CN103257909A - Baseboard management controller (BMC)-based automated testing method and system for light emitting diode (LED) - Google Patents

Baseboard management controller (BMC)-based automated testing method and system for light emitting diode (LED) Download PDF

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Publication number
CN103257909A
CN103257909A CN 201210033648 CN201210033648A CN103257909A CN 103257909 A CN103257909 A CN 103257909A CN 201210033648 CN201210033648 CN 201210033648 CN 201210033648 A CN201210033648 A CN 201210033648A CN 103257909 A CN103257909 A CN 103257909A
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China
Prior art keywords
led
event
bmc
array element
management table
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CN 201210033648
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Chinese (zh)
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黄嘉庆
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Priority to CN 201210033648 priority Critical patent/CN103257909A/en
Priority to TW101105375A priority patent/TW201333690A/en
Publication of CN103257909A publication Critical patent/CN103257909A/en
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Abstract

A BMC-based automated testing method for an LED comprises the steps of reading all data in an LED management table from a database; simulating an event in the LED management table in a preset order; obtaining the current state of the LED after a preset time interval; inquiring an ideal LED light condition in the LED management table; determining whether the current state of the LED is identical with the inquired LED light condition, if the current state of the LED is not identical with the inquired LED light condition, prompting test failure, and otherwise, determining whether all events are simulated; and when some events are not simulated, simulating the next event in the LED management table in the preset order, returning to obtain the current state of the LED, and otherwise, prompting all test information. The invention further provides a BMC-based automated testing system for the LED. By means of the BMC-based automated testing method and system for the LED, LED light conditions corresponding to different events of a server can be tested.

Description

LED automated testing method and system based on BMC
Technical field
The present invention relates to a kind of LED automated testing method and system based on BMC, relate in particular to LED automated testing method and system based on BMC in a kind of server.
Background technology
(Baseboard Management Controller BMC) as the supvr of server, is responsible for the operation conditions of monitoring server to baseboard management controller.When various undesirable conditions (for example low excessively heat radiation deficiency, the overtension etc. of causing of rotation speed of the fan) take place server, these undesirable conditions hereinafter will be referred to as event, and BMC can record these events.Simultaneously, in order to cause the attention of server managers, usually BMC also can according to different events light corresponding light emitting diode (Light Emitting Diode, LED).BMC decides the bright lamp situation of LED according to the order of importance and emergency of event usually at present, and the bright lamp situation of LED is made up of color and frequency.For example matters of aggravation is yellow flashing led, and not serious event is yellow led Chang Liang.
In the production run of factory, need the bright lamp situation of the corresponding LED of different event of testing server whether correct, all adopt the manual testing this moment.Owing to cause the undesirable condition event various, and the color of LED and frequency are varied, and both combine and bring very big difficulty to the manual testing, lose time and omit to some extent easily.Therefore, be necessary to provide a kind of LED automated testing method based on BMC, can test comprehensively and rapidly.
Summary of the invention
In view of above content, be necessary to provide a kind of LED automated testing method based on BMC, with the test of the bright lamp situation of the corresponding LED of different event that realizes server.
In view of above content, also be necessary to provide a kind of LED automatization test system based on BMC, with the test of the bright lamp situation of the corresponding LED of different event that realizes server.
Described LED automated testing method based on BMC, this method may further comprise the steps: read all data in the LED management table from database; Simulation steps one: according to an event in the preset order simulation LED management table, color and the frequency of BMC control LED in simulation process; Obtaining step: the current state of after a default time interval, obtaining LED; Query steps: the desirable bright lamp situation of LED of inquiry in the LED management table; Determining step one: whether the current state of judging LED is identical with the bright lamp situation of the LED that inquires, and when the bright lamp situation of current state and the LED that inquires of LED is identical, carries out determining step two, otherwise, the bright lamp situation of the LED test crash of pointing out this event correspondence; Determining step two: judge whether all events have all been simulated and finish, when also having event not simulate, carry out simulation steps two, otherwise, provide the detecting information prompting of the bright lamp situation of LED of all event correspondences; Simulation steps two: according to the next event in the preset order simulation LED management table, and return the execution obtaining step.
Described LED automatization test system based on BMC, this system comprises: read module, for all data that read from database the LED management table; Analog module is used for an event according to a preset order simulation LED management table, color and the frequency of BMC control LED in simulation process; Acquisition module is for the current state of obtaining LED after a default time interval; Enquiry module is used in the desirable bright lamp situation of LED of LED management table inquiry; Judge module is used for judging whether the current state of LED is identical with the bright lamp situation of the LED that inquires; Reminding module, be used for when the current state of LED and the bright lamp situation of LED that inquires not simultaneously, point out the bright lamp situation of the LED test crash of this event correspondence; Described judge module also is used for current state as LED when identical with the bright lamp situation of the LED that inquires, and judges whether all events have all been simulated to finish; Described analog module also is used for when also having event not simulate, according to the next event in the preset order simulation LED management table; Described reminding module also is used for when all events have all been simulated, provides the detecting information prompting of the bright lamp situation of LED of all event correspondences.
Compared to prior art, described LED automated testing method and system based on BMC, whether the bright lamp situation of the corresponding LED of different event that can testing server by this method is correct, promotes the coverage rate of test and the quality of product.
Description of drawings
Fig. 1 is the Organization Chart that the present invention is based on the LED automatization test system preferred embodiment of BMC.
Fig. 2 is the functional block diagram that the present invention is based on the LED automatization test system preferred embodiment of BMC.
Fig. 3 is the process flow diagram that the present invention is based on the LED automated testing method preferred embodiment of BMC.
Fig. 4 is an exemplary plot of LED management table among the present invention.
The main element symbol description
Server 1
LED automatization test system based on BMC 10
Memory device 20
Database 200
BMC 30
Display device 40
LED 50
Read module 100
Analog module 101
Acquisition module 102
Enquiry module 103
Judge module 104
Reminding module 105
Following embodiment will further specify the present invention in conjunction with above-mentioned accompanying drawing.
Embodiment
As shown in Figure 1, be the Organization Chart that the present invention is based on the LED automatization test system preferred embodiment of BMC.
LED automatization test system 10 based on BMC runs in the server 1, also comprises memory device 20, BMC30 in the described server 1.Described memory device 20 both can be storage mediums such as the built-in hard disk of server 1, internal memory, also can be storage mediums such as the hard disk that is external in server 1, flash memory.This preferred embodiment is that server 1 built-in storage medium is that example is introduced with memory device 20.
Comprise a database 200 in the described memory device 20, store a LED management table in this database 200, this LED management table is used for the corresponding relation of description event and the bright lamp situation of LED.Described event is the various undesirable conditions that server 1 takes place, and for example rotation speed of the fan hangs down the deficiency that causes dispelling the heat excessively, the front panel temperature is high excessively.All to a sensor being arranged in monitoring, each sensor can be monitored one or more events to each event.Comprise a plurality of parameter informations in the described LED management table, described parameter information comprises: priority (priority), color (color), frequency (frequency), sensor memory body (sensor owner), sensor identification code (sensor number), event reason (offset), type (mask) and test sign etc.Every row of described LED management table are a parameter information, and every row of described LED management table is all represented an event, and the content of every row all reflects the information of an event and the bright lamp situation of LED of this event correspondence.This LED management table is according to the configuration difference of server 1, and its content is also correspondingly different.As shown in Figure 4, be an exemplary plot of LED management table among the present invention.
Described priority is used for the priority of sign event, and since 0 (0 expression server 1 is normal, and namely priority is that 0 event is server 1 normal event), the numerical value of priority is more big, and then event is also more urgent.Described color and frequency are used for describing color and the frequency of LED.Described sensor memory body is used for the variation of record sensor, can be BMC30 or Basic Input or Output System (BIOS) (Basic Input Output System, BIOS) or operating system etc.Described sensor identification sign indicating number is used for the sensor of this event of position monitor.Described event reason is used for showing the reason of event generation, still is brownout etc. as overtension.Described type is used for the direction of characteristic events, and (assert) still sounds all clear as alarm.Described test sign is used for identified event and whether has finished test, and 0 this event of expression is test mode not, and 1 represents that this event is test mode.
Can comprise a plurality of events under each priority in the described LED management table, the color of the event under same priority is identical with frequency.Each type is the event of alarm, can be the event of sounding all clear to a type should be arranged all under same priority.Described type is the undesirable condition of the event corresponding with service device 1 of alarm, and described type is that the event of sounding all clear is that the undesirable condition of the corresponding server 1 of event of alarm recovers normal with type.As shown in Figure 4, priority is that 0 expression server 1 is normal, and the bright lamp situation of LED is green Chang Liang, and other parameter information is null value; Priority is that 1 event has four, and the color of LED50, frequency are green, 1Hz, and priority is that each type of 1 is the event of alarm, is that 1 type is the event of sounding all clear to a priority should be arranged all.
Need to prove that when a plurality of types are the event of alarm when taking place in succession, may have a plurality of events simultaneously in the server 1, at this moment, what the bright lamp situation of LED showed is color and the frequency of the LED50 of the highest event correspondence of priority.In Fig. 4, after parameter information takes place for the event of " redundancy is lost, alarm ", when taking place parameter information for the event of " surpass serious threshold value, alarm " more in succession, the bright lamp situation of LED this moment should be event corresponding color and the frequency of parameter information for " surpassing serious threshold value, alarm ": yellow, 1Hz.
Described server 1 also is connected with display device 40, LED50.Described display device 40 is used for carrying out the output demonstration of test result.Described display device 40 both had been external in the display of server 1, also can be the display screen of server 1, and this preferred embodiment is that the display that is external in server 1 is that example is introduced with display device 40.(General Purpose Input Output GPIO) is connected (drawing three among the figure) to described BMC30 with LED50 by the multiple bus extender.The corresponding a kind of color of every GPIO, described BMC30 transmits control signal to realize control to the frequency of LED50 by corresponding GPIO.
As shown in Figure 2, be the functional block diagram that the present invention is based on the LED automatization test system preferred embodiment of BMC.
Described LED automatization test system 10 based on BMC comprises read module 100, analog module 101, acquisition module 102, enquiry module 103, judge module 104 and reminding module 105.The function of each module will describe in detail in conjunction with the process flow diagram of Fig. 3.
As shown in Figure 3, be the process flow diagram that the present invention is based on the LED automated testing method preferred embodiment of BMC.
Step S10, described read module 100 reads all data in the LED management table from database 200.
In this step, created the right of priority integer array of an one dimension by analog module 101.The subscript value of the array element in this right of priority array is corresponding one by one with the priority in the LED management table by order from small to large, all corresponding array element of each event.Need to prove that a priority in the equal corresponding LED management table of the subscript value of each array element may have a plurality of events under the same priority, at this moment, the corresponding same array element of described a plurality of events.Right of priority array priority[N+1 for example], wherein N is the maximal value of LED management table medium priority, suppose that N is 3, four array elements are then arranged in the right of priority array, be respectively priority[0], priority[1], priority[2], priority[3], priority[0 then], priority[1], priority[2], priority[3] corresponding priority is 0 respectively, priority is 1, priority is 2, priority is 3 event.Analog module 101 is set to 1 with the initial value of first array element in the right of priority array (be priority[0]), and the initial value of remaining each array element all is set to 0.
Step S12, described analog module 101 is according to an event in the preset order simulation LED management table.
Described preset order is arranged at random by the user, but should guarantee that type is that the event of sounding all clear should be to carry out after the event of alarm in the type of correspondence, and all events in the LED management table all are performed.As shown in Figure 4, described preset order can be: the event in the LED management table is carried out successively according to order from top to bottom, or other order.
Need to prove that before not having the present invention, original working method is: when server 1 when event occurs, the sensor detecting of monitoring this event during to this event this sensor can change self value.In the present invention, the method for employing software is simulated the process of the value that changes sensor.When event in the analog module 101 simulation LED management table, simulation be the undesirable condition that server 1 takes place.Described simulation process is as follows: analog module 101 utilizes Sensor Events that order (set sensor reading and event command is set, be an order of IPMI regulation and stipulation) set the value of sensor of this event of monitoring, described Sensor Events arranges order according to parameter information: sensor identification sign indicating number, event reason and type, decide the value of sensor.Afterwards, server 1 judges that according to the value of this sensor (whether normal, rotation speed of the fan is whether normal etc. as temperature) obtains a judged result; BMC30 obtains this event corresponding priorities according to this judged result, and the highest event of priority that exists in definite server 1, and obtain color and the frequency of the LED50 of the highest event correspondence of this priority, and determine control signal according to color and the frequency of this LED50, and this control signal is sent to LED50.
Step S14, described acquisition module 102 obtains the current state of LED50 after a default time interval.The performance of described default time interval by server 1 determines.
Acquisition module 102 obtains the current state of LED50 by detecting BMC30.After event of analog module 101 simulations, acquisition module 102 reads BMC30 and is sent to the control signal of LED50 by GPIO, and determines the current state of LED50 according to this control signal.Need to prove that acquisition module 102 is updated to test mode with the test sign of the event of simulation simultaneously, be about to the test sign and become 1 by 0.
When the event of analog module 101 this time simulations (supposing that this event corresponding priority in the LED management table is m) when type is alarm, acquisition module 102 is done the initial value of the array element of this event correspondence (be priority[m]) and is added 1 operation, when the event type of analog module 101 this time simulations when sounding all clear, then acquisition module 102 is done the initial value of the array element of this event correspondence (be priority[m]) and is subtracted 1 operation.
Step S16, described enquiry module 103 inquire about the bright lamp situation of desirable LED in the LED management table.
Enquiry module 103 reads the initial value of array element in the right of priority array from big to small according to the subscript value of array element, is non-0 until the initial value of reading array element, and obtains the subscript value of this non-0 array element.At this moment, enquiry module 103 in the LED management table, inquire about priority for the corresponding color of event of the subscript value of this non-0 array element (be 3 as priority) and frequency (as for yellow, 0), this color and frequency are the bright lamp situation of desirable LED.
Step S18, described judge module 104 judge whether the current state of LED50 is identical with the bright lamp situation of the LED that inquires.When the current state of LED50 and the bright lamp situation of LED that inquires not simultaneously, execution in step S20, otherwise, execution in step S22.
Step S20, the bright lamp situation of the LED test crash of described reminding module 105 these event correspondences of prompting.
The information indicating of the bright lamp situation of the LED of described event correspondence test crash comprises: the prompting of the current state of the bright lamp situation of the LED that inquires, LED50, this event corresponding sensor, test crash etc.
Step S22, described judge module 104 judge whether all events have all been simulated and finish.When also having event not simulate, execution in step S24, otherwise, execution in step S26.
Judge module 104 judges whether that the test sign of all events in the LED management table is test mode.When the test sign of all events was test mode, judge module 104 was judged that all events are all simulated and is finished, otherwise judge module 104 judges to also have not simulation of event.
Step S24, described analog module 101 be according to the next event in the preset order simulation LED management table, and return execution in step S14.
Step S26, the detecting information prompting of the bright lamp situation of LED that described reminding module 105 provides all event correspondences.
The detecting information prompting of the bright lamp situation of the LED of all event correspondences comprises: whether each event test is successful, the current state of the bright lamp situation of the LED that event inquires when testing successfully, LED50, information indicating during the event test crash, the number of event test crash, the number that the event test is successful etc.
Above embodiment is only unrestricted in order to technical scheme of the present invention to be described, although with reference to preferred embodiment the present invention is had been described in detail, those of ordinary skill in the art is to be understood that, can make amendment or be equal to replacement technical scheme of the present invention, and not break away from the spirit and scope of technical solution of the present invention.

Claims (12)

1. LED automated testing method based on BMC is characterized in that this method may further comprise the steps:
Read step: from database, read all data in the LED management table;
Simulation steps one: according to an event in the preset order simulation LED management table, color and the frequency of BMC control LED in simulation process;
Obtaining step: the current state of after a default time interval, obtaining LED;
Query steps: the desirable bright lamp situation of LED of inquiry in the LED management table;
Determining step one: whether the current state of judging LED is identical with the bright lamp situation of the LED that inquires, and when the bright lamp situation of current state and the LED that inquires of LED is identical, carries out determining step two, otherwise, the bright lamp situation of the LED test crash of pointing out this event correspondence;
Determining step two: judge whether all events have all been simulated and finish, when also having event not simulate, carry out simulation steps two, otherwise, provide the detecting information prompting of the bright lamp situation of LED of all event correspondences;
Simulation steps two: according to the next event in the preset order simulation LED management table, and return the execution obtaining step.
2. the LED automated testing method based on BMC as claimed in claim 1, it is characterized in that, every row of described LED management table are a parameter information, and every row is all represented an event, and the content of every row all reflects the information of an event and the bright lamp situation of LED of this event correspondence.
3. the LED automated testing method based on BMC as claimed in claim 2 is characterized in that, described simulation steps one is passed through the simulation of following steps realization event:
Utilize the Sensor Events of IPMI regulation and stipulation that the value that the sensor of this event of monitoring is set in order is set, described Sensor Events arranges order and decides the value of sensor by parameter information, and described parameter information comprises sensor identification code, event reason and type.
4. the LED automated testing method based on BMC as claimed in claim 1 is characterized in that, also comprises before simulation steps one:
Create the right of priority array of an one dimension, the subscript value of the array element in this right of priority array is corresponding one by one with the priority in the LED management table by order from small to large, all corresponding array element of each event;
The initial value of first array element in the right of priority array is set to 1, and the initial value of remaining each array element all is set to 0.
5. the LED automated testing method based on BMC as claimed in claim 4 is characterized in that described obtaining step also comprises:
When the event type of simulation when being alarm, the initial value of the array element of this event correspondence done add 1 operation;
When the event type of simulation when sounding all clear, the initial value of the array element of this event correspondence done subtract 1 and operate.
6. the LED automated testing method based on BMC as claimed in claim 5 is characterized in that, described query steps realizes the inquiry of the bright lamp situation of LED by following steps:
Reading the initial value of array element from big to small according to the subscript value of array element, is non-0 until the initial value of reading array element, and obtains the subscript value of this non-0 array element;
Inquiry priority is the corresponding color of event and the frequency of the subscript value of this non-0 array element in the LED management table, and this color and frequency are the bright lamp situation of desirable LED.
7. LED automatization test system based on BMC is characterized in that this system comprises:
Read module is for all data that read from database the LED management table;
Analog module is used for an event according to a preset order simulation LED management table, color and the frequency of BMC control LED in simulation process;
Acquisition module is for the current state of obtaining LED after a default time interval;
Enquiry module is used in the desirable bright lamp situation of LED of LED management table inquiry;
Judge module is used for judging whether the current state of LED is identical with the bright lamp situation of the LED that inquires;
Reminding module, be used for when the current state of LED and the bright lamp situation of LED that inquires not simultaneously, point out the bright lamp situation of the LED test crash of this event correspondence;
Described judge module also is used for current state as LED when identical with the bright lamp situation of the LED that inquires, and judges whether all events have all been simulated to finish;
Described analog module also is used for when also having event not simulate, according to the next event in the preset order simulation LED management table;
Described reminding module also is used for when all events have all been simulated, provides the detecting information prompting of the bright lamp situation of LED of all event correspondences.
8. the LED automatization test system based on BMC as claimed in claim 7, it is characterized in that, every row of described LED management table are a parameter information, and every row is all represented an event, and the content of every row all reflects the information of an event and the bright lamp situation of LED of this event correspondence.
9. the LED automatization test system based on BMC as claimed in claim 8 is characterized in that, described analog module passes through the simulation of following steps realization event:
Utilize the Sensor Events of IPMI regulation and stipulation that the value that the sensor of this event of monitoring is set in order is set, described Sensor Events arranges order and decides the value of sensor by parameter information, and described parameter information comprises sensor identification code, event reason and type.
10. the LED automatization test system based on BMC as claimed in claim 7 is characterized in that described analog module also is used for:
Create the right of priority array of an one dimension, the subscript value of the array element in this right of priority array is corresponding one by one with the priority in the LED management table by order from small to large, all corresponding array element of each event;
The initial value of first array element in the right of priority array is set to 1, and the initial value of remaining each array element all is set to 0.
11. the LED automatization test system based on BMC as claimed in claim 10 is characterized in that described acquisition module also is used for:
When the event type of simulation when being alarm, the initial value of the array element of this event correspondence done add 1 operation;
When the event type of simulation when sounding all clear, the initial value of the array element of this event correspondence done subtract 1 and operate.
12. the LED automatization test system based on BMC as claimed in claim 11 is characterized in that, described enquiry module is realized the inquiry of the bright lamp situation of LED by following steps:
Reading the initial value of array element from big to small according to the subscript value of array element, is non-0 until the initial value of reading array element, and obtains the subscript value of this non-0 array element;
Inquiry priority is the corresponding color of event and the frequency of the subscript value of this non-0 array element in the LED management table, and this color and frequency are the bright lamp situation of desirable LED.
CN 201210033648 2012-02-15 2012-02-15 Baseboard management controller (BMC)-based automated testing method and system for light emitting diode (LED) Pending CN103257909A (en)

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Application Number Priority Date Filing Date Title
CN 201210033648 CN103257909A (en) 2012-02-15 2012-02-15 Baseboard management controller (BMC)-based automated testing method and system for light emitting diode (LED)
TW101105375A TW201333690A (en) 2012-02-15 2012-02-17 Method and system for testing LED based on BMC automatically

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Application Number Priority Date Filing Date Title
CN 201210033648 CN103257909A (en) 2012-02-15 2012-02-15 Baseboard management controller (BMC)-based automated testing method and system for light emitting diode (LED)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105677544A (en) * 2015-12-30 2016-06-15 联想(北京)有限公司 Lamplight display method and lamplight display apparatus
CN110441713A (en) * 2019-07-12 2019-11-12 苏州浪潮智能科技有限公司 A method of passing through the automatic testing service device LED light stability of BMC
CN110517629A (en) * 2019-08-30 2019-11-29 苏州浪潮智能科技有限公司 A kind of panel LED control method, device, equipment and readable storage medium storing program for executing
CN110579733A (en) * 2019-09-25 2019-12-17 苏州浪潮智能科技有限公司 indicator lamp health detection device and use method thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105677544A (en) * 2015-12-30 2016-06-15 联想(北京)有限公司 Lamplight display method and lamplight display apparatus
CN110441713A (en) * 2019-07-12 2019-11-12 苏州浪潮智能科技有限公司 A method of passing through the automatic testing service device LED light stability of BMC
CN110517629A (en) * 2019-08-30 2019-11-29 苏州浪潮智能科技有限公司 A kind of panel LED control method, device, equipment and readable storage medium storing program for executing
CN110579733A (en) * 2019-09-25 2019-12-17 苏州浪潮智能科技有限公司 indicator lamp health detection device and use method thereof

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Application publication date: 20130821