CN113608107B - Circuit board test equipment with double channels - Google Patents
Circuit board test equipment with double channels Download PDFInfo
- Publication number
- CN113608107B CN113608107B CN202110902291.3A CN202110902291A CN113608107B CN 113608107 B CN113608107 B CN 113608107B CN 202110902291 A CN202110902291 A CN 202110902291A CN 113608107 B CN113608107 B CN 113608107B
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- circuit board
- conveying
- rail
- conveying device
- testing
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- 238000012360 testing method Methods 0.000 title claims abstract description 131
- 230000007246 mechanism Effects 0.000 claims abstract description 54
- 238000010276 construction Methods 0.000 claims description 15
- 230000009977 dual effect Effects 0.000 claims description 10
- 238000012546 transfer Methods 0.000 claims description 7
- 238000007599 discharging Methods 0.000 claims description 5
- 230000006835 compression Effects 0.000 claims description 3
- 238000007906 compression Methods 0.000 claims description 3
- 238000013461 design Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention provides a circuit board test device with double channels, which comprises a device rack, a test mechanism and a conveying mechanism. The testing mechanism is connected with the equipment rack. The conveying mechanism is connected with the equipment rack and is positioned below the testing mechanism. Wherein, conveying mechanism includes: a first conveying device and a second conveying device. The first conveying device is connected with the equipment rack. The second conveying device is connected with the equipment rack and is positioned below the first conveying device. The first conveying device and the second conveying device are used for alternately conveying the circuit boards. The circuit board testing equipment with the double channels is provided with the first conveying device and the second conveying device, and the first conveying device and the second conveying device are used for alternately conveying the circuit boards. The circuit board test equipment with the double channels reduces the time of blanking and reloading the circuit board to be tested, and the circuit board test equipment with the double channels has high test efficiency.
Description
Technical Field
The invention relates to the field of test equipment, in particular to circuit board test equipment with double channels.
Background
Before the circuit board is put into use, the circuit board needs to be tested. The staff needs to ensure that the circuit board is available after each component on the circuit board is properly located.
Testing of the circuit board is performed by a test apparatus. The test equipment replaces manual testing, and labor cost is saved. And the test precision of the test equipment is higher than that of the manual test. At present, after testing a circuit board, the testing equipment needs to perform blanking on the circuit board and then reload the circuit board to be tested. The test equipment has long waiting time for blanking and reloading the circuit board to be tested, and has low test efficiency.
It is desirable to provide a circuit board testing apparatus with dual channels to solve the above-mentioned problems.
Disclosure of Invention
The invention provides a circuit board testing device with two channels, which solves the problems that the prior art has unreasonable structural design, long time for waiting for blanking and reloading of the circuit board to be tested and low testing efficiency of the testing device by arranging a first conveying device and a second conveying device and using the first conveying device and the second conveying device to alternately convey the circuit board.
In order to solve the technical problems, the technical scheme of the invention is as follows: a circuit board test device with double channels is used for testing a circuit board; the circuit board test equipment with two channels comprises:
An equipment rack;
the testing mechanism is connected with the equipment rack and used for testing the circuit board; and
The conveying mechanism is connected with the equipment rack, is positioned below the testing mechanism and is used for conveying the circuit board;
Wherein, conveying mechanism includes:
The first conveying device is connected with the equipment rack and is used for conveying the circuit board; and
The second conveying device is connected with the equipment rack, is positioned below the first conveying device and is used for conveying the circuit board;
the first conveying device and the second conveying device are used for alternately conveying the circuit boards.
In the present invention, the first conveying apparatus includes:
A first slide rail, and
The first conveying disc is positioned on the first sliding rail, is connected with the first sliding rail in a sliding way and is used for bearing the discharge circuit board; the motion trail of the first conveying disc comprises the following steps: a first loading level and a first unloading level;
The second conveying device includes:
The second sliding rail is positioned below the first sliding rail; and
The second conveying disc is positioned on the second sliding rail, is connected with the second sliding rail in a sliding way and is used for bearing the discharge circuit board; the motion trail of the second conveying disc comprises the following steps: a second loading level and a second unloading level;
when the first conveying device is positioned at the first feeding level and the second conveying device is positioned at the second feeding level, the vertical projection of the first conveying device and the second conveying device on the equipment rack coincides, and when the first conveying device is positioned at the first discharging level and the second conveying device is positioned at the second discharging level, the vertical projection of the first conveying device and the second conveying device under the equipment rack coincides.
In the present invention, the first slide rail includes:
A first rail connected with the equipment rack, and
The second rail is positioned on one side of the first rail and is connected with the equipment rack; the first sliding rail and the second sliding rail are used for conveying the first conveying disc together;
The second slide rail includes:
A third rail connected with the equipment rack, and
A fourth rail positioned on one side of the third rail and connected with the equipment rack; the first sliding rail and the second sliding rail are used for conveying a second conveying disc together;
the height of the first sliding rail is higher than that of the second sliding rail, the third rail is located between the first rail and the fourth rail, and the fourth rail is located between the second rail and the third rail.
In the present invention, the first transfer tray includes:
The first bearing part is positioned in the middle of the first conveying disc and used for bearing a circuit board; and
The first connecting part is positioned at the periphery of the first conveying disc and is connected with the first sliding rail; a first limiting block is arranged on the first bearing part and used for limiting the circuit board;
The second transfer tray includes:
the second bearing part is positioned in the middle of the second conveying disc and is used for bearing a circuit board; and
The second connecting part is positioned at the periphery of the second conveying disc and is connected with the second sliding rail; a second limiting block is arranged on the second bearing part and used for limiting the circuit board; the second bearing part has the same structure as the second bearing part.
In the invention, a plurality of connecting holes are arranged on the first bearing part, and the first limiting block is connected with the first bearing part through the connecting holes.
In the invention, the two ends of the first bearing part are provided with first clamping grooves; and second clamping grooves are formed in two ends of the second bearing part.
In the present invention, the test mechanism includes:
the scheduling device is connected with the equipment rack;
The fixing device is connected with the dispatching device and is positioned above the conveying mechanism and used for fixing the circuit board; the fixing device comprises a fixing piece for fixing at least two non-parallel faces; and
And the testing device is connected with the fixing device and is used for testing the circuit board.
In the present invention, the fixing means includes:
the connecting block is connected with the testing mechanism, and the inside of the connecting block is hollow to form a telescopic chamber;
The first fixing piece is connected with the connecting block; the first fixing piece extends into the telescopic chamber and is used for pressing down and fixing the circuit board;
The building block is positioned below the first fixing piece and connected with the first fixing piece;
A spring, which is located between the connecting block and the construction block and is arranged at the periphery of the first fixing piece; one end of the spring is connected with the bottom surface of the bottom of the connecting block, and the other end of the spring is connected with the top surface of the bottom of the building block and is used for resetting the first fixing piece;
A second fixing member located at one side of the construction block for fixing the circuit board; the second fixing member includes:
a compression part connected with the construction block, and
And one end of the connecting part is connected with the connecting block, and the other end of the connecting part is connected with the compacting part and is used for driving the compacting part to press downwards.
In the present invention, the test device includes:
a vertical tester, which is positioned below the construction block and connected with the construction block; and
And the oblique tester is positioned below the second fixing piece and is connected with the second fixing piece.
In the invention, the test mechanism comprises an initial state, a second working state and a third working state;
when the testing mechanism is in an initial state, an included angle between the extension line of the compacting part and the extension line of the connecting part is a degrees, an included angle between the extension line of the compacting part and the extension line of the building block is b degrees, the vertical tester is far away from the circuit board, and the inclined tester is far away from the circuit board;
When the testing mechanism is in a first working state, an included angle between the extension line of the compacting part and the extension line of the connecting part is a degrees, an included angle between the extension line of the compacting part and the extension line of the building block is b degrees, the vertical tester is connected with the circuit board, and the inclined tester is far away from the circuit board;
when the testing mechanism is in a third working state, an included angle between the extension line of the compacting part and the extension line of the connecting part is e degrees, an included angle between the extension line of the compacting part and the extension line of the building block is f degrees, the vertical tester is connected with the circuit board, and the oblique tester is connected with the circuit board;
Wherein 180> a > e and b < f <180.
Compared with the prior art, the invention has the beneficial effects that: the circuit board testing equipment with the double channels is provided with the first conveying device and the second conveying device, and the circuit boards are alternately conveyed by using the first conveying device and the second conveying device. The equipment reduces the time for blanking and reloading the circuit board to be tested, has high test efficiency, and solves the problems that the test equipment in the prior art is unreasonable in structural design, the test equipment waits for the time for blanking and reloading the circuit board to be tested, and the test efficiency of the test equipment is low.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are needed in the embodiments are briefly described below, and the drawings in the following description are only drawings corresponding to some embodiments of the present invention.
Fig. 1 is a schematic structural view of a preferred embodiment of a circuit board testing device with dual channels according to the present invention.
Fig. 2 is a front view of a preferred embodiment of the circuit board testing apparatus of the present invention having dual channels.
Fig. 3 is a schematic structural view of a conveying mechanism in a preferred embodiment of the circuit board testing apparatus with dual channels of the present invention.
Fig. 4 is a schematic structural view of a first transfer tray in a preferred embodiment of the circuit board testing apparatus with dual channels of the present invention.
Fig. 5 is a schematic structural view of a second transfer tray in a preferred embodiment of the circuit board testing apparatus with dual channels of the present invention.
Fig. 6 is a schematic structural view of a test mechanism in a preferred embodiment of the circuit board test apparatus with dual channels of the present invention.
Fig. 7 is a schematic diagram showing an initial state of a test mechanism in a preferred embodiment of the circuit board test apparatus with dual channels of the present invention.
Fig. 8 is a schematic diagram showing a first operation state of the test mechanism in the preferred embodiment of the circuit board test apparatus with two channels according to the present invention.
Fig. 9 is a schematic diagram showing a second working state of the test mechanism in the preferred embodiment of the circuit board test apparatus with two channels according to the present invention.
Reference numerals: equipment rack 1, testing mechanism 2, scheduler 21, testing device 22, vertical tester 221, diagonal tester 222, fixture 23, connection block 231, first fixture 232, building block 233, spring 234, second fixture 235, compacting portion 2351, connection portion 2352, transport mechanism 3, first transport device 31, first slide rail 311, first track 3111, second track 3112, first transport tray 312, first carrier 3121, connection hole 3121a, first stopper 3121b, first connection portion 3122, second transport device 32, second slide rail 321, third track 3211, fourth track 3212, second transport tray 322, second carrier 3221, second connection portion 3222.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the drawings, like structural elements are denoted by like reference numerals.
The words "first," "second," and the like in the terminology of the present invention are used for descriptive purposes only and are not to be construed as indicating or implying relative importance and not as limiting the order of precedence.
Referring to fig. 1 and 2, the following describes in detail a circuit board testing device with two channels, which can solve the above technical problems:
The preferred embodiment of the circuit board testing equipment with double channels provided by the invention is as follows: a circuit board testing device with double channels is used for testing a circuit board. The circuit board test equipment with double channels comprises: an equipment rack 1, a testing mechanism 2 and a conveying mechanism 3. The test mechanism 2 is connected with the equipment rack 1 for testing the circuit board. The conveying mechanism 3 is connected with the equipment rack 1 and is positioned below the testing mechanism 2 and used for conveying the circuit board.
Wherein the conveying mechanism 3 comprises: a first conveyor 31 and a second conveyor 32. The first conveying device 31 is connected to the equipment rack 1 for conveying the circuit boards. The second conveying device 32 is connected to the equipment rack 1 and is located below the first conveying device 31 for conveying the circuit board. The first conveying device 31 and the second conveying device 32 are used for alternately conveying the circuit boards.
The circuit board testing device with double channels of the invention is provided with the first conveying device 31 and the second conveying device 32, and the circuit boards are alternately conveyed by using the first conveying device 31 and the second conveying device 32. The circuit board test equipment with the double channels reduces the time of circuit board blanking and reloading the circuit board to be tested, has high test efficiency, and solves the problems that the test equipment in the prior art is unreasonable in structural design, the time of waiting for circuit board blanking and reloading the circuit board to be tested is long, and the test efficiency of the test equipment is low.
Please refer to fig. 3, 4 and 5, the following describes the conveying mechanism 3 in detail:
The conveying mechanism 3 includes: a first conveyor 31 and a second conveyor 32. The first conveying device 31 includes: the first sliding rail 311 and a first conveying tray. The first conveying tray 312 is located on the first sliding rail 311, and is slidably connected with the first sliding rail 311, for supporting the circuit board. The movement trace of the first conveyor tray 312 includes: a first loading level and a first unloading level.
The second conveying device 32 includes: the second slide rail 321 and the second conveying tray 322. The second sliding rail 321 is located below the first sliding rail 311. The second conveying tray 322 is located on the second sliding rail 321, and is slidably connected to the second sliding rail 321, for supporting the circuit board. The motion trail of the second conveyor pan 322 includes: a second loading level and a second unloading level.
When the first conveyor 31 is at the first loading level and the second conveyor 32 is at the second loading level, the vertical projections of the first conveyor 31 and the second conveyor 32 on the equipment rack 1 coincide, and when the first conveyor 31 is at the first unloading level and the second conveyor 32 is at the second unloading level, the vertical projections of the first conveyor 31 and the second conveyor 32 under the equipment rack 1 coincide. The first conveying device 31 and the second conveying device 32 are arranged, so that the testing mechanism 2 can test the circuit board conveniently.
Further, the first slide rail 311 includes: a first track 3111 and a second track 3112. The first track 3111 is connected to the equipment rack 1. The second track 3112 is located on one side of the first track 3111 and is connected to the equipment rack 1. The first slide rail 311 and the second slide rail 321 are used together to convey the first conveying tray 312.
The second slide rail 321 includes: third track 3211 and fourth track 3212. The third rail 3211 is connected to the equipment rack 1. The fourth track 3212 is located on one side of the third track 3211 and is connected to the equipment rack 1. The first sliding rail 311 and the second sliding rail 321 are used together to convey the second conveying tray 322;
The first rail 311 has a height higher than that of the second rail 321, the third rail 3211 is located between the first rail 3111 and the fourth rail 3212 is located between the second rail 3112 and the third rail 3211. The first sliding rail 311 is independently arranged on the second sliding rail 321, and is not limited by the synchronous device, so that the conveying mechanism 3 is more flexible.
In this aspect, the first conveyor tray 312 includes: the first carrier portion 3121 and the first connection portion 3122. The first carrying portion 3121 is located at a middle portion of the first conveying tray 312 for carrying the circuit board. The first connection portion 3122 is located at the outer periphery of the first conveying tray 312 and connected to the first sliding rail 311. The first bearing portion 3121 is provided with a first limiting block 3121b, and the first limiting block 3121b is used for limiting the circuit board.
The second transfer tray 322 includes: the second carrier portion 3221 and the second connection portion 3222. The second carrier 3221 is located in the middle of the second conveying tray 322 and is used for carrying the circuit board. The second connecting portion 3222 is located at the outer periphery of the second conveying tray 322 and is connected to the second sliding rail 321. The second bearing portion 3221 is provided with a second limiting block, and the second limiting block is used for limiting the circuit board. The second carrier 3221 has the same structure as the second carrier 3221. The position of the circuit board is limited by using the limiting block, so that the circuit board is conveniently tested by the testing mechanism 2, and the testing accuracy is further improved.
It can be understood that the first carrying portion 3121 is provided with a plurality of connection holes 3121a, and the first limiting block 3121b is connected to the first carrying portion 3121 through the connection holes 3121 a. When meeting circuit boards with different specifications, the position of the first limiting block 3121b can be adjusted to limit the circuit boards with different specifications. The applicability of the circuit board testing equipment with the double channels is improved.
In addition, the first conveying tray 312 in this embodiment is provided with a first clamping groove, and the second conveying tray 322 is provided with a second clamping groove. The first gripping grooves are located at both ends of the first carrier 3121. The second bearing portion 3221 is located at two ends of the second clamping groove. The first clamping groove and the second clamping groove are arranged to facilitate the removal of the first conveying disc 312 and the second conveying disc 322, and further facilitate the feeding and discharging of the first conveying disc 312 and the second conveying disc 322 by workers.
Please refer to fig. 6, 7, 8 and 9, the following describes the testing mechanism 2 of the present invention in detail:
The test mechanism 2 includes: scheduling means 21, fixing means 23 and testing means 22. The scheduler 21 is connected to the equipment rack 1. The fixing device 23 is connected with the dispatching device 21 and is located above the conveying mechanism 3 and used for fixing the circuit board. The fixing means 23 comprise a fixing for fixing at least two non-parallel faces. And the testing device 22 is connected with the fixing device 23 and is used for testing the circuit board.
The use of the fixing means 23 enables the circuit board to be fixed before testing the circuit board. The setting of the fixing device 23 improves the accuracy of the test. The fixing piece used for fixing at least two non-parallel surfaces is arranged, so that the circuit board with an irregular shape can be tested, and the applicability of the circuit board testing equipment with two channels is improved.
Wherein the fixing means 23 comprises: the connecting block 231, the first fixing piece 232, the construction block 233, the spring 234, and the second fixing piece 235. The connection block 231 is connected with the test mechanism 2, and the inside of the connection block 231 is hollow to form a telescopic chamber. The first fixing member 232 is connected with the connection block 231. The first fixing member 232 extends into the telescopic chamber for pressing down and fixing the circuit board. The building block 233 is located below the first fixing member 232 and connected to the first fixing member 232. The spring 234 is disposed between the connection block 231 and the construction block 233, and is disposed at the periphery of the first fixing member 232. One end of the spring 234 is connected to the bottom surface of the bottom of the connection block 231, and the other end is connected to the top surface of the bottom of the construction block 233 for resetting the first fixing member 232. The second fixing member 235 is located at one side of the building block 233 for fixing the circuit board. The second fixing member 235 includes: the compression part 2351 and the connection part 2352. The compacting section 2351 is connected to the building block 233. One end of the connecting portion 2352 is connected to the connecting block 231, and the other end is connected to the compacting portion 2351, for driving the compacting portion 2351 to press down.
The test device 22 includes: vertical tester 221 and diagonal tester 222. The vertical tester 221 is located below the building block 233 and is connected to the building block 233. The oblique tester 222 is located below the second fixing member 235 and connected to the second fixing member 235.
In this solution, the test mechanism 2 comprises an initial state, a second working state and a third working state;
When the testing mechanism 2 is in the initial state, the included angle between the extension line of the compacting part 2351 and the extension line of the connecting part 2352 is a degrees, the included angle between the extension line of the compacting part 2351 and the extension line of the building block 233 is b degrees, the vertical tester 221 is far away from the circuit board, and the oblique tester 222 is far away from the circuit board;
When the testing mechanism 2 is in the first working state, the included angle between the extension line of the compacting part 2351 and the extension line of the connecting part 2352 is a degrees, the included angle between the extension line of the compacting part 2351 and the extension line of the construction block 233 is b degrees, the vertical tester 221 is connected with the circuit board, and the oblique tester 222 is far away from the circuit board;
when the testing mechanism 2 is in the third working state, the included angle between the extension line of the compacting part 2351 and the extension line of the connecting part 2352 is e degrees, the included angle between the extension line of the compacting part 2351 and the extension line of the construction block 233 is f degrees, the vertical tester 221 is connected with the circuit board, and the oblique tester 222 is connected with the circuit board;
Wherein 180> a > e and b < f <180.
The working principle of the embodiment is as follows: the circuit board is fed onto the first conveying device 31, and the circuit board is fed onto the second conveying device 32 in the process that the first conveying device 31 brings the circuit board to the first feeding position. The second conveyor 32 brings the circuit board to the second loading position during the process of blanking and reloading after the circuit board is tested by the first conveyor 31. The first conveying device 31 and the second conveying device 32 alternately convey the circuit boards in a reciprocating manner, so that the efficiency of testing the circuit boards by the circuit board testing equipment with double channels is improved.
When the test mechanism 2 tests the circuit board, the test device 22 descends, the first fixing member 232 is pressed down, the vertical tester on the building block 233 contacts the circuit board, and the circuit board is primarily fixed. As the testing device 22 continues to descend, the second fixing member 235 rotates until the oblique tester on the second fixing member 235 contacts the circuit board, thereby completing the fixing. And finally, the testing device tests the circuit board.
Thus, the test process of the circuit board test apparatus with dual channels of the present preferred embodiment is completed.
The circuit board testing equipment with the double channels is provided with the first conveying device and the second conveying device, and the first conveying device and the second conveying device are used for alternately conveying the circuit boards. The circuit board test equipment with the double channels reduces the time of circuit board blanking and reloading the circuit board to be tested, has high test efficiency, and solves the problems that the test equipment in the prior art is unreasonable in structural design, the time of waiting for circuit board blanking and reloading the circuit board to be tested is long, and the test efficiency of the test equipment is low.
In summary, although the present invention has been described in terms of the preferred embodiments, the preferred embodiments are not limited to the above embodiments, and various modifications and changes can be made by one skilled in the art without departing from the spirit and scope of the invention, and the scope of the invention is defined by the appended claims.
Claims (4)
1. A circuit board test device with double channels is used for testing a circuit board; the circuit board test equipment with the double channels is characterized by comprising:
An equipment rack;
the testing mechanism is connected with the equipment rack and used for testing the circuit board; and
The conveying mechanism is connected with the equipment rack, is positioned below the testing mechanism and is used for conveying the circuit board;
Wherein, conveying mechanism includes:
The first conveying device is connected with the equipment rack and is used for conveying the circuit board; and
The second conveying device is connected with the equipment rack, is positioned below the first conveying device and is used for conveying the circuit board;
the first conveying device and the second conveying device are used for alternately conveying the circuit boards;
The first conveying device includes:
A first slide rail, and
The first conveying disc is positioned on the first sliding rail, is connected with the first sliding rail in a sliding way and is used for bearing the discharge circuit board; the motion trail of the first conveying disc comprises the following steps: a first loading level and a first unloading level;
The second conveying device includes:
The second sliding rail is positioned below the first sliding rail; and
The second conveying disc is positioned on the second sliding rail, is connected with the second sliding rail in a sliding way and is used for bearing the discharge circuit board; the motion trail of the second conveying disc comprises the following steps: a second loading level and a second unloading level;
When the first conveying device is positioned at the first feeding level and the second conveying device is positioned at the second feeding level, the vertical projection of the first conveying device and the second conveying device on the equipment rack coincides, and when the first conveying device is positioned at the first discharging level and the second conveying device is positioned at the second discharging level, the vertical projection of the first conveying device and the second conveying device under the equipment rack coincides;
the first transfer tray includes:
The first bearing part is positioned in the middle of the first conveying disc and used for bearing a circuit board; and
The first connecting part is positioned at the periphery of the first conveying disc and is connected with the first sliding rail; a first limiting block is arranged on the first bearing part and used for limiting the circuit board;
The second transfer tray includes:
the second bearing part is positioned in the middle of the second conveying disc and is used for bearing a circuit board; and
The second connecting part is positioned at the periphery of the second conveying disc and is connected with the second sliding rail; a second limiting block is arranged on the second bearing part and used for limiting the circuit board; the second bearing part has the same structure as the second bearing part;
The test mechanism comprises:
the scheduling device is connected with the equipment rack;
The fixing device is connected with the dispatching device and is positioned above the conveying mechanism and used for fixing the circuit board; the fixing device comprises a fixing piece for fixing at least two non-parallel faces; and
The testing device is connected with the fixing device and is used for testing the circuit board;
The fixing device includes:
the connecting block is connected with the testing mechanism, and the inside of the connecting block is hollow to form a telescopic chamber;
The first fixing piece is connected with the connecting block; the first fixing piece extends into the telescopic chamber and is used for pressing down and fixing the circuit board;
The building block is positioned below the first fixing piece and connected with the first fixing piece;
A spring, which is located between the connecting block and the construction block and is arranged at the periphery of the first fixing piece; one end of the spring is connected with the bottom surface of the bottom of the connecting block, and the other end of the spring is connected with the top surface of the bottom of the building block and is used for resetting the first fixing piece;
A second fixing member located at one side of the construction block for fixing the circuit board; the second fixing member includes:
a compression part connected with the construction block, and
One end of the connecting part is connected with the connecting block, and the other end of the connecting part is connected with the compacting part and is used for driving the compacting part to press down;
The test device comprises:
a vertical tester, which is positioned below the construction block and connected with the construction block; and
The oblique tester is positioned below the second fixing piece and is connected with the second fixing piece;
The testing mechanism comprises an initial state, a second working state and a third working state;
when the testing mechanism is in an initial state, an included angle between the extension line of the compacting part and the extension line of the connecting part is a degrees, an included angle between the extension line of the compacting part and the extension line of the building block is b degrees, the vertical tester is far away from the circuit board, and the inclined tester is far away from the circuit board;
When the testing mechanism is in a first working state, an included angle between the extension line of the compacting part and the extension line of the connecting part is a degrees, an included angle between the extension line of the compacting part and the extension line of the building block is b degrees, the vertical tester is connected with the circuit board, and the inclined tester is far away from the circuit board;
when the testing mechanism is in a third working state, an included angle between the extension line of the compacting part and the extension line of the connecting part is e degrees, an included angle between the extension line of the compacting part and the extension line of the building block is f degrees, the vertical tester is connected with the circuit board, and the oblique tester is connected with the circuit board;
Wherein 180> a > e and b < f <180.
2. The dual channel circuit board testing apparatus of claim 1, wherein the first slide rail comprises:
A first rail connected with the equipment rack, and
The second rail is positioned on one side of the first rail and is connected with the equipment rack; the first sliding rail and the second sliding rail are used for conveying the first conveying disc together;
The second slide rail includes:
A third rail connected with the equipment rack, and
A fourth rail positioned on one side of the third rail and connected with the equipment rack; the first sliding rail and the second sliding rail are used for conveying a second conveying disc together;
the height of the first sliding rail is higher than that of the second sliding rail, the third rail is located between the first rail and the fourth rail, and the fourth rail is located between the second rail and the third rail.
3. The circuit board testing device with two channels according to claim 1, wherein a plurality of connecting holes are formed in the first bearing portion, and the first limiting block is connected with the first bearing portion through the connecting holes.
4. The circuit board testing device with two channels according to claim 1, wherein two ends of the first bearing part are provided with first clamping grooves; and second clamping grooves are formed in two ends of the second bearing part.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110902291.3A CN113608107B (en) | 2021-08-06 | 2021-08-06 | Circuit board test equipment with double channels |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110902291.3A CN113608107B (en) | 2021-08-06 | 2021-08-06 | Circuit board test equipment with double channels |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113608107A CN113608107A (en) | 2021-11-05 |
| CN113608107B true CN113608107B (en) | 2024-05-10 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110902291.3A Active CN113608107B (en) | 2021-08-06 | 2021-08-06 | Circuit board test equipment with double channels |
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| JPH02249730A (en) * | 1989-03-22 | 1990-10-05 | Kubota Ltd | Dumping stand structure for work vehicle |
| TW200944817A (en) * | 2008-04-22 | 2009-11-01 | Horng Terng Automation Co Ltd | Dual test base transporting apparatus for printed circuit board tester |
| BE1020820A3 (en) * | 2012-07-05 | 2014-05-06 | Atlas Copco Airpower Nv | AERATION DEVICE, ITS USE, AND WATER TREATMENT PLANT WITH SUCH AERATION DEVICE. |
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