CN113632099A - 分布式产品缺陷分析系统、方法及计算机可读存储介质 - Google Patents
分布式产品缺陷分析系统、方法及计算机可读存储介质 Download PDFInfo
- Publication number
- CN113632099A CN113632099A CN201980003156.6A CN201980003156A CN113632099A CN 113632099 A CN113632099 A CN 113632099A CN 201980003156 A CN201980003156 A CN 201980003156A CN 113632099 A CN113632099 A CN 113632099A
- Authority
- CN
- China
- Prior art keywords
- product
- defect
- task
- identification
- product manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 title claims abstract description 871
- 238000004458 analytical method Methods 0.000 title claims abstract description 270
- 238000000034 method Methods 0.000 title claims description 91
- 238000003860 storage Methods 0.000 title claims description 47
- 238000004519 manufacturing process Methods 0.000 claims abstract description 443
- 238000012545 processing Methods 0.000 claims abstract description 182
- 238000012549 training Methods 0.000 claims description 60
- 238000003062 neural network model Methods 0.000 claims description 9
- 238000004590 computer program Methods 0.000 claims description 6
- 238000013528 artificial neural network Methods 0.000 claims description 5
- 238000013527 convolutional neural network Methods 0.000 claims description 4
- 230000000306 recurrent effect Effects 0.000 claims description 2
- 238000012163 sequencing technique Methods 0.000 claims description 2
- 239000000047 product Substances 0.000 description 1068
- 230000008569 process Effects 0.000 description 56
- 230000006870 function Effects 0.000 description 47
- 238000012360 testing method Methods 0.000 description 39
- 238000010586 diagram Methods 0.000 description 26
- 238000001514 detection method Methods 0.000 description 25
- 238000013473 artificial intelligence Methods 0.000 description 19
- 238000004891 communication Methods 0.000 description 16
- 238000012544 monitoring process Methods 0.000 description 15
- 239000002245 particle Substances 0.000 description 14
- 238000012552 review Methods 0.000 description 14
- 238000004422 calculation algorithm Methods 0.000 description 13
- 238000004364 calculation method Methods 0.000 description 13
- 239000004065 semiconductor Substances 0.000 description 12
- 238000007726 management method Methods 0.000 description 11
- 239000011521 glass Substances 0.000 description 10
- 238000007689 inspection Methods 0.000 description 10
- 230000008859 change Effects 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 6
- 238000002372 labelling Methods 0.000 description 6
- 239000000523 sample Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000007613 environmental effect Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 238000007781 pre-processing Methods 0.000 description 4
- 238000012795 verification Methods 0.000 description 4
- 230000000007 visual effect Effects 0.000 description 4
- 230000037303 wrinkles Effects 0.000 description 4
- 230000004913 activation Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 238000013135 deep learning Methods 0.000 description 3
- 230000003993 interaction Effects 0.000 description 3
- 238000011068 loading method Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 239000000872 buffer Substances 0.000 description 2
- 230000003139 buffering effect Effects 0.000 description 2
- 230000001413 cellular effect Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000013500 data storage Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 238000009776 industrial production Methods 0.000 description 2
- 238000010801 machine learning Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000005457 optimization Methods 0.000 description 2
- 238000011176 pooling Methods 0.000 description 2
- 230000000644 propagated effect Effects 0.000 description 2
- 239000004576 sand Substances 0.000 description 2
- 238000010200 validation analysis Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000010923 batch production Methods 0.000 description 1
- 230000006399 behavior Effects 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000002845 discoloration Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000003203 everyday effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000010606 normalization Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000012913 prioritisation Methods 0.000 description 1
- 230000031877 prophase Effects 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
- 238000012800 visualization Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
- G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
- G05B23/0254—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0262—Confirmation of fault detection, e.g. extra checks to confirm that a failure has indeed occurred
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
- G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
- G05B23/0281—Quantitative, e.g. mathematical distance; Clustering; Neural networks; Statistical analysis
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
- G06Q10/063—Operations research, analysis or management
- G06Q10/0639—Performance analysis of employees; Performance analysis of enterprise or organisation operations
- G06Q10/06395—Quality analysis or management
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q50/00—Information and communication technology [ICT] specially adapted for implementation of business processes of specific business sectors, e.g. utilities or tourism
- G06Q50/04—Manufacturing
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
- G06V10/82—Arrangements for image or video recognition or understanding using pattern recognition or machine learning using neural networks
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/96—Management of image or video recognition tasks
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/32—Operator till task planning
- G05B2219/32368—Quality control
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20081—Training; Learning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20084—Artificial neural networks [ANN]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30148—Semiconductor; IC; Wafer
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/06—Recognition of objects for industrial automation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Business, Economics & Management (AREA)
- Evolutionary Computation (AREA)
- Quality & Reliability (AREA)
- Automation & Control Theory (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Human Resources & Organizations (AREA)
- Artificial Intelligence (AREA)
- Multimedia (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Strategic Management (AREA)
- Economics (AREA)
- Software Systems (AREA)
- Medical Informatics (AREA)
- Databases & Information Systems (AREA)
- Computing Systems (AREA)
- Mathematical Physics (AREA)
- Educational Administration (AREA)
- Marketing (AREA)
- Data Mining & Analysis (AREA)
- Entrepreneurship & Innovation (AREA)
- Development Economics (AREA)
- General Business, Economics & Management (AREA)
- Tourism & Hospitality (AREA)
- Mathematical Optimization (AREA)
- Operations Research (AREA)
- Algebra (AREA)
- Mathematical Analysis (AREA)
- Game Theory and Decision Science (AREA)
- Probability & Statistics with Applications (AREA)
- Pure & Applied Mathematics (AREA)
- Primary Health Care (AREA)
- Life Sciences & Earth Sciences (AREA)
- Bioinformatics & Cheminformatics (AREA)
Abstract
一种分布式产品缺陷分析系统(104),用于产品制造过程中的产品缺陷分析,包括产品制造消息处理集群(201)、产品缺陷识别集群(202)、产品图像数据库(203)、客户端设备(204),其中:所述产品图像数据库(203),被配置为存储产品制造过程中产生的产品图像;所述产品制造消息处理集群(201),被配置为:根据产品制造消息,生成产品缺陷分析任务,其中,所述产品缺陷分析任务包括第一缺陷识别任务;所述产品缺陷识别集群(202),被配置为:基于所述第一缺陷识别任务,通过缺陷识别模型识别所述产品图像中的产品缺陷内容,其中,所述产品缺陷内容包括产品的缺陷类型、缺陷位置和缺陷大小中的任意一项或多项;所述客户端设备(204),被配置为输出产品缺陷识别结果。
Description
PCT国内申请,说明书已公开。
Claims (21)
- PCT国内申请,权利要求书已公开。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2019/127071 WO2021120186A1 (zh) | 2019-12-20 | 2019-12-20 | 分布式产品缺陷分析系统、方法及计算机可读存储介质 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113632099A true CN113632099A (zh) | 2021-11-09 |
CN113632099B CN113632099B (zh) | 2024-06-28 |
Family
ID=
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114418458A (zh) * | 2022-03-17 | 2022-04-29 | 深圳市爱云信息科技有限公司 | 基于数字孪生DaaS平台的工艺调参方法 |
CN114463331A (zh) * | 2022-04-12 | 2022-05-10 | 四川英创力电子科技股份有限公司 | 印制电路板aoi检修报表自动生成方法及装置 |
CN115438805A (zh) * | 2022-11-08 | 2022-12-06 | 江苏智云天工科技有限公司 | 基于工业质检领域机器学习模型的产品缺陷检测方法 |
WO2023226682A1 (zh) * | 2022-05-25 | 2023-11-30 | 京东方科技集团股份有限公司 | 一种数据处理方法、装置、服务器及存储介质 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040254752A1 (en) * | 2003-06-10 | 2004-12-16 | International Business Machines Corporation | System for identification of defects on circuits or other arrayed products |
CN108564104A (zh) * | 2018-01-09 | 2018-09-21 | 北京百度网讯科技有限公司 | 产品缺陷检测方法、装置、系统、服务器及存储介质 |
CN110059631A (zh) * | 2019-04-19 | 2019-07-26 | 中铁第一勘察设计院集团有限公司 | 接触网非接触式监测缺陷识别方法 |
CN110441312A (zh) * | 2019-07-30 | 2019-11-12 | 上海深视信息科技有限公司 | 一种基于多光谱成像的产品表面缺陷检测系统 |
US20190362490A1 (en) * | 2018-05-25 | 2019-11-28 | Beijing Baidu Netcom Science And Technology Co., Ltd. | Method and apparatus for inspecting corrosion defect of ladle |
CN110554047A (zh) * | 2019-09-06 | 2019-12-10 | 腾讯科技(深圳)有限公司 | 产品缺陷检测数据处理方法、装置、系统和设备 |
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040254752A1 (en) * | 2003-06-10 | 2004-12-16 | International Business Machines Corporation | System for identification of defects on circuits or other arrayed products |
CN108564104A (zh) * | 2018-01-09 | 2018-09-21 | 北京百度网讯科技有限公司 | 产品缺陷检测方法、装置、系统、服务器及存储介质 |
US20190362490A1 (en) * | 2018-05-25 | 2019-11-28 | Beijing Baidu Netcom Science And Technology Co., Ltd. | Method and apparatus for inspecting corrosion defect of ladle |
CN110059631A (zh) * | 2019-04-19 | 2019-07-26 | 中铁第一勘察设计院集团有限公司 | 接触网非接触式监测缺陷识别方法 |
CN110441312A (zh) * | 2019-07-30 | 2019-11-12 | 上海深视信息科技有限公司 | 一种基于多光谱成像的产品表面缺陷检测系统 |
CN110554047A (zh) * | 2019-09-06 | 2019-12-10 | 腾讯科技(深圳)有限公司 | 产品缺陷检测数据处理方法、装置、系统和设备 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114418458A (zh) * | 2022-03-17 | 2022-04-29 | 深圳市爱云信息科技有限公司 | 基于数字孪生DaaS平台的工艺调参方法 |
CN114463331A (zh) * | 2022-04-12 | 2022-05-10 | 四川英创力电子科技股份有限公司 | 印制电路板aoi检修报表自动生成方法及装置 |
WO2023226682A1 (zh) * | 2022-05-25 | 2023-11-30 | 京东方科技集团股份有限公司 | 一种数据处理方法、装置、服务器及存储介质 |
CN115438805A (zh) * | 2022-11-08 | 2022-12-06 | 江苏智云天工科技有限公司 | 基于工业质检领域机器学习模型的产品缺陷检测方法 |
CN115438805B (zh) * | 2022-11-08 | 2023-01-24 | 江苏智云天工科技有限公司 | 基于工业质检领域机器学习模型的产品缺陷检测方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20220117126A (ko) | 2022-08-23 |
EP4080406A4 (en) | 2022-12-28 |
JP7393515B2 (ja) | 2023-12-06 |
WO2021120186A1 (zh) | 2021-06-24 |
US20230153974A1 (en) | 2023-05-18 |
US11880968B2 (en) | 2024-01-23 |
EP4080406A1 (en) | 2022-10-26 |
JP2023514891A (ja) | 2023-04-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7393515B2 (ja) | 分散型製品欠陥分析システム、方法及びコンピュータ可読記憶媒体 | |
JP2020528996A (ja) | ディスプレイスクリーン品質検査方法、装置、電子機器及び記憶媒体 | |
US20210049416A1 (en) | Artificial intelligence system for inspecting image reliability | |
US20180276508A1 (en) | Automated visual information context and meaning comprehension system | |
CN110287316A (zh) | 一种告警分类方法、装置、电子设备及存储介质 | |
CN112966772A (zh) | 一种多人在线的图像半自动标注方法及系统 | |
JP7442550B2 (ja) | 推論演算装置、モデル訓練装置、及び推論演算システム | |
US11500370B2 (en) | System for predictive maintenance using generative adversarial networks for failure prediction | |
WO2021120179A1 (zh) | 产品制造消息处理方法、设备和计算机存储介质 | |
US20210281469A1 (en) | System for decomposing events that includes user interface | |
WO2023226682A1 (zh) | 一种数据处理方法、装置、服务器及存储介质 | |
US20230048386A1 (en) | Method for detecting defect and method for training model | |
CN115546218B (zh) | 置信度阈值确定方法和装置、电子设备和存储介质 | |
CN113632099B (zh) | 分布式产品缺陷分析系统、方法及计算机可读存储介质 | |
US20230195742A1 (en) | Time series prediction method for graph structure data | |
CN109597702A (zh) | 消息总线异常的根因分析方法、装置、设备及存储介质 | |
CN116340434A (zh) | 企业数据管理仪表板 | |
US20210279597A1 (en) | System for predictive maintenance using discriminant generative adversarial networks | |
US20210279596A1 (en) | System for predictive maintenance using trace norm generative adversarial networks | |
US20240220319A1 (en) | Automated visual information context and meaning comprehension system | |
CN116475081B (zh) | 一种基于云边协同的工业产品分拣控制方法、装置及系统 | |
US20220405617A1 (en) | Artificial intelligence collectors | |
US20220405676A1 (en) | Method and device for managing project by using data filtering | |
US20220405678A1 (en) | Method and device for managing project by using data pointer | |
US11238354B2 (en) | Event-based feature engineering |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant |