CN113325305A - 500kV circuit breaker high-voltage electrical test wiring device and use method thereof - Google Patents
500kV circuit breaker high-voltage electrical test wiring device and use method thereof Download PDFInfo
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- CN113325305A CN113325305A CN202110621181.XA CN202110621181A CN113325305A CN 113325305 A CN113325305 A CN 113325305A CN 202110621181 A CN202110621181 A CN 202110621181A CN 113325305 A CN113325305 A CN 113325305A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3272—Apparatus, systems or circuits therefor
- G01R31/3274—Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
Abstract
The invention discloses a high-voltage electrical test wiring device of a 500kV circuit breaker and a using method thereof. The invention connects the test wire to the tested breaker at one time through the switching device, and quickly completes the wiring and grounding of tests of medium loss and capacitance of the voltage-sharing capacitor at the break of the breaker, time parameters of the breaker and the like through the switching of the switching device. Need not frequently to ascend a height and trade the wiring, prevent the influence electricity injury, shorten test time, improve test efficiency.
Description
Technical Field
The invention belongs to the technical field of high-voltage electrical test wiring equipment of circuit breakers, and relates to a high-voltage electrical test wiring device of a 500kV circuit breaker and a using method thereof.
Background
The 500kV circuit breaker is a three-phase split-phase double-fracture, each phase of fracture is connected with a voltage-sharing capacitor in parallel, and the circuit breaker is large in equipment installation space, high in height and strong in induced electricity. At present, when a 500kV circuit breaker is tested, tests such as dielectric loss and capacitance of a fracture voltage-sharing capacitor, time parameters of the circuit breaker and the like are required according to pre-test regulations. The following problems exist in the test process:
1. when the medium loss and capacitance test of the voltage-sharing capacitor at the fracture of the 500kV circuit breaker is carried out, the high-altitude wiring operation needs to be carried out by using the aerial work vehicle, each phase of the 500kV circuit breaker is a double fracture, each fracture is connected with one voltage-sharing capacitor (C1 and C2) in parallel, the wiring and the test need to be carried out frequently one by one phase, and the operation steps are multiple, as shown in figure 1. According to the statistics of a test site, the medium loss test of three-phase C1 and C2 voltage-sharing capacitors is completed, and 6 tests of 3 phases in total need to be performed, wherein the ground cutter is operated for 12 times in a matching mode, and the overhead working truck is used for lifting and disconnecting wires for 12 times. The risk of frequent lifting operation is high. (statistics in: attached Table 1)
Attached table 1: working statistical table of existing dielectric loss test method
2. When the time parameter test of the circuit breaker is carried out, the test wiring on the fracture voltage-sharing capacitor is firstly detached, and then the test wiring of the time parameter of the circuit breaker is replaced. And 3-phase tests are required to be carried out for 3 times in total after the three-phase time parameter test is completed, wherein the ground cutter is matched and operated for 6 times, and the overhead working truck is used for lifting and disconnecting wires for 6 times. The risk of frequent lifting operation is high.
3. According to the test requirements, in the test processes of medium loss and capacitance of a fracture voltage-sharing capacitor, time parameters of a circuit breaker and the like, operators on duty need to operate to perform switching on and off of a grounding disconnecting link in a whole process in a matching way, 2 operators need to wait for the matching in the whole process for a long time, and the requirement on manpower resources is high; there is also an indeterminate wait time, such as a longer wait time when more people are not available to run. Unforeseen operation faults also exist, for example, the situation that operation is jammed in the process of frequently switching on and off the grounding disconnecting link for many times needs to wait for the maintenance personnel to eliminate the fault and then work.
4. The induction electricity of the 500kV switch field is large, before test wiring is carried out, grounding disconnecting links on two sides of the circuit breaker need to be closed, if the grounding disconnecting links are not closed, the assembly and disassembly work of a test wire is carried out, and the damage to a test instrument and an operator can be caused by the excessive induction electricity discharge.
In conclusion, test wiring is frequently changed, time and labor are wasted, fatigue is caused, and the risk of climbing operation exists. Is the problem that the high-voltage test of the existing 500kV circuit breaker needs to solve. To overcome the shortcomings of the existing test wiring methods, it is therefore necessary to optimize the existing test wiring to solve these problems.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the utility model provides a 500kV circuit breaker high-voltage electrical test termination and application method thereof to solve frequently to change experimental wiring, operation intensity of labour is big, experimental operating time is long in the test process, needs the operation personnel to frequently operate the earthing knife-switch simultaneously and leads to wasting manpower and time scheduling problem, in order to reach the purpose of reliable, quick test.
The technical scheme adopted by the invention is as follows: the utility model provides a 500kV circuit breaker high-voltage electrical test termination, includes auto-change over device, and auto-change over device passes through the test wire and connects circuit breaker and tester under test, and auto-change over device includes the shell and installs switching circuit, test output port, characteristic test input port, the test input port that calms the loss on the shell, and test output port, characteristic test input port, the test input port that calms the loss are connected to switching circuit.
Preferably, the switching circuit includes a switch S1, a switch S2 and a switch S3, the switches S1 and S3 are single-stage switches, the switch S2 is a double-stage switch, and the switches S1, S2 and S3 are connected to the corresponding test output port, the characteristic test input port and the dielectric loss test input port by connection lines.
Preferably, the input ends of the switch S1 and the switch S3 are connected in parallel and then connected to a ground port, the output ends are respectively connected to the T1 interface and the T3 interface of the characteristic input port, the T1 interface and the T3 interface are also respectively connected in series to the Cx1 interface and the Cx2 interface of the test output port, the input end of the switch S2 is connected to the Cx interface of the dielectric loss test input port, the output ends are respectively connected to the T1 interface and the T3 interface, and the HV interface of the dielectric loss test input port is sequentially connected in series to the T2 interface of the characteristic input port and the HV interface of the test output port.
Preferably, the method for using the wiring device for the high-voltage electrical test of the 500kV circuit breaker comprises the following steps: according to the test sequence of the test items of the circuit breaker, the dielectric loss and the capacitance of the fracture voltage-sharing capacitor are tested firstly, then the time parameter characteristic test of the circuit breaker is carried out, according to the test sequence, the switching device is utilized to carry out the switching of the test, before the test, the circuit breaker is positioned at the switch-off position, the fractures D1 and D2 of the circuit breaker are disconnected, grounding disconnecting switches G1 and G2 at the two sides of the circuit breaker are closed and grounded, firstly, test lines L1-L3 are connected with CX1 interfaces, HV interfaces and CX2 interfaces of the test output port of the switching device respectively, then, the other ends of the test lines L1-L3 are connected with a, C positions and middle b positions at the two ends of the voltage-sharing capacitor C1 and the voltage-sharing capacitor C2 which are connected in series with the circuit breaker respectively, and the grounding port on the switching device is grounded.
The test method of the medium loss and the capacitance of the fracture voltage-sharing capacitor C1 comprises the following steps: the dielectric loss tester is connected with a CX interface and an HV interface of a dielectric loss test input port on the switching device through a test wire, a change-over switch S1 on the switching device is disconnected, a change-over switch S2 is connected with the Cx1 interface, the change-over switch S3 is connected, the test connection of the dielectric loss and the capacitance of a breaker fracture voltage-sharing capacitor C1 is completed, before the test is prepared, grounding disconnecting switches G1 and G2 on two sides of the breaker are operated to be disconnected, and the test of the dielectric loss and the capacitance of the fracture voltage-sharing capacitor C1 is carried out on the breaker.
The test method of the medium loss and the capacitance of the fracture voltage-sharing capacitor C2 comprises the following steps: and (4) closing the change-over switch S1, switching on the change-over switch S2 to a Cx2 interface, disconnecting the change-over switch S3, completing the test wiring of the medium loss and the capacitance of the breaker fracture voltage-sharing capacitor C2, and testing the medium loss and the capacitance of the fracture voltage-sharing capacitor C2 of the breaker.
The method for testing the time parameter characteristic of the circuit breaker comprises the following steps: closing a change-over switch S1 on the switching device, closing a change-over switch S3, disconnecting a change-over switch S2, taking down a test connecting line between a dielectric loss tester and a CX interface and an HV interface of a dielectric loss test input port on the switching device, connecting a mechanical characteristic tester with a T1 interface, a T2 interface and a T3 interface of a characteristic test input port on the switching device by using a test line, and grounding a T2 interface of the characteristic test input port; and (3) disconnecting a change-over switch S1 on the switching device, disconnecting a change-over switch S3, completing test wiring of the breaker time parameter characteristic test, and testing the time parameter characteristic of the breaker.
After the time parameter characteristic test of the circuit breaker is completed, a change-over switch S1 on the switching device is closed, a change-over switch S3 is closed, then a test connecting wire between a mechanical characteristic tester and a characteristic test input port on the switching device and a characteristic test input port T2 interface grounding wire are taken down, grounding disconnecting switches G1 and G2 on two sides of the circuit breaker are closed and grounded, and then test lines L1-L3 connected to positions a, b and c on a voltage-sharing capacitor of the circuit breaker are taken down.
The invention has the beneficial effects that: compared with the prior art, the invention connects the test wire to the tested breaker at one time through the switching device, and quickly completes the wiring and grounding of tests of medium loss and capacitance of the voltage-sharing capacitor at the break of the breaker, time parameters of the breaker and the like through the switching of the switching device. Need not frequently to ascend a height and trade the wiring, prevent the influence electricity injury, shorten test time, improve test efficiency.
Drawings
FIG. 1 is a schematic diagram of a high-voltage electrical test wiring structure of a conventional circuit breaker;
FIG. 2 is a schematic view of a connection structure of the switching device of the present invention;
FIG. 3 is a switching loop diagram of the switching device;
FIG. 4 is a switching device test port wiring diagram;
fig. 5 is a diagram of the switching device in connection with the circuit breaker;
FIG. 6 is a dielectric loss and capacitance test switching wiring diagram of the fracture equalizing capacitor C1;
fig. 7 is a dielectric loss and capacitance test switching wiring diagram of the fracture equalizing capacitor C2;
FIG. 8 is a wiring diagram before a switching test of a circuit breaker time parameter test;
FIG. 9 is a wiring diagram during a switching test of a circuit breaker time parameter test;
FIG. 10 is a diagram of the switching wiring after the test is completed;
fig. 11 is a schematic view of the switching device.
Detailed Description
The invention is further described with reference to the accompanying drawings and specific embodiments.
Example 1: as shown in fig. 2-11, a 500kV circuit breaker high-voltage electrical test wiring device comprises a switching device, the switching device is connected to a tested circuit breaker and a tester through a test line, the switching device comprises a shell, and a switching loop, a test output port, a characteristic test input port and a dielectric loss test input port which are arranged on the shell, and can meet the test wiring switching of tests such as dielectric loss and capacitance of a fracture equalizing capacitor and circuit breaker time parameters, and the test output port, the characteristic test input port and the dielectric loss test input port are connected to the switching loop.
Preferably, the switching circuit includes a switch S1, a switch S2 and a switch S3, the switches S1 and S3 are single-stage switches, the switch S2 is a double-stage switch, and the switches S1, S2 and S3 are connected to corresponding test output ports, characteristic test input ports and dielectric loss test input ports through connection lines, specifically: the input ends of the switch S1 and the switch S3 are connected in parallel and then connected to the ground port, the output ends are respectively connected to the T1 interface and the T3 interface of the characteristic input port, the T1 interface and the T3 interface are also respectively connected in series to the Cx1 interface and the Cx2 interface of the test output port, the input end of the switch S2 is connected to the Cx interface of the dielectric loss test input port, the output ends are respectively connected to the T1 interface and the T3 interface, and the HV interface of the dielectric loss test input port is sequentially connected in series to the T2 interface of the characteristic input port and the HV interface of the test output port, as shown in fig. 3.
The test port comprises a test output port, a characteristic test input port and a dielectric loss test input port. The test output port consists of three terminals (CX1, HV and CX2), the characteristic test input port consists of three terminals (T1, T2 and T3), and the dielectric loss test input port consists of two terminals (CX and HV). The test output ports (CX1, HV and CX2) are used for connecting terminals of the medium loss and capacitance test of the breaker break voltage-sharing capacitor; the characteristic test input ports (T1, T2 and T3) are used for connecting terminals of a mechanical characteristic tester for tests of breaker time parameters and the like; the dielectric loss test input ports (CX and HV) are used for connecting input terminals of a dielectric loss tester for conducting dielectric loss and capacitance tests of a breaker fracture voltage-sharing capacitor, and are shown in FIG. 4.
Example 2: the use method of the wiring device for the high-voltage electrical test of the 500kV circuit breaker comprises the following steps: according to the test sequence of the breaker test items, the dielectric loss and the capacitance of the fracture voltage-sharing capacitor are tested firstly, and then the breaker time parameter characteristic test is carried out. The following is a description of the switching of the test by the switching device according to this test sequence: before testing, the breaker is in the opening position, the fractures D1 and D2 are opened, and the grounding disconnecting links G1 and G2 on the two sides of the breaker are closed and grounded. The test lines L1 to L3 are connected to the test output ports (CX1, HV, CX2) of the switching device, the other ends of the test lines L1 to L3 are connected to the positions a, b, C on the voltage-sharing capacitors (C1, C2) of the circuit breaker, and the "grounding" port on the switching device is grounded, as shown in fig. 5.
Testing dielectric loss and capacitance of fracture voltage-sharing capacitor (C1)
When the medium loss and capacitance tests of the breaker fracture voltage-sharing capacitor (C1) are carried out, a medium loss tester is connected with medium loss test input ports (CX and HV) on the switching device by using test wires. The contacts 1 and 2 of the changeover switch S1 on the changeover device are opened. The contacts 3 and 4 of the changeover switch S2 are turned on and the contacts 4 and 5 are turned off. The contacts 6 and 7 of the changeover switch S3 are turned on. The test loop at this time was: dielectric loss tester-CX-3 and 4 contacts of S2-T1-CX 1-a-C1-b-HV-T2-HV-dielectric loss tester. Thus, the test wiring of the dielectric loss and capacitance of the breaker break voltage-sharing capacitor (C1) is completed. Before preparation for the test, the earthing switches G1 and G2 on both sides of the circuit breaker were operated to the open position. The circuit breaker can be tested for dielectric loss and capacitance of the break grading capacitor (C1) as shown in fig. 6.
② testing dielectric loss and capacitance of fracture voltage-sharing capacitor (C2)
When the medium loss and the capacitance of the breaker breaking voltage-sharing capacitor (C2) are tested. All test connections need not be changed, but only the 1 and 2 contacts of the diverter switch S1 on the diverter device are closed. The contacts 4 and 5 of the changeover switch S2 are turned on and the contacts 3 and 4 are turned off. The contacts 6 and 7 of the changeover switch S3 are opened. The test loop at this time was: dielectric loss tester- -4 and 5 contacts of CX-S2- -T3- -CX 2- -C- -C2- -b- -HV- -T2- -HV- -dielectric loss tester. Thus, the test wiring of the dielectric loss and capacitance of the breaker break voltage-sharing capacitor (C2) is completed. The circuit breaker can be tested for dielectric loss and capacitance of the break grading capacitor (C2) as shown in fig. 7.
Test of circuit breaker time parameter
Before the tests of the time parameters of the circuit breaker and the like are carried out, contacts 1 and 2 of a change-over switch S1 on a switching device are closed firstly to prevent the inductive electric damage. The contacts 6 and 7 of the change-over switch S3 are closed, so that the two sides of the circuit breaker are in a protective grounding state. The contacts 3 and 4 and the contacts 4 and 5 of the changeover switch S2 are opened. And then, taking down the test connecting wire between the dielectric loss tester and the dielectric loss test input ports (CX and HV) on the switching device. The mechanical characteristic tester is connected to characteristic test input ports (T1, T2, T3) on the switching device by test lines. The characteristic test input port T2 is grounded as shown in fig. 8.
The contacts 1 and 2 of the changeover switch S1 on the changeover device are opened. The contacts 6 and 7 of the changeover switch S3 are opened, and both sides of the circuit breaker are in an ungrounded state. The test loop at this time was: mechanical property tester-T1-CX 1-a; mechanical property tester-T2-HV-b; mechanical property tester-T3-CX 2-c. Thus, test wiring of tests such as circuit breaker time parameters and the like is completed. The circuit breaker can be tested for a time parameter as shown in fig. 9.
Description of operations after the test ends:
after tests such as the time parameter of the circuit breaker are completed, the 1 and 2 contacts of the switch S1 on the switching device are closed, and the 6 and 7 contacts of the switch S3 are closed, so that the two sides of the circuit breaker are in a protective grounding state, and induced electricity damage is prevented. The test connection wires between the mechanical property tester and the property test input ports (T1, T2, T3) on the switching device and the property test input port T2 ground wire are then removed. The grounding knife switches G1 and G2 on the two sides of the breaker are closed and grounded. And then test lines L1-L3 connected to the positions a, b and C of the grading capacitors (C1 and C2) of the circuit breaker are taken down. The test work is now complete as shown in fig. 10. The test conditions are contrasted and explained as follows:
according to the scheme of the invention: compared with the conventional testing wiring mode, the wiring optimizing and switching device for the high-voltage electrical test of the 500kV circuit breaker and the using method thereof can solve the problems that the wiring of the test is frequently changed, the time is wasted, the labor is wasted, the risk of climbing operation exists and the like in the conventional testing mode. The purpose of reliable and quick test is realized. The efficiency of the test is promoted. And summarize the following advantages:
(1) the medium loss test wiring mode is improved, and the test of medium loss and capacitance of the break voltage-sharing capacitors C1 and C2 of the 500kV circuit breaker can be completed by assembling and disassembling the test lead at one time;
(2) the equipment test lead is used for multiple times, and the wiring and grounding of tests such as capacitor dielectric loss, capacitance, breaker time parameters and the like can be completed through one-time wiring;
(3) the grounding of the test lead is controlled by a tester, and the grounding function can ensure that the two sides of the circuit breaker are in a protective grounding state, prevent induced electrical injury and meet the requirement of equipment on the environment in the test process;
(4) when different tests can be carried out according to the requirements of test items, the grounding disconnecting link does not need to be switched on and off by operators to be matched with the grounding disconnecting link for instrument switching, and the operation times of the grounding disconnecting link is reduced.
The above description is only an embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of changes or substitutions within the technical scope of the present invention, and therefore, the scope of the present invention should be determined by the scope of the claims.
Claims (8)
1. The utility model provides a 500kV circuit breaker high-voltage electrical test termination which characterized in that: the switching device comprises a shell, a switching loop, a test output port, a characteristic test input port and a dielectric loss test input port, wherein the switching loop, the test output port, the characteristic test input port and the dielectric loss test input port are arranged on the shell, and the test output port, the characteristic test input port and the dielectric loss test input port are connected to the switching loop.
2. The high-voltage electrical test wiring device of the 500kV circuit breaker, according to claim 1, characterized in that: the switching loop comprises a change-over switch S1, a change-over switch S2 and a change-over switch S3, wherein the change-over switch S1 and the change-over switch S3 are single-gear switches, the change-over switch S2 is a double-gear switch, and the change-over switch S1, the change-over switch S2 and the change-over switch S3 are connected with corresponding test output ports, characteristic test input ports and dielectric loss test input ports through connecting wires.
3. The high-voltage electrical test wiring device of the 500kV circuit breaker, according to claim 2, characterized in that: the input ends of a change-over switch S1 and a change-over switch S3 are connected in parallel and then connected to a ground port, the output ends are respectively connected to a T1 interface and a T3 interface of a characteristic input port, the T1 interface and the T3 interface are also respectively connected in series to a Cx1 interface and a Cx2 interface of a test output port, the input end of the change-over switch S2 is connected to the Cx interface of a dielectric loss test input port, the output end of the change-over switch S2 is respectively connected to a T1 interface and a T3 interface, and an HV interface of the dielectric loss test input port is sequentially connected in series to a T2 interface of the characteristic input port and an HV interface of the test output port.
4. The use method of the high-voltage electrical test wiring device of the 500kV circuit breaker according to claim 1, characterized in that: the method comprises the following steps: according to the test sequence of the test items of the circuit breaker, the dielectric loss and the capacitance of the fracture voltage-sharing capacitor are tested firstly, then the time parameter characteristic test of the circuit breaker is carried out, according to the test sequence, the switching device is utilized to carry out the switching of the test, before the test, the circuit breaker is positioned at the switch-off position, the fractures D1 and D2 of the circuit breaker are disconnected, grounding disconnecting switches G1 and G2 at the two sides of the circuit breaker are closed and grounded, firstly, test lines L1-L3 are connected with CX1 interfaces, HV interfaces and CX2 interfaces of the test output port of the switching device respectively, then, the other ends of the test lines L1-L3 are connected with a, C positions and middle b positions at the two ends of the voltage-sharing capacitor C1 and the voltage-sharing capacitor C2 which are connected in series with the circuit breaker respectively, and the grounding port on the switching device is grounded.
5. The high-voltage electrical test wiring device of the 500kV circuit breaker, according to claim 4, characterized in that: the test method of the medium loss and the capacitance of the fracture voltage-sharing capacitor C1 comprises the following steps: the dielectric loss tester is connected with a CX interface and an HV interface of a dielectric loss test input port on the switching device through a test wire, a change-over switch S1 on the switching device is disconnected, a change-over switch S2 is connected with the Cx1 interface, the change-over switch S3 is connected, the test connection of the dielectric loss and the capacitance of a breaker fracture voltage-sharing capacitor C1 is completed, before the test is prepared, grounding disconnecting switches G1 and G2 on two sides of the breaker are operated to be disconnected, and the test of the dielectric loss and the capacitance of the fracture voltage-sharing capacitor C1 is carried out on the breaker.
6. The high-voltage electrical test wiring device of the 500kV circuit breaker, according to claim 5, characterized in that: the test method of the medium loss and the capacitance of the fracture voltage-sharing capacitor C2 comprises the following steps: and (4) closing the change-over switch S1, switching on the change-over switch S2 to a Cx2 interface, disconnecting the change-over switch S3, completing the test wiring of the medium loss and the capacitance of the breaker fracture voltage-sharing capacitor C2, and testing the medium loss and the capacitance of the fracture voltage-sharing capacitor C2 of the breaker.
7. The high-voltage electrical test wiring device of the 500kV circuit breaker, according to claim 6, characterized in that: the method for testing the time parameter characteristic of the circuit breaker comprises the following steps: closing a change-over switch S1 on the switching device, closing a change-over switch S3, disconnecting a change-over switch S2, taking down a test connecting line between a dielectric loss tester and a CX interface and an HV interface of a dielectric loss test input port on the switching device, connecting a mechanical characteristic tester with a T1 interface, a T2 interface and a T3 interface of a characteristic test input port on the switching device by using a test line, and grounding a T2 interface of the characteristic test input port; and (3) disconnecting a change-over switch S1 on the switching device, disconnecting a change-over switch S3, completing test wiring of the breaker time parameter characteristic test, and testing the time parameter characteristic of the breaker.
8. The high-voltage electrical test wiring device of the 500kV circuit breaker according to claim 7, characterized in that: after the time parameter characteristic test of the circuit breaker is completed, a change-over switch S1 on the switching device is closed, a change-over switch S3 is closed, then a test connecting wire between a mechanical characteristic tester and a characteristic test input port on the switching device and a characteristic test input port T2 interface grounding wire are taken down, grounding disconnecting switches G1 and G2 on two sides of the circuit breaker are closed and grounded, and then test lines L1-L3 connected to positions a, b and c on a voltage-sharing capacitor of the circuit breaker are taken down.
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Cited By (1)
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CN115327178A (en) * | 2022-08-19 | 2022-11-11 | 广东电网有限责任公司佛山供电局 | Electrical detection system and method and wiring conversion device |
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