CN113552471A - Method, device, equipment and medium for detecting inductance parallel PN junction circuit - Google Patents
Method, device, equipment and medium for detecting inductance parallel PN junction circuit Download PDFInfo
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Abstract
The application provides a detection method, a device, equipment and a medium for an inductor parallel PN junction circuit, wherein the method comprises the following steps: acquiring waveform data of an alternating current excitation signal and a first output signal of a standard inductor parallel PN junction circuit; wherein the first output signal is an output signal of the standard inductor parallel PN junction circuit when the alternating current excitation signal is used as the input of the standard inductor parallel PN junction circuit; taking the alternating current excitation signal as the input of the inductor to be tested parallel to the PN junction circuit to obtain a second output signal of the inductor to be tested parallel to the PN junction circuit; generating quality prompt information of the inductor to be tested parallel PN junction circuit according to the comparison result of the waveform data of the first output signal and the waveform data of the second output signal; and sending the quality prompt information of the inductor to be tested parallel PN junction circuit to an employee terminal so that the employee terminal displays the quality prompt information of the inductor to be tested parallel PN junction circuit.
Description
Technical Field
The application relates to the field of circuit detection, in particular to a method, a device, equipment and a medium for detecting an inductor parallel PN junction circuit.
Background
The PN junction has the characteristics of forward conduction and reverse cut-off, and is widely applied to electronic circuits of various products, such as computers, mobile phones, chips of various digital products, LED lamps, solar cells, optical communication lasers, detectors and the like. Due to the reverse cut-off characteristic of the PN junction, the back electromotive force released by the inductor in the circuit can be prevented from breaking down the components in the circuit, and therefore, the PN junction is generally connected in parallel with the inductor in the circuit.
The parallel circuit of the PN junction and the inductor is welded in a circuit board of a product in a welding mode, but the quality defect of the parallel circuit of the PN junction and the inductor can be caused by welding errors in the welding process.
Disclosure of Invention
In view of this, an object of the present application is to provide a method, an apparatus, a device, and a medium for detecting an inductor parallel PN junction circuit, which are used to solve the problem of low accuracy in determining a quality defect in the inductor parallel PN junction circuit in the prior art.
In a first aspect, an embodiment of the present application provides a method for detecting an inductor parallel PN junction circuit, including:
acquiring waveform data of an alternating current excitation signal and a first output signal of a standard inductor parallel PN junction circuit; wherein the first output signal is an output signal of the standard inductor parallel PN junction circuit when the alternating current excitation signal is used as the input of the standard inductor parallel PN junction circuit;
taking the alternating current excitation signal as the input of the inductor to be tested parallel to the PN junction circuit to obtain a second output signal of the inductor to be tested parallel to the PN junction circuit;
generating quality prompt information of the inductor to be tested parallel PN junction circuit according to the comparison result of the waveform data of the first output signal and the waveform data of the second output signal;
and sending the quality prompt information of the inductor to be tested parallel PN junction circuit to an employee terminal so that the employee terminal displays the quality prompt information of the inductor to be tested parallel PN junction circuit.
Optionally, the waveform data is a peak value, a trough value and a waveform shape of a waveform corresponding to the output signal in the unit period; according to the comparison result of the waveform data of the first output signal and the waveform data of the second output signal, generating quality prompt information of the to-be-detected inductor parallel PN junction circuit, which comprises the following steps:
if the comparison result is that the difference between the absolute value of the wave peak value of the first output signal and the absolute value of the wave peak value of the second output signal is smaller than a first preset difference value, the difference between the absolute value of the wave valley value of the first output signal and the absolute value of the wave valley value of the second output signal is smaller than a second preset difference value, and the crest truncation direction in the waveform shape of the first output signal is consistent with the crest truncation direction in the waveform shape of the second output signal, determining that the inductance parallel PN junction circuit to be tested has no quality problem, and generating quality prompt information that the inductance parallel PN junction circuit to be tested has no quality problem;
if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal in the comparison result is not less than a first preset difference, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is not less than a second preset difference, and the direction of clipping the waveform shape of the first output signal is not consistent with the direction of clipping the waveform shape of the second output signal, determining the quality defect of the inductor parallel PN junction circuit to be tested according to any one of the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal and the waveform shape of the first output signal, and generating quality prompt information of the quality defect of the inductor parallel PN junction circuit to be tested.
Optionally, determining the quality defect of the inductor parallel PN junction circuit to be tested according to at least one of a difference between an absolute value of a peak value of the first output signal and an absolute value of a peak value of the second output signal, a difference between an absolute value of a valley value of the first output signal and an absolute value of a valley value of the second output signal, and a waveform shape of the first output signal, includes:
and if the difference between the absolute value of the wave peak value of the first output signal and the absolute value of the wave peak value of the second output signal in the comparison result is smaller than a first preset difference value, the difference between the absolute value of the wave valley value of the first output signal and the absolute value of the wave valley value of the second output signal is not smaller than a second preset difference value, and no top clipping exists in the waveform shape of the second output signal, determining that the quality defect of the inductance parallel PN junction circuit to be detected is PN junction open circuit.
Optionally, determining the quality defect of the inductor parallel PN junction circuit to be tested according to at least one of a difference between an absolute value of a peak value of the first output signal and an absolute value of a peak value of the second output signal, a difference between an absolute value of a valley value of the first output signal and an absolute value of a valley value of the second output signal, and a waveform shape of the first output signal, includes:
and if the absolute value of the wave peak value of the second output signal in the comparison result is equal to the alternating current excitation signal, the difference between the absolute value of the wave valley value of the first output signal and the absolute value of the wave valley value of the second output signal is not less than a second preset difference value, and the direction of the top cutting in the waveform shape of the first output signal is opposite to the direction of the top cutting in the waveform shape of the second output signal, determining that the quality defect of the inductance parallel PN junction circuit to be detected is PN junction reverse installation.
Optionally, determining the quality defect of the inductor parallel PN junction circuit to be tested according to at least one of a difference between an absolute value of a peak value of the first output signal and an absolute value of a peak value of the second output signal, a difference between an absolute value of a valley value of the first output signal and an absolute value of a valley value of the second output signal, and a waveform shape of the first output signal, includes:
and if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal in the comparison result is not smaller than a first preset difference value, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is smaller than a second preset difference value, the absolute value of the peak value of the second output signal is equal to the absolute value of the valley value of the second output signal, and the crest direction in the waveform shape of the first output signal is consistent with the crest direction in the waveform shape of the second output signal, determining that the quality defect of the inductance parallel PN junction circuit to be tested is inductance disconnection.
Optionally, the quality prompt information further includes a maintenance strategy of the parallel PN junction circuit of the inductor to be tested; the detection method further comprises the following steps:
and determining a maintenance strategy aiming at the inductance parallel PN junction circuit to be detected according to different quality defects of the inductance parallel PN junction circuit to be detected.
Optionally, the alternating current excitation signal is determined based on alternating current impedance characteristics and PN junction characteristics of an inductor in the standard inductor parallel PN junction circuit.
In a second aspect, an embodiment of the present application provides a detection apparatus for an inductive parallel PN junction circuit, including:
the acquisition module is used for acquiring waveform data of an alternating current excitation signal and a first output signal of a standard inductor parallel PN junction circuit; wherein the first output signal is an output signal of the standard inductor parallel PN junction circuit when the alternating current excitation signal is used as the input of the standard inductor parallel PN junction circuit;
the output module is used for taking the alternating current excitation signal as the input of the inductor to be detected parallel to the PN junction circuit to obtain a second output signal of the inductor to be detected parallel to the PN junction circuit;
the generating module is used for generating quality prompt information of the inductor to be tested parallel PN junction circuit according to the comparison result of the waveform data of the first output signal and the waveform data of the second output signal;
and the prompting module is used for sending quality prompting information of the inductor to be tested parallel PN junction circuit to an employee terminal so as to enable the employee terminal to display the quality prompting information of the inductor to be tested parallel PN junction circuit.
In a third aspect, an embodiment of the present application provides a computer device, which includes a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor implements the steps of the detection method when executing the computer program.
In a fourth aspect, the present application provides a computer-readable storage medium, on which a computer program is stored, where the computer program is executed by a processor to perform the steps of the detection method.
The method for detecting the inductance parallel PN junction circuit comprises the steps of firstly, acquiring waveform data of an alternating current excitation signal and a first output signal of a standard inductance parallel PN junction circuit; wherein the first output signal is an output signal of the standard inductor parallel PN junction circuit when the alternating current excitation signal is used as the input of the standard inductor parallel PN junction circuit; secondly, the alternating current excitation signal is used as the input of the inductor to be detected parallel to the PN junction circuit, and a second output signal of the inductor to be detected parallel to the PN junction circuit is obtained; thirdly, according to the comparison result of the waveform data of the first output signal and the waveform data of the second output signal, generating quality prompt information of the to-be-detected inductor parallel PN junction circuit; and finally, sending the quality prompt information of the inductor to be tested parallel PN junction circuit to an employee terminal so that the employee terminal displays the quality prompt information of the inductor to be tested parallel PN junction circuit.
In some embodiments, whether the waveform data of the second output signal of the inductor parallel PN junction circuit to be detected has a quality problem is determined according to the comparison result of the waveform data of the second output signal of the inductor parallel PN junction circuit to be detected and the waveform data of the first output signal of the standard inductor parallel PN junction circuit to be detected, the accuracy of determining the quality defect in the inductor parallel PN junction circuit to be detected is improved, and quality prompt information is sent to an employee terminal, so that an operator can know the quality of the inductor parallel PN junction circuit to be detected as soon as possible, then next-step production or maintenance is carried out based on the quality of the inductor parallel PN junction circuit to be detected, and the production efficiency and the production quality of a product with the inductor parallel PN junction circuit to be detected are improved.
In order to make the aforementioned objects, features and advantages of the present application more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained from the drawings without inventive effort.
Fig. 1 is a schematic flowchart of a detection method for an inductor parallel PN junction circuit according to an embodiment of the present disclosure;
fig. 2 is a schematic diagram of an inductive parallel PN junction circuit according to an embodiment of the present disclosure;
FIG. 3 is a schematic diagram of a waveform of a first output signal provided by an embodiment of the present application;
fig. 4 is a schematic diagram illustrating waveforms of a first second output signal provided in an embodiment of the present application;
fig. 5 is a schematic diagram of a waveform of a second output signal provided in an embodiment of the present application;
fig. 6 is a schematic diagram of waveforms of a third second output signal provided in an embodiment of the present application;
fig. 7 is a schematic structural diagram of a detection apparatus of an inductor parallel PN junction circuit according to an embodiment of the present disclosure;
fig. 8 is a schematic structural diagram of a computer device according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present application without making any creative effort, shall fall within the protection scope of the present application.
The inductance parallel PN junction circuit is welded in the circuit board in a welding mode, when the quality defect of the inductance parallel PN junction circuit is determined, the measurement is carried out by a method of applying direct current voltage, and the PN junction is characterized in that the PN junction is in a conducting state when the forward applied voltage of the PN junction is greater than the conducting voltage, and is in a stopping state when the reverse applied voltage of the PN junction is greater than the conducting voltage; and when the voltage is applied to the inductor in the forward and reverse directions, the inductor is in a conducting state. Therefore, when the direct current voltage is used for measuring the parallel connection of the direct current voltage and the direct current voltage, the measurement excitation is needed to output a large current, two different voltages are applied in the forward direction, one voltage is smaller than the PN junction conduction voltage, and only the current flowing through the inductor is measured; the other voltage is slightly greater than the turn-on voltage and the current flowing through both devices in common is measured. Since the inductor presents only the resistance of the winding resistor in the dc state, it is usually very small. Therefore, the direct current measurement method needs to measure excitation and has strong driving capability, a general direct current signal source cannot achieve the driving capability, and the realization difficulty is high. And because large current can not be applied to some elements for a long time, the risk of damaging the elements can exist when the current is large and the time is long, so that the measuring time is short, and large measuring errors can exist. In this case, the inductance loss condition can be accurately measured, but the PN junction loss condition is not easily detected, and a missing measurement condition exists.
Based on the above defects, an embodiment of the present application provides a method for detecting an inductor parallel PN junction circuit, as shown in fig. 1, including the following steps:
s101, acquiring waveform data of an alternating current excitation signal and a first output signal of a standard inductor parallel PN junction circuit; wherein the first output signal is an output signal of the standard inductor parallel PN junction circuit when the alternating current excitation signal is used as the input of the standard inductor parallel PN junction circuit;
s102, taking the alternating current excitation signal as the input of an inductor to be detected parallel to a PN junction circuit to obtain a second output signal of the inductor to be detected parallel to the PN junction circuit;
s103, generating quality prompt information of the inductor to be tested parallel PN junction circuit according to the comparison result of the waveform data of the first output signal and the waveform data of the second output signal;
and S104, sending the quality prompt information of the inductor to be tested parallel PN junction circuit to an employee terminal so that the employee terminal displays the quality prompt information of the inductor to be tested parallel PN junction circuit.
As shown in fig. 2, the inductor parallel PN junction circuit is formed by connecting an inductor and a PN junction in parallel, and after an ac excitation signal is used to excite the inductor parallel PN junction circuit, according to the ac impedance characteristic Lz =2 pi fL (f is a frequency, L is an inductance value, and Lz is an ac impedance characteristic of the inductor), when the inductance value is determined by the device to be constant, the impedance presented by the device is proportional to the frequency of the applied ac signal, and the impedance is increased as the frequency is increased. From ohm's law I = U/R (I is a current value, U is a voltage value, and R is a resistance value), it is known that, when a voltage is constant, the current is decreased as the resistance is increased. Therefore, the frequency of the alternating current measurement excitation signal is adjusted according to the inductance value, so that the alternating current measurement excitation signal presents larger impedance, the current flowing through the alternating current measurement excitation signal can be reduced, and the driving capability of a signal source is reduced. According to the characteristics of the PN junction, when the forward voltage applied to the PN junction is larger than the conduction voltage, the PN junction is conducted, and the forward voltage at the two ends of the PN junction is clamped. Therefore, when the amplitude of the applied alternating voltage is larger than the conducting voltage of the PN junction, the voltage waveform is truncated, and the truncated voltage is the conducting voltage of the PN junction. That is, after applying an ac excitation signal to the inductive parallel PN junction circuit without quality defects, an output signal waveform as shown in fig. 3 can be obtained. Whether the PN junction or the inductor has certain characteristics, when a manufacturer produces a part, the characteristic of the part is marked, such as the conduction voltage of the PN junction, the impedance of the inductor and the inductance value, so that the alternating current excitation signal to be applied can be determined based on the characteristic of the PN junction and the inductor. That is, the ac excitation signal is determined based on the ac impedance characteristic and the PN junction characteristic of the inductor in the standard inductor parallel PN junction circuit.
The ac measurement stimulus test method typically applies an ac voltage having a peak value of 1.5V, and equates the ac impedance value of the inductor to 2k ohms, thereby deducing an ac frequency of f =2000/(2 pi L). The alternating current excitation signal uses a 1k source resistor as a current limiting (to prevent short circuit fault on the parallel PN junction circuit of the inductor to be tested).
In step S101, the ac excitation signal is a signal having a fixed waveform, and may be ac voltage excitation. The standard inductance parallel PN junction circuit is an inductance parallel PN junction circuit without quality defects, namely an inductance parallel PN junction circuit without quality problems. The first output signal is the output signal of the standard inductor parallel PN junction circuit when the alternating current excitation signal is used as the input of the standard inductor parallel PN junction circuit. As shown in fig. 2, when an ac excitation signal is input to the power supply side (left side) of the inductor parallel PN junction circuit, an output signal can be obtained on the load side (right side) of the inductor parallel PN junction circuit. The output signal itself has a waveform, the waveform of the output signal can be displayed by the oscilloscope, and further waveform data is obtained through a waveform image displayed in the oscilloscope, the waveform data is attribute information of the waveform corresponding to the output signal, namely, the waveform data is the attribute information of the output signal. The waveform data is a peak value, a valley value and a waveform shape of a waveform corresponding to the output signal in a unit period. Taking a transverse wave as an example, a wave crest value is a numerical value corresponding to the highest point of the transverse wave above the abscissa axis, a wave trough value is a numerical value corresponding to the lowest point of the transverse wave below the abscissa axis, and a waveform shape is a shape of a curve formed by connecting points corresponding to all signals in a unit period. Therefore, after the alternating current excitation signal is input to the power supply side of the standard inductance parallel PN junction circuit, the first output signal can be obtained at the load side of the standard inductance parallel PN junction circuit.
In step S102, the inductor to be tested parallel to the PN junction circuit is a circuit that needs to perform quality problem detection. After an alternating current excitation signal is input to the power supply side of the inductor to be tested parallel to the PN junction circuit, a second output signal is obtained at the load side of the inductor to be tested parallel to the PN junction circuit.
In the step S103, the quality prompting information is used to prompt the staff whether the quality problem exists in the parallel PN junction of the inductor to be tested.
In specific implementation, each output signal has corresponding waveform data, and under the condition of applying the same alternating current excitation signal, whether the inductance parallel PN junction circuit to be detected has a quality problem or not can be accurately determined based on a comparison result of the waveform data of the inductance parallel PN junction circuit to be detected and the waveform data of the standard inductance parallel PN junction circuit to be detected. Therefore, after the quality of the inductor parallel PN junction circuit to be tested is determined, quality prompt information which can be used for prompting a worker needs to be generated. So that the quality prompt information can be seen by the working personnel to know the quality of the parallel PN junction circuit of the inductor to be tested.
In the step S104, the quality prompt information of the inductor parallel PN junction circuit to be tested is sent to the staff terminal, so that the staff can know the quality of the inductor parallel PN junction circuit to be tested as soon as possible, and then perform the next production or maintenance based on the quality of the inductor parallel PN junction circuit to be tested, thereby improving the production efficiency and the production quality of the product with the inductor parallel PN junction circuit to be tested.
According to the detection method of the inductor parallel PN junction circuit, whether the waveform data of the second output signal of the inductor parallel PN junction circuit to be detected has quality problems or not is determined according to the comparison result of the waveform data of the second output signal of the inductor parallel PN junction circuit to be detected and the waveform data of the first output signal of the standard inductor parallel PN junction circuit to be detected, the accuracy of determining the quality defects in the inductor parallel PN junction circuit to be detected is improved, quality prompt information is sent to a staff terminal, staff can know the quality of the inductor parallel PN junction circuit to be detected as soon as possible, then next production or maintenance is carried out based on the quality of the inductor parallel PN junction circuit to be detected, and the production efficiency and the production quality of products with the inductor parallel PN junction circuit to be detected are improved.
When the quality of the inductor parallel PN junction circuit to be tested is determined, the quality of the inductor parallel PN junction circuit to be tested comprises quality problems and no quality problems. Based on the quality of the inductor to be tested parallel with the PN junction circuit, two kinds of quality prompt information can be generated. Therefore, step S103 includes:
step 1031, if the comparison result is that the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal is smaller than a first preset difference value, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is smaller than a second preset difference value, and the clipping direction in the waveform shape of the first output signal is consistent with the clipping direction in the waveform shape of the second output signal, determining that the inductance parallel PN junction circuit to be tested has no quality problem, and generating quality prompt information that the inductance parallel PN junction circuit to be tested has no quality problem;
step 1032, if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal is not smaller than a first preset difference, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is not smaller than a second preset difference, and the direction of the crest in the waveform shape of the first output signal is not consistent with the direction of the crest in the waveform shape of the second output signal, determining the quality defect of the to-be-tested parallel inductor PN junction circuit according to any one of the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal, and the waveform shape of the first output signal, and generating quality prompt information of the quality problem of the to-be-detected inductor parallel PN junction circuit.
In step 1031, after comparing the waveform data of the second output signal of the inductor parallel PN junction circuit to be tested with the corresponding data in the waveform data of the first output signal of the standard inductor parallel PN junction circuit, the following conditions exist: the difference between the absolute value of the wave peak value of the first output signal and the absolute value of the wave peak value of the second output signal is smaller than a first preset difference value, the difference between the absolute value of the wave valley value of the first output signal and the absolute value of the wave valley value of the second output signal is smaller than a second preset difference value, the top cutting direction in the waveform shape of the first output signal is consistent with the top cutting direction in the waveform shape of the second output signal, namely, the waveform diagram corresponding to the second output signal is consistent with the waveform diagram in fig. 3, so that the quality condition of the inductance parallel PN junction circuit to be detected is indicated to be free of quality problems, and further, the quality prompt information that the inductance parallel PN junction circuit to be detected is free of quality problems is generated according to the quality condition of the inductance parallel PN junction circuit to be detected.
In step 1032, when the waveform data of the second output signal of the inductor parallel PN junction circuit to be measured is compared with the corresponding data in the waveform data of the first output signal of the standard inductor parallel PN junction circuit, the following situations exist: the difference between the absolute value of the wave peak value of the first output signal and the absolute value of the wave peak value of the second output signal is not smaller than a first preset difference value, the difference between the absolute value of the wave valley value of the first output signal and the absolute value of the wave valley value of the second output signal is not smaller than a second preset difference value, and the direction of the top cutting in the waveform shape of the first output signal is not consistent with the direction of the top cutting in the waveform shape of the second output signal, so that the quality condition of the inductance parallel PN junction circuit to be detected is indicated as the quality defect, and further, the quality prompt information of the inductance parallel PN junction circuit to be detected is generated according to the quality condition of the inductance parallel junction circuit to be detected.
The quality defects of the inductance parallel PN junction circuit to be tested exist in various situations, such as PN junction open circuit (PN junction leakage welding), PN junction reverse installation, inductance open circuit and the like. For different situations, the waveform of the second output signal of the inductor parallel PN junction circuit to be tested may exhibit different characteristics, and therefore, specific analysis may be performed based on each information in the waveform data of the waveform corresponding to the second output signal, that is, when the PN junction in the inductor parallel PN junction circuit to be tested is open, step 1032 includes:
step 10321, if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal in the comparison result is smaller than a first preset difference, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is not smaller than a second preset difference, the absolute value of the peak value of the second output signal is equal to the absolute value of the valley value of the second output signal, and there is no vertex truncation in the waveform shape of the second output signal, determining that the quality defect of the inductor parallel junction circuit to be tested is a PN junction open circuit.
In step 10321, when the PN junction in the inductor parallel PN junction circuit to be tested is open, the truncated waveform generated by the characteristic of the PN junction disappears, and the voltage waveforms of the second output signals at the two ends of the inductor parallel PN junction circuit to be tested are as shown in fig. 4. Based on the comparison between the waveform image of the second output signal in fig. 4 and the waveform image of the first output signal in fig. 3, it is shown that the truncated peaks (flat regions) corresponding to the troughs appear in the waveform image of the second output signal, the absolute values of the peak values and the trough values of the second output signal are equal, and the difference between the absolute value of the trough values of the second output signal and the absolute value of the trough values of the second output signal is not less than a second preset difference (i.e., the absolute value of the trough values of the second output signal far exceeds the on-state voltage of the PN junction).
When the PN junction in the parallel PN junction circuit of the inductor to be tested is reversely mounted, step 1032 includes:
in step 10322, if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal in the comparison result is not smaller than a first preset difference, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is not smaller than a second preset difference, and the clipping direction in the waveform shape of the first output signal is opposite to the clipping direction in the waveform shape of the second output signal, it is determined that the quality defect of the to-be-measured inductor parallel PN junction circuit is a PN junction reverse installation.
In step 10322, when the PN junction in the inductor parallel PN junction circuit to be tested is reversely mounted, the clipping direction generated by the characteristic of the PN junction is opposite to the clipping direction of the waveform of the standard inductor parallel PN junction circuit, and the voltage waveform of the second output signal at both ends of the inductor parallel PN junction circuit to be tested is as shown in fig. 5. Based on the comparison between the waveform image of the second output signal in fig. 5 and the waveform image of the first output signal in fig. 3, the peak value in the waveform image of the second output signal has a peak clipping effect, the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal is not less than the first preset difference, and the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is not less than the second preset difference.
When the inductor of the inductor parallel PN junction circuit to be tested is open, step 1032 includes:
in step 10323, if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal in the comparison result is not smaller than a first preset difference, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is smaller than a second preset difference, the absolute value of the peak value of the second output signal is equal to the absolute value of the valley value of the second output signal, and the direction of the top-cut in the waveform shape of the first output signal is consistent with the direction of the top-cut in the waveform shape of the second output signal, it is determined that the quality defect of the inductor parallel PN junction circuit to be tested is an inductor open circuit.
In step 10323, when the inductor in the inductor parallel PN junction circuit to be tested is open-circuited, the topping direction generated by the PN junction characteristic is the same as the topping direction of the waveform of the standard inductor parallel PN junction circuit, the current flowing through the inductor disappears, the impedance at the two ends of the inductor parallel PN junction circuit to be tested appears infinite when the PN junction is cut off, and the voltage waveform of the second output signal at the two ends of the inductor parallel PN junction circuit to be tested is as shown in fig. 6. Based on the comparison between the waveform image of the second output signal in fig. 6 and the waveform image of the first output signal in fig. 3, the valley in the waveform image of the second output signal is truncated, the difference between the absolute value of the valley value of the second output signal and the absolute value of the valley value of the first output signal is not less than the second predetermined difference, the absolute value of the peak value of the second output signal is equal to the ac excitation signal (voltage value), and the peak value of the second output signal is much greater than the peak value of the first output signal.
The parallelly connected PN junction circuit of inductance that awaits measuring can have different quality problems, to different quality problems, needs adopt different solution, consequently, when the quality condition of the parallelly connected PN junction circuit of inductance that awaits measuring is reminded for the staff, can also, the maintenance scheme of suggestion staff to this quality problem, that is to say, this scheme still includes:
and 105, determining a maintenance strategy aiming at the inductor to be detected parallel PN junction circuit according to different quality defects of the inductor to be detected parallel PN junction circuit.
In the step 105, if the quality defect of the inductor parallel PN junction circuit to be measured is a PN junction open circuit, it indicates that the PN junction in the inductor parallel PN junction circuit to be measured is not well welded or the PN junction is not installed, and therefore, when the quality defect of the inductor parallel PN junction circuit to be measured is a PN junction open circuit, the maintenance strategy may be to re-weld the PN junction in the inductor parallel PN junction circuit to be measured. If the quality defect of the inductor parallel PN junction circuit to be tested is that the PN junction is reversely mounted, the maintenance strategy can be to remove the original PN junction in the inductor parallel PN junction circuit to be tested and weld a new PN junction again. If the quality defect of the inductor parallel PN junction circuit to be tested is inductor open circuit, the condition that the inductor in the inductor parallel PN junction circuit to be tested is not well welded or the inductor is neglected to be installed is indicated, and the maintenance strategy can be to weld the inductor in the inductor parallel PN junction circuit to be tested again. Therefore, when the quality condition of the inductance parallel PN junction circuit to be detected is prompted to the working personnel, a maintenance strategy for solving the quality defect is provided, the maintenance efficiency of the working personnel on the inductance parallel PN junction circuit to be detected with the quality defect is improved, the working efficiency of the working personnel is further improved, and the quality of a product using the inductance parallel PN junction circuit to be detected is also improved.
The embodiment of the present application provides a detection apparatus for an inductor parallel PN junction circuit, as shown in fig. 7, including:
an obtaining module 701, configured to obtain waveform data of an ac excitation signal and a first output signal of a standard inductor parallel PN junction circuit; wherein the first output signal is an output signal of the standard inductor parallel PN junction circuit when the alternating current excitation signal is used as the input of the standard inductor parallel PN junction circuit;
the output module 702 is configured to use the ac excitation signal as an input of the to-be-detected inductor parallel PN junction circuit to obtain a second output signal of the to-be-detected inductor parallel PN junction circuit;
a generating module 703, configured to generate quality prompt information of the to-be-detected inductor parallel PN junction circuit according to a comparison result between the waveform data of the first output signal and the waveform data of the second output signal;
the prompting module 704 is configured to send quality prompting information of the inductor to be tested parallel to the PN junction circuit to an employee terminal, so that the employee terminal displays the quality prompting information of the inductor to be tested parallel to the PN junction circuit.
Optionally, the generating module 703 includes:
a first generation unit, configured to determine that the inductor parallel PN junction circuit to be tested has no quality problem and generate quality prompt information indicating that the inductor parallel PN junction circuit to be tested has no quality problem if the comparison result indicates that a difference between an absolute value of a peak value of the first output signal and an absolute value of a peak value of the second output signal is smaller than a first preset difference, a difference between an absolute value of a valley value of the first output signal and an absolute value of a valley value of the second output signal is smaller than a second preset difference, and a clipping direction in a waveform shape of the first output signal is consistent with a middle clipping direction in a waveform shape of the second output signal;
a second generating unit, configured to determine a quality defect of the to-be-measured inductive parallel PN junction circuit according to any one of a difference between an absolute value of a peak value of the first output signal and an absolute value of a valley value of the second output signal, a difference between an absolute value of a valley value of the first output signal and an absolute value of a peak value of the second output signal, and a difference between a peak direction of the first output signal and a valley direction of a waveform shape of the second output signal, if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal is not smaller than a first preset difference, and if the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is not equal to the peak direction of the waveform shape of the second output signal in the comparison result, and generating quality prompt information of the quality defect of the inductor parallel PN junction circuit to be tested.
Optionally, the second generating unit includes:
and the first determining subunit is configured to determine that the quality defect of the inductor parallel PN junction circuit to be tested is a PN junction open circuit if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal in the comparison result is smaller than a first preset difference, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is not smaller than a second preset difference, and no truncation exists in the waveform shape of the second output signal.
Optionally, the second generating unit includes:
and the second determining subunit is configured to determine that the quality defect of the to-be-detected inductor parallel PN junction circuit is a PN junction reverse installation if the absolute value of the peak value of the second output signal in the comparison result is equal to the ac excitation signal, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is not smaller than a second preset difference value, and the direction of the vertex cut in the waveform shape of the first output signal is opposite to the direction of the vertex cut in the waveform shape of the second output signal.
Optionally, the second generating unit includes:
a third determining subunit, configured to determine that the quality defect of the to-be-detected inductive parallel PN junction circuit is an inductive open circuit if, in the comparison result, a difference between an absolute value of a peak value of the first output signal and an absolute value of a peak value of the second output signal is not smaller than a first preset difference, a difference between an absolute value of a valley value of the first output signal and an absolute value of a valley value of the second output signal is smaller than a second preset difference, the absolute value of the peak value of the second output signal is equal to the absolute value of the valley value of the second output signal, and a clipping direction in a waveform shape of the first output signal is consistent with a clipping direction in a waveform shape of the second output signal.
Optionally, the apparatus further includes:
and the fourth determining subunit is used for determining a maintenance strategy aiming at the inductance parallel PN junction circuit to be detected according to different quality defects of the inductance parallel PN junction circuit to be detected.
Optionally, the alternating current excitation signal is determined based on alternating current impedance characteristics and PN junction characteristics of an inductor in the standard inductor parallel PN junction circuit.
Corresponding to the detection method of the inductive parallel PN junction circuit in fig. 1, an embodiment of the present application further provides a computer apparatus 800, as shown in fig. 8, the apparatus includes a memory 801, a processor 802, and a computer program stored in the memory 801 and executable on the processor 802, wherein the processor 802 implements the detection method of the inductive parallel PN junction circuit when executing the computer program.
Specifically, the memory 801 and the processor 802 can be general memories and processors, which are not limited in particular, and when the processor 802 runs a computer program stored in the memory 801, the method for detecting the inductance parallel PN junction circuit can be executed, so that the problem of low accuracy in determining the quality defect in the inductance parallel PN junction circuit in the prior art is solved.
Corresponding to the method for detecting the inductive parallel PN junction circuit in fig. 1, an embodiment of the present application further provides a computer-readable storage medium, where a computer program is stored on the computer-readable storage medium, and the computer program is executed by a processor to perform the steps of the method for detecting the inductive parallel PN junction circuit.
Specifically, the storage medium can be a general storage medium, such as a mobile magnetic disk, a hard disk and the like, when a computer program on the storage medium is operated, the detection method of the inductance parallel PN junction circuit can be executed, the problem that the accuracy of determining the quality defect in the inductance parallel PN junction circuit in the prior art is low is solved, whether the quality problem exists in the waveform data of the second output signal of the inductance parallel PN junction circuit to be detected or not is determined through the comparison result of the waveform data of the second output signal of the inductance parallel PN junction circuit to be detected and the waveform data of the first output signal of the standard inductance parallel PN junction circuit, the accuracy of determining the quality defect in the inductance parallel PN junction circuit to be detected is improved, quality prompt information is sent to an employee terminal, and an employee can know the quality of the inductance parallel PN junction circuit to be detected as soon as possible, and then, the next production or maintenance is carried out based on the quality of the inductor parallel PN junction circuit to be detected, so that the production efficiency and the production quality of the product with the inductor parallel PN junction circuit to be detected are improved.
In the embodiments provided in the present application, it should be understood that the disclosed method and apparatus may be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one logical division, and there may be other divisions when actually implemented, and for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some communication interfaces, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments provided in the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present application or portions thereof that substantially contribute to the prior art may be embodied in the form of a software product stored in a storage medium and including instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus once an item is defined in one figure, it need not be further defined and explained in subsequent figures, and moreover, the terms "first", "second", "third", etc. are used merely to distinguish one description from another and are not to be construed as indicating or implying relative importance.
Finally, it should be noted that: the above-mentioned embodiments are only specific embodiments of the present application, and are used for illustrating the technical solutions of the present application, but not limiting the same, and the scope of the present application is not limited thereto, and although the present application is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: any person skilled in the art can modify or easily conceive the technical solutions described in the foregoing embodiments or equivalent substitutes for some technical features within the technical scope disclosed in the present application; such modifications, changes or substitutions do not depart from the spirit and scope of the present disclosure, which should be construed in light of the above teachings. Are intended to be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. A detection method of an inductance parallel PN junction circuit is characterized by comprising the following steps:
acquiring waveform data of an alternating current excitation signal and a first output signal of a standard inductor parallel PN junction circuit; wherein the first output signal is an output signal of the standard inductor parallel PN junction circuit when the alternating current excitation signal is used as the input of the standard inductor parallel PN junction circuit;
taking the alternating current excitation signal as the input of the inductor to be tested parallel to the PN junction circuit to obtain a second output signal of the inductor to be tested parallel to the PN junction circuit;
generating quality prompt information of the inductor to be tested parallel PN junction circuit according to the comparison result of the waveform data of the first output signal and the waveform data of the second output signal;
and sending the quality prompt information of the inductor to be tested parallel PN junction circuit to an employee terminal so that the employee terminal displays the quality prompt information of the inductor to be tested parallel PN junction circuit.
2. The detection method according to claim 1, wherein the waveform data is a peak value, a trough value, and a waveform shape of a waveform corresponding to the output signal in a unit period; according to the comparison result of the waveform data of the first output signal and the waveform data of the second output signal, generating quality prompt information of the to-be-detected inductor parallel PN junction circuit, which comprises the following steps:
if the comparison result is that the difference between the absolute value of the wave peak value of the first output signal and the absolute value of the wave peak value of the second output signal is smaller than a first preset difference value, the difference between the absolute value of the wave valley value of the first output signal and the absolute value of the wave valley value of the second output signal is smaller than a second preset difference value, and the crest truncation direction in the waveform shape of the first output signal is consistent with the crest truncation direction in the waveform shape of the second output signal, determining that the inductance parallel PN junction circuit to be tested has no quality problem, and generating quality prompt information that the inductance parallel PN junction circuit to be tested has no quality problem;
if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal in the comparison result is not less than a first preset difference, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is not less than a second preset difference, and the direction of clipping the waveform shape of the first output signal is not consistent with the direction of clipping the waveform shape of the second output signal, determining the quality defect of the inductor parallel PN junction circuit to be tested according to any one of the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal and the waveform shape of the first output signal, and generating quality prompt information of the quality defect of the inductor parallel PN junction circuit to be tested.
3. The method for detecting according to claim 2, wherein determining the quality defect of the inductor parallel PN junction circuit under test according to at least one of a difference between an absolute value of a peak value of the first output signal and an absolute value of a peak value of the second output signal, a difference between an absolute value of a valley value of the first output signal and an absolute value of a valley value of the second output signal, and a waveform shape of the first output signal comprises:
and if the difference between the absolute value of the wave peak value of the first output signal and the absolute value of the wave peak value of the second output signal in the comparison result is smaller than a first preset difference value, the difference between the absolute value of the wave valley value of the first output signal and the absolute value of the wave valley value of the second output signal is not smaller than a second preset difference value, and no top clipping exists in the waveform shape of the second output signal, determining that the quality defect of the inductance parallel PN junction circuit to be detected is PN junction open circuit.
4. The method for detecting according to claim 2, wherein determining the quality defect of the inductor parallel PN junction circuit under test according to at least one of a difference between an absolute value of a peak value of the first output signal and an absolute value of a peak value of the second output signal, a difference between an absolute value of a valley value of the first output signal and an absolute value of a valley value of the second output signal, and a waveform shape of the first output signal comprises:
and if the absolute value of the wave peak value of the second output signal in the comparison result is equal to the alternating current excitation signal, the difference between the absolute value of the wave valley value of the first output signal and the absolute value of the wave valley value of the second output signal is not less than a second preset difference value, and the direction of the top cutting in the waveform shape of the first output signal is opposite to the direction of the top cutting in the waveform shape of the second output signal, determining that the quality defect of the inductance parallel PN junction circuit to be detected is PN junction reverse installation.
5. The method for detecting according to claim 2, wherein determining the quality defect of the inductor parallel PN junction circuit under test according to at least one of a difference between an absolute value of a peak value of the first output signal and an absolute value of a peak value of the second output signal, a difference between an absolute value of a valley value of the first output signal and an absolute value of a valley value of the second output signal, and a waveform shape of the first output signal comprises:
and if the difference between the absolute value of the peak value of the first output signal and the absolute value of the peak value of the second output signal in the comparison result is not smaller than a first preset difference value, the difference between the absolute value of the valley value of the first output signal and the absolute value of the valley value of the second output signal is smaller than a second preset difference value, the absolute value of the peak value of the second output signal is equal to the absolute value of the valley value of the second output signal, and the crest direction in the waveform shape of the first output signal is consistent with the crest direction in the waveform shape of the second output signal, determining that the quality defect of the inductance parallel PN junction circuit to be tested is inductance disconnection.
6. The detection method according to any one of claims 3 to 5, wherein the quality prompt information further includes a maintenance strategy of the parallel PN junction circuit of the inductor to be detected; the method further comprises the following steps:
and determining a maintenance strategy aiming at the inductance parallel PN junction circuit to be detected according to different quality defects of the inductance parallel PN junction circuit to be detected.
7. The detection method of claim 1, wherein the ac excitation signal is determined based on an ac impedance characteristic and a PN junction characteristic of an inductor in the standard inductor parallel PN junction circuit.
8. A detection device for an inductance parallel PN junction circuit is characterized by comprising:
the acquisition module is used for acquiring waveform data of an alternating current excitation signal and a first output signal of a standard inductor parallel PN junction circuit; wherein the first output signal is an output signal of the standard inductor parallel PN junction circuit when the alternating current excitation signal is used as the input of the standard inductor parallel PN junction circuit;
the output module is used for taking the alternating current excitation signal as the input of the inductor to be detected parallel to the PN junction circuit to obtain a second output signal of the inductor to be detected parallel to the PN junction circuit;
the generating module is used for generating quality prompt information of the inductor to be tested parallel PN junction circuit according to the comparison result of the waveform data of the first output signal and the waveform data of the second output signal;
and the prompting module is used for sending quality prompting information of the inductor to be tested parallel PN junction circuit to an employee terminal so as to enable the employee terminal to display the quality prompting information of the inductor to be tested parallel PN junction circuit.
9. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the steps of the detection method according to any of the preceding claims 1-7 are implemented when the computer program is executed by the processor.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the detection method according to any one of the preceding claims 1 to 7.
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Application publication date: 20211026 |