CN113470727A - Processing method, device, equipment and medium for uncorrectable data of solid state disk - Google Patents
Processing method, device, equipment and medium for uncorrectable data of solid state disk Download PDFInfo
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Abstract
The invention discloses a method, a device, equipment and a medium for processing uncorrectable data of a solid state disk. The method comprises the following steps: recording the error position in response to the uncorrectable error of the solid state disk; acquiring the type of the uncorrectable error, and acquiring a first voltage axis corresponding to the error position in response to the uncorrectable error belonging to the decoding failure; carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes; and respectively re-reading the data of the error position by adopting a plurality of second voltage axes. According to the scheme, for the situation that the uncorrectable error belongs to the decoding failure, the first voltage axis corresponding to the error position is obtained, the first voltage axis is subjected to offset adjustment to obtain the second voltage axes, and finally the second voltage axes are used for re-reading to correct the data as far as possible, so that the maximum error correction capability is provided for data error correction, the relevant data is retrieved for the user as far as possible, and the safety of the solid state disk is improved.
Description
Technical Field
The invention relates to the technical field of solid state disks, in particular to a method, a device, equipment and a medium for processing uncorrectable data of a solid state disk.
Background
With the development and wide application of technologies such as internet, cloud computing, internet of things and the like, mass data are generated at all times in human life and need to be processed and stored, and the high-speed development of information technology puts higher requirements on the performance of a storage system. Solid state disks are widely used because of their fast read/write speed and low energy consumption. However, with the increase of PE (tolerance degree of program & erase termination), under the influence of read disturb (read disturb), DATA retention (DATA retention), etc., the flash memory (NAND) may be in an unstable state, which appears as triggering more DATA error correction flows, even a DATA decoding failure occurs, which are all the manifestations of abnormal operation of the solid state disk, and seriously affect the reliability of the solid state disk.
Disclosure of Invention
In view of the above, there is a need to provide a method, an apparatus, a device, and a medium for processing uncorrectable data in a solid state disk, which can record abnormal information, provide maximum error correction capability for data error correction, and retrieve relevant data for a user as much as possible.
According to a first aspect of the present invention, a method for processing uncorrectable data in a solid state disk is provided, where the method includes:
recording the error position in response to the uncorrectable error of the solid state disk;
acquiring the type of an uncorrectable error, and acquiring a first voltage axis corresponding to the error position in response to the uncorrectable error belonging to decoding failure;
carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and respectively re-reading the data of the error position by adopting a plurality of second voltage axes.
In some embodiments, the step of offset adjusting the first voltage axis to obtain a number of second voltage axes comprises:
continuously reducing a preset offset by taking the first voltage axis as a reference according to preset times to obtain a plurality of negative second voltage axes;
continuously increasing preset offset according to preset times by taking the first voltage axis as a reference to obtain a plurality of forward second voltage axes;
each negative second voltage axis corresponds to a positive second voltage axis with the same offset.
In some embodiments, the step of re-reading the data of the error position respectively by using a plurality of second voltage axes includes:
sequentially adopting each negative direction second voltage axis to re-read the data of the error position;
and responding to the multiple negative second voltage axes to finish re-reading, and sequentially adopting each positive second voltage axis to re-read the data of the error position.
In some embodiments, the step of re-reading the data of the error position respectively by using a plurality of second voltage axes includes:
and reading the data of the error position again by using the first voltage axis as a reference and adopting a negative second voltage axis and a corresponding positive second voltage axis in a crossing manner from small to large according to the offset.
In some embodiments, the method further comprises:
responding to the data read from the error position based on a certain second voltage axis and successfully decoding, and taking the read data as the correction data of the current uncorrectable error;
storing the read data;
and stopping re-reading the data of the error position by using the residual second voltage axis.
In some embodiments, the method further comprises:
recording influence factor information when an error occurs in response to an uncorrectable error of the solid state disk, wherein the influence factor information comprises erasing times, data retention time, reading interference times and temperature information when the error occurs;
and storing the influence factor information and the corresponding error position information.
In some embodiments, the step of storing the influence factor information and the corresponding error location includes:
storing the influence factor information and the corresponding error position information into a supplier log;
and storing the influence factor information and the corresponding error position information into a key alarm log.
According to a second aspect of the present invention, there is provided a device for processing uncorrectable data of a solid state disk, the device including:
the recording module is used for recording the error position when the uncorrectable error occurs in the solid state disk;
a voltage axis obtaining module, configured to obtain a type to which an uncorrectable error belongs, and obtain a first voltage axis corresponding to the error position in response to that the uncorrectable error belongs to a decoding failure;
the voltage axis offset module is used for carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and the rereading module is used for respectively rereading the data of the error position by adopting a plurality of second voltage axes.
According to a third aspect of the present invention, there is also provided a computer apparatus comprising:
at least one processor; and
the solid state disk error uncorrectable data processing method comprises the following steps of:
recording the error position in response to the uncorrectable error of the solid state disk;
acquiring the type of an uncorrectable error, and acquiring a first voltage axis corresponding to the error position in response to the uncorrectable error belonging to decoding failure;
carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and respectively re-reading the data of the error position by adopting a plurality of second voltage axes.
According to a fourth aspect of the present invention, there is also provided a computer-readable storage medium, in which a computer program is stored, and the computer program, when executed by a processor, performs the foregoing processing method for the non-error-correctable data of the solid state disk, the method including the following steps:
recording the error position in response to the uncorrectable error of the solid state disk;
acquiring the type of an uncorrectable error, and acquiring a first voltage axis corresponding to the error position in response to the uncorrectable error belonging to decoding failure;
carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and respectively re-reading the data of the error position by adopting a plurality of second voltage axes.
According to the processing method for the uncorrectable data of the solid state disk, the uncorrectable error occurs in the solid state disk to record the error position, if the uncorrectable error belongs to the decoding failure situation, the first voltage axis corresponding to the error position is obtained, then the first voltage axis is subjected to offset adjustment to obtain the plurality of second voltage axes, and finally the plurality of second voltage axes are used for re-reading to correct the data as far as possible, so that the maximum error correction capability can be provided for data error correction, the relevant data can be found for a user as far as possible, and the overall safety of the solid state disk is improved.
In addition, the invention also provides a processing device of the uncorrectable data of the solid state disk, a computer device and a computer readable storage medium, which can also achieve the technical effects and are not described herein again.
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In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other embodiments can be obtained by using the drawings without creative efforts.
Fig. 1 is a flowchart of a method for processing uncorrectable data in a solid state disk according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a device for processing uncorrectable data in a solid state disk according to another embodiment of the present invention;
fig. 3 is an internal structural view of a computer device according to another embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following embodiments of the present invention are described in further detail with reference to the accompanying drawings.
It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are used for distinguishing two entities with the same name but different names or different parameters, and it should be noted that "first" and "second" are merely for convenience of description and should not be construed as limitations of the embodiments of the present invention, and they are not described in any more detail in the following embodiments.
In an embodiment, referring to a flowchart shown in fig. 1, the present invention provides a method for processing uncorrectable data in a solid state disk, where the method includes:
s100, recording the error position in response to the uncorrectable error of the solid state disk;
s200, acquiring the type of an uncorrectable error, and acquiring a first voltage axis corresponding to the error position in response to the uncorrectable error belonging to decoding failure;
s300, carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and S400, adopting a plurality of second voltage axes to respectively re-read the data of the error position.
According to the processing method for the uncorrectable data of the solid state disk, the uncorrectable error occurs in the solid state disk to record the error position, if the uncorrectable error belongs to the decoding failure situation, the first voltage axis corresponding to the error position is obtained, then the first voltage axis is subjected to offset adjustment to obtain the plurality of second voltage axes, and finally the plurality of second voltage axes are used for re-reading to correct the data as far as possible, so that the maximum error correction capability can be provided for data error correction, the relevant data can be found for a user as far as possible, and the overall safety of the solid state disk is improved.
In another embodiment, the foregoing step S300 specifically includes the following sub-steps:
s310, continuously reducing preset offset by taking the first voltage axis as a reference according to preset times to obtain a plurality of negative second voltage axes;
s320, continuously increasing preset offset according to preset times by taking the first voltage axis as a reference to obtain a plurality of forward second voltage axes;
each negative second voltage axis corresponds to a positive second voltage axis with the same offset.
In yet another embodiment, the aforementioned step S400 includes the steps of:
S410A, sequentially adopting each negative direction second voltage axis to re-read the data of the error position;
and S420A, in response to that the multiple negative second voltage axes all complete re-reading, sequentially adopting each positive second voltage axis to re-read the data of the error position.
For example, assuming the first voltage axis is zero, the negative second voltage axes may be offset from the first voltage axis by an amount of-1, -2, -3 … …, etc.; similarly, the deviation amounts of the plurality of positive second voltage axes, i.e., the first voltage axes, are +1, +2, +3 …, etc. In the specific implementation process, as the positive voltage axis and the negative voltage axis are multiple, a plurality of negative second voltage axes can be adopted to try to read again, and the mode that the absolute values of deviations are sequentially increased can be adopted in sequence; and after all the negative second voltage axes attempt to re-read, re-reading by using the positive second voltage axes.
In yet another embodiment, the foregoing step S400 can also be implemented in the following manner:
and S410B, re-reading the data of the error position by using a negative second voltage axis and a corresponding positive second voltage axis from small to large crossing according to the offset with reference to the first voltage axis.
Specifically, different from the foregoing embodiment in steps S410A to S420A, in this embodiment, reading may be performed by using the positive second voltage axis and the negative second voltage axis alternately, that is, the negative second voltage axis with a deviation of-1 is used to perform re-reading, if not, the positive second voltage axis with a deviation of +1 is used to perform reading, if not, the negative second voltage axis with a deviation of-2 is used to perform re-reading, and if not, the positive second voltage axis with a deviation of +2 is used to perform reading, and so on until reading is performed.
It should be noted that, since the preset offset and the number of reading times both affect finding the second voltage capable of performing error correction, in the specific implementation process, the setting may be performed according to the specific precision and the requirement of the application scenario so as to retrieve the error correction data quickly.
In yet another embodiment, the method further comprises:
s510, responding to the fact that data of the error position are read based on a certain second voltage axis and decoding is successful, and taking the read data as correction data of the uncorrectable error;
s520, storing the read data;
and S530, stopping re-reading the data of the error position by using the residual second voltage axis.
Continuing by way of example, assuming that re-reading of data is attempted in the manner 410A-410B, assuming that data can already be retrieved when some negative second voltage axis is attempted, e.g., reading at an offset of-2, data can be read and decoded successfully, and then the negative second voltage axis with an offset greater than-2 and all positive second voltage axes do not need to be read again.
In yet another embodiment, the method further comprises:
s610, in response to an uncorrectable error occurring in the solid state disk, recording influence factor information during the error, wherein the influence factor information includes erasing times, data retention time, reading interference times and temperature information during the error;
and S620, storing the influence factor information and the corresponding error position information.
In another embodiment, based on the foregoing embodiment, step S620 specifically includes the following sub-steps:
s621, storing the influence factor information and the corresponding error position information into a supplier log;
and S622, storing the influence factor information and the corresponding error position information into a key alarm log.
In another embodiment, in order to facilitate understanding of the scheme of the present invention, a detailed description is given below by taking data recovery of uncorrectable errors of a certain solid state disk as an example, and a specific processing method for uncorrectable data of a solid state disk includes the following two parts:
recording uncorrectable error information, specifically recording information of uncorrectable positions from multiple dimensions, mainly comprising:
record 1: the physical information of the error position comprises block, page, chunk and other information;
record 2: factors influencing errors include erasing times, data retention time at that time, reading interference times, temperature information and reasons of errors. This reason can be divided into two categories, decoding failure and non-decoding failure; note: non-decoding failure, i.e., read NAND media is abnormal, attributable to a media error;
the information of the above record 1 and record 2 is saved to two locations simultaneously: supplier logs (vendor-log) and Critical warning logs (Critical warning log). Due to the fact that the dial and other reasons cause abnormal power-down, data can be lost, and therefore the stored two pieces of information can be triggered to export the information through the nvme command, and technicians can conveniently analyze the reasons of errors. The two positions are recorded to ensure the accuracy and the integrity of data, and if data in one log is missing when the record is yes, the recorded content in the other log can be referred to.
(II) adjusting a voltage axis to correct scanning errors:
the reasons for the error correction failure are roughly divided into two types:
the first reason is: the original optimal voltage axis is subjected to abnormal offset due to various factors, and the offset exceeds a certain threshold and is out of a range allowed by software design;
the second reason is that: physical damage or null data (such as write failure), which can be corrected only by redundant data between the solid state disks;
for the first failure reason, a voltage axis scanning tool is designed correspondingly, namely, according to voltage axes corresponding to the Uncorrectable Error (UECC) error positions, according to offsets ± 2, ± 4, … ± 128, if decoding is successful, the data can be exited in advance, and data can be corrected back at a high probability based on the mode.
For Uncorrectable Errors (UECC) with decoding failure, the following two strategies are mainly used:
the first strategy is to trigger the scan immediately: when software detects an Uncorrectable Error (UECC), the software informs the host to issue a rereading mechanism again, the voltage axis scanning strategy is directly triggered at the moment, if decoding is successful, data is transferred to a safe position, and simultaneously, a voltage axis selected when decoding is successful is recorded for subsequent technical analysis; otherwise, it is marked as a media error (media error). It should be noted that the method of the present invention is time consuming and requires serial execution in order to avoid affecting normal performance.
The second strategy is to debug the trigger scan: the method is mainly used for problem debugging, and is based on a scanning voltage offset tool according to the recorded error position, and is used for analyzing the optimal offset voltage as the basis of problem analysis.
In the method, the diversity of environments influencing the operation of the solid state disk is considered, so that the related information of the error flash memory, including the erasing times, the data storage time, the reading interference times, the temperature and the like, needs to be recorded from multiple dimensions, and the information is recorded for analyzing the reason of occurrence of uncorrectable errors and providing analysis basis for improving the reliability of the solid state disk. In addition, a simple method with the maximum error correction capability is provided, namely all voltage axes are scanned to try error correction, and the strategy has a high probability of rescuing back part of data.
In another embodiment, referring to the structure diagram of the processing apparatus for uncorrectable data in a solid state disk shown in fig. 2, the present invention further provides a processing apparatus 70 for uncorrectable data in a solid state disk, where the apparatus includes:
the recording module 71 is configured to record an error position when an uncorrectable error occurs in the solid state disk;
a voltage axis obtaining module 72, configured to obtain a type to which an uncorrectable error belongs, and obtain a first voltage axis corresponding to the error position in response to that the uncorrectable error belongs to a decoding failure;
a voltage axis offset module 73, configured to perform offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and a rereading module 74, configured to reread the data at the error position by using a plurality of second voltage axes.
According to the processing device for the uncorrectable data of the solid state disk, the error position is recorded through the uncorrectable error occurring in the solid state disk, if the uncorrectable error belongs to the decoding failure situation, the first voltage axis corresponding to the error position is obtained, then the first voltage axis is subjected to offset adjustment to obtain the plurality of second voltage axes, and finally the plurality of second voltage axes are used for re-reading to correct the data as far as possible, so that the maximum error correction capability can be provided for data error correction, the relevant data can be found for a user as far as possible, and the overall safety of the solid state disk is improved.
It should be noted that, for specific limitations of the processing apparatus for the uncorrectable data in the solid state disk, reference may be made to the above limitations of the processing method for the uncorrectable data in the solid state disk, and details are not described herein again. All or part of each module in the processing device of the non-error-correction data of the solid state disk can be realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
According to another aspect of the present invention, a computer device is provided, and the computer device may be a server, and its internal structure is shown in fig. 3. The computer device includes a processor, a memory, a network interface, and a database connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The database of the computer device is used for storing data. The network interface of the computer device is used for communicating with an external terminal through a network connection. When executed by a processor, the computer program implements the processing method of the non-error-correction data of the solid state disk, and specifically, the method includes the following steps:
recording the error position in response to the uncorrectable error of the solid state disk;
acquiring the type of an uncorrectable error, and acquiring a first voltage axis corresponding to the error position in response to the uncorrectable error belonging to decoding failure;
carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and respectively re-reading the data of the error position by adopting a plurality of second voltage axes.
In some embodiments, the step of offset adjusting the first voltage axis to obtain a number of second voltage axes comprises:
continuously reducing a preset offset by taking the first voltage axis as a reference according to preset times to obtain a plurality of negative second voltage axes;
continuously increasing preset offset according to preset times by taking the first voltage axis as a reference to obtain a plurality of forward second voltage axes;
each negative second voltage axis corresponds to a positive second voltage axis with the same offset.
In some embodiments, the step of re-reading the data of the error position respectively by using a plurality of second voltage axes includes:
sequentially adopting each negative direction second voltage axis to re-read the data of the error position;
and responding to the multiple negative second voltage axes to finish re-reading, and sequentially adopting each positive second voltage axis to re-read the data of the error position.
In some embodiments, the step of re-reading the data of the error position respectively by using a plurality of second voltage axes includes:
and reading the data of the error position again by using the first voltage axis as a reference and adopting a negative second voltage axis and a corresponding positive second voltage axis in a crossing manner from small to large according to the offset.
In some embodiments, the method further comprises:
responding to the data read from the error position based on a certain second voltage axis and successfully decoding, and taking the read data as the correction data of the current uncorrectable error;
storing the read data;
and stopping re-reading the data of the error position by using the residual second voltage axis.
In some embodiments, the method further comprises:
recording influence factor information when an error occurs in response to an uncorrectable error of the solid state disk, wherein the influence factor information comprises erasing times, data retention time, reading interference times and temperature information when the error occurs;
and storing the influence factor information and the corresponding error position information.
In some embodiments, the step of storing the influence factor information and the corresponding error location includes:
storing the influence factor information and the corresponding error position information into a supplier log;
and storing the influence factor information and the corresponding error position information into a key alarm log.
According to still another aspect of the present invention, there is provided a computer-readable storage medium, on which a computer program is stored, the computer program, when executed by a processor, implementing the processing method of the non-error-correctable data of the solid state disk described above, specifically, the method includes the following steps:
recording the error position in response to the uncorrectable error of the solid state disk;
acquiring the type of an uncorrectable error, and acquiring a first voltage axis corresponding to the error position in response to the uncorrectable error belonging to decoding failure;
carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and respectively re-reading the data of the error position by adopting a plurality of second voltage axes.
In some embodiments, the step of offset adjusting the first voltage axis to obtain a number of second voltage axes comprises:
continuously reducing a preset offset by taking the first voltage axis as a reference according to preset times to obtain a plurality of negative second voltage axes;
continuously increasing preset offset according to preset times by taking the first voltage axis as a reference to obtain a plurality of forward second voltage axes;
each negative second voltage axis corresponds to a positive second voltage axis with the same offset.
In some embodiments, the step of re-reading the data of the error position respectively by using a plurality of second voltage axes includes:
sequentially adopting each negative direction second voltage axis to re-read the data of the error position;
and responding to the multiple negative second voltage axes to finish re-reading, and sequentially adopting each positive second voltage axis to re-read the data of the error position.
In some embodiments, the step of re-reading the data of the error position respectively by using a plurality of second voltage axes includes:
and reading the data of the error position again by using the first voltage axis as a reference and adopting a negative second voltage axis and a corresponding positive second voltage axis in a crossing manner from small to large according to the offset.
In some embodiments, the method further comprises:
responding to the data read from the error position based on a certain second voltage axis and successfully decoding, and taking the read data as the correction data of the current uncorrectable error;
storing the read data;
and stopping re-reading the data of the error position by using the residual second voltage axis.
In some embodiments, the method further comprises:
recording influence factor information when an error occurs in response to an uncorrectable error of the solid state disk, wherein the influence factor information comprises erasing times, data retention time, reading interference times and temperature information when the error occurs;
and storing the influence factor information and the corresponding error position information.
In some embodiments, the step of storing the influence factor information and the corresponding error location includes:
storing the influence factor information and the corresponding error position information into a supplier log;
and storing the influence factor information and the corresponding error position information into a key alarm log.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A method for processing uncorrectable data of a solid state disk is characterized by comprising the following steps:
recording the error position in response to the uncorrectable error of the solid state disk;
acquiring the type of an uncorrectable error, and acquiring a first voltage axis corresponding to the error position in response to the uncorrectable error belonging to decoding failure;
carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and respectively re-reading the data of the error position by adopting a plurality of second voltage axes.
2. The method for processing the uncorrectable data on the solid state disk according to claim 1, wherein the step of performing offset adjustment on the first voltage axis to obtain a plurality of second voltage axes includes:
continuously reducing a preset offset by taking the first voltage axis as a reference according to preset times to obtain a plurality of negative second voltage axes;
continuously increasing preset offset according to preset times by taking the first voltage axis as a reference to obtain a plurality of forward second voltage axes;
each negative second voltage axis corresponds to a positive second voltage axis with the same offset.
3. The method for processing the uncorrectable data on the solid state disk according to claim 2, wherein the step of re-reading the data at the error position by using a plurality of second voltage axes comprises:
sequentially adopting each negative direction second voltage axis to re-read the data of the error position;
and responding to the multiple negative second voltage axes to finish re-reading, and sequentially adopting each positive second voltage axis to re-read the data of the error position.
4. The method for processing the uncorrectable data on the solid state disk according to claim 2, wherein the step of re-reading the data at the error position by using a plurality of second voltage axes comprises:
and reading the data of the error position again by using the first voltage axis as a reference and adopting a negative second voltage axis and a corresponding positive second voltage axis in a crossing manner from small to large according to the offset.
5. The method for processing the uncorrectable data on the solid state disk according to claim 1, further comprising:
responding to the data read from the error position based on a certain second voltage axis and successfully decoding, and taking the read data as the correction data of the current uncorrectable error;
storing the read data;
and stopping re-reading the data of the error position by using the residual second voltage axis.
6. The method for processing the uncorrectable data on the solid state disk according to any one of claims 1 to 5, wherein the method further comprises:
recording influence factor information when an error occurs in response to an uncorrectable error of the solid state disk, wherein the influence factor information comprises erasing times, data retention time, reading interference times and temperature information when the error occurs;
and storing the influence factor information and the corresponding error position information.
7. The method for processing the uncorrectable data on the solid state disk according to claim 6, wherein the step of storing the influencing factor information and the corresponding error position includes:
storing the influence factor information and the corresponding error position information into a supplier log;
and storing the influence factor information and the corresponding error position information into a key alarm log.
8. A processing device for uncorrectable data of a solid state disk is characterized by comprising:
the recording module is used for recording the error position when the uncorrectable error occurs in the solid state disk;
a voltage axis obtaining module, configured to obtain a type to which an uncorrectable error belongs, and obtain a first voltage axis corresponding to the error position in response to that the uncorrectable error belongs to a decoding failure;
the voltage axis offset module is used for carrying out offset adjustment on the first voltage axis to obtain a plurality of second voltage axes;
and the rereading module is used for respectively rereading the data of the error position by adopting a plurality of second voltage axes.
9. A computer device, comprising:
at least one processor; and
a memory storing a computer program operable in the processor, the processor when executing the program performing the method of any of claims 1-7.
10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, is adapted to carry out the method of any one of claims 1 to 7.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170097868A1 (en) * | 2015-10-01 | 2017-04-06 | SK Hynix Inc. | Data storage device and operating method thereof |
| CN107291382A (en) * | 2017-05-19 | 2017-10-24 | 记忆科技(深圳)有限公司 | The method and solid state hard disc of operating lag are read in a kind of solid state hard disc reduction |
| CN110058957A (en) * | 2019-04-22 | 2019-07-26 | 湖南国科微电子股份有限公司 | A kind of solid state hard disk error correcting capability method for improving and solid state hard disk |
| CN111880736A (en) * | 2020-07-28 | 2020-11-03 | 苏州浪潮智能科技有限公司 | Solid state disk access method, device, equipment and medium |
| CN112466378A (en) * | 2020-11-12 | 2021-03-09 | 苏州浪潮智能科技有限公司 | Solid state disk operation error correction method and device and related components |
-
2021
- 2021-06-04 CN CN202110627590.0A patent/CN113470727A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170097868A1 (en) * | 2015-10-01 | 2017-04-06 | SK Hynix Inc. | Data storage device and operating method thereof |
| CN107291382A (en) * | 2017-05-19 | 2017-10-24 | 记忆科技(深圳)有限公司 | The method and solid state hard disc of operating lag are read in a kind of solid state hard disc reduction |
| CN110058957A (en) * | 2019-04-22 | 2019-07-26 | 湖南国科微电子股份有限公司 | A kind of solid state hard disk error correcting capability method for improving and solid state hard disk |
| CN111880736A (en) * | 2020-07-28 | 2020-11-03 | 苏州浪潮智能科技有限公司 | Solid state disk access method, device, equipment and medium |
| CN112466378A (en) * | 2020-11-12 | 2021-03-09 | 苏州浪潮智能科技有限公司 | Solid state disk operation error correction method and device and related components |
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