CN113237842A - Fourier infrared spectrometer sample rack and using method - Google Patents
Fourier infrared spectrometer sample rack and using method Download PDFInfo
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- CN113237842A CN113237842A CN202110449247.1A CN202110449247A CN113237842A CN 113237842 A CN113237842 A CN 113237842A CN 202110449247 A CN202110449247 A CN 202110449247A CN 113237842 A CN113237842 A CN 113237842A
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- test
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- infrared spectrometer
- fourier infrared
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- 238000000034 method Methods 0.000 title claims abstract description 13
- 238000012360 testing method Methods 0.000 claims abstract description 108
- 238000002360 preparation method Methods 0.000 claims abstract description 4
- 238000006243 chemical reaction Methods 0.000 abstract description 2
- 230000000694 effects Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
- G01N2021/3572—Preparation of samples, e.g. salt matrices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
Abstract
A sample holder of a Fourier infrared spectrometer and a using method thereof relate to a sample holder of a Fourier infrared spectrometer. The invention aims to solve the problems that in the prior art, the position point of outgoing light rays changes, the propagation path of the outgoing light rays changes, and finally the test result is possibly inaccurate. The device comprises the following steps: the tool base is provided with two support columns in a sliding mode, the linear ends of the two protractors are fixedly mounted on the two support columns respectively, the bottoms of the two test sample supports are connected to the two support columns in a rotating mode respectively, and the two test samples are inserted into the two test sample supports respectively. The method comprises the following steps: firstly, stably installing and placing a tool base in a working condition or environment required by testing; step two, adjusting the test oblique incidence angle by rotating the two test sample supports, wherein the angle value can be read by a protractor; placing the two test samples on the two supports according to the symmetry requirement; and step four, after the preparation is finished, starting the test. The invention is used for light path conversion.
Description
Technical Field
The invention relates to the field of light path conversion devices, in particular to a Fourier infrared spectrometer sample holder and a using method thereof.
Background
The fourier infrared spectrometer is an infrared spectrometer developed based on the principle of fourier transform of infrared light after interference, and is one of the most important methods for infrared optical testing. However, the conventional fourier infrared spectrometer can only test a vertically incident optical sample, and when a sample is subjected to an oblique incidence test, a light path is deviated due to a refraction effect, so that light intensity in a detector is changed, and correct judgment of transmittance is seriously affected.
In summary, the position of the incident light varies and the propagation path of the incident light changes, which may lead to inaccurate test results.
Disclosure of Invention
The invention provides a Fourier infrared spectrometer sample frame and a using method thereof, and solves the problems that in the prior art, the position point of incident light changes, the propagation path of the emergent light changes, and the final test result may be inaccurate.
The technical scheme of the invention is as follows:
a Fourier infrared spectrometer sample holder, characterized by: the device comprises a tool base, two protractors, two test sample supports and two support columns;
the tool base is provided with two supporting columns in a sliding mode, the linear ends of the two protractors are fixedly mounted on the two supporting columns respectively, the two protractors are arranged in a mirror image mode in the vertical direction, the bottoms of the two test sample supports are connected to the two supporting columns in a rotating mode respectively, the two test sample supports are arranged in a mirror image mode in the vertical direction, the two test samples are respectively inserted into the two test sample supports, and the two test samples are arranged in a mirror image mode in the vertical direction.
A use method of a sample holder of a Fourier infrared spectrometer is characterized by comprising the following steps: it comprises the following steps
Firstly, stably installing and placing a tool base in a working condition or environment required by testing;
rotating the two test sample supports by adjusting the tightness of the second bolt to adjust the oblique incidence angle required by the test;
placing the two test samples on the two test sample supports according to the symmetry requirement, and screwing a first bolt to tightly push the test samples to form a complete test system;
and step four, after the preparation is finished, starting the test, and realizing the test of different oblique incidence angles by repeating the step two and the step three until the incident path is the same as the emergent path, thereby completing the inclination angle debugging of the Fourier infrared spectrometer sample.
Compared with the prior art, the invention has the following effects:
the invention adopts two test samples symmetrically placed on two test sample supports for simultaneous test, ensures that the light propagation path can not be changed before and after passing through the samples, can effectively ensure the stability of the light propagation path in the test process, ensures that the emergent light propagation path passing through the test system is always consistent with the incident light propagation path, and the emergent light path only changes along with the change of the incident light path and is irrelevant to the oblique incident angle. That is, as long as the incident path is determined once, no matter how the oblique incident angle is changed, the emergent path is not changed. The method can effectively avoid inaccurate test caused by the change of the light propagation path and the instability of the light path, and improves the stability and the accuracy of the test.
Drawings
FIG. 1 is a front view of the present invention;
FIG. 2 is a front view of the present test specimen holder;
FIG. 3 is a cross-sectional view A-A of FIG. 2;
FIG. 4 is a perspective view of a test specimen holder;
FIG. 5 is a rear view of the test specimen holder;
FIG. 6 is a side view of a test specimen holder;
FIG. 7 is a schematic view of a test sample when it is externally coated;
FIG. 8 is a schematic view of a test specimen when coated on the inside;
Detailed Description
The first embodiment is as follows: the present embodiment is described with reference to fig. 1 to 8, and the fourier infrared spectrometer sample holder of the present embodiment includes a tool base 1, two protractors 2, two test sample holders 3, and two support columns 5;
two support columns 5 are arranged above the tool base 1 in a sliding mode, the linear ends of the two protractors 2 are fixedly mounted on the two support columns 5 respectively, the two protractors 2 are arranged in a mirror image mode in the vertical direction, the bottoms of the two test sample supports 3 are connected to the two support columns 5 in a rotating mode respectively, the two test sample supports 3 are arranged in a mirror image mode in the vertical direction, the two test samples 4 are inserted into the two test sample supports 3 respectively, and the two test samples 4 are arranged in a mirror image mode in the vertical direction.
The second embodiment is as follows: referring to fig. 1 to 8, the present embodiment is described, in which a first through hole 3-1 is formed above one side end surface of a test sample holder 3, a second through hole 3-2 is formed above the other side end surface of the test sample holder 3, the size of the second through hole 3-2 is smaller than that of the first through hole 3-1, and inverted U-shaped through holes are formed below both sides of the test sample holder 3. The first through-hole 3-1 is sized to match the size of the test sample 4. The size of the through hole on the test sample support 3 is different, so that the test sample 4 is clamped on the test sample support 3. The rest is the same as the first embodiment.
The third concrete implementation mode: referring to fig. 1 to 8, the present embodiment further includes two first bolts 6, each first bolt 6 is screwed to the top end face of each test sample holder 3, and the test sample 4 on the test sample holder 3 is tightly pressed by screwing the first bolt 6. The arrangement is that the test sample 4 is fastened on the test sample support 3, and the test sample 4 is prevented from moving, so that the test accuracy is reduced. The other embodiments are the same as the first or second embodiment.
The fourth concrete implementation mode: the embodiment is described with reference to fig. 1 to 8, and the embodiment further includes a slide rail 7, and the slide rail 7 is disposed between the tool base 1 and the support column 5. So set up and make support column 5 slip about on frock base 1, and then adjust the position of test sample 4. The others are the same as the first, second or third embodiments.
The fifth concrete implementation mode: referring to fig. 1 to 8, the present embodiment is described, two mounting holes 3-3 are formed at the bottom end of the test sample holder 3 of the present embodiment, and the mounting holes on the test sample holder 3 are in threaded connection with the supporting column 5 through the second bolts 8. The arrangement is that the test sample support 3 is rotated by adjusting the tightness of the bolt, so as to adjust the angle displayed by the test sample support 3 in the protractor. The others are the same as the first, second, third or fourth embodiments.
The sixth specific implementation mode: the present embodiment will be described with reference to fig. 1 to 8, and a method of using a sample holder for a fourier infrared spectrometer according to the present embodiment is characterized in that: it comprises the following steps
Firstly, stably installing and placing a tool base 1 in a working condition or environment required by a test;
step two, rotating the two test sample supports 3 by adjusting the tightness of the second bolt 8 to adjust the oblique incidence angle required by the test;
placing two test samples 4 on two test sample supports 3 according to the symmetry requirement, and screwing a first bolt 6 to tightly push the test samples 4 to form a complete test system;
and step four, after the preparation is finished, starting the test, and realizing the test of different oblique incidence angles by repeating the step two and the step three until the incident path is the same as the emergent path, thereby completing the inclination angle debugging of the Fourier infrared spectrometer sample.
The other embodiments are the same as the first, second, third, fourth or fifth embodiments.
The seventh embodiment: in the embodiment, the surface treatments such as coating are performed on the material of the test sample 4, and it should be ensured that the sides having the same treatment process are opposite or reverse, that is, the test sample 4 must be placed to ensure that the two samples have mirror symmetry, and the coated side should be located on the inner side or the outer side when the test sample 4 is a coated sample. The arrangement ensures that the two samples have completely opposite effects on the refraction of light. The other embodiments are the same as the first, second, third, fourth, fifth or sixth embodiments.
The working principle is as follows:
when incident light irradiates the surface of the test sample 4, because the media on the two sides of the incident interface are different, the light is refracted inside the test sample 4 after entering the test sample 4, the original propagation path is changed, when the light reaches the interface on the other side again, the light is refracted again after leaving the test sample 4 due to the media on the two sides of the interface, the propagation path is changed again, after twice refraction at the two interfaces, the propagation path of the light is deviated from the initial incident light by a certain distance, and the propagation direction is still kept unchanged. For the same reason, when the light passes through a sample which is mirror symmetric with respect to the previous position of the test sample 4 again, the light is also refracted twice at the two interfaces, resulting in a change of the propagation path, but the path change direction is exactly opposite to that when passing through the first test sample 4. Therefore, the light rays return to the initial propagation path consistent with the incident light rays again, the path of the light rays is guaranteed not to be changed after the light rays pass through the system, when the incident angle is changed, the propagation paths of the light rays passing through the tooling system are always consistent, and the propagation path of the emergent light rays cannot be deviated and changed along with the change of the angle.
The present invention has been described in terms of the preferred embodiments, but it is not limited thereto, and any simple modification, equivalent change and modification made to the above embodiments according to the technical spirit of the present invention will still fall within the technical scope of the present invention.
Claims (6)
1. A Fourier infrared spectrometer sample holder, characterized by: the device comprises a tool base (1), two protractors (2), two test sample supports (3) and two support columns (5);
two support columns (5) are arranged above the tool base (1) in a sliding mode, the straight line ends of the two protractors (2) are fixedly mounted on the two support columns (5) respectively, the two protractors (2) are arranged in a mirror image mode in the vertical direction, the bottoms of the two test sample supports (3) are connected to the two support columns (5) in a rotating mode respectively, the two test sample supports (3) are arranged in a mirror image mode in the vertical direction, the two test samples (4) are inserted into the two test sample supports (3) respectively, and the two test samples (4) are arranged in a mirror image mode in the vertical direction.
2. A sample holder for a fourier infrared spectrometer as recited in claim 1, wherein: a first through hole (3-1) is machined above the end face of one side of the test sample support (3), a second through hole (3-2) is machined above the end face of the other side of the test sample support (3), the size of the second through hole (3-2) is smaller than that of the first through hole (3-1), and inverted U-shaped through holes are machined below the two sides of the test sample support (3).
3. A sample holder for a fourier infrared spectrometer as recited in claim 1, wherein: the test device is characterized by further comprising two first bolts (6), each first bolt (6) is in threaded connection with the top end face of each test sample support (3), and the test samples (4) on the test sample supports (3) are tightly jacked through screwing the first bolts (6).
4. A sample holder for a fourier infrared spectrometer as recited in claim 1, wherein: it still includes slide rail (7), and slide rail (7) set up between frock base (1) and support column (5).
5. A sample holder for a fourier infrared spectrometer as recited in claim 2, wherein: two mounting holes (3-3) are processed at the bottom end of the test sample support (3), and the mounting holes in the test sample support (3) are in threaded connection with the supporting columns (5) through second bolts (8).
6. A method of using a sample holder of a fourier infrared spectrometer as claimed in any of claims 1 to 7, wherein: it comprises the following steps
Firstly, stably installing and placing a tool base (1) in a working condition or environment required by a test;
rotating the two test sample supports (3) by adjusting the tightness of the second bolt (8) to adjust the oblique incidence angle required by the test;
placing the two test samples (4) on the two test sample supports (3) according to the symmetry requirement, and screwing a first bolt (6) to tightly push the test samples (4) to form a complete test system;
and step four, after the preparation is finished, starting the test, and realizing the test of different oblique incidence angles by repeating the step two and the step three until the incident path is the same as the emergent path, thereby completing the inclination angle debugging of the Fourier infrared spectrometer sample.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110449247.1A CN113237842A (en) | 2021-04-25 | 2021-04-25 | Fourier infrared spectrometer sample rack and using method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110449247.1A CN113237842A (en) | 2021-04-25 | 2021-04-25 | Fourier infrared spectrometer sample rack and using method |
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| CN113237842A true CN113237842A (en) | 2021-08-10 |
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| CN202110449247.1A Pending CN113237842A (en) | 2021-04-25 | 2021-04-25 | Fourier infrared spectrometer sample rack and using method |
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Application publication date: 20210810 |