CN113836021A

CN113836021A - Test method, test device, electronic apparatus, and medium

Info

Publication number: CN113836021A
Application number: CN202111122812.XA
Authority: CN
Inventors: 张志文; 郭文平
Original assignee: Kunlun Core Beijing Technology Co ltd
Current assignee: Kunlun Core Beijing Technology Co ltd
Priority date: 2021-09-24
Filing date: 2021-09-24
Publication date: 2021-12-24

Abstract

The disclosure provides a test method, a test device, electronic equipment and a medium, and relates to the technical field of computers, in particular to the field of chips. The implementation scheme is as follows: in response to a plurality of first test data having the same first sequence being included in the test data set, dividing each of the plurality of first test data into a first sequence and a second sequence other than the first sequence; based on the first sequence, executing the test on the object to be tested by utilizing the first test system to obtain first intermediate test data; and for each first test data in the plurality of first test data, executing the test on the object to be tested by using the second test system based on the first intermediate test data and the second sequence of the first test data to obtain a final test result.

Description

Test method, test device, electronic apparatus, and medium

Technical Field

The present disclosure relates to the field of computer technologies, particularly to the field of chips, and in particular, to a test method, an apparatus, an electronic device, a computer-readable storage medium, and a computer program product.

Background

Testing plays a very important role in the validation of hardware or software. In the continuous iteration and updating of hardware or software, the required tests are continuously refined and increased, which presents new requirements and challenges for the test method, namely how to ensure the test quality and the test efficiency under the condition of limited time and computing resources.

The approaches described in this section are not necessarily approaches that have been previously conceived or pursued. Unless otherwise indicated, it should not be assumed that any of the approaches described in this section qualify as prior art merely by virtue of their inclusion in this section. Similarly, unless otherwise indicated, the problems mentioned in this section should not be considered as having been acknowledged in any prior art.

Disclosure of Invention

The present disclosure provides a testing method, an apparatus, an electronic device, a computer-readable storage medium, and a computer program product.

According to an aspect of the present disclosure, there is provided a test method including: in response to a plurality of first test data having the same first sequence being included in the test data set, dividing each of the plurality of first test data into a first sequence and a second sequence other than the first sequence; based on the first sequence, executing the test on the object to be tested by utilizing the first test system to obtain first intermediate test data; and for each first test data in the plurality of first test data, executing the test on the object to be tested by using the second test system based on the first intermediate test data and the second sequence of the first test data to obtain a final test result.

According to another aspect of the present disclosure, there is provided a test apparatus including: a dividing unit configured to divide each of a plurality of first test data into a first sequence and a second sequence other than the first sequence in response to a plurality of first test data having the same first sequence being included in the test data set; a first test unit configured to perform a test on an object to be tested based on a first sequence to obtain first intermediate test data; and a second test unit configured to perform, for each of the plurality of first test data, a test on the object to be tested based on the first intermediate test data and the second sequence of the first test data to obtain a final test result.

According to another aspect of the present disclosure, there is provided an electronic device including: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method described above.

According to another aspect of the present disclosure, there is provided a non-transitory computer readable storage medium storing computer instructions for causing a computer to perform the above-described method.

According to another aspect of the disclosure, a computer program product is provided, comprising a computer program, wherein the computer program realizes the above-described method when executed by a processor.

According to one or more embodiments of the present disclosure, the test efficiency can be effectively improved.

It should be understood that the statements in this section do not necessarily identify key or critical features of the embodiments of the present disclosure, nor do they limit the scope of the present disclosure. Other features of the present disclosure will become apparent from the following description.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate exemplary embodiments of the embodiments and, together with the description, serve to explain the exemplary implementations of the embodiments. The illustrated embodiments are for purposes of illustration only and do not limit the scope of the claims. Throughout the drawings, identical reference numbers designate similar, but not necessarily identical, elements.

FIG. 1 illustrates a schematic diagram of an exemplary system in which various methods described herein may be implemented, according to an embodiment of the present disclosure;

FIG. 2 shows a flow diagram of a testing method according to an embodiment of the present disclosure;

FIG. 3 shows a schematic diagram of first test data according to an embodiment of the present disclosure;

FIG. 4 shows a schematic diagram of a multi-layer test system according to an embodiment of the present disclosure;

FIG. 5 shows a schematic diagram of another first test data according to an embodiment of the present disclosure;

FIG. 6 shows a schematic diagram of another multi-layer test system in accordance with an embodiment of the present disclosure;

FIG. 7 shows a block diagram of a test apparatus according to an embodiment of the present disclosure;

FIG. 8 illustrates a block diagram of an exemplary electronic device that can be used to implement embodiments of the present disclosure.

Detailed Description

Exemplary embodiments of the present disclosure are described below with reference to the accompanying drawings, in which various details of the embodiments of the disclosure are included to assist understanding, and which are to be considered as merely exemplary. Accordingly, those of ordinary skill in the art will recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope of the present disclosure. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.

In the present disclosure, unless otherwise specified, the use of the terms "first", "second", etc. to describe various elements is not intended to limit the positional relationship, the timing relationship, or the importance relationship of the elements, and such terms are used only to distinguish one element from another. In some examples, a first element and a second element may refer to the same instance of the element, and in some cases, based on the context, they may also refer to different instances.

The terminology used in the description of the various examples in this disclosure is for the purpose of describing particular examples only and is not intended to be limiting. Unless the context clearly indicates otherwise, if the number of elements is not specifically limited, the elements may be one or more. Furthermore, the term "and/or" as used in this disclosure is intended to encompass any and all possible combinations of the listed items.

In the related art, the test of hardware or software is often performed by a single-layer test system. For example, in the chip testing, a single-layer regression system is used to perform the testing, that is, the whole test set is introduced into the regression system at one time, and multiple rounds of regression simulation are performed in the testing environment through the regression system to generate corresponding test results, so that the quality of the design codes of the complete test chip is used to find out the design defects, thereby improving the chip flow success rate. The single-layer test system is limited by factors such as server resources and the size of the test data set, and the test frequency is not too high, for example, the test on the test data set can be completed in a week or even a month. However, in the background of rapid technology evolution, the update frequency of the object to be tested, the test data, the test environment, and the like is often higher than the operation frequency of the single-layer test system, so that the test system cannot meet the requirement of actual test.

Based on this, the present disclosure provides a testing method, which extracts a same first sequence from a plurality of first test data, performs a test on the first sequence by using a first testing system to obtain intermediate test data, and performs a test on a second sequence other than the first sequence in the first test data on the basis of the obtained intermediate test data by using a second testing system different from the first testing system to obtain a final test result. Therefore, the same part in the plurality of first test data can be tested only once to obtain the intermediate test result, and the intermediate test result can be shared in the test of other parts in the plurality of first test data, so that the overall test efficiency is effectively improved.

Embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings.

Fig. 1 illustrates a schematic diagram of an exemplary system 100 in which various methods and apparatus described herein may be implemented in accordance with embodiments of the present disclosure. Referring to fig. 1, the system 100 includes one or

more client devices

101, 102, 103, 104, 105, and 106, a server 120, and one or more communication networks 110 coupling the one or more client devices to the server 120.

Client devices

101, 102, 103, 104, 105, and 106 may be configured to execute one or more applications.

In embodiments of the present disclosure, the server 120 may run one or more services or software applications that enable the test methods to be performed.

In some embodiments, the server 120 may also provide other services or software applications that may include non-virtual environments and virtual environments. In certain embodiments, these services may be provided as web-based services or cloud services, for example, provided to users of

client devices

101, 102, 103, 104, 105, and/or 106 under a software as a service (SaaS) model.

In the configuration shown in fig. 1, server 120 may include one or more components that implement the functions performed by server 120. These components may include software components, hardware components, or a combination thereof, which may be executed by one or more processors. A user operating a

client device

101, 102, 103, 104, 105, and/or 106 may, in turn, utilize one or more client applications to interact with the server 120 to take advantage of the services provided by these components. It should be understood that a variety of different system configurations are possible, which may differ from system 100. Accordingly, fig. 1 is one example of a system for implementing the various methods described herein and is not intended to be limiting.

A user may use

client devices

101, 102, 103, 104, 105, and/or 106 to obtain a test data set. The client device may provide an interface that enables a user of the client device to interact with the client device. The client device may also output information to the user via the interface. Although fig. 1 depicts only six client devices, those skilled in the art will appreciate that any number of client devices may be supported by the present disclosure.

Client devices

101, 102, 103, 104, 105, and/or 106 may include various types of computer devices, such as portable handheld devices, general purpose computers (such as personal computers and laptops), workstation computers, wearable devices, smart screen devices, self-service terminal devices, service robots, gaming systems, thin clients, various messaging devices, sensors or other sensing devices, and so forth. These computer devices may run various types and versions of software applications and operating systems, such as MICROSOFT Windows, APPLE iOS, UNIX-like operating systems, Linux, or Linux-like operating systems (e.g., GOOGLE Chrome OS); or include various Mobile operating systems such as MICROSOFT Windows Mobile OS, iOS, Windows Phone, Android. Portable handheld devices may include cellular telephones, smart phones, tablets, Personal Digital Assistants (PDAs), and the like. Wearable devices may include head-mounted displays (such as smart glasses) and other devices. The gaming system may include a variety of handheld gaming devices, internet-enabled gaming devices, and the like. The client device is capable of executing a variety of different applications, such as various Internet-related applications, communication applications (e.g., email applications), Short Message Service (SMS) applications, and may use a variety of communication protocols.

Network 110 may be any type of network known to those skilled in the art that may support data communications using any of a variety of available protocols, including but not limited to TCP/IP, SNA, IPX, etc. By way of example only, one or more networks 110 may be a Local Area Network (LAN), an ethernet-based network, a token ring, a Wide Area Network (WAN), the internet, a virtual network, a Virtual Private Network (VPN), an intranet, an extranet, a Public Switched Telephone Network (PSTN), an infrared network, a wireless network (e.g., bluetooth, WIFI), and/or any combination of these and/or other networks.

The server 120 may include one or more general purpose computers, special purpose server computers (e.g., PC (personal computer) servers, UNIX servers, mid-end servers), blade servers, mainframe computers, server clusters, or any other suitable arrangement and/or combination. The server 120 may include one or more virtual machines running a virtual operating system, or other computing architecture involving virtualization (e.g., one or more flexible pools of logical storage that may be virtualized to maintain virtual storage for the server). In various embodiments, the server 120 may run one or more services or software applications that provide the functionality described below.

The computing units in server 120 may run one or more operating systems including any of the operating systems described above, as well as any commercially available server operating systems. The server 120 may also run any of a variety of additional server applications and/or middle tier applications, including HTTP servers, FTP servers, CGI servers, JAVA servers, database servers, and the like.

In some implementations, the server 120 may include one or more applications to analyze and consolidate data feeds and/or event updates received from users of the

client devices

101, 102, 103, 104, 105, and 106. Server 120 may also include one or more applications to display data feeds and/or real-time events via one or more display devices of

client devices

101, 102, 103, 104, 105, and 106.

In some embodiments, the server 120 may be a server of a distributed system, or a server incorporating a blockchain. The server 120 may also be a cloud server, or a smart cloud computing server or a smart cloud host with artificial intelligence technology. The cloud server is a host product in a cloud computing service system, and is used for solving the defects of high management difficulty and weak service expansibility in the traditional physical host and Virtual Private Server (VPS) service.

The system 100 may also include one or more databases 130. In some embodiments, these databases may be used to store data and other information. For example, one or more of the databases 130 may be used to store information such as audio files and video files. The database 130 may reside in various locations. For example, the database used by the server 120 may be local to the server 120, or may be remote from the server 120 and may communicate with the server 120 via a network-based or dedicated connection. The database 130 may be of different types. In certain embodiments, the database used by the server 120 may be, for example, a relational database. One or more of these databases may store, update, and retrieve data to and from the database in response to the command.

In some embodiments, one or more of the databases 130 may also be used by applications to store application data. The databases used by the application may be different types of databases, such as key-value stores, object stores, or regular stores supported by a file system.

The system 100 of fig. 1 may be configured and operated in various ways to enable application of the various methods and apparatus described in accordance with the present disclosure.

In the technical scheme of the disclosure, the collection, storage, use, processing, transmission, provision, disclosure and other processing of the personal information of the related user are all in accordance with the regulations of related laws and regulations and do not violate the good customs of the public order.

FIG. 2 shows a flow diagram of a testing method according to an embodiment of the present disclosure. As shown in fig. 2, the testing method includes: step S201, in response to the test data set including a plurality of first test data with the same first sequence, dividing each of the plurality of first test data into the first sequence and a second sequence except the first sequence; step S202, based on the first sequence, executing the test on the object to be tested by using the first test system to obtain first intermediate test data; and step S203, aiming at each first test data in the plurality of first test data, based on the first intermediate test data and the second sequence of the first test data, executing the test on the object to be tested by using the second test system to obtain a final test result.

Therefore, the same part in the plurality of first test data can be tested only once to obtain the intermediate test result, and the intermediate test result can be shared in the test of other parts in the plurality of first test data, so that the overall test efficiency is effectively improved.

Meanwhile, in the multi-layered test system constructed by the first test system and the second test system of the present disclosure, tests based on different versions of test data may be simultaneously performed in the first test system and the second test system. In the first test system, the number of the first sequences to be tested is the number of the types of the first sequences, thereby reducing the data amount to be tested in the first test system and enabling the first test system to perform the test at a higher test frequency. After any one of the object to be tested, the test data and the test environment is updated, the test based on the first sequence of the updated version can be rapidly completed, and the updated intermediate test data is obtained to be used by the second test system. In the second test system, for each first test data in the plurality of first test data, the test of the first sequence can be skipped and the test of the second sequence can be executed only, thereby effectively saving the test time. Based on this, utilize the multilayer test system that this disclosure provided to can promote holistic test efficiency.

In addition, problems existing in the test of the object to be tested by using the first sequence can be quickly exposed based on the first intermediate test data obtained by the first test system, so that the object to be tested can be debugged in a more targeted manner, and a foundation can be laid for the subsequent test of the second sequence.

According to some embodiments, the object to be tested is a chip.

According to some embodiments, the first test system and the second test system may be regression test systems.

For steps S201 and S202, the first intermediate test data may include state information of hardware and environment.

According to some embodiments, the first sequence precedes the second sequence in each of the plurality of first test data.

According to some embodiments, the first sequence may be an initialization instruction, the first intermediate test data comprising initialization information.

For example, when testing an AI chip applied to a big data center, complex initial configuration processes such as clock configuration, reset signal release, storage space initialization, firmware loading, port protocol training, etc. need to be performed based on the same initialization instruction first, and after this process, the chip enters a normal working state, and different test data may perform respective test verification work by using different sequences according to corresponding test targets.

Therefore, no matter what purpose the test data is used for, each test data needs to go through the same initialization process after loading and running, and the time of the process is often long and sometimes even longer than the verification time after normal operation on the SOC chip. Therefore, the first sequence formed by the initialization instruction is tested by the first test system, so that the second sequence tested in the second test system can share the intermediate test result of the first test system, the test time consumption caused by the repeated execution of the initialization process in the test process of a plurality of first test data is avoided, and the overall test efficiency is improved.

With respect to step S203, according to some embodiments, performing a test on the object to be tested by using the second test system based on the first intermediate test data and the second sequence of the first test data to obtain a final test result includes: determining first intermediate test data corresponding to the second sequence of the first test data based on the identification information corresponding to the second sequence of the first test data; and performing a test on the object to be tested by using the second test system based on the determined first intermediate test data and the second sequence of the first test data to obtain a final test result.

Therefore, the second test system can efficiently and accurately acquire the intermediate test data required by the test.

For example, the test list of the second test system may include identification information of the second sequence of each of the plurality of first test data, and the identification information may be used to indicate first intermediate test data required for the test thereof, so that the second test system may obtain the corresponding first intermediate test data to perform the test on the second sequence.

According to some embodiments, the identification information includes version information, and determining the first intermediate test data corresponding to the second sequence of the first test data based on the identification information corresponding to the second sequence of the first test data may include: and determining first intermediate test data corresponding to the second sequence of the first test data based on version information corresponding to the second sequence of the first test data, wherein the version information corresponding to the second sequence of the first test data is the same as the version information of the first intermediate test data.

In practical application, an object to be tested, a test environment, test data and the like all have corresponding version information. The first intermediate test data is obtained based on the version information, so that the test versions in the first test system and the second test system can be aligned, and the normal operation of the test can be ensured.

According to some embodiments, the first test system and the second test system may generate corresponding test reports, respectively, whereby the tester may evaluate the test result of the object to be tested based on the first sequence and the test result of the object to be tested based on the second sequence, respectively.

According to some embodiments, one or more of the test data set, the test environment, and the object to be tested may be debugged based on the final test result.

In real scenarios, often not all test data contain the same first sequence.

FIG. 3 shows a first test data diagram according to an embodiment of the present disclosure. As shown in fig. 3, the first test data 301, the first test data 302, and the first test data 303 have the same first sequence, while the first test data 301, the first test data 302, and the first test data 303 have different second sequences; the first test data 304 and the first test data 305 have the same first sequence, while the first test data 304 and the first test data 305 have different second sequences.

FIG. 4 shows a schematic diagram of a multi-layer test system according to an embodiment of the present disclosure. The test may be performed on the plurality of first test data of fig. 3 using a multi-layer test system as shown in fig. 4.

In the multi-layer test system in fig. 4, the first test system may be adopted to perform a test on the first sequence of the first test data 301, the first test data 302 and the first test data 303, and the first sequence of the first test data 304 and the first test data 305, respectively, to obtain corresponding first intermediate test data.

The second test system is adopted to perform a test on the second sequence of each of the first test data 301 to 305, wherein the second test system can determine first intermediate test data corresponding to the first test data according to the identification information corresponding to each of the first test data 301 to 305, and then complete the whole test process for each of the first test data 301 to 305 based on the first intermediate test data.

According to some embodiments, in response to at least two third test data having the same first subsequence in the second sequence being included in the plurality of first test data, dividing the second sequence in each of the at least two third test data into the first subsequence and a second subsequence other than the first subsequence; wherein, for each first test data in the plurality of first test data, based on the first intermediate test data and the second sequence of the first test data, performing a test on the object to be tested by using the second test system to obtain a final test result comprises: based on the first intermediate test data and the first subsequence, executing the test on the object to be tested by utilizing the first sub-test system in the second test system to obtain second intermediate test data; and for each third test data in the plurality of third test data, based on the second intermediate test data and the second subsequence of the third test data, executing a test on the object to be tested by using a second sub-test system in the second test system to obtain a final test result.

Due to the continuous evolution and development of functions of the object to be tested, the test data for performing the test on the object to be tested is often added with a new test sequence based on the existing test sequence to test the new function of the object to be tested. Therefore, the three-layer or even multi-layer test system can be built to better utilize the characteristics of the test set to carry out high-efficiency test.

FIG. 5 shows a first test data diagram according to an embodiment of the present disclosure. As shown in fig. 5, the first test data 501, the first test data 502, and the first test data 503 have the same first sequence; while the first test data 501 and the first test data 502 have the same first subsequence.

FIG. 6 shows a schematic diagram of a multi-layer test system according to an embodiment of the present disclosure. The test may be performed on the plurality of first test data of fig. 5 using a multi-layer test system as shown in fig. 6.

In the multi-layer test system of fig. 6, a first test system may be employed to test a first sequence of first test data 501, first test data 502, and first test data 503 to obtain corresponding first intermediate test data.

Based on the first intermediate test data, testing the first test data 501 and the first sub-sequence of the first test data 502 by adopting a first test subsystem in a second test system to obtain corresponding second intermediate test data; meanwhile, based on the first intermediate test data, the second sequence of the first test data 503 is tested by using the first test subsystem in the second test system, and the whole test process of the first test data 503 is completed.

Based on the second intermediate test data, the second test subsystem in the second test system is adopted to test the second sub-sequences of the first test data 501 and the first test data 502 respectively, so that the whole test process of the first test data 501 and the first test data 502 can be completed.

Fig. 7 shows a block diagram of a test apparatus according to an embodiment of the present disclosure. As shown in fig. 7, the test apparatus 700 includes: a first dividing unit 701 configured to divide each of a plurality of first test data into a first sequence and a second sequence other than the first sequence in response to a plurality of first test data having the same first sequence being included in the test data set; a first testing unit 702 configured to perform a test on an object to be tested based on a first sequence to obtain first intermediate test data; and a second testing unit 703 configured to perform, for each of the plurality of first test data, a test on the object to be tested based on the first intermediate test data and the second sequence of the first test data to obtain a final test result.

According to some embodiments, the apparatus further includes a second dividing unit configured to divide a second sequence of each of the at least two third test data into the first subsequence and a second subsequence other than the first subsequence in response to at least two third test data having a same first subsequence in the second sequence being included in the plurality of first test data; wherein the second test unit includes: a first sub-test unit configured to perform a test on the object to be tested based on the first intermediate test data and the first subsequence to obtain second intermediate test data; and a second sub-test unit configured to perform, for each of the plurality of third test data, a test on the object to be tested based on the second intermediate test data and the second sub-sequence of the third test data to obtain a final test result.

According to some embodiments, the second test unit comprises: the determining subunit is configured to determine, based on the identification information corresponding to the second sequence of the first test data, first intermediate test data corresponding to the second sequence of the first test data; and a third sub-test unit configured to perform a test on the object to be tested to obtain a final test result based on the determined first intermediate test data and the second sequence of the first test data.

According to some embodiments, the identification information comprises version information, and determining the sub-unit comprises: and determining a module of first intermediate test data corresponding to the second sequence of the first test data based on version information corresponding to the second sequence of the first test data, wherein the version information corresponding to the second sequence of the first test data is the same as the version information of the first intermediate test data.

According to some embodiments, the first intermediate test data comprises initialization information.

According to some embodiments, the object to be tested is a chip.

According to another aspect of the present disclosure, there is also provided an electronic device including: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method described above.

According to another aspect of the present disclosure, there is also provided a non-transitory computer readable storage medium storing computer instructions for causing a computer to perform the above-described method.

According to another aspect of the present disclosure, there is also provided a computer program product comprising a computer program, wherein the computer program realizes the above-mentioned method when executed by a processor.

According to an embodiment of the present disclosure, there is also provided an electronic device, a readable storage medium, and a computer program product.

Referring to fig. 8, a block diagram of a structure of an electronic device 800, which may be a server or a client of the present disclosure, which is an example of a hardware device that may be applied to aspects of the present disclosure, will now be described. Electronic device is intended to represent various forms of digital electronic computer devices, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be examples only, and are not meant to limit implementations of the disclosure described and/or claimed herein.

As shown in fig. 8, the apparatus 800 includes a computing unit 801 that can perform various appropriate actions and processes according to a computer program stored in a Read Only Memory (ROM)802 or a computer program loaded from a storage unit 808 into a Random Access Memory (RAM) 803. In the RAM 803, various programs and data required for the operation of the device 800 can also be stored. The calculation unit 801, the ROM 802, and the RAM 803 are connected to each other by a bus 804. An input/output (I/O) interface 805 is also connected to bus 804.

A number of components in the device 800 are connected to the I/O interface 805, including: an input unit 806, an output unit 807, a storage unit 808, and a communication unit 809. The input unit 806 may be any type of device capable of inputting information to the device 800, and the input unit 806 may receive input numeric or character information and generate key signal inputs related to user settings and/or function controls of the electronic device, and may include, but is not limited to, a mouse, a keyboard, a touch screen, a track pad, a track ball, a joystick, a microphone, and/or a remote control. Output unit 807 can be any type of device capable of presenting information and can include, but is not limited to, a display, speakers, a video/audio output terminal, a vibrator, and/or a printer. The storage unit 808 may include, but is not limited to, a magnetic disk, an optical disk. The communication unit 809 allows the device 800 to exchange information/data with other devices via a computer network, such as the internet, and/or various telecommunications networks, and may include, but is not limited to, modems, network cards, infrared communication devices, wireless communication transceivers and/or chipsets, such as bluetooth (TM) devices, 1302.11 devices, WiFi devices, WiMax devices, cellular communication devices, and/or the like.

Computing unit 801 may be a variety of general and/or special purpose processing components with processing and computing capabilities. Some examples of the computing unit 801 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various dedicated Artificial Intelligence (AI) computing chips, various computing units running machine learning model algorithms, a Digital Signal Processor (DSP), and any suitable processor, controller, microcontroller, and the like. The calculation unit 801 executes the respective methods and processes described above, such as the test method. For example, in some embodiments, the testing method may be implemented as a computer software program tangibly embodied in a machine-readable medium, such as storage unit 808. In some embodiments, part or all of the computer program can be loaded and/or installed onto device 800 via ROM 802 and/or communications unit 809. When loaded into RAM 803 and executed by computing unit 801, a computer program may perform one or more steps of the testing method described above. Alternatively, in other embodiments, the computing unit 801 may be configured to perform the testing method in any other suitable manner (e.g., by means of firmware).

Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuitry, Field Programmable Gate Arrays (FPGAs), Application Specific Integrated Circuits (ASICs), Application Specific Standard Products (ASSPs), system on a chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs that are executable and/or interpretable on a programmable system including at least one programmable processor, which may be special or general purpose, receiving data and instructions from, and transmitting data and instructions to, a storage system, at least one input device, and at least one output device.

Program code for implementing the methods of the present disclosure may be written in any combination of one or more programming languages. These program codes may be provided to a processor or controller of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the program codes, when executed by the processor or controller, cause the functions/operations specified in the flowchart and/or block diagram to be performed. The program code may execute entirely on the machine, partly on the machine, as a stand-alone software package partly on the machine and partly on a remote machine or entirely on the remote machine or server.

In the context of this disclosure, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

To provide for interaction with a user, the systems and techniques described here can be implemented on a computer having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which a user can provide input to the computer. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic, speech, or tactile input.

The systems and techniques described here can be implemented in a computing system that includes a back-end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back-end, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), Wide Area Networks (WANs), and the Internet.

The computer system may include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server may be a cloud server, a server of a distributed system, or a server with a combined blockchain.

It should be understood that various forms of the flows shown above may be used, with steps reordered, added, or deleted. For example, the steps described in the present disclosure may be performed in parallel, sequentially or in different orders, and are not limited herein as long as the desired results of the technical solutions disclosed in the present disclosure can be achieved.

Although embodiments or examples of the present disclosure have been described with reference to the accompanying drawings, it is to be understood that the above-described methods, systems and apparatus are merely exemplary embodiments or examples and that the scope of the present invention is not limited by these embodiments or examples, but only by the claims as issued and their equivalents. Various elements in the embodiments or examples may be omitted or may be replaced with equivalents thereof. Further, the steps may be performed in an order different from that described in the present disclosure. Further, various elements in the embodiments or examples may be combined in various ways. It is important that as technology evolves, many of the elements described herein may be replaced with equivalent elements that appear after the present disclosure.

Claims

1. A method of testing, comprising:

in response to a plurality of first test data having the same first sequence being included in the test data set, dividing each of the plurality of first test data into a first sequence and a second sequence other than the first sequence;

based on the first sequence, executing the test on the object to be tested by utilizing a first test system to obtain first intermediate test data; and

and for each first test data in the plurality of first test data, executing the test on the object to be tested by using a second test system based on the first intermediate test data and the second sequence of the first test data to obtain a final test result.

2. The method of claim 1, further comprising:

in response to at least two third test data having the same first subsequence in the second sequence being included in the plurality of first test data, dividing the second sequence in each of the at least two third test data into a first subsequence and a second subsequence other than the first subsequence;

wherein the executing, by the second testing system, the test on the object to be tested to obtain the final test result based on the first intermediate test data and the second sequence of the first test data for each of the plurality of first test data comprises:

based on the first intermediate test data and the first subsequence, executing a test on the object to be tested by using a first sub-test system in the second test system to obtain second intermediate test data; and

and for each third test data in the plurality of third test data, based on the second intermediate test data and the second subsequence of the third test data, executing a test on the object to be tested by using a second sub-test system in the second test system to obtain a final test result.

3. The method of claim 1 or 2, wherein performing a test on the object to be tested with a second test system based on the first intermediate test data and the second sequence of the first test data to obtain a final test result comprises:

determining the first intermediate test data corresponding to the second sequence of the first test data based on the identification information corresponding to the second sequence of the first test data; and

and performing a test on the object to be tested by using the second test system based on the determined first intermediate test data and the second sequence of the first test data to obtain a final test result.

4. The method of claim 3, wherein the identification information includes version information, and the determining the first intermediate test data corresponding to the second sequence of the first test data based on the identification information corresponding to the second sequence of the first test data includes:

and determining the first intermediate test data corresponding to the second sequence of the first test data based on the version information corresponding to the second sequence of the first test data, wherein the version information corresponding to the second sequence of the first test data is the same as the version information of the first intermediate test data.

5. The method of any of claims 1-4, wherein the first sequence precedes the second sequence in each of the plurality of first test data.

6. The method of claim 5, wherein the first intermediate test data comprises initialization information.

7. The method of any one of claims 1 to 6, wherein the object to be tested is a chip.

8. A test apparatus, comprising:

a first dividing unit configured to divide each of a plurality of first test data having a same first sequence into a first sequence and a second sequence other than the first sequence in response to a plurality of first test data having the same first sequence being included in a test data set;

a first test unit configured to perform a test on an object to be tested based on the first sequence to obtain first intermediate test data; and

a second testing unit configured to execute, for each of the plurality of first test data, a test on the object to be tested based on the first intermediate test data and the second sequence of the first test data to obtain a final test result.

9. The apparatus of claim 8, further comprising:

a second dividing unit configured to divide a second sequence of each of at least two third test data into a first subsequence and a second subsequence other than the first subsequence in response to at least two third test data having the same first subsequence in the second sequence being included in the plurality of first test data;

wherein the second test unit includes:

a first sub-test unit configured to perform a test on the object to be tested based on the first intermediate test data and the first subsequence to obtain second intermediate test data; and

and the second sub-test unit is configured to execute the test on the object to be tested to obtain a final test result based on the second intermediate test data and the second subsequence of the third test data aiming at each third test data in the plurality of third test data.

10. The apparatus of claim 8 or 9, wherein the second test unit comprises:

the determining subunit is configured to determine, based on the identification information corresponding to the second sequence of the first test data, the first intermediate test data corresponding to the second sequence of the first test data; and

a third sub-test unit configured to perform a test on the object to be tested to obtain a final test result based on the determined first intermediate test data and the second sequence of the first test data.

11. The apparatus of claim 10, wherein the identification information comprises version information, the determining subunit comprising:

and determining a module of the first intermediate test data corresponding to the second sequence of the first test data based on version information corresponding to the second sequence of the first test data, wherein the version information corresponding to the second sequence of the first test data is the same as the version information of the first intermediate test data.

12. The apparatus of any of claims 8 to 11, wherein the first sequence precedes the second sequence in each of the plurality of first test data.

13. The apparatus of claim 12, wherein the first intermediate test data comprises initialization information.

14. The apparatus of any one of claims 8 to 13, wherein the object to be tested is a chip.

15. An electronic device, comprising:

at least one processor; and

a memory communicatively coupled to the at least one processor; wherein

The memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-7.

16. A non-transitory computer readable storage medium having stored thereon computer instructions for causing the computer to perform the method of any one of claims 1-7.

17. A computer program product comprising a computer program, wherein the computer program realizes the method of any one of claims 1-7 when executed by a processor.