CN113284549B - Method and device for testing chip leakage-writing electric programmable fuse - Google Patents
Method and device for testing chip leakage-writing electric programmable fuse Download PDFInfo
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- CN113284549B CN113284549B CN202110544085.XA CN202110544085A CN113284549B CN 113284549 B CN113284549 B CN 113284549B CN 202110544085 A CN202110544085 A CN 202110544085A CN 113284549 B CN113284549 B CN 113284549B
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- programmable fuse
- electrically programmable
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56008—Error analysis, representation of errors
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5604—Display of error information
Abstract
The invention provides a method and a device for testing a chip leakage-writing programmable fuse, wherein the method comprises the following steps: when an electronic device applying a chip to be tested is started for the first time, acquiring an electrically programmable fuse state zone bit of the chip to be tested; judging whether the electrically programmable fuse writes data according to the state flag bit of the electrically programmable fuse; and if the electrically programmable fuse does not write data, sending a reminding signal. The invention can detect the problem of the chip leakage and electricity-writing programmable fuse as early as possible.
Description
Technical Field
The invention relates to the technical field of chip testing, in particular to a method and a device for testing a chip leakage-writing programmable fuse wire.
Background
An Efuse (Electrically programmable fuse) is widely applied to the design of a super-large-scale chip, the Efuse stores information according to the electromigration theory by whether the fuse is blown by current or not, the resistance of a polysilicon fuse is small before the fuse is blown, the resistance is multiplied after the fuse is blown by continuous large current, and the broken state of the fuse is permanently maintained. One fuse may correspond to a value of "0" or "1" in the binary. For example, it may be defined that an unblown fuse node stores "1" and a blown fuse node stores "0".
The application of Efuse mainly plays a redundancy role in a chip, and particularly in a circuit of a semiconductor memory, when the circuit has an error, the Efuse serves as a backup storage circuit to enable the chip to automatically repair the defect. Secondly, the eFUSE also has the characteristic of one-time programming, and can be programmed according to different requirements, so that the chip is more intelligent. Generally, before the chip leaves the factory, data needs to be written into the eFUSE, and if the chip misses the eFUSE, the chip cannot work or part of the function is abnormal.
Disclosure of Invention
In view of this, the present invention provides a method and an apparatus for testing a chip programming-missing programmable fuse, which can detect the chip programming-missing programmable fuse as early as possible before the chip leaves the factory.
In a first aspect, the present invention provides a method for testing a chip leakage-writing electrically programmable fuse, including:
when an electronic device applying a chip to be tested is started for the first time, acquiring an electrically programmable fuse state zone bit of the chip to be tested;
judging whether the electrically programmable fuse writes data or not according to the state flag bit of the electrically programmable fuse;
and if the electrically programmable fuse does not write data, sending a reminding signal.
Optionally, if the flag bit of the state of the electrically programmable fuse is 1, it is determined that the electrically programmable fuse has written data, and if the flag bit of the state of the electrically programmable fuse is 0, it is determined that the electrically programmable fuse has not written data.
Optionally, the sending of the reminding signal includes performing one or a combination of several of the following operations, specifically including:
stopping the electronic equipment on a starting interface, and controlling the screen of the electronic equipment to flicker;
stopping the electronic equipment on the starting interface, and displaying reminding characters or pictures on the screen of the electronic equipment;
stopping the electronic equipment on the starting interface, and controlling the charging indicator lamp to flash;
and stopping the electronic equipment on the starting interface, and controlling the loudspeaker to play reminding music;
and controlling the appointed GPIO port to output a pulse signal with a fixed frequency.
Optionally, the flag bit of the electrically programmable fuse state is 8bit, the default state is 0x00, which indicates that the efuse is not written by the chip, and the write state is 0x01, which indicates that the efuse has been written by the chip.
In a second aspect, the present invention provides a device for testing a chip leakage-writing electrically programmable fuse, including:
the system comprises an acquisition module, a detection module and a control module, wherein the acquisition module is used for acquiring an electrically programmable fuse state zone bit of a chip to be detected when an electronic device applying the chip to be detected is started for the first time;
the judging module is used for judging whether the electrically programmable fuse writes data according to the state flag bit of the electrically programmable fuse;
and the reminding module is used for sending a reminding signal if the electrically programmable fuse does not write data.
Optionally, the determining module is configured to determine that the data is written by the electrically programmable fuse if the flag bit of the electrically programmable fuse state is 1, and determine that the data is not written by the electrically programmable fuse if the flag bit of the electrically programmable fuse state is 0.
Optionally, the reminding module is configured to, if the electrically programmable fuse does not write data, perform one or a combination of several of the following operations, specifically including:
stopping the electronic equipment on a starting interface, and controlling the screen of the electronic equipment to flicker;
stopping the electronic equipment on the starting interface, and displaying reminding characters or pictures on the screen of the electronic equipment;
stopping the electronic equipment on the starting interface, and controlling the charging indicator lamp to flash;
and stopping the electronic equipment on the starting interface, and controlling the loudspeaker to play reminding music;
and controlling the appointed GPIO port to output a pulse signal with a fixed frequency.
Optionally, the flag bit of the electrically programmable fuse state is 8bit, the default state is 0x00, which indicates that the efuse is not written by the chip, and the write state is 0x01, which indicates that the efuse has been written by the chip.
In a third aspect, the present invention provides an electronic device, comprising a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the steps of the method for testing a chip under-written electrically programmable fuse provided in the first aspect.
In a fourth aspect, the present invention provides a non-transitory computer readable storage medium, on which a computer program is stored, which computer program, when executed by a processor, implements the steps of the method for testing a chip under-written electrically programmable fuse as provided in the first aspect.
The method and the device for testing the chip programming leakage programmable fuse can be applied to a chip debugging stage and a chip mass production stage, can detect the problem of the chip programming leakage programmable fuse when electronic equipment is started for the first time, can avoid programming leakage and reduce loss caused by programming leakage of the chip.
Drawings
Fig. 1 is a schematic flowchart illustrating a method for testing a chip under-programmed programmable fuse according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a device for testing a chip leakage write electrically programmable fuse according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a schematic flowchart illustrating a method for testing a chip under-test electrically programmable fuse according to an embodiment of the present invention, where the method is used to test whether data is written into an electrically programmable fuse built in a chip to be tested. As shown in fig. 1, the method includes steps S101 to S103.
In step S101, when the electronic device using the chip to be tested is turned on for the first time, the flag bit of the electrically programmable fuse state of the chip to be tested is obtained.
In this embodiment, an 8-bit electrically programmable fuse state flag is designed in the chip design stage, where 0x00 is a default state indicating that no efuse is written to the chip, and 0x01 is a write state indicating that efuse has been programmed to the chip. After the chip is written in a packaging factory, marking an electrically programmable fuse state flag bit (hereinafter abbreviated as efuse state flag bit in this application), and if efuse is written in, setting the efuse state flag bit to be 1. The efuse status flag bit remains in default state 0 if efuse is not written. I.e., the efuse status flag bit, is used to indicate whether the electrically programmable fuse efuse has been written with data.
In step S102, it is determined whether the electrically programmable fuse writes data according to the electrically programmable fuse state flag bit.
In this embodiment, if the flag bit of the electrically programmable fuse state is 1, it is determined that the electrically programmable fuse has written data, and if the flag bit of the electrically programmable fuse state is 0, it is determined that the electrically programmable fuse has not written data.
In step S103, if the electrically programmable fuse does not write data, a warning signal is sent.
In this embodiment, the sending of the reminding signal may be one or a combination of several of the following operations, which specifically includes:
stopping the electronic equipment on a starting interface, and controlling the screen of the electronic equipment to flicker;
stopping the electronic equipment on the starting interface, and displaying reminding characters or pictures on the screen of the electronic equipment;
stopping the electronic equipment on the starting interface, and controlling the charging indicator lamp to flash;
and stopping the electronic equipment on the starting interface, and controlling the loudspeaker to play reminding music;
and controlling the appointed GPIO port to output a pulse signal with fixed frequency.
The method for testing the chip programming-missing programmable fuse can be applied to a chip debugging stage and a chip mass production stage, a USB AT command is not used in the chip debugging stage, whether the efuse is unwritten or not is directly judged in the first starting process, if the efuse is unwritten, a reminding signal is sent, in the chip mass production stage, the abnormality can be found without waiting for a function or performance test, whether the efuse is unwritten or not can be judged when a mobile phone is started for the first time, and if the efuse is unwritten, the reminding signal is sent.
Specifically, the following describes an application of the method for testing a chip-programmed electrical programmable fuse by using a mobile phone chip as an example.
The life cycle state of the chip can be divided into two application scenes.
In a first scenario, when a chip is in a research, development and debugging stage, a chip testing method includes the following steps:
1. when a mobile phone using the mobile phone chip is started for the first time, the efuse state zone bit of the chip to be tested is obtained.
2. Judging whether the data is written into the electrically programmable fuse according to the efuse state flag bit, and if the efuse state flag bit is 1, judging that the data is written into the electrically programmable fuse by the mobile phone chip on an ATE production line, and normally starting the mobile phone; and if the efuse state flag bit is 0, judging that the mobile phone chip is not written with efuse in the ATE production line.
3. If the efuse does not write data, a reminding signal is sent to remind a research and development personnel that the efuse does not write data. Specifically, the reminder is sent out in one of the following manners or a combination manner:
1) stopping the mobile phone on a starting interface, and controlling the screen of the mobile phone to flicker;
2) the mobile phone is stopped at a starting interface, and reminding characters or pictures are displayed on a mobile phone screen;
3) the mobile phone is stopped at a starting interface, and the charging indicator lamp is controlled to flicker;
4) stopping the mobile phone on a starting interface, and controlling a loudspeaker to play reminding music;
5) and controlling the appointed GPIO port to output a pulse signal with fixed frequency.
After the reminding lasts for a period of time, the mobile phone is normally started. If the developer still does not write the effect at this stage, the subsequent mass production stage can be left.
In a second scenario, when the chip is in a mass production stage, that is, in a stage of importing the chip to a client, the chip testing method includes:
1. when a mobile phone using the mobile phone chip is started for the first time, the efuse state zone bit of the chip to be tested is obtained.
2. Judging whether the data is written into the electric programmable fuse according to the efuse state flag bit, if the efuse state flag bit is 1, judging that the data is written into the electric programmable fuse by the mobile phone chip on an ATE production line, and normally starting the mobile phone; and if the efuse state flag bit is 0, judging that the mobile phone chip is not written with efuse in the ATE production line.
3. And if the efuse does not write data, sending a reminding signal to remind a producer that the efuse does not write data. Specifically, the reminder is sent out in one of the following manners or a combination manner:
1) the mobile phone stays in the starting process, the complete starting is not completed, and the screen of the mobile phone is controlled to flicker;
2) the mobile phone stays in the starting process, does not complete the starting, and displays reminding characters or pictures on a screen of the mobile phone;
3) the mobile phone stays in the starting process, the complete starting is not completed, and the charging indicator lamp is controlled to flicker;
4) the mobile phone stays in the starting process, and is not completely started, and the loudspeaker is controlled to play the reminding music;
5) and controlling the appointed GPIO port to output a pulse signal with fixed frequency.
At this stage, if no data is written to the efuse, the boot process is stopped.
Therefore, the testing method of the chip programming leakage programmable fuse can detect the problem of the chip programming leakage programmable fuse when the mobile phone is started for the first time, avoid programming leakage and reduce loss caused by programming leakage of the chip.
Fig. 2 is a schematic structural diagram illustrating a device for testing a chip leakage write electrically programmable fuse according to an embodiment of the present invention. As shown in fig. 2, the apparatus includes: an obtaining module 201, a judging module 202 and a reminding module 203, wherein,
an obtaining module 201, configured to obtain an electrically programmable fuse state flag of a chip to be tested when an electronic device applying the chip to be tested is started up for a first time;
the judging module 202 is used for judging whether the electrically programmable fuse writes data according to the state flag bit of the electrically programmable fuse;
and the reminding module 203 is used for sending a reminding signal if the electrically programmable fuse does not write data.
Further, in the embodiment of the present invention, the flag bit of the electrically programmable fuse state is 8bit, the default state is 0x00, which indicates that no efuse is written to the chip, and the write state is 0x01, which indicates that the efuse has been programmed to the chip.
The determining module 202 is configured to determine that the data is written by the electrically programmable fuse if the status flag bit of the electrically programmable fuse is 1, and determine that the data is not written by the electrically programmable fuse if the status flag bit of the electrically programmable fuse is 0.
The reminding module 203 is configured to, if the electrically programmable fuse does not write data, perform one or a combination of several of the following operations, specifically including:
stopping the electronic equipment on a starting interface, and controlling the screen of the electronic equipment to flicker;
stopping the electronic equipment on the starting interface, and displaying reminding characters or pictures on the screen of the electronic equipment;
stopping the electronic equipment on the starting interface, and controlling the charging indicator lamp to flash;
and stopping the electronic equipment on the starting interface, and controlling the loudspeaker to play reminding music;
and controlling the appointed GPIO port to output a pulse signal with fixed frequency.
The device for testing a chip under-programmed electrically programmable fuse according to an embodiment of the present invention is used to execute the method embodiment, and for details and flow of the method embodiment, reference is made to the embodiment, which is not repeated herein.
On the other hand, an embodiment of the present invention further provides an electronic device, where the electronic device may include: a processor (processor), a memory (memory), and a communication bus, wherein the processor and the memory communicate with each other through the communication bus. The processor may execute the program instructions in the memory to implement the steps of the method for testing a chip under-programmed electrically programmable fuse provided by the above embodiments, for example, including: when an electronic device applying a chip to be tested is started for the first time, acquiring an electrically programmable fuse state zone bit of the chip to be tested; judging whether the electrically programmable fuse writes data according to the state flag bit of the electrically programmable fuse; and if the electrically programmable fuse does not write data, sending a reminding signal.
On the other hand, the embodiment of the present invention further provides a non-transitory computer readable storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the steps of the method for testing a chip under-programmed electrically programmable fuse provided in the above embodiments.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A method for testing a chip leakage-writing electrically programmable fuse is characterized by comprising the following steps:
when an electronic device applying a chip to be tested is started for the first time, acquiring an electrically programmable fuse state zone bit of the chip to be tested;
judging whether the electrically programmable fuse writes data or not according to the state flag bit of the electrically programmable fuse;
and if the electrically programmable fuse does not write data, sending a reminding signal.
2. The method of claim 1, wherein if the electrically programmable fuse state flag bit is 1, it is determined that the electrically programmable fuse has written data, and if the electrically programmable fuse state flag bit is 0, it is determined that the electrically programmable fuse has not written data.
3. The method according to claim 1, wherein the sending of the alert signal includes performing one or a combination of the following operations:
stopping the electronic equipment on a starting interface, and controlling the screen of the electronic equipment to flicker;
stopping the electronic equipment on the starting interface, and displaying reminding characters or pictures on the screen of the electronic equipment;
stopping the electronic equipment on the starting interface, and controlling the charging indicator lamp to flash;
and stopping the electronic equipment on the starting interface, and controlling a loudspeaker to play reminding music;
and controlling the appointed GPIO port to output a pulse signal with fixed frequency.
4. The method of claim 1, wherein the status flag bit of the electrically programmable fuse is 8bit, the default status is 0x00, which indicates that no efuse is written into the chip, and the write status is 0x01, which indicates that efuse has been burned into the chip.
5. A device for testing a chip under-written electrically programmable fuse, the device comprising:
the system comprises an acquisition module, a detection module and a control module, wherein the acquisition module is used for acquiring an electrically programmable fuse state zone bit of a chip to be detected when an electronic device applying the chip to be detected is started for the first time;
the judging module is used for judging whether the electrically programmable fuse writes data according to the state flag bit of the electrically programmable fuse;
and the reminding module is used for sending a reminding signal if the electrically programmable fuse does not write data.
6. The apparatus of claim 5, wherein the determining module is configured to determine that the electrically programmable fuse writes data if the electrically programmable fuse status flag bit is 1, and determine that the electrically programmable fuse does not write data if the electrically programmable fuse status flag bit is 0.
7. The apparatus of claim 5, wherein the reminding module is configured to, if the electrically programmable fuse does not write data, perform one or a combination of the following operations, specifically including:
stopping the electronic equipment on a starting interface, and controlling the screen of the electronic equipment to flicker;
stopping the electronic equipment on the starting interface, and displaying reminding characters or pictures on the screen of the electronic equipment;
stopping the electronic equipment on the starting interface, and controlling the charging indicator lamp to flash;
and stopping the electronic equipment on the starting interface, and controlling the loudspeaker to play reminding music;
and controlling the appointed GPIO port to output a pulse signal with fixed frequency.
8. The apparatus of claim 5, wherein the status flag bit of the electrically programmable fuse is 8bit, the default status is 0x00, which indicates that no efuse is written into the chip, and the write status is 0x01, which indicates that efuse has been burned into the chip.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the steps of the method for testing a under-programmed fuse according to any of claims 1 to 4 are implemented when the program is executed by the processor.
10. A non-transitory computer readable storage medium, having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the method for testing a under-programmed fuse according to any of claims 1 to 4.
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| CN202110544085.XA CN113284549B (en) | 2021-05-19 | 2021-05-19 | Method and device for testing chip leakage-writing electric programmable fuse |
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| CN202110544085.XA CN113284549B (en) | 2021-05-19 | 2021-05-19 | Method and device for testing chip leakage-writing electric programmable fuse |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103187095A (en) * | 2011-12-30 | 2013-07-03 | 联芯科技有限公司 | Efuse module control method and chip with efuse module |
| CN107204206A (en) * | 2017-05-25 | 2017-09-26 | 深圳市金立通信设备有限公司 | A kind of electrical fuse programming method, terminal and computer-readable recording medium |
| CN108647140A (en) * | 2018-04-26 | 2018-10-12 | 深圳市明泰电讯有限公司 | A kind of test method and test system of mobile terminal |
| CN112416824A (en) * | 2020-12-03 | 2021-02-26 | 上海集成电路研发中心有限公司 | Efuse read-write controller, chip, electronic equipment and control method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109493909B (en) * | 2018-11-21 | 2021-06-25 | 上海华虹宏力半导体制造有限公司 | Electrically programmable fuse circuit, and programming method and detection method of electrically programmable fuse |
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- 2021-05-19 CN CN202110544085.XA patent/CN113284549B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103187095A (en) * | 2011-12-30 | 2013-07-03 | 联芯科技有限公司 | Efuse module control method and chip with efuse module |
| CN107204206A (en) * | 2017-05-25 | 2017-09-26 | 深圳市金立通信设备有限公司 | A kind of electrical fuse programming method, terminal and computer-readable recording medium |
| CN108647140A (en) * | 2018-04-26 | 2018-10-12 | 深圳市明泰电讯有限公司 | A kind of test method and test system of mobile terminal |
| CN112416824A (en) * | 2020-12-03 | 2021-02-26 | 上海集成电路研发中心有限公司 | Efuse read-write controller, chip, electronic equipment and control method |
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