CN113497588A - Method and device for testing electrical performance of solar cell and solar cell module - Google Patents
Method and device for testing electrical performance of solar cell and solar cell module Download PDFInfo
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Abstract
A method and a device for testing electrical performance of a solar cell and a solar module belong to the field of solar cell testing and are characterized in that: obtaining Voc, Isc and maximum power Pmax under set test parameters through a primary IV curve test; the test parameters comprise scanning point number, scanning area and sampling interval time; keeping the test pulse width unchanged, adjusting the test parameters and then continuously testing; after adjusting the test parameters at least twice, selecting the maximum power of the last two tests to calculate the absolute difference value; if the absolute difference value is within the preset error range, the test is finished; if the absolute error is not within the preset error range, continuing the test until the absolute deviation of the last two test values meets the preset error range, and ending the test; whether the set requirements are met or not is automatically diagnosed and tested through the set test deviation, manual intervention is not needed in the testing process, successive approximation truth values are tested, and therefore accurate data are obtained.
Description
Technical Field
The invention belongs to the field of solar cell testing, and particularly relates to a method and a device for testing electrical properties of a solar cell and a solar cell module.
Background
The electrical performance test of the solar cell and the solar module is directly related to the related benefits of enterprises and terminal application parties, so that the accurate test scheme is provided and is very important. With the industrial layout of high-efficiency batteries, the difficulty of accurate test gradually increases as the battery efficiency is higher in mass production of PERC, N-type TOP Con and HJT in the promotion stage.
At present, the problem of capacitive effect difference during voltage and current collection in a Pmax interval is mainly solved by adopting a pulse width superposition nonlinear electronic load driving technology of more than 10ms in an industrial field, a laboratory and a third-party mechanism obtain a complete IV curve by adopting multiple 10ms sectional test fitting, but enough sectional times need to be set for N-type TOP Con and HJT solar cells and components with larger capacitive effects to eliminate the capacitive effects depending on tests, and test schemes need to be correspondingly adjusted when test objects are changed, so that huge pressure and challenge are brought to test repeatability and accuracy. Meanwhile, in the prior art, the pulse width and the segmentation times are still manually set, the test compatibility is relatively dependent on the diagnosis of an operator on a test object, and if the test effect is unreasonable, the rotating pulse width and the segmentation times are difficult to guarantee, and the current requirements of batch and convenient operation are difficult to meet.
Disclosure of Invention
The invention aims to solve the problems and provides a method and a device for testing the electrical performance of a solar cell and a solar module.
In a first aspect, the present invention provides a method for testing electrical properties of a solar cell and a solar module, comprising:
obtaining Voc, Isc and maximum power Pmax under set test parameters through a primary IV curve test; the test parameters comprise scanning point number, scanning area and sampling interval time;
keeping the test pulse width unchanged, adjusting the test parameters and then continuously testing;
after adjusting the test parameters at least twice, selecting the maximum power of the last two tests to calculate the absolute difference value;
if the absolute difference value is within the preset error range, the test is finished;
if the absolute error is not within the preset error range, continuing the test until the absolute deviation of the last two test values meets the preset error range, and ending the test;
the adjusting of the test parameters comprises:
the adjustment rule of the scanning points is as follows: the number of scanning points is reduced to one half of the number of scanning points of the last time;
the adjustment rule of the scanning area is as follows: marking the voltage and the current corresponding to the maximum power Pmax as a point P according to the maximum power Pmax tested at the last time, and expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively as an adjusted scanning area by taking the marked point P as a reference;
the regulation rule of the sampling interval time is as follows: the sampling interval time is adjusted to 2 times the sampling interval time in the last test.
In a second aspect, the present invention provides a method for testing electrical properties of a solar cell and a solar module, comprising:
obtaining Voc, Isc and maximum power Pmax1 in a set scanning point number, a scanning area and a sampling interval time through a primary IV curve test;
marking the voltage and the current corresponding to Pmax1 as a point P1, expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively by taking the marked point P1 as a reference to determine a new area, and recording the starting point and the end point of the new area as V1 and V2 respectively;
under the premise of unchanging the pulse, the number of scanning points is adjusted to be one half of the number of scanning points at the last time, and the sampling interval time is adjusted to be 2 times of the sampling interval time in the last test;
performing a scanning test on a region between V1 and V2 to obtain Pmax2 in the region;
marking the voltage and the current corresponding to Pmax2 as a point P2, expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively by taking the marked point P2 as a reference to determine a new area, and recording the starting point and the end point of the new area as V3 and V4 respectively;
under the premise of unchanging the pulse, the number of scanning points is adjusted to be one half of the number of scanning points at the last time, and the sampling interval time is adjusted to be 2 times of the sampling interval time in the last test;
performing a scanning test on a region between V3 and V4 to obtain Pmax3 in the region;
judging the absolute difference value of Pmax3 and Pmax 2;
if the absolute difference value is within the preset error range, the test is finished;
and if the absolute error is not within the preset error range, continuously adjusting the sampling interval time, the number of scanning points and the area for testing until the absolute deviation of the maximum power of the last two tests meets the preset error range, and ending the test.
Furthermore, according to the solar cell and the solar cell module electrical performance testing method, the number of scanning points is reduced to one sixteenth of the total number of the first scanning points at minimum.
Furthermore, according to the solar cell and the solar cell module electrical property testing method, the sampling interval time is 10us-10000 us.
Further, according to the solar cell and the solar cell module electrical performance testing method, the pulse width is 10ms-200 ms; in specific application, the test result can be obtained quickly by preferentially using the longer pulse width for the test object with larger capacitance.
In a third aspect, the present invention provides a device for testing electrical properties of a solar cell and a solar module, comprising:
the testing module is used for testing the electrical properties of the solar cell and the solar cell module according to the set testing parameters; the test parameters comprise sampling interval time, scanning point number and scanning area;
the adjusting module is used for adjusting the test parameters according to the last test result; the adjusting of the test parameters comprises: the adjustment rule of the scanning points is as follows: the number of scanning points is reduced to one half of the number of scanning points of the last time; the adjustment rule of the scanning area is as follows: marking the voltage and the current corresponding to the maximum power Pmax as a point P according to the maximum power Pmax tested at the last time, and expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively as an adjusted scanning area by taking the marked point P as a reference; the regulation rule of the sampling interval time is as follows: the sampling interval time is adjusted to be 2 times of the sampling interval time in the last test;
the analysis module is used for selecting the maximum power of the last two tests to calculate the absolute difference value after detecting that the test parameters are adjusted at least twice; if the absolute difference value is within the preset error range, the test is finished; if the absolute error is not within the preset error range, continuing the test until the absolute deviation of the last two test values meets the preset error range, and ending the test;
and the output module is used for outputting the test result.
According to the method and the device for testing the electrical performance of the solar cell and the solar module, the relative intervals of Voc, Isc and Pmax are obtained through one-time complete IV curve test, and then the accurate Pmax value is further obtained through regulating the number of scanning points and scanning the Pmax interval in a region centralized mode for multiple times. Whether the set requirements are met or not is automatically diagnosed and tested through the set test deviation, manual intervention is not needed in the testing process, successive approximation truth values are tested, and therefore accurate data are obtained.
Drawings
Fig. 1 is a schematic flow chart of an electrical performance testing method for a solar cell and a solar module according to an embodiment of the present invention;
fig. 2 is a schematic structural view of a solar cell and device electrical performance testing apparatus according to a third embodiment of the present invention.
Detailed Description
The following describes the electrical performance testing method and apparatus of the solar cell and the solar module in detail with reference to the drawings and the embodiments.
Example one
In the embodiment of the present disclosure, taking an I-V test mode as an example, the method specifically includes the following steps:
step one, acquiring open-circuit voltage Voc, short-circuit current Isc and maximum power Pmax under set test parameters through one-time IV curve test; the test parameters comprise scanning point number, scanning area and sampling interval time;
step two, keeping the test pulse width unchanged, and adjusting the test parameters and then continuously testing;
the adjusting of the test parameters comprises: the adjustment process of the scanning point number is as follows: the number of scanning points is reduced to one half of the number of scanning points of the last time; the scanning point number is reduced to one sixteenth of the total number of the first scanning point number at minimum;
the adjustment process of the scanning area comprises the following steps: marking the voltage and the current corresponding to the maximum power Pmax as a point P according to the maximum power Pmax tested at the last time, and expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively as an adjusted scanning area by taking the marked point P as a reference;
the adjustment process of the sampling interval time comprises the following steps: the sampling interval time is adjusted to be 2 times of the sampling interval time in the last test;
step three, adjusting the test parameters at least twice;
selecting the maximum power of the last two tests to calculate the absolute difference value; if the absolute difference value is within the preset error range, the test is finished; and if the absolute error is not within the preset error range, continuing the test until the absolute deviation of the last two test values meets the preset error range, and ending the test.
During testing, the electronic load is initially in an open circuit state, and at the moment, the accurate Voc of the tested object can be obtained by setting a corresponding time interval; after the acquisition delay is finished, adjusting the electronic load to a short circuit state, and acquiring the Isc at the moment; because the current in the test loop is large and the voltage is zero, the Isc of the tested object can be accurately obtained, the V value and the I value are synchronously and correspondingly acquired along with the process that the electronic load is gradually adjusted from a short circuit to an open circuit, and the Pmax which can be obtained at the moment is a relative sampling interval actually in consideration of the hysteresis effect caused by the capacitance effect. In the I-V mode, after the electronic load is adjusted each time, a test loop is equivalent to that the capacitor is in a charging state, test data is small when sampling delay is insufficient after the electronic load is adjusted, and Pmax is smaller than a true value, so that voltage and current points corresponding to the maximum power Pmax obtained by driving the electronic load for the first time are marked, in order to avoid missing a true maximum power interval, 5% and 15% of the total sampling point number are respectively expanded to the front end and the rear end of a sampling point by taking the marked points as a reference, and the areas are correspondingly recorded to obtain V1 and V2. The electronic load is adjusted to an open circuit state, and a value of Voc1 is obtained, which usually does not match the Voc obtained from the front end (usually smaller) and needs to be calibrated to a true value. The first time of the electronic load complete driving obtains three core data, Voc, Isc and Pmax1 intervals.
After adjustment, the areas V1 and V2 are intensively scanned by the electronic load for the second time, the pulse width is consistent with that of the first time, the scanning interval is relatively concentrated, the total scanning points are half of that of the first time, and the voltage and the current corresponding to Pmax2 are obtained in the interval. And expanding 5 percent and 15 percent of the number of the sampling points to the front end and the rear end of the sampling point respectively by taking the point as a reference point, and recording the starting point and the ending point of the area as V3 and V4 respectively.
And the third time of electronic load centralized scanning is performed in V3 and V4 intervals, the pulse width is consistent with that of the first time, the total scanning points are one fourth of that of the first time, and Pmax3 and corresponding voltage and current are obtained in the interval. And calculating the absolute difference value between Pmax3 and Pmax2, and automatically diagnosing whether the absolute difference value meets the set error range or not by the system, wherein the test is finished if the absolute difference value meets the set error range, and the test is continued if the absolute difference value does not meet the set error range.
And keeping the concentrated scanning step, wherein the test pulse width is always consistent with that of the first time, the number of the total scanning points is reduced in a successive corresponding proportion until the total scanning points are reduced to the first sixteenth time and then are not reduced, but the sampling data interval is continuously adjusted to a more accurate range according to the test result until the absolute deviation of the test values of the last two times meets the set range, and then the test is finished.
In the embodiment of the present disclosure, if the absolute difference error range is set to 0.2W, if the absolute difference exceeds 0.2W, the test condition is not satisfied, the test continues, if the absolute difference is less than 0.2W, the test condition is satisfied, and the test ends. Meanwhile, in the embodiment of the present disclosure, the number of scanning points for the first time is set to 400, the number of scanning points is mainly related to the configuration of the selected hardware system, the electronic load acts once, and a delay is correspondingly needed, after the electronic load acts, the acquisition is not performed synchronously, and the acquisition needs to be performed after the acquisition system is stabilized, so there is a delay time here; the collected data is ensured to be in the stage period, and if the collected data is not in the stage period, the collected data is easy to distort, and the error is large. If the number of sampling points is too large, each sampling point wastes time for waiting for entering a platform period and then collecting, and a large amount of time is wasted. Longer waiting time can be obtained in the same time by reducing the number of sampling points, so that the sampling is ensured to fully enter a platform period, if the sampling is carried out for the first time by 400 points, and the sampling is carried out for the second time by 200 points, the sampling interval time for the second time is 2 times of the sampling interval time for the first time, under the background that the capacitance effect of a tested object is larger, the number of the testing points is properly reduced, and the condition is more favorably met.
Example two
In the embodiment of the present disclosure, taking an HJT device to be tested as an example, and taking an I-V as an example in the test mode, as shown in fig. 1, the method specifically includes the following steps:
step one, acquiring an open-circuit voltage Voc, a short-circuit current Isc and a maximum power Pmax1 in a set scanning point number, a scanning area and a sampling interval time through a primary IV curve test;
marking the voltage and the current corresponding to Pmax1 as a point P1, expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively by taking the marked point P1 as a reference to determine a new area, and recording the starting point and the end point of the new area as V1 and V2 respectively;
under the premise of unchanging the pulse, the number of scanning points is adjusted to be one half of the number of scanning points at the last time, and the sampling interval time is adjusted to be 2 times of the sampling interval time in the last test; performing a scanning test on a region between V1 and V2 to obtain Pmax2 in the region;
marking the voltage and the current corresponding to Pmax2 as a point P2, expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively by taking the marked point P2 as a reference to determine a new area, and recording the starting point and the end point of the new area as V3 and V4 respectively;
under the premise of unchanging the pulse, the number of scanning points is adjusted to be one half of the number of scanning points at the last time, and the sampling interval time is adjusted to be 2 times of the sampling interval time in the last test; performing a scanning test on a region between V3 and V4 to obtain Pmax3 in the region;
step four, judging the absolute difference value of Pmax3 and Pmax 2;
if the absolute difference value is within the preset error range, the test is finished;
and if the absolute error is not within the preset error range, continuously adjusting the sampling interval time, the number of scanning points and the area for testing until the absolute deviation of the maximum power of the last two tests meets the preset error range, and ending the test.
In the embodiment of the present disclosure, the error range of the absolute difference of the maximum power is set to be 0.2W, the scanning pulse width is 100ms, the number of the first scanning dots is 400, and Pmax1, V1 and V2 are obtained by the first scanning according to the set rule.
The second scanning is concentrated between V1 and V2, the pulse width is kept at 100ms, the number of scanning points is 200, and Pmax2, V3 and V4 can be obtained according to the adjusted rule.
The third scanning is concentrated between V3 and V4, the pulse width is kept at 100ms, the number of scanning points is 100 points, and Pmax3, V5 and V6 can be obtained according to the adjusted rule in the test. The test system judges whether the absolute difference value of Pmax3 and Pmax2 meets the set requirement through the upper computer, and if the absolute difference value does not meet the set requirement, the test is continued.
The fourth scanning is concentrated between V5 and V6, the pulse width is kept at 100ms, the number of scanning points is 50, and Pmax4, V7 and V8 can be obtained according to the adjusted rule in the test. And the upper computer of the test system judges whether the absolute difference value of the Pmax4 and the Pmax3 meets the set requirement, and if not, the test is continued.
The fifth scanning is concentrated between V7 and V8, the pulse width is kept at 100ms, the number of scanning points is 25, and Pmax5, V9 and V10 can be obtained according to the adjusted rule in the test. And the test system judges whether the absolute difference value of the Pmax5 and the Pmax4 meets the requirement through the upper computer, and if the absolute difference value does not meet the requirement, the test is continued.
The sixth scanning is concentrated between 9 and V10, the pulse width is kept at 100ms, the number of the current scanning point and the number of the subsequent scanning points are kept at 25 points and are not reduced (the number of the sampling points is not reduced after one sixteenth of the total number of the sampling points is met), and the Pmax6, V11 and V12 can be obtained according to the set rule in the current test. The test system judges whether the absolute difference value of Pmax6 and Pmax5 meets the requirement through the upper computer, and if the absolute difference value meets the requirement, the test is finished.
If the test does not meet the requirement, the pulse width is kept unchanged, the number of scanning points is kept unchanged at 25 points, the voltage range of the corresponding obtained maximum power interval is still continuously adjusted, a more accurate maximum power interval is obtained according to actual test data until the test value meets the set requirement, and the test is finished.
In the embodiment of the present disclosure, during the first full IV interval scanning, the number of scanning points is 400, after the electronic load acts, the sampling interval time is 250us, wherein about 6us is collected after the sampling delay of 244us, and the next point sampling is performed after the completion until the test is finished.
During the second interval scanning, the number of scanning points is 200, after the electronic load acts, the sampling interval time is 500us, wherein, after the sampling is delayed by 494us, about 6us is collected, and after the sampling is finished, one-point sampling is carried out until the test is finished.
And during the third interval scanning, the number of sampling points is 100, the sampling interval time is 1000us, wherein about 6us is collected after the sampling is delayed by 994us, and the next sampling is carried out until the test is finished. If the test does not meet the set requirements at this time, the test is continued.
And during the fourth interval scanning, the number of sampling points is 50, the sampling interval time is 2000us, wherein after sampling is delayed for 1994us, about 6us is collected, and then the next point collection is carried out until the test is finished. In this way, the test still does not meet the set requirements, and the test is continued.
And in the fifth interval scanning, the number of sampling points is 25, the sampling interval time is 4000us, the sampling time is delayed by 3994us, then about 6us is acquired, and the next point acquisition is carried out until the test is finished.
At this time, when the test still does not meet the set requirement, the test is continued, but the number of test points is not reduced, and the corresponding test interval is reduced continuously according to the set requirement until the test result meets the set requirement. In the process, the test interval can be correspondingly adjusted every time, and can be adjusted to a smaller voltage interval every time, so that the capacitance effect is eliminated, and an accurate test value is obtained.
EXAMPLE III
In the embodiment of the present disclosure, an apparatus for testing electrical performance of a solar cell and a solar module is disclosed, which includes a testing module, an adjusting module, an analyzing module and an output module as shown in fig. 2. The testing module is used for testing the electrical performance of the solar cell and the solar cell module according to the set sampling interval time, the number of scanning points and the scanning area. The adjusting module is used for adjusting the number of scanning points and the scanning area according to the last test result; the adjustment rule of the scanning points is as follows: the number of scanning points is reduced to one half of the number of scanning points of the last time; the adjustment rule of the scanning area is as follows: marking the voltage and the current corresponding to the maximum power Pmax as a point P according to the maximum power Pmax tested at the last time, and expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively as an adjusted scanning area by taking the marked point P as a reference; the regulation rule of the sampling interval time is as follows: the sampling interval time is adjusted to 2 times the sampling interval time in the last test. The analysis module is used for selecting the maximum power of the last two tests to calculate the absolute difference value after detecting the adjustment of the scanning point number and the scanning area at least twice; if the absolute difference value is within the preset error range, the test is finished; and if the absolute error is not within the preset error range, continuing the test until the absolute deviation of the last two test values meets the preset error range, and ending the test. And the output module is used for outputting the test result. The specific testing process of the device for testing the electrical properties of the solar cell and the component according to the embodiment of the present disclosure is the same as the method for testing the electrical properties of the solar cell and the component according to the first embodiment or the second embodiment, and is not described herein again.
Claims (6)
1. A solar cell and module electrical property test method is characterized by comprising the following steps:
obtaining Voc, Isc and maximum power Pmax under set test parameters through a primary IV curve test; the test parameters comprise scanning point number, scanning area and sampling interval time;
keeping the test pulse width unchanged, adjusting the test parameters and then continuously testing;
after adjusting the test parameters at least twice, selecting the maximum power of the last two tests to calculate the absolute difference value;
if the absolute difference value is within the preset error range, the test is finished;
if the absolute error is not within the preset error range, continuing the test until the absolute deviation of the last two test values meets the preset error range, and ending the test;
the adjusting of the test parameters comprises:
the adjustment rule of the scanning points is as follows: the number of scanning points is reduced to one half of the number of scanning points of the last time;
the adjustment rule of the scanning area is as follows: marking the voltage and the current corresponding to the maximum power Pmax as a point P according to the maximum power Pmax tested at the last time, and expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively as an adjusted scanning area by taking the marked point P as a reference;
the regulation rule of the sampling interval time is as follows: the sampling interval time is adjusted to 2 times the sampling interval time in the last test.
2. A solar cell and module electrical property test method is characterized by comprising the following steps:
obtaining Voc, Isc and maximum power Pmax1 in a set scanning point number, a scanning area and a sampling interval time through a primary IV curve test;
marking the voltage and the current corresponding to Pmax1 as a point P1, expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively by taking the marked point P1 as a reference to determine a new area, and recording the starting point and the end point of the new area as V1 and V2 respectively;
under the premise of no change of pulse, the scanning point number is adjusted to be one half of the scanning point number of the last time; adjusting the sampling interval time to be 2 times of the sampling interval time in the last test;
performing a scanning test on a region between V1 and V2 to obtain Pmax2 in the region;
marking the voltage and the current corresponding to Pmax2 as a point P2, expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively by taking the marked point P2 as a reference to determine a new area, and recording the starting point and the end point of the new area as V3 and V4 respectively;
under the premise of no change of pulse, the scanning point number is adjusted to be one half of the scanning point number of the last time; adjusting the sampling interval time to be 2 times of the sampling interval time in the last test;
performing a scanning test on a region between V3 and V4 to obtain Pmax3 in the region;
judging the absolute difference value of Pmax3 and Pmax 2;
if the absolute difference value is within the preset error range, the test is finished;
and if the absolute error is not within the preset error range, continuously adjusting the sampling interval time, the number of scanning points and the area for testing until the absolute deviation of the maximum power of the last two tests meets the preset error range, and ending the test.
3. The method for testing the electrical performance of the solar cell and the solar module according to claim 1 or 2, wherein: the number of scanning points is reduced to one sixteenth of the total number of the first scanning points.
4. The method for testing the electrical properties of solar cells and modules according to claim 3, wherein: the sampling interval time is 10-10000 us.
5. The method for testing the electrical properties of solar cells and modules according to claim 4, wherein: the pulse width is 10ms-200 ms.
6. The utility model provides a solar cell and subassembly electrical property testing arrangement which characterized in that includes:
the testing module is used for testing the electrical properties of the solar cell and the solar cell module according to the set testing parameters; the test parameters comprise sampling interval time, scanning point number and scanning area;
the adjusting module is used for adjusting the test parameters according to the last test result; the adjusting of the test parameters comprises: the adjustment rule of the scanning points is as follows: the number of scanning points is reduced to one half of the number of scanning points of the last time; the adjustment rule of the scanning area is as follows: marking the voltage and the current corresponding to the maximum power Pmax as a point P according to the maximum power Pmax tested at the last time, and expanding 5% and 15% of the total sampling point number to the front end and the rear end of the sampling point respectively as an adjusted scanning area by taking the marked point P as a reference; the regulation rule of the sampling interval time is as follows: the sampling interval time is adjusted to be 2 times of the sampling interval time in the last test;
the analysis module is used for selecting the maximum power of the last two tests to calculate the absolute difference value after detecting that the test parameters are adjusted at least twice; if the absolute difference value is within the preset error range, the test is finished; if the absolute error is not within the preset error range, continuing the test until the absolute deviation of the last two test values meets the preset error range, and ending the test;
and the output module is used for outputting the test result.
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| CN114076897B (en) * | 2021-11-10 | 2024-03-12 | 陕西众森电能科技有限公司 | Electrical performance testing method for solar cell and assembly |
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| CN113497588B (en) | 2022-08-23 |
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