CN113311006A - Automatic optical detection system and method for detecting edge defects of contact lens - Google Patents
Automatic optical detection system and method for detecting edge defects of contact lens Download PDFInfo
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- CN113311006A CN113311006A CN202010121338.8A CN202010121338A CN113311006A CN 113311006 A CN113311006 A CN 113311006A CN 202010121338 A CN202010121338 A CN 202010121338A CN 113311006 A CN113311006 A CN 113311006A
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- 230000007547 defect Effects 0.000 title claims abstract description 38
- 238000000034 method Methods 0.000 title claims abstract description 19
- 230000003287 optical effect Effects 0.000 title claims abstract description 12
- 238000001514 detection method Methods 0.000 title abstract description 9
- 238000007689 inspection Methods 0.000 claims abstract description 13
- 238000004458 analytical method Methods 0.000 claims description 38
- 238000011524 similarity measure Methods 0.000 claims description 33
- 230000002950 deficient Effects 0.000 claims description 24
- 230000003993 interaction Effects 0.000 claims description 3
- 238000005286 illumination Methods 0.000 description 17
- 238000003708 edge detection Methods 0.000 description 3
- 239000007853 buffer solution Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9511—Optical elements other than lenses, e.g. mirrors
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
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Abstract
The invention discloses an automatic optical detection system and a method for detecting defects of the edge of a contact lens. Therefore, the automatic optical inspection system does not need to use a qualified reference image for comparison with the contact lens, but uses each part of the contact lens edge itself for self-inspection, so as to improve the inspection accuracy.
Description
Technical Field
The present invention relates to Inspection systems, and more particularly, to an Automated Optical Inspection (AOI) system and a method for inspecting edge defects of contact lenses using the same.
Background
Defects on the edge of a contact lens include deformities, notches, cracks, burrs, etc., and in order to improve the efficiency of manual visual inspection, the industry currently uses AOI systems for automated inspection. The AOI system can be divided into two major parts, namely hardware and software, wherein the hardware part uses a camera device to capture an image of a contact lens with a suitable light source, and the software part focuses on the development of an algorithm, for example, the AOI system can detect whether the edge of the contact lens is defective or not by the developed edge detection algorithm.
However, the conventional edge detection algorithm usually compares the captured image of the contact lens with the qualified reference image to detect the defect of the contact lens edge, but has the disadvantage that some minor defects are still difficult to detect. In addition, the detection accuracy is also affected by uneven illumination. Therefore, how to design an AOI system and a method for detecting edge defects of a contact lens becomes an important issue in the art.
Disclosure of Invention
In view of this, an embodiment of the present invention provides an AOI system, which includes a carrying tray, a light source module, an image capturing module, and a system host. The carrying disc is used for carrying the contact lens, and the light source module is arranged below the carrying disc and used for emitting parallel light to the contact lens. The image acquisition module is arranged above the carrying disc and corresponds to the position of the contact lens to obtain the outline image of the contact lens. The system host is coupled with the image acquisition module and is used for dividing the contact lens edge on the contour image into a plurality of sections, then carrying out similarity analysis on the sections alternately and detecting whether the contact lens edge has defects or not according to the result of the similarity analysis.
In addition, the present invention provides a method for detecting edge defects of a contact lens, which is implemented in an AOI system, the AOI system includes a carrier, a light source module, an image capturing module and a system host. Firstly, a contact lens is carried by using a carrying disc, and parallel light is emitted to the contact lens by using a light source module. Secondly, an image capturing module is used for obtaining the outline image of the contact lens. Then, the system host machine is used for dividing the contact lens edge on the contour image into a plurality of sections, similarity analysis is carried out on the sections alternately, and whether the contact lens edge is defective or not is detected according to the result of the similarity analysis.
For a better understanding of the features and technical content of the present invention, reference should be made to the following detailed description of the invention and accompanying drawings, which are provided for purposes of illustration and description only and are not intended to limit the invention.
Drawings
FIG. 1 is a schematic diagram of an AOI system provided by an embodiment of the present invention.
Fig. 2 is a schematic view of a contact lens profile image provided by an embodiment of the present invention.
FIG. 3 is a flowchart illustrating the steps of a method for detecting edge defects of a contact lens according to an embodiment of the present invention.
Detailed Description
The following is a description of embodiments of the present invention with reference to specific embodiments, and those skilled in the art will understand the advantages and effects of the present invention from the contents provided in the present specification. The invention is capable of other and different embodiments and its several details are capable of modification and various other changes, which can be made in various details within the specification and without departing from the spirit and scope of the invention. The drawings of the present invention are for illustrative purposes only and are not intended to be drawn to scale. The following embodiments will further explain the related art of the present invention in detail, but the contents are not provided to limit the scope of the present invention.
It will be understood that, although the terms "first," "second," "third," etc. may be used herein to describe various components or signals, these components or signals should not be limited by these terms. These terms are used primarily to distinguish one element from another element or from one signal to another signal. In addition, the term "or" as used herein should be taken to include any one or combination of more of the associated listed items as the case may be.
Referring to fig. 1, fig. 1 is a schematic diagram of an AOI system according to an embodiment of the present invention. As shown in fig. 1, the AOI system 1 includes a tray 10, a light source module 12, an image capturing module 14, and a system host 16, wherein the light source module 12 and the image capturing module 14 can be implemented by pure hardware, or implemented by hardware and firmware or software, but the invention is not limited thereto. In the present embodiment, the tray 10 is used for carrying the contact lens 20, and in practice, the tray 10 may contain the buffer solution 30, so that the contact lens 20 is soaked in the buffer solution 30 for protection, but the invention is not limited thereto. In addition, the light source module 12 is disposed under the boat 10 and is used to emit parallel light onto the contact lens 20. It should be noted that the parallel light is also called directional light, which is a group of parallel light rays without attenuation. Thus, the AOI system 1 will avoid being affected by illumination non-uniformities.
The image capturing module 14 is disposed above the tray 10 and corresponding to the position of the contact lens 20 for obtaining the contour image of the contact lens 20, as shown in fig. 2. In practice, the image capturing module 14 may be composed of a Charge Coupled Device (CCD) and a lens, for example, but the invention is not limited thereto. In addition, the image capturing module 14 is coupled to the system host 16, and transmits the obtained contour image to the system host 16. In the embodiment, the system host 16 may be composed of a personal computer and peripheral devices, for example, but the invention is not limited thereto. In summary, it should be understood by those skilled in the art that the system host 16 includes an operating system (not shown in fig. 1), and the operating system is loaded with an edge detection algorithm to instruct the system host 16 to divide the contact lens edge on the contour image into a plurality of segments, and then perform a similarity analysis on the segments, and detect whether the contact lens edge is defective or not according to the result of the similarity analysis.
For example, for the convenience of the following description, the system host 16 divides the contact lens edge on the contour image of fig. 2 into 16 segments, i.e. segment 1 to segment 16, but the present invention is not limited thereto. That is, each segment represents a small portion of the edge of the contact lens, and in practice, Similarity analysis of the edge (segment) without defect and the edge (segment) without defect should yield a high Similarity Measure (Similarity Measure), but Similarity analysis of the edge (segment) with defect and the edge (segment) without defect should yield a low Similarity Measure. In addition, because each flaw has its distinctiveness, similarity analysis of even an edge (segment) with one flaw with an edge (segment) with another flaw does not yield a high similarity measure. Therefore, in this embodiment, the result of the similarity analysis is represented by a similarity measure, and the system host 16 can compare the similarity measure of any two edges (segments) with a threshold value to detect whether the contact lens edge is defective. Please note that the present invention is not limited to the specific value of the threshold, and one skilled in the art should be able to design the threshold according to the actual requirement or application.
As shown in fig. 2, since sector 1 has a defect but sector 2 has no defect, the similarity measure between sector 1 and sector 2 should be lower than the threshold, and the system host 16 at this time cannot know that sector 1 has a defect and sector 2 has no defect. Therefore, when the similarity measure of the zone 1 and the zone 2 is lower than the threshold value, the system host 16 detects that the contact lens edge is defective, and can determine that at least one of the zone 1 and the zone 2 is a defective contact lens edge. Next, to further confirm that the defective sector 1 and/or sector 2 are/is, the system host 16 may perform similarity analysis again for sector 1 and sector 3, and for sector 2 and sector 3. However, since the sector 3 is also free of defects, the system host 16 may determine that the sector 1 is a defective contact lens edge when the similarity measure of the sectors 1 and 3 is lower than the threshold value, but the similarity measure of the sectors 2 and 3 is higher than the threshold value.
Similarly, the system host 16 may perform similarity analysis again for zone 1 and zone 4, for zone 2 and zone 4, and for zone 3 and zone 4. Therefore, in other embodiments, even if there are two defective sectors in sectors 1 to 4, the system host 16 can determine which two defective sectors are in sectors 1 to 4 according to the similarity measure of the six combinations (i.e., sectors 1 and 2, sectors 1 and 3, sectors 1 and 4, sectors 2 and 3, sectors 2 and 4, and sectors 3 and 4). In summary, the present invention does not limit the order in which two segments are taken from these segments for similarity analysis. In addition, if the sector 1 to the sector 4 have defects in more than three sectors, the system host 16 performs similarity analysis by interacting with other sectors and the sectors 1 to 4. That is, the more the sectors are divided, the more combinations of similarity analysis can be interactively performed on the sectors, and the more defective sectors can be effectively determined by the system host 16 according to the similarity measure of the more combinations, i.e., the detection accuracy is improved. Therefore, one of ordinary skill in the art should be able to determine the number of segments to be divided according to actual needs or applications.
In addition, as mentioned above, the AOI system 1 is prevented from being affected by the non-uniform illumination due to the use of the parallel light, but in order to achieve the accuracy of the detection against the illumination effect, the system host 16 performs the similarity analysis by interacting a plurality of segments with similar illumination degrees. For example, the sectors 1 to 4 are four sectors similar to each other in illumination degree, so the system host 16 performs similarity analysis alternately with the sectors 1 to 4 similar to each other in illumination degree, and the system host 16 can detect whether the sectors 1 to 4 are defective or not according to the similarity measure of the above six combinations. Similarly, the sectors 5 to 8 are the other four sectors with similar illumination degrees, so the system host 16 performs the similarity analysis by interacting with the sectors 5 to 8 with similar illumination degrees. That is, the system host 16 may further take two sectors out of the sectors 5 to 8 for similarity analysis, that is, a similarity measure of six new combinations (i.e., the sectors 5 and 6, the sectors 5 and 7, the sectors 5 and 8, the sectors 6 and 7, the sectors 6 and 8, and the sectors 7 and 8) may be obtained, and based on the similarity measure of the six new combinations, the system host 16 may detect whether the sectors 5 to 8 are defective. Since the details of the determination are the same as those described above, further description is omitted here.
Similarly, the sectors 9 to 12 are the other four sectors with similar illumination degrees, and the sectors 13 to 16 are the last four sectors with similar illumination degrees, so the system host 16 performs the similarity analysis alternately by the sectors 9 to 12 with similar illumination degrees, and performs the similarity analysis alternately by the sectors 13 to 16 with similar illumination degrees. As shown in fig. 2, since the sector 10 has distortion defect but the sector 9 has no defect, the similarity measure between the sector 9 and the sector 10 should be lower than the threshold value, and the system host 16 at this time cannot know that the sector 10 has defect and the sector 9 has no defect. Therefore, when the similarity measure of the zone 9 and the zone 10 is lower than the threshold value, the system host 16 may also determine that at least one of the zone 9 and the zone 10 is a defective contact lens edge. Then, since the sector 11 is also free of defects, the system host 16 can determine that the sector 11 is a defective contact lens edge when the similarity measure of the sector 10 and the sector 11 is lower than the threshold value, but the similarity measure of the sector 9 and the sector 11 is higher than the threshold value. Since the operation details are the same as those described above, further description is omitted here.
Please note that, in the present embodiment, it is only shown that one of the first three adjacent sections with similar illumination degrees is defective, and according to the similarity measure of the three combinations of the three sections alternately taken out of the three sections for similarity analysis, the system host 16 can detect which of the three sections is defective, but when there are more than one sections with similar illumination degrees and there are defects in the sections at any position in the sections, it should be understood by those skilled in the art that the system host 16 can detect which of the sections are defective according to the similarity measure of all the combinations of the sections alternately taken out of the sections for similarity analysis, and therefore the details of modification or change thereof are not repeated herein. As mentioned above, the present invention does not limit the sequence of extracting two segments from the plurality of segments for similarity analysis, and the more segments are divided, the more combinations of segments that can be interactively subjected to similarity analysis, and the more defective segments can be effectively determined by the system host 16 according to the similarity measure of the more combinations.
Finally, to further illustrate the operation of the AOI system 1, the present invention further provides an embodiment of the operation method thereof. Referring to FIG. 3, FIG. 3 is a flowchart illustrating a method for detecting edge defects of a contact lens according to an embodiment of the present invention. It should be noted that the method of fig. 3 may be implemented in the AOI system 1 of fig. 1, and therefore, please refer to fig. 1 for understanding, but the present invention does not limit that the method of fig. 3 can only be implemented in the AOI system 1 of fig. 1.
As shown in fig. 3, the contact lens 20 is carried by the carrier plate 10 in step S310, and the parallel light is emitted onto the contact lens 20 by the light source module 12 in step S320. Next, in step S330, the image capturing module 14 obtains a contour image of the contact lens 20, and in step S340, the system host 16 divides the contact lens edge on the contour image into a plurality of segments, as shown in fig. 2. Then, in step S350, similarity analysis is performed on the segment interactions, and whether the contact lens edge is defective or not is detected according to the result of the similarity analysis. Since the details are as described above, further description is omitted here.
In summary, the present invention provides an AOI system and a method for detecting defects on an edge of a contact lens, which can divide the edge of the contact lens into a plurality of segments, perform similarity analysis on the segments, and detect whether the edge of the contact lens has defects according to the result of the similarity analysis. Therefore, the present invention does not need to use a qualified reference image for comparison with the contact lens, but uses each part of the contact lens edge itself for self-detection, which has the advantages of simplifying the complicated image processing, and detecting some minor defects through the similarity measure of each part, i.e. improving the detection accuracy. In addition, the invention not only uses the parallel light to irradiate the contact lens, but also uses a plurality of sections with similar illumination degrees to interactively carry out similarity analysis so as to overcome the problem that the detection is influenced by the uneven illumination.
The disclosure is only a preferred embodiment of the invention and should not be taken as limiting the scope of the invention, so that the invention is not limited by the disclosure of the invention.
Claims (10)
1. An automated optical inspection system, comprising:
a carrier plate for carrying a contact lens;
a light source module, which is arranged below the carrying disc and is used for emitting parallel light to the contact lens;
the image acquisition module is arranged above the carrying disc and corresponds to the position of the contact lens, and is used for acquiring a contour image of the contact lens; and
a system host, coupled to the image capture module, for dividing the contact lens edge on the contour image into a plurality of segments, performing similarity analysis on the interaction of the segments, and detecting whether the contact lens edge has defects according to the result of the similarity analysis.
2. The automated optical inspection system of claim 1, wherein the result of said similarity analysis is represented by a similarity measure, and when said similarity measure of a first segment and a second segment of said plurality of segments is below a threshold value, said system host detects said defect in said contact lens edge and determines that at least one of said first segment and said second segment is said contact lens edge having said defect.
3. The automated optical inspection system of claim 2, wherein said system host determines said first zone as said defective contact lens edge when said similarity measure of said first zone and a third zone is also below said threshold value, but said similarity measure of said second zone and said third zone is above said threshold value.
4. The automated optical inspection system of claim 2, wherein said system host determines said second zone as said defective contact lens edge when said measure of similarity between said second zone and a third zone is also below said threshold value, but said measure of similarity between said first zone and said third zone is above said threshold value.
5. The automated optical inspection system of claim 1, wherein the system mainframe interacts to perform the similarity analysis with a plurality of the segments that are similarly illuminated.
6. A method for detecting edge defects of a contact lens, the method being implemented in an automatic optical inspection system, the automatic optical inspection system comprising a carrier, a light source module, an image capture module, and a system host, the method comprising:
carrying the contact lens by using the carrying disc, and emitting parallel light onto the contact lens by using the light source module;
acquiring a contour image of the contact lens by using the image acquisition module; and
dividing the contact lens edge on the contour image into a plurality of sections by using the system host, then carrying out similarity analysis on a plurality of section interactions, and detecting whether the contact lens edge has the defects or not according to the result of the similarity analysis.
7. The method of claim 6, wherein the result of said similarity analysis is represented by a similarity measure, and when said similarity measure of a first segment and a second segment of said plurality of segments is below a threshold value, said system host detects said defect in said contact lens edge and determines that at least one of said first segment and said second segment is said contact lens edge having said defect.
8. The method of claim 7, wherein said system host determines said first zone as said defective contact lens edge when said similarity measure of said first zone and a third zone is also below said threshold value, but said similarity measure of said second zone and said third zone is above said threshold value.
9. The method of claim 7, wherein said system host determines said second zone as said defective contact lens edge when said similarity measure of said second zone and a third zone is also below said threshold value, but said similarity measure of said first zone and said third zone is above said threshold value.
10. The method of claim 6, wherein the system host interacts to perform the similarity analysis with a plurality of the segments that are similarly illuminated.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010121338.8A CN113311006A (en) | 2020-02-26 | 2020-02-26 | Automatic optical detection system and method for detecting edge defects of contact lens |
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| CN202010121338.8A CN113311006A (en) | 2020-02-26 | 2020-02-26 | Automatic optical detection system and method for detecting edge defects of contact lens |
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