CN113421020A - Multi-index abnormal point contact ratio analysis method - Google Patents
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Abstract
The invention relates to a method for analyzing contact ratio of multiple index abnormal points, which relates to the field of data processing, wherein the method comprises the following steps: acquiring a target index of a target object in a target time interval, and acquiring a plurality of other indexes; acquiring an abnormal time sequence of a target index and an abnormal time sequence of each other index; calculating the contact ratio between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index; screening N other indexes from the other indexes according to the contact ratio; and displaying N other indexes in the list in an order from top to bottom according to the size value of the contact ratio, and displaying the target index and M other indexes before the order in a fold line comparison mode, wherein M is a positive integer smaller than N. Therefore, aiming at a certain target index, other indexes highly overlapped with the time sequence of the abnormal point of the target index are checked, and other relations of the abnormal indexes are mined, so that the index abnormality can be rapidly positioned in the following.
Description
Technical Field
The disclosure relates to the technical field of data processing, in particular to a method for analyzing contact ratio of multiple index abnormal points.
Background
At present, enterprises pay special attention to data index abnormity, and an enterprise optimization iteration thought is obtained by analyzing index abnormity points.
However, at present, enterprises often perform analysis based on the occurrence time of the abnormal point, and ignore the abnormal point which has occurred in history. Therefore, after each abnormal point is generated, the business hypothesis analysis is repeatedly carried out, and the capability of quickly obtaining an analysis conclusion based on historical analysis experience is not provided.
Disclosure of Invention
To solve the above technical problem or at least partially solve the above technical problem, the present disclosure provides a method for analyzing contact ratio of multiple index outliers.
The present disclosure provides a method for analyzing contact ratio of multiple index outliers, comprising:
acquiring a target index of a target object in a target time interval, and acquiring a plurality of other indexes;
acquiring the abnormal time sequence of the target index and the abnormal time sequence of each other index;
calculating the coincidence degree between the target index and each of the other indexes according to the abnormal time series of the target index and the abnormal time series of each of the other indexes;
screening N other indexes from the other indexes according to the contact ratio; wherein N is a positive integer;
the N other indexes are displayed in a list in an ordering mode according to the size value of the contact ratio from top to bottom, and the target index and M other indexes before the ordering are displayed in a fold line comparison mode; wherein M is a positive integer less than N.
In an optional embodiment of the present disclosure, the calculating, according to the abnormal time series of the target index and the abnormal time series of each of the other indexes, a degree of coincidence between the target index and each of the other indexes includes:
acquiring a coincidence point of the abnormal time sequence of the target index and the abnormal time sequence of each other index;
and calculating according to the number of the coincident points and the coincidence time value to obtain the coincidence degree.
In an optional embodiment of the present disclosure, the screening N other indicators from the plurality of other indicators according to the degree of overlap includes:
and sequencing according to the overlap ratio value from high to low to obtain the N other indexes before sequencing.
In an optional embodiment of the present disclosure, the displaying, in the list, the N other indicators in an order from top to bottom according to the size value of the degree of overlap, and displaying, in a broken line comparison form, the target indicator and M other indicators before the order, includes:
displaying the target index and the M other indexes in a fold line contrast mode in a first area of a display interface; wherein the display positions of the M other indicators are related to the degree of overlap;
and displaying the N other indexes in a list of a second area of the display interface in a high-to-low order according to the size value of the contact ratio.
In an optional embodiment of the present disclosure, the method for analyzing contact ratio of multiple index outliers further includes:
receiving a click operation request; the click operation request comprises an index to be inquired;
and jumping to an information display interface corresponding to the index to be inquired.
In an optional embodiment of the present disclosure, the method for analyzing contact ratio of multiple index outliers further includes:
acquiring coincidence points corresponding to the target index and other indexes of the target number and coincidence time values corresponding to each coincidence point;
and displaying the coincidence points and the coincidence time values corresponding to each coincidence point in a preset form in the first area.
In an optional embodiment of the present disclosure, the method for analyzing contact ratio of multiple index outliers further includes:
and displaying M other indexes in the list before the sorting in a lighting mode.
In an optional embodiment of the present disclosure, the method for analyzing contact ratio of multiple index outliers further includes:
and canceling the lighted other indexes, and acquiring one or more other indexes to carry out lighting processing.
Compared with the prior art, the technical scheme provided by the embodiment of the disclosure has the following advantages:
acquiring a target index of a target object in a target time interval and acquiring a plurality of other indexes; acquiring an abnormal time sequence of a target index and an abnormal time sequence of each other index; calculating the contact ratio between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index; screening N other indexes from the other indexes according to the contact ratio; and displaying N other indexes in the list in an order from top to bottom according to the size value of the contact ratio, and displaying the target index and M other indexes before the order in a fold line comparison mode, wherein M is a positive integer smaller than N. Therefore, aiming at a certain target index, other indexes highly overlapped with the time sequence of the abnormal point of the target index are checked, and other relations of the abnormal indexes are mined, so that the index abnormality can be rapidly positioned in the following.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and together with the description, serve to explain the principles of the disclosure.
In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present disclosure, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a schematic flow chart of a method for analyzing contact ratio of multiple index outliers according to an embodiment of the disclosure;
fig. 2 is a scene diagram of a multi-index outlier contact ratio analysis according to an embodiment of the disclosure.
Detailed Description
In order that the above objects, features and advantages of the present disclosure may be more clearly understood, aspects of the present disclosure will be further described below. It should be noted that the embodiments and features of the embodiments of the present disclosure may be combined with each other without conflict.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present disclosure, but the present disclosure may be practiced in other ways than those described herein; it is to be understood that the embodiments disclosed in the specification are only a few embodiments of the present disclosure, and not all embodiments.
Fig. 1 is a schematic flow chart of a method for analyzing contact ratio of multiple index outliers according to an embodiment of the present disclosure. As shown in fig. 1, the method includes:
The target time zone can be selected and set according to actual application needs, and can be one day, one week, one month and the like, the target object can also be selected and set according to actual application needs, for example, advertisements of enterprises, application programs of enterprises, popularization information of enterprises and the like, indexes corresponding to different target objects are different, for example, the target object is an advertisement of an enterprise, the indexes can be indexes such as the opening amount of the advertisement, the pushing amount of the advertisement and the like, the target index is any specified index, the target time zone can be selected and set according to needs, for example, the target object is an application program of an enterprise, and the indexes can be the click rate of application program elements, the version stability rate of the application program, the click rate of search results and the like.
The other indexes are indexes other than the target index, for example, the target index is the click rate of the application element, and the other indexes may be the version stability rate of the application, the push amount of the advertisement, and the like, and are specifically selected and set according to the application scenario.
In an embodiment of the present disclosure, obtaining a target index of a target object in a target time interval includes: and receiving the information selection trigger operation based on the trigger operation of the user on the preset information selection control on the display page, and acquiring a target time interval and a target index. The display page is a page for displaying the index selection, the information selection control is an anchor point arranged in the display page for information selection, the expression form of the information selection control is not limited, and the information selection control can be an icon or text information, for example.
Specifically, a trigger operation of a user on a display page may be detected, and when a click operation or a hover operation of the user on an information selection control is detected, an information selection trigger operation may be received, so as to obtain a target time interval and a target index.
Further, a plurality of other metrics is obtained, such as a plurality of other metrics from a query in a database-related list.
And 103, calculating the coincidence degree between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index.
In the embodiment of the present disclosure, the abnormal time series of the target index refers to a time point when the target index is abnormal, for example, three points of the whole target index in afternoon in july-month-july in 2021 are abnormal, that is, three points of the target index in afternoon in july-month-july in 2021 are abnormal time points, and a plurality of abnormal time points are combined into the abnormal time series of the target index; the abnormal time series of other indexes refers to the time point when the other indexes are abnormal, for example, the abnormal time point of the other indexes 1 is three-point, zero-quarter and 0-second abnormal in afternoon in july-month and july-day in 2021, and a plurality of abnormal time points are combined into the abnormal time series of the other indexes.
In the embodiment of the present disclosure, there are various ways to calculate the coincidence degree between the target index and each of the other indexes according to the abnormal time series of the target index and the abnormal time series of each of the other indexes, and as an example, the coincidence point between the target abnormal time series and the other abnormal time series is obtained, and the coincidence degree is obtained by performing calculation according to the number of the coincidence points and the coincidence time value.
It should be noted that the hourly index can only match the hourly index; the day-by-day index may match the day-by-day index.
Specifically, when the time interval is otherwise made with the index by hour as the target index, the contact ratio is calculated in units of hours: hourly indices: every hour of abnormality is matched, the contact ratio is increased by 1, other indexes of nearly 3 days can be matched, and indexes according to days cannot be matched.
Specifically, when the time interval is otherwise made according to the day index as a target index, the contact ratio is calculated by taking the day as a unit: according to the day index: every time one day of abnormity is matched, the coincidence degree is added with 1, the alarm indexes of nearly 30 days can be matched (when groups exist, the alarm indexes are matched according to the groups), and the indexes according to the hours cannot be matched.
And 104, screening N other indexes from the other indexes according to the contact ratio.
In the embodiment of the present disclosure, there are various ways to screen out N other indicators from a plurality of other indicators according to the degree of overlap, and as an example, the N other indicators before the ranking are obtained by ranking according to the degree of overlap value from high to low.
And 105, displaying the N other indexes in the list in an order from top to bottom according to the size value of the contact ratio, and displaying the target index and M other indexes before the order in a fold line comparison mode, wherein M is a positive integer smaller than N.
In the embodiment of the disclosure, N other indexes are displayed in the list from high to low according to the size value of the contact ratio, and the target index and M other indexes before sorting are displayed in a fold line comparison manner, so that as a possible implementation manner, the target index and M other indexes are displayed in a fold line comparison manner in the first area of the display interface; wherein the display positions of the M other indexes are related to the contact ratio; and displaying N other indexes in a list of a second area of the display interface from top to bottom according to the size value of the contact ratio.
The first area may be a left area of the display interface, and the second area may be a right area of the display interface, specifically selected according to an application scene, such as an upper area and a lower area.
As an example of a scenario, as shown in fig. 2, a maximum of 4 indicators (including target indicators) are shown in the left diagram by default. Other indices, shown in the right list. In addition, the threshold value of the number of other indexes may be set to be the same as the value N, for example, 20, and at most 20 other indexes in the same period (when the number exceeds 20, only 20 indexes are displayed, and the others are not displayed in the list).
The sorting rule of the index time sequence is sorted according to the coincidence degree, the longer the coincidence time is, the higher the sorting is, namely the coincidence time of the target index and the index A in FIG. 2 is greater than the coincidence time of the target index and the index B, and the coincidence time of the target index and the index B is greater than the coincidence time of the target index and the index C.
In summary, the method for analyzing the contact ratio of the multiple index outliers of the present disclosure obtains the target index of the target object in the target time interval, and obtains a plurality of other indexes; acquiring an abnormal time sequence of a target index and an abnormal time sequence of each other index; calculating the contact ratio between the target index and each other index according to the abnormal time sequence of the target index and the abnormal time sequence of each other index; screening N other indexes from the other indexes according to the contact ratio; and displaying N other indexes in the list in an order from top to bottom according to the size value of the contact ratio, and displaying the target index and M other indexes before the order in a fold line comparison mode, wherein M is a positive integer smaller than N. Therefore, aiming at a certain target index, other indexes highly overlapped with the time sequence of the abnormal point of the target index are checked, and other relations of the abnormal indexes are mined, so that the index abnormality can be rapidly positioned in the following.
In an optional embodiment of the present disclosure, a click operation request is received; and the click operation request comprises an index to be inquired, and the information display interface corresponding to the index to be inquired is skipped to.
In the embodiment of the disclosure, other degree indexes can be clicked, and the information display interface corresponding to the index to be queried is skipped, so that other indexes are further known, and information of other indexes is more quickly and comprehensively known to help analysis.
In an optional embodiment of the present disclosure, coincidence points corresponding to the target index and other indexes of the target number and a coincidence time value corresponding to each coincidence point are obtained, and the coincidence points and the coincidence time values corresponding to each coincidence point are displayed in a preset form in the first area. Such as in fig. 2, the coincidence time values are displayed in dark gray to quickly view the coincidence of the different indicators in the time series analysis.
In an alternative embodiment of the present disclosure, the top M other indicators in the list are displayed in an illuminated manner.
In an optional embodiment of the present disclosure, the other indicators that have been lit are cancelled, and the remaining one or more other indicators are obtained for lighting processing.
Specifically, as shown in FIG. 2, A, B and C are highlighted to prompt the user, and the lit indicator may be cancelled and the other indicators lit to meet the demand.
Therefore, time sequence analysis among multiple indexes can be performed by accumulating abnormal points of different index time sequences, so that the overlap ratio of time sequence analysis of different indexes can be checked, and the problem of index abnormality can be rapidly positioned. That is to say, index abnormal points can be effectively found, and after a certain data early warning is accumulated, a plurality of early warning indexes respectively have time series of the abnormal points. The overlap ratio matching analysis can be performed based on a time series of outliers.
For example, as shown in fig. 2, for a certain target index, the index highly coinciding with the time series of the abnormal point thereof can be checked, and other relationships of the abnormal points among different indexes can be mined, so as to provide a wider analysis idea on the time series.
It is noted that, in this document, relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The foregoing are merely exemplary embodiments of the present disclosure, which enable those skilled in the art to understand or practice the present disclosure. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the disclosure. Thus, the present disclosure is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (8)
1. A method for analyzing contact ratio of multiple index abnormal points is characterized by comprising the following steps:
acquiring a target index of a target object in a target time interval, and acquiring a plurality of other indexes;
acquiring the abnormal time sequence of the target index and the abnormal time sequence of each other index;
calculating the coincidence degree between the target index and each of the other indexes according to the abnormal time series of the target index and the abnormal time series of each of the other indexes;
screening N other indexes from the other indexes according to the contact ratio; wherein N is a positive integer;
the N other indexes are displayed in a list in an ordering mode according to the size value of the contact ratio from top to bottom, and the target index and M other indexes before the ordering are displayed in a fold line comparison mode; wherein M is a positive integer less than N.
2. The method according to claim 1, wherein the calculating the degree of coincidence between the target index and each of the other indexes based on the time series of abnormality of the target index and the time series of abnormality of each of the other indexes comprises:
acquiring a coincidence point of the abnormal time sequence of the target index and the abnormal time sequence of each other index;
and calculating according to the number of the coincident points and the coincidence time value to obtain the coincidence degree.
3. The method of claim 1, wherein the screening N additional indicators from the plurality of additional indicators according to the degree of overlap comprises:
and sequencing according to the overlap ratio value from high to low to obtain the N other indexes before sequencing.
4. The method for analyzing the coincidence of the anomaly points according to claim 1, wherein the step of displaying the N other indicators in the list in an order from top to bottom according to the magnitude of the coincidence, and the target indicator and the M other indicators before the order in a broken line contrast form comprises:
displaying the target index and the M other indexes in a fold line contrast mode in a first area of a display interface; wherein the display positions of the M other indicators are related to the degree of overlap;
and displaying the N other indexes in a list of a second area of the display interface in a high-to-low order according to the size value of the contact ratio.
5. The method of analyzing the coincidence of the multiple index outliers of claim 4, further comprising:
receiving a click operation request; the click operation request comprises an index to be inquired;
and jumping to an information display interface corresponding to the index to be inquired.
6. The method of analyzing the coincidence of the multiple index outliers of claim 4, further comprising:
acquiring coincidence points corresponding to the target index and other indexes of the target number and coincidence time values corresponding to each coincidence point;
and displaying the coincidence points and the coincidence time values corresponding to each coincidence point in a preset form in the first area.
7. The method of analyzing the coincidence of the multiple index outliers of claim 4, further comprising:
and displaying M other indexes in the list before the sorting in a lighting mode.
8. The method of analyzing the coincidence of the multiple index outliers of claim 7, further comprising:
and canceling the lighted other indexes, and acquiring one or more other indexes to carry out lighting processing.
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