CN113573349A - Performance test system and method of millimeter wave communication equipment - Google Patents
Performance test system and method of millimeter wave communication equipment Download PDFInfo
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- CN113573349A CN113573349A CN202111126338.8A CN202111126338A CN113573349A CN 113573349 A CN113573349 A CN 113573349A CN 202111126338 A CN202111126338 A CN 202111126338A CN 113573349 A CN113573349 A CN 113573349A
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- H04B17/0087—Monitoring; Testing using service channels; using auxiliary channels using auxiliary channels or channel simulators
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- H04B17/30—Monitoring; Testing of propagation channels
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Abstract
The invention discloses a performance test system and a method of millimeter wave communication equipment, in the test system, the process of transmitting information in a logic channel to any intermediate frequency channel for sending is completed in a channel simulator, devices such as a radio frequency switch matrix and the like are not needed, the construction difficulty of the equipment is obviously reduced, the overall cost of the test system is reduced, and the loss is reduced. The mapping from a small number of logic channels to any port between a large number of intermediate frequency channels is realized by software switching in the channel simulator, the power dynamic range of the test system is improved, and the flexibility of the test system is improved. The use of the millimeter wave active dual-polarized antenna reduces the link loss and further improves the dynamic power range of the system. In addition, the test system can completely realize end-to-end test from the millimeter wave base station to the millimeter wave terminal, and is suitable for various millimeter wave application scenes.
Description
Technical Field
The invention belongs to the technical field of 5G air interface test, and particularly relates to a performance test system and method of millimeter wave communication equipment.
Background
Millimeter wave technology is one of the key technologies of fifth generation mobile communication (5G), and the abundant spectrum resources can realize the instant transmission of mass data. For 5G millimeter wave equipment, an antenna and a radio frequency channel are integrally designed, a port for radio frequency measurement is not available, a traditional conduction test method cannot be implemented, and an air interface (OTA) test is a main test method for the millimeter wave equipment.
The OTA test can be divided into a radio frequency test and a performance test according to the test type. The radio frequency test mainly aims at measuring radio frequency indexes of equipment such as transmission power, stray and the like and is performed in the equipment consistency test; the performance test mainly aims at the overall performance index test of the equipment such as throughput and the like, and can reflect the overall performance of the equipment.
The main means of the OTA performance test include a radiation two-step method, a reverberation method and a multi-probe method, and in the performance test of millimeter wave equipment, the multi-probe method is commonly used, has been adopted by the 3GPP international standardization organization, and is written in a technical report TR38.827 and a technical standard TS 38.151.
The multi-probe method is characterized in that a plurality of dual-polarized antenna probes are arranged in a darkroom environment and different weight coefficients are given to each probe, so that spatial angle information of an MIMO channel environment is simulated in a region to be measured in the darkroom, and other information of the MIMO channel is generated through a channel simulator. The placement position and the weight coefficient of the dual-polarized antenna probe are obtained through optimization, different probe positions and probe coefficients are combined for different channel models, and the probe and the logical channel resources in the channel simulator are in a one-to-one mapping (bijective) relationship.
In order to ensure the testing accuracy, the positions of activated probes and corresponding weight coefficients under different MIMO channel models are usually different, and under a normal condition, the logical channel resources of a channel simulator are limited, so for different channel models, for deployed antenna probes, probe position points corresponding to the number of the logical channel resources of the channel simulator need to be selected from the deployed antenna probes, and this process is generally implemented by using a radio frequency switch matrix, and the number of probes corresponding to the number of the logical resource ports of the channel simulator is selected from a plurality of dual-polarized antenna probes by using the radio frequency switch matrix for signal transmission. However, the rf switch matrix is generally complex to construct, and the insertion loss of the link increases with the number of ports. For the radio frequency switch matrix with a large number of ports, the cost is expensive and the loss is large, so that the overall cost of the test system is increased, and the implementation of the test scheme is limited.
On the other hand, in the current millimeter wave multi-probe test scheme, the millimeter wave dual-polarization probe is connected with the millimeter wave power frequency conversion module through a coaxial cable, and the length of the coaxial cable is long, so that the link loss of millimeter wave signals is large, the dynamic range of the test system is influenced, and the test precision and the power test range of the test system are limited.
Disclosure of Invention
The purpose of the invention is as follows: in order to overcome the defects of the prior art, the invention provides a performance test system of millimeter wave communication equipment, which can improve the dynamic test range and the test flexibility and realize efficient and accurate evaluation on the overall performance of millimeter wave base station equipment and terminal equipment.
Another object of the present invention is to provide a testing method for the performance testing system of the millimeter wave communication device.
The technical scheme is as follows: the performance test system of millimeter wave communication equipment comprises a base station performance test part, a terminal performance test part, a channel simulator, a local oscillator distributor and a controller, wherein the base station performance test part is used for testing the performance of a terminal; the base station performance testing part and the terminal performance testing part respectively comprise a darkroom, a plurality of millimeter wave active dual-polarized probes which are arranged in the darkroom in an array mode and point to the same region to be tested, a supporting device used for supporting a target to be tested in the region to be tested, and an intermediate frequency cable correspondingly connected with the millimeter wave active dual-polarized probes; the channel simulator comprises a logic processing unit, a plurality of logic channels and a plurality of intermediate frequency channels; the logic processing unit is internally provided with a port switching module, and the logic channel is connected with the logic processing unit; the logic channel and the intermediate frequency channel are correspondingly divided into two groups, and the two groups respectively correspond to the base station performance testing part and the terminal performance testing part; in each group, any logic channel is logically connected with all intermediate frequency channels, and the port mapping of the logic channel and any intermediate frequency channel controls the switching through the port switching module; the port of the intermediate frequency channel is correspondingly connected with the intermediate frequency cable; the local oscillator distributor and the controller provide unified local oscillator signals and control signals for the millimeter wave active dual-polarized probe.
And output signals of the millimeter wave active dual-polarized probe are intermediate-frequency signals with the frequency less than 6 GHz.
Specifically, in each group, the number of logic channels is less than the number of intermediate frequency channels.
In one embodiment, the base station performance testing part and the terminal performance testing part each further include an arch frame disposed in the darkroom, and the millimeter wave active dual-polarized probes are distributed in a spherical area on the arch frame with the area to be tested as a center of sphere.
In one embodiment, the horizontal opening angle of the spherical area on the arch frame of the base station performance test part is 120 degrees, and the vertical opening angle is 40 degrees; the horizontal opening angle of the spherical area on the arch frame of the terminal performance testing part is 60 degrees, and the vertical opening angle is 30 degrees. The setting of the base station performance testing part can meet the cell coverage angle of most base stations, and the spatial angle information of the MIMO multi-path channel at the base station side is simulated in the coverage area; the spatial angle information of the MIMO multi-path channel at the terminal side in the angle area can be simulated by setting the terminal performance testing part.
In one embodiment, the angle interval between two adjacent millimeter wave active dual-polarized probes is 5 °.
In one embodiment, the supporting device of the base station performance testing part is a metal holding pole fixedly arranged in a dark room of the base station performance testing part; the supporting device of the terminal performance testing part is a two-dimensional rotary table arranged in a darkroom of the terminal performance testing part, and the posture of the tested terminal is adjusted through rotation of the azimuth and the polarization angle.
In one embodiment, the dark chamber comprises a shell of an all-metal structure and a wave-absorbing material covered inside the shell.
Corresponding to the performance test system of the millimeter wave communication equipment, the technical scheme adopted by the test method comprises the following steps: obtaining an activated millimeter wave active dual-polarized probe and a corresponding weight coefficient thereof by combining a probe optimization algorithm according to an MIMO channel model at a base station side and/or a terminal side, thereby determining a port of an intermediate frequency channel corresponding to the activated millimeter wave active dual-polarized probe, controlling and switching a logical channel and port mapping of the intermediate frequency channel by the port switching module, further creating an MIMO multipath channel environment at the base station side and/or the terminal side in a coverage area of the base station and/or the terminal by using the activated millimeter wave active dual-polarized probe and the channel simulator, and completing the performance test of a target to be tested in a darkroom environment; and adjusting the posture of the tested terminal by combining with a supporting device of the terminal performance testing part, and completing the performance test of the tested terminal under different postures in a darkroom environment.
Specifically, the method for mapping and switching any port between the small number of logic channels and the large number of intermediate frequency channels by the port switching module is as follows:
the number of logical channels of each group in the channel simulator isMThe number of intermediate frequency channels isNAny one of the logic channels is logically connected with all the intermediate frequency channels, andM<N；
the logic channel sending information corresponds to the information of a single cluster in the MIMO channel model, and the vector for the multipath signal information composed of all the clusters
Is shown in which
Is shown asiInformation sent by each logical channel;
after the software switching process of the channel simulator, the information sent by all the intermediate frequency channelsUsing vectors
Is shown in which
Is shown asjInformation sent by the intermediate frequency channels;
the process of a to B can be expressed as:
wherein T represents the implementation process of the port switching module, and
；
for elements in Tt ji The method comprises the following steps:
i.e. to implement a mapping procedure from a small number of logical channels to any port between a large number of intermediate frequency channels.
Has the advantages that: compared with the prior art, the process that the test system transmits the information in the logic channel to any intermediate frequency channel for sending is finished in the channel simulator, devices such as a radio frequency switch matrix and the like are not needed, the difficulty in constructing equipment is obviously reduced, the overall cost of the test system is reduced, and the loss is reduced. The mapping from a small number of logic channels to any port between a large number of intermediate frequency channels is realized by software switching in the channel simulator, the power dynamic range of the test system is improved, and the flexibility of the test system is improved. The use of the millimeter wave active dual-polarized antenna reduces the link loss and further improves the dynamic power range of the system. In addition, the test system can completely realize end-to-end test from the millimeter wave base station to the millimeter wave terminal, and is suitable for various millimeter wave application scenes.
Drawings
Fig. 1 is a block diagram of a performance testing system of a millimeter wave communication device in an embodiment of the present invention;
FIG. 2 is a schematic diagram of port mapping between a logic channel and an intermediate frequency channel in a channel simulator according to an embodiment of the present invention;
fig. 3 is a schematic layout diagram of millimeter wave active dual-polarized probes of a base station performance testing part on an arch frame in the embodiment of the present invention;
fig. 4 is a schematic layout diagram of millimeter wave active dual-polarized probes of the terminal performance testing part on an arch frame in the embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings.
As shown in fig. 1, the performance testing system of the millimeter wave communication device is a dual-darkroom testing system with multiple probes, and includes a base station performance testing part, a terminal performance testing part, a channel simulator, a local oscillator distributor and a controller.
The base station performance testing part is used for millimeter wave base station performance testing, and the terminal performance testing part is used for millimeter wave terminal performance testing. The structure of both comprises a darkroom, a plurality of millimeter wave active dual-polarized probes, a supporting device and an intermediate frequency cable. The darkroom is provided with a shell of an all-metal structure, plays a role in shielding external electromagnetic waves, and the shell is internally covered with wave-absorbing materials. In the millimeter wave active dual-polarized probe, an integrated design is adopted between a dual-polarized antenna and a millimeter wave frequency conversion circuit, the antenna and the frequency conversion circuit are not connected by a coaxial cable, and an output signal is an intermediate-frequency signal with the frequency less than 6 GHz. The millimeter wave active dual-polarized probe and the measured target are arranged in a non-contact mode, specifically, an arch frame is arranged in a darkroom, a millimeter wave active dual-polarized probe array is arranged in a spherical area on the arch frame, the area to be measured serves as a sphere center, angle information in a millimeter wave multipath channel is simulated in the area to be measured in a radiation mode, and meanwhile, the measured target is supported in the area to be measured through a supporting device. Each millimeter wave active dual-polarized probe is correspondingly connected with an intermediate frequency cable and is connected with a port of the channel simulator through the intermediate frequency cable, and an intermediate frequency signal with the output frequency less than 6GHz is used as an output signal to be transmitted with the channel simulator.
In this embodiment, the number of millimeter wave active dual-polarized probes in the performance testing section of the base station is recorded asLAs shown in fig. 3, the horizontal angle interval and the vertical angle interval of the array arrangement are both 5 °. The horizontal opening angle of the spherical area on the arch frame is 120 degrees, the vertical opening angle is 40 degrees, and the arrangement can meet the cell coverage angle of most base stations. The supporting device is a metal holding pole, is arranged in the darkroom and supports the base station to be measured in the area to be measured at the center of the sphere.
The number of millimeter wave active dual-polarized probes of the terminal performance test part is recorded asNAs shown in fig. 4, the horizontal angle interval and the vertical angle interval of the array arrangement are both 5 °. The horizontal opening angle of the spherical area on the arch frame is 60 degrees, and the vertical opening angle is 30 degrees. The supporting device is a two-dimensional rotary table, is arranged in a darkroom, supports the base station to be measured in the area to be measured at the center of a sphere, and can adjust the posture of the terminal to be measured through the rotation of the orientation and the polarization angle.
As shown in fig. 2, the channel simulator includes a logic processing unit, a plurality of logic channels, and a plurality of intermediate frequency channels. The intermediate frequency channels correspond to ports on the channel simulator one by one. The resources in the channel simulator are divided into two groups respectively corresponding to a base station performance testing part and a terminal performance testing part, each group is provided with a plurality of logic channels and a plurality of intermediate frequency channels, any logic channel and all the intermediate frequency channels are logically connected in each group, and the corresponding port mapping of the logic channels and any intermediate frequency channels controls the switching through a port switching module. The ports of the two groups are respectively connected with the intermediate frequency cables of the base station performance testing part and the terminal performance testing part.
Referring to fig. 2 again, in the present embodiment, the number of logical channels in the group corresponding to the base station performance testing part is recorded asQThe number of the intermediate frequency channels is consistent with the number of the corresponding millimeter wave active dual-polarized probes and is recorded asLIs provided withQ<LAnd in generalQ<<L. To pairThe number of logical channels in the group of the terminal performance test part is recorded asMThe number of the intermediate frequency channels is consistent with the number of the corresponding millimeter wave active dual-polarized probes and is recorded asNIs provided withM<NAnd in generalM<<N。
Because the frequency conversion module exists in the millimeter wave active dual-polarized probe, in order to realize the frequency synchronization of the whole test system, the local oscillation signals and the control signals of all the millimeter wave active dual-polarized probes are respectively and uniformly provided by the local oscillation distributor and the controller.
The test method of the performance test system of the millimeter wave communication equipment comprises the steps of obtaining activated millimeter wave active dual-polarized probes and corresponding weight coefficients thereof according to MIMO channel models at a base station side and/or a terminal side and by combining probe optimization algorithms (only existing optimization algorithms), wherein the number of the activated millimeter wave active dual-polarized probes is equal to the number of logic channels in a corresponding group of the channel simulator, and therefore ports of intermediate frequency channels corresponding to the activated millimeter wave active dual-polarized probes are determined. The port switching module is used for controlling the port mapping of the switching logic channel and the intermediate frequency channel, and then an activated millimeter wave active dual-polarized probe and the channel simulator are used for creating an MIMO multi-path channel environment at the base station side and/or the terminal side in the coverage area of the base station and/or the terminal, and the performance of the tested target is tested in a darkroom environment;
and for the terminal performance testing part, the posture of the tested terminal is adjusted by combining the two-dimensional rotary table, and the performance testing of the tested terminal under different postures is completed in a darkroom environment.
In order to replace a radio frequency switch matrix, the invention improves the power dynamic range and the test flexibility of a test system by using a millimeter wave active probe and a soft switching mode in a channel simulator, wherein the soft switching mode is also called a port switching module of the invention, namely, the port switching module is used for mapping and switching any port between a small number of logic channels and a large number of intermediate frequency channels. The method is that (the following parameters take a terminal as an example, and the base station side also has the same principle):
the number of logical channels of each group in the channel simulator isMThe number of intermediate frequency channels isNAny one of the logic channels is logically connected with all the intermediate frequency channels, andM<Nin general, the conditionsM<<N；
The logic channel transmission information corresponds to the information of a single cluster in the MIMO channel model, and the vector for the multipath signal information composed of all the clusters
Is shown in which
Is shown asiInformation sent by each logical channel;
after the software switching process of the channel simulator, all the vectors for the information sent by the intermediate frequency channels
Is shown in which
Is shown asjInformation sent by the intermediate frequency channels;
the process of a to B can be represented as
：
Wherein T represents the implementation process of the port switching module, and
；
for elements in Tt ji The method comprises the following steps:
the mapping process from the logic channels with small number to any port between the intermediate frequency channels with large number is realized in the channel simulator, the flexibility of the test system is increased, and the insertion loss of the test system caused by the radio frequency switch is further reduced.
Claims (10)
1. A performance test system of millimeter wave communication equipment is characterized by comprising a base station performance test part, a terminal performance test part, a channel simulator, a local oscillator distributor and a controller;
the base station performance testing part and the terminal performance testing part respectively comprise a darkroom, a plurality of millimeter wave active dual-polarized probes which are arranged in the darkroom in an array mode and point to the same region to be tested, a supporting device used for supporting a target to be tested in the region to be tested, and an intermediate frequency cable correspondingly connected with the millimeter wave active dual-polarized probes;
the channel simulator comprises a logic processing unit, a plurality of logic channels and a plurality of intermediate frequency channels; the logic processing unit is internally provided with a port switching module, and the logic channel is connected with the logic processing unit; the logic channel and the intermediate frequency channel are correspondingly divided into two groups, and the two groups respectively correspond to the base station performance testing part and the terminal performance testing part; in each group, any logic channel is logically connected with all intermediate frequency channels, and the port mapping of the logic channel and any intermediate frequency channel controls the switching through the port switching module; the port of the intermediate frequency channel is correspondingly connected with the intermediate frequency cable;
the local oscillator distributor and the controller provide unified local oscillator signals and control signals for the millimeter wave active dual-polarized probe.
2. The performance testing system of millimeter wave communication equipment of claim 1, characterized in that, the output signals of the millimeter wave active dual-polarized probe are all intermediate frequency signals with a frequency less than 6 GHz.
3. The performance testing system of millimeter wave communication devices of claim 1, characterized in that in each group, the number of logical channels is less than the number of intermediate frequency channels.
4. The performance test system of millimeter wave communication equipment of claim 1, characterized in that, the base station performance test section and the terminal performance test section each further comprise an arch frame disposed in the dark room, and the millimeter wave active dual-polarized probes are distributed in a spherical area on the arch frame with the area to be tested as a sphere center.
5. The performance test system of millimeter wave communication equipment according to claim 4, characterized in that the horizontal field angle of the spherical area on the arch of the base station performance test section is 120 ° and the vertical field angle is 40 °; the horizontal opening angle of the spherical area on the arch frame of the terminal performance testing part is 60 degrees, and the vertical opening angle is 30 degrees.
6. The performance testing system of millimeter wave communication equipment according to claim 4 or 5, characterized in that, the angular interval between two adjacent millimeter wave active dual-polarized probes is 5 °.
7. The performance testing system of millimeter wave communication equipment according to claim 1, characterized in that the supporting means of the base station performance testing section is a metal holding pole fixedly arranged in a dark room thereof; the supporting device of the terminal performance testing part is a two-dimensional rotary table arranged in a darkroom of the terminal performance testing part, and the posture of the tested terminal is adjusted through rotation of the azimuth and the polarization angle.
8. The performance testing system of millimeter wave communication equipment according to claim 1, characterized in that the darkroom comprises a shell of all-metal structure and a wave-absorbing material covered inside the shell.
9. A performance test method of a millimeter wave communication device, characterized in that the method is implemented based on the performance test system of the millimeter wave communication device of claim 1; the method comprises the following steps: obtaining an activated millimeter wave active dual-polarized probe and a corresponding weight coefficient thereof by combining a probe optimization algorithm according to an MIMO channel model at a base station side and/or a terminal side, thereby determining a port of an intermediate frequency channel corresponding to the activated millimeter wave active dual-polarized probe, controlling and switching a logical channel and port mapping of the intermediate frequency channel by the port switching module, further creating an MIMO multipath channel environment at the base station side and/or the terminal side in a coverage area of the base station and/or the terminal by using the activated millimeter wave active dual-polarized probe and the channel simulator, and completing the performance test of a target to be tested in a darkroom environment;
and adjusting the posture of the tested terminal by combining with a supporting device of the terminal performance testing part, and completing the performance test of the tested terminal under different postures in a darkroom environment.
10. The performance testing method of millimeter wave communication equipment according to claim 9, wherein the method for mapping switching of any port between a small number of logic channels and a large number of intermediate frequency channels by the port switching module is as follows:
the number of logic channels of each group in the channel simulator isMThe number of intermediate frequency channels isNAny one of the logic channels is logically connected with all the intermediate frequency channels, andM<N；
the logic channel sending information corresponds to the information of a single cluster in the MIMO channel model, and the vector for the multipath signal information composed of all the clusters
Is shown in which
Is shown asiInformation sent by each logical channel;
after the software switching process of the channel simulator, all the vectors for the information sent by the intermediate frequency channels
Is shown in which
Is shown asjInformation sent by the intermediate frequency channels;
the process of a to B can be represented as
：
Wherein T represents the implementation process of the port switching module, and
；
for elements in Tt ji The method comprises the following steps:
i.e. to implement a mapping procedure from a small number of logical channels to any port between a large number of intermediate frequency channels.
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