CN113421020B - Multi-index abnormal point overlap ratio analysis method - Google Patents
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Abstract
The disclosure relates to a multi-index outlier overlap ratio analysis method, and relates to the field of data processing, wherein the method comprises the following steps: acquiring a target index of a target object in a target time interval and acquiring a plurality of other indexes; acquiring an abnormal time sequence of the target index and an abnormal time sequence of each other index; calculating the coincidence degree between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index; screening N other indexes from the plurality of other indexes according to the overlapping ratio; and displaying N other indexes in the list according to the degree of coincidence from top to bottom, and displaying the target index and M other indexes before sequencing in a broken line comparison mode, wherein M is a positive integer smaller than N. Therefore, other indexes which are highly overlapped with the time sequence of the abnormal point of the target index are checked aiming at a certain target index, and other relations of the abnormal occurrence among different indexes are mined, so that the abnormal indexes can be quickly positioned later.
Description
Technical Field
The disclosure relates to the technical field of data processing, in particular to a multi-index outlier coincidence degree analysis method.
Background
At present, enterprises are particularly concerned about data index abnormality, and an enterprise optimization iteration thought is obtained by analyzing index abnormal points.
However, at present, enterprises often analyze based on occurrence time of abnormal points, and ignore abnormal points which have occurred in history. Thus, after each occurrence of an outlier, the business hypothesis analysis is repeated, and the capability of quickly obtaining an analysis conclusion based on historical analysis experience is not provided.
Disclosure of Invention
In order to solve the above technical problems or at least partially solve the above technical problems, the present disclosure provides a multi-index outlier overlap ratio analysis method.
The disclosure provides a multi-index outlier overlap ratio analysis method, comprising the following steps:
Acquiring a target index of a target object in a target time interval and acquiring a plurality of other indexes;
acquiring an abnormal time sequence of the target index and an abnormal time sequence of each other index;
Calculating the coincidence degree between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index;
screening N other indexes from the plurality of other indexes according to the overlapping ratio; wherein N is a positive integer;
Displaying the N other indexes in a list according to the degree of overlap from top to bottom in a sequence manner, and displaying the target index and M other indexes before sequencing in a fold line comparison manner; wherein M is a positive integer less than N.
In an optional embodiment of the disclosure, the calculating the coincidence ratio between the target index and each of the other indexes according to the anomaly time series of the target index and the anomaly time series of each of the other indexes includes:
Acquiring the coincidence point of the abnormal time sequence of the target index and the abnormal time sequence of each other index;
and calculating according to the number of the coincident points and the coincident time value to obtain the coincidence degree.
In an optional embodiment of the disclosure, the screening N other indexes from the plurality of other indexes according to the overlap ratio includes:
And sequencing according to the overlap ratio value from high to low, and acquiring the N other indexes before sequencing.
In an optional embodiment of the disclosure, the displaying the N other indexes in the list according to the magnitude of the overlap ratio from top to bottom, and displaying the target index and M other indexes before sorting in a form of fold line comparison, includes:
Displaying the target index and the M other indexes in a first area of a display interface in a broken line comparison mode; wherein, the display positions of the M other indexes are related to the coincidence degree;
And displaying the N other indexes in the list of the second area of the display interface according to the degree of coincidence from high to low in sequence.
In an optional embodiment of the disclosure, the multi-index outlier coincidence degree analysis method further includes:
Receiving a click operation request; wherein the click operation request comprises an index to be queried;
and jumping to an information display interface corresponding to the index to be queried.
In an optional embodiment of the disclosure, the multi-index outlier coincidence degree analysis method further includes:
Acquiring coincidence points corresponding to the target indexes and other indexes of the target quantity and coincidence time values corresponding to each coincidence point;
and displaying the coincident points and the coincident time values corresponding to each coincident point in the first area in a preset mode.
In an optional embodiment of the disclosure, the multi-index outlier coincidence degree analysis method further includes:
and displaying the first M other indexes in the list in a lighting mode.
In an optional embodiment of the disclosure, the multi-index outlier coincidence degree analysis method further includes:
and canceling the other lighted indexes, and acquiring the remaining one or more other indexes to carry out lighting processing.
Compared with the prior art, the technical scheme provided by the embodiment of the disclosure has the following advantages:
Acquiring a target index of a target object in a target time interval and acquiring a plurality of other indexes; acquiring an abnormal time sequence of the target index and an abnormal time sequence of each other index; calculating the coincidence degree between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index; screening N other indexes from the plurality of other indexes according to the overlapping ratio; and displaying N other indexes in the list according to the degree of coincidence from top to bottom, and displaying the target index and M other indexes before sequencing in a broken line comparison mode, wherein M is a positive integer smaller than N. Therefore, other indexes which are highly overlapped with the time sequence of the abnormal point of the target index are checked aiming at a certain target index, and other relations of the abnormal occurrence among different indexes are mined, so that the abnormal indexes can be quickly positioned later.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the disclosure and together with the description, serve to explain the principles of the disclosure.
In order to more clearly illustrate the embodiments of the present disclosure or the solutions in the prior art, the drawings that are required for the description of the embodiments or the prior art will be briefly described below, and it will be obvious to those skilled in the art that other drawings can be obtained from these drawings without inventive effort.
FIG. 1 is a flow chart of a multi-index outlier overlap ratio analysis method according to an embodiment of the disclosure;
FIG. 2 is a scene graph of a multi-index outlier coincidence analysis according to an embodiment of the present disclosure.
Detailed Description
In order that the above objects, features and advantages of the present disclosure may be more clearly understood, a further description of aspects of the present disclosure will be provided below. It should be noted that, without conflict, the embodiments of the present disclosure and features in the embodiments may be combined with each other.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present disclosure, but the present disclosure may be practiced otherwise than as described herein; it will be apparent that the embodiments in the specification are only some, but not all, embodiments of the disclosure.
Fig. 1 is a flow chart of a multi-index outlier coincidence degree analysis method according to an embodiment of the disclosure. As shown in fig. 1, the method includes:
Step 101, acquiring a target index of a target object in a target time interval, and acquiring a plurality of other indexes.
The target time area can be selected and set according to actual application needs, such as a day, a week, a month, and the like, the target object can also be selected and set according to actual application needs, such as advertisements of enterprises, application programs of the enterprises, popularization information of the enterprises, and the like, indexes corresponding to different target objects are different, such as the targets are advertisements of the enterprises, the indexes can be indexes of opening quantity of the advertisements, pushing quantity of the advertisements, and the like, the target indexes can be any designated index, can be selected and set according to needs, and the indexes can be the click quantity of application program elements, the version stability rate of the application programs, the click rate of search results, and the like.
The other indexes are indexes except the target indexes, for example, the target indexes are the click quantity of the application program elements, the other indexes can be the stability rate of the version of the application program, the pushing quantity of the advertisement and the like, and the other indexes are specifically selected and set according to the application scene.
In an embodiment of the present disclosure, obtaining a target indicator of a target object of a target time interval includes: based on the triggering operation of a user on a preset information selection control on a display page, receiving the information selection triggering operation, and acquiring a target time interval and a target index. The display page is used for displaying the index selection, the information selection control is used for performing information selection, the expression form of the information selection control is not limited, and for example, the information selection control can be an icon or text information.
Specifically, a triggering operation of the user on the display page may be detected, and when a clicking operation or a hovering operation of the user on the information selection control is detected, the information selection triggering operation may be received, so as to obtain the target time interval and the target index.
Further, a plurality of other metrics are obtained, such as from querying a database-related list.
Step 102, obtaining an abnormal time sequence of the target index and an abnormal time sequence of each other index.
And step 103, calculating the coincidence degree between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index.
In the embodiment of the present disclosure, the abnormal time sequence of the target index refers to a time point when an abnormality occurs in the target index, for example, an abnormality occurs in the target index at three afternoon on seven days of 2021, that is, the abnormal time point when the target index is at three afternoon on seven days of 2021, and a plurality of abnormal time points are combined into the abnormal time sequence of the target index; the abnormal time sequence of the other indexes refers to the time point when the other indexes are abnormal, for example, the other indexes 1 are abnormal at three afternoon and four minutes and 0 seconds of the seventh, and the afternoon of 2021, the abnormal time point of the other indexes 1 is the abnormal time sequence of the other indexes, wherein a plurality of abnormal time points are combined into the abnormal time sequence of the other indexes.
In the embodiment of the present disclosure, there are various ways of calculating the coincidence ratio between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index, and as an example, the coincidence point of the target abnormal time sequence and the other abnormal time sequence is obtained, and calculation is performed according to the number of coincidence points and the coincidence time value, so as to obtain the coincidence ratio.
The index per hour can only be matched with the index per hour; the per-day index may match the per-day index.
Specifically, when the time period is other by taking the index of the hour as the target index, the overlap ratio is calculated in units of the hour: according to the index of the hour: every hour of anomaly, the overlap ratio is increased by 1, other indexes of nearly 3 days can be matched, and indexes according to days cannot be matched.
Specifically, when the time period is made to be other by taking the index of the day as the target index, the coincidence degree is calculated in the unit of the day: according to the index of the day: every matching is abnormal for one day, the coincidence ratio is increased by 1, the alarm indexes (when the alarm indexes are grouped, the alarm indexes are matched according to the grouping) can be matched for nearly 30 days, and the indexes according to the hours cannot be matched.
And 104, screening N other indexes from the plurality of other indexes according to the overlapping degree.
In the embodiment of the present disclosure, there are various ways of screening N other indexes from a plurality of other indexes according to the degree of overlap, and as an example, the N other indexes before the sorting are obtained by sorting the degree of overlap from high to low.
And 105, displaying the N other indexes in the list according to the degree of overlap from high to low, and displaying the target index and M other indexes before sequencing in a broken line comparison mode, wherein M is a positive integer smaller than N.
In the embodiment of the present disclosure, there are a plurality of ways of displaying N other indexes from high to low according to the value of the overlap ratio in the list, and displaying the target index and M other indexes before sorting in a fold line comparison manner, which is a possible implementation manner, in a first area of the display interface, displaying the target index and M other indexes in a fold line comparison manner; wherein, the display positions of M other indexes are related to the coincidence degree; and displaying N other indexes in the list of the second area of the display interface according to the degree of overlap from top to bottom.
The first area may be a left area of the display interface, and the second area may be a right area of the display interface, which is specifically selected according to an application scenario, for example, an upper area and a lower area.
As an example of a scenario, as shown in fig. 2, a maximum of 4 indices (including target indices) are shown in the left-hand diagram by default. Other metrics are shown in the right list. In addition, the threshold value of the number of other indexes may be set to be the same as the aforementioned value N, for example, 20, and up to 20 other indexes in the same period (when more than 20 indexes are displayed, only 20 indexes are displayed, and the other indexes are not displayed in the list).
The sorting rule of the index time sequence sorts according to the coincidence degree, and the longer the coincidence time is, the higher the sorting is, namely, the coincidence time of A and the target index in the figure 2 is larger than the coincidence time of B and the target index, and the coincidence time of B and the target index is larger than the coincidence time of C and the target index.
In summary, according to the multi-index outlier coincidence degree analysis method disclosed by the disclosure, the target index of the target object in the target time interval is obtained, and a plurality of other indexes are obtained; acquiring an abnormal time sequence of the target index and an abnormal time sequence of each other index; calculating the coincidence degree between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index; screening N other indexes from the plurality of other indexes according to the overlapping ratio; and displaying N other indexes in the list according to the degree of coincidence from top to bottom, and displaying the target index and M other indexes before sequencing in a broken line comparison mode, wherein M is a positive integer smaller than N. Therefore, other indexes which are highly overlapped with the time sequence of the abnormal point of the target index are checked aiming at a certain target index, and other relations of the abnormal occurrence among different indexes are mined, so that the abnormal indexes can be quickly positioned later.
In an alternative embodiment of the present disclosure, a click operation request is received; the clicking operation request comprises an index to be queried, and jumps to an information display interface corresponding to the index to be queried.
In the embodiment of the disclosure, other degree indexes can be clicked, and an information display interface corresponding to the index to be queried is jumped, so that other indexes are further known, and information of other indexes is more quickly and comprehensively known to help analysis.
In an optional embodiment of the present disclosure, a coincidence point corresponding to a target index and other indexes of a target number and a coincidence time value corresponding to each coincidence point are obtained, and the coincidence point and the coincidence time value corresponding to each coincidence point are displayed in a first area in a preset form. Such as in fig. 2, the coincidence time values are displayed in dark gray form to quickly view the coincidence of different index timing analyses.
In an alternative embodiment of the present disclosure, the top M other indicators in the list are displayed in a lit manner.
In an alternative embodiment of the present disclosure, other indexes that have been lit up are cancelled, and the remaining one or more other indexes are acquired for the lighting process.
Specifically, as shown in FIG. 2, three other indicators A, B and C are highlighted to alert the user, and the illuminated indicators can be canceled, and the other indicators can be illuminated to meet the demand.
Therefore, time sequence analysis among a plurality of indexes can be performed by accumulating abnormal points of time sequences of different indexes, so that the coincidence degree of the time sequence analysis of the different indexes is checked, and the problem of locating the abnormal indexes is quickly helped. That is, it is possible to effectively find an abnormal point of the index, and after accumulation of a predetermined data warning, there is a time series of abnormal points for each of the plurality of warning indexes. The coincidence matching analysis may be performed based on the time series of outliers.
For example, in fig. 2, for a certain target index, an index which is highly overlapped with the time sequence of the abnormal point of the target index can be checked, and other relations of abnormal occurrence among different indexes can be mined, so that a wider analysis idea on the time sequence is provided.
It should be noted that in this document, relational terms such as "first" and "second" and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The foregoing is merely a specific embodiment of the disclosure to enable one skilled in the art to understand or practice the disclosure. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the disclosure. Thus, the present disclosure is not intended to be limited to the embodiments shown and described herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (5)
1. The multi-index abnormal point contact ratio analysis method is characterized by comprising the following steps of:
Acquiring a target index of a target object in a target time interval and acquiring a plurality of other indexes; the target index is the click rate of the application program element, and the other indexes comprise the stability rate of the application program version and the pushing amount of the advertisement;
Acquiring an abnormal time sequence of the target index and an abnormal time sequence of each other index; the abnormal time points of the target index are combined into an abnormal time sequence of the target index, and the abnormal time points of the other indexes are combined into an abnormal time sequence of the other indexes;
Calculating the coincidence degree between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index;
Sorting according to the degree of coincidence value from high to low, wherein the longer the coincidence time is, the higher the sorting is, and N other indexes before sorting are screened out from the plurality of other indexes according to the degree of coincidence; wherein N is a positive integer;
Displaying the N other indexes in a list according to the degree of overlap from top to bottom in a sequence manner, and displaying the target index and M other indexes before sequencing in a fold line comparison manner; wherein M is a positive integer less than N;
The calculating the coincidence degree between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index comprises the following steps:
Acquiring the coincidence point of the abnormal time sequence of the target index and the abnormal time sequence of each other index; calculating according to the number of the coincident points and the coincident time value to obtain the coincidence degree;
When the index of the hour is used as a target index, calculating the coincidence ratio in the unit of the hour, and adding one to the coincidence ratio when the abnormality of one hour is matched; when the index of the day is used as a target index, calculating the coincidence degree by taking the day as a unit, and adding one to the coincidence degree when each day is matched with the abnormality of the day;
The step of displaying the N other indexes in the list according to the degree of coincidence from top to bottom in a sequence manner, and displaying the target indexes and M other indexes before sequencing in a broken line comparison manner, wherein the step of displaying comprises the following steps:
Displaying the target index and the M other indexes in a first area of a display interface in a broken line comparison mode; the display positions of the M other indexes are related to the coincidence ratio, and the target indexes and the folding lines of the M other indexes in the first area have the same data quantity in the same time at the same period;
And displaying the N other indexes in the list of the second area of the display interface according to the degree of coincidence from high to low in sequence.
2. The multi-index outlier coincidence analysis method according to claim 1, further comprising:
Receiving a click operation request; wherein the click operation request comprises an index to be queried;
and jumping to an information display interface corresponding to the index to be queried.
3. The multi-index outlier coincidence analysis method according to claim 1, further comprising:
acquiring coincidence points corresponding to the target indexes and other indexes of the target quantity and coincidence time values corresponding to each coincidence point;
and displaying the coincident points and the coincident time values corresponding to each coincident point in the first area in a preset mode.
4. The multi-index outlier coincidence analysis method according to claim 1, further comprising:
and displaying the first M other indexes in the list in a lighting mode.
5. The multi-index outlier coincidence analysis method of claim 4, further comprising:
and canceling the other lighted indexes, and acquiring the rest one or more other indexes to carry out lighting processing.
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