CN113219249A - Contact resistance test system based on LabVIEW - Google Patents
Contact resistance test system based on LabVIEW Download PDFInfo
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- CN113219249A CN113219249A CN202110397143.0A CN202110397143A CN113219249A CN 113219249 A CN113219249 A CN 113219249A CN 202110397143 A CN202110397143 A CN 202110397143A CN 113219249 A CN113219249 A CN 113219249A
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- 238000012360 testing method Methods 0.000 title claims abstract description 117
- 238000004891 communication Methods 0.000 claims abstract description 5
- 238000005259 measurement Methods 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 10
- 238000007726 management method Methods 0.000 claims description 6
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 6
- 230000002159 abnormal effect Effects 0.000 claims description 3
- 238000007405 data analysis Methods 0.000 claims description 3
- 238000013523 data management Methods 0.000 claims description 3
- 229910052697 platinum Inorganic materials 0.000 claims description 3
- 239000004973 liquid crystal related substance Substances 0.000 abstract description 3
- 238000013500 data storage Methods 0.000 description 3
- 238000010998 test method Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 230000003750 conditioning effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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Abstract
The invention discloses a contact resistance testing system based on LabVIEW, which comprises a contact resistance testing system, wherein a testing board card and a testing system are arranged on the contact resistance testing system, a constant current source, an AD collector, a control switch and an RS232 interface are arranged on the testing board card, an RS232 interface, a CPU, a window communication module, a testing controller, a database memory, a data processor and a display module are arranged on the testing system, a VGA interface, a USB interface and an RJ45 interface are arranged on the edge of one side of the testing system, the VGA interface is connected with a liquid crystal display, and the USB interface is connected with a keyboard and a mouse.
Description
Technical Field
The invention relates to the technical field of industrial relay testing, in particular to a contact resistance testing system based on LabVIEW.
Background
The reliability of electronic products is fundamentally determined by the quality of components, the resistor is one of the most widely used components, the test work of the resistor is normalized, and the GB/T5729 and 2003 fixed resistor for electronic equipment and the Q/GDW11179.3 technical specification of components for electric energy meter are part 3: resistor element standards all specify resistor test methods. As the surface mount technology develops, the chip resistor gradually replaces the lead resistor, and the chip resistor has an inconvenience in testing due to its small size.
Disclosure of Invention
The invention aims to provide a contact resistance testing system based on LabVIEW, which solves the problems in the background technology.
In order to achieve the purpose, the invention provides the following technical scheme: a contact resistance test system based on LabVIEW comprises a contact resistance test system and is characterized in that: the contact resistance testing system is provided with a testing board card and a testing system, the testing board card is provided with a control switch, an AD collector and a constant current source, the control switch, the AD collector and the constant current source are respectively connected with the PFGA, an RS232 interface is arranged at the edge of one side of the test board card, a window communication module, a test controller, a database memory, a data processor, a display module and a CPU are arranged on the contact resistance test system, the edge of one side of the test system is provided with an RS232 interface, the edge of the other side of the test system is provided with a VGA interface, a USB interface and an RJ45 interface, the VGA interface is connected with a liquid crystal screen, the USB interface is connected with a keyboard and a mouse, the test board card and the test system are connected with 220V voltage, the contact resistance testing system comprises user management, parameter configuration, automatic testing, data analysis, data query, alarm and fault items after the initialization is successful.
Preferably, the contact resistance testing system is provided with a testing interface, and the testing interface is connected with the contact resistance.
Preferably, the contact resistance test system is used for user online login in user management, login and registration are carried out, user data are stored after login, the user database is updated in time, and the system generates a user data table from the user data.
Preferably, the system on the contact resistance test system enters parameter configuration to store the system configuration, and simultaneously, the system configuration is tested, the tested data is generated into a data table, and finally, the tested data and the generated data table are displayed.
Preferably, the system realizes data acquisition, processes and stores the acquired data, generates a data table by the processed and stored data and displays the data table on a display section, and stops data acquisition and generates a report by the acquired and processed data if an alarm prompt appears in the display process.
Preferably, the system in the data query on the contact resistance test system can perform log query, data management and platinum record query.
Preferably, when the system on the contact resistance testing system gives an alarm and prompts a fault, the system records the alarm times and displays the key information of fault alarm.
Preferably, the contact resistance test process comprises the steps of:
A. initializing after the system is started, and performing self-checking after the initialization is completed
B. When all the systems are normal after the self-checking is passed, the relay to be tested is accessed;
C. the method comprises the steps of testing after the relay is connected, testing products after the relay is connected, determining whether the serial number of the products is correct after the products are detected to be installed correctly, re-inputting the sequence of the products to measure again when the serial number of the products is abnormal, measuring the resistance value of the resistor when the serial number of the products is normal, storing the measured resistance value of the resistor after the measurement is finished, and finishing the measurement.
Compared with the prior art, the invention has the beneficial effects that:
(1) the test board card is used for controlling the on-off of the relay, receiving the measurement data processed by the signal conditioning circuit and sending the measurement data to the embedded industrial computer, and the embedded industrial computer calculates, analyzes, judges, stores and displays the measurement data;
(2) the test system has the advantages of real-time monitoring, calculation, analysis and display, real-time data storage capacity, greatly improved test efficiency, stability and accuracy compared with a common test method, and greatly reduced system complexity and cost.
Drawings
FIG. 1 is a schematic diagram of a contact resistance test system according to the present invention;
FIG. 2 is a functional diagram of a test system according to the present invention;
FIG. 3 is a flow chart of the test system of the present invention.
In the figure: 1. a contact resistance test system; 2. testing the board card; 3. a constant current source; 4. an AD collector; 5. a control switch; 6. a test interface; 7. a contact resistance; 8. an RS232 interface; 9. a CPU; 10. a window communication module; 11. a test controller; 12. a database memory; 13. a data processor; 14. a display module; 15. and (6) testing the system.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-3, the present invention provides a technical solution: a contact resistance test system based on LabVIEW comprises a contact resistance test system 1, wherein a test board card 2 and a test system 15 are arranged on the contact resistance test system 1, a control switch 5, an AD collector 4 and a constant current source 3 are arranged on the test board card 2, the control switch 5, the AD collector 4 and the constant current source 3 are respectively connected with a PFGA (pulse frequency generation and generation), an RS232 interface 8 is arranged at the edge of one side of the test board card 2, a window communication module 10, a test controller 11, a database memory 12, a data processor 13, a display module 14 and a CPU9 are arranged on the test system 15, an RS232 interface 8 is arranged at the edge of one side of the test system 15, a VGA interface, a USB interface and an RJ45 interface are arranged at the edge of the other side of the test system 15, the VGA interface is connected with a liquid crystal display screen, the USB interface is connected with a keyboard and a mouse, the test board card 2 and the test system 15 are connected with 220V voltage, the test board card 2 is used for controlling the on-off of a relay, receiving the measurement data processed by a signal conditioning circuit and sending the measurement data to an embedded industrial computer, the embedded industrial computer calculates, analyzes, judges, stores and displays the measured data, and the contact resistance testing system 1 comprises user management, parameter configuration, automatic testing, data analysis, data query, alarm and fault items after the initialization is successful.
The contact resistance testing system 1 is provided with a testing interface 6, and the testing interface 6 is connected with a contact resistance 7.
The contact resistance test system 1 logs in a user line in user management, registers the user line after logging in, stores user data after logging in, updates a user database in time, and generates the user data into a user data table.
And the system on the contact resistance testing system 1 enters parameter configuration to store the system configuration, tests the system configuration at the same time, generates the tested data into a data table, and finally displays the tested data and the generated data table.
The system realizes data acquisition, processes and stores acquired data, generates a data table by the processed and stored data and displays the data table on a display section, and stops data acquisition and generates a report by the acquired and processed data if an alarm prompt appears in the display process.
The system in the data query on the contact resistance test system 1 can perform log query, data management and platinum record query.
When the system on the contact resistance testing system 1 alarms and prompts faults, the system records alarm times and simultaneously displays key information of fault alarm, when the contact resistance testing system based on LabVIEW tests the contact resistance, the system is initialized after being started, the system performs self-checking after initialization is completed, all the parts of the system are normal after the self-checking is passed, a relay to be tested is accessed at the moment, the testing is performed after the relay is accessed, the product is tested after the relay is accessed and the test is performed without problems, whether the product serial number is correct or not is confirmed after the product is correctly installed is detected, when the serial number of the product is detected to be abnormal, the sequence of the product is re-input to perform measurement again, when the product serial number is normal, the resistance of the resistor is measured, after the measurement is completed, the measured resistance is subjected to data storage, and the measurement is completed.
The test system has the advantages of real-time monitoring, calculation, analysis and display, real-time data storage capacity, greatly improved test efficiency, stability and accuracy compared with a common test method, and greatly reduced system complexity and cost.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (8)
1. A contact resistance test system based on LabVIEW, comprising a contact resistance test system (1), characterized in that: be equipped with test integrated circuit board (2) and test system (15) on contact resistance test system (1), be equipped with control switch (5), AD collector (4), constant current source (3) on test integrated circuit board (2), control switch (5), AD collector (4), constant current source (3) are connected with PFGA respectively, one side edge of test integrated circuit board (2) is equipped with RS232 interface (8), be equipped with window communication module (10), test controller (11), database memory (12), data processor (13), display module (14) and CPU (9) on test system (15), one side edge of test system (15) is equipped with RS232 interface (8), and the opposite side edge of test system (15) is equipped with VGA interface, USB interface, RJ45 interface, VGA interface connection LCD screen, USB interface connection keyboard, mouse, test system (2) and test system (15) access 220V voltage, the contact resistance testing system (1) comprises user management, parameter configuration, automatic testing, data analysis, data query, alarm and fault items after the initialization is successful.
2. The LabVIEW-based contact resistance testing system as claimed in claim 1, wherein: the contact resistance testing system (1) is provided with a testing interface (6), and the testing interface (6) is connected with a contact resistance (7).
3. The LabVIEW-based contact resistance testing system as claimed in claim 1, wherein: the contact resistance testing system (1) is used for logging in a user line in user management, registering is carried out after logging in, user data is stored after logging in, a user database is updated in time by the database, and the system generates a user data table from the user data.
4. The LabVIEW-based contact resistance testing system as claimed in claim 1, wherein: and the system on the contact resistance testing system (1) enters parameter configuration to store the system configuration, simultaneously tests the system configuration, generates a data table from the tested data, and finally displays the tested data and the generated data table.
5. The LabVIEW-based contact resistance testing system as claimed in claim 1, wherein: the contact resistance testing system (1) automatically tests application parameters in the system, the system realizes data acquisition, processes and stores acquired data, generates a data table by the processed and stored data and displays the data table on a display section, and if an alarm prompt appears in the display process, the system stops data acquisition and generates a report by the acquired and processed data.
6. The LabVIEW-based contact resistance testing system as claimed in claim 1, wherein: the system in the data query of the contact resistance test system (1) can perform log query, data management and platinum record query.
7. The LabVIEW-based contact resistance testing system as claimed in claim 1, wherein: when the system on the contact resistance testing system (1) gives an alarm and prompts faults, the system records the alarm times and displays the key information of fault alarm.
8. The contact resistance testing system based on LabVIEW is realized, and the contact resistance testing process comprises the following steps:
A. initializing after the system is started, and performing self-checking after the initialization is completed
B. When all the systems are normal after the self-checking is passed, the relay to be tested is accessed;
C. the method comprises the steps of testing after the relay is connected, testing products after the relay is connected, determining whether the serial number of the products is correct after the products are detected to be installed correctly, re-inputting the sequence of the products to measure again when the serial number of the products is abnormal, measuring the resistance value of the resistor when the serial number of the products is normal, storing the measured resistance value of the resistor after the measurement is finished, and finishing the measurement.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110397143.0A CN113219249A (en) | 2021-04-13 | 2021-04-13 | Contact resistance test system based on LabVIEW |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110397143.0A CN113219249A (en) | 2021-04-13 | 2021-04-13 | Contact resistance test system based on LabVIEW |
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| CN113219249A true CN113219249A (en) | 2021-08-06 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103163380A (en) * | 2013-03-27 | 2013-06-19 | 西南交通大学 | Micro-ohm resistance measurement system based on LabVIEW developing platform |
| CN203630224U (en) * | 2013-09-12 | 2014-06-04 | 陕西航天导航设备有限公司 | Conductive device dynamic contact resistance test apparatus |
| CN210347864U (en) * | 2019-07-26 | 2020-04-17 | 北京广利核系统工程有限公司 | Automatic checking device for key characteristics of nuclear-grade commercial item relay |
| CN112067989A (en) * | 2020-09-29 | 2020-12-11 | 国网北京市电力公司 | High-speed train electromagnetic contactor test system |
-
2021
- 2021-04-13 CN CN202110397143.0A patent/CN113219249A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103163380A (en) * | 2013-03-27 | 2013-06-19 | 西南交通大学 | Micro-ohm resistance measurement system based on LabVIEW developing platform |
| CN203630224U (en) * | 2013-09-12 | 2014-06-04 | 陕西航天导航设备有限公司 | Conductive device dynamic contact resistance test apparatus |
| CN210347864U (en) * | 2019-07-26 | 2020-04-17 | 北京广利核系统工程有限公司 | Automatic checking device for key characteristics of nuclear-grade commercial item relay |
| CN112067989A (en) * | 2020-09-29 | 2020-12-11 | 国网北京市电力公司 | High-speed train electromagnetic contactor test system |
Non-Patent Citations (7)
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