CN113624783A - PLC chip grade detection method - Google Patents

PLC chip grade detection method Download PDF

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Publication number
CN113624783A
CN113624783A CN202110893544.5A CN202110893544A CN113624783A CN 113624783 A CN113624783 A CN 113624783A CN 202110893544 A CN202110893544 A CN 202110893544A CN 113624783 A CN113624783 A CN 113624783A
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channel
test data
insertion loss
comparison
data
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何祺昌
林棣棚
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Anjie Core Technology Co ltd
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Anjie Core Technology Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106—General arrangement of respective parts
    • G01N2021/0112—Apparatus in one mechanical, optical or electronic block
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's

Abstract

The application discloses a PLC chip grade detection method, which comprises the following steps: firstly, obtaining a maximum insertion loss spectrum curve CH00nMAX, a minimum insertion loss spectrum curve CH00nMIN and an average insertion loss spectrum curve CH00nAVG of each channel, then obtaining PB IL test data, PDW test data, 1dB BW test data, 3dB BW test data and AX test data in the corresponding spectrum curves, comparing the PB IL test data, PDW test data, 1dB BW test data, 3dB BW test data and AX test data values of each channel, selecting PB IL comparison data, PDW comparison data, 1dB BW comparison data, 3dB BW comparison data and AX comparison data and calculating IL unif comparison data, comparing the comparison data of each chip with each comparison data value in a grade comparison data table to judge the grade of the chip, and because each type chip has the test data, the detection method has strong universality, avoiding errors.

Description

PLC chip grade detection method
Technical Field
The invention belongs to the technical field of optical communication, and particularly relates to a PLC chip grade detection method.
Background
Along with the development of 5G communication, Wavelength Division Multiplexing (WDM) products show remarkable advantages, the demand of planar optical waveguide chips (PLC) is increasing day by day, and in the chip production process, the chip grade needs to be divided.
Disclosure of Invention
Objects of the invention
In order to overcome the defects, the invention aims to provide a PLC chip grade detection method to solve the technical problems that different analysis macro templates need to be constructed, the universality is poor, and the analysis is not accurate easily after the wrong analysis macro template is selected in the conventional PLC chip grade detection method.
(II) technical scheme
In order to achieve the purpose, the technical scheme provided by the application is as follows:
in order to achieve the above object, one aspect of the present application provides the following technical solutions:
a PLC chip grade detection method comprises the following steps:
acquiring spectral curves of all channels: acquiring a maximum insertion loss spectrum curve CH00nMAX, a minimum insertion loss spectrum curve CH00nMIN, an average insertion loss spectrum curve CH00nAVG, a TM polarization state spectrum curve and a TE polarization state spectrum curve of each channel;
acquiring test data of each channel: obtaining PB IL test data, PDW test data, 1dB BW test data, 3dB BW test data and AX test data of each channel, wherein the PB IL test data are obtained based on a maximum insertion loss spectrum curve CH00nMAX of each channel, the PDW test data are obtained based on a TM polarized state spectrum curve of each channel and a TE polarized state spectrum curve of each channel, the 1dB BW test data and the 3dB BW test data are obtained based on an average insertion loss spectrum curve CH00nAVG of each channel, and the AX test data are obtained based on an average insertion loss spectrum curve CH00nAVG of each channel;
selecting chip comparison data: selecting the following test data from the obtained test data of each channel: PB IL comparison data, PDW comparison data, 1dB BW comparison data, 3dB BW comparison data and AX comparison data IL unif comparison data;
judging the grade of the chip: comparing all the selected chip comparison data with preset grade comparison parameters: comparing the PB IL comparison parameter, the PDW comparison parameter, the 1dB BW comparison parameter, the 3dB BW comparison parameter, the AX comparison parameter and the IL unif comparison parameter to obtain a chip level;
the detection method comprises the following steps: firstly, obtaining a maximum insertion loss spectrum curve CH00nMAX, a minimum insertion loss spectrum curve CH00nMIN and an average insertion loss spectrum curve CH00nAVG of each channel, then obtaining PB IL test data, PDW test data, 1dB BW test data, 3dB BW test data and AX test data in the corresponding spectrum curves, then comparing the PB IL test data, PDW test data, 1dB BW test data, 3dB BW test data and AX test data values of each channel, selecting PB IL comparison data, PDW comparison data, 1dB BW comparison data, 3dB BW comparison data and AX comparison data and calculating IL unif comparison data, comparing each chip comparison data with each pair of comparison data values in a grade comparison data table to judge the grade of the chip, thus realizing the grade detection of the chip, and each type of chips has the test data, the detection method is suitable for different types of chips, different detection and analysis templates are not required to be selected during detection, the universality is strong, errors are avoided, and the analysis accuracy is ensured.
In some embodiments, obtaining the maximum insertion loss spectral curve CH00nMAX for each channel comprises: and sequentially enabling each wavelength in a preset range to enter each channel at preset different incidence angles, and connecting the maximum insertion loss values obtained under each wavelength to form a maximum insertion loss spectral curve CH00 nMAX.
In some embodiments, obtaining the minimum insertion loss spectral curve CH00nMIN for each channel comprises: and sequentially enabling each wavelength in a preset range to enter each channel at preset different incidence angles, and connecting the minimum insertion loss values obtained under each wavelength to form a minimum insertion loss spectral curve CH00 nMIN.
In some embodiments, obtaining the average insertion loss spectrum curve CH00nAVG comprises: and sequentially enabling each wavelength in a preset range to enter each channel at preset different incidence angles, and connecting the average values of all the insertion loss values obtained under each wavelength to form an average insertion loss spectrum curve CH00 nAVG.
In some embodiments, obtaining the TM polarization state spectral curve and the TE polarization state spectral curve comprises:
connecting the first half section of the minimum insertion loss spectrum curve CH00nMIN and the second half section of the maximum insertion loss spectrum curve CH00nMAX to form a TM polarized spectrum curve;
the middle wavelength of the incident wavelength is taken as a central point, and the front half section of the maximum insertion loss spectrum curve CH00nMAX and the rear half section of the minimum insertion loss spectrum curve CH00nMIN are connected to form a TE polarization state spectrum curve.
In some embodiments, obtaining PB IL test data for each channel comprises: in the maximum insertion loss spectrum curve choonnax of each channel, the maximum insertion loss value is selected as PB IL test data of each channel within the ITU Passband range.
In some embodiments, obtaining PDW test data for each channel comprises: respectively calculating the central wavelength lambda of the TM polarized spectral curve of each channelCWL_TMAnd center wavelength lambda of TE polarization state spectral curve of each channelCWL_TEThe central wavelength lambda in the same channelCWL_TMWith a central wavelength λCWL_TEAnd performing difference to obtain PDW test data of each channel.
In some embodiments, obtaining 1dB BW test data for each lane comprises: in the average insertion loss spectrum curve CH00nAVG of each channel, the difference is made between two wavelengths corresponding to two points of intersection of the average insertion loss spectrum curve CH00nAVG of the corresponding channel after the peak wavelength is reduced by 1dB, and 1dB BW test data of each channel is obtained;
acquiring 3dB BW test data for each channel includes: in the average insertion loss spectrum curve CH00nAVG of each channel, the difference between two wavelengths corresponding to two points intersected with the average insertion loss spectrum curve CH00nAVG of the corresponding channel after the peak wavelength is reduced by 3dB is used for calculating the 3dB BW test data of each channel.
In some embodiments, obtaining AX test data for each channel comprises: in the average insertion loss spectrum CH00nAVG of each channel, the AX test data of each channel is obtained by taking the difference between the minimum insertion loss corresponding to the average insertion loss spectrum CH00nAVG of the current channel falling into the range of the ITU Passband of the adjacent channel and the maximum insertion loss corresponding to the current channel in the range of the ITU Passband of the current channel.
In some embodiments, the center wavelength λ is determinedCWL_TMCentral wavelength lambdaCWL_TEWhen the Peak insertion loss Peak IL of the corresponding spectrum is reduced by a corresponding height and the wavelength corresponding to the point intersected with the corresponding spectrum curve falls in the interval between two adjacent wavelengths of the incident wavelength, the wavelength-insertion loss relation formula is obtained by taking two value taking points on the corresponding spectrum curve: λ ═ aIL (n) + b, and the insertion loss value corresponding to the intersection is substituted into the wavelength-insertion loss relational expression to obtain the wavelength corresponding to the intersection.
In some embodiments, selecting the chip comparison data comprises:
selecting the PB IL test data with the minimum value from the PB IL test data of each channel as PB IL comparison data;
selecting PDW test data with the largest value from the PDW test data of each channel as PDW comparison data;
selecting 1dB BW test data with the minimum value from the 1dB BW test data of each channel as 1dB BW comparison data;
selecting 3dB BW test data with the minimum value from the 3dB BW test data of each channel as 3dB BW comparison data;
selecting the AX test data with the minimum value from the AX test data of each channel as AX comparison data;
in the PB IL test data of each channel, the maximum PB IL test data and the minimum PB IL test data are subjected to difference, and IL unif comparison data are obtained.
In some embodiments, the predetermined grade alignment parameters include:
the values of the alignment parameters of the first grade are: PB IL-4, PDW-0.03, 1dB BW-0.41, 3dB BW-0.61, AX-28, IL-unif-1;
the values of the second-level alignment parameters are: PB IL-4.5, PDW-0.04, 1dB BW-0.405, 3dB BW-0.605, AX-27.5, IL unif-1;
the third level of values of the respective alignment parameters were: PB IL-5, PDW-0.045, 1dB BW-0.39, 3dB BW-0.59, AX-25, IL unif-1.2.
In some embodiments, obtaining the chip rank comprises: PB IL test data, IL unif test data, 1dB broadband test data, 3dB broadband test data and AX test data need to be respectively greater than IL contrast data, 1dB broadband contrast data, 3dB broadband contrast data and AX contrast data, and IL unif test data and PDW test data need to be respectively less than IL unif contrast data and PDW contrast data.
Another aspect of the present application provides a PLC chip level detection system, configured to operate the PLC chip level detection method, where the system includes:
the spectrum curve acquisition module is used for acquiring a maximum insertion loss spectrum curve CH00nMAX, a minimum insertion loss spectrum curve CH00nMIN and an average insertion loss spectrum curve CH00nAVG corresponding to each channel;
the test data acquisition module is used for acquiring PB IL test data, PDW test data, 1dB BW test data, 3dB BW test data and AX test data of each channel, wherein the PB IL test data are acquired based on a maximum insertion loss spectrum curve CH00nMAX of each channel, the PDW test data are acquired based on a TM polarization state spectrum curve of each channel and a TE polarization state spectrum curve of each channel, the 1dB BW test data and the 3dB BW test data are acquired based on an average insertion loss spectrum curve CH00nAVG of each channel, and the AX test data are acquired based on an average insertion loss spectrum curve CH00nAVG of each channel;
the chip comparison data selection module is used for selecting the following test data of each channel: PB IL comparison data, PDW comparison data, 1dB BW comparison data, 3dB BW comparison data and AX comparison data IL unif comparison data;
the chip grade judging module is used for respectively comparing all the selected chip comparison data with preset grade comparison parameters: and comparing the PB IL comparison parameter, the PDW comparison parameter, the 1dB BW comparison parameter, the 3dB BW comparison parameter, the AX comparison parameter and the IL unif comparison parameter to obtain the chip level.
In some embodiments, the spectral curve acquisition module comprises: and the maximum insertion loss spectrum curve CH00nMAX acquisition submodule is used for connecting the maximum insertion loss values obtained under each wavelength when each wavelength in a preset range is sequentially incident to each channel at preset different incidence angles to form a maximum insertion loss spectrum curve CH00 nMAX.
In some embodiments, the spectral curve acquisition module comprises: and the minimum insertion loss spectrum curve CH00nMIN acquisition submodule is used for connecting the minimum insertion loss values obtained under each wavelength when each wavelength in a preset range is sequentially incident to each channel at preset different incidence angles to form the minimum insertion loss spectrum curve CH00 nMIN.
In some embodiments, the spectral curve acquisition module comprises: and the average insertion loss spectral curve CH00nAVG acquisition submodule is used for connecting the average values of all the insertion loss values obtained under each wavelength when each wavelength in a preset range is sequentially incident to each channel at preset different incidence angles to form the average insertion loss spectral curve CH00 nAVG.
In some embodiments, the spectral curve acquisition module comprises:
the TM polarized spectral curve acquisition submodule is used for connecting the first half section of the minimum insertion loss spectral curve CH00nMIN and the second half section of the maximum insertion loss spectral curve CH00nMAX to form a TM polarized spectral curve by taking the middle wavelength of the incident wavelength as a central point;
and the TE polarization state spectral curve acquisition submodule is used for connecting the first half section of the maximum insertion loss spectral curve CH00nMAX and the second half section of the minimum insertion loss spectral curve CH00nMIN by taking the middle wavelength of the incident wavelength as a central point to form the TE polarization state spectral curve.
In some embodiments, the test data acquisition module comprises: and the PB IL test data acquisition submodule is used for selecting the maximum insertion loss value as PB IL test data of each channel in the ITU passage band range in the maximum insertion loss spectrum curve CHOOnMAX of each channel after the maximum insertion loss spectrum curve CH00nMAX is acquired by the maximum insertion loss spectrum curve CH00nMAX acquisition submodule.
In some embodiments, the test data acquisition module comprises: a PDW test data acquisition submodule for respectively calculating the central wavelength lambda of the TM polarized spectrum curve of each channel after the TM polarized spectrum curve acquisition submodule and the TE polarized spectrum curve acquisition submodule acquire the TM polarized spectrum curve and the TE polarized spectrum curveCWL_TMAnd center wavelength lambda of TE polarization state spectral curve of each channelCWL_TEThe central wavelength lambda in the same channelCWL_TMWith a central wavelength λCWL_TEAnd performing difference to obtain PDW test data of each channel.
In some embodiments, the test data acquisition module comprises:
the 1dB BW test data acquisition submodule is used for acquiring and acquiring the average insertion loss spectral curvature CH00nAVG in the average insertion loss spectral curvature CH00nAVG acquisition submodule, and then subtracting two wavelengths corresponding to two crossed points of the average insertion loss spectral curvature CH00nAVG of the corresponding channel after the peak wavelength is reduced by 1dB in the average insertion loss spectral curvature CH00nAVG of each channel to obtain 1dB BW test data of each channel;
and the 3dB BW test data acquisition submodule is used for acquiring the average insertion loss spectral curvature CH00nAVG in the average insertion loss spectral curvature CH00nAVG acquisition submodule, and then subtracting two wavelengths corresponding to two crossed points of the average insertion loss spectral curvature CH00nAVG of the corresponding channel after the peak wavelength is reduced by 3dB in the average insertion loss spectral curvature CH00nAVG of each channel to obtain the 3dB BW test data of each channel.
In some embodiments, the test data acquisition module comprises: and the AX test data acquisition submodule is used for acquiring the average insertion loss spectrum curvature CH00nAVG in the average insertion loss spectrum curvature CH00nAVG acquisition submodule, then in the average insertion loss spectrum curvature CH00nAVG of each channel, calculating the AX test data of each channel by taking the difference between the average insertion loss spectrum curvature CH00nAVG of the current channel and the minimum insertion loss corresponding to the adjacent channel ITU Passband range and the maximum insertion loss corresponding to the current channel in the ITU Passband range of the current channel.
In some embodiments, further comprising: a wavelength calculation module for calculating the center wavelength λCWL_TMCentral wavelength lambdaCWL_TEWhen the Peak insertion loss Peak IL of the corresponding spectrum is reduced by a corresponding height and the wavelength corresponding to the point intersected with the corresponding spectrum curve falls in the interval between two adjacent wavelengths of the incident wavelength, the wavelength-insertion loss relation formula is obtained by taking two value taking points on the corresponding spectrum curve: λ ═ aIL (n) + b, and the insertion loss value corresponding to the intersection is substituted into the wavelength-insertion loss relational expression to obtain the wavelength corresponding to the intersection.
In some embodiments, the chip comparison data selecting module includes:
the PB IL comparison data selection submodule is used for selecting PDW test data with the largest value from the PDW test data of each channel as PDW comparison data;
the 1dB BW comparison data selection submodule is used for selecting the 1dB BW test data with the minimum value from the 1dB BW test data of each channel as the 1dB BW comparison data;
the 3dB BW comparison data selection submodule is used for selecting the 3dB BW test data with the minimum value from the 3dB BW test data of each channel as the 3dB BW comparison data;
the AX comparison data selection submodule is used for selecting the AX test data with the minimum value from the AX test data of each channel as AX comparison data;
and the IL unif comparison data selection submodule is used for subtracting the maximum PB IL test data from the minimum PB IL test data in the PB IL test data of each channel to obtain IL unif comparison data.
This application still provides one more aspect with a PLC chip grade check out test set, includes: the system comprises a memory, a processor and a computer program stored on the memory and executable on the processor, the computer program being executed by the processor to implement the steps of the PLC chip level detection method.
Yet another aspect of the present application is a computer-readable storage medium having a PLC chip level detection program stored thereon, the PLC chip level detection program being executed by a processor to implement the steps of the PLC chip level detection method.
Drawings
FIG. 1 is an analysis diagram of PB IL test data;
FIG. 2 shows the calculation of the center wavelength λCWL_TMOr center wavelength λCWL_TEAn analytical plot of wavelength;
FIG. 3 is an analysis diagram of finding 1dB BW test data or 3dB BW test data;
FIG. 4 is an analysis of AX test data;
FIG. 5 is a plot of the TM and TE polarization spectra;
FIG. 6 is a linear equation of a wavelength-insertion loss relationship;
fig. 7 is a graph of the maximum insertion loss spectrum curve CH00nMAX, the minimum insertion loss spectrum curve CH00nMIN, and the average insertion loss spectrum curve CH00nAVG in the 1 st channel.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail with reference to the accompanying drawings in conjunction with the following detailed description. It should be understood that the description is intended to be exemplary only, and is not intended to limit the scope of the present invention. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present invention.
The invention provides a PLC chip grade detection method on one hand, which comprises the following steps:
step one, acquiring spectral curves of all channels:
acquiring a maximum insertion loss spectrum curve CH00nMAX, a minimum insertion loss spectrum curve CH00nMIN, an average insertion loss spectrum curve CH00nAVG, a TM polarization state spectrum curve and a TE polarization state spectrum curve of each channel, specifically:
the maximum insertion loss spectral curve CH00nMAX is: sequentially enabling each wavelength in a preset range to enter each channel at preset different incidence angles, and connecting the maximum insertion loss values obtained under each wavelength to form a maximum insertion loss spectral curve CH00 nMAX;
the minimum insertion loss spectral curve CH00nMIN is: sequentially enabling each wavelength in a preset range to enter each channel at preset different incidence angles, and connecting the minimum insertion loss values obtained under each wavelength to form a minimum insertion loss spectral curve CH00 nMIN;
the average insertion loss spectrum CH00nAVG is: sequentially enabling each wavelength in a preset range to enter each channel at preset different incidence angles, and connecting the average values of all insertion loss values obtained under each wavelength to form an average insertion loss spectral curve CH00 nAVG;
the TM polarization spectral curve is: taking the middle wavelength in the predetermined range as a boundary, connecting the first half of the minimum insertion loss spectrum curve CH00nMIN and the second half of the maximum insertion loss spectrum curve CH00nMAX to obtain a TM polarized spectrum curve, as shown in FIG. 5;
the TE polarization state spectrum curve is: connecting the first half of the maximum insertion loss spectrum curve CH00nMAX and the second half of the minimum insertion loss spectrum curve CH00nMIN by taking the middle wavelength in a preset range as a boundary to obtain a TE polarization state spectrum curve;
specifically, fig. 7 shows three spectral curves in total, the abscissa indicates a predetermined range of wavelengths, the ordinate indicates an insertion loss value, the ordinate extends upward, and the insertion loss value gradually decreases, specifically, the uppermost spectral curve in the graph is the minimum insertion loss spectral curve CH00nMIN, the lowermost spectral curve in the graph is the maximum insertion loss spectral curve CH00nMAX, and the average insertion loss spectral curve CH00nAVG is located therebetween;
fig. 5 shows three spectral curves in total, the curve with a circle is a minimum insertion loss spectral curve CH00nMIN, the curve with a square is a maximum insertion loss spectral curve CH00nMAX, the bold dotted line is a TM spectral curve, and the wavy line is a TE spectral curve;
step two, acquiring test data of each channel:
obtaining PB IL test data of each channel: in the maximum insertion loss spectrum curve choonnax of each channel, in the ITU Passband range, the maximum insertion loss value is selected as PB IL test data of each channel, as shown in fig. 1;
obtaining PDW measurements for each channelTest data: respectively calculating the central wavelength lambda of the TM polarized spectral curve of each channelCWL_TMAnd center wavelength lambda of TE polarization state spectral curve of each channelCWL_TEThe central wavelength lambda in the same channelCWL_TMWith a central wavelength λCWL_TETaking difference to obtain PDW test data of each channel, wherein the central wavelength is shown in figure 2;
acquiring 1dB BW test data of each channel: in the average insertion loss spectrum curve CH00nAVG of each channel, the difference between two wavelengths corresponding to two points intersected with the average insertion loss spectrum curve CH00nAVG of the corresponding channel is made after the peak wavelength is reduced by 1dB, and 1dB BW test data of each channel is obtained (as shown in figure 3);
acquiring 3dB BW test data of each channel: in the average insertion loss spectrum curve CH00nAVG of each channel, the difference between two wavelengths corresponding to two points intersected with the average insertion loss spectrum curve CH00nAVG of the corresponding channel is made after the peak wavelength is reduced by 3dB, and 3dB BW test data of each channel is obtained (as shown in figure 3);
AX test data for each channel were acquired: in the average insertion loss spectrum curve CH00nAVG of each channel, calculating AX test data (as shown in fig. 4) of each channel by taking the difference between the minimum insertion loss corresponding to the average insertion loss spectrum curve CH00nAVG of the current channel falling within the range of the ITU Passband of the adjacent channel and the maximum insertion loss corresponding to the current channel within the range of the ITU Passband of the current channel;
selecting chip comparison data:
selecting the PB IL test data with the minimum value from the PB IL test data of each channel as PB IL comparison data;
selecting PDW test data with the largest value from the PDW test data of each channel as PDW comparison data;
selecting 1dB BW test data with the minimum value from the 1dB BW test data of each channel as 1dB BW comparison data;
selecting 3dB BW test data with the minimum value from the 3dB BW test data of each channel as 3dB BW comparison data;
selecting the AX test data with the minimum value from the AX test data of each channel as AX comparison data;
in the PB IL test data of each channel, the maximum PB IL test data and the minimum PB IL test data are subjected to difference, and IL unif comparison data are obtained;
step four, judging the grade of the chip:
comparing each comparison data of the selected comparison channel with the preset value of each grade comparison parameter to obtain the grade of the chip,
specifically, the alignment process is as follows:
PB IL comparison data needs to be larger than PB IL comparison parameters;
the IL unif comparison data is required to be smaller than the IL unif comparison parameters;
PDW comparison data is smaller than PDW comparison parameters;
1dB broadband comparison data needs to be larger than 1dB broadband comparison parameters;
3dB broadband comparison data needs to be larger than 3dB broadband comparison parameters;
the AX comparison data is required to be larger than the AX comparison parameters;
specifically, the values of the alignment parameters in the level alignment data table are as follows:
the values of the alignment parameters of the first grade are: PB IL-4, IL unif-1, PDW-0.03, 1dB BW-0.41, 3dB BW-0.61, AX-28;
the values of the second-level alignment parameters are: PB IL-4.5, IL unif-1, PDW-0.04, 1dB BW-0.405, 3dB BW-0.605, AX-27.5;
the third level of values of the respective alignment parameters were: PB IL-5, IL unif-1.2, PDW-0.045, 1dB BW-0.39, 3dB BW-0.59, and AX-25.
The comparison parameters of each grade are arranged into a table as follows:
Grade PB IL IL unif PDW 1dB BW 3dB BW Ax
q (first grade) -4 1 0.03 0.41 0.61 28
N (second grade) -4.5 1 0.04 0.405 0.605 27.5
V (third grade) -5 1.2 0.045 0.39 0.59 25
Table 1
Specifically, ITU Passband is the standard center wavelength of each channel specified by the international telecommunications union.
Specifically, the insertion loss value is obtained by testing through a transmitter and a power receiver, the incident wavelength range is preset, a plurality of spectral curves corresponding to each channel are drawn through the insertion loss value and the incident wavelength range, a plurality of test data of each channel are obtained in different spectral curves, 6 test data are obtained in each channel, 6 test data sets are formed in all the channels, corresponding test data are selected in each set to serve as comparison data, 6 comparison data are finally selected, the 6 selected comparison data are respectively compared with 6 comparison parameters in a comparison table, and the grade of a chip is obtained.
When test data are acquired, different wavelengths in a predetermined range need to be incident into each channel at different incidence angles, specifically, the same wavelength is incident into the channel at different incidence angles to obtain a plurality of different insertion loss values, the maximum insertion loss value and the minimum insertion loss value of each channel are obtained from the plurality of different insertion loss values, and the average insertion loss value is obtained by averaging the plurality of insertion loss values.
Specifically, referring to table 2, taking an example that a certain wavelength is incident to one channel 1, the acquisition of the test data is illustrated:
the starting wavelength 1527nm is incident into the channel 1 at different angles (for example, alpha, beta and theta degrees), and the insertion loss values at three angles are obtained: -45.248dB, -58.614dB, -40.327dB, selecting the minimum insertion loss value-40.327 dB under the wavelength of 1527nm, the maximum insertion loss value-58.614 dB and calculating the average value of the three insertion loss values to obtain-48.063 dB, by analogy, the minimum insertion loss value, the maximum insertion loss value and the average value of other wavelengths in the preset range which are incident into the channel 1 are obtained to obtain the minimum insertion loss value, the maximum insertion loss value and the average insertion loss value of the channel 1 at each wavelength in the preset range, then drawing a minimum insertion loss spectral curve CH001MIN based on the relation between each wavelength and the corresponding minimum insertion loss value, drawing a maximum insertion loss spectral curve CH001MAX based on the relation between each wavelength and the corresponding maximum insertion loss value, drawing an average insertion loss spectral curve CH001AVG based on the relation between each wavelength and the corresponding average insertion loss value, then, based on the different spectral curves, all the test data corresponding to channel 1 are obtained by sorting (as shown in table 3). Specifically, the method for obtaining a plurality of spectral curves by other channels is the same, and is not described herein again.
Figure BDA0003196941490000131
Figure BDA0003196941490000141
Figure BDA0003196941490000151
Table 2
channel PB IL PDW 1dB BW 3dB BW Ax
1 -3.374 0.027 0.434 0.622 31.332
2 -3.318 0.025 0.441 0.625 31.027
3 -3.369 0.024 0.441 0.626 31.009
......
Table 3
Referring to table 1, table 2 and table 3, taking 3 channels as an example, the chip comparison data is selected as follows:
comparing PB IL test data, PDW test data, 1dB BW test data, 3dB BW test data and AX test data in the three channels, specifically, in the three channels, in the PB IL test data, since the value of-3.374 is the smallest, with-3.374 as PB IL alignment data, in the PDW test data, since 0.027 is the maximum value and 0.027 is taken as PDW comparison data, in the 1dB BW test data, since 0.441 is the minimum value, 0.441 is used as 1dB BW comparison data, in the 3dB BW test data, since 0.622 is the minimum value, 0.622 is used as 3dB BW comparison data, in the AX test data, since 31.009 is the minimum value, 31.009 is used as AX alignment data, and 0.056 is obtained as IL unif alignment data by subtracting-3.374 from-3.318 the maximum value PB IL ═ 3.318, each alignment data of the final chip is: PB IL-3.374, IL unef-0.056, PDW-0.027, 1dB BW-0.441, 3dB BW-0.622, ax-31.009;
the specific process of judging the chip grade comprises the following steps:
the test data of the chips obtained above were compared with the level alignment parameters in the comparison table (Table 3), and the chip level was Q (first level) because of-3.374 > -4, 0.056<1, 0.027<0.03, 0.441>0.41, 0.622>0.61, 31.009> 28.
Specifically, the center wavelength λ is obtainedCWL_TMCentral wavelength lambdaCWL_TEIn the case of wavelength, 1dB BW test data, and 3dB BW test data, if the Peak insertion loss Peak IL of the corresponding spectrum drops by the corresponding height, the wavelength corresponding to the point of intersection with the corresponding spectrum curve falls between the adjacent incident wavelengths, the wavelength corresponding to the intersection cannot be directly known at this time, and the 1dB BW test data, the 3dB BW test data, and the PDW test data cannot be obtained, at this time, the wavelength corresponding to the intersection needs to be solved through a wavelength-insertion loss equation set, for example, when the wavelength corresponding to the intersection falls between 1520-1520.005 wavelengths, at this time, the corresponding wavelength needs to be solved through the equation set.
More specifically, referring to fig. 6, the wavelength-insertion loss equation is shown by substituting the first value points (λ 1, IL (1)) and the second value points (λ 2, IL (2)) into λ ═ al (n) + b:
for example, when 1dB BW test data in channel 1 is found, if the intersection point falls between adjacent incident wavelengths (1527 to 1527.005), the first value-taking point (1527, -48.063) and the second value-taking point (1527.005, -48.26) are substituted into λ ═ ail (n) + b, and the equation set is listed:
λ1＝aIL(1)+b；
λ2＝aIL(2)+b；
then, a first constant a and a second constant b are solved;
obtaining a first constant a and a second constant b, and substituting an insertion loss value IL (3) obtained by subtracting 1dB BW from the average insertion loss spectrum curve CH00nAVG in the channel 1 into λ 3 ═ aIL (3) + b to obtain a wavelength λ 3 corresponding to the intersection point;
by analogy, the corresponding central wavelength lambda is obtainedCWL_TMCentral wavelength lambdaCWL_TEWavelength and 3dB BW test data.
Another aspect of the present application provides a PLC chip level detection system, configured to operate the PLC chip level detection method, where the system includes:
the spectrum curve acquisition module is used for acquiring a maximum insertion loss spectrum curve CH00nMAX, a minimum insertion loss spectrum curve CH00nMIN and an average insertion loss spectrum curve CH00nAVG corresponding to each channel;
the test data acquisition module is used for acquiring PB IL test data, PDW test data, 1dB BW test data, 3dB BW test data and AX test data of each channel, wherein the PB IL test data are acquired based on a maximum insertion loss spectrum curve CH00nMAX of each channel, the PDW test data are acquired based on a TM polarization state spectrum curve of each channel and a TE polarization state spectrum curve of each channel, the 1dB BW test data and the 3dB BW test data are acquired based on an average insertion loss spectrum curve CH00nAVG of each channel, and the AX test data are acquired based on an average insertion loss spectrum curve CH00nAVG of each channel;
the chip comparison data selection module is used for selecting the following test data of each channel: PB IL comparison data, PDW comparison data, 1dB BW comparison data, 3dB BW comparison data and AX comparison data IL unif comparison data;
the chip grade judging module is used for respectively comparing all the selected chip comparison data with preset grade comparison parameters: and comparing the PB IL comparison parameter, the PDW comparison parameter, the 1dB BW comparison parameter, the 3dB BW comparison parameter, the AX comparison parameter and the IL unif comparison parameter to obtain the chip level.
Specifically, the spectral curve acquisition module includes: and the maximum insertion loss spectrum curve CH00nMAX acquisition submodule is used for connecting the maximum insertion loss values obtained under each wavelength when each wavelength in a preset range is sequentially incident to each channel at preset different incidence angles to form a maximum insertion loss spectrum curve CH00 nMAX.
Specifically, the spectral curve acquisition module includes: and the minimum insertion loss spectrum curve CH00nMIN acquisition submodule is used for connecting the minimum insertion loss values obtained under each wavelength when each wavelength in a preset range is sequentially incident to each channel at preset different incidence angles to form the minimum insertion loss spectrum curve CH00 nMIN.
Specifically, the spectral curve acquisition module includes: and the average insertion loss spectral curve CH00nAVG acquisition submodule is used for connecting the average values of all the insertion loss values obtained under each wavelength when each wavelength in a preset range is sequentially incident to each channel at preset different incidence angles to form the average insertion loss spectral curve CH00 nAVG.
Specifically, the spectral curve acquisition module includes:
the TM polarized spectral curve acquisition submodule is used for connecting the first half section of the minimum insertion loss spectral curve CH00nMIN and the second half section of the maximum insertion loss spectral curve CH00nMAX to form a TM polarized spectral curve by taking the middle wavelength of the incident wavelength as a central point;
and the TE polarization state spectral curve acquisition submodule is used for connecting the first half section of the maximum insertion loss spectral curve CH00nMAX and the second half section of the minimum insertion loss spectral curve CH00nMIN by taking the middle wavelength of the incident wavelength as a central point to form the TE polarization state spectral curve.
Specifically, the test data acquisition module includes: and the PB IL test data acquisition submodule is used for selecting the maximum insertion loss value as PB IL test data of each channel in the ITU passage band range in the maximum insertion loss spectrum curve CHOOnMAX of each channel after the maximum insertion loss spectrum curve CH00nMAX is acquired by the maximum insertion loss spectrum curve CH00nMAX acquisition submodule.
Specifically, the test data acquisition module includes: a PDW test data acquisition submodule for acquiring the TM polarized spectral curve acquisition submodule and the TE polarized spectral curve acquisition submoduleRespectively calculating the central wavelength lambda of the TM polarized spectrum curve of each channel after the TM polarized spectrum curve and the TE polarized spectrum curveCWL_TMAnd center wavelength lambda of TE polarization state spectral curve of each channelCWL_TEThe central wavelength lambda in the same channelCWL_TMWith a central wavelength λCWL_TEAnd performing difference to obtain PDW test data of each channel.
Specifically, the test data acquisition module includes:
the 1dB BW test data acquisition submodule is used for acquiring and acquiring the average insertion loss spectral curvature CH00nAVG in the average insertion loss spectral curvature CH00nAVG acquisition submodule, and then subtracting two wavelengths corresponding to two crossed points of the average insertion loss spectral curvature CH00nAVG of the corresponding channel after the peak wavelength is reduced by 1dB in the average insertion loss spectral curvature CH00nAVG of each channel to obtain 1dB BW test data of each channel;
and the 3dB BW test data acquisition submodule is used for acquiring the average insertion loss spectral curvature CH00nAVG in the average insertion loss spectral curvature CH00nAVG acquisition submodule, and then subtracting two wavelengths corresponding to two crossed points of the average insertion loss spectral curvature CH00nAVG of the corresponding channel after the peak wavelength is reduced by 3dB in the average insertion loss spectral curvature CH00nAVG of each channel to obtain the 3dB BW test data of each channel.
Specifically, the test data acquisition module includes: and the AX test data acquisition submodule is used for acquiring the average insertion loss spectrum curvature CH00nAVG in the average insertion loss spectrum curvature CH00nAVG acquisition submodule, then in the average insertion loss spectrum curvature CH00nAVG of each channel, calculating the AX test data of each channel by taking the difference between the average insertion loss spectrum curvature CH00nAVG of the current channel and the minimum insertion loss corresponding to the adjacent channel ITU Passband range and the maximum insertion loss corresponding to the current channel in the ITU Passband range of the current channel.
Specifically, still include: a wavelength calculation module for calculating the center wavelength λCWL_TMCentral wavelength lambdaCWL_TEWhen the wavelength, the 1dB BW test data and the 3dB BW test data are tested, if the Peak insertion loss Peak IL of the corresponding spectrum is reduced by the corresponding height, the wavelength corresponding to the point which is intersected with the curve of the corresponding spectrum falls on two adjacent incident wavelengthsAnd when the interval between the wavelengths is within the interval, two value points on the corresponding spectrum curve are taken to obtain a wavelength-insertion loss relation: λ ═ aIL (n) + b, and the insertion loss value corresponding to the intersection is substituted into the wavelength-insertion loss relational expression to obtain the wavelength corresponding to the intersection.
Specifically, the chip comparison data selection module includes:
the PB IL comparison data selection submodule is used for selecting PDW test data with the largest value from the PDW test data of each channel as PDW comparison data;
the 1dB BW comparison data selection submodule is used for selecting the 1dB BW test data with the minimum value from the 1dB BW test data of each channel as the 1dB BW comparison data;
the 3dB BW comparison data selection submodule is used for selecting the 3dB BW test data with the minimum value from the 3dB BW test data of each channel as the 3dB BW comparison data;
the AX comparison data selection submodule is used for selecting the AX test data with the minimum value from the AX test data of each channel as AX comparison data;
and the IL unif comparison data selection submodule is used for subtracting the maximum PB IL test data from the minimum PB IL test data in the PB IL test data of each channel to obtain IL unif comparison data.
This application still provides one more aspect with a PLC chip grade check out test set, includes: the system comprises a memory, a processor and a computer program stored on the memory and executable on the processor, the computer program being executed by the processor to implement the steps of the PLC chip level detection method.
Yet another aspect of the present application is a computer-readable storage medium having a PLC chip level detection program stored thereon, the PLC chip level detection program being executed by a processor to implement the steps of the PLC chip level detection method.
It is to be understood that the above-described embodiments of the present invention are merely illustrative of or explaining the principles of the invention and are not to be construed as limiting the invention. Therefore, any modification, equivalent replacement, improvement and the like made without departing from the spirit and scope of the present invention should be included in the protection scope of the present invention. Further, it is intended that the appended claims cover all such variations and modifications as fall within the scope and boundaries of the appended claims or the equivalents of such scope and boundaries.

Claims (10)

1. A PLC chip grade detection method is characterized by comprising the following steps:
acquiring spectral curves of all channels: acquiring a maximum insertion loss spectrum curve CH00nMAX, a minimum insertion loss spectrum curve CH00nMIN, an average insertion loss spectrum curve CH00nAVG, a TM polarization state spectrum curve and a TE polarization state spectrum curve of each channel;
acquiring test data of each channel: obtaining PB IL test data, PDW test data, 1dB BW test data, 3dB BW test data and AX test data of each channel, wherein the PB IL test data are obtained based on a maximum insertion loss spectrum curve CH00nMAX of each channel, the PDW test data are obtained based on a TM polarization state spectrum curve of each channel and a TE polarization state spectrum curve of each channel, the 1dB BW test data and the 3dB BW test data are obtained based on an average insertion loss spectrum curve CH00nAVG of each channel, and the AX test data are obtained based on an average insertion loss spectrum curve CH00nAVG of each channel;
selecting chip comparison data: selecting the following test data from the obtained test data of each channel: PB IL comparison data, PDW comparison data, 1dB BW comparison data, 3dB BW comparison data, AX comparison data and IL unif comparison data;
judging the grade of the chip: and respectively comparing all the selected comparison data with preset grade comparison parameters: and comparing the PB IL comparison parameter, the PDW comparison parameter, the 1dB BW comparison parameter, the 3dB BW comparison parameter, the AX comparison parameter and the IL unif comparison parameter to obtain the chip level.
2. The PLC chip level detection method according to claim 1, wherein the acquiring the maximum insertion loss spectral curve CH00nMAX of each channel includes: sequentially enabling each wavelength in a preset range to enter each channel at preset different incidence angles, and connecting the maximum insertion loss values obtained under each wavelength to form a maximum insertion loss spectral curve CH00 nMAX;
the acquiring of the minimum insertion loss spectral curve CH00nMIN of each channel comprises the following steps: sequentially enabling each wavelength in a preset range to enter each channel at preset different incidence angles, and connecting the minimum insertion loss values obtained under each wavelength to form a minimum insertion loss spectral curve CH00 nMIN;
obtaining the average insertion loss spectrum curve CH00nAVG comprises the following steps: and sequentially enabling each wavelength in a preset range to enter each channel at preset different incidence angles, and connecting the average values of all the insertion loss values obtained under each wavelength to form an average insertion loss spectrum curve CH00 nAVG.
3. The PLC chip level detection method according to claim 2, wherein the acquiring the TM polarization spectrum curve and the TE polarization spectrum curve includes: connecting the first half section of the minimum insertion loss spectrum curve CH00nMIN and the second half section of the maximum insertion loss spectrum curve CH00nMAX by taking the middle wavelength of the incident wavelength as a central point to form the TM polarized spectrum curve;
and connecting the first half section of the maximum insertion loss spectrum curve CH00nMAX and the second half section of the minimum insertion loss spectrum curve CH00nMIN by taking the middle wavelength of the incident wavelength as a central point to form the TE polarization state spectrum curve.
4. The PLC chip level detection method of claim 3, wherein the obtaining PB IL test data of each channel comprises: in the maximum insertion loss spectrum curve CH00nMAX of each channel, the maximum insertion loss value was selected as PB IL test data of each channel within the ITU Passband range.
5. The PLC chip level detection method of claim 4, wherein the obtaining PDW test data of each channel comprises: respectively calculating the central wavelength lambda of the TM polarized spectral curve of each channelCWL_TMAnd center wavelength lambda of TE polarization state spectral curve of each channelCWL_TEThe central wavelength lambda in the same channelCWL_TMWith a central wavelength λCWL_TEAnd performing difference to obtain PDW test data of each channel.
6. The PLC chip level detection method of claim 5, wherein the obtaining 1dB BW test data for each channel comprises: in the average insertion loss spectrum curve CH00nAVG of each channel, the difference is made between two wavelengths corresponding to two points of intersection of the average insertion loss spectrum curve CH00nAVG of the corresponding channel after the peak wavelength is reduced by 1dB, and 1dB BW test data of each channel is obtained;
the acquiring the 3dB BW test data of each channel includes: in the average insertion loss spectrum curve CH00nAVG of each channel, the difference between two wavelengths corresponding to two points intersected with the average insertion loss spectrum curve CH00nAVG of the corresponding channel after the peak wavelength is reduced by 3dB is used for calculating the 3dB BW test data of each channel.
7. The PLC chip level detection method according to claim 6, wherein the acquiring AX test data of each channel includes: in the average insertion loss spectrum curve CH00nAVG of each channel, the average insertion loss spectrum curve CH00nAVG of the current channel is used for determining the AX test data of each channel by taking the difference between the minimum insertion loss corresponding to the current channel falling into the range of the ITU Passband of the adjacent channel and the maximum insertion loss corresponding to the current channel in the range of the ITU Passband of the current channel.
8. The PLC chip level detection method according to claim 7, wherein the centering wavelength λ is obtainedCWL_TMCentral wavelength lambdaCWL_TEWhen the Peak insertion loss Peak IL of the corresponding spectrum is reduced by a corresponding height and the wavelength corresponding to the point intersected with the corresponding spectrum curve falls in the interval between two adjacent wavelengths of the incident wavelength, the wavelength-insertion loss relation formula is obtained by taking two value taking points on the corresponding spectrum curve: λ ═ aIL (n) + b, and the insertion loss value corresponding to the intersection is substituted into the wavelength-insertion loss relational expression to obtain the wavelength corresponding to the intersection.
9. The PLC chip level detection method according to claim 8, wherein the selecting chip comparison data includes:
selecting the PB IL test data with the minimum value from the PB IL test data of each channel as PB IL comparison data;
selecting PDW test data with the largest value from the PDW test data of each channel as PDW comparison data;
selecting 1dB BW test data with the minimum value from the 1dB BW test data of each channel as 1dB BW comparison data;
selecting 3dB BW test data with the minimum value from the 3dB BW test data of each channel as 3dB BW comparison data;
selecting the AX test data with the minimum value from the AX test data of each channel as AX comparison data;
in the PB IL test data of each channel, the maximum PB IL test data and the minimum PB IL test data are subjected to difference, and IL unif comparison data are obtained.
10. The PLC chip level detection method according to claim 9, wherein the preset level comparison parameter includes:
the values of the alignment parameters of the first grade are: PB IL-4, PDW-0.03, 1dB BW-0.41, 3dB BW-0.61, AX-28, IL-unif-1;
the values of the second-level alignment parameters are: PB IL-4.5, PDW-0.04, 1dB BW-0.405, 3dB BW-0.605, AX-27.5, IL unif-1;
the third level of values of the respective alignment parameters were: PB IL-5, PDW-0.045, 1dB BW-0.39, 3dB BW-0.59, AX-25, IL unif-1.2;
wherein, the judging the chip grade comprises:
PB IL comparison data needs to be larger than PB IL comparison parameters;
the IL unif comparison data is required to be smaller than the IL unif comparison parameters;
PDW comparison data is smaller than PDW comparison parameters;
1dB broadband comparison data needs to be larger than 1dB broadband comparison parameters;
3dB broadband comparison data needs to be larger than 3dB broadband comparison parameters;
the AX alignment data is larger than the AX alignment parameters.
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