CN113702939A - Near-field local irradiation target scattering near-far field conversion method - Google Patents
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Abstract
The invention provides a near-field and far-field conversion method for scattering of a near-field local irradiation target, which comprises the following steps: s1, dividing the target into P scattering areas; s2, sequentially carrying out 2-D plane sampling on each scattering area to obtain 2-D near-field scattering data of each sampling point; s3, based on the expression of the 2-D near-field test antenna receiving voltage, performing near-far field conversion on the 2-D near-field scattering data of the scattering area to obtain 2-D far-field scattering characteristic quantity of the scattering area; and S4, performing total field synthesis on the 2-D far-field scattering characteristic quantities of the scattering regions, and calculating to obtain the total RCS of the target based on the RCS relational expression. The invention also provides a near-field and far-field conversion method for scattering the near-field local irradiation target, which is suitable for acquiring the total RCS of the target under 3-D space sampling.
Description
Technical Field
The invention relates to the technical field of electromagnetic scattering and inverse scattering, in particular to a near-field and far-field conversion method for scattering of a near-field local irradiation target.
Background
The RCS (Radar Cross section) near-field test technology developed actively in recent years is a technology combining a test and a calculation, wherein the test is performed in a near field which does not meet far-field conditions, and a target RCS is obtained through near-far field conversion. When the target electrical size is large, the far field conditions become exceptionally harsh and difficult to achieve in the experimental field. The near-field test is only required to be carried out in a limited experimental field with target size being several times, and has the characteristics of low cost and convenience. However, near-field testing requires near-far field conversion processing on test data to obtain far-field RCS data, so that the near-far field conversion algorithm is the key of the above-mentioned near-field testing technique.
The target RCS near-field test is different from the far-field horizon test and the compact field test, and means that the RCS is obtained by performing the test in a target scattering Fresnel zone and performing near-far field conversion on the obtained test result. At present, the mature RCS near-field test method is to make the target to be tested completely in the irradiation area of the test antenna pattern, and obtain the far-field RCS through double-station scanning or single-station sampling and corresponding near-far-field conversion algorithm.
The existing near-far field conversion method supports a fixed and single near-field test mode, and near-far field conversion of a near-field local irradiation target cannot be realized. The existing near-far field conversion methods are divided into two categories based on plane wave synthesis and target imaging. The method based on plane wave synthesis requires dual plane wave synthesis for transmission and reception, and the measurement is only effective when the whole target is in an effective plane wave synthesis area. If only a part of the object is in the plane wave synthesis region, an edge effect is generated and the synthesized plane wave is destroyed. The method has huge testing amount and can not meet the requirement of on-site rapid testing. In conclusion, the near-far field conversion method based on plane wave synthesis is not suitable for near-field local illumination conditions. The RCS can be obtained only by single-station near-field test based on the near-field and far-field conversion method of target imaging, but a linear approximation error of a scattering field exists. If the traditional method based on target near-field SAR/ISAR imaging is used for processing the problem of near-field local irradiation, a target area needs to be segmented firstly, and then a far field is synthesized by image splicing.
Related researches mainly based on a single-station near-far field conversion method, such as a near-field test and near-far field conversion method based on near-field imaging, a convolution extrapolation single-station near-far field conversion method, a local double-station near-far field conversion method of a coupled target, a correction algorithm of a two-dimensional single-station near-far field conversion method and the like, are carried out at home and abroad in recent years. However, the above methods are all based on the object to be tested being entirely within the test antenna pattern illumination area.
Therefore, a method based on near-field local test and near-far-field transformation of the target to obtain the RCS characteristics of the target is needed.
Disclosure of Invention
The invention aims to provide a near-field and far-field scattering conversion method for a near-field local irradiation target, which can realize integration of target segmentation and near-field and far-field conversion, can perform three-dimensional (3-D) to two-dimensional (2-D) dimensionality reduction simplification, has any antenna and flexible near-field sampling mode, and thus can quickly and conveniently acquire a target RCS.
In order to achieve the above object, the present invention provides a method for converting scattering near-far field of a near-field local illumination target, comprising the steps of:
s1, dividing the target into P scattering areas;
s2, sequentially carrying out 2-D plane sampling on each scattering area to obtain 2-D near-field scattering data of each sampling point;
s3, based on the expression of the 2-D near-field test antenna receiving voltage, performing near-far field conversion on the 2-D near-field scattering data of the scattering area to obtain 2-D far-field scattering characteristic quantity of the scattering area;
and S4, performing total field synthesis on the 2-D far-field scattering characteristic quantities of the scattering regions, and calculating to obtain the total RCS of the target based on the RCS relational expression.
Optionally, step S2 includes:
s21, determining a sampling plane of near-field scattering data in the scattering area;
and S22, sampling at any position of the circular ring by using any antenna in the circular ring determined by the closest radius and the farthest radius by taking the center of the sampling plane as the center of the circle on the sampling plane, and recording the antenna receiving voltage and the sampling point position of each sampling point.
Optionally, in step S3, the expression of the 2-D near-field test antenna receiving voltage is:
wherein, UmThe sum of the antenna receiving voltages of all sampling points in the P scattering areas; u shapeiIs the incident voltage; z represents the wave impedance in free space; r isAIs the position vector of the tested antenna; r ispIs the center coordinate of the p-th scattering region on the target; r isApIs the vector between the center of the p-th scattering region to the test antenna; t isNIs a transfer operator, k denotes the incident wave vector,
k and
respectively the wave number and the wave vector direction,
is the direction of the two-dimensional wave vector, and beta is the wave vector
Angles in a two-dimensional polar coordinate system; xip(k) Representing the far field scattering characteristic quantity of the p-th scattering area.
Optionally, TNThe expression of (a) is:
Optionally, step S4 includes:
s41, carrying out total field synthesis on the 2-D far-field scattering characteristic quantity of each scattering area, and acquiring a target total far-field scattering characteristic quantity xi:
s42, calculating to obtain the target total RCS:
σ denotes the target overall RCS.
The invention also provides a near-field and far-field conversion method for scattering of the near-field local irradiation target, which comprises the following steps:
h1, dividing the target into P scattering areas;
h2, sequentially carrying out 3-D space sampling on each scattering area to obtain 3-D near-field scattering data of each sampling point;
h3, performing near-far field conversion on the 3-D near-field scattering data of the scattering area based on the expression of the receiving voltage of the 3-D near-field test antenna, and acquiring the 3-D far-field scattering characteristic quantity of the scattering area;
h4, carrying out total field synthesis on the 3-D far-field scattering characteristic quantities of all scattering areas, and calculating to obtain the total RCS of the target based on the RCS relational expression.
Optionally, step H2 includes:
h21, determining a sampling space of near-field scattering data in a scattering area;
h22, in the sampling space, taking the center of the sampling space as the center of a circle, sampling at any position of the sphere layer by using any antenna in the sphere layer determined by the nearest radius and the farthest radius, and recording the antenna receiving voltage and the sampling point position of each sampling point.
Optionally, in step H3, the expression based on the 3-D near-field test antenna receiving voltage is:
wherein, UmThe sum of the antenna receiving voltages of all sampling points in the P scattering areas; k is the wave number; u shapeiIs the incident voltage; z represents the wave impedance in free space; r isAIs the position vector of the tested antenna; r ispIs the center coordinate of the p-th scattering region on the target; r isApIs the center r of the p-th scattering areapVector to test antenna; t isLIs a transfer operator; xip(k) Representing a far field scattering characteristic quantity of a p-th scattering area;
k and
wave number and wave vector direction, respectively.
Optionally, TLThe expression of (a) is:
Optionally, step H4 includes:
h41, carrying out total field synthesis on the 3-D far-field scattering characteristic quantity of each scattering area, and acquiring a target total far-field scattering characteristic quantity xi:
h42, calculating to obtain the target total RCS:
σ denotes the target overall RCS.
Compared with the prior art, the invention has the beneficial effects that:
the near-field and far-field conversion method for scattering of the near-field local irradiation target realizes the near-field local irradiation of the target through testing the antenna directional diagram control, and can be used for target scattering measurement in a limited space in a non-darkroom environment; the target segmentation method is not strictly required; the sampling mode is flexible, the sampling point is not fixed, and the 3-D space free sampling can be carried out, and the sampling can also be carried out on a 2-D plane; the fully polarized scatter data can be processed.
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In order to more clearly illustrate the technical solution of the present invention, the drawings used in the description will be briefly introduced, and it is obvious that the drawings in the following description are an embodiment of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts according to the drawings:
FIG. 1 is a flowchart illustrating a method for converting scattering near-field and far-field of a near-field local illumination target according to a first embodiment of the present invention;
FIG. 2 is a flowchart illustrating a method for near-field and far-field transformation of scattering of a local irradiation target in a near field according to a second embodiment of the present invention;
FIG. 3 is a diagram of the relationship between the location vectors in the target segmentation and the target scattering model according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The near-field and far-field conversion method for scattering of the near-field local irradiation target can process flexibly sampled near-field test data, solve the problem of near-field local irradiation, realize near-field sampling (2-D and 3-D) of the target by using a non-complete irradiation antenna, and obtain the far-field electromagnetic scattering characteristic of the target by a rapid near-field and far-field conversion method based on multilayer plane wave decomposition.
The principle of the invention is as follows:
after the target enters the local irradiation area, the relation between the scattering characteristic of the target and the antenna directional pattern is more close compared with the traditional far-field irradiation. The method is more sensitive to the relative distance between the target and the antenna, the current distribution on the surface of the target is more complex, the scattering echo of the target changes more severely, and the difference of the contribution of different scattering sources on the target to the total scattering field is larger. The method is based on first-order Born approximation, and considers that the total scattering characteristic quantity of the target is the linear combination of the scattering characteristic quantities of different parts on the target according to the linear superposition principle of the scattering characteristic quantity of the target. Firstly, dividing a target into P scattering areas, respectively carrying out single-station RCS near-far field conversion based on multilayer plane wave decomposition, and finally carrying out total field synthesis to obtain the whole RCS of the target.
Example one
The invention provides a near-field local irradiation target scattering near-far-field conversion method, which is suitable for acquiring target total RCS under 2-D plane sampling, and as shown in figure 1, the method comprises the following steps:
s1, dividing the target into P scattering areas;
s2, sequentially carrying out 2-D plane sampling on each scattering area to obtain 2-D near-field scattering data of each sampling point;
step S2 includes:
s21, determining a sampling plane of near-field scattering data in the scattering area;
and S22, sampling at any position of the circular ring by using any antenna in the circular ring determined by the closest radius and the farthest radius by taking the center of the sampling plane as the center of the circle on the sampling plane, and recording the antenna receiving voltage and the sampling point position of each sampling point.
S3, based on the expression of the 2-D near-field test antenna receiving voltage, performing near-far field conversion on the 2-D near-field scattering data of the scattering area to obtain 2-D far-field scattering characteristic quantity of the scattering area;
in step S3, the expression of the 2-D near-field test antenna receiving voltage is:
wherein, UmThe sum of the antenna receiving voltages of all sampling points in the P scattering areas; u shapeiIs the incident voltage; z represents the wave impedance in free space; as shown in FIG. 3, rAIs the position vector of the tested antenna; r ispIs the center coordinate of the p-th scattering region on the target; r isApIs the center r of the p-th scattering areapVector to the test antenna, r' in fig. 2 is any point in the p region; t isNIs a transfer operator, k denotes the incident wave vector,
k and
respectively the wave number and the wave vector direction,
is the direction of the two-dimensional wave vector, and beta is the wave vector
Angles in a two-dimensional polar coordinate system; xip(k) Represents the far-field scattering characteristic quantity of the p-th scattering area (under 2-D test).
TNThe expression of (a) is:
As will be understood by those skilled in the art, when P is 1, step S3 is equivalent to a single-station RCS near-far-field conversion method based on multi-layer plane wave decomposition to obtain a 2-D far-field scattering characteristic quantity of the scattering region.
And S4, performing total field synthesis on the 2-D far-field scattering characteristic quantities of the scattering regions, and calculating to obtain the total RCS of the target based on the RCS relational expression.
Step S4 includes:
s41, carrying out total field synthesis on the 2-D far-field scattering characteristic quantity of each scattering area, and acquiring a target total far-field scattering characteristic quantity xi:
s42, calculating to obtain the target total RCS:
σ denotes the target overall RCS.
Example two
The invention also provides a near-field local irradiation target scattering near-far-field conversion method, which is suitable for acquiring the total RCS of a target under 3-D space sampling, and comprises the following steps:
h1, dividing the target into P scattering areas;
h2, sequentially carrying out 3-D space sampling on each scattering area to obtain 3-D near-field scattering data of each sampling point;
step H2 includes:
h21, determining a sampling space of near-field scattering data in a scattering area;
h22, in the sampling space, taking the center of the sampling space as the center of a circle, sampling at any position of the sphere layer by using any antenna in the sphere layer determined by the nearest radius and the farthest radius, and recording the antenna receiving voltage and the sampling point position of each sampling point.
H3, performing near-far field conversion on the 3-D near-field scattering data of the scattering area based on the expression of the receiving voltage of the 3-D near-field test antenna, and acquiring the 3-D far-field scattering characteristic quantity of the scattering area;
step H3 is based on the expression of the 3-D near field test antenna received voltage:
wherein, UmThe sum of the antenna receiving voltages of all sampling points in the P scattering areas; k is the wave number; u shapeiIs the incident voltage; z represents the wave impedance in free space; as shown in FIG. 2, rAIs the position vector of the tested antenna; r ispIs the center coordinate of the p-th scattering region on the target; r isApIs the center r of the p-th scattering areapVector to test antenna; t isLIs a transfer operator; xip(k) Far-field scattering characteristic quantity (under 3-D test) of the p-th scattering region is represented;
k and
wave number and wave vector direction, respectively.
TLThe expression of (a) is:
As will be understood by those skilled in the art, when P is 1, step H3 is equivalent to a single-station RCS near-far-field conversion method based on multi-layer plane wave decomposition to obtain 3-D far-field scattering characteristic quantities of each scattering region.
H4, carrying out total field synthesis on the 3-D far-field scattering characteristic quantities of all scattering areas, and calculating to obtain the total RCS of the target based on the RCS relational expression.
Step H4 includes:
h41, carrying out total field synthesis on the 3-D far-field scattering characteristic quantity of each scattering area, and acquiring a target total far-field scattering characteristic quantity xi:
h42, calculating to obtain the target total RCS:
σ denotes the target overall RCS.
Compared with the traditional near-field global irradiation situation, the method can achieve the effect of suppressing clutter by controlling the beam width of the test antenna, so that the RCS test of the target can be performed in a non-darkroom environment. The invention has no strict requirements on the target segmentation method; the sampling mode is flexible, the sampling point is not fixed, and the 3-D space free sampling can be carried out, and the sampling can also be carried out on a 2-D plane; the fully polarized scatter data can be processed.
The invention provides a scattering near-far field conversion method for a near-field local irradiation target, and provides a 3-D and 2-D near-field local irradiation scattering measurement scheme and a near-far field conversion method for measurement data, so that RCS of a total target is obtained. The method comprises the steps of dividing a target to be detected according to scattering characteristics of the target and conditions of a test field, sequentially carrying out near-far field conversion processing on each scattering area by using a single-station RCS near-far field conversion method based on multilayer plane wave decomposition, and finally carrying out total field synthesis to obtain the RCS of the target to be detected. The method can process vector data and scalar data, namely complete the conversion of the full polarization data at one time; in addition, the method inherits the advantages of arbitrary antenna, flexible near-field sampling mode and the like in the single-station RCS near-far field conversion method based on multilayer plane wave decomposition.
While the invention has been described with reference to specific embodiments, the invention is not limited thereto, and various equivalent modifications and substitutions can be easily made by those skilled in the art within the technical scope of the invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. A method for converting scattering near-field and far-field of a near-field local illumination target, which is characterized by comprising the following steps:
s1, dividing the target into P scattering areas;
s2, sequentially carrying out 2-D plane sampling on each scattering area to obtain 2-D near-field scattering data of each sampling point;
s3, based on the expression of the 2-D near-field test antenna receiving voltage, performing near-far field conversion on the 2-D near-field scattering data of the scattering area to obtain 2-D far-field scattering characteristic quantity of the scattering area;
and S4, performing total field synthesis on the 2-D far-field scattering characteristic quantities of the scattering regions, and calculating to obtain the total RCS of the target based on the RCS relational expression.
2. The method for near-field local illumination target scattering near-far-field switching as claimed in claim 1, wherein step S2 comprises:
s21, determining a sampling plane of near-field scattering data in the scattering area;
and S22, sampling at any position of the circular ring by using any antenna in the circular ring determined by the closest radius and the farthest radius by taking the center of the sampling plane as the center of the circle on the sampling plane, and recording the antenna receiving voltage and the sampling point position of each sampling point.
3. The near-field local illumination target scattering near-far-field switching method according to claim 1, wherein the expression of the 2-D near-field test antenna receiving voltage in step S3 is:
wherein, UmThe sum of the antenna receiving voltages of all sampling points in the P scattering areas; u shapeiIs the incident voltage; z represents the wave impedance in free space; r isAIs the position vector of the tested antenna; r ispIs the center coordinate of the p-th scattering region on the target; r isApIs the vector between the center of the p-th scattering region to the test antenna; t isNIs a transfer operator, k denotes the incident wave vector,
k and
respectively the wave number and the wave vector direction,
is the direction of the two-dimensional wave vector, and beta is the wave vector
Angles in a two-dimensional polar coordinate system; xip(k) Representing the far field scattering characteristic quantity of the p-th scattering area.
4. The near-field local illumination target scattering near-far field conversion method of claim 3, wherein T isNThe expression of (a) is:
5. The near-field local illumination target scattering near-far-field switching method according to claim 4, wherein the step S4 comprises:
s41, carrying out total field synthesis on the 2-D far-field scattering characteristic quantity of each scattering area, and acquiring a target total far-field scattering characteristic quantity xi:
s42, calculating to obtain the target total RCS:
σ denotes the target overall RCS.
6. A method for converting scattering near-field and far-field of a near-field local illumination target, which is characterized by comprising the following steps:
h1, dividing the target into P scattering areas;
h2, sequentially carrying out 3-D space sampling on each scattering area to obtain 3-D near-field scattering data of each sampling point;
h3, performing near-far field conversion on the 3-D near-field scattering data of the scattering area based on the expression of the receiving voltage of the 3-D near-field test antenna, and acquiring the 3-D far-field scattering characteristic quantity of the scattering area;
h4, carrying out total field synthesis on the 3-D far-field scattering characteristic quantities of all scattering areas, and calculating to obtain the total RCS of the target based on the RCS relational expression.
7. The method for near-field local illumination target scattering near-far-field switching as claimed in claim 6, wherein step H2 comprises:
h21, determining a sampling space of near-field scattering data in a scattering area;
h22, in the sampling space, taking the center of the sampling space as the center of a circle, sampling at any position of the sphere layer by using any antenna in the sphere layer determined by the nearest radius and the farthest radius, and recording the antenna receiving voltage and the sampling point position of each sampling point.
8. The near-field local illumination target scattering near-far-field switching method according to claim 6, wherein the expression of the receiving voltage based on the 3-D near-field test antenna of step H3 is:
wherein, UmThe sum of the antenna receiving voltages of all sampling points in the P scattering areas; k is the wave number; u shapeiIs the incident voltage; z represents the wave impedance in free space; r isAIs the position vector of the tested antenna; r ispIs the center coordinate of the p-th scattering region on the target; r isApIs the center r of the p-th scattering areapVector to test antenna; t isLIs a transfer operator; xip(k) Representing a far field scattering characteristic quantity of a p-th scattering area;
k and
wave number and wave vector direction, respectively.
9. The near-field local illumination target scattering near-far field conversion method of claim 8, wherein T isLThe expression of (a) is:
10. The method for near-field local illumination target scattering near-far-field switching as claimed in claim 9, wherein step H4 comprises:
h41, carrying out total field synthesis on the 3-D far-field scattering characteristic quantity of each scattering area, and acquiring a target total far-field scattering characteristic quantity xi:
h42, calculating to obtain the target total RCS:
σ denotes the target overall RCS.
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