CN112327018A - Well low-voltage plate cabinet major loop test interface switching circuit - Google Patents
Well low-voltage plate cabinet major loop test interface switching circuit Download PDFInfo
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- CN112327018A CN112327018A CN202011272397.1A CN202011272397A CN112327018A CN 112327018 A CN112327018 A CN 112327018A CN 202011272397 A CN202011272397 A CN 202011272397A CN 112327018 A CN112327018 A CN 112327018A
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- insulation resistance
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- 238000012360 testing method Methods 0.000 title claims abstract description 111
- 238000009413 insulation Methods 0.000 claims abstract description 66
- 230000016507 interphase Effects 0.000 abstract description 3
- 239000012071 phase Substances 0.000 description 23
- 208000010392 Bone Fractures Diseases 0.000 description 9
- 206010017076 Fracture Diseases 0.000 description 9
- 238000000034 method Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 208000006670 Multiple fractures Diseases 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000008385 outer phase Substances 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 238000013522 software testing Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a switching circuit of a main loop test interface of a medium-low voltage disc cabinet, wherein the switching circuit for comprehensively testing the switching characteristic in the circuit is connected with a wiring clamp of a comprehensive switch characteristic tester, and the wiring clamp of the comprehensive switch characteristic tester is connected to an upper pole and a lower pole of the medium-low voltage disc cabinet or a low-voltage disc cabinet to be tested; the line end of an insulation resistance tester in the insulation resistance main circuit is connected with a group of insulation resistance main circuit testing jointing clamps through auxiliary contacts of a first contactor and a third contactor, and the grounding end of the insulation resistance tester is connected with the other group of insulation resistance main circuit testing jointing clamps through main contacts of a second contactor and a third contactor after being grounded. The invention can realize the switching of various tests such as ground, interphase, fracture, insulation resistance and the like, does not need to disassemble wires during switching, improves the test efficiency, reduces the misoperation risk, is safe and reliable, and is suitable for popularization and application.
Description
Technical Field
The invention relates to the technical field of middle and low voltage disc cabinet testing, in particular to a main loop testing interface switching circuit of a middle and low voltage disc cabinet.
Background
The medium and low voltage disc cabinet is widely applied to the fields of nuclear power, factories, mines, rail transit and the like, the power distribution and control systems in various industries are tightly combined, the control loops are relatively complex, a plurality of matched manufacturers exist, the interfaces of control lines of different manufacturers do not have uniform standards, and the conditions result in that the medium and low voltage disc cabinets at home and abroad are non-standard products at present. In order to ensure the smooth production, the stability of the performance of the medium voltage switchboard plays an important role, and therefore, many industries set up the maintenance cycle and maintenance outline of the switchboard. The test of well low-voltage plate cabinet major loop mainly includes switch mechanical characteristic test, insulation resistance test, major loop resistance test, need carry out ground, alternate, fracture multiple operation respectively to well low-voltage plate cabinet among the current test scheme, relies on manual many times to tear open the wiring, still involves the switch combined floodgate separating brake operation, and not only efficiency of software testing is low, has moreover to connect wrong line and maloperation risk, and the security is poor.
The above problems are urgently needed to be solved.
Disclosure of Invention
The invention aims to solve the problems mentioned in the background technology part by using a switching circuit of a main loop test interface of a medium-low voltage disc cabinet.
In order to achieve the purpose, the invention adopts the following technical scheme:
the embodiment of the invention provides a switching circuit of a main loop test interface of a medium-low voltage disc cabinet, which comprises a switching circuit for a switch characteristic comprehensive test, a jointing clamp of a switch characteristic comprehensive tester, an insulation resistance main loop test switching circuit and an insulation resistance main loop test jointing clamp; a switching characteristic test circuit and a loop resistance test circuit in the switching circuit of the switching characteristic comprehensive test are connected with a wiring clamp of the switching characteristic comprehensive tester, and the wiring clamp of the switching characteristic comprehensive tester is connected to an upper pole and a lower pole of a medium-voltage disk cabinet or a low-voltage disk cabinet to be tested; the insulation resistance main loop test switching circuit comprises an insulation resistance tester, a first contactor, a second contactor and a third contactor, wherein the line end of the insulation resistance tester passes through the first contactor and an auxiliary contact of the third contactor is connected with a group of insulation resistance main loop test jointing clamps, the group of insulation resistance main loop test jointing clamps are connected to one end of a medium-voltage disk cabinet or a low-voltage disk cabinet to be tested, the grounding end of the insulation resistance tester passes through the second contactor and a main contact of the third contactor after being grounded and is connected with another group of insulation resistance main loop test jointing clamps, and the group of insulation resistance main loop test jointing clamps are connected to the other end of the medium-voltage disk cabinet or the low-voltage disk cabinet to be tested.
Particularly, the wiring clamp of the comprehensive switch characteristic tester comprises three upper pole wiring clamps and three lower pole wiring clamps; the three upper pole terminals are clamped to the upper pole terminals of the medium-voltage disc cabinet or the low-voltage disc cabinet to be tested; and the three lower pole wiring clamps are connected to the lower poles of the medium-voltage disc cabinet or the low-voltage disc cabinet to be tested.
Particularly, the switching characteristic test circuit and the loop resistance test circuit are integrated in the switching characteristic comprehensive tester after being electrically isolated.
The switching circuit of the main loop test interface of the medium and low voltage disc cabinet provided by the invention can realize the switching of various tests such as ground, phase, fracture, insulation resistance and the like only by clamping the test wiring to the upper and lower poles of the medium or low voltage disc cabinet to be tested, and the wiring is not required to be disconnected during switching, so that the test efficiency is improved, the misoperation risk is reduced, and the switching circuit is safe, reliable and suitable for popularization and application.
Drawings
Fig. 1 is a structure diagram of a switching circuit for a switch characteristic comprehensive test according to an embodiment of the present invention;
fig. 2 is a structural diagram of an insulation resistance main loop test switching circuit according to an embodiment of the present invention.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete. It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
In this embodiment, the switching circuit of the main loop test interface of the middle and low voltage disc cabinet specifically includes a switching circuit for a switching characteristic comprehensive test, a junction clamp of a switching characteristic comprehensive tester, an insulation resistance main loop test switching circuit, and an insulation resistance main loop test junction clamp. Specifically, in this embodiment, the switching circuit for the switching characteristic integrated test and the insulation resistance main loop test switching circuit are both connected to the switching control device. And a switching characteristic test circuit and a loop resistance test circuit in the switching circuit of the switching characteristic comprehensive test are connected with the switch clamp of the switching characteristic comprehensive tester, and the switch clamp of the switching characteristic comprehensive tester is connected to the upper pole and the lower pole of the medium voltage disk cabinet or the low voltage disk cabinet to be tested. As shown in fig. 1, in the figure, QF indicates a medium-voltage disk cabinet or a low-voltage disk cabinet to be tested, GDKC indicates a switch characteristic comprehensive tester, J4-5 indicates an a-phase loop resistor, J6-7 indicates a B-phase loop resistor, and J8-9 indicates a C-phase loop resistor, the switch characteristic test circuit and the loop resistor test circuit are integrated in the switch characteristic comprehensive tester after being electrically isolated, so that only six test wires need to be connected to a switch main contact up and down, and the wire disconnection work is not needed in the test process. In the embodiment, the wiring clamp of the comprehensive switch characteristic tester comprises three upper pole wiring clamps and three lower pole wiring clamps; when the test is needed, the three upper pole terminal clamps are clamped on the upper poles of the medium voltage disk cabinet or the low voltage disk cabinet to be tested; and the three lower pole terminal clamps are clamped on the lower poles of the medium-voltage disk cabinet or the low-voltage disk cabinet to be tested. When the test object is a medium-voltage plate cabinet, the following tests can be automatically completed through a switching circuit of the switch characteristic comprehensive test: the mechanical dynamic characteristics of the switch (opening and closing time, three-phase different phase, closing bounce and the like, the precision is 1ms), primary loop resistance (100A, the measurement precision is 1 microohm), primary main insulation, fracture, phase to phase and relative ground (2500VDC, 1min, and the insulation resistance is not less than 1000 ohm/V). The switch characteristic test comprises the following steps: switching-on and switching-off time, switching-on and switching-off speed, contact travel, contact over-distance, three-phase synchronism, switching-on bounce and the like; the loop resistance test comprises the following steps: and applying 100A current to ABC three phases in sequence, testing the voltage at two ends of the main loop, and calculating the resistance of the main loop according to ohm's law. When the test object is a low-voltage disk cabinet, the following tests can be automatically completed through a switching circuit of the switch characteristic comprehensive test: the circuit comprises the mechanical dynamic characteristics of a switch (switching-off and switching-on time, three phases with different periods and the like, the precision is 1ms), primary loop resistance (10A, the measurement precision is 1 microohm), primary main insulation, a fracture, phases and relative ground (500VDC, 1min, and the insulation resistance is not less than 1000 ohm/V). Wherein, the switching characteristic test includes: switching-on and switching-off time, switching-on and switching-off speed, contact travel, contact over-distance, three-phase synchronism, switching-on bounce and the like; and (3) loop resistance testing, namely applying 10A current to ABC three phases in sequence, testing the voltage at two ends of the main loop, and calculating the resistance of the main loop according to ohm's law.
Specifically, in this embodiment, the insulation resistance main circuit testing switching circuit includes an insulation resistance tester, a first contactor, a second contactor, and a third contactor, a line end of the insulation resistance tester is connected to a group of insulation resistance main circuit testing jointing clamp through auxiliary contacts of the first contactor and the third contactor, the group of insulation resistance main circuit testing jointing clamp is connected to one end of the medium voltage panel cabinet or the low voltage panel cabinet to be tested, after a ground end of the insulation resistance tester is grounded, the grounding end of the insulation resistance tester is connected to another group of insulation resistance main circuit testing jointing clamp through main contacts of the second contactor and the third contactor, and the group of insulation resistance main circuit testing jointing clamp is connected to the other end of the medium voltage panel cabinet or the low voltage panel cabinet to be tested. As shown in fig. 2, GD in the figure is an insulation resistance tester, QF is a medium voltage panel cabinet or a low voltage panel cabinet to be tested, KM1 is a first contactor, KM2 is a second contactor, and KM3 is a third contactor. The insulation resistance main loop test comprises the following steps: 1. three-phase ground insulation test; 2. testing interphase insulation; 3. and (4) testing the three-phase fracture insulation. When the test object is a medium-voltage panel cabinet, the insulation resistance tester outputs 2500V voltage and is higher in voltage, and the insulation resistance tester and the switch characteristic comprehensive tester are two independent instrument modules, so that the insulation resistance tester is not suitable for being combined with the switch characteristic test, the insulation resistance tester outputs 6 test lines independently, only 6 test lines are connected to a switch main contact during the test, the switching control device controls the corresponding contactor and the medium-voltage switch to switch a test main loop, and the wiring disassembling work is not needed in the test process. When three-phase ground insulation test is carried out, KM1 is attracted, and a medium-voltage switch is switched on; when the interphase insulation test is carried out, the KM3 is attracted, and the breaker is switched on; when the three-phase fracture insulation test is carried out, the KM1 and the KM2 are attracted, and the breaker is opened. The test contents of the insulation characteristic test instrument in this embodiment are defined as follows: three-phase insulation test: the method refers to insulation resistance tests of upper and lower three opposite shells of a medium-voltage switch. And (3) testing the phase insulation: the method refers to insulation resistance test of the middle phase and the outer phase of the medium-voltage switch. Three-phase fracture insulation test: the method refers to the insulation resistance test between an upper fracture and a lower fracture of a medium-voltage switch. When the test object is a low-voltage disk cabinet, the insulation resistance tester outputs 500V voltage, and other test processes are the same as those of the medium-voltage disk cabinet, and are not described herein again.
According to the technical scheme provided by the invention, the switching of various tests such as ground, phase, fracture, insulation resistance and the like can be realized only by clamping the testing wiring to the upper and lower poles of the medium-voltage disc cabinet or the low-voltage disc cabinet to be tested, and the wiring is not required to be disconnected during switching, so that the testing efficiency is improved, the misoperation risk is reduced, and the method is safe, reliable and suitable for popularization and application. The invention is compatible with the primary loop interfaces of switches of different brands and models, and can be used for testing the performance of the main loop of the main flow medium-low voltage disk cabinet such as Schneider, ABB, Mueller, Siemens and domestic brands.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (3)
1. A switching circuit of a main loop test interface of a medium-low voltage disc cabinet is characterized by comprising a switching circuit for a switch characteristic comprehensive test, a jointing clamp of a switch characteristic comprehensive tester, an insulation resistance main loop test switching circuit and an insulation resistance main loop test jointing clamp; a switching characteristic test circuit and a loop resistance test circuit in the switching circuit of the switching characteristic comprehensive test are connected with a wiring clamp of the switching characteristic comprehensive tester, and the wiring clamp of the switching characteristic comprehensive tester is connected to an upper pole and a lower pole of a medium-voltage disk cabinet or a low-voltage disk cabinet to be tested; the insulation resistance main loop test switching circuit comprises an insulation resistance tester, a first contactor, a second contactor and a third contactor, wherein the line end of the insulation resistance tester passes through the first contactor and an auxiliary contact of the third contactor is connected with a group of insulation resistance main loop test jointing clamps, the group of insulation resistance main loop test jointing clamps are connected to one end of a medium-voltage disk cabinet or a low-voltage disk cabinet to be tested, the grounding end of the insulation resistance tester passes through the second contactor and a main contact of the third contactor after being grounded and is connected with another group of insulation resistance main loop test jointing clamps, and the group of insulation resistance main loop test jointing clamps are connected to the other end of the medium-voltage disk cabinet or the low-voltage disk cabinet to be tested.
2. The switching circuit of the main loop test interface of the medium and low voltage disc cabinet according to claim 1, wherein the wiring clamps of the switching characteristic comprehensive tester comprise three upper pole wiring clamps and three lower pole wiring clamps; the three upper pole terminals are clamped to the upper pole terminals of the medium-voltage disc cabinet or the low-voltage disc cabinet to be tested; and the three lower pole wiring clamps are connected to the lower poles of the medium-voltage disc cabinet or the low-voltage disc cabinet to be tested.
3. The medium and low voltage disk cabinet main loop test interface switching circuit according to any one of claims 1 or 2, wherein the switch characteristic test circuit and the loop resistance test circuit are integrated in a switch characteristic comprehensive tester after being electrically isolated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011272397.1A CN112327018A (en) | 2020-11-13 | 2020-11-13 | Well low-voltage plate cabinet major loop test interface switching circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011272397.1A CN112327018A (en) | 2020-11-13 | 2020-11-13 | Well low-voltage plate cabinet major loop test interface switching circuit |
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| Publication Number | Publication Date |
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| CN112327018A true CN112327018A (en) | 2021-02-05 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011272397.1A Pending CN112327018A (en) | 2020-11-13 | 2020-11-13 | Well low-voltage plate cabinet major loop test interface switching circuit |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114167188A (en) * | 2021-12-08 | 2022-03-11 | 无锡中科电气设备有限公司 | Testing arrangement of low-voltage plate cabinet |
| CN114184948A (en) * | 2021-12-08 | 2022-03-15 | 无锡中科电气设备有限公司 | Testing device for medium-voltage switch |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205388610U (en) * | 2016-01-06 | 2016-07-20 | 苏州华电电气股份有限公司 | High tension switchgear combined test conversion equipment |
| CN112305274A (en) * | 2020-11-13 | 2021-02-02 | 无锡中科电气设备有限公司 | Well low-voltage plate cabinet secondary circuit test interface switching circuit |
| CN213933939U (en) * | 2020-11-13 | 2021-08-10 | 无锡中科电气设备有限公司 | Well low-voltage plate cabinet major loop test interface switching circuit |
| CN213933938U (en) * | 2020-11-13 | 2021-08-10 | 无锡中科电气设备有限公司 | Well low-voltage plate cabinet secondary circuit test interface switching circuit |
-
2020
- 2020-11-13 CN CN202011272397.1A patent/CN112327018A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN205388610U (en) * | 2016-01-06 | 2016-07-20 | 苏州华电电气股份有限公司 | High tension switchgear combined test conversion equipment |
| CN112305274A (en) * | 2020-11-13 | 2021-02-02 | 无锡中科电气设备有限公司 | Well low-voltage plate cabinet secondary circuit test interface switching circuit |
| CN213933939U (en) * | 2020-11-13 | 2021-08-10 | 无锡中科电气设备有限公司 | Well low-voltage plate cabinet major loop test interface switching circuit |
| CN213933938U (en) * | 2020-11-13 | 2021-08-10 | 无锡中科电气设备有限公司 | Well low-voltage plate cabinet secondary circuit test interface switching circuit |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114167188A (en) * | 2021-12-08 | 2022-03-11 | 无锡中科电气设备有限公司 | Testing arrangement of low-voltage plate cabinet |
| CN114184948A (en) * | 2021-12-08 | 2022-03-15 | 无锡中科电气设备有限公司 | Testing device for medium-voltage switch |
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Effective date of registration: 20220719 Address after: 298 Furong Zhong Er Road, Xishan Economic Development Zone, Wuxi City, Jiangsu Province, 214000 Applicant after: WUXI ZHONGKE ELECTRIC EQUIPMENT Co.,Ltd. Address before: 298 Furong Zhong Er Road, Xishan Economic Development Zone, Wuxi City, Jiangsu Province, 214000 Applicant before: WUXI ZHONGKE ELECTRIC EQUIPMENT Co.,Ltd. Applicant before: Shenzhen Hezhong Clean Energy Research Institute |