CN113804948A - Current sampling method suitable for multi-path parallel circuit - Google Patents
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Abstract
The invention provides a current sampling method suitable for a multi-path parallel circuit, and belongs to the technical field of power consumption measurement. The current sampling method applicable to the multipath parallel circuit is S1: acquiring a plurality of groups of load currents I and pin voltages Vpc corresponding to the load currents I; s2: acquiring a pending relational expression I = a × Vpc + b between the load current I and the pin voltage Vpc, wherein a and b are unknown constants, and respectively substituting a plurality of groups of load current I and pin voltage Vpc into I = a × Vpc + b to form a plurality of relational expression groups; s3: analyzing the multiple relational expression groups through a linear regression algorithm, respectively obtaining a constant a and a constant B, and obtaining a linear relational expression I = A × Vpc + B; s4: will the actual voltage VPractice ofSubstituting the linear relation I = A × Vpc + B to obtain the actual current I outputted by the power supply at the momentPractice of. The invention has the advantages of simple circuit, small system, no damage to circuit integrity, high acquisition precision and the like.
Description
Technical Field
The invention relates to the technical field of power consumption measurement, in particular to a current sampling method suitable for a multi-path parallel circuit.
Background
In applications with high reliability requirements and large load current, a parallel operation of multiple power supplies is usually used to supply power to the load. With the improvement of the management requirement of the power system, the sampling requirement on the current value is higher and higher. The existing large-current sampling method mainly comprises a Hall sensor type and a collecting line voltage drop type, wherein the Hall sensor type is large in size and inconvenient to measure, and the collecting line voltage drop type is low in precision and affects the integrity of a line.
Chinese patent CN212872612U, published japanese patent No. 2021-04-02 disclose a current sampling system and a current sampling device, the current sampling system includes a first hall sensor and a second hall sensor, the first hall sensor and the second hall sensor are connected in reverse; the input end of the Hall sensor group is connected with a circuit to be tested, the first output end of the Hall sensor group is connected with the input end of the operation storage module, and the output end of the operation storage module is connected with the first input end of the control module. Therefore, the first Hall sensor and the second Hall sensor in the Hall sensor group are reversely connected, so that the influence of the Hall sensors in the Hall sensor group caused by temperature drift is reduced, and the accuracy of the sampling result of the current sampling system is improved. Adopt hall sensor to sample the electric current in the above-mentioned patent, the volume is great, inconvenient measurement.
Disclosure of Invention
The present invention is directed to a current sampling method suitable for a multi-path parallel circuit, which overcomes the above-mentioned shortcomings of the prior art.
The invention provides a current sampling method suitable for a multi-path parallel circuit, which comprises the following steps:
s1: the method comprises the steps of obtaining a plurality of constant load currents I, controlling a power supply to constantly output each load current I through an electronic load, collecting pin voltage Vpc of a parallel circuit through a voltage collecting circuit, obtaining a plurality of groups of load currents I and pin voltage Vpc corresponding to the load currents I, and disconnecting a connecting circuit of the electronic load and the power supply;
s2: acquiring a pending relational expression I = a × Vpc + b between the load current I and the pin voltage Vpc, wherein a and b are unknown constants, and respectively substituting a plurality of groups of load current I and pin voltage Vpc into I = a × Vpc + b to form a plurality of relational expression groups;
s3: analyzing the relation groups through a linear regression algorithm, and respectively obtaining a constant a and a constant B, so as to obtain a linear relation I = A × Vpc + B between the load current I and the pin voltage Vpc;
s4: the connecting circuit of the electronic load and the power supply is conducted, and the actual voltage V of the parallel circuit at the moment is remotely acquired through the voltage acquisition circuitPractice ofWill be the actual voltage VPractice ofSubstituting the linear relation I = A × Vpc + B to obtain the actual current I outputted by the power supply at the momentPractice of。
Further, in step S1, any two load currents I have different values, and any two pin voltages Vpc have different values; if N load currents I have the same value, removing N-1 identical load currents I; if the N pin voltages Vpc are the same, removing N-1 load currents corresponding to the N-1 pin voltages Vpc; n-1 different load currents I are retrieved and the pin voltage Vpc corresponding to the load current I is collected.
Further, step S1 includes:
s11: randomly acquiring M constant load currents I;
s12: the M load currents I are sequenced from small to large through a bubble sequencing algorithm, if N load currents I have the same value in the M load currents I, N-1 identical load currents I are removed, M-N +1 load currents I are left, the N-1 load currents I are obtained again at random, the N-1 load currents I and the M-N +1 load currents I are combined into the M load currents I, and the M load currents I are reordered until the M load currents I have different values.
Further, step S12 is followed by:
s13: obtaining rated minimum current Imin corresponding to power output, sequentially comparing the M load currents I with the rated minimum current Imin according to the sequence from the small to the large of the M load currents I, removing P load currents I and leaving M-P +1 load currents I if P load currents I in the M load currents I are smaller than the rated minimum current Imin, obtaining P load currents I again randomly, combining the P load currents and the M-P +1 load currents I into M load currents I, and returning to execute the step S12 until the M load currents I are not smaller than the rated minimum current Imin.
Further, step S12 is followed by:
s14: obtaining rated maximum current Imax corresponding to power output, sequentially comparing M load currents I with the rated maximum current Imax according to the sequence from large to small of the M load currents I, removing Q load currents I and leaving M-Q +1 load currents I if Q load currents I in the M load currents I are larger than the rated maximum current Imax, obtaining Q load currents I again randomly, combining the Q load currents I and the M-Q +1 load currents I into M load currents I, and returning to the step S12 until the M load currents I are not larger than the rated maximum current Imax.
Further, step S12 is followed by:
s15: respectively outputting M different load currents I through an electronic load control power supply and collecting M pin voltages Vpc of a parallel circuit, sorting the M pin voltages Vpc from small to large through a bubble sorting algorithm, if N pin voltages Vpc exist in the M pin voltages Vpc, removing N-1 load currents I corresponding to N-1 same pin voltages Vpc and leaving M-N +1 load currents I, randomly obtaining N-1 load currents I again, combining the N-1 load currents I and the M-N +1 load currents I into M load currents I, and returning to execute the step S12 until the values of the M pin voltages Vpc are different.
Further, step S12 is followed by:
s16: obtaining a first preset load current corresponding to the power supply, if the minimum value of the M load currents is greater than the first preset load current or the maximum value of the M load currents is less than the first preset load current, removing the first preset number of load currents I from the M load currents I, obtaining the first preset number of load currents I again at random, and returning to execute the step S12 until the minimum value of the M load currents I is less than the first preset load current and the maximum value is greater than the first preset load current.
Further, step S16 specifically includes:
s161: taking the average value of the sum of the rated minimum current Imin and the rated maximum current Imax as a first preset load current;
s162: acquiring a minimum value and a maximum value of the M load currents and a second preset load current at a first preset position, wherein the first preset position is a position corresponding to other load currents except the minimum value and the maximum value in the M load currents I;
s163: if the minimum value of the M load currents is greater than the first preset load current, removing all load currents from the minimum value to the second preset load current, obtaining the corresponding number of load currents I again at random and combining the load currents I into the M load currents I, and returning to execute the step S12 until the minimum value of the M load currents I is less than the first preset load current and the maximum value is greater than the first preset load current;
s164: if the maximum value of the M load currents is smaller than the first preset load current, all the load currents from the second preset load current to the maximum value are removed, the corresponding number of load currents I are randomly obtained again and merged into the M load currents I, and the step S12 is executed again until the minimum value of the M load currents I is smaller than the first preset load current and the maximum value of the M load currents I is larger than the first preset load current.
Further, step S162 specifically includes: if M is an even number, taking the position M/2 in the M load currents I as a first preset position, and taking the corresponding load current I at the position M/2 in the M load currents I as a second preset load current; if M is an odd number, acquiring a minimum integer X larger than M/2, taking the position of X in the M load currents I as a first preset position, and taking the corresponding load current I at the position of X in the M load currents I as a second preset load current.
Further, in step S15, if the values of the N pin voltages Vpc are the same among the M pin voltages Vpc, N-1 identical pin voltages Vpc are successively obtained from a first pin voltage Vpc among the N pin voltages Vpc according to the arrangement order of the pin voltages Vpc, and the N-1 load currents I corresponding to the N-1 identical pin voltages Vpc are removed and M-N +1 load currents I are left, the N-1 load currents I are randomly obtained again, and the N-1 load currents I and the M-N +1 load currents I are combined into M load currents I.
The current sampling method applicable to the multipath parallel circuit has the following beneficial effects:
firstly, acquiring a plurality of groups of load currents I and pin voltages Vpc corresponding to the load currents I, respectively substituting the plurality of groups of load currents I and the pin voltages Vpc into I = a Vpc + B to form a plurality of relational expression groups, then analyzing the plurality of relational expression groups through a linear regression algorithm, respectively acquiring a constant a and a constant B, thereby acquiring a linear relational expression I = A Vpc + B between the load currents I and the pin voltages Vpc, calculating and acquiring a and B which can maximally express the linear relation between the load currents I and the pin voltages Vpc, finally conducting a connecting circuit of the electronic load and a power supply, and remotely acquiring the actual voltage V of the parallel circuit at the moment through a voltage acquisition circuitPractice ofWill be the actual voltage VPractice ofSubstituting the linear relation I = A × Vpc + B to obtain the actual current I outputted by the power supply at the momentPractice ofTherefore, when the electronic load and the power supply are conducted, the corresponding actual current can be obtained according to the remotely obtained actual voltage, and the method has the advantages of simple circuit, small system, no damage to circuit integrity, high acquisition precision and the like. Compared with the traditional Hall sensor type current acquisition method, a huge electromagnetic induction device is not required to be placed, the electromagnetic conversion links are reduced, and the sampling precision is improved. Compared with a voltage drop type current collection method of a collection line, the circuit integrity can not be damaged, the circuit is simpler, the circuit conductivity is not influenced, the sampling precision is less influenced by capacitance inductance errors, and the sampling precision is higher.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention and together with the description, serve to explain the principles of the invention. In the drawings, like reference numerals are used to indicate like elements. The drawings in the following description are directed to some, but not all embodiments of the invention. For a person skilled in the art, other figures can be derived from these figures without inventive effort.
Fig. 1 is a schematic flow chart of a current sampling method suitable for a multi-path parallel circuit according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention. It should be noted that the embodiments and features of the embodiments in the present application may be arbitrarily combined with each other without conflict.
Please refer to fig. 1. The current sampling method suitable for the multi-path parallel circuit comprises the following steps of:
s1: the method comprises the steps of obtaining a plurality of constant load currents I, controlling a power supply to constantly output each load current I through an electronic load, collecting pin voltage Vpc of a parallel circuit through a voltage collecting circuit, obtaining a plurality of groups of load currents I and pin voltage Vpc corresponding to the load currents I, and disconnecting a connecting circuit of the electronic load and the power supply;
s2: acquiring a pending relational expression I = a × Vpc + b between the load current I and the pin voltage Vpc, wherein a and b are unknown constants, and respectively substituting a plurality of groups of load current I and pin voltage Vpc into I = a × Vpc + b to form a plurality of relational expression groups;
s3: analyzing the relation groups through a linear regression algorithm, and respectively obtaining a constant a and a constant B, so as to obtain a linear relation I = A × Vpc + B between the load current I and the pin voltage Vpc;
s4: the connecting circuit of the electronic load and the power supply is conducted and remotely obtained through the voltage acquisition circuitTaking the actual voltage V of the parallel circuit at this timePractice ofWill be the actual voltage VPractice ofSubstituting the linear relation I = A × Vpc + B to obtain the actual current I outputted by the power supply at the momentPractice of。
Firstly, obtaining a plurality of groups of load currents I and pin voltages Vpc corresponding to the load currents I, respectively substituting the plurality of groups of load currents I and pin voltages Vpc into I = a Vpc + B to form a plurality of relational expression groups, then analyzing the plurality of relational expression groups through a linear regression algorithm, respectively obtaining a constant a and a constant B, thereby obtaining a linear relational expression I = A Vpc + B between the load currents I and the pin voltages Vpc, calculating and obtaining a and B which can express the linear relation between the load currents I and the pin voltages Vpc to the maximum extent, finally conducting a connecting circuit of the electronic load and a power supply, and remotely obtaining the actual voltage V of the parallel circuit at the moment through a voltage acquisition circuitPractice ofWill be the actual voltage VPractice ofSubstituting the linear relation I = A × Vpc + B to obtain the actual current I outputted by the power supply at the momentPractice ofTherefore, when the electronic load and the power supply are conducted, the corresponding actual current can be obtained according to the remotely obtained actual voltage, and the method has the advantages of simple circuit, small system, no damage to circuit integrity, high acquisition precision and the like. Compared with the traditional Hall sensor type current acquisition method, a huge electromagnetic induction device is not required to be placed, the electromagnetic conversion links are reduced, and the sampling precision is improved. Compared with a voltage drop type current collection method of a collection line, the circuit integrity can not be damaged, the circuit is simpler, the circuit conductivity is not influenced, the sampling precision is less influenced by capacitance inductance errors, and the sampling precision is higher.
After obtaining a plurality of groups of load currents I and pin voltages Vpc, a to-be-determined relational expression I = a × Vpc + B between the load current I and the pin voltage Vpc is included in the first relational model, where a and B are unknown constants, the first relational model calls the plurality of groups of load currents I and pin voltages Vpc and substitutes the plurality of groups of load currents I and pin voltages Vpc into I = a × Vpc + B, respectively, to form a plurality of relational expression groups, the first regression model calls the plurality of relational expression groups in the first relational model and analyzes the plurality of relational expression groups through a linear regression algorithm in the first regression model, and obtains values of the constants a and B, respectively, so as to obtain a linear relational expression I = a × Vpc + B between the load current I and the pin voltage Vpc.
The pin voltage Vpc of the PC and the load current I output by the power supply are in a linear relationship, but the values of a and b in the undetermined relationship formula I = a × Vpc + b are both unknown constants, so the values of a and b need to be found out, and after the values of a and b are found, the value of the pin voltage Vpc can be remotely obtained, so the corresponding load current I can be obtained, and the current sampling by the hall sensor formula and the acquisition line voltage drop formula is not needed.
Applying a constant load current I to a power supply by using an electronic load, measuring the value of a pin voltage Vpc, wherein the value of the pin voltage Vpc can be remotely read by a voltage acquisition circuit, according to an equation solving method, if at least two groups of load current I and the pin voltage Vpc corresponding to the load current I are required for obtaining the values of a and B, but because the circuit has factors such as interference of level signals, errors of capacitance resistance components and the like, the linear relation between a full-load intervals cannot be accurately expressed only by the values of a and B obtained by the two groups of values is calculated by using a linear regression algorithm according to the values of the multiple groups of load current I and the corresponding pin voltage Vpc, and finally obtaining a linear relation expression I = A × Vpc + B between the load current I and the pin voltage Vpc, thus after the power supply and the electronic load are conducted, remotely reading the actual voltage V by a voltage acquisition circuitPractice ofAnd actually substituting the actual voltage V into a linear relation formula I = A × Vpc + B to obtain the actual current I output by the power supply at the momentPractice of。
In step S1, any two load currents I have different values, and any two pin voltages Vpc have different values; if N load currents I have the same value, removing N-1 identical load currents I; if the N pin voltages Vpc are the same, removing N-1 load currents corresponding to the N-1 pin voltages Vpc; n-1 different load currents I are retrieved and the pin voltage Vpc corresponding to the load current I is collected.
If N load currents I in M load currents I have the same value, N-1 load currents I in the N load currents I are useless data, data waste is caused, the available data of the load currents I are reduced, and the accuracy of values a and b obtained through calculation of a linear regression algorithm is reduced. If N pin voltages Vpc have the same value among M pin voltages Vpc, the first may be that the values of the load currents I corresponding to the pin voltages Vpc are the same, and the second may be that a fault occurs during the Vpc detection process, so that partial data is wrong, both of these two cases may cause N-1 pin voltages Vpc of the N pin voltages Vpc to be useless data, which causes data waste, reduces the data of the available pin voltages Vpc, and further reduces the accuracy of the values a and b calculated and obtained by the linear regression algorithm. Therefore, when the N load currents I have the same value, N-1 same load currents I are removed, and N pin voltages Vpc have the same value, N-1 load currents corresponding to the N-1 pin voltages Vpc are removed, N-1 different load currents I are obtained again, the total number of the load currents is supplemented, and the pin voltages Vpc corresponding to the load currents I are collected.
Step S1 includes:
s11: randomly acquiring M constant load currents I;
s12: the M load currents I are sequenced from small to large through a bubble sequencing algorithm, if N load currents I have the same value in the M load currents I, N-1 identical load currents I are removed, M-N +1 load currents I are left, the N-1 load currents I are obtained again at random, the N-1 load currents I and the M-N +1 load currents I are combined into the M load currents I, and the M load currents I are reordered until the M load currents I have different values.
The load current is randomly acquired, the influence on subsequently acquired values of a and B due to the fact that the selected load current data are too special is avoided, and the problem that the linear relation I = A × Vpc + B cannot be widely used due to the fact that the values of a and B acquired through calculation are too special is avoided. M constant load currents I can be randomly output through a first calling module, the M load currents I are sequenced from small to large through a bubble sequencing algorithm through the first sequencing module, the M sequenced load currents I in the first sequencing module are read through a second calling module, the value of each load current can be obtained through the second calling module, if N load currents I have the same value, N-1 identical load currents I are removed and M-N +1 load currents I are left, meanwhile, the first calling module continues to randomly output the N-1 load currents I, the first sequencing module can combine the N-1 load currents I and the M-N +1 load currents I into the M load currents I, the M load currents I are reordered until the values of the M load currents I are different, the sorting is stopped, the second calling module reads the M load currents I which are sorted in the first sorting module and have different values of any two load currents, so that the same load currents can be obtained from the M load currents, part of the same load currents are removed, and the M load currents have different values, so that the accuracy of a and B can be improved, and the wide applicability of the linear relation formula I = A × Vpc + B is improved.
Step S12 is followed by:
s13: obtaining rated minimum current Imin corresponding to power output, sequentially comparing the M load currents I with the rated minimum current Imin according to the sequence from the small to the large of the M load currents I, removing P load currents I and leaving M-P +1 load currents I if P load currents I in the M load currents I are smaller than the rated minimum current Imin, obtaining P load currents I again randomly, combining the P load currents and the M-P +1 load currents I into M load currents I, and returning to execute the step S12 until the M load currents I are not smaller than the rated minimum current Imin.
If there are load currents smaller than the rated minimum current Imin in the M load currents, these load currents cannot be used, and the electronic load cannot control the power output, so that it is necessary to remove this load current.
Step S12 is followed by:
s14: obtaining rated maximum current Imax corresponding to power output, sequentially comparing M load currents I with the rated maximum current Imax according to the sequence from large to small of the M load currents I, removing Q load currents I and leaving M-Q +1 load currents I if Q load currents I in the M load currents I are larger than the rated maximum current Imax, obtaining Q load currents I again randomly, combining the Q load currents I and the M-Q +1 load currents I into M load currents I, and returning to the step S12 until the M load currents I are not larger than the rated maximum current Imax.
If there are load currents larger than the rated maximum current Imax among the M load currents, these load currents cannot be used, and the electronic load cannot control the power output, so that it is necessary to remove the load currents.
The first storage module stores rated minimum current Imin and rated maximum current Imax corresponding to power output, and the second calling module stores M load currents I which are sequenced and have different values of any two load currents; the first comparison module calls each load current in the second calling module and calls the rated minimum current Imin and the rated maximum current Imax in the first storage module in sequence from small to large; the method comprises the steps that an accumulator is initially 0, a first comparison module compares load current with rated minimum current Imin, if the load current is smaller than the rated minimum current Imin, the accumulator is added with 1, the load current is removed until all the load currents are compared with the rated minimum current Imin, a first statistic module obtains the value in the accumulator as P, the first comparison module removes the P load currents and leaves M-P +1 load currents, a first calling module randomly outputs the P load currents, a first sequencing module calls the M-P +1 load currents in the first comparison module and the P load currents in the first calling module, the two load currents are combined into M load currents, and new M load currents are sequenced until the M load currents I are not smaller than the rated minimum current Imin; the accumulator is initially 0, the first comparison module compares the load current with the rated maximum current Imax, if the load current is larger than the rated maximum current Imax, the accumulator is added with 1, the load current is removed until all the load currents are compared with the rated maximum current Imax, the first statistic module obtains the value in the accumulator as Q, the first comparison module removes the Q load currents and leaves M-Q +1 load currents, the first calling module randomly outputs Q load currents, the first sequencing module calls the M-Q +1 load currents in the first comparison module and the Q load currents in the first calling module, combines the two load currents into M load currents, and sequences the new M load currents until the M load currents I are not smaller than the rated maximum current Imax.
Step S12 is followed by:
s15: respectively outputting M different load currents I through an electronic load control power supply and collecting M pin voltages Vpc of a parallel circuit, sorting the M pin voltages Vpc from small to large through a bubble sorting algorithm, if N pin voltages Vpc exist in the M pin voltages Vpc, removing N-1 load currents I corresponding to N-1 same pin voltages Vpc and leaving M-N +1 load currents I, randomly obtaining N-1 load currents I again, combining the N-1 load currents I and the M-N +1 load currents I into M load currents I, and returning to execute the step S12 until the values of the M pin voltages Vpc are different.
The second storage module stores M load currents I and pin voltages Vpc corresponding to each load current, the second sorting module calls the M pin voltages Vpc in the second storage module, the second sorting module sorts the M pin voltages Vpc from small to large through a bubble sorting algorithm, if N pin voltages Vpc in the M pin voltages Vpc have the same value, N-1 load currents I corresponding to N-1 same pin voltages Vpc are removed and M-N +1 load currents I are left, the first calling module randomly obtains the N-1 load currents I, the N-1 load currents I and the M-N +1 load currents I are combined into the M load currents I, the first sorting module sorts the new M load currents I, if any two values of the M load currents I are different, the second sorting module sorts the new M pin voltages Vpc until the values of the M pin voltages Vpc are different, so that the same pin voltages are obtained from the M pin voltages Vpc, and part of the same pin voltages are removed, and the values of the M pin voltages are different quickly, so that the accuracy of a and B can be improved, and the wide applicability of the linear relation formula I = a × Vpc + B is improved.
Step S12 is followed by:
s16: obtaining a first preset load current corresponding to the power supply, if the minimum value of the M load currents is greater than the first preset load current or the maximum value of the M load currents is less than the first preset load current, removing the first preset number of load currents I from the M load currents I, obtaining the first preset number of load currents I again at random, and returning to execute the step S12 until the minimum value of the M load currents I is less than the first preset load current and the maximum value is greater than the first preset load current.
Step S16 specifically includes:
s161: taking the average value of the sum of the rated minimum current Imin and the rated maximum current Imax as a first preset load current;
s162: acquiring a minimum value and a maximum value of the M load currents and a second preset load current at a first preset position, wherein the first preset position is a position corresponding to other load currents except the minimum value and the maximum value in the M load currents I;
s163: if the minimum value of the M load currents is greater than the first preset load current, removing all load currents from the minimum value to the second preset load current, obtaining the corresponding number of load currents I again at random and combining the load currents I into the M load currents I, and returning to execute the step S12 until the minimum value of the M load currents I is less than the first preset load current and the maximum value is greater than the first preset load current;
s164: if the maximum value of the M load currents is smaller than the first preset load current, all the load currents from the second preset load current to the maximum value are removed, the corresponding number of load currents I are randomly obtained again and merged into the M load currents I, and the step S12 is executed again until the minimum value of the M load currents I is smaller than the first preset load current and the maximum value of the M load currents I is larger than the first preset load current.
In the rectangular coordinate system, if the M load currents are all located at a portion on one side of the first preset load current, the values of the selected M load currents are made to be too special, and the load currents located at a portion on the other side of the first preset load current are not tested, so that the data of the selected load currents are made to be too special, and the values of a and B obtained subsequently are affected, so that the values of a and B obtained through calculation are too special, and the linear relation formula I = a × Vpc + B cannot be widely used, so that the selected M load currents need to be distributed on two sides of the first preset load current, and thus the data of the selected load currents are universal, the values of a and B obtained through calculation are universal, and the linear relation formula I = a × Vpc + B can be widely used.
Step S162 specifically includes: if M is an even number, taking the position M/2 in the M load currents I as a first preset position, and taking the corresponding load current I at the position M/2 in the M load currents I as a second preset load current; if M is an odd number, acquiring a minimum integer X larger than M/2, taking the position of X in the M load currents I as a first preset position, and taking the corresponding load current I at the position of X in the M load currents I as a second preset load current.
The first calculation module calls the rated minimum current Imin and the rated maximum current Imax stored in the first storage module and calculates and obtains an average value of the sum of the rated minimum current Imin and the rated maximum current Imax; the second comparison module takes the average value in the first calculation module as a first preset load current; the second comparison module acquires the minimum value and the maximum value of the M load currents in the second calling module and a second preset load current at the first preset position; the first comparing module compares the minimum value with a first preset load current, if the minimum value of the M load currents is larger than the first preset load current, sending a signal of removing all load currents from the minimum value to a second preset load current to a second calling module, removing all load currents from the minimum value to the second preset load current according to the signal by the second calling module, counting the number of the removed load currents by the second calling module, randomly outputting the same number of load currents by the first calling module, combining the load currents output by the first calling module and the rest load currents in the second calling module into M load currents by the second calling module, and sequencing the M load currents by the first sequencing module again until the minimum value of the M load currents I is smaller than the first preset load current and the maximum value of the M load currents I is larger than the first preset load current; the second comparing module compares the maximum value with the first preset load current, and if the maximum value of the M load currents is less than the first preset load current, sending 'all load currents from the second preset load current to the maximum value are removed' to a second calling module, the second calling module removes all load currents from the second preset load current to the maximum value according to signals, the second calling module counts the number of the removed load currents, the first calling module randomly outputs the same number of load currents, the second calling module combines the load currents output by the first calling module and the rest load currents in the second calling module into M load currents, and the first sequencing module reorders the M load currents until the minimum value of the M load currents I is smaller than the first preset load current and the maximum value of the M load currents I is larger than the first preset load current. Therefore, the M load currents comprise a part on one side of the first preset load current and a part on the other side of the first preset load current, the selected load current data are prevented from being too special to influence the values of a and B acquired subsequently, the linear relation I = A × Vpc + B cannot be widely used due to the fact that the values of a and B acquired through calculation are too special, the selected load current data are universal, the values of a and B acquired through calculation are universal, and the linear relation I = A × Vpc + B can be widely used
In step S15, if N pin voltages Vpc have the same value among the M pin voltages Vpc, N-1 identical pin voltages Vpc are successively obtained from a first pin voltage Vpc among the N pin voltages Vpc according to the arrangement order of the pin voltages Vpc, N-1 load currents I corresponding to the N-1 identical pin voltages Vpc are removed and M-N +1 load currents I are left, N-1 load currents I are randomly obtained again, and the N-1 load currents I and the M-N +1 load currents I are combined into M load currents I. The method for removing N-1 identical pin voltages Vpc from N pin voltages Vpc includes a plurality of modes, the selection mode is complicated, the second sorting module sorts the M pin voltages Vpc from small to large by a bubble sorting algorithm, if the N pin voltages Vpc have the same value, the first sorting module obtains each serial number of the N pin voltages Vpc, the first sorting module obtains N-1 identical pin voltages Vpc from the first pin voltage Vpc of the N pin voltages Vpc continuously, removes N-1 load currents I corresponding to the N-1 identical pin voltages Vpc and leaves M-N +1 load currents I, the first calling module randomly obtains N-1 load currents I, the N-1 load currents I and M-N +1 load currents I are combined into M load currents I, the first sequencing module sequences the M new load currents I, if any two values of the M load currents I are different, the second sequencing module sequences the M new pin voltages Vpc until the values of the M pin voltages Vpc are different, so that the same pin voltages can be obtained from the M pin voltages Vpc conveniently, part of the same pin voltages are removed, the values of the M pin voltages are different quickly, the accuracy of a and B can be improved, and the wide applicability of a linear relation formula I = A × Vpc + B is improved.
The above-described aspects may be implemented individually or in various combinations, and such variations are within the scope of the present invention.
It should be noted that, in the description of the present application, it should be noted that the terms "upper end", "lower end" and "bottom end" indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the drawings or the orientation or positional relationship which the product of the application is usually placed in when the product of the application is used, and are only for convenience of describing the present application and simplifying the description, but do not indicate or imply that the device referred to must have a specific orientation, be constructed in a specific orientation and be operated, and thus, should not be construed as limiting the present application. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Finally, it should be noted that: the above examples are only for illustrating the technical solutions of the present invention, and are not limited thereto. Although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A current sampling method suitable for a multipath parallel circuit is characterized by comprising the following steps:
s1: the method comprises the steps of obtaining a plurality of constant load currents I, controlling a power supply to constantly output each load current I through an electronic load, collecting pin voltage Vpc of a parallel circuit through a voltage collecting circuit, obtaining a plurality of groups of load currents I and pin voltage Vpc corresponding to the load currents I, and disconnecting a connecting circuit of the electronic load and the power supply;
s2: acquiring a pending relational expression I = a × Vpc + b between the load current I and the pin voltage Vpc, wherein a and b are unknown constants, and respectively substituting a plurality of groups of load current I and pin voltage Vpc into I = a × Vpc + b to form a plurality of relational expression groups;
s3: analyzing the relation groups through a linear regression algorithm, and respectively obtaining a constant a and a constant B, so as to obtain a linear relation I = A × Vpc + B between the load current I and the pin voltage Vpc;
s4: the connecting circuit of the electronic load and the power supply is conducted, and the actual voltage V of the parallel circuit at the moment is remotely acquired through the voltage acquisition circuitPractice ofWill be the actual voltage VPractice ofSubstituting into linear relation I = A × Vpc + B to obtainTaking the actual current I output by the power supply at the momentPractice of。
2. A method of sampling current for use in a multiple parallel circuit as claimed in claim 1, wherein: in step S1, any two load currents I have different values, and any two pin voltages Vpc have different values; if N load currents I have the same value, removing N-1 identical load currents I; if the N pin voltages Vpc are the same, removing N-1 load currents corresponding to the N-1 pin voltages Vpc; n-1 different load currents I are retrieved and the pin voltage Vpc corresponding to the load current I is collected.
3. The current sampling method for the multiple parallel circuits according to claim 1 or 2, wherein the step S1 comprises:
s11: randomly acquiring M constant load currents I;
s12: the M load currents I are sequenced from small to large through a bubble sequencing algorithm, if N load currents I have the same value in the M load currents I, N-1 identical load currents I are removed, M-N +1 load currents I are left, the N-1 load currents I are obtained again at random, the N-1 load currents I and the M-N +1 load currents I are combined into the M load currents I, and the M load currents I are reordered until the M load currents I have different values.
4. A current sampling method suitable for use in a multi-way parallel circuit according to claim 3,
step S12 is followed by:
s13: obtaining rated minimum current Imin corresponding to power output, sequentially comparing the M load currents I with the rated minimum current Imin according to the sequence from the small to the large of the M load currents I, removing P load currents I and leaving M-P +1 load currents I if P load currents I in the M load currents I are smaller than the rated minimum current Imin, obtaining P load currents I again randomly, combining the P load currents and the M-P +1 load currents I into M load currents I, and returning to execute the step S12 until the M load currents I are not smaller than the rated minimum current Imin.
5. A method of sampling current for use in a multiple parallel circuit as claimed in claim 4, wherein: step S12 is followed by:
s14: obtaining rated maximum current Imax corresponding to power output, sequentially comparing M load currents I with the rated maximum current Imax according to the sequence from large to small of the M load currents I, removing Q load currents I and leaving M-Q +1 load currents I if Q load currents I in the M load currents I are larger than the rated maximum current Imax, obtaining Q load currents I again randomly, combining the Q load currents I and the M-Q +1 load currents I into M load currents I, and returning to the step S12 until the M load currents I are not larger than the rated maximum current Imax.
6. The method according to claim 3, wherein the step S12 is followed by the steps of:
s15: respectively outputting M different load currents I through an electronic load control power supply and collecting M pin voltages Vpc of a parallel circuit, sorting the M pin voltages Vpc from small to large through a bubble sorting algorithm, if N pin voltages Vpc exist in the M pin voltages Vpc, removing N-1 load currents I corresponding to N-1 same pin voltages Vpc and leaving M-N +1 load currents I, randomly obtaining N-1 load currents I again, combining the N-1 load currents I and the M-N +1 load currents I into M load currents I, and returning to execute the step S12 until the values of the M pin voltages Vpc are different.
7. A current sampling method suitable for use in a multi-way parallel circuit according to claim 5,
step S12 is followed by:
s16: obtaining a first preset load current corresponding to the power supply, if the minimum value of the M load currents is greater than the first preset load current or the maximum value of the M load currents is less than the first preset load current, removing the first preset number of load currents I from the M load currents I, obtaining the first preset number of load currents I again at random, and returning to execute the step S12 until the minimum value of the M load currents I is less than the first preset load current and the maximum value is greater than the first preset load current.
8. The method for sampling current in a multi-way parallel circuit as claimed in claim 7, wherein the step S16 specifically includes:
s161: taking the average value of the sum of the rated minimum current Imin and the rated maximum current Imax as a first preset load current;
s162: acquiring a minimum value and a maximum value of the M load currents and a second preset load current at a first preset position, wherein the first preset position is a position corresponding to other load currents except the minimum value and the maximum value in the M load currents I;
s163: if the minimum value of the M load currents is greater than the first preset load current, removing all load currents from the minimum value to the second preset load current, obtaining the corresponding number of load currents I again at random and combining the load currents I into the M load currents I, and returning to execute the step S12 until the minimum value of the M load currents I is less than the first preset load current and the maximum value is greater than the first preset load current;
s164: if the maximum value of the M load currents is smaller than the first preset load current, all the load currents from the second preset load current to the maximum value are removed, the corresponding number of load currents I are randomly obtained again and merged into the M load currents I, and the step S12 is executed again until the minimum value of the M load currents I is smaller than the first preset load current and the maximum value of the M load currents I is larger than the first preset load current.
9. The method according to claim 8, wherein the step S162 specifically includes: if M is an even number, taking the position M/2 in the M load currents I as a first preset position, and taking the corresponding load current I at the position M/2 in the M load currents I as a second preset load current; if M is an odd number, acquiring a minimum integer X larger than M/2, taking the position of X in the M load currents I as a first preset position, and taking the corresponding load current I at the position of X in the M load currents I as a second preset load current.
10. A method of sampling current for use in a multiple parallel circuit as claimed in claim 6, wherein: in step S15, if N pin voltages Vpc have the same value among the M pin voltages Vpc, N-1 identical pin voltages Vpc are successively obtained from a first pin voltage Vpc among the N pin voltages Vpc according to the arrangement order of the pin voltages Vpc, N-1 load currents I corresponding to the N-1 identical pin voltages Vpc are removed and M-N +1 load currents I are left, N-1 load currents I are randomly obtained again, and the N-1 load currents I and the M-N +1 load currents I are combined into M load currents I.
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| CN101308170A (en) * | 2007-05-18 | 2008-11-19 | 孙振宇 | Active electric current test technology |
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