation, and the long-term stable work of a detection system is ensured;
the probe head and the probe sleeve are made of high-conductivity materials such as brass and phosphor bronze or carbon steel such as SK-4, the surface of the probe head and the probe sleeve is plated with nickel, gold and rhodium gold, the resistance of cA surface contact strip is reduced, the maximum current can be borne by the probe head and the probe sleeve and is less than or equal to 2A, the spring is made of spring steel such as SWP-A, the working temperature is stabilized to be-30-80 ℃, and the probe head and the probe sleeve can stably work for cA long time in the working range of the galvanic pile.
The size of the mounting hole on the probe base is 0.03mm larger than the outer diameter of the probe base, and the distance between the through holes on the probe base 1 is the same as the mounting distance of the bipolar plate of the single cell of the electric pile to be tested. The number of the through holes is the same as that of the probes, and the through holes are calculated according to the diameter of the probe head, the machining tolerance of the through holes, the stacking tolerance of the bipolar plate of the galvanic pile and the like.
The through hole on the probe base 1 comprises a wire guide hole 12 for the lead 6 to pass through and a mounting hole 11 for the probe base 2 to insert, and the inner diameter of the mounting hole 11 is larger than that of the wire guide hole 12.
The fixed support 4 is composed of two identical support frames in a splicing mode, a mounting groove for mounting the probe base 1 is formed in the middle of each support frame, and a gap for the lead 6 to penetrate through is reserved on the splicing surfaces of the two support frames. The two support frames are fastened through the first screws 7, and waist-shaped holes convenient for the second screws to penetrate are further formed in the two ends of each support frame.
The probe base 1 is made of high-strength insulating materials and comprises bakelite, an epoxy resin board, a PEI board or a PPS board.
The method comprises the following specific operation steps:
1. installing a probe seat on a probe base, wherein a lead at the tail part of the probe seat penetrates through a lead hole of the probe base, and a probe is inserted into the probe seat;
2. the assembled probe integrated piece is arranged outside the electric pile 100, the probe is inserted into a detection groove of a bipolar plate (a cathode plate 102 and an anode plate 103) of a single cell 101, if the bipolar plate is internally provided with the detection groove, the probe is arranged at the middle part of the thickness of the bipolar plate as much as possible, and two adjacent probes are required to be positioned at two sides of a membrane electrode 104, particularly two sides of a membrane electrode frame 105; according to the steps, the probe integrated parts of all the sections are installed on the electric pile;
3. two support frames are arranged on two sides of the probe integrated piece, the probe integrated piece is clamped tightly by the two support frames through fastening of first screws, and two ends of each support frame are fixed on a front end plate 108 and a rear end plate 107 of the pile through second screws respectively.
The present invention may be installed at any one of the four sides around the stack, and is not limited to the upper area shown in fig. 6, and may be installed in the left and right areas;
4. uniformly marking the lead wires led out of the probe integrated component clearly according to the positions of the corresponding bipolar plates; uniformly integrating the lead wires led out from the probe integrated component to the wiring terminals of the PCB connector according to wiring definition; the PCB connectors are typically in the form of female PCB connectors. The PCB board that is connected to the monocell voltage through the PCB connector patrols and examines circuit conveniently dismantles, overhauls and changes fast.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
Although the embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and not to be construed as limiting the present invention, and those skilled in the art can make changes, modifications, substitutions and alterations to the above embodiments without departing from the principle and spirit of the present invention, and any simple modification, equivalent change and modification made to the above embodiments according to the technical spirit of the present invention still fall within the technical scope of the present invention.