CN113608107A - Circuit board test equipment with double channels - Google Patents
Circuit board test equipment with double channels Download PDFInfo
- Publication number
- CN113608107A CN113608107A CN202110902291.3A CN202110902291A CN113608107A CN 113608107 A CN113608107 A CN 113608107A CN 202110902291 A CN202110902291 A CN 202110902291A CN 113608107 A CN113608107 A CN 113608107A
- Authority
- CN
- China
- Prior art keywords
- circuit board
- testing
- conveying
- rail
- conveying device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 138
- 230000009977 dual effect Effects 0.000 claims description 20
- 238000012546 transfer Methods 0.000 claims description 5
- 238000013461 design Methods 0.000 description 4
- 230000032258 transport Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000005056 compaction Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention provides a circuit board testing device with double channels. The testing mechanism is connected with the equipment rack. The conveying mechanism is connected with the equipment rack and is positioned below the testing mechanism. Wherein, conveying mechanism includes: a first conveying device and a second conveying device. The first conveying device is connected with the equipment rack. The second conveying device is connected with the equipment rack and is positioned below the first conveying device. The first conveying device and the second conveying device are used for alternately conveying the circuit boards. The circuit board testing equipment with the double channels is provided with the first conveying device and the second conveying device, and the circuit boards are conveyed alternately by using the first conveying device and the second conveying device. The circuit board testing equipment with the double channels reduces the time for blanking and reloading the circuit board to be tested, and the testing efficiency of the circuit board testing equipment with the double channels is high.
Description
Technical Field
The invention relates to the field of test equipment, in particular to circuit board test equipment with double channels.
Background
Before the circuit board is put into use, the circuit board needs to be tested. The operator needs to ensure that every component on the circuit board is properly accessible behind the circuit board.
The testing of the circuit board is performed by a testing device. The testing equipment replaces manual testing, and labor cost is saved. And the testing precision of the testing equipment is higher than that of manual testing. At present, after a test device tests a circuit board, the circuit board needs to be blanked and then the circuit board to be tested needs to be reloaded. The test equipment has long time for waiting for the circuit board to be unloaded and reloading the circuit board to be tested, and the test efficiency of the test equipment is low.
It is therefore desirable to provide a circuit board testing apparatus with dual channels to solve the above technical problems.
Disclosure of Invention
The invention provides a circuit board testing device with double channels, which is characterized in that a first conveying device and a second conveying device are arranged, and circuit boards are alternately conveyed by the first conveying device and the second conveying device, so that the problems that the structural design of the testing device in the prior art is unreasonable, the time for the testing device to wait for circuit board blanking and reloading to-be-tested circuit boards is long, and the testing efficiency of the testing device is low are solved.
In order to solve the technical problems, the technical scheme of the invention is as follows: a circuit board testing device with dual channels is used for testing a circuit board; the circuit board testing apparatus having dual channels includes:
an equipment rack;
the testing mechanism is connected with the equipment rack and used for testing the circuit board; and the number of the first and second groups,
the conveying mechanism is connected with the equipment rack, is positioned below the testing mechanism and is used for conveying the circuit board;
wherein, conveying mechanism includes:
the first conveying device is connected with the equipment rack and used for conveying the circuit board; and the number of the first and second groups,
the second conveying device is connected with the equipment rack, is positioned below the first conveying device and is used for conveying the circuit board;
the first conveying device and the second conveying device are used for alternately conveying the circuit boards.
In the present invention, the first conveying device includes:
a first slide rail, and,
the first conveying disc is positioned on the first slide rail, is connected with the first slide rail in a sliding manner and is used for bearing a circuit board; the motion trail of the first conveying disc comprises: a first loading position and a first unloading position;
the second conveying device includes:
the second sliding rail is positioned below the first sliding rail; and the number of the first and second groups,
the second conveying disc is positioned on the second slide rail, is connected with the second slide rail in a sliding manner and is used for bearing the circuit board; the motion trail of the second conveying disc comprises: a second loading position and a second unloading position;
the first conveying device is located when first material loading level with the second conveying device is in second material loading level, first conveying device with the second conveying device is in vertical projection coincidence in the equipment frame, first conveying device is in first material level with when second conveying device is in second material level, first conveying device with the second conveying device is in vertical projection coincidence under the equipment frame.
In the present invention, the first slide rail includes:
a first rail coupled to the equipment rack, and,
the second rail is positioned on one side of the first rail and is connected with the equipment rack; the first sliding rail and the second sliding rail are jointly used for conveying a first conveying disc;
the second slide rail includes:
a third rail coupled to the equipment rack, and,
a fourth rail located at one side of the third rail and connected to the equipment rack; the first sliding rail and the second sliding rail are jointly used for conveying a second conveying disc;
the height of the first slide rail is higher than that of the second slide rail, the third rail is positioned between the first rail and the fourth rail, and the fourth rail is positioned between the second rail and the third rail.
In the present invention, the first conveyance tray includes:
the first bearing part is positioned in the middle of the first conveying disc and used for bearing a circuit board; and the number of the first and second groups,
the first connecting part is positioned on the periphery of the first conveying disc and is connected with the first slide rail; the first bearing part is provided with a first limiting block, and the first limiting block is used for limiting the circuit board;
the second conveyance tray includes:
the second bearing part is positioned in the middle of the second conveying disc and used for bearing the circuit board; and the number of the first and second groups,
the second connecting part is positioned on the periphery of the second conveying disc and is connected with the second slide rail; the second bearing part is provided with a second limiting block, and the second limiting block is used for limiting the circuit board; the second bearing part has the same structure as the second bearing part.
In the invention, a plurality of connecting holes are arranged on the first bearing part, and the first limiting block is connected with the first bearing part through the connecting holes.
In the invention, two ends of the first bearing part are provided with first clamping grooves; and second clamping grooves are formed at two ends of the second bearing part.
In the present invention, the test mechanism includes:
the scheduling device is connected with the equipment rack;
the fixing device is connected with the scheduling device, is positioned above the conveying mechanism and is used for fixing the circuit board; the fixing device comprises a fixing piece for fixing at least two non-parallel surfaces; and the number of the first and second groups,
and the testing device is connected with the fixing device and used for testing the circuit board.
In the present invention, the fixing device includes:
the connecting block is connected with the testing mechanism, and the inside of the connecting block is hollow to form a telescopic chamber;
the first fixing piece is connected with the connecting block; the first fixing piece extends into the telescopic chamber and is used for pressing and fixing the circuit board;
the building block is positioned below the first fixing piece and connected with the first fixing piece;
a spring, which is located between the connecting block and the building block and is arranged at the periphery of the first fixing piece; one end of the spring is connected with the bottom surface of the bottom of the connecting block, and the other end of the spring is connected with the top surface of the bottom of the building block and used for resetting the first fixing piece;
the second fixing piece is positioned at one side of the building block and used for fixing the circuit board; the second fixing member includes:
a compacted part connected to the building block, and,
and one end of the connecting part is connected with the connecting block, and the other end of the connecting part is connected with the real-pressing part and is used for driving the real-pressing part to press down.
In the present invention, the test apparatus includes:
a vertical tester located below the building block, connected to the building block; and the number of the first and second groups,
and the oblique tester is positioned below the second fixing piece and is connected with the second fixing piece.
In the invention, the testing mechanism comprises an initial state, a second working state and a third working state;
when the testing mechanism is in an initial state, an included angle between the extension line of the compacted part and the extension line of the connecting part is a degrees, an included angle between the extension line of the compacted part and the extension line of the building block is b degrees, the vertical tester is far away from the circuit board, and the oblique tester is far away from the circuit board;
when the testing mechanism is in a first working state, an included angle between the extension line of the compacted part and the extension line of the connecting part is a degrees, an included angle between the extension line of the compacted part and the extension line of the building block is b degrees, the vertical tester is connected with the circuit board, and the oblique tester is far away from the circuit board;
when the testing mechanism is in a third working state, an included angle between the extension line of the compacted part and the extension line of the connecting part is e degrees, an included angle between the extension line of the compacted part and the extension line of the building block is f degrees, the vertical tester is connected with the circuit board, and the oblique tester is connected with the circuit board;
wherein 180> a > e and b < f < 180.
Compared with the prior art, the invention has the beneficial effects that: the circuit board testing equipment with the double channels is provided with the first conveying device and the second conveying device, and the circuit boards are alternately conveyed by using the first conveying device and the second conveying device. The device reduces the time for blanking and reloading the circuit board to be tested, has high testing efficiency, and solves the problems that the testing device in the prior art has unreasonable structural design, the time for waiting for blanking and reloading the circuit board to be tested is long, and the testing efficiency of the testing device is low.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required in the embodiments are briefly introduced below, and the drawings in the following description are only corresponding to some embodiments of the present invention.
Fig. 1 is a schematic structural diagram of a preferred embodiment of the circuit board testing apparatus with dual channels according to the present invention.
Fig. 2 is a front view of a preferred embodiment of the circuit board testing apparatus of the present invention having dual channels.
Fig. 3 is a schematic structural diagram of a conveying mechanism in a preferred embodiment of the circuit board testing apparatus having two channels according to the present invention.
Fig. 4 is a schematic structural view of a first transfer tray in a preferred embodiment of the circuit board testing apparatus having dual channels according to the present invention.
Fig. 5 is a schematic structural view of a second transfer tray in a preferred embodiment of the circuit board testing apparatus having dual channels according to the present invention.
Fig. 6 is a schematic structural diagram of a test mechanism in a preferred embodiment of the circuit board test apparatus with dual channels of the present invention.
Fig. 7 is a schematic view showing an initial state of a test mechanism in a preferred embodiment of the circuit board test apparatus having dual channels of the present invention.
Fig. 8 is a schematic view of a first operating state of the test mechanism in the preferred embodiment of the circuit board test apparatus with dual channels of the present invention.
Fig. 9 is a schematic view of a second operation state of the test mechanism in the preferred embodiment of the circuit board test apparatus with dual channels of the present invention.
Reference numerals: the device comprises an equipment rack 1, a testing mechanism 2, a scheduling device 21, a testing device 22, a vertical tester 221, an oblique tester 222, a fixing device 23, a connecting block 231, a first fixing member 232, a building block 233, a spring 234, a second fixing member 235, a compaction part 2351, a connecting part 2352, a conveying mechanism 3, a first conveying device 31, a first sliding rail 311, a first rail 3111, a second rail 3112, a first conveying disc 312, a first bearing part 3121, a connecting hole 3121a, a first limiting block 3121b, a first connecting part 3122, a second conveying device 32, a second sliding rail 321, a third rail 3211, a fourth rail 3212, a second conveying disc 322, a second bearing part 3221 and a second connecting part 3222.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the drawings, elements having similar structures are denoted by the same reference numerals.
The terms "first," "second," and the like in the terms of the invention are used for descriptive purposes only and not for purposes of indication or implication relative importance, nor as a limitation on the order of precedence.
Referring to fig. 1 and fig. 2, a circuit board testing apparatus with dual channels for solving the above technical problems according to the present invention is described in detail as follows:
the preferred embodiment of the circuit board test equipment with double channels provided by the invention is as follows: a circuit board testing device with dual channels is used for testing a circuit board. The circuit board testing apparatus having dual channels includes: the device comprises an equipment rack 1, a testing mechanism 2 and a conveying mechanism 3. The test mechanism 2 is connected with the equipment rack 1 and used for testing the circuit board. The conveying mechanism 3 is connected with the equipment rack 1 and is positioned below the testing mechanism 2 and used for conveying the circuit board.
Wherein, conveying mechanism 3 includes: a first conveyor 31 and a second conveyor 32. The first transport device 31 is connected to the equipment rack 1 for transporting the circuit boards. The second conveying device 32 is connected to the equipment rack 1 and located below the first conveying device 31 for conveying the circuit boards. The first and second conveyors 31 and 32 are used to alternately convey the circuit boards.
The circuit board testing apparatus having dual lanes of the present invention alternately transports circuit boards by providing the first transporting device 31 and the second transporting device 32 and using the first transporting device 31 and the second transporting device 32. The circuit board testing equipment with the double channels reduces the time for blanking and reloading the circuit board to be tested, has high testing efficiency, and solves the problems that the testing equipment in the prior art has unreasonable structural design, the time for waiting for blanking and reloading the circuit board to be tested is long, and the testing efficiency of the testing equipment is low.
Referring to fig. 3, 4 and 5, the conveying mechanism 3 of the present invention will be described in detail as follows:
the conveying mechanism 3 includes: a first conveyor 31 and a second conveyor 32. The first conveying device 31 includes: a first slide rail 311 and a first conveying tray. The first conveying tray 312 is disposed on the first slide rail 311, and is slidably connected to the first slide rail 311 for supporting the circuit board. The movement locus of the first conveyance tray 312 includes: a first loading position and a first unloading position.
The second conveying device 32 includes: a second slide rail 321, and a second feed tray 322. The second slide rail 321 is located below the first slide rail 311. The second conveying tray 322 is disposed on the second slide rail 321, and is slidably connected to the second slide rail 321 for supporting the circuit board. The motion locus of the second conveyance tray 322 includes: a second loading level and a second unloading level.
When the first conveying device 31 is at the first loading position and the second conveying device 32 is at the second loading position, the vertical projections of the first conveying device 31 and the second conveying device 32 on the equipment rack 1 are overlapped, and when the first conveying device 31 is at the first unloading position and the second conveying device 32 is at the second unloading position, the vertical projections of the first conveying device 31 and the second conveying device 32 on the equipment rack 1 are overlapped. The first conveying device 31 is disposed on the second conveying device 32, so that the testing mechanism 2 can test the circuit board conveniently.
Further, the first slide rail 311 includes: a first rail 3111 and a second rail 3112. The first rail 3111 is connected to the equipment rack 1. The second rail 3112 is located at one side of the first rail 3111 and is connected to the equipment rack 1. The first slide rail 311 and the second slide rail 321 are used together to transport the first transport tray 312.
The second slide rail 321 includes: a third rail 3211 and a fourth rail 3212. The third rail 3211 is connected to the equipment rack 1. The fourth rail 3212 is located at one side of the third rail 3211 and is connected to the equipment rack 1. The first slide rail 311 and the second slide rail 321 are used together for conveying the second conveying disc 322;
the height of the first slide rail 311 is higher than that of the second slide rail 321, the third rail 3211 is located between the first rail 3111 and the fourth rail, and the fourth rail 3212 is located between the second rail 3112 and the third rail 3211. The first slide rail 311 is independently disposed on the second slide rail 321, and is not limited by the synchronization device, so that the conveying mechanism 3 is more flexible.
In this case, the first conveyance tray 312 includes: a first bearing portion 3121 and a first connection portion 3122. The first bearing portion 3121 is located at a middle portion of the first conveyance tray 312 for bearing a circuit board. The first connection portion 3122 is located at the periphery of the first conveying tray 312 and connected to the first slide rail 311. The first bearing portion 3121 is provided with a first limit block 3121b, and the first limit block 3121b is used for limiting the circuit board.
The second conveyance tray 322 includes: second bearing portion 3221 and second connecting portion 3222. The second carrying portion 3221 is located in the middle of the second conveying tray 322, and is used for carrying circuit boards. The second connecting portion 3222 is located at the periphery of the second conveying tray 322 and is connected to the second slide rail 321. The second bearing portion 3221 is provided with a second limiting block, and the second limiting block is used for limiting the circuit board. Second bearing portion 3221 has the same structure as second bearing portion 3221. The limiting blocks are used for limiting the position of the circuit board, so that the circuit board can be conveniently tested by the testing mechanism 2, and the testing accuracy is further improved.
It can be understood that a plurality of connecting holes 3121a are formed on the first bearing portion 3121, and the first limit block 3121b is connected to the first bearing portion 3121 through the connecting holes 3121 a. When circuit boards of different specifications are met, the circuit boards of different specifications can be limited by adjusting the position of the first limiting block 3121 b. The applicability of the circuit board testing equipment with the double channels is improved.
In addition, the first conveying tray 312 is provided with a first clamping groove, and the second conveying tray 322 is provided with a second clamping groove. The first catching grooves are located at both ends of the first bearing portion 3121. The second bearing parts 3221 are located at both ends of the second gripping groove. The first and second gripping grooves are arranged to facilitate the removal of the first and second transfer trays 312 and 322, so that the worker can load and unload the first and second transfer trays 312 and 322 conveniently.
Referring to fig. 6, 7, 8 and 9, the testing mechanism 2 of the present invention is described in detail as follows:
the test mechanism 2 includes: scheduling means 21, fixing means 23 and testing means 22. The scheduling device 21 is connected to the equipment rack 1. The fixing device 23 is connected to the scheduling device 21, and is located above the conveying mechanism 3 for fixing the circuit board. The fixing means 23 comprise fixing elements for fixing at least two non-parallel faces. And the testing device 22 is connected with the fixing device 23 and used for testing the circuit board.
The circuit board can be fixed prior to testing the circuit board using the fixing means 23. The setting of fixing device 23 has improved the precision of test. The fixing piece used for fixing at least two unparallel surfaces is arranged, so that the circuit board in an irregular shape can be tested, and the applicability of the circuit board testing equipment with double channels is improved.
Wherein the fixing device 23 comprises: a connecting block 231, a first fixture 232, a building block 233, a spring 234, and a second fixture 235. The connecting block 231 is connected with the testing mechanism 2, and the inside of the connecting block 231 is hollow to form a telescopic chamber. The first fixing member 232 is connected to the connection block 231. The first fixing member 232 extends into the expansion chamber for pressing and fixing the circuit board. The building block 233 is located below the first fixing member 232 and connected to the first fixing member 232. The spring 234 is located between the connection block 231 and the building block 233, and is disposed at the periphery of the first fixing member 232. One end of the spring 234 is connected to the bottom surface of the bottom of the connection block 231, and the other end is connected to the top surface of the bottom of the building block 233, for restoring the first fixing member 232. A second fixing member 235 is located at one side of the building block 233 for fixing the circuit board. The second fixing member 235 includes: a compaction portion 2351 and a connection portion 2352. Compacted portion 2351 is connected to building block 233. One end of the connecting portion 2352 is connected to the connecting block 231, and the other end is connected to the load portion 2351, for driving the load portion 2351 to be pressed down.
The test device 22 includes: a vertical tester 221 and a diagonal tester 222. Vertical tester 221 is located below building block 233, and is connected to building block 233. The slant tester 222 is located below the second fixing member 235 and connected to the second fixing member 235.
In the scheme, the testing mechanism 2 comprises an initial state, a second working state and a third working state;
when the testing mechanism 2 is in the initial state, an included angle between the extension line of the compacted part 2351 and the extension line of the connecting part 2352 is a degree, an included angle between the extension line of the compacted part 2351 and the extension line of the building block 233 is b degrees, the vertical tester 221 is away from the circuit board, and the diagonal tester 222 is away from the circuit board;
when the testing mechanism 2 is in the first working state, an included angle between the extension line of the compacted part 2351 and the extension line of the connecting part 2352 is a degree, an included angle between the extension line of the compacted part 2351 and the extension line of the building block 233 is b degrees, the vertical tester 221 is connected with the circuit board, and the oblique tester 222 is far away from the circuit board;
when the testing mechanism 2 is in the third working state, the included angle between the extension line of the compacted part 2351 and the extension line of the connecting part 2352 is e degrees, the included angle between the extension line of the compacted part 2351 and the extension line of the building block 233 is f degrees, the vertical tester 221 is connected with the circuit board, and the oblique tester 222 is connected with the circuit board;
wherein 180> a > e and b < f < 180.
The working principle of the embodiment is as follows: the circuit boards are fed onto the first conveying device 31, and the circuit boards are fed onto the second conveying device 32 in the process that the first conveying device 31 brings the circuit boards to the first feeding position. And the second conveying device 32 is used for bringing the circuit boards to a second loading position in the process of unloading and reloading after the circuit boards of the first conveying device 31 are tested. The first conveying device 31 and the second conveying device 32 convey the circuit boards in a reciprocating and alternating mode, and the efficiency of testing the circuit boards by the circuit board testing equipment with double channels is improved.
When the testing mechanism 2 tests the circuit board, the testing device 22 descends, the first fixing member 232 is pressed downwards, the vertical tester on the building block 233 contacts the circuit board, and the circuit board is preliminarily fixed. As the testing device 22 continues to descend, the second fixing member 235 rotates until the oblique tester on the second fixing member 235 contacts the circuit board, and the fixing is completed. And finally, testing the circuit board by the testing device.
This completes the test process of the circuit board test apparatus with dual channels of the preferred embodiment.
The circuit board testing equipment with the double channels is provided with the first conveying device and the second conveying device, and the circuit boards are conveyed alternately by using the first conveying device and the second conveying device. The circuit board testing equipment with the double channels reduces the time for blanking and reloading the circuit board to be tested, has high testing efficiency, and solves the problems that the testing equipment in the prior art has unreasonable structural design, the time for waiting for blanking and reloading the circuit board to be tested is long, and the testing efficiency of the testing equipment is low.
In summary, although the present invention has been described with reference to the preferred embodiments, the above-described preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, therefore, the scope of the present invention shall be determined by the appended claims.
Claims (10)
1. A circuit board testing device with dual channels is used for testing a circuit board; characterized in that, the circuit board test equipment with binary channels includes:
an equipment rack;
the testing mechanism is connected with the equipment rack and used for testing the circuit board; and the number of the first and second groups,
the conveying mechanism is connected with the equipment rack, is positioned below the testing mechanism and is used for conveying the circuit board;
wherein, conveying mechanism includes:
the first conveying device is connected with the equipment rack and used for conveying the circuit board; and the number of the first and second groups,
the second conveying device is connected with the equipment rack, is positioned below the first conveying device and is used for conveying the circuit board;
the first conveying device and the second conveying device are used for alternately conveying the circuit boards.
2. The apparatus for testing a circuit board having two channels of claim 1, wherein the first transporting means comprises:
a first slide rail, and,
the first conveying disc is positioned on the first slide rail, is connected with the first slide rail in a sliding manner and is used for bearing a circuit board; the motion trail of the first conveying disc comprises: a first loading position and a first unloading position;
the second conveying device includes:
the second sliding rail is positioned below the first sliding rail; and the number of the first and second groups,
the second conveying disc is positioned on the second slide rail, is connected with the second slide rail in a sliding manner and is used for bearing the circuit board; the motion trail of the second conveying disc comprises: a second loading position and a second unloading position;
the first conveying device is located when first material loading level with the second conveying device is in second material loading level, first conveying device with the second conveying device is in vertical projection coincidence in the equipment frame, first conveying device is in first material level with when second conveying device is in second material level, first conveying device with the second conveying device is in vertical projection coincidence under the equipment frame.
3. The apparatus for testing a circuit board having dual channels of claim 2, wherein the first slide rail comprises:
a first rail coupled to the equipment rack, and,
the second rail is positioned on one side of the first rail and is connected with the equipment rack; the first sliding rail and the second sliding rail are jointly used for conveying a first conveying disc;
the second slide rail includes:
a third rail coupled to the equipment rack, and,
a fourth rail located at one side of the third rail and connected to the equipment rack; the first sliding rail and the second sliding rail are jointly used for conveying a second conveying disc;
the height of the first slide rail is higher than that of the second slide rail, the third rail is positioned between the first rail and the fourth rail, and the fourth rail is positioned between the second rail and the third rail.
4. The apparatus for testing circuit boards having dual channels according to claim 2, wherein the first transfer tray comprises:
the first bearing part is positioned in the middle of the first conveying disc and used for bearing a circuit board; and the number of the first and second groups,
the first connecting part is positioned on the periphery of the first conveying disc and is connected with the first slide rail; the first bearing part is provided with a first limiting block, and the first limiting block is used for limiting the circuit board;
the second conveyance tray includes:
the second bearing part is positioned in the middle of the second conveying disc and used for bearing the circuit board; and the number of the first and second groups,
the second connecting part is positioned on the periphery of the second conveying disc and is connected with the second slide rail; the second bearing part is provided with a second limiting block, and the second limiting block is used for limiting the circuit board; the second bearing part has the same structure as the second bearing part.
5. The apparatus for testing the circuit board according to claim 4, wherein the first carrying portion has a plurality of connection holes, and the first stopper is connected to the first carrying portion through the connection holes.
6. The apparatus for testing a circuit board with two channels according to claim 4, wherein the first bearing part is provided with first clamping grooves at two ends; and second clamping grooves are formed at two ends of the second bearing part.
7. The apparatus for testing circuit boards having dual channels of claim 1 wherein the testing mechanism comprises:
the scheduling device is connected with the equipment rack;
the fixing device is connected with the scheduling device, is positioned above the conveying mechanism and is used for fixing the circuit board; the fixing device comprises a fixing piece for fixing at least two non-parallel surfaces; and the number of the first and second groups,
and the testing device is connected with the fixing device and used for testing the circuit board.
8. The apparatus for testing a circuit board having two channels of claim 7, wherein the fixing means comprises:
the connecting block is connected with the testing mechanism, and the inside of the connecting block is hollow to form a telescopic chamber;
the first fixing piece is connected with the connecting block; the first fixing piece extends into the telescopic chamber and is used for pressing and fixing the circuit board;
the building block is positioned below the first fixing piece and connected with the first fixing piece;
a spring, which is located between the connecting block and the building block and is arranged at the periphery of the first fixing piece; one end of the spring is connected with the bottom surface of the bottom of the connecting block, and the other end of the spring is connected with the top surface of the bottom of the building block and used for resetting the first fixing piece;
the second fixing piece is positioned at one side of the building block and used for fixing the circuit board; the second fixing member includes:
a compacted part connected to the building block, and,
and one end of the connecting part is connected with the connecting block, and the other end of the connecting part is connected with the real-pressing part and is used for driving the real-pressing part to press down.
9. The apparatus for testing a circuit board having two channels of claim 8, wherein the testing device comprises:
a vertical tester located below the building block, connected to the building block; and the number of the first and second groups,
and the oblique tester is positioned below the second fixing piece and is connected with the second fixing piece.
10. The apparatus for testing a circuit board having two channels according to claim 9, wherein the testing mechanism comprises an initial state, a second operating state and a third operating state;
when the testing mechanism is in an initial state, an included angle between the extension line of the compacted part and the extension line of the connecting part is a degrees, an included angle between the extension line of the compacted part and the extension line of the building block is b degrees, the vertical tester is far away from the circuit board, and the oblique tester is far away from the circuit board;
when the testing mechanism is in a first working state, an included angle between the extension line of the compacted part and the extension line of the connecting part is a degrees, an included angle between the extension line of the compacted part and the extension line of the building block is b degrees, the vertical tester is connected with the circuit board, and the oblique tester is far away from the circuit board;
when the testing mechanism is in a third working state, an included angle between the extension line of the compacted part and the extension line of the connecting part is e degrees, an included angle between the extension line of the compacted part and the extension line of the building block is f degrees, the vertical tester is connected with the circuit board, and the oblique tester is connected with the circuit board;
wherein 180> a > e and b < f < 180.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110902291.3A CN113608107B (en) | 2021-08-06 | 2021-08-06 | Circuit board test equipment with double channels |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110902291.3A CN113608107B (en) | 2021-08-06 | 2021-08-06 | Circuit board test equipment with double channels |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113608107A true CN113608107A (en) | 2021-11-05 |
| CN113608107B CN113608107B (en) | 2024-05-10 |
Family
ID=78307471
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110902291.3A Active CN113608107B (en) | 2021-08-06 | 2021-08-06 | Circuit board test equipment with double channels |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113608107B (en) |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02249730A (en) * | 1989-03-22 | 1990-10-05 | Kubota Ltd | Dumping stand structure for work vehicle |
| TW200944817A (en) * | 2008-04-22 | 2009-11-01 | Horng Terng Automation Co Ltd | Dual test base transporting apparatus for printed circuit board tester |
| BE1020820A3 (en) * | 2012-07-05 | 2014-05-06 | Atlas Copco Airpower Nv | AERATION DEVICE, ITS USE, AND WATER TREATMENT PLANT WITH SUCH AERATION DEVICE. |
| US20150044788A1 (en) * | 2013-08-08 | 2015-02-12 | Mitsubishi Electric Corporation | Test apparatus and test method |
| CN105137323A (en) * | 2015-08-14 | 2015-12-09 | 深圳创维－Rgb电子有限公司 | Automatic PCB test device and test method thereof |
| CN107329076A (en) * | 2017-08-07 | 2017-11-07 | 苏州维信电子有限公司 | FPC electric logging equipment |
| CN209432962U (en) * | 2018-12-21 | 2019-09-24 | 珠海市运泰利自动化设备有限公司 | A kind of structure function test platform alternatively up and down |
| CN209868742U (en) * | 2019-04-26 | 2019-12-31 | 四川普瑞森电子有限公司 | Fixing device for drilling printed circuit board |
| CN110850270A (en) * | 2019-11-06 | 2020-02-28 | 南京协辰电子科技有限公司 | Feeding and discharging mechanism, test equipment with mechanism and test system with mechanism |
| CN212255566U (en) * | 2019-11-06 | 2020-12-29 | 南京协辰电子科技有限公司 | Feeding and discharging mechanism, test equipment with mechanism and test system with mechanism |
| CN213023437U (en) * | 2020-03-06 | 2021-04-20 | 青岛海尔空调电子有限公司 | Circuit board testing equipment |
-
2021
- 2021-08-06 CN CN202110902291.3A patent/CN113608107B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02249730A (en) * | 1989-03-22 | 1990-10-05 | Kubota Ltd | Dumping stand structure for work vehicle |
| TW200944817A (en) * | 2008-04-22 | 2009-11-01 | Horng Terng Automation Co Ltd | Dual test base transporting apparatus for printed circuit board tester |
| BE1020820A3 (en) * | 2012-07-05 | 2014-05-06 | Atlas Copco Airpower Nv | AERATION DEVICE, ITS USE, AND WATER TREATMENT PLANT WITH SUCH AERATION DEVICE. |
| US20150044788A1 (en) * | 2013-08-08 | 2015-02-12 | Mitsubishi Electric Corporation | Test apparatus and test method |
| CN105137323A (en) * | 2015-08-14 | 2015-12-09 | 深圳创维－Rgb电子有限公司 | Automatic PCB test device and test method thereof |
| CN107329076A (en) * | 2017-08-07 | 2017-11-07 | 苏州维信电子有限公司 | FPC electric logging equipment |
| CN209432962U (en) * | 2018-12-21 | 2019-09-24 | 珠海市运泰利自动化设备有限公司 | A kind of structure function test platform alternatively up and down |
| CN209868742U (en) * | 2019-04-26 | 2019-12-31 | 四川普瑞森电子有限公司 | Fixing device for drilling printed circuit board |
| CN110850270A (en) * | 2019-11-06 | 2020-02-28 | 南京协辰电子科技有限公司 | Feeding and discharging mechanism, test equipment with mechanism and test system with mechanism |
| CN212255566U (en) * | 2019-11-06 | 2020-12-29 | 南京协辰电子科技有限公司 | Feeding and discharging mechanism, test equipment with mechanism and test system with mechanism |
| CN213023437U (en) * | 2020-03-06 | 2021-04-20 | 青岛海尔空调电子有限公司 | Circuit board testing equipment |
Non-Patent Citations (1)
| Title |
|---|
| 胡忠臣: "集成电路测试制造领域所用几种装置的探究", Retrieved from the Internet <URL:《科技广场》> * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113608107B (en) | 2024-05-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111806978B (en) | Balance placing machine | |
| KR100232260B1 (en) | Test socket and apparatus for testing module using the same | |
| CN208303255U (en) | A kind of product testing assembly line | |
| CN106054011A (en) | Automatic electric leakage detection platform for electric leakage circuit breaker | |
| CN110560378A (en) | Test line | |
| CN116256240A (en) | Precast slab on-line measuring device | |
| CN116008715A (en) | Parallel testing and packaging integrated machine for ceramic dielectric filter | |
| KR101216359B1 (en) | Device inspection apparatus | |
| CN113608107A (en) | Circuit board test equipment with double channels | |
| KR101291583B1 (en) | Device inspection apparatus and apparatus for pressing device therefor | |
| CN115593873A (en) | Send board test assembly line | |
| CN211330305U (en) | Test line | |
| CN115327287A (en) | Workpiece testing device | |
| CN210775743U (en) | Production system for chip detection and packaging and electrical property testing device thereof | |
| CN111069084A (en) | UV curing detection device | |
| TWI535627B (en) | Electronic components operating equipment | |
| CN218567548U (en) | VCM motor terminal electric measurement detection device | |
| CN108974784A (en) | A kind of chip mounter pcb board conveying device | |
| CN214638301U (en) | Battery detection system | |
| CN218433346U (en) | Send board test assembly line | |
| CN111044839B (en) | Electronic component testing apparatus | |
| CN116507041B (en) | Chip mounter is used in production of accurate electronic components | |
| CN210557745U (en) | Transmission device | |
| CN217748158U (en) | Product detection device | |
| CN217062806U (en) | Binding post automatic feeding mechanism |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |