CN113433720A

CN113433720A - Liquid crystal display panel testing method and device

Info

Publication number: CN113433720A
Application number: CN202110670510.XA
Authority: CN
Inventors: 卓恩宗; 韦超; 张勇; 丁洁; 郑浩旋
Original assignee: HKC Co Ltd
Current assignee: HKC Co Ltd
Priority date: 2021-06-17
Filing date: 2021-06-17
Publication date: 2021-09-24
Anticipated expiration: 2041-06-17
Also published as: CN113433720B

Abstract

The application discloses a method and equipment for testing a liquid crystal display panel, wherein in the test of an array plate, a first voltage lasting for a first time length is applied to a scanning line of the array plate, and a second voltage lasting for the first time length is applied to a data line; the first voltage does not belong to the rated voltage interval of the scanning line, and the second voltage does not belong to the rated voltage interval of the data line; testing the pressurized array plate to determine whether the array plate is abnormal; after the liquid crystal display panel is manufactured on the basis of the array plate passing the test, in the test of the liquid crystal display panel, a third voltage lasting for a second time is applied to a scanning line of the liquid crystal display panel, and a fourth voltage lasting for the second time is applied to a data line; the third voltage does not belong to the rated voltage interval of the scanning line, and the fourth voltage does not belong to the rated voltage interval of the data line; and testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal or not, so that the missing detection rate is reduced, and the quality, the service life and the yield of the liquid crystal display panel are improved.

Description

Liquid crystal display panel testing method and device

Technical Field

The present disclosure relates to liquid crystal displays, and particularly to a method and an apparatus for testing a liquid crystal display panel.

Background

In recent years, liquid crystal display technology has been rapidly developed, and has excellent characteristics of high maturity, low radiation, low power consumption, easy integration, and the like, so that the liquid crystal display technology has been widely applied to the display field, particularly to the display of portable electronic products.

The liquid crystal display panel needs to be tested in the production process to determine whether the liquid crystal display panel meets the quality requirement. However, in the related art, the testing process of the liquid crystal display panel is rough, so that some liquid crystal display panels with defects cannot be detected, and the liquid crystal display panel has high omission factor, low quality and short service life.

Disclosure of Invention

The main purpose of the application is to provide a liquid crystal display panel testing method and device, and the method and device are used for solving the problems of high missing rate, low liquid crystal display panel quality and short service life caused by the rough testing process of the existing liquid crystal display panel.

In order to achieve the above object, the present application provides a method for testing a liquid crystal display panel, including:

in the test of the array plate, a first voltage lasting for a first time length is applied to a scanning line of the array plate, and a second voltage lasting for the first time length is applied to a data line; the first voltage does not belong to a rated voltage interval of the scanning line, and the second voltage does not belong to a rated voltage interval of the data line;

testing the pressurized array plate to determine whether the array plate is abnormal;

after the liquid crystal display panel is manufactured on the basis of the array plate passing the test, in the test of the liquid crystal display panel, a third voltage lasting for a second time is applied to a scanning line of the liquid crystal display panel, and a fourth voltage lasting for the second time is applied to a data line; the third voltage does not belong to the rated voltage interval of the scanning line, and the fourth voltage does not belong to the rated voltage interval of the data line;

and testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal.

Optionally, the step of testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal includes:

performing a lighting test on the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal;

or the like, or, alternatively,

and testing the image quality of the pressurized liquid crystal display panel to determine whether the image quality of the liquid crystal display panel reaches a preset condition.

Optionally, the rated voltage interval of the scan line is-9V to 30V, and the rated voltage interval of the data line is 0V to 14V.

Optionally, the first voltage is smaller than a minimum value of a rated voltage interval of the scan line, and the second voltage is larger than a maximum value of a rated voltage interval of the data line; the third voltage is smaller than the minimum value of the rated voltage interval of the scanning line, and the fourth voltage is larger than the maximum value of the rated voltage interval of the data line.

Optionally, the first voltage is different from the third voltage; the second voltage is different from the fourth voltage.

Optionally, after the step of testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal, the method further includes:

in the aging test, the liquid crystal display panel is placed in a first aging environment; wherein the temperature of the first aging environment is greater than 55 degrees Celsius;

and after the third time, testing the liquid crystal display panel to determine whether the liquid crystal display panel is abnormal.

Optionally, the temperature of the first aging environment is 60 ℃.

Optionally, the first voltage is smaller than the minimum value of the rated voltage interval of the scanning line by 6V; the second voltage is 16V greater than a maximum value of a rated voltage section of the data line.

Optionally, the third voltage is smaller than a minimum value of a rated voltage interval of the scan line by 1V, and the fourth voltage is larger than a maximum value of a rated voltage interval of the data line by 21V.

In addition, in order to achieve the above object, the present application also provides a liquid crystal display panel testing apparatus, which is configured to:

According to the technical scheme, a liquid crystal display panel testing method and equipment are adopted, in the testing of an array plate, a first voltage lasting for a first time length is applied to a scanning line of the array plate, and a second voltage lasting for the first time length is applied to a data line; the first voltage does not belong to the rated voltage interval of the scanning line, and the second voltage does not belong to the rated voltage interval of the data line; testing the pressurized array plate to determine whether the array plate is abnormal; after the liquid crystal display panel is manufactured on the basis of the array plate passing the test, in the test of the liquid crystal display panel, a third voltage lasting for a second time is applied to a scanning line of the liquid crystal display panel, and a fourth voltage lasting for the second time is applied to a data line; the third voltage does not belong to the rated voltage interval of the scanning line, and the fourth voltage does not belong to the rated voltage interval of the data line; testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal; that is, in the present application, in the testing process of the array board and the liquid crystal display panel, the voltage applied to the semi-finished product or the finished product of the liquid crystal display panel obtained by manufacturing does not belong to the rated voltage interval, so as to accelerate the aging or deterioration of the semi-finished product or the finished product of the liquid crystal display panel, expose the hidden defect of the semi-finished product or the finished product of the liquid crystal display panel, reduce the omission factor, improve the quality of the liquid crystal display panel, and prolong the service life of the liquid crystal display panel; and after the array plate is manufactured, the voltage applied to the array plate does not belong to the rated voltage interval, so that the hidden defect of the array plate is exposed, the situation that the time and materials are wasted due to the fact that the array plate with the hidden defect is used for manufacturing a liquid crystal display panel is avoided, the manufacturing efficiency and the yield are improved, and the manufacturing cost is reduced.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art that other drawings can be obtained according to the structures shown in the drawings without any inventive work.

FIG. 1 is a schematic flow chart illustrating a method for testing a liquid crystal display panel according to an embodiment of the present application;

FIG. 2 is a diagram of a liquid crystal display panel according to an embodiment of the present application;

FIG. 3 is a first schematic circuit diagram of an LCD panel according to an embodiment of the present disclosure;

fig. 4 is a circuit diagram of a liquid crystal display panel according to an embodiment of the present application;

fig. 5 is a schematic flowchart of a method for testing a liquid crystal display panel according to another embodiment of the present application.

The reference numbers illustrate:

the implementation, functional features and advantages of the objectives of the present application will be further explained with reference to the accompanying drawings.

Detailed Description

It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be noted that all the directional indications (such as up, down, left, right, front, and rear … …) in the embodiment of the present application are only used to explain the relative position relationship between the components, the movement situation, and the like in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indication is changed accordingly.

In addition, if there is a description of "first", "second", etc. in the embodiments of the present application, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, the meaning of "and/or" appearing throughout includes three juxtapositions, exemplified by "A and/or B" including either A or B or both A and B. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present application.

In order to ensure the quality of the liquid crystal display panel, the liquid crystal display panel is tested in the manufacturing process of the liquid crystal display panel. However, in the related test, the test mode is relatively rough, and it can only test whether the circuit of the liquid crystal display panel is disconnected, but some hidden defects (for example, the connection circuit is relatively weak) of the liquid crystal display panel cannot be tested, so that the quality of the manufactured liquid crystal display panel is low, and the service life is short. For example, as the requirements of the definition and quality of the LCD panel are higher and higher, the difficulty of fabricating the LCD panel is higher and higher, so that the fabricated LCD panel is prone to hidden defects, in one example, for a high performance TFT-LCD (Thin Film Transistor-Liquid Crystal Display), the TFT Channel length of the TFT is relatively small, a BCE (Back Channel Etching) type structure is usually adopted in the TFT fabrication process, due to the special fabrication process, a PR (photo resist) remainders easily occur in a GOA (gate on Array, gate circuit integrated on the Array panel) region and an in-plane pixel region, which causes over Etching, and leads to a weak line, and in the related test, only whether the line is disconnected or not can be tested, and for a weak line, the liquid crystal display panel cannot be tested, so that the liquid crystal display panel has low quality and short service life.

In order to solve the above technical problem, the present embodiment provides a method for testing a liquid crystal display panel, referring to fig. 1, where fig. 1 is a schematic flow chart of the method for testing a liquid crystal display panel provided by the present embodiment, and the method for testing a liquid crystal display panel includes:

step S11: in the test of the array plate, a first voltage lasting for a first time period is applied to the scanning lines of the array plate, and a second voltage lasting for the first time period is applied to the data lines.

The array plate is one of the main components of the liquid crystal display panel. The array board is provided with a circuit which comprises a plurality of scanning lines, a plurality of data lines, a plurality of TFT (Thin Film Transistor) switches, a plurality of pixel electrodes and the like, wherein the grid electrode of each TFT switch is connected with the scanning lines, the source electrode of each TFT switch is connected with the data lines, and the drain electrode of each TFT switch is connected with the pixel electrodes. The circuit on the array board can be flexibly arranged according to actual needs. In one example, the array plate may be a TFT array plate.

In some embodiments, to reduce cost, the conductive traces on the array board may all be made of aluminum. For example, the scan lines, the data lines, and the connection lines between the TFT switches and the pixel electrodes on the array board may all be made of aluminum.

In some embodiments, to improve the conductive performance of the array board, the conductive traces on the array board may be partially made of copper. In one example, the scan lines on the array board may be made of copper, and the other traces (e.g., connection lines between the TFT switches and the pixel electrodes, data line traces) may all be made of aluminum.

In some embodiments, to further enhance the conductive performance of the array board, the conductive traces on the array board may be made of copper. For example, the scan lines, data lines, and connection lines between the TFT switches and the pixel electrodes on the array board may all be made of copper.

It should be understood that a series of semi-finished products are produced throughout the manufacturing process of the liquid crystal display panel, and the resulting semi-finished products are tested in order to avoid problems in the quality of the finished products due to the quality problems of the semi-finished products.

In the embodiment of the present invention, after the Array board is manufactured, the Array board needs to be tested, i.e., Array Technology Test (ATT). In order to expose hidden defects of the array plate, in the test process, a first voltage lasting for a first time length is applied to the scanning lines of the array plate, a second voltage lasting for the first time length is applied to the data lines, namely, the first voltage is applied to the scanning lines of the array plate, the second voltage is applied to the data lines, and the first time length is kept. The first voltage does not belong to the rated voltage interval of the scanning line, and the second voltage does not belong to the rated voltage interval of the data line. Because the voltages applied to the scanning lines and the data lines of the array board do not belong to the corresponding rated voltage intervals, the aging or deterioration of the lines on the array board can be accelerated, and the hidden defects of the array board are exposed. For example, due to the situation of photoresist residue and the like, lines on the array plate are over-etched, some connection points are weak, and in the normal test process, the connection points are normally electrified and cannot be detected; in the embodiment of the invention, the voltages applied to the scanning lines and the data lines of the array board do not belong to the rated voltage interval, so that the array board is accelerated to age or deteriorate, the weak connection point is disconnected, the disconnection of the connection point can be tested in the subsequent process, and the missing detection rate is reduced.

It should be understood that the rated voltage is the voltage of the electrical appliance in normal operation, and the rated voltage interval is the voltage range of the electrical appliance in normal operation. The specific values of the rated voltage interval of the scanning line and the rated voltage interval of the data line are determined by the properties of the array plate. In some embodiments, an array board with a rated voltage range of-9V to 30V (i.e., -9V, 30V) for the scan lines and 0V to 14V (i.e., [0V, 14V ]) for the data lines can be used. In the embodiment of the present invention, a to B represent a number equal to or greater than a and equal to or less than B, the interval corresponding to the symbol [ ] includes end points, and the interval corresponding to the symbol () does not include end points, for example, [ a, B ] represents a number equal to or greater than a and equal to or less than B, (a, B) represents a number greater than a and less than B, and (a, B ] represents a number greater than a and equal to or less than B.

The first voltage can be larger than the maximum value of the rated voltage interval of the scanning line, or smaller than the minimum value of the rated voltage interval of the scanning line; the second voltage may be greater than a maximum value of a rated voltage section of the data line or less than a minimum value of the rated voltage section of the data line.

In some embodiments, to further accelerate the line aging or deterioration speed, the first voltage may be greater than a maximum value of a scan line rated voltage section, and the second voltage may be less than a minimum value of a data line rated voltage section. For example, assuming that the scan line voltage range is [ -9V, 30V ], and the data line voltage range is [0V, 14V ], the first voltage may be greater than 30V, and the second voltage may be less than 0V. The specific values of the first voltage and the second voltage can be flexibly set according to actual needs.

In order to avoid that the deviation from the rated voltage interval is too large and the line is blown, the absolute value of the difference between the first voltage and the maximum value of the rated voltage interval of the scanning line can be less than or equal to a, and the absolute value of the difference between the second voltage and the minimum value of the rated voltage interval of the data line can be less than or equal to b, wherein a and b are positive integers, a and b can be equal to or unequal, and the specific values of a and b can be flexibly set according to actual needs, for example, a can be set to 5V, 10V and the like, and b can be set to 4V, 8V and the like. In one example, assuming that a is 5V, b is 8V, the rated voltage interval of the scan line is [ -9V, 30V ], and the rated voltage interval of the data line is [0V, 14V ], the first voltage has a value in a range of (30V, 35V), i.e., greater than 30V and less than or equal to 35V, and the second voltage has a value in a range of [ -8V, 0V, i.e., less than 0V and greater than or equal to-8V.

In some embodiments, to further accelerate the line aging or deterioration speed, the first voltage may be less than the minimum value of the scan line rated voltage interval and the second voltage is greater than the maximum value of the data line rated voltage interval. For example, assuming that the scan line voltage range is [ -9V, 30V ], and the data line voltage range is [0V, 14V ], the first voltage may be less than-9V, and the second voltage may be greater than 14V. It should be noted that specific values of the first voltage and the second voltage can be flexibly set according to actual needs.

In order to avoid too large deviation from the rated voltage interval and line blowing, the absolute value of the difference between the first voltage and the minimum value of the rated voltage interval of the scanning line can be less than or equal to x1, and the absolute value of the difference between the second voltage and the maximum value of the rated voltage interval of the data line can be less than or equal to y1, wherein x1 and y1 can be equal to or different from each other, the specific values of x1 and y1 can be flexibly set according to actual needs, for example, x1 can be set to 5V, 10V, etc., and y1 can be set to 6V, 8V, etc. In one example, assuming that x1 is 5V, y1 is 25V, the scan line rated voltage range is [ -9V, 30V ], the data line rated voltage range is [0V, 14V ], and the first voltage has a value range of [ -14V, -9V), i.e., greater than or equal to-14V and less than-9V; the second voltage has a value range of (14V, 39V), i.e., greater than 14V and less than or equal to 39V.

In order to avoid too small deviation from the rated voltage interval and slow deterioration/aging speed, the absolute value of the difference between the first voltage and the minimum value of the rated voltage interval of the scanning line can be greater than or equal to x2, the absolute value of the difference between the second voltage and the maximum value of the rated voltage interval of the data line can be greater than or equal to y2, wherein x2 is less than or equal to x1, y2 is less than or equal to y1, and the specific values of x2 and y2 can be flexibly set according to actual needs. In one example, assuming that x1 is 9V, x2 is 1V, y1 is 18V, y2 is 5V, the scan line rated voltage interval is [ -9V, 30V ], the data line rated voltage interval is [0V, 14V ], the first voltage ranges from [ -18V, -10V ], that is, greater than or equal to-18V, and less than or equal to-10V; the value range of the second voltage is [19V, 32V ], namely, the second voltage is greater than 19V and less than or equal to 32V; for example, the first voltage may be-15V and the second voltage may be 30V.

In the embodiment of the present invention, the first time period may be flexibly set according to actual needs, for example, may be set to 3 seconds, 4 seconds, 5 seconds, and the like. In one example, to avoid excessive aging/degradation, the line may fail, and the first time period may be determined according to a deviation of the first voltage from a scan line rated voltage interval and a deviation of the second voltage from a data line rated voltage interval, wherein the larger the deviation of the first voltage from the scan line rated voltage interval is, the larger the deviation of the second voltage from the data line rated voltage interval is, the smaller the first time period is. For example, assuming that the scan line rated voltage range is [ -9V, 30V ], the data line rated voltage range is [0V, 14V ], if the first voltage value is (-10V, -9V), the second voltage value is (14V, 20V ], the first time period may be 10 seconds, and if the first voltage value is [ -15V, -10V ], the second voltage value is (20V, 30V ], the first time period may be 4 seconds.

In this embodiment of the present invention, test points may be disposed on the array board, and voltages may be applied to the scan lines and the data lines of the array board through the test points.

Step S12: the pressurized array plate is tested to determine if the array plate is abnormal.

In the embodiment of the invention, after the scanning lines of the array plate are applied with the first voltage lasting for the first time length and the data lines are applied with the second voltage lasting for the first time length, the array plate is tested to determine whether the array plate is abnormal. Because the voltage which does not belong to the rated voltage interval is applied to the scanning lines and the data lines of the array board, the aging/deterioration of the lines of the array board is accelerated, and the hidden defects on the array board are exposed and detected. For example, because the scanning lines and the data lines of the array board are applied with voltages which do not belong to the rated voltage interval, the aging/deterioration of the lines of the array board is accelerated, the weak connection points on the array board are disconnected, the test is carried out, the missing rate is reduced, and the quality of the array board is guaranteed.

The specific test mode can be flexibly set according to actual needs.

Step S13: after the liquid crystal display panel is manufactured based on the array panel passing the test, in the test of the liquid crystal display panel, a third voltage lasting for a second time period is applied to the scan lines of the liquid crystal display panel, and a fourth voltage lasting for the second time period is applied to the data lines.

After the array board is manufactured and tested, the liquid crystal display panel is further manufactured based on the array board that has passed the test. It should be understood that the liquid crystal display panel includes an array plate, and thus, the liquid crystal display panel is also provided with scan lines and data lines. The liquid crystal display panel may further include an array Board, a color filter, a polarizing plate, a Printed Circuit Board (PCB), and the like. In one example, referring to fig. 2, the manufactured liquid crystal display panel sequentially includes a first polarizer 201, an array plate 202, a liquid crystal cell 203, a color filter 204, and a second polarizer 205 along a light emitting direction.

The whole manufacturing process of the liquid crystal display panel can be as follows: firstly, manufacturing an array plate, and testing the array plate (namely ATT) to screen out the array plate with poor quality; secondly, the array plate which passes the test is attached to a color filter and cut to obtain a first semi-finished product, and the obtained first semi-finished product is subjected to lighting test to screen out the first semi-finished product with poor quality, wherein the area of the array plate is larger than that of the color filter during cutting so as to be used for attaching the PCB at the spare position of the array plate; and then, attaching the first semi-finished product passing the test to a polaroid to obtain a second semi-finished product, and attaching the second semi-finished product to a PCB to obtain the liquid crystal display panel.

It should be understood that after the liquid crystal display panel is manufactured, the liquid crystal display panel needs to be tested, i.e. a chip bonding and then dotting test (CT3, cell test 3, unit test 3). In the embodiment of the invention, after the liquid crystal display panel is manufactured, the liquid crystal display panel is tested, and in the testing process, a third voltage lasting for a second time duration is applied to the scanning lines of the liquid crystal display panel, and a fourth voltage lasting for the second time duration is applied to the data lines, that is, the third voltage is applied to the scanning lines of the liquid crystal display panel, and the fourth voltage is applied to the data lines, and the second time duration is kept. The third voltage does not belong to the rated voltage interval of the scanning line, and the fourth voltage does not belong to the rated voltage interval of the data line. Since the voltages applied to the scan lines and the data lines of the lcd panel do not belong to the corresponding rated voltage intervals, the aging/degradation of the lines on the lcd panel is accelerated, and the hidden defects of the lcd panel are exposed. For example, referring to fig. 3 and 4, fig. 3 is a schematic circuit connection diagram of a liquid crystal display panel, and in fig. 3, due to problems such as photoresist residue, resulting in over-etching, some lines have weak connection points 301, in normal testing, since the weak connection point 301 may be conductive, it cannot be tested, in an embodiment of the present invention, by applying a voltage that does not fall within the rated voltage range to the scanning lines and data lines of the liquid crystal display panel, thereby accelerating the aging or deterioration of the liquid crystal display panel such that the weak connection point 301 is disconnected, as shown in fig. 4, fig. 4 is the liquid crystal display panel shown in fig. 3, after the third voltage is applied to the scanning lines, the fourth voltage is applied to the data lines and the second time is kept, the circuit of the liquid crystal display panel is connected with a schematic diagram, in fig. 4, the weak link 301 is broken, and the weak link 301 can be tested in a subsequent test.

The third voltage may be greater than the maximum value of the rated voltage interval of the scanning line, or less than the minimum value of the rated voltage interval of the scanning line; the fourth voltage may be greater than a maximum value of a rated voltage section of the data line or less than a minimum value of the rated voltage section of the data line.

In some embodiments, to further accelerate the line aging or deterioration speed, the third voltage may be greater than a maximum value of a scan line rated voltage section, and the fourth voltage may be less than a minimum value of a data line rated voltage section. For example, assuming that the scan line voltage range is [ -9V, 30V ], and the data line voltage range is [0V, 14V ], the third voltage may be greater than 30V, and the fourth voltage may be less than 0V. The specific values of the third voltage and the fourth voltage can be flexibly set according to actual needs.

In order to avoid that the deviation from the rated voltage interval is too large and the line is blown, the absolute value of the difference between the third voltage and the maximum value of the rated voltage interval of the scanning line can be smaller than or equal to c, and the absolute value of the difference between the fourth voltage and the minimum value of the rated voltage interval of the data line can be smaller than or equal to d, wherein c and d can be equal to or different from each other, the specific values of c and d can be flexibly set according to actual needs, for example, c can be set to be 5V, 8V and the like, and d can be set to be 3V, 15V and the like. In one example, assuming that c is 4V, d is 10V, the rated voltage interval of the scan line is [ -9V, 30V ], the rated voltage interval of the data line is [0V, 14V ], the third voltage has a value in a range of (30V, 34V), i.e., greater than 30V and less than or equal to 34V, and the fourth voltage has a value in a range of [ -10V, 0V, i.e., less than 0V and greater than or equal to-10V.

In some embodiments, to further accelerate the line aging or deterioration speed, the third voltage may be smaller than the minimum value of the scan line rated voltage section, and the fourth voltage is larger than the maximum value of the data line rated voltage section. For example, assuming that the scan line voltage range is [ -9V, 30V ], and the data line voltage range is [0V, 14V ], the third voltage may be less than-9V, and the fourth voltage may be greater than 14V. It should be noted that specific values of the third voltage and the fourth voltage can be flexibly set according to actual needs.

In order to avoid too large deviation from the rated voltage interval and line blowing, the absolute value of the difference between the third voltage and the minimum value of the rated voltage interval of the scanning line can be less than or equal to e1, and the absolute value of the difference between the fourth voltage and the maximum value of the rated voltage interval of the data line can be less than or equal to f1, wherein e1 and f1 can be equal to or different from each other, the specific values of e1 and f1 can be flexibly set according to actual needs, for example, e1 can be set to 5V, 10V, etc., and f1 can be set to 6V, 8V, etc. In one example, assuming that e1 is 5V, f1 is 25V, the rated voltage interval of the scan line is [ -9V, 30V ], the rated voltage interval of the data line is [0V, 14V ], and the third voltage is in the range of [ -14V, -9V), i.e., greater than or equal to-14V and less than-9V; the value range of the fourth voltage is (14V, 39V), namely, the fourth voltage is greater than 14V and less than or equal to 39V.

In order to avoid too small deviation from the rated voltage interval and slow deterioration/aging speed, the absolute value of the difference between the third voltage and the minimum value of the rated voltage interval of the scanning line can be more than or equal to e2, the absolute value of the difference between the fourth voltage and the maximum value of the rated voltage interval of the data line can be more than or equal to f2, wherein e2 is less than or equal to e1, f2 is less than or equal to f1, and the specific values of e2 and f2 can be flexibly set according to actual needs. In one example, assuming that e1 is 5V, e2 is 1V, f1 is 26V, f2 is 5V, the scan line rated voltage interval is [ -9V, 30V ], the data line rated voltage interval is [0V, 14V ], the third voltage is in the range of [ -14V, -10V ], that is, greater than or equal to-14V, and less than or equal to-10V; the value range of the fourth voltage is [19V, 40V ], namely, the fourth voltage is greater than 19V and less than or equal to 40V; for example, the third voltage may be-10V and the fourth voltage may be 35V.

In some embodiments, since the first voltage and the third voltage are both voltages applied to the scan lines and the second voltage and the fourth voltage are both voltages applied to the data lines, the first voltage and the third voltage may be equal and the second voltage and the fourth voltage may be equal; alternatively, the first voltage and the third voltage may not be equal, and the second voltage and the fourth voltage may not be equal, i.e., the first voltage may be greater than or less than the third voltage and the second voltage may be greater than or less than the fourth voltage, in one example, the first voltage is less than the third voltage and the second voltage is less than the fourth voltage, or the first voltage is greater than the third voltage and the second voltage is greater than the fourth voltage.

In the embodiment of the present invention, the second time period may be flexibly set according to actual needs, for example, may be set to 1 second, 4 seconds, 5 seconds, and the like. In one example, in order to avoid excessive aging/deterioration and line failure, the second time period may be determined according to a deviation of the third voltage from a scan line rated voltage interval and a deviation of the fourth voltage from a data line rated voltage interval, wherein the second time period is smaller as the deviation of the third voltage from the scan line rated voltage interval is larger and the deviation of the fourth voltage from the data line rated voltage interval is larger. For example, assuming that the scan line rated voltage range is [ -9V, 30V ], the data line rated voltage range is [0V, 14V ], if the third voltage value is (-10V, -9V), the fourth voltage value is (14V, 20V ], the second time period may be 3 seconds, if the third voltage value is [ -15V, -10V ], the fourth voltage value is (20V, 35V ], the second time period may be 1 second.

In some embodiments, the second duration may or may not be equal to the first duration, e.g., the second duration may be less than the first duration.

Step S14: and testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal.

In the embodiment of the invention, after the scanning lines of the liquid crystal display panel are applied with the third voltage lasting for the second time length and the data lines are applied with the fourth voltage lasting for the second time length, the liquid crystal display panel is tested to determine whether the liquid crystal display panel is abnormal.

The specific test mode can be flexibly set according to actual needs.

In some embodiments, step S14 includes: and carrying out a lighting test on the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal.

The liquid crystal display panel can be driven to light by applying rated voltage to the scanning lines and the data lines of the liquid crystal display panel, so that whether the liquid crystal display panel is abnormal or not can be tested.

In some embodiments, step S14 includes: and testing the image quality of the pressurized liquid crystal display panel to determine whether the image quality of the liquid crystal display panel reaches a preset condition.

The liquid crystal display panel can be driven to display the picture by applying corresponding voltages to the scanning lines and the data lines of the liquid crystal display panel, so that whether the picture quality of the liquid crystal display panel reaches the preset condition or not is tested. The preset conditions can be flexibly set according to actual needs.

In this embodiment, a method for testing a liquid crystal display panel is adopted, in a test of an array board, a first voltage lasting for a first duration is applied to a scan line of the array board, and a second voltage lasting for the first duration is applied to a data line; the first voltage does not belong to the rated voltage interval of the scanning line, and the second voltage does not belong to the rated voltage interval of the data line; testing the pressurized array plate to determine whether the array plate is abnormal; after the liquid crystal display panel is manufactured on the basis of the array plate passing the test, in the test of the liquid crystal display panel, a third voltage lasting for a second time is applied to a scanning line of the liquid crystal display panel, and a fourth voltage lasting for the second time is applied to a data line; the third voltage does not belong to the rated voltage interval of the scanning line, and the fourth voltage does not belong to the rated voltage interval of the data line; testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal; that is, in the present application, in the testing process of the array board and the liquid crystal display panel, the voltage applied to the semi-finished product or the finished product of the liquid crystal display panel obtained by manufacturing does not belong to the rated voltage interval, so as to accelerate the aging or deterioration of the semi-finished product or the finished product of the liquid crystal display panel, expose the hidden defect of the semi-finished product or the finished product of the liquid crystal display panel, reduce the omission factor, improve the quality of the liquid crystal display panel, and prolong the service life of the liquid crystal display panel; and after the array plate is manufactured, the voltage applied to the array plate does not belong to the rated voltage interval, so that the hidden defect of the array plate is exposed, the situation that the time and materials are wasted due to the fact that the array plate with the hidden defect is used for manufacturing a liquid crystal display panel is avoided, the manufacturing efficiency and the yield are improved, and the manufacturing cost is reduced.

Based on the foregoing embodiment, a further embodiment of the present application is proposed. In the embodiment of the present invention, referring to fig. 4, after step S14, the method for testing a liquid crystal display panel may further include:

step S15: in the aging test, the liquid crystal display panel is placed in a first aging environment.

Wherein the temperature of the first aging environment is greater than 55 degrees celsius.

It should be clear that the Aging test in the embodiment of the present invention refers to Aging test, where an environment corresponding to Aging test is referred to as an Aging environment. In the embodiment of the invention, a third voltage lasting for a second time is applied to a scanning line of the liquid crystal display panel, a fourth voltage lasting for the second time is applied to a data line of the liquid crystal display panel, the pressurized liquid crystal display panel is tested, and after the test is passed, the liquid crystal display panel is placed in a first aging environment for aging test, wherein the temperature of the first aging environment is more than 55 ℃; namely, the liquid crystal display panel is placed in an aging environment with the temperature of more than 55 ℃. It can be understood that the temperature above 55 degrees celsius belongs to the higher temperature category, so that the aging or deterioration of the liquid crystal display panel can be accelerated, the testing time can be reduced, and the liquid crystal display panel with poor quality can be detected more effectively through the heating treatment, and the defect missing rate of the liquid crystal display panel can be reduced.

In some embodiments, the temperature of the first aging environment is greater than 55 degrees celsius and less than or equal to 65 degrees celsius; the temperature of the first aging environment is adjusted flexibly according to a specific application scene, for example, 65 degrees centigrade, etc. in order to increase the aging speed, expose the defects of the liquid crystal display panel and avoid the damage of the liquid crystal display panel caused by too high temperature, the temperature of the first aging environment can be 60 degrees centigrade.

Step S16: and after the third time period, testing the liquid crystal display panel to determine whether the liquid crystal display panel is abnormal.

In the embodiment of the invention, the liquid crystal display panel is required to be placed in the first aging environment for a third time; namely, the liquid crystal display panel needs to be placed in an aging environment with the temperature above 55 ℃ for a third time period, and the liquid crystal display panel is tested after being placed in the aging environment with the temperature above 55 ℃ for the third time period, so as to determine whether the liquid crystal display panel is abnormal. It can be understood that, in the embodiment of the present invention, determining whether the liquid crystal display panel is abnormal may be determining whether the line connection is abnormal, whether the on-off of the switch is abnormal, and the like; in practical application, the related aspect of determining whether the liquid crystal display panel is abnormal can be flexibly adjusted according to a specific application scene.

In some embodiments, the third length of time is greater than or equal to 1 hour, and less than or equal to 2 hours; namely, the value range of the third time length is [1h, 2h ], optionally, the value of the third time length can be 1h, 1.5h, 2h and the like; in practical application, the third duration can be flexibly adjusted according to a specific application scenario. In general, the longer the third time period for which the liquid crystal display panel is placed in the first aging environment, the more the hidden defects of the liquid crystal display panel can be exposed, so that the liquid crystal display panel with poor quality can be more effectively detected.

In the embodiment of the invention, in the aging test, the liquid crystal display panel is placed in a first aging environment with the temperature of more than 55 ℃, and further, after a third time period, the liquid crystal display panel is tested to determine whether the liquid crystal display panel is abnormal or not; the problems that the existing liquid crystal display panel is long in testing time, so that the manufacturing period of the liquid crystal display panel is long, and the manufacturing process of the liquid crystal display panel is influenced are solved.

That is to say, in the embodiment of the present invention, in the aging test process, the heating process exceeding the temperature of 55 degrees celsius is applied to the manufactured liquid crystal display panel, so that the aging or deterioration of the liquid crystal display panel is accelerated, the test time is reduced, the manufacturing period of the liquid crystal display panel is shortened, and the manufacturing rate of the liquid crystal display panel is increased. Moreover, the heating process can accelerate the aging or deterioration of the circuit on the liquid crystal display panel, so that the hidden defects of the liquid crystal display panel can be exposed, for example, the liquid crystal display panel is over-etched due to the residual of photoresist and other conditions, and some connection points are weak; in the embodiment of the invention, the weak connection point on the liquid crystal display panel is disconnected due to higher temperature applied on the liquid crystal display panel, so that the disconnection of the connection point can be tested in the subsequent process, the liquid crystal display panel with poor quality can be detected more effectively, the defect omission ratio of the liquid crystal display panel is reduced, and the quality of the liquid crystal display panel which finally flows to the market is better.

Based on the foregoing embodiments, a method for testing a liquid crystal display panel according to another embodiment of the present application is provided; in the embodiment of the present invention, after the step of placing the liquid crystal display panel in the first aging environment in step S15, the method for testing a liquid crystal display panel further includes the following steps:

step S17: applying a fifth voltage to the scanning lines of the liquid crystal display panel, applying a sixth voltage to the data lines, and keeping for a fourth time; and the voltage difference between the fifth voltage and the sixth voltage is higher than a target voltage difference, the target voltage difference is the maximum voltage difference between the rated voltage of the scanning line and the rated voltage of the data line, and the fourth time length is less than the third time length.

It should be clear that, in the embodiment of the present invention, during the process that the liquid crystal display panel is in the first aging environment, the fifth voltage is applied to the scan lines of the liquid crystal display panel, the sixth voltage is applied to the data lines, and the fourth time period is kept; that is, the fifth voltage lasting for the fourth time period is applied to the scan line of the liquid crystal display panel, the sixth voltage lasting for the fourth time period is applied to the data line, for example, V1 lasting T3 is applied to the scan line of the liquid crystal display panel, and V2 lasting T3 is applied to the data line.

The voltage difference between the fifth voltage and the sixth voltage is higher than a target voltage difference, and the target voltage difference is the maximum voltage difference between the rated voltage of the scanning line and the rated voltage of the data line; that is, the voltage difference of the fifth voltage applied to the scan line and the sixth voltage applied to the data line of the liquid crystal display panel is higher than the maximum voltage difference between the rated voltage of the scan line and the rated voltage of the data line. It can be understood that, because the voltage difference between the fifth voltage applied to the scan line and the sixth voltage applied to the data line of the lcd panel is higher than the maximum voltage difference between the rated voltage of the scan line and the rated voltage of the data line, in the embodiment of the present invention, there is necessarily a case where the voltage applied to at least one side exceeds the rated voltage interval corresponding to the side. In the embodiment of the present invention, the fifth voltage applied to the scan line of the liquid crystal display panel may be smaller than the minimum value of the rated voltage interval of the scan line; or the sixth voltage applied to the data line of the liquid crystal display panel is larger than the maximum value of the rated voltage interval of the data line; or the fifth voltage applied to the scanning line of the liquid crystal display panel is smaller than the minimum value of the rated voltage interval of the scanning line, and the sixth voltage applied to the data line of the liquid crystal display panel is larger than the maximum value of the rated voltage interval of the data line; in practical application, the method can be flexibly adjusted according to specific application scenes. In some examples, the fifth voltage applied to the scan line of the liquid crystal display panel may be less than a minimum value of a rated voltage interval of the scan line, and the sixth voltage applied to the data line may be greater than a maximum value of a rated voltage interval of the data line, for example, the fifth voltage applied to the scan line of the liquid crystal display panel may be a negative voltage, and accordingly, the sixth voltage applied to the data line of the liquid crystal display panel may be a positive voltage.

In practical application, the target voltage difference can be flexibly adjusted according to the specific values of the rated voltage of the scanning line and the rated voltage of the data line. If the target differential pressure is 35V, the differential pressure between the fifth voltage and the sixth voltage may be higher than the target differential pressure by 35V.

In some embodiments, the voltage difference between the fifth voltage and the sixth voltage may be 5-15V higher than the target voltage difference, i.e., the voltage difference between the fifth voltage and the sixth voltage is at least 5V higher than the target voltage difference and at most 15V higher than the target voltage difference. For example, the fifth voltage is-10V, the sixth voltage is 30V, and the voltage difference between the fifth voltage and the sixth voltage is | -10V- (30V) | -40V, which is 5V higher than the target voltage difference 35V; or the fifth voltage is-10V, the sixth voltage is 35V, and the voltage difference between the fifth voltage and the sixth voltage is-10V- (35V) | 45V, which is 10V higher than the target voltage difference 35V; or the fifth voltage is-10V, the sixth voltage is 40V, and the voltage difference between the fifth voltage and the sixth voltage is | -10V- (40V) | -50V, which is 15V higher than the target voltage difference of 35V.

The fourth time length is less than the third time length, that is, the time length for applying the fifth voltage to the scanning lines of the liquid crystal display panel and the time length for applying the sixth voltage to the data lines is less than the time length for placing the liquid crystal display panel in the first aging environment, so that the time points for applying the fifth voltage to the scanning lines of the liquid crystal display panel and applying the sixth voltage to the data lines can be flexibly adjusted. For example, the value range of the third time duration is [1h, 2h ], the value range of the fourth time duration is [0.5h, 1h), and optionally, the value of the third time duration may be 0.5h, 0.6h, 0.8h, and the like.

In the embodiment of the invention, in the aging test, the liquid crystal display panel is in the first aging environment, the fifth voltage is applied to the scanning line of the liquid crystal display panel, the sixth voltage is applied to the data line, and the fifth voltage is applied to the scanning line of the liquid crystal display panel, the voltage difference of the sixth voltage applied to the data line is higher than the maximum voltage difference between the rated voltage of the scanning line and the rated voltage of the data line. Moreover, since the voltage applied to the liquid crystal display panel is high, that is, the liquid crystal display panel is subjected to pressurization treatment, the aging or deterioration of the lines on the liquid crystal display panel is accelerated, so that hidden defects of the liquid crystal display panel are exposed, for example, the liquid crystal display panel is over-etched due to the conditions of photoresist residue and the like, some connection points are weak, and in the normal test process, the connection points are normally electrified and cannot be detected; in the embodiment of the invention, the voltage applied to the liquid crystal display panel is higher, so that the weak connection point on the liquid crystal display panel is disconnected, and the disconnection of the connection point can be tested in the subsequent process, thereby more effectively detecting the liquid crystal display panel with poor quality, reducing the defect omission ratio of the liquid crystal display panel and ensuring that the quality of the liquid crystal display panel finally flowing to the market is better.

Based on the foregoing embodiments, a method for testing a liquid crystal display panel according to another embodiment of the present application is provided; in the embodiment of the present invention, after step S16, the method for testing a liquid crystal display panel further includes the following steps:

step S18: placing the liquid crystal display panel in a second aging environment;

step S19: after the fifth time period, the liquid crystal display panel is tested again to determine whether the liquid crystal display panel is abnormal.

It should be clear that, in the embodiment of the present invention, after the liquid crystal display panel is placed in the first aging environment for the first time period and passes the test, the liquid crystal display panel needs to be placed in the second aging environment for the fifth time period, so that the liquid crystal display panel is tested again, and whether the liquid crystal display panel is abnormal is determined again, so as to further improve the poor blocking inspection rate of the liquid crystal display panel.

It is understood that steps S18-S19 may be repeated for multiple times, for example, 5 times, to implement multiple tests on the liquid crystal display panel, and then a total of 6 aging tests on the liquid crystal display panel may be implemented, and in practical applications, the number of times steps S18-S19 are implemented may be flexibly adjusted.

In some embodiments, the fifth duration may be a constant duration when the number of times steps S18-S19 are performed is 2 or more; for example, the aging tests of the liquid crystal display panel can be performed 3 times by performing the steps S18-S19 2 times, the fifth time length is 1h when the steps S18-S19 are performed 1 time, and the fifth time length is 1h when the steps S18-S19 are performed 2 times.

In some embodiments, when the number of times of execution of steps S18-S19 is 2 or more, the fifth time period may be a variable time period that sequentially increases by a preset increase value; for example, if the steps S18-S19 are performed 3 times, the aging test of the liquid crystal display panel can be performed 4 times, the fifth time length is 1h when the steps S18-S19 are performed 1 time, the fifth time length is 1.2h when the steps S18-S19 are performed 2 times, and the fifth time length is 1.4h when the steps S18-S19 are performed 3 times, that is, the preset increase value is 0.2 h; in practical application, the preset growth value can be flexibly adjusted according to a specific application scene.

In some embodiments, when the number of times of execution of steps S18-S19 is 2 or more, the fifth time period may be a variable time period that decreases in order by a preset decrease value; for example, if the steps S18-S19 are performed 3 times, the aging test of the liquid crystal display panel can be performed 4 times, the fifth time length is 1.4h when the steps S18-S19 are performed 1 time, the fifth time length is 1.2h when the steps S18-S19 are performed 2 times, and the fifth time length is 1h when the steps S18-S19 are performed 3 times, that is, the preset reduction value is 0.2 h; in practical application, the preset reduction value can be flexibly adjusted according to a specific application scene.

In some embodiments, the temperature of the first aging environment and the temperature of the second aging environment are the same; when the temperature of the first aging environment is greater than 55 ℃, correspondingly, the temperature of the second aging environment is also greater than 55 ℃; when the temperature of the first aging environment is greater than 55 ℃ and less than or equal to 65 ℃, correspondingly, the temperature of the second aging environment is also greater than 55 ℃ and less than or equal to 65 ℃; when the temperature of the first aging environment is equal to 65 degrees celsius, the temperature of the second aging environment is equal to 65 degrees celsius, accordingly. That is, the temperature of the second aging environment is always the same as the temperature of the first aging environment, so that the re-aging test is different only in the third time period and the fifth time period, and optionally, the fifth time period is shorter than the third time period.

In some embodiments, the temperature of the second aging environment is less than ambient temperature; under normal conditions, the normal temperature is 25 ℃, and optionally, the temperature of the second aging environment can be 20 ℃, 0 ℃, minus 10 ℃ and the like; in practical application, the temperature of the second aging environment can be flexibly adjusted according to a specific application scene.

In the embodiment of the invention, the liquid crystal display panel is subjected to the aging test at a high-temperature first aging environment, and then the liquid crystal display panel is subjected to the aging test at a low-temperature or lower-than-normal-temperature second aging environment; therefore, the aging test is carried out at a more comprehensive temperature, so that the liquid crystal display panel with poor quality can be detected more effectively, the defect omission ratio of the liquid crystal display panel is reduced, and the quality of the liquid crystal display panel which finally flows to the market is better.

Based on the foregoing embodiment, a further embodiment of the present application is proposed. Referring to fig. 5, fig. 5 is a schematic flow chart of a method for testing a liquid crystal display panel provided in this embodiment, where the method for testing a liquid crystal display panel includes:

step S51: in the test of the array plate, a first voltage lasting for a first time period is applied to the scanning lines of the array plate, and a second voltage lasting for the first time period is applied to the data lines.

The array plate is provided with scanning lines, data lines, TFT switches and the like. In order to improve the conductivity of the array board, the scanning lines, the data lines and other wires can be made of copper. In the embodiment of the invention, the rated voltage interval of the scanning line of the array plate is [ -9V, 30V ], and the rated voltage interval of the data line is [0V, 14V ].

In the embodiment of the invention, after the array plate is manufactured, a first voltage is applied to the scanning lines of the array plate, a second voltage is applied to the data lines, and the array plate is kept for a first time period, wherein the first voltage is smaller than the minimum value of the rated voltage interval of the scanning lines, and the second voltage is larger than the maximum value of the rated voltage interval of the data lines, so that the aging or the deterioration of the array plate is accelerated, the weak connection point on the array plate is disconnected, and the hidden defect is exposed.

In order to avoid excessive aging or deterioration, which affects the normal circuit, and avoid insufficient aging or deterioration, which makes the hidden defect unable to be exposed, the first duration is 4 seconds, the first voltage is 6V less than the minimum value of the rated voltage interval of the scan line, the second voltage is 16V greater than the maximum value of the rated voltage interval of the data line, that is, the first voltage is-15V, and the second voltage is 30V.

Step S52: the pressurized array plate is tested to determine if the array plate is abnormal.

In the embodiment of the invention, after the scanning lines of the array plate are applied with the first voltage lasting for the first time length and the data lines are applied with the second voltage lasting for the first time length, the array plate is tested to determine whether the array plate is abnormal.

Step S53: after the liquid crystal display panel is manufactured based on the array panel passing the test, in the test of the liquid crystal display panel, a third voltage lasting for a second time period is applied to the scan lines of the liquid crystal display panel, and a fourth voltage lasting for the second time period is applied to the data lines.

It should be understood that after the array plate is manufactured and tested, the array plate passing the test is further produced to manufacture a liquid crystal display panel, wherein the liquid crystal display panel includes the array plate, the color filter, the polarizing plate, and the like.

In the embodiment of the invention, after the liquid crystal display panel is manufactured, the liquid crystal display panel is tested, in the testing process, a third voltage is applied to a scanning line of the liquid crystal display panel, a fourth voltage is applied to a data line of the liquid crystal display panel, and the liquid crystal display panel is kept for a second time period, wherein the third voltage is smaller than the minimum value of a rated voltage interval of the scanning line, and the fourth voltage is larger than the maximum value of the rated voltage interval of the data line, so that the aging or the deterioration of the liquid crystal display panel is accelerated, the liquid crystal display panel is disconnected from a weak connection point, and hidden defects are exposed.

In order to avoid excessive aging or deterioration, which affects the normal circuit, and avoid insufficient aging or deterioration, which makes the hidden defect unable to be exposed, the second duration is 1 second, the third voltage is smaller than the minimum value of the rated voltage interval of the scan line by 1V, the fourth voltage is larger than the maximum value of the rated voltage interval of the data line by 21V, that is, the third voltage is-10V, and the fourth voltage is 35V.

Step S54: and testing the image quality of the pressurized liquid crystal display panel to determine whether the image quality of the liquid crystal display panel reaches a preset condition.

The preset conditions can be flexibly set according to actual needs.

After the third voltage lasting for the second time is applied to the scanning lines of the liquid crystal display panel and the fourth voltage lasting for the second time is applied to the data lines, corresponding display data can be acquired and input to the liquid crystal display panel to drive the liquid crystal display panel to display the picture, so that whether the picture quality of the liquid crystal display panel reaches the preset condition or not is tested.

In this embodiment, a method for testing a liquid crystal display panel is adopted, in a test of an array board, a first voltage lasting for a first duration is applied to a scan line of the array board, and a second voltage lasting for the first duration is applied to a data line; the first voltage does not belong to the rated voltage interval of the scanning line, and the second voltage does not belong to the rated voltage interval of the data line; testing the pressurized array plate to determine whether the array plate is abnormal; after the liquid crystal display panel is manufactured on the basis of the array plate passing the test, in the test of the liquid crystal display panel, a third voltage lasting for a second time is applied to a scanning line of the liquid crystal display panel, and a fourth voltage lasting for the second time is applied to a data line; the third voltage does not belong to the rated voltage interval of the scanning line, and the fourth voltage does not belong to the rated voltage interval of the data line; testing the image quality of the pressurized liquid crystal display panel to determine whether the image quality of the liquid crystal display panel reaches a preset condition; that is, in the present application, in the testing process of the array board and the liquid crystal display panel, the voltage applied to the semi-finished product or the finished product of the liquid crystal display panel obtained by manufacturing does not belong to the rated voltage interval, so as to accelerate the aging or deterioration of the semi-finished product or the finished product of the liquid crystal display panel, expose the hidden defect of the semi-finished product or the finished product of the liquid crystal display panel, reduce the omission factor, and improve the quality and the service life of the liquid crystal display panel; and after the array plate is manufactured, the voltage applied to the array plate does not belong to the rated voltage interval, so that the hidden defect of the array plate is exposed, the situation that the time and materials are wasted due to the fact that the array plate with the hidden defect is used for manufacturing a liquid crystal display panel is avoided, the manufacturing efficiency and the yield are improved, and the manufacturing cost is reduced.

Based on the foregoing embodiments, a liquid crystal display panel test apparatus of the present application is proposed, the liquid crystal display panel test apparatus being configured to:

in the test of the array plate, a first voltage lasting for a first time length is applied to a scanning line of the array plate, and a second voltage lasting for the first time length is applied to a data line; the first voltage does not belong to the rated voltage interval of the scanning line, and the second voltage does not belong to the rated voltage interval of the data line; testing the pressurized array plate to determine whether the array plate is abnormal; after the liquid crystal display panel is manufactured on the basis of the array plate passing the test, in the test of the liquid crystal display panel, a third voltage lasting for a second time is applied to a scanning line of the liquid crystal display panel, and a fourth voltage lasting for the second time is applied to a data line; the liquid crystal display panel comprises an array plate, the third voltage does not belong to the rated voltage interval of the scanning line, and the fourth voltage does not belong to the rated voltage interval of the data line; and testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal.

The liquid crystal display panel testing equipment can also be used for implementing other steps in the liquid crystal display panel testing method.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or system that comprises the element.

The above-mentioned serial numbers of the embodiments of the present application are merely for description and do not represent the merits of the embodiments.

The above description is only an alternative embodiment of the present application, and not intended to limit the scope of the present application, and all modifications and equivalents of the subject matter of the present application, which are made by the following claims and their equivalents, or which are directly or indirectly applicable to other related arts, are intended to be included within the scope of the present application.

Claims

1. The liquid crystal display panel testing method is characterized by comprising the following steps:

2. The method for testing the liquid crystal display panel according to claim 1, wherein the step of testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal comprises:

or the like, or, alternatively,

3. The method for testing the liquid crystal display panel according to claim 1, wherein a rated voltage section of the scan line is-9V to 30V, and a rated voltage section of the data line is 0V to 14V.

4. The method for testing a liquid crystal display panel according to claim 1, wherein the first voltage is less than a minimum value of a rated voltage section of the scan line, and the second voltage is greater than a maximum value of a rated voltage section of the data line; the third voltage is smaller than the minimum value of the rated voltage interval of the scanning line, and the fourth voltage is larger than the maximum value of the rated voltage interval of the data line.

5. The method for testing a liquid crystal display panel according to claim 1, wherein the first voltage is different from the third voltage; the second voltage is different from the fourth voltage.

6. The method for testing a liquid crystal display panel according to claim 1, wherein after the step of testing the pressurized liquid crystal display panel to determine whether the liquid crystal display panel is abnormal, the method further comprises:

7. The method for testing a liquid crystal display panel according to claim 6, wherein the temperature of the first aging environment is 60 degrees celsius.

8. The liquid crystal display panel testing method of any one of claims 1 to 7, wherein the first voltage is 6V smaller than a minimum value of a rated voltage interval of the scan line; the second voltage is 16V greater than a maximum value of a rated voltage section of the data line.

9. The method of testing a liquid crystal display panel of claim 8, wherein the third voltage is 1V less than a minimum value of a rated voltage section of the scan line, and the fourth voltage is 21V greater than a maximum value of a rated voltage section of the data line.

10. The liquid crystal display panel testing apparatus is characterized in that the liquid crystal display panel testing apparatus is used for: