TW201333690A - Method and system for testing LED based on BMC automatically - Google Patents

Abstract

The present invention provides a method and system for testing the LED based on BMC automatically. The method includes: reading all information of LED management form from database; simulating an event of the form in accordance with a default order; acquiring the current state of the LED after a preset time interval; inquiring the ideal lighting state of the LED in the form; determining whether the current state of the LED is the same with the ideal lighting state of the LED; if it isn't, giving a prompt that test fails; if it is, determining whether all the events are simulated; if they aren't, simulating the next event of the form in accordance with a default order; if they are, giving a prompt of all testing information.

Description

LED automatic test method and system based on BMC

The invention relates to a BMC-based LED automatic test method and system, in particular to a BMC-based LED automatic test method and system in a server.

The Baseboard Management Controller (BMC) acts as the administrator of the server and monitors the health of the server. When the server has various adverse conditions (such as low fan speed resulting in insufficient heat dissipation, high voltage, etc.), these undesirable conditions will be referred to as events in the following, and the BMC will record these events. At the same time, in order to attract the attention of the server manager, the BMC usually lights up the corresponding Light Emitting Diode (LED) according to different events. At present, BMC usually determines the LED lighting condition according to the priority of the event. The LED lighting condition is composed of color and frequency. For example, the serious event is a yellow LED flashing, and the non-serious event is that the yellow LED is always on.

In the production process of the factory, it is necessary to test whether the LED lighting conditions corresponding to different events of the server are correct, and manual testing is used at this time. Due to the numerous events that lead to bad conditions, and the variety of LED colors and frequencies, the combination of the two brings great difficulties to manual testing, wasting time and is easy to miss. Therefore, it is necessary to provide a BMC-based LED automated test method that can be tested comprehensively and quickly.

In view of the above, it is necessary to provide a BMC-based LED automatic test method and system to achieve the LED lighting condition corresponding to different events of the server.

The BMC-based LED automated test method includes the following steps: reading all the data in the LED management table from the database; analogy step 1: analogizing an event in the LED management table according to a preset order, in analogy During the process, the BMC controls the color and frequency of the LED; the obtaining step: obtaining the current state of the LED after a preset time interval; the query step: querying the ideal LED lighting condition in the LED management table; determining step 1: determining the LED The current state is the same as the LED lighting condition that is queried. When the current state of the LED is the same as the illuminating LED, the judgment step 2 is performed. Otherwise, the LED lighting condition corresponding to the event is failed. Second: judge whether all events have been analogously completed. When there are still events that are not analogous, perform analogy step two. Otherwise, give test information prompts for LED lighting conditions corresponding to all events; analog step 2: analogy according to preset order The LED manages the next event in the form and returns to the execution acquisition step.

The BMC-based LED automated test system includes: a read module for reading all data in the LED management table from the database; an analog module for analogizing the LED management table according to a preset order In an event, the BMC controls the color and frequency of the LED during the analogy process; the acquisition module is used to obtain the current state of the LED after a preset time interval; the query module is used to query the ideal in the LED management table. The LED lighting condition; the determining module is configured to determine whether the current state of the LED is the same as the queried LED lighting condition; and the prompting module is configured to: when the current state of the LED is different from the queried LED lighting condition, Prompting that the LED lighting condition corresponding to the event fails; the determining module is further configured to determine whether all events have been analogized when the current state of the LED is the same as the queried LED lighting condition; The group is also used to manage the next event in the table according to the preset order when the event is not analogous; the prompt module is also used to give all the events when all the events have been analogized. LED lighting member corresponding to the case where the test information tips.

Compared with the prior art, the BMC-based LED automatic test method and system of the present invention can test whether the LED lighting conditions corresponding to different events of the server are correct, improve the test coverage and the product. quality.

FIG. 1 is an architectural diagram of a preferred embodiment of a BMC-based LED automated test system of the present invention.

The BMC-based LED automated test system 10 runs in the server 1, and the server 1 further includes a storage device 20 and a BMC 30. The storage device 20 may be a storage medium such as a hard disk or a memory built in the server 1 or a storage medium such as a hard disk or a flash memory externally connected to the server 1. The preferred embodiment of the present invention is described by taking the storage device 20 as a storage medium built in the server 1.

The storage device 20 includes a database 200, and the database 200 stores an LED management table for describing the correspondence between the event and the LED lighting condition. The event is a variety of undesirable conditions that occur in the server 1, such as a low fan speed resulting in insufficient heat dissipation, a high front panel temperature, and the like. Each event corresponds to a sensor being monitored, and each sensor can monitor one or more events. The LED management table includes a plurality of parameter information, including: priority, color, frequency, sensor owner, sensor identifier ( Sensor number), event reason (offset), type (mask) and test flags. Each column of the LED management table is a parameter information, and each row of the LED management table represents an event, and the content of each row reflects the information of one event and the LED lighting condition corresponding to the event. The LED management table differs depending on the configuration of the server 1, and its contents are also different. As shown in FIG. 4, it is an exemplary diagram of the LED management table in the present invention.

The priority order is used to represent the priority order of the event, starting from 0 (0 means that the server 1 is normal, that is, the event with the priority order of 0 is the normal event of the server 1), and the larger the priority value, the more the event urgent. The color and frequency are used to describe the color and frequency of the LED. The sensor memory is used to record changes of the sensor, and may be a BMC 30 or a Basic Input Output System (BIOS) or an operating system. The sensor identification code is used to locate a sensor that monitors the event. The cause of the event is used to indicate the cause of the event, such as excessive voltage or low voltage. The type is used to flag the direction of the event, such as an alert or an alert. The test flag is used to identify whether the event has completed the test, 0 indicates that the event is an untested state, and 1 indicates that the event is a tested state.

Each of the priority orders in the LED management table may include a plurality of events, and the events and colors in the same priority order have the same color and frequency. Each event of type alert will have an event of the type that is de-alarmed in the same priority order. The event of the type of alarm corresponds to the fault condition of the server 1, and the event of the type of canceling the alarm restores the fault condition of the server 1 corresponding to the event of the type of the alarm to normal. As shown in FIG. 4, the priority order is 0, indicating that the server 1 is normal, the LED is lit, the green light is always on, and the other parameter information is null; the priority order is one, and the color and frequency of the LED 50 are both For each type of alarm that is green, 1 Hz, and priority order is 1, there is an event with the priority order of 1 being the alarm.

It should be noted that when multiple types of events with alarms occur one after another, there may be multiple events in the server 1. At this time, the LED lighting condition displays the color and frequency of the LED 50 corresponding to the event with the highest priority. . As shown in Figure 4, when the parameter information is "redundant loss, alarm" occurs, and then the parameter information is "exceeding the critical threshold, alarm" event, the LED lighting should be parameter information as " The color and frequency corresponding to the event that exceeds the critical threshold, alarm: yellow, 1 Hz.

The server 1 is also connected to the display device 40 and the LED 50. The display device 40 is configured to perform an output display of test results. The display device 40 can be either a display externally connected to the server 1 or a display screen of the server 1. The preferred embodiment of the present invention is described by taking the display device 40 as a display externally connected to the server 1. The BMC 30 is connected to the LED 50 through a plurality of General Purpose Input Outputs (GPIOs) (three are drawn in the figure). Each GPIO corresponds to one color, and the BMC 30 controls the frequency of the LED 50 by transmitting a control signal through the corresponding GPIO.

As shown in FIG. 2, it is a functional module diagram of a preferred embodiment of the BMC-based LED automated test system of the present invention.

The BMC-based LED automated test system 10 includes a read module 100, an analog module 101, an acquisition module 102, an inquiry module 103, a determination module 104, and a prompt module 105. The function of each module will be described in detail in conjunction with the flowchart of FIG.

FIG. 3 is a flow chart of a preferred embodiment of the BMC-based LED automated test method of the present invention.

In step S10, the reading module 100 reads all the materials in the LED management table from the database 200.

A one-dimensional priority integer array is created by the analog module 101 in this step. The index values of the array elements in the priority array are in one-to-one correspondence with the priority order in the LED management table in ascending order, and each event corresponds to one array element. It should be noted that the subscript values of each array element correspond to a priority order in the LED management table, and there may be multiple events in the same priority order. In this case, the multiple events correspond to the same array element. For example, the priority array priority [N+1], where N is the maximum value of the priority order in the LED management table. If N is 3, there are four array elements in the priority array, respectively, priority [0], priority [1] 】, priority [2], priority [3], then priority [0], priority [1], priority [2], priority [3] respectively correspond to the priority order is 0, the priority order is 1, the priority order is 2, priority An event with a sequence of 3. The analog module 101 sets the initial value of the first array element (i.e., priority [0]) in the priority array to 1, and the initial value of each of the remaining array elements is set to zero.

In step S12, the analog module 101 manages an event in the table according to a preset order analog LED.

The preset order is randomly set by the user, but it should be ensured that the event of the type de-alarm should be executed after the corresponding event of the type of alarm, and all events in the LED management table are executed. As shown in FIG. 4, the preset sequence may be: sequentially executing events in the LED management table in order from top to bottom, or other order.

It should be noted that, before the invention is invented, the original working mode is that when the server 1 has an event, the sensor that monitors the event detects the event and the sensor changes its value. In the present invention, a software method is used to analogously change the value of the sensor. When the analog module 101 is compared to an event in the LED management table, the analogy is the bad condition that occurs in the server 1. The analogy process is as follows: the analog module 101 uses a set sensor reading and event command (a command specified by the IPMI specification) to set a value of a sensor that monitors the event, the sensor The event setup command determines the value of the sensor based on the parameter information: the sensor identification code, the cause and type of the event. After that, the server 1 determines whether the temperature is normal according to the value of the sensor (such as whether the temperature is normal, whether the fan speed is normal, etc.) to obtain a determination result; the BMC 30 obtains the priority order corresponding to the event according to the determination result, and determines the server 1 The highest priority event exists in the middle, and the color and frequency of the LED 50 corresponding to the event with the highest priority is obtained, and the control signal is determined according to the color and frequency of the LED 50, and the control signal is sent to the LED 50.

In step S14, the acquisition module 102 acquires the current state of the LED 50 after a preset time interval. The preset time interval is determined by the performance of the server 1.

The acquisition module 102 acquires the current state of the LED 50 by detecting the BMC 30. When the analog module 101 is analogous to an event, the acquisition module 102 reads the control signal sent by the BMC 30 to the LED 50 through the GPIO, and determines the current state of the LED 50 according to the control signal. It should be noted that the acquisition module 102 updates the test flag of the analog event to the tested state, that is, the test flag is changed from 0 to 1.

When the analogy module 101 is analogous to the event (assuming that the event corresponds to a priority of m in the LED management table), the acquisition module 102 initializes the array element corresponding to the event (ie, priority [m] The operation of adding 1 is performed. When the event type of the analogy module 101 is the release alarm, the acquisition module 102 decrements the initial value of the array element corresponding to the event (ie, priority [m]).

In step S16, the query module 103 queries the LED management table for an ideal LED lighting condition.

The query module 103 reads the initial values of the array elements in the priority array from large to small according to the index value of the array elements until the initial value of the read array elements is non-zero, and obtains the subscript value of the non-zero array elements. . At this time, the query module 103 queries, in the LED management table, the color and frequency (such as yellow, 0) corresponding to the event whose priority order is the subscript value of the non-zero array element (eg, the priority order is 3), and the color and The frequency is the ideal LED lighting condition.

In step S18, the determining module 104 determines whether the current state of the LED 50 is the same as the queried LED lighting condition. When the current state of the LED 50 is different from the queried LED lighting condition, step S20 is performed; otherwise, step S22 is performed.

In step S20, the prompting module 105 prompts that the LED lighting condition corresponding to the event fails.

The information prompts of the LED lighting condition test failure corresponding to the event include: the queried LED lighting condition, the current state of the LED 50, the sensor corresponding to the event, and the prompt of the test failure.

In step S22, the determining module 104 determines whether all events have been analogized. When there is still no analogy of the event, step S24 is performed, otherwise, step S26 is performed.

The determining module 104 determines whether the test flags of all events in the LED management table are in a tested state. When all the test flags of the event are in the tested state, the determining module 104 determines that all events are analogously completed. Otherwise, the determining module 104 determines that there are still no analogies.

In step S24, the analog module 101 compares the next event in the table with the LEDs in a preset order, and returns to step S14.

In step S26, the prompting module 105 gives a test information prompt for the LED lighting condition corresponding to all events.

The test information prompts for LED lighting conditions corresponding to all events include: whether each event test is successful, the LED lighting condition that is queried when the event test is successful, the current status of LED50, the information prompt when the event test fails, and the event test fails. The number, the number of successful event tests, and so on.

In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. The above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited to the above-described embodiments, and equivalent modifications or variations made by those skilled in the art in light of the spirit of the present invention are It should be covered by the following patent application.

1. . . server

10. . . BMC-based LED automated test system

20. . . Storage device

200. . . database

30. . . BMC

40. . . display screen

50. . . led

100. . . Read module

101. . . Analog module

102. . . Get module

103. . . Query module

104. . . Judging module

105. . . Prompt module

S10. . . Read all the data in the LED management form from the database

S12. . . An event in the spreadsheet management table in a preset order

S14. . . Get the current state of the LED after a preset time interval

S16. . . Query the ideal LED lighting situation in the LED management form

S18. . . Is the current state of the LED the same as the LED lighting?

S20. . . Prompt that the LED lighting condition corresponding to the event failed.

S22. . . Whether all events are analogous

S24. . . Analog to the next event in the LED management table in a preset order

S26. . . Give test information prompts for LED lighting conditions corresponding to all events

1 is a block diagram of a preferred embodiment of a BMC-based LED automated test system of the present invention.

2 is a functional block diagram of a preferred embodiment of the BMC-based LED automated test system of the present invention.

3 is a flow chart of a preferred embodiment of the BMC-based LED automated test method of the present invention.

Fig. 4 is a view showing an example of an LED management table in the present invention.

S10. . . Read all the data in the LED management form from the database

S12. . . An event in the spreadsheet management table in a preset order

S14. . . Get the current state of the LED after a preset time interval

S16. . . Query the ideal LED lighting situation in the LED management form

S18. . . Is the current state of the LED the same as the LED lighting?

S20. . . Prompt that the LED lighting condition corresponding to the event failed.

S22. . . Whether all events are analogous

S24. . . Analog to the next event in the LED management table in a preset order

S26. . . Give test information prompts for LED lighting conditions corresponding to all events

Claims (12)

A BMC-based LED automated test method, wherein the method comprises the following steps:
Read step: read all the data in the LED management table from the database;
Analog step 1: According to an event in the preset order of the LED management table, the BMC controls the color and frequency of the LED during the analogy process;
Acquisition step: obtaining the current state of the LED after a preset time interval;
Query step: query the LED lighting condition in the LED management form;
Judgment step 1: Determine whether the current state of the LED is the same as the LED illumination condition. When the current state of the LED is the same as the LED illumination of the query, perform the judgment step 2. Otherwise, the LED corresponding to the event is highlighted. Lamp condition test failed;
Judgment Step 2: Determine whether all events have been analogized. When there are still events that are not analogous, perform analogy step two. Otherwise, give test information prompts for LED lighting conditions corresponding to all events;
Analog step 2: The next event in the table is managed analogously to the LEDs in a preset order and returned to the execution acquisition step. The BMC-based LED automated test method according to claim 1, wherein each column of the LED management table is a parameter information, and each row represents an event, and each row reflects an event. Information and LED lighting corresponding to the event. The BMC-based LED automated test method as described in claim 2, wherein the analogy step 1 implements an analogy of events by the following steps:
The value of the sensor that monitors the event is set using a sensor event setting command specified by the IPMI specification, the sensor event setting command determining the value of the sensor from the parameter information, the parameter information including the sensor Identification code, event reason and type. The method for automatically testing a BMC-based LED according to claim 1, wherein before the analogy step 1, the method further comprises:
Creating a one-dimensional priority array, the index values of the array elements in the priority array are in one-to-one correspondence with the priority order in the LED management table, and each event corresponds to one array element;
The initial value of the first array element in the priority array is set to 1, and the initial value of each of the remaining array elements is set to zero. The BMC-based LED automated test method of claim 4, wherein the obtaining step further comprises:
When the analog event type is an alarm, the initial value of the array element corresponding to the event is incremented by one;
When the analog event type is to release the alarm, the initial value of the array element corresponding to the event is decremented by 1. The method for automatically testing a BMC-based LED according to claim 5, wherein the querying step is performed by querying the LED lighting condition by the following steps:
Reading the initial value of the array element from large to small according to the index value of the array element until the initial value of the read array element is non-zero, and obtaining the subscript value of the non-zero array element;
The LED management table is queried for the color and frequency corresponding to the event whose priority order is the subscript value of the non-zero array element, and the color and frequency are ideal LED lighting conditions. A BMC-based LED automated test system, wherein the system includes:
a reading module for reading all the data in the LED management table from the database;
An analog module for analogizing an event in the LED management table in a preset order, the BMC controls the color and frequency of the LED during the analogy process;
Obtaining a module for acquiring a current state of the LED after a preset time interval;
Query module for querying the ideal LED lighting condition in the LED management table;
The determining module is configured to determine whether the current state of the LED is the same as the queried LED lighting condition;
The prompting module is configured to prompt the LED lighting condition corresponding to the event to fail when the current state of the LED is different from the queried LED lighting condition;
The determining module is further configured to determine whether all events have been analogized when the current state of the LED is the same as the queried LED lighting condition;
The analog module is further configured to compare the next event in the LED management table according to a preset order when there is still an event not analogy;
The prompting module is further configured to give a test information prompt for LED lighting conditions corresponding to all events when all events have been analogized. The BMC-based LED automated test system according to claim 7, wherein each column of the LED management table is a parameter information, and each row represents an event, and each row reflects an event. Information and LED lighting corresponding to the event. The BMC-based LED automated test system according to claim 8, wherein the analog module implements an analogy of events by the following steps:
The value of the sensor that monitors the event is set using a sensor event setting command specified by the IPMI specification, the sensor event setting command determining the value of the sensor from the parameter information, the parameter information including the sensor Identification code, event reason and type. The BMC-based LED automated test system of claim 7, wherein the analog module is further configured to:
Creating a one-dimensional priority array, the index values of the array elements in the priority array are in one-to-one correspondence with the priority order in the LED management table, and each event corresponds to one array element;
The initial value of the first array element in the priority array is set to 1, and the initial value of each of the remaining array elements is set to zero. The BMC-based LED automated test system of claim 10, wherein the acquisition module is further configured to:
When the analog event type is an alarm, the initial value of the array element corresponding to the event is incremented by one;
When the analog event type is to release the alarm, the initial value of the array element corresponding to the event is decremented by 1. The BMC-based LED automated test system of claim 11, wherein the query module performs the query of the LED lighting condition by the following steps:
Reading the initial value of the array element from large to small according to the index value of the array element until the initial value of the read array element is non-zero, and obtaining the subscript value of the non-zero array element;
The LED management table is queried for the color and frequency corresponding to the event whose priority order is the subscript value of the non-zero array element, and the color and frequency are ideal LED lighting conditions.