CN114609528A - Inspection contactor for electric pile test bench and inspection method thereof - Google Patents

Abstract

The invention belongs to the field of proton exchange membrane fuel cell detection, and particularly relates to an inspection contactor for a stack test bench and an inspection method thereof. The invention has the advantages of simple use, easy adjustment, reliable contact, convenient observation and recording and is beneficial to quickly finishing the inspection and installation. The method can be used for experimental detection of a small amount of different electric pile specification changes, can also be used for repeated detection on a continuous production line with unchanged electric pile specification, improves the operation efficiency, and is beneficial to reducing the research and development and production cost.

Description

A kind of inspection contactor for stack test bench and inspection method thereof

technical field

The invention is applied to the field of proton exchange membrane fuel cell detection, in particular to a single cell voltage inspection device and method used for fuel cell detection.

Background technique

The detection of hydrogen proton exchange membrane fuel cells includes many aspects, among which the single cell voltage is an important content. Specifically, in the detection of the stack, the voltage of each single cell needs to be monitored, which is called patrol inspection. The patrol inspection is to obtain the potential through the contact between the conductive probe and the single cell pole plate. For the fuel cell test bench, the inspection system provided by the test bench may not be specific to a specific type of stack, and needs to be adapted to the detection of different types of stacks as much as possible.

In the actual inspection, if the tested stack does not have its own inspection device, or the stack's own inspection device cannot be used by the test bench, it is necessary to use the test bench to add a patrol instrument to the stack, and use the probe to realize the detection of each single cell. Potential acquisition.

The inspection of various stacks requires fast and reliable probe implementation. The number and thickness of single cells of various stacks encountered by the test bench are different, and this operation needs to be repeated in large quantities during production. The thickness of the single cell of the conventional stack is millimeters, generally 1 to 3 mm, and its trend is getting thinner and thinner. and installation compression deformation, the thickness of the single cells of the entire stack forms an occasional, non-repetitive micro-accumulation. Therefore, after a certain number of single cells in the stack, the specific probe spacing, especially the total distance between the head and tail It can no longer remain fixed, and the height difference of different stacks of the same type and process of stacks can exceed the thickness of a single cell. In fact, when the total thickness difference is close to half the thickness of a single cell, the probes with fixed spacing cannot adapt to the change well, and manual adjustment is required. Especially with the improvement of the current technology, the thickness of the single cell has been reduced to about 1mm, and the inspection itself has also increased the difficulty of allocating these small probes.

The prior art includes the inspection of a specific stack with a fixed number of single cells and a fixed spacing, and also includes a non-specific inspector to complete the inspection of the stack to be tested. Several techniques for adjusting the pitch of the probes are listed here to facilitate the understanding of the technical background. For example, Chinese patents CN113140762A, CN201910712118.X, CN102938470B, CN202433417U and CN212342869U, etc., use the method of fixing the probes in the sockets on the board to complete the voltage inspection of the exclusive specific stack. Patents CN212989415U, CN211653089U, CN201922363039.0, CN202020179251.1, etc., have elastic probes, elastic wire contact probes, etc., to complete the detection of non-exclusive stacks, facilitate removal, and use fixed brackets without adjusting the spacing. The patent CN211785982U uses a spring to adjust the distance between the collection probes, and the patent CN211603482U uses a parallelogram structure to adjust the distance between the probe and the electrode plate, and the number of detected single cells does not change.

The above techniques either do not consider adjusting the spacing, or do not consider the amount of adjustment, and there are still many inconveniences in use.

In addition, since various stacks are designed with their own specific probe interface methods on the single cell, and different probe contact points or areas that can be used, from the perspective of the test bench, it is necessary to adopt a general design structure to adapt to Different thicknesses of single cells, contact positions, and the number of single cell stacks in the stack, but also controllable protection of contact pressure.

SUMMARY OF THE INVENTION

In order to overcome the shortcomings of the prior art, the present invention provides an inspection contactor for a stack test bench and an inspection method thereof, which are used for fuel cell inspection probes to measure the number and spacing of single cells of the stack to be tested. adaptive adjustment.

The invention is suitable for the inspection and testing of various types of stacks, and has the advantages of being simple to use, easy to adjust, easy to observe and record, reliable in contact, and conducive to quickly completing inspection and installation, and can be used for a small number of different electric The experimental detection of changes in stack specifications can also be used for repeated detection on continuous production lines with constant stack specifications, which is beneficial to reduce R&D and production costs, and is safe and reliable. The detection and processing of electric potential are known and conventional technologies, which are related to the present invention, but do not belong to the present invention, so the relevant content is omitted.

The concrete technical scheme of the present invention is as follows:

An inspection contactor used for a stack test bench, a contactor frame is provided with a probe board group, and the bottom of the probe board group is provided with a wire to lead the potential of the current collector plate c, and then superimposed elastic elements and Probe board, the probe board is provided with probes, the probes are crimped or welded in the grooves or holes on the probe board, the top probe board is provided with a cover plate, the spring is pressed on the cover plate, the cover plate The gasket on the spring is connected with the plate pressure adjusting nut. The upper end of the plate pressure adjusting nut is provided with a wire to lead the potential of the collector plate a. Caps, springs, and various probe boards and elastic elements until the wires lead to the potential of the collector plate c, each probe card is connected to the inspection signal processor through the wires, and the wires lead to the collector plate a potential to connect a collector of the stack. The flow plate a is connected to the inspection signal processor through the wire a, and the wire leads the current collector plate c to the other current collecting plate c of the stack, and is connected to the inspection signal processor through the wire c, and the insulation limiter is in the probe. On the same side of the probe on the needle board, there are adjustable elongated holes and fixing screws. There are several fixing screws, such as 2. The fixing screws fix the insulating stopper on the detector frame, and adjust the probe through the elongated hole. The distance between the needle and the front end of the insulation stopper.

Further, the probe card is provided with periodic marks, which is convenient for inspection and recording, for example, a mark is set on the probe card on the position of repeated numerical value every 10 digits or 8 digits, and the mark is a notch or convex on the side of the plate. up or different colors.

Further, the probe card uses any one of thin metal plate, high polymer plate and hard composite plate.

Further, the rotating shaft uses any one of metal, high polymer material and composite material, preferably high polymer material.

Further, the number of the probes is not limited, but preferably 40 to 200; for a single cell stack with more than 200 single cells, multiple sets of contactors of the present invention are used to complete the test.

Further, the distance between each probe board in the relaxed state is 1.1-2.2mm, and after compression, the distance between each probe is 1-2mm, and the thickness reaches the thickness of the single battery, which is also suitable for the thickness of the single cell. A set of probe series with a pitch of 1.5 to 3.0 mm can be set.

Further, the elastic element is any one of a spring ring, a spring sheet, a rubber plate, and a foamed rubber plate.

Further, since each component of the probe card group is at the gram level, and the cumulative weight is in the hundreds of grams or hundreds of grams, the elastic force of the elastic element 15 is several times the overall weight of the probe card, such as the compressive elastic force of 1000-3000g. , to eliminate the effect of the weight of each component of the probe card assembly on compression.

A patrol inspection method for a stack test bench. When the number of single cells of the stack to be tested is less than or equal to the detection number of a single set of patrol contactors, a set of patrol contactors is used for detection, and the pressure of the nut is adjusted to complete the inspection. The probe board is in one-to-one correspondence with the single cells of the stack. Under the limit protection of the insulating stopper, the detector frame is fixed on the stack, so that all the probes are pressed against the edge of the corresponding single cell, and the wire Lead and connect the current collector plate a to one current collector plate a of the stack, and the wire leads the current collector plate c to the other current collector plate c of the stack to obtain the potential of the anode and cathode respectively, forming a complete pair of electricity with the probe. Detection of the potential of each cell of the stack.

When the number of single cells of the stack to be tested is between the detection number of a single group of inspection contactors and the detection number of two groups of inspection contactors, two groups of inspection contactors are used for detection, and the first group of contactors remains the first. The probes of the group of contactors are in place, and only the plate pressure adjustment nut is adjusted to make the distance between the probes suitable for the distance between the single cells of the stack. The second group of contactors and the first group of contactors are staggered from the top view. For the excess number of probe boards above, the excess second group of contactor probe parts are indexed to deviate from the contact with the stack electrode plates, and the remaining second contactor probe parts are in-situ contact with the stack electrode plates, so as to To achieve the purpose of using a specific number of probes; when rotating, refer to the periodic notches on the probe board for easy adjustment, the position of the first probe at the bottom of the second group of contacts is the same as the position of the first probe at the top of the first group of contacts. The positions of the needles are adjacent. The first group of contactor wires leads the current collector plate c to the potential connection to the current collector plate below the stack to obtain the lowest potential of the stack; the second group of contactor wires leads the current collector plate a to the potential connection above the stack. of the current collector plate to obtain the uppermost potential of the stack.

The beneficial effects of the present invention compared with the prior art are:

(1) The probe can be easily adjusted to suit the specifications of the specific stack, including the distance between cells and the number of cells;

(2) Simple to use, periodic marks are conducive to adjustment, observation and recording;

(3) It can be used not only for the experimental detection of a small number of changes in different stack specifications, but also for repeated detection on a continuous production line with constant stack specifications, improving operational efficiency and reducing R&D and production costs.

Description of drawings

Figure 1 is a schematic side view of the basic structure of the inspection contactor;

Figure 2 is a top view of the rotation of part of the probe of the patrol device;

Figure 3 is a schematic diagram of the in-situ rounded corners and the straight edge of the probe card;

Figure 4 is a schematic diagram of the rounded corners and the straight edge of the clamping position after the probe card is rotated;

5 is a schematic top view of two sets of contactors when they are used together;

FIG. 6 is a schematic front view of two sets of contactors when they are used together.

Among them, 1. Inspection signal processor; 2. Conductor; 3. Contactor frame; 4. Plate pressure adjusting nut; 5. Rotating shaft; 6. Spring; 7. Gasket; 10. Insulation limiter; 11. Long hole; 12. Fixing screw; 13. Probe board; 14. Probe; 15. Elastic element; ; 17. Probe in situ; 18. Probe board in situ; 19. Probe board transposition; 20. Probe transposition; 21. Connecting line in situ; 22. Connecting line transposition; Contactor; 24. The second group of contactors; 25. The second group of contactor wires lead to the potential of the collector plate a; 26. The second group of contactor probe parts are indexed; 27. The second group of contactor probe parts are original 28. The first group of contactor probes in-situ; 29. The first group of wires leads to the potential of the collector plate c; 30. Rounded corners; 33. Wire a; 34. Wire c.

Detailed ways

The present invention is described in detail below through specific embodiments, but the protection scope of the present invention is not limited. Unless otherwise specified, the experimental methods used in the present invention are all conventional methods, and the experimental equipment, materials, reagents, etc. used can be obtained from commercial sources.

Due to the processing technology of the detection signal and the fixation of the inspector on the stack, it is not an innovative point of the present invention and will not be described in detail.

The wire 2 connected to the inspection signal processor 1 can be in the form of a wire harness, a terminal cable, a crimping terminal, a board card slot, etc. In this description, the wire is used as a representative for description. In the text, up and down, top view and front view are relative terms, which are only for the convenience of description, and the actual situation depends on the arrangement direction of the electrode plates of the stack.

Example 1

See Figures 1 to 4.

It is used for the detection of a single cell stack with 60 cells, and the cell thickness of the stack is 1.5±0.1mm.

The inspection contactor of the present invention is composed of an inspection signal processor 1, a contactor frame 3, a probe board group mounted on the frame, a compactor, a rotating shaft 5, an insulating stopper 10, etc., and its slack thickness is 3.0 mm, the pressing thickness is 1.2mm. Among them, the probe card group is a repeated probe card unit. The probe card unit is composed of the probe card 13 and the surface perpendicular to the plane of the probe card 13. The elastic rubber or sheet metal spring, the probe card 13 are superimposed. One side is connected to the wire 2 of the patrol signal processor 1 and the elastic probe on the other side of the probe board 13 is composed. The probe 14 is connected to the wire 2 , and transmits the contact potential of the single cell to the inspection signal processor 1 . The probe card 13 can use thin metal plate, high polymer plate, hard composite plate, etc. The probe card 13 has a central hole, and the central hole is installed with a common rotating shaft 5, which is perpendicular to the probe card group.

The probe card 13 has rounded corners 30, the rounded corners 30 rotate together with the probe card 13, and the first locking position formed by the straight edge 31 in contact with the detector frame 3 is defined as the in-situ use state; the rounded corners 30 After rotating 90° clockwise, the latch formed by the contact between the second latch straight edge 32 and the detector frame 3 is defined as the non-use state of the index.

Taking a probe card unit with 100 repetitions as an example, the probe card unit consists of the probe card 13 and the surface perpendicular to the plane of the probe card 13 superimposed on the elastic element 15. The elastic element 15 uses elastic rubber, and the probe card 13 One side is connected to the wire 2 of the inspection signal processor 1, and the other side of the probe board 13 is connected to the probe 14. The probe 14 is connected to the wire 2 , and transmits the electric potential of the contacted single cell to the inspection signal processor 1 . The probe card 13 uses a rigid composite plate, and has a central hole, and the central hole is installed with a common rotating shaft 5, and the rotating shaft 5 is perpendicular to the probe card group.

Wherein, the presser is located at one end of the probe card set, preferably on the side of the probe card 13 that can be rotated. It consists of the gasket and the plate pressure adjusting nut 4 on the gasket. The plate pressure adjusting nut 4 can be twisted to change the pressure of the probe card group through the gasket, the spring 6 and the cover plate 8, and compress each probe card. The thickness of the group can be adjusted to realize the spacing adjustment of the probe card group. The probes 14 are crimped or soldered into slots or holes in the probe card 10 . The center of the cover plate 8 , the spring 6 , the gasket and the plate pressure adjusting nut 4 of the presser all have concentric holes through which the rotating shaft 5 passes. When the pressure of the plate pressure adjusting nut 4 changes, each probe The needle plate group slides on the rotating shaft 5 to change the distance.

After releasing the pressure of the tight compactor, the probe board 13 can rotate around the rotation axis 5. According to the actual number of single battery cells in the stack, taking 60 single battery cells as an example, select a total of 40 single battery cells close to one end of the compactor. The probe cards 13 are rotated by 90° to deviate from the surface of the battery, and the probes 14 they carry avoid contact with the stack, so that the number of the remaining 60 probe cards 13 used is the same as the number of single cells.

The insulating stopper 10 is on the same side as the probe 14 of the probe board 13, and has an adjustable elongated hole 11 and a fixing screw 12. There are multiple fixing screws 12, for example, two. The fixing screw 12 connects the insulating stopper 10 It is fixed on the detector frame 3, and the distance from the front end of the insulating stopper 10 exposed in the relaxed state of the probe 14 is adjusted through the elongated hole 11. When the inspection contactor of the present invention approaches the stack, the already positioned insulating stopper 10 limits the expansion and contraction of the probe 14 , thereby protecting the probe 14 .

The conductor leads to the current collector plate a potential 9 is connected to one current collector plate a of the stack, and is connected to the inspection signal processor 1 through the wire a33. The wire c34 is connected to the inspection signal processor 1 to obtain the potentials of the anode and the cathode respectively, and forms a complete detection of the potential of each single cell of the stack with the probe 14 .

The above-mentioned wires lead to a total of 2 potentials of the collector plate.

According to the specific stack structure, one of the potential of the stack current collector and the detection potential of the adjacent probes connected by the wires has the potential difference formed by the potential of a single cell and the resistance of each connecting element, and the other is only the resistance of the various components. The potential difference formed here is assumed to be the current collector potential detected by the wire leading the current collector c potential 16 and the potential obtained by the adjacent probes. The difference is very small, and the value is generally much smaller than the single cell voltage value. Depending on the specific stack, this potential difference is generally formed by connection resistance, probe contact resistance, current collector plate body resistance, current collector plate-to-cell plate resistance, single-cell plate-to-electrode contact resistance, etc., and may include additional The non-power-generating conductive separators used for thermal management and other functions are the specific characteristics of the stack. The tester can decide whether to use or cancel one of the above-mentioned conductors to lead the collector plate potential connection according to the requirements of the detection purpose and the detection accuracy of the inspection signal processor 1 .

Set periodic marks on the probe card 13, starting from the first probe card 13 away from the plate pressure adjusting nut 4, set periodic marks on the probe card 13 at the position where the value is repeated every 10 digits. Use notches on the sides.

Example 2

The difference between this example and Example 1 is that the detection number of a set of contactors is exactly equal to the number of single cells of the stack to be tested, and part of the probe card rotation adjustment on the above-mentioned rotating shaft 5 in Example 1 is not performed.

Adjust the pressure of the nut 4 to complete the one-to-one correspondence between the probe card 13 and the single cells of the stack. Under the limit protection of the insulating stopper 10, the detector frame 3 fixes the detector frame 3 on the stack, so that all the The probes 14 are pressed against the respective corresponding cell edges.

The wire leads to the current collector plate a potential 9 to connect one current collector plate a of the stack, the wire leads the current collector plate c to the potential 16 to connect to the other current collector plate c of the stack, and obtains the potential of the anode and cathode respectively, forming with the probe 14 Complete detection of the potential of each single cell of the stack.

Example 3

See Figures 5 and 6.

This example is used to detect a stack with a single cell thickness of 1.5 mm and a single cell number of 160, using 2 sets of inspection contactors in Example 1. That is, when the detection number of a single set of inspection contactors is less than the number of single cells of the stack to be tested, a method of multiple inspection contactors is adopted.

The "top view" and "left view" of the top view and the left view here are only for the convenience of description, and are determined according to the arrangement direction of the electrode plates of the stack.

The two sets of inspectors can be fixedly connected and fixed to the stack, or they can be independently connected to the stack without mutual fixation. Only the last probe of the first set and its second set are determined. The starting position is continuous. And it is preferable to be independent and the two sets of inspectors are not connected and fixed to each other.

The first group of contactors 23 keeps the first group of contactor probes in their original positions 28, and only the plate pressure adjusting nut 4 is adjusted to achieve the probe spacing suitable for the stack cell spacing.

The second group of contactors 24 and the first group of contactors 23 are staggered in plan view. According to the number of 160 single cells in the stack, rotate the 40 probe boards above, so that the probe parts of the second group of 40 contactors are partially indexed 26 to deviate from the contact with the stack electrode plates, and the remaining 60 second contactors are probed. The needle part in-situ 27 contacts the contact of the stack electrode plate to achieve the purpose of using 60 pieces. When turning, refer to the periodic notches on the probe board for easy adjustment.

The position of the lowermost first probe of the second set of contacts 24 is adjacent to the position of the uppermost probe of the first set of contacts.

A total of 160 probes obtained 160 potentials.

The first group of contactor wires leads to the potential 29 of the collector plate c and connects to the collector plate below the stack to obtain the potential at the bottom of the stack, and transmits it to the inspection signal processor 1 through it.

The second group of contactor wires leads the potential 25 of the collector plate a to connect the collector plate above the stack to obtain the uppermost potential of the stack and transmit it to the inspection signal processor 1 .

The above-mentioned embodiments are only preferred embodiments of the present invention, rather than all possible embodiments of the present invention. For those skilled in the art, any obvious changes made to it without departing from the principle and spirit of the present invention should be considered to be included in the protection scope of the claims of the present invention.

Claims (10)

1. A patrol inspection contactor for a galvanic pile test bench is characterized in that a probe plate group is arranged in a contactor frame (3), a lead is arranged at the bottom of the probe plate group to lead a current collecting plate c potential (16), an elastic element (15) and a probe plate (13) are sequentially overlapped from bottom to top, the probe plate (13) is provided with a probe (14), the probe (14) is pressed or welded in a groove or a hole on the probe plate (13), a cover plate (8) is arranged on the probe plate (13) at the top, a spring (6) is pressed on the cover plate (8), the cover plate (8) is connected with a plate pressure adjusting nut (4) through a gasket (7) on the spring (6), the upper end of the plate pressure adjusting nut (4) is provided with a lead current collecting plate a potential (9), a rotating shaft (5) sequentially penetrates through the lead current collecting plate a potential (9), the plate pressure adjusting nut (4) and the spring (6) from top to bottom, and each probe board (13) and elastic element (15) until the potential (16) of the lead leading current collecting board c, each probe board (13) is respectively connected with the inspection signal processor (1) through a lead (2), the potential (9) of the lead leading current collecting board a is connected with a current collecting board a of the electric pile, is connected to the inspection signal processor (1) through a lead a (33), the potential (16) of a lead-in collecting plate c is connected with the other collecting plate c of the galvanic pile, is connected to the inspection signal processor (1) through a lead wire c (34), the insulation limiter (10) is arranged at the same side of a probe (14) on a probe board (13) and is provided with an adjustable strip hole (11) and a plurality of fixing screws (12), the insulation limiter (10) is fixed on the detector frame (3) by the fixing screws (12), the distance between the probe (14) and the front end of the insulation limiter (10) is adjusted through the long hole (11).

2. The inspection contactor according to claim 1, wherein the probe card (13) is provided with periodic markings.

3. The inspection contactor according to claim 1, wherein the probe card (13) is formed of any one of a thin metal plate, a high polymer plate, and a hard composite plate.

4. The inspection contactor according to claim 1, wherein the rotating shaft (5) is made of any one of metal, high polymer materials and composite materials.

5. The inspection contactor according to claim 1, wherein the number of probes (14) is 40 to 200.

6. The inspection contactor according to claim 1, wherein the distance between each probe card (13) in a relaxed state is 1.1-2.2 mm, and the distance between each probe card (14) after compression is 1-2 mm.

7. The inspection contactor according to claim 1, wherein the elastic element (15) is any one of a spring ring, a spring plate, a rubber plate and a foamed rubber plate.

8. The inspection contactor for the electric pile test bench according to claim 1, wherein the compression elasticity of the elastic element (15) is 1000-3000 g.

9. A method for inspecting a test bed of a galvanic pile is characterized in that when the number of single cells of the galvanic pile to be tested is less than or equal to the number of single inspection contactors, one inspection contactor is adopted for inspection, the pressure of a nut (4) is adjusted, probe plates (13) are in one-to-one correspondence with the single cells of the galvanic pile, under the limit protection of an insulating limiter (10), a detector frame (3) is fixed on the galvanic pile by the detector frame (3), all probes (14) are pressed on the edges of the corresponding single cells, a potential (9) of a lead-in current collecting plate a is connected with a current collecting plate a of the galvanic pile, a potential (16) of the lead-in current collecting plate c is connected with another current collecting plate c of the galvanic pile, the potentials of an anode and a cathode are obtained respectively, and the potential and the probe (14) form complete detection on the potential of each single cell of the galvanic pile.

10. An inspection method for a stack test bench according to claim 1, wherein when the number of single cells of the stack to be inspected is between the number of inspection contactors in a single group and the number of inspection contactors in two groups, two groups of inspection contactors are adopted for detection, the first group of contactors (23) keep the probes of the first group of contactors in situ (28), only the plate pressure adjusting screw cap (4) is adjusted to achieve the purpose that the distance between the probes (14) is suitable for the distance between single cells of the electric pile, the overlooking positions of the second group of contactors (24) and the first group of contactors (23) are staggered, according to the number of single cells of the pile, rotating the probe plates (13) with the excessive number above to enable the excessive second group of contactor probe parts to be indexed (26) to deviate from being in contact with the pile plates, and enabling the rest second contactor probe parts to be in-situ (27) in contact with the pile plates so as to achieve the purpose of using a specific number of probes; when the probe card rotates, the periodic gaps on the probe card (13) are referenced, so that the adjustment is convenient, the position of a first probe at the bottom of the second group of contactors (24) is adjacent to the position of a probe at the top of the first group of contactors (23), and the potential (c) of the first group of contactor lead current collecting plates is connected with the current collecting plates below the galvanic pile to obtain the potential at the bottom of the galvanic pile; and the potential (25) of a current collecting plate a of the second group of contactor leads is connected with the current collecting plate above the galvanic pile to obtain the uppermost potential of the galvanic pile.

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