CN113351951A - 一种集成陶瓷冷平台的封装结构和实现方法 - Google Patents
一种集成陶瓷冷平台的封装结构和实现方法 Download PDFInfo
- Publication number
- CN113351951A CN113351951A CN202110674843.XA CN202110674843A CN113351951A CN 113351951 A CN113351951 A CN 113351951A CN 202110674843 A CN202110674843 A CN 202110674843A CN 113351951 A CN113351951 A CN 113351951A
- Authority
- CN
- China
- Prior art keywords
- cold platform
- ceramic cold
- transition ring
- metal transition
- core column
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000919 ceramic Substances 0.000 title claims abstract description 49
- 238000000034 method Methods 0.000 title claims abstract description 16
- 238000004806 packaging method and process Methods 0.000 title claims abstract description 16
- 229910052751 metal Inorganic materials 0.000 claims abstract description 48
- 239000002184 metal Substances 0.000 claims abstract description 48
- 230000007704 transition Effects 0.000 claims abstract description 39
- 238000003466 welding Methods 0.000 claims abstract description 27
- 238000005219 brazing Methods 0.000 claims abstract description 20
- 229920006335 epoxy glue Polymers 0.000 claims abstract description 6
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims abstract description 6
- 229910010271 silicon carbide Inorganic materials 0.000 claims abstract description 6
- 229910052581 Si3N4 Inorganic materials 0.000 claims abstract description 5
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims abstract description 5
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims abstract description 5
- 238000004140 cleaning Methods 0.000 claims description 9
- 229910000679 solder Inorganic materials 0.000 claims description 7
- 229910001069 Ti alloy Inorganic materials 0.000 claims description 5
- 239000000945 filler Substances 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 4
- 238000010894 electron beam technology Methods 0.000 claims description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 3
- 239000007769 metal material Substances 0.000 claims description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 2
- 239000002253 acid Substances 0.000 claims description 2
- 239000003921 oil Substances 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 239000004332 silver Substances 0.000 claims description 2
- 239000010935 stainless steel Substances 0.000 claims description 2
- 229910001220 stainless steel Inorganic materials 0.000 claims description 2
- 239000000463 material Substances 0.000 abstract description 8
- 239000002210 silicon-based material Substances 0.000 abstract description 2
- 238000007689 inspection Methods 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- 229910010293 ceramic material Inorganic materials 0.000 description 5
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- AHGIVYNZKJCSBA-UHFFFAOYSA-N [Ti].[Ag].[Cu] Chemical compound [Ti].[Ag].[Cu] AHGIVYNZKJCSBA-UHFFFAOYSA-N 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 239000010963 304 stainless steel Substances 0.000 description 1
- 229910001374 Invar Inorganic materials 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910000589 SAE 304 stainless steel Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- GDYSHMYWZMUKNK-UHFFFAOYSA-N [In].[Ti].[Cu].[Ag] Chemical compound [In].[Ti].[Cu].[Ag] GDYSHMYWZMUKNK-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000005238 degreasing Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000005554 pickling Methods 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/005—Soldering by means of radiant energy
- B23K1/0056—Soldering by means of radiant energy soldering by means of beams, e.g. lasers, E.B.
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/008—Soldering within a furnace
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/20—Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/20—Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
- B23K1/206—Cleaning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/204—Structure thereof, e.g. crystal structure
- G01N33/2045—Defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/207—Welded or soldered joints; Solderability
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Food Science & Technology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Ceramic Products (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
本发明公开了一种集成陶瓷冷平台的封装结构和实现方法,封装结构包括探测器模块、陶瓷冷平台、金属过渡环、芯柱等部件,其特征在于:所述的陶瓷冷平台的上表面安装有探测器模块,下表面气密集成有金属过渡环,金属过渡环与芯柱气密同心连接。在杜瓦芯柱上通过钎焊和激光焊相结合的方法集成有陶瓷冷平台,陶瓷冷平台上表面通过环氧胶安装有探测器模块。该结构中,陶瓷冷平台材料为高导热低膨胀的碳化硅、氮化硅或氮化铝材料,由于碳化硅、氮化硅或氮化铝材料与集成电路用的硅材料低温热匹配,可省去大规模焦平面探测器封装时采用的平衡层结构,结构简洁、制冷机冷量利用率高、温度均匀性好,尤其适用于大规模面阵探测器深低温封装的场合。
Description
技术领域
本发明涉及一种集成陶瓷冷平台的封装结构和实现方法,应用于杜瓦封装,尤其适用于大规模面阵探测器深低温封装的场合。
背景技术
制冷型红外探测器技术在空间天文、对地观测、资源环境等领域有着广泛的应用,随着系统应用对空间分辨率、光谱分辨率等要求的不断提高,面阵探测器的规模在不断扩大,640×512,1K×1K产品已经成熟,国际上先进生产商已经推出4K×4K的产品,随着探测器规模的扩大,为了实现与硅集成电路的低温热匹配,碳化硅等新型陶瓷材料已开始应用于探测器封装基板;另一方面,由于集成度的提高,系统对组件功耗、轻量化等指标也提出了越来越严格的指标,发展高集成度、高可靠、低功耗、轻量化杜瓦封装已成为发展趋势。
发明内容
本发明目的在于提供一种集成陶瓷冷平台的封装结构和实现方法,提出去掉传统杜瓦中的金属冷平台,利用钎焊和高能束焊相结合的方法将陶瓷冷平台直接集成在杜瓦芯柱上,为新型高集成度杜瓦制备提供新的途径。
本发明中出现的“上表面”、“下表面”等方位用词,均为表达方便使用,任何按本发明思路进行的连接关系叙述均属本发明的保护范围。
一种集成陶瓷冷平台的封装结构,包括1探测器模块、2陶瓷冷平台、3金属过渡环、4芯柱。所述的2陶瓷冷平台的上表面安装有1探测器模块,下表面气密集成有3金属过渡环,3金属过渡环与4芯柱气密同心连接。
所述的2陶瓷冷平台材料为碳化硅、氮化硅或氮化铝,该材料热导率高且低温膨胀系数与硅材料匹配。
所述的4芯柱材料为低热导率高强度的钛合金或不锈钢。
所述的3金属过渡环采用膨胀系数与2陶瓷冷平台材料相近,且与4芯柱材料冶金相容性好的金属材料制成;3金属过渡环与2陶瓷冷平台的焊接面内侧设有3-1焊料倒角,用于储存溢出焊料。
一种集成陶瓷冷平台的实现方法,实现步骤如下:
①试样表面清理:将2陶瓷冷平台、3金属过渡环、4芯柱除油、酸洗、酒精清洗处理;
②钎焊连接:选用银基钎料夹装在2陶瓷冷平台和3金属过渡环中间,通过真空钎焊连接固定。
③钎焊检漏:对钎焊焊缝进行检查并检漏
④高能束焊接:3金属过渡环与4芯柱同心装配后,利用激光圆周焊或电子束圆周焊连接固定。
⑤高能束焊检漏:对高能束缝进行检查并检漏。
⑥探测器模块通过环氧胶粘结到(2)陶瓷冷平台上表面。
本发明的一种集成陶瓷冷平台的封装结构和实现方法最主要的特点是结构中不再采用金属冷平台,而采用新型低膨胀高导热陶瓷冷平台,但由于杜瓦芯柱都是金属材料,需考虑冷平台与芯柱的气密性连接。本发明提出在陶瓷背面设置金属过渡环,通过真空钎焊实现陶瓷材料与金属过渡环的异种连接,再将金属过渡环与金属芯柱高能束焊连接,解决了工艺兼容问题。本发明结构的优点主要有两个:由于不再需要金属冷平台和平衡层结构,装配结构更简单,陶瓷材料自身密度小,有利于杜瓦轻量化和冷平台可靠性;二是该结构中传热界面大大减少,有利于提高制冷机冷量利用率,另外陶瓷材料的热导率很高,也有利于保证冷平台的温度均匀性。
附图说明
图1为整体结构剖视图。
图2为金属过渡环剖视图。
附图中:1—探测器模块、2—陶瓷冷平台、3—金属过渡环、4—芯柱、3-1—焊料倒角。
具体实施方式
下面结合实施例对本发明作进一步的详细描述。但不应将此理解为本发明上述主题的范围仅限于以下的实施例,凡基于本发明内容所实现的技术均属于本发明的范围。
实施例1
本发明提供的一种集成陶瓷冷平台的封装结构和实现方法,如图1~图2,包括探测器模块1、陶瓷冷平台2、金属过渡环3、芯柱4。陶瓷冷平台2材料选用碳化硅,金属过渡环材料选用因瓦合金,焊料倒角3-1为R0.5,芯柱采用304不锈钢;将2陶瓷冷平台、3金属过渡环、4芯柱除油、稀硫酸酸洗、酒精超声清洗干净;选用银铜钛活性钎料夹装在2陶瓷冷平台和3金属过渡环中间,通过真空钎焊连接固定,钎焊完成后进行焊缝检查和漏率测试,漏率优于2×10-10Torr·L/s;3金属过渡环与4芯柱同心装配后,利用激光圆周焊连接固定,激光焊完成后进行焊缝检查和漏率测试,漏率优于2×10-10Torr·L/s;最后将合格的1探测器模块通过环氧胶粘结到2陶瓷冷平台上表面。
实施例2
采用与实施例1相同的装配结构和部件清理方式,所不同的是,陶瓷冷平台2材料选用氮化硅,金属过渡环材料选用钼,焊料倒角3-1为R0.5,芯柱采用TC4钛合金;选用银铜铟钛活性钎料夹装在2陶瓷冷平台和3金属过渡环中间,通过真空钎焊连接固定,钎焊完成后进行焊缝检查和漏率测试,漏率优于2×10-10Torr·L/s;3金属过渡环与4芯柱同心装配后,利用电子束圆周焊连接固定,电子束焊完成后进行焊缝检查和漏率测试,漏率优于2×10-10Torr·L/s;最后将合格的1探测器模块通过环氧胶粘结到2陶瓷冷平台上表面。
实施例3
采用与实施例1相同的装配结构和部件清理方式,所不同的是,陶瓷冷平台2材料选用氮化铝,金属过渡环材料选用TC4钛合金,焊料倒角3-1为R0.5,芯柱采用TC4钛合金;选用银铜钛钎料夹装在2陶瓷冷平台和3金属过渡环中间,通过真空钎焊连接固定,钎焊完成后进行焊缝检查和漏率测试,漏率优于2×10-10Torr·L/s;将1探测器模块通过环氧胶粘结到2陶瓷冷平台上表面,开展性能筛选,当探测器满足要求后,将带3金属过渡环的探测器模块与4芯柱同心装配后,利用激光圆周焊连接固定,激光焊完成后进行焊缝检查和漏率测试,漏率优于2×10-10Torr·L/s。
Claims (2)
1.一种集成陶瓷冷平台的封装结构,包括探测器模块(1)、陶瓷冷平台(2)、金属过渡环(3)、芯柱(4);其特征在于:
所述的陶瓷冷平台(2)的上表面安装有探测器模块(1),下表面气密集成有金属过渡环(3),金属过渡环(3)与芯柱(4)气密同心连接;
所述的陶瓷冷平台(2)材料为碳化硅、氮化硅或氮化铝;
所述的芯柱(4)材料为钛合金或不锈钢;
所述的金属过渡环(3)采用膨胀系数与陶瓷冷平台(2)材料相近,且与芯柱(4)材料冶金相容性好的金属材料制成;金属过渡环(3)与陶瓷冷平台(2)的焊接面内侧设有焊料倒角(3-1)。
2.一种集成陶瓷冷平台的封装结构的实现方法,其特征在于方法步骤如下:
①试样表面清理:将陶瓷冷平台(2)、金属过渡环(3)、芯柱(4)除油、酸洗、酒精清洗处理;
②钎焊连接:选用银基钎料夹装在陶瓷冷平台(2)和金属过渡环(3)中间,通过真空钎焊连接固定;
③钎焊检漏:对钎焊焊缝进行检查并检漏;
④高能束焊接:金属过渡环(3)与芯柱(4)同心装配后,利用激光圆周焊或电子束圆周焊连接固定;
⑤高能束焊检漏:对高能束焊缝进行检查并检漏;
⑥探测器模块通过环氧胶粘结到(2)陶瓷冷平台上表面。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110674843.XA CN113351951A (zh) | 2021-06-18 | 2021-06-18 | 一种集成陶瓷冷平台的封装结构和实现方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110674843.XA CN113351951A (zh) | 2021-06-18 | 2021-06-18 | 一种集成陶瓷冷平台的封装结构和实现方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN113351951A true CN113351951A (zh) | 2021-09-07 |
Family
ID=77535114
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202110674843.XA Pending CN113351951A (zh) | 2021-06-18 | 2021-06-18 | 一种集成陶瓷冷平台的封装结构和实现方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN113351951A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114406400A (zh) * | 2022-02-24 | 2022-04-29 | 中国科学院上海技术物理研究所 | 一种钛合金芯柱与因瓦冷头结合件钎焊夹具及方法 |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5598966A (en) * | 1994-07-19 | 1997-02-04 | Santa Barbara Research Center | Brazed lower vacuum housing for a dewar |
RU10877U1 (ru) * | 1999-02-09 | 1999-08-16 | Закрытое акционерное общество "Матричные технологии" | Приемник ик излучения |
US6430941B1 (en) * | 1999-09-23 | 2002-08-13 | Rafael-Armament Development Authority Ltd. | Infrared detector |
CN101144738A (zh) * | 2007-10-31 | 2008-03-19 | 中国科学院上海技术物理研究所 | 一种用于焦平面探测器的低温杜瓦的冷平台的支撑机构 |
CN102651461A (zh) * | 2011-02-25 | 2012-08-29 | 比亚迪股份有限公司 | 一种电池的密封组件及其制作方法、以及一种锂离子电池 |
CN203772505U (zh) * | 2014-01-17 | 2014-08-13 | 中国科学院上海技术物理研究所 | 用于在低温下对分置式杜瓦焊缝加压检漏的装置 |
CN205898305U (zh) * | 2016-04-15 | 2017-01-18 | 中国科学院上海技术物理研究所 | 一种集成式微型杜瓦内管 |
CN111595463A (zh) * | 2020-05-22 | 2020-08-28 | 中国科学院上海技术物理研究所 | 一种低接触热阻且隔离耦合应力的分置式杜瓦冷平台 |
CN112504475A (zh) * | 2020-10-23 | 2021-03-16 | 中国电子科技集团公司第十一研究所 | 一种红外探测器 |
CN215356591U (zh) * | 2021-06-18 | 2021-12-31 | 中国科学院上海技术物理研究所 | 一种集成陶瓷冷平台的封装结构 |
-
2021
- 2021-06-18 CN CN202110674843.XA patent/CN113351951A/zh active Pending
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5598966A (en) * | 1994-07-19 | 1997-02-04 | Santa Barbara Research Center | Brazed lower vacuum housing for a dewar |
RU10877U1 (ru) * | 1999-02-09 | 1999-08-16 | Закрытое акционерное общество "Матричные технологии" | Приемник ик излучения |
US6430941B1 (en) * | 1999-09-23 | 2002-08-13 | Rafael-Armament Development Authority Ltd. | Infrared detector |
CN101144738A (zh) * | 2007-10-31 | 2008-03-19 | 中国科学院上海技术物理研究所 | 一种用于焦平面探测器的低温杜瓦的冷平台的支撑机构 |
CN102651461A (zh) * | 2011-02-25 | 2012-08-29 | 比亚迪股份有限公司 | 一种电池的密封组件及其制作方法、以及一种锂离子电池 |
CN203772505U (zh) * | 2014-01-17 | 2014-08-13 | 中国科学院上海技术物理研究所 | 用于在低温下对分置式杜瓦焊缝加压检漏的装置 |
CN205898305U (zh) * | 2016-04-15 | 2017-01-18 | 中国科学院上海技术物理研究所 | 一种集成式微型杜瓦内管 |
CN111595463A (zh) * | 2020-05-22 | 2020-08-28 | 中国科学院上海技术物理研究所 | 一种低接触热阻且隔离耦合应力的分置式杜瓦冷平台 |
CN112504475A (zh) * | 2020-10-23 | 2021-03-16 | 中国电子科技集团公司第十一研究所 | 一种红外探测器 |
CN215356591U (zh) * | 2021-06-18 | 2021-12-31 | 中国科学院上海技术物理研究所 | 一种集成陶瓷冷平台的封装结构 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114406400A (zh) * | 2022-02-24 | 2022-04-29 | 中国科学院上海技术物理研究所 | 一种钛合金芯柱与因瓦冷头结合件钎焊夹具及方法 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5216580A (en) | Optimized integral heat pipe and electronic circuit module arrangement | |
CN105910751B (zh) | 平行板干式电容压力传感器 | |
CN215356591U (zh) | 一种集成陶瓷冷平台的封装结构 | |
CN109945979B (zh) | 一种用于低温光学系统的红外探测器组件杜瓦外壳结构 | |
CN103344342B (zh) | 一种抗径向振动和冲击的冷平台支撑结构 | |
US5598966A (en) | Brazed lower vacuum housing for a dewar | |
EP0058645B1 (en) | Infrared radiation detector device | |
CN113351951A (zh) | 一种集成陶瓷冷平台的封装结构和实现方法 | |
US5198671A (en) | Apparatus for large area infrared focal plane | |
JPH0749994B2 (ja) | 赤外線検出器ジュワーパッケージで使用する急速冷却/低歪みハイブリッド焦点平面アレイプラットフォーム | |
CN111595463B (zh) | 一种低接触热阻且隔离耦合应力的分置式杜瓦冷平台 | |
CN203323885U (zh) | 抗径向振动和冲击的冷平台支撑结构 | |
US6417514B1 (en) | Sensor/support system having a stabilization structure affixed to a side of a platform oppositely disposed from a sensor assembly | |
EP0372108B1 (en) | Vacuum container for cryogenically cooled electron device packaging | |
US11889223B2 (en) | Explosively welded cooled infrared camera | |
JPH01110219A (ja) | 外筒を有するセラミック導管 | |
US8307666B2 (en) | Methods and apparatus for providing rotational movement and thermal stability to a cooled sample | |
CN218180120U (zh) | 双波段探测器共杜瓦结构 | |
US4766316A (en) | Disc detector assembly having vacuum chamber | |
CN112504475B (zh) | 一种红外探测器 | |
US20110005238A1 (en) | Methods and apparatus for dewar and cold shield assemblies | |
CN212010989U (zh) | 集成透镜的气密性封装组件结构 | |
JPS63211772A (ja) | 赤外線検知器 | |
CN109655165B (zh) | 用于抑制制冷工质对红外探测器噪声影响的集成封装结构 | |
EP0213421A2 (en) | Infrared detector assembly having vacuum chambers |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |