CN113639971A - Method for calibrating pipe shaft component - Google Patents
Method for calibrating pipe shaft component Download PDFInfo
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- CN113639971A CN113639971A CN202110958807.6A CN202110958807A CN113639971A CN 113639971 A CN113639971 A CN 113639971A CN 202110958807 A CN202110958807 A CN 202110958807A CN 113639971 A CN113639971 A CN 113639971A
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- 238000000034 method Methods 0.000 title claims abstract description 18
- 230000000149 penetrating effect Effects 0.000 claims 1
- 230000003287 optical effect Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 5
- 238000009434 installation Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/005—Testing of reflective surfaces, e.g. mirrors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/04—Optical benches therefor
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- Chemical & Material Sciences (AREA)
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention belongs to the technical field of optical instruments, and particularly relates to a method for calibrating a pipe shaft component.
Description
Technical Field
The invention belongs to the technical field of optical instruments, and particularly relates to a method for calibrating a pipe shaft component.
Background
The monochromator is used for decomposing incident light into monochromatic light and accurately taking out light with a certain wavelength. When the angle grating monochromator is used, the reflecting mirror and the grating need to rotate by corresponding angles to obtain required monochromatic light. The installation accuracy of the reflector and the grating rotating shaft directly influences the resolution of the monochromator. As shown in figure 3, the reflecting mirror and the grating rotating shaft are hollow tubular shafts, and the central axes of the reflecting mirror and the grating rotating shaft are absent, so that the assembly of the instrument is difficult. After the plane mirror rotating shaft and the grating rotating shaft are parallel, how to calibrate the axes of the two shafts to be positioned in the same plumb bob plane becomes a problem to be solved urgently.
Disclosure of Invention
The invention aims to provide a method for calibrating a pipeline component, which can obtain a monochromator with required assembly precision of a plane mirror rotating shaft and a grating rotating shaft.
In order to realize the purpose, the invention adopts the technical scheme that:
a method for calibrating a pipe shaft component comprises the steps that a base is installed on a calibration platform, a level gauge is erected beside the base, a theodolite is erected at the outer end, close to a grating rotating shaft, of the base, a target is installed at the shaft end of the grating rotating shaft or a plane mirror rotating shaft, the center of the target is observed through the level gauge or the theodolite, and the base is calibrated;
the calibration steps are as follows:
A. calibrating the grating rotating shaft;
a1, mounting the target on the end of the grating rotating shaft, aiming the target by the theodolite and adjusting the base to rotate until the axis of the grating aligning shaft and the collimation shaft of the theodolite are in the same plumb plane;
a2, mounting the target at the end of the grating rotating shaft, aiming the target by a level gauge and adjusting the height posture of the base until the axis of the grating rotating shaft is horizontally arranged;
B. calibrating a plane mirror rotating shaft;
the target is arranged at one end of a plane mirror rotating shaft, and the position relation between the center of the observation target and the theodolite vertical wire is adjusted to enable the base to rotate around the axis of the grating rotating shaft until the axis of the plane mirror rotating shaft and the collimation axis of the theodolite are positioned in the same plumb plane.
When the target is arranged on the grating rotating shaft or the plane mirror rotating shaft, the center of the target is taken as the axis of the corresponding rotating shaft. The method aims at a target arranged on a grating rotating shaft by using a theodolite and a level gauge, calibrates the grating rotating shaft, and then adjusts a base according to the deflection direction of the center of the target arranged on the plane mirror rotating shaft relative to a vertical wire of the theodolite, so that the high-efficiency calibration can be realized, and the plane mirror rotating shaft and the grating rotating shaft which are horizontally arranged in the axis and are positioned on the same plumb surface can be obtained.
Drawings
The contents of the description and the references in the drawings are briefly described as follows:
FIG. 1 is a schematic diagram of an instrument to be calibrated in an embodiment;
FIG. 2 is a front view of an instrument to be calibrated in the embodiment;
FIG. 3 is a cross-sectional view A-A of FIG. 2;
FIG. 4 is a schematic of a target;
FIG. 5 is a schematic diagram of a top view arrangement of the theodolite and the pipe axis to be calibrated;
FIG. 6 is a schematic diagram of a side view arrangement of the theodolite and the pipe axis to be calibrated;
FIGS. 7 and 8 are schematic side view arrangements of the theodolite and the pipe axis to be calibrated in step A1;
FIG. 9 is a schematic diagram of a top view arrangement of the theodolite, level and tube axis to be calibrated;
fig. 10 and 11 are schematic diagrams of the theodolite eyepiece observation in the state shown in fig. 6.
In the figure: 10. the grating rotating shaft I, the grating rotating shaft II, the plane mirror rotating shaft 30, the level gauge 40, the theodolite 50 and the target 60 are arranged on the base 20.
Detailed Description
The following description of the embodiments of the present invention will be made in detail with reference to the accompanying drawings.
Example one
In this embodiment, as shown in fig. 1-3, a grating mounting seat 11 and a mirror mounting seat 12 are rotatably connected to a base 10 of the grating monochromator, two ends of the generally U-shaped grating mounting seat 11 are respectively hinged to the base 10 through a grating rotating shaft one 21 and a grating rotating shaft 22, and the mirror mounting seat 12 is hinged to the base 10 through a plane mirror rotating shaft 30. Wherein, the axes of the grating revolution axis I21 and the grating revolution axis 22 are superposed, and the axis of the plane mirror revolution axis 30 is arranged in parallel with the axes of the grating revolution axis I21 and the grating revolution axis II 22.
In this embodiment, the grating rotation axis 20 to be calibrated is composed of two separated tube axis grating rotation axes i 21 and two grating rotation axes i 22, which are disposed with their axes coinciding with each other, in other embodiments, the grating rotation axis 20 to be calibrated may be a complete and continuous tube axis, and both ends of the tube axis can be installed with the targets 60.
The target 60 used in this embodiment is shown in fig. 4, and includes a target shaft sleeve 100 in a stepped shaft shape as a whole, a lens 300 is disposed in a placement cavity of the target shaft sleeve 100, a plurality of concentric circles are disposed on the lens 300, the center of the concentric circles is the target center, and when the target 60 is inserted into a pipe shaft to be calibrated, the target center coincides with the axis of the corresponding rotating shaft. The specific structure of the target 60 is described in the patent No. 202110777573.5 of the applicant's patent application No. 2021, 7/9/7/a "target device for calibration of equipment".
Before calibration, the base 10 of the grating monochromator is mounted on a calibration platform, and a level 40 and a theodolite 50 are erected. As shown in FIG. 9, the level 40 is located beside the base 10, and the connecting line between the center of the level 40 and the center of the grating revolution axis I, II 21, 22 and the axis of the grating revolution axis I21 are arranged at an included angle in the horizontal direction, so that when the target 60 is installed on the grating revolution axis I21 or the grating revolution axis 22, there is no shielding between the level 40 and the center of the target. The theodolite 50 is arranged close to the first grating revolution axis 21 and is positioned at the extended line of the axes of the first grating revolution axis, the second grating revolution axis 21 and the second grating revolution axis 22, namely the theodolite 50, the first grating revolution axis 21 and the second grating revolution axis 22 are positioned on the same straight line visually.
The calibration method comprises the following steps:
A. calibrating the grating revolution axis 20;
a1, as shown in fig. 7 and 8, the same targets 60 are alternately mounted on the first grating rotation axis 21 and the second grating rotation axis 22, the theodolite 50 is used to aim at the targets 60 and the base 10 is adjusted to rotate on the adjustment platform, until the posture of the theodolite 50 is maintained, the centers of the targets 60 mounted on the first grating rotation axis 21 and the second grating rotation axis 22 coincide with the vertical line of the theodolite 50, or only the pitch posture of the theodolite 50 is adjusted, and the centers of the targets 60 mounted on the first grating rotation axis 21 and the second grating rotation axis 22 can coincide with the cross line center of the theodolite 50. Thus, it is determined that the centers of the targets 60 installed on the first and second grating revolution axes 21 and 22 and the collimation axis of the theodolite 50 are located in the same plumb plane, that is, the axis of the grating revolution axis 20 and the collimation axis of the theodolite 50 are located in the same plumb plane.
The attitude of the theodolite 50 is maintained.
A2, as shown in fig. 9, the same target 60 is alternately installed on the first grating revolution axis 21 and the second grating revolution axis 22, the level gauge 40 is used to aim at the target 60 and adjust the height posture of the base 10 until only the horizontal observation angle of the level gauge 40 is adjusted, and the distances between the center of the target 60 and the horizontal wires are the same when the targets are installed on the first grating revolution axis 21 and the second grating revolution axis 22. Specifically, as shown in fig. 4, 10, and 11, a plurality of concentric circles are disposed on the lens 300 of the target 60, and the target 60 mounted on the first grating revolution axis 21 and the second grating revolution axis 22 is observed by the precise level 40, so that when the upper side of the same concentric circle on the target lens 300 is tangent to the horizontal filament, or the lower side of the same concentric circle on the target lens 300 is tangent to the horizontal filament, or the smallest concentric circle on the target lens 300 is coincident with the horizontal filament, it can be determined that the centers of the target 60 mounted on the first grating revolution axis 21 and the second grating revolution axis 22 are located in the same horizontal plane, i.e., the axis of the grating revolution axis 20 is horizontally disposed.
B. Calibrating the plane mirror rotating shaft 30;
as shown in fig. 5 and 6, the target 60 is mounted at the end of the plane mirror rotating shaft 30, the positional relationship between the center of the target and the vertical line of the theodolite 50 is observed, and the base 10 is adjusted to rotate around the axis of the grating rotating shaft 20, so that the center of the target 60 mounted at the end of the plane mirror rotating shaft 30 coincides with the vertical line of the theodolite 50. As shown in fig. 10, the center of the target 60 mounted on the plane mirror rotating shaft 30 is located on the left side of the vertical line, and the base 10 is adjusted to rotate counterclockwise around the axis of the grating rotating shaft 20 to the posture shown in fig. 11, so that the grating rotating shaft 20 and the plane mirror rotating shaft 30 are located in the same plumb plane and the two shafts are respectively arranged horizontally.
As shown in fig. 1 to 3, when the target 60 is inserted into the first grating revolution axis 21 or the second grating revolution axis 22, the center of the target coincides with the axes of the first grating revolution axis 21 and the second grating revolution axis 22. Therefore, the position of the center of the target 60 inserted in the first grating revolution axis 21 and the second grating revolution axis 22 can be calibrated, so that the posture of the grating revolution axis 20 can be calibrated. However, the end of the plane mirror rotation axis 30, which is far from the grating rotation axis 20, can be engaged with the target 60, and the posture of the plane mirror rotation axis 30 cannot be directly calibrated by the above-mentioned method, so the method adopts the sequence of calibrating the grating rotation axis 20 first and then calibrating the plane mirror rotation axis 30.
In this embodiment, the same target 60 is alternately arranged at the first grating rotating shaft 21, the second grating rotating shaft 22 and the shaft end of the plane mirror rotating shaft 30 to be used as the calibration reference, so that the calibration accuracy can be prevented from being influenced by the manufacturing errors of different targets 60. In other embodiments, in the case that the calibration accuracy meets the requirement, a plurality of targets 60 may be simultaneously mounted at the axial ends of the grating rotating shaft 20 and the plane mirror rotating shaft 30, respectively, to improve the calibration efficiency.
Example two
The present embodiment is different from the first embodiment in that after the base 10 is mounted on the calibration platform, the positioning of the theodolite 50 includes the following steps:
and K1, drawing or marking the reference line extending outwards from the base 10 by taking the axial extension directions of the first grating revolution axis 21 and the second grating revolution axis 22 as the reference. The initial state projections of the first grating revolution axis 21 and the second grating revolution axis 22 in the horizontal plane are a straight line, and the reference line is overlapped with the straight line visually. Namely, the reference line is a perpendicular line of the axes of the first grating revolution axis 21 and the second grating revolution axis 22 on the calibration platform and the ground.
K2, the theodolite 50 is erected on the reference line, and the erecting height of the theodolite 50 is adjusted to confirm that the axis of the plane mirror rotating shaft 30 can be observed from the ocular lens of the theodolite 50 through the shaft holes of the first grating rotating shaft 21 and the second grating rotating shaft 22. The target 60 is arranged at the end part of the plane mirror rotating shaft 30, and the erection height and the pitching attitude of the theodolite 50 are adjusted until the target center of the target 60 can be observed through the first grating rotating shaft 21 and the second grating rotating shaft 22.
EXAMPLE III
The difference between this embodiment and the first embodiment is that the adjusting device between the base 10 and the calibration platform cannot directly realize the rotation of the base 10 around the axis of the grating rotation shaft 20. In step B, the posture of the grating revolution axis 20 may be changed when the base 10 is adjusted, so step C is further included after step B, to verify the grating revolution axis 20 and the plane mirror revolution axis 30. The checking steps are as follows:
c1, checking whether the axis of the grating revolving shaft 20 is horizontally arranged, if not, repeating the step A2, and if so, entering the step C2;
and successively installing the same target 60 on the first grating revolution shaft 21 and the second grating revolution shaft 22, observing whether the distance between the center of the target 60 installed on the first grating revolution shaft 21 and the second grating revolution shaft 22 and the transverse wire of the leveling instrument 40 is the same, if so, judging that the axis of the grating revolution shaft 20 is horizontally arranged, and if not, judging that the axis of the grating revolution shaft 20 and the sighting axis of the theodolite 50 are not horizontally arranged.
C2, checking whether the axis of the grating revolving shaft 20 and the sighting axis of the theodolite 50 are positioned in the same plumb plane, if not, repeating the step A1, and if so, entering the step C3;
and successively installing the same target 60 on the first grating revolution shaft 21 and the second grating revolution shaft 22, observing whether the centers of the targets 60 installed on the first grating revolution shaft 21 and the second grating revolution shaft 22 are superposed with the vertical wires of the theodolite 50, if so, judging that the axis of the grating revolution shaft 20 and the collimation axis of the theodolite 50 are positioned in the same plumb bob surface, and if not, judging that the axis of the grating revolution shaft 20 and the collimation axis of the theodolite 50 are not positioned in the same plumb bob surface.
C3, checking whether the axes of the plane mirror rotating shaft 30 and the grating rotating shaft 20 are positioned in the same plumb plane, if not, repeating the step B, and if so, finishing the calibration operation;
and (3) mounting the target 60 at the end part of the plane mirror rotating shaft 30, observing whether the center of the target is superposed with the vertical wires of the theodolite 50, judging that the axes of the plane mirror rotating shaft 30 and the grating rotating shaft 20 are positioned in the same plumb plane if the target is superposed with the vertical wires of the theodolite 50, and judging that the axes of the plane mirror rotating shaft 30 and the grating rotating shaft 20 are not positioned in the same plumb plane if the target is not superposed with the vertical wires of the theodolite 50.
Example four
The difference between this embodiment and the third embodiment is that in step a, the calibration is performed according to steps a2 and a1, that is, the base 10 is first calibrated so that the axis of the grating rotation axis 20 is horizontally arranged, and then the base 10 is calibrated so that the axis of the grating rotation axis 20 is coplanar with the collimation axis of the theodolite 50.
Claims (8)
1. A method of calibrating a pipe component, characterized by: the base (10) is arranged on the adjusting platform, a level gauge (40) is erected beside the base (10), a theodolite (50) is erected at the outer end, close to the grating rotating shaft (20), of the base (10), the target (60) is arranged at the shaft end of the grating rotating shaft (20) or the plane mirror rotating shaft (30), and the level gauge (40) or the theodolite (50) is used for observing the center of the target and adjusting the base (10);
the calibration steps are as follows:
A. calibrating the grating revolution axis (20);
a1, mounting the target (60) at the end of the grating revolution axis (20), aiming the target (60) by the theodolite (50) and adjusting the base (10) to rotate until the axis of the grating revolution axis (20) and the collimation axis of the theodolite (50) are positioned in the same plumb plane;
a2, mounting the target (60) at the end of the grating rotating shaft (20), aiming the target (60) by a level (40) and adjusting the height posture of the base (10) until the axis of the grating rotating shaft (20) is horizontally arranged;
B. calibrating the plane mirror rotation axis (30);
a target (60) is arranged at one end of a plane mirror rotating shaft (30), and a base (10) is adjusted to rotate around the axis of a grating rotating shaft (20) by observing the position relation between the center of the target and a vertical wire of a theodolite (50) until the axis of the plane mirror rotating shaft (30) and a collimation axis of the theodolite (50) are positioned in the same plumb plane.
2. The method of calibrating a pipe shaft component according to claim 1, wherein: further comprising a step K, before step A1, of positioning the theodolite (50),
k1, drawing or marking a reference line corresponding to the axial extension direction of the grating revolution axis (20);
k2, erecting a theodolite (50) on a reference line, adjusting the erecting height of the theodolite (50), and confirming that the axis of the plane mirror rotating shaft (30) can be observed from a shaft hole penetrating through the grating rotating shaft (20) in an ocular lens of the theodolite (50).
3. The method of calibrating a pipe shaft component according to claim 1, wherein: the step B is also followed by a step C,
c1, checking whether the axis of the grating rotating shaft (20) is horizontally arranged, if not, repeating the step A2, and if so, entering the step C2;
c2, checking whether the axis of the grating revolving shaft (20) and the sighting axis of the theodolite (50) are positioned in the same plumb plane, if not, repeating the step A1, and if so, entering the step C3;
c3, checking whether the plane mirror rotating shaft (30) and the grating rotating shaft (20) are positioned in the same plumb plane, if not, repeating the step B, and if so, finishing the calibration operation.
4. The method of calibrating a pipe shaft component according to claim 1, wherein: in step A, calibration was performed according to steps A2 and A1.
5. The method of calibrating a pipe shaft component according to any one of claims 1 to 4, wherein: the same target (60) is alternately arranged at the shaft ends of the grating rotating shaft (20) and the plane mirror rotating shaft (30) to be used as an adjusting reference.
6. The method of calibrating a spool component of claim 5, wherein: the grating revolution axis (20) comprises a grating revolution axis I (21) and a grating revolution axis II (22) which are overlapped in axis and separately arranged in axis bodies.
7. The method of calibrating a spool component of claim 6, wherein: and in the step A, the same target (60) is alternately arranged at the shaft ends of the first grating rotating shaft (21) and the second grating rotating shaft (22), the theodolite (50) is used for observing the target and adjusting the base (10) until the posture of the theodolite (50) is maintained, and the target centers of the target (60) arranged on the first grating rotating shaft (21) and the second grating rotating shaft (22) are respectively superposed with the vertical wires of the theodolite (50).
8. The method of calibrating a spool component of claim 6, wherein: and in the step B, the same target (60) is alternately arranged on the first grating rotating shaft (21) and the second grating rotating shaft (22), the target is observed by the leveling instrument (40), the base (10) is adjusted until the observation part of the leveling instrument (40) is horizontally rotated, and the distance between the centers of the target (60) arranged on the first grating rotating shaft (21) and the second grating rotating shaft (22) and the transverse wire of the leveling instrument (40) is equal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110958807.6A CN113639971B (en) | 2021-08-20 | 2021-08-20 | Method for calibrating tube shaft component |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110958807.6A CN113639971B (en) | 2021-08-20 | 2021-08-20 | Method for calibrating tube shaft component |
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| CN113639971A true CN113639971A (en) | 2021-11-12 |
| CN113639971B CN113639971B (en) | 2023-11-03 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116125655A (en) * | 2022-12-23 | 2023-05-16 | 安徽创谱仪器科技有限公司 | Method for assembling raster scanning device and raster scanning device |
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| CN111896107A (en) * | 2020-07-31 | 2020-11-06 | 安徽创谱仪器科技有限公司 | Grating monochromator |
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2021
- 2021-08-20 CN CN202110958807.6A patent/CN113639971B/en active Active
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| JPH10141946A (en) * | 1996-11-07 | 1998-05-29 | Nec Eng Ltd | Theodolite facing mirror and method for measuring directed angle |
| CN101153819A (en) * | 2006-09-29 | 2008-04-02 | 中国科学院长春光学精密机械与物理研究所 | Method for optical spectrum tuning angle calibration of monochromator with variable included angle |
| CN104748947A (en) * | 2015-04-23 | 2015-07-01 | 江苏省计量科学研究院 | Method of calibrating rotational angle of automatic turntable of luminous distribution performance test system for lamps |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116125655A (en) * | 2022-12-23 | 2023-05-16 | 安徽创谱仪器科技有限公司 | Method for assembling raster scanning device and raster scanning device |
| CN116125655B (en) * | 2022-12-23 | 2023-08-22 | 安徽创谱仪器科技有限公司 | Method for assembling raster scanning device and raster scanning device |
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| CN113639971B (en) | 2023-11-03 |
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Address after: Building 11, Phase II, Yingtang Industrial Park, No. 103 Huatuo Lane, Shulu Community Service Center, High tech Zone, Hefei City, Anhui Province 230000 Patentee after: ANHUI SPECREATION INSTRUMENT SCIENCE & TECHNOLOGY Co.,Ltd. Country or region after: China Address before: 230000 8th floor, building 1, No. 228, Wanshui Road, high tech Zone, Shushan District, Hefei City, Anhui Province Patentee before: ANHUI SPECREATION INSTRUMENT SCIENCE & TECHNOLOGY Co.,Ltd. Country or region before: China |