CN113702939B - Near-field local irradiation target scattering near-far field conversion method - Google Patents
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Abstract
The invention provides a near-field local irradiation target scattering near-far field conversion method, which comprises the following steps: s1, dividing a target into P scattering areas; s2, sequentially carrying out 2-D plane sampling on each scattering region to obtain 2-D near-field scattering data of each sampling point; s3, performing near-far field conversion on the 2-D near-field scattering data of a scattering region based on an expression of the receiving voltage of the 2-D near-field test antenna, and obtaining 2-D far-field scattering characteristic quantity of the scattering region; and S4, performing total field synthesis on the 2-D far-field scattering characteristic quantity of each scattering region, and calculating based on an RCS relational expression to obtain the target overall RCS. The invention also provides a near-field local irradiation target scattering near-far field conversion method which is suitable for acquiring the target overall RCS under 3-D space sampling.
Description
Technical Field
The invention relates to the technical field of electromagnetic scattering and back scattering, in particular to a near-field local irradiation target scattering near-far field conversion method.
Background
In recent years, an active RCS (Radar Cross section radar cross section) near-field test technology is a technology combining test and calculation for obtaining a target RCS through near-field and far-field conversion after testing in a near-field which does not meet far-field conditions. When the target electrical size is large, far field conditions become exceptionally severe and difficult to achieve in an experimental field. The near field test is only required to be carried out in a limited experimental field with a few times of target size, and has the characteristics of low cost and convenience. However, near field testing requires near-far field conversion processing on test data to obtain far field RCS data, so a near-far field conversion algorithm is a key of the near field testing technology.
The target RCS near field test is different from the far field horizon test and the compact field test, namely the test is performed in a target scattering Fresnel zone, and the obtained test result is subjected to near-far field conversion to obtain the RCS. The current mature RCS near-field test method is to enable a target to be tested to be completely located in a test antenna pattern irradiation area, and obtain a far-field RCS through double-station scanning or single-station sampling and a corresponding near-field and far-field conversion algorithm.
The near field test mode supported by the existing near-far field conversion method is fixed and single, and near-far field local irradiation target near-far field conversion cannot be realized. The existing near-far field conversion method is divided into two main types based on plane wave synthesis and based on target imaging. The plane wave synthesis-based method requires dual plane wave synthesis of transmitting and receiving, and measurement is effective only when the whole object is in an effective plane wave synthesis area. If only a part of the target is in the plane wave synthesizing region, an edge effect is generated and the synthesized plane wave is destroyed. The method has huge test quantity and does not meet the field rapid test requirement. In conclusion, the near-far field conversion method based on plane wave synthesis is not suitable for near-field local irradiation conditions. The near-far field conversion method based on target imaging can acquire RCS only by single-station near-field test, but has a scattered field linear approximation error. If the problem of local irradiation of the near field is treated by using the traditional method based on the target near field SAR/ISAR imaging, the target area needs to be segmented first, then the far field is synthesized by image stitching, and the problem of alignment of the imaging center becomes a difficult problem in testing and data processing due to the sensitivity of the target scattering image to the gesture.
Related researches mainly comprising a single-station near-far field conversion method, such as a near-field test based on near-field imaging and a near-far field conversion method, a convolution extrapolation single-station near-far field conversion method, a local double-station near-far field conversion method of a coupling target, a correction algorithm of a two-dimensional single-station near-far field conversion method and the like are carried out in recent years at home and abroad. However, the above methods are based on the object to be measured being entirely in the test antenna pattern illumination area.
Thus, there is a need for a method based on near field local testing and near-far field conversion of a target to obtain the RCS characteristics of the target.
Disclosure of Invention
The invention aims to provide a near-field local irradiation target scattering near-field conversion method, which can realize the integration of target segmentation and near-field conversion, can perform three-dimensional (3-D) to two-dimensional (2-D) dimension reduction simplification, has arbitrary antenna and flexible near-field sampling mode, and can rapidly and conveniently acquire a target RCS.
In order to achieve the above object, the present invention provides a near-field local irradiation target scattering near-far field conversion method, comprising the steps of:
s1, dividing a target into P scattering areas;
s2, sequentially carrying out 2-D plane sampling on each scattering region to obtain 2-D near-field scattering data of each sampling point;
s3, performing near-far field conversion on the 2-D near-field scattering data of a scattering region based on an expression of the receiving voltage of the 2-D near-field test antenna, and obtaining 2-D far-field scattering characteristic quantity of the scattering region;
and S4, performing total field synthesis on the 2-D far-field scattering characteristic quantity of each scattering region, and calculating based on an RCS relational expression to obtain the target overall RCS.
Optionally, step S2 includes:
s21, determining a sampling plane of near-field scattering data in a scattering region;
s22, on the sampling plane, taking the center of the sampling plane as the center of a circle, sampling at any position of the circle by using any antenna in the circle determined by the nearest radius and the farthest radius, and recording the antenna receiving voltage and the sampling point position of each sampling point.
Optionally, in step S3, the expression of the receiving voltage of the 2-D near field test antenna is:
wherein U is m Is the sum of antenna receiving voltages of all sampling points in the P scattering areas; u (U) i Is the incident voltage; z represents the wave impedance of free space; r is (r) A Is the position vector of the test antenna; r is (r) p Is the center coordinates of the p-th scattering region on the target; r is (r) Ap Is the vector between the center of the p-th scattering region and the test antenna; t (T) N Is a transfer operator, k represents the incident wave vector,k and->Wave number and wave vector direction, respectively, +.>Is the two-dimensional wave vector direction, beta is the wave vector +.>An angle in a two-dimensional polar coordinate system; zeta type toy p (k) Representing the far field scattering characteristic quantity of the p-th scattering region.
Alternatively, T N The expression of (2) is:
is a second class of sphere Hankel functions.
Optionally, step S4 includes:
s41, performing total field synthesis on the 2-D far-field scattering characteristic quantity of each scattering region to obtain a target total far-field scattering characteristic quantity xi:
s42, calculating to obtain a target overall RCS:
σ represents the target overall RCS.
The invention also provides a near-field local irradiation target scattering near-far field conversion method, which comprises the following steps:
h1, dividing a target into P scattering areas;
h2, sequentially carrying out 3-D space sampling on each scattering region to obtain 3-D near-field scattering data of each sampling point;
h3, based on an expression of the receiving voltage of the 3-D near-field test antenna, performing near-field conversion on the 3-D near-field scattering data of the scattering region to obtain a 3-D far-field scattering characteristic quantity of the scattering region;
and H4, performing total field synthesis on the 3-D far-field scattering characteristic quantity of each scattering region, and calculating based on an RCS relational expression to obtain the target overall RCS.
Optionally, step H2 includes:
h21, determining a sampling space of near-field scattering data in a scattering region;
and H22, in the sampling space, taking the center of the sampling space as the center of a circle, sampling at any position of the sphere by using any antenna in the sphere determined by the nearest radius and the farthest radius, and recording the antenna receiving voltage and the sampling point position of each sampling point.
Optionally, in step H3, the expression based on the receiving voltage of the 3-D near field test antenna is:
wherein U is m Is the sum of antenna receiving voltages of all sampling points in the P scattering areas; k is the wave number; u (U) i Is the incident voltage; z represents the wave impedance of free space; r is (r) A Is the position vector of the test antenna; r is (r) p Is the center coordinates of the p-th scattering region on the target; r is (r) Ap Is the center r of the p-th scattering region p Vector to test antenna; t (T) L Is a transfer operator; zeta type toy p (k) A far-field scattering feature quantity representing a p-th scattering region;k and->Wave number and wave vector directions, respectively.
Alternatively, T L The expression of (2) is:
is a second class of sphere Hankel function, P l Is a legendre polynomial.
Optionally, step H4 includes:
h41, carrying out total field synthesis on the 3-D far-field scattering characteristic quantity of each scattering region to obtain a target total far-field scattering characteristic quantity xi:
and H42, calculating to obtain a target overall RCS:
σ represents the target overall RCS.
Compared with the prior art, the invention has the beneficial effects that:
according to the near field local irradiation target scattering near-far field conversion method, target near field local irradiation is realized through test antenna pattern control, and the method can be used for target scattering measurement in a limited space of a non-darkroom environment; the method has no strict requirement on the target segmentation method; the sampling mode is flexible, sampling points are not fixed, and the sampling can be carried out on 3-D space free sampling and 2-D plane sampling; the fully polarized scatter data may be processed.
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For a clearer description of the technical solutions of the present invention, the drawings that are needed in the description will be briefly introduced below, it being obvious that the drawings in the following description are one embodiment of the present invention, and that, without inventive effort, other drawings can be obtained by those skilled in the art from these drawings:
FIG. 1 is a flow chart of a method for converting scattered near-field to far-field of a near-field local irradiation target according to the first embodiment of the invention;
FIG. 2 is a flow chart of a method for converting scattered near-field to far-field of a near-field local irradiation target according to the second embodiment of the invention;
FIG. 3 is a graph of position vector relationships in a target segmentation and target scattering model in an embodiment of the invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The near field local irradiation target scattering near-far field conversion method can process near field test data which are flexibly sampled, solves the near field local irradiation problem, realizes near field sampling (2-D and 3-D) on the target by utilizing the incomplete irradiation antenna, and obtains the far field electromagnetic scattering characteristic of the target by a rapid near-far field conversion method based on multi-layer plane wave decomposition.
The principle of the invention is as follows:
after the target enters the local irradiation area, compared with the traditional far-field irradiation, the relation between the scattering characteristic of the target and the antenna pattern is more intimate. The method is more sensitive to the relative distance between the target and the antenna, the current distribution on the surface of the target is more complex, the scattering echo change of the target is more severe, and the difference of contribution of different scattering sources on the target to the scattering total field is also larger. The method is based on first-order Born approximation, and according to the principle of linear superposition of scattering feature quantities of the target, the total scattering feature quantity of the target is considered to be linear combination of scattering feature quantities of different parts on the target. Firstly, dividing a target into P scattering areas, respectively performing near-far field conversion of a single-station RCS based on multi-layer plane wave decomposition, and finally performing total field synthesis to obtain the whole RCS of the target.
Example 1
The invention provides a near-field local irradiation target scattering near-far field conversion method, which is suitable for acquiring a target overall RCS under 2-D plane sampling, as shown in figure 1, and comprises the following steps:
s1, dividing a target into P scattering areas;
s2, sequentially carrying out 2-D plane sampling on each scattering region to obtain 2-D near-field scattering data of each sampling point;
step S2 includes:
s21, determining a sampling plane of near-field scattering data in a scattering region;
s22, on the sampling plane, taking the center of the sampling plane as the center of a circle, sampling at any position of the circle by using any antenna in the circle determined by the nearest radius and the farthest radius, and recording the antenna receiving voltage and the sampling point position of each sampling point.
S3, performing near-far field conversion on the 2-D near-field scattering data of a scattering region based on an expression of the receiving voltage of the 2-D near-field test antenna, and obtaining 2-D far-field scattering characteristic quantity of the scattering region;
the expression of the receiving voltage of the 2-D near field test antenna in the step S3 is as follows:
wherein U is m Is the sum of antenna receiving voltages of all sampling points in the P scattering areas; u (U) i Is the incident voltage; z represents the wave impedance of free space; as shown in fig. 3, r A Is the position vector of the test antenna; r is (r) p Is the center coordinates of the p-th scattering region on the target; r is (r) Ap Is the center r of the p-th scattering region p Vector to test antenna, r' in fig. 2 is any point in the p region; t (T) N Is a transfer operator, k represents the incident wave vector,k and->Wave number and wave vector direction, respectively, +.> Is the two-dimensional wave vector direction, beta is the wave vector +.>An angle in a two-dimensional polar coordinate system; zeta type toy p (k) Representing the far field scattering characteristic quantity of the p-th scattering region (under 2-D test).
T N The expression of (2) is:
is a second class of sphere Hankel functions.
It will be appreciated by those skilled in the art that when p=1, step S3 is equivalent to a single-station RCS near-far field conversion method based on multi-layer plane wave decomposition to obtain 2-D far field scattering features of the scattering region.
And S4, performing total field synthesis on the 2-D far-field scattering characteristic quantity of each scattering region, and calculating based on an RCS relational expression to obtain the target overall RCS.
Step S4 includes:
s41, performing total field synthesis on the 2-D far-field scattering characteristic quantity of each scattering region to obtain a target total far-field scattering characteristic quantity xi:
s42, calculating to obtain a target overall RCS:
σ represents the target overall RCS.
Example two
The invention also provides a near-field local irradiation target scattering near-far field conversion method which is suitable for obtaining the target overall RCS under 3-D space sampling, and the method comprises the following steps:
h1, dividing a target into P scattering areas;
h2, sequentially carrying out 3-D space sampling on each scattering region to obtain 3-D near-field scattering data of each sampling point;
step H2 comprises:
h21, determining a sampling space of near-field scattering data in a scattering region;
and H22, in the sampling space, taking the center of the sampling space as the center of a circle, sampling at any position of the sphere by using any antenna in the sphere determined by the nearest radius and the farthest radius, and recording the antenna receiving voltage and the sampling point position of each sampling point.
H3, based on an expression of the receiving voltage of the 3-D near-field test antenna, performing near-field conversion on the 3-D near-field scattering data of the scattering region to obtain a 3-D far-field scattering characteristic quantity of the scattering region;
step H3 is based on the expression of the 3-D near field test antenna receiving voltage:
wherein U is m Is the sum of antenna receiving voltages of all sampling points in the P scattering areas; k is the wave number; u (U) i Is the incident voltage; z represents the wave impedance of free space; as shown in fig. 2, r A Is the position vector of the test antenna; r is (r) p Is the center coordinates of the p-th scattering region on the target; r is (r) Ap Is the center r of the p-th scattering region p Vector to test antenna; t (T) L Is a transfer operator; zeta type toy p (k) Far field scattering features (under 3-D testing) representing the p-th scattering region;k and->Wave number and wave vector directions, respectively.
T L The expression of (2) is:
is a second class of sphere Hankel function, P l Is a legendre polynomial.
It will be appreciated by those skilled in the art that when p=1, step H3 is equivalent to a single-station RCS near-far field conversion method based on multi-layer plane wave decomposition to obtain 3-D far field scattering features for each scattering region.
And H4, performing total field synthesis on the 3-D far-field scattering characteristic quantity of each scattering region, and calculating based on an RCS relational expression to obtain the target overall RCS.
Step H4 comprises:
h41, carrying out total field synthesis on the 3-D far-field scattering characteristic quantity of each scattering region to obtain a target total far-field scattering characteristic quantity xi:
and H42, calculating to obtain a target overall RCS:
σ represents the target overall RCS.
Compared with the traditional near field global irradiation situation, the near field local irradiation is carried out on the target, and the effect of clutter suppression can be achieved by controlling the beam width of the test antenna, so that the RCS test of the target can be carried out in a non-darkroom environment. The method has no strict requirement on the target segmentation method; the sampling mode is flexible, sampling points are not fixed, and the sampling can be carried out on 3-D space free sampling and 2-D plane sampling; the fully polarized scatter data may be processed.
The near-field local irradiation target scattering near-far field conversion method provides a 3-D and 2-D near-field local irradiation scattering measurement scheme and a near-far field conversion method of measurement data, so that RCS of an overall target is obtained. According to the invention, a target to be detected is segmented according to scattering characteristics of the target and conditions of a test field, a single-station RCS near-far field conversion method based on multi-layer plane wave decomposition is used for sequentially carrying out near-far field conversion treatment on each scattering region, and finally total field synthesis is carried out to obtain the RCS of the target to be detected. The method can process vector data and scalar data, namely complete the conversion of all-polarization data at one time; in addition, the method inherits the advantages of arbitrary antenna, flexible near-field sampling mode and the like in the single-station RCS near-far field conversion method based on multi-layer plane wave decomposition.
While the invention has been described with reference to certain preferred embodiments, it will be understood by those skilled in the art that various changes and substitutions of equivalents may be made and equivalents will be apparent to those skilled in the art without departing from the scope of the invention. Therefore, the protection scope of the invention is subject to the protection scope of the claims.
Claims (4)
1. A near-field local irradiation target scattering near-far field conversion method is characterized by comprising the following steps:
s1, dividing a target into P scattering areas;
s2, sequentially carrying out 2-D plane sampling on each scattering region to obtain 2-D near-field scattering data of each sampling point;
s3, performing near-far field conversion on the 2-D near-field scattering data of a scattering region based on an expression of the receiving voltage of the 2-D near-field test antenna, and obtaining 2-D far-field scattering characteristic quantity of the scattering region;
the expression of the receiving voltage of the 2-D near field test antenna in the step S3 is as follows:
wherein U is m Is the sum of antenna receiving voltages of all sampling points in the P scattering areas; u (U) i Is the incident voltage; z represents the wave impedance of free space; r is (r) A Is the position vector of the test antenna; r is (r) p Is the center coordinates of the p-th scattering region on the target; r is (r) Ap Is the vector between the center of the p-th scattering region and the test antenna; t (T) N Is a transfer operator, k represents the incident wave vector,k and->Wave number and wave vector direction, respectively, +.>Is the two-dimensional wave vector direction, beta is the wave vector +.>An angle in a two-dimensional polar coordinate system; zeta type toy p (k) A far-field scattering feature quantity representing a p-th scattering region;
s4, total field synthesis is carried out on the 2-D far-field scattering characteristic quantity of each scattering region, and a target overall RCS is obtained through calculation based on an RCS relational expression;
step S4 includes:
s41, performing total field synthesis on the 2-D far-field scattering characteristic quantity of each scattering region to obtain a target total far-field scattering characteristic quantity xi:
s42, calculating to obtain a target overall RCS:
σ represents the target overall RCS.
2. The near-field local irradiation target scattering near-far field conversion method according to claim 1, wherein step S2 comprises:
s21, determining a sampling plane of near-field scattering data in a scattering region;
s22, on the sampling plane, taking the center of the sampling plane as the center of a circle, sampling at any position of the circle by using any antenna in the circle determined by the nearest radius and the farthest radius, and recording the antenna receiving voltage and the sampling point position of each sampling point.
3. A near-field local irradiation target scattering near-far field conversion method is characterized by comprising the following steps:
h1, dividing a target into P scattering areas;
h2, sequentially carrying out 3-D space sampling on each scattering region to obtain 3-D near-field scattering data of each sampling point;
h3, based on an expression of the receiving voltage of the 3-D near-field test antenna, performing near-field conversion on the 3-D near-field scattering data of the scattering region to obtain a 3-D far-field scattering characteristic quantity of the scattering region;
the expression of the receiving voltage of the 3-D near field test antenna is as follows:
wherein U is m Is the sum of antenna receiving voltages of all sampling points in the P scattering areas; k is the wave number; u (U) i Is the incident voltage; z represents the wave impedance of free space; r is (r) A Is the position vector of the test antenna; r is (r) p Is the center coordinates of the p-th scattering region on the target; r is (r) Ap Is the center r of the p-th scattering region p Vector to test antenna; t (T) L Is a transfer operator; zeta type toy p (k) A far-field scattering feature quantity representing a p-th scattering region;k and->Wave number and wave vector directions, respectively;
h4, performing total field synthesis on the 3-D far field scattering characteristic quantity of each scattering region, and calculating based on an RCS relational expression to obtain a target overall RCS;
step H4 comprises:
h41, carrying out total field synthesis on the 3-D far-field scattering characteristic quantity of each scattering region to obtain a target total far-field scattering characteristic quantity xi:
and H42, calculating to obtain a target overall RCS:
σ represents the target overall RCS.
4. A method for near-field local irradiation target scattered near-far field conversion as set forth in claim 3, wherein,
step H2 comprises:
h21, determining a sampling space of near-field scattering data in a scattering region;
and H22, in the sampling space, taking the center of the sampling space as the center of a circle, sampling at any position of the sphere by using any antenna in the sphere determined by the nearest radius and the farthest radius, and recording the antenna receiving voltage and the sampling point position of each sampling point.
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