CN113203741B - Opposite lighting transparent panel flaw detection method - Google Patents

Opposite lighting transparent panel flaw detection method Download PDF

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Publication number
CN113203741B
CN113203741B CN202110501445.8A CN202110501445A CN113203741B CN 113203741 B CN113203741 B CN 113203741B CN 202110501445 A CN202110501445 A CN 202110501445A CN 113203741 B CN113203741 B CN 113203741B
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panel
light
camera
light rays
light sources
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CN113203741A (en
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朱仁杰
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Suzhou Zhonglian Intelligent Technology Co ltd
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Suzhou Zhonglian Intelligent Technology Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features

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  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
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  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The invention provides a flaw detection method for a transparent panel with opposite illumination, which comprises the following steps: the camera faces the panel to be detected, the distance between the camera and the panel to be detected is adjusted, and the focal length and the aperture of the camera are adjusted to enable the imaging to be clear; placing the oppositely-arranged illuminating light sources on the front side and the back side of the panel to be detected, and overlapping, wherein the oppositely-arranged illuminating light sources are positioned outside the field of vision of the camera; lighting the opposed illumination light sources, wherein when a part of light rays meet the panel, the direction of the light rays is changed and the light rays are transmitted to the periphery along the panel, other light rays are reflected among the opposed illumination light sources for multiple times and finally the direction of the light rays is changed and the light rays are transmitted to the periphery along the panel, the light rays are transmitted to each surface of the panel through the interior of the panel, but the light rays cannot be directly emitted into the camera from the light sources; the flaws on the panel are irradiated by the light field inside the panel, and the generated scattered light enters the camera to form an image with higher contrast for flaw detection. The detection method can improve the detection efficiency and stability.

Description

Opposite lighting transparent panel flaw detection method
Technical Field
The invention relates to a method for detecting flaws of oppositely-arranged lighting transparent panels, and belongs to the technical field of panel processing.
Background
Currently, in the transparent panel processing process, flaws on the transparent panel, such as scratches, broken edges, etc. on the glass panel, may be very fine. Whether the quality inspector faces the light source or faces away from the light source, the defects can be found only from a certain observation angle, and the observation angle for finding each defect can be different, which means that the observation angle and the light source arrangement on the detection station cannot be determined in advance.
The existing automatic detection station adopts a method of arranging a plurality of camera stations at different observation angles or arranging a plurality of light sources at different positions and in different directions so as to improve the probability of meeting a proper observation angle. However, such an arrangement is complicated and cannot take into account every possible shooting or illumination angle, so that missing inspection may still occur due to inappropriate angles, resulting in an increase in defective products.
Therefore, there is a need to design a new method for detecting flaws in oppositely illuminated transparent panels to overcome the above problems.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a method for detecting the flaws of the oppositely-arranged illuminating transparent panel, which can reduce camera positions and illuminating light sources on an automatic detection station and improve the detection efficiency and stability; the device can also be applied to manual detection stations to improve the detection efficiency and stability.
The invention is realized in the following way:
the invention provides a flaw detection method for a transparent panel with opposite illumination, which comprises the following steps:
the method comprises the following steps: the camera faces the panel to be detected, the distance between the camera and the panel to be detected is adjusted, and the focal length and the aperture of the camera are adjusted to enable the imaging to be clear;
step two: placing the oppositely-arranged illumination light sources on the front side and the back side of the panel to be detected, and overlapping, wherein the oppositely-arranged illumination light sources are positioned outside the field of vision of the camera;
step three: lighting the opposed illumination light sources, wherein when a part of light rays meet the panel, the direction of the light rays is changed and the light rays are transmitted to the periphery along the panel, other light rays are reflected among the opposed illumination light sources for multiple times and finally the direction of the light rays is changed and the light rays are transmitted to the periphery along the panel, the light rays are transmitted to each surface of the panel through the interior of the panel, but the light rays cannot be directly emitted into the camera from the light sources;
step four: the flaws on the panel are irradiated by the light field inside the panel, and the generated scattered light enters the camera to form an image with higher contrast for flaw detection.
Preferably, the opposed illumination light source comprises two independent light sources, and the two independent light sources have the same structure and are symmetrically arranged along the panel to be detected.
Preferably, the independent light source comprises a shell, a reflective coating, a sealing rubber strip and a plurality of light emitting diodes; the casing includes a recess, reflective coating lays in the inner wall of recess, emitting diode install in the recess, joint strip set up in the periphery side of recess.
Preferably, a plurality of the light emitting diodes are arranged in a matrix.
Preferably, the sealing rubber strip is partially positioned in the shell and partially protrudes out of the surface of the shell.
Preferably, the vertical distance from the end of the sealing rubber strip to the bottom of the groove is larger than the vertical distance from the end of the light emitting diode to the bottom of the groove.
The invention has the following beneficial effects:
the invention provides a method for detecting flaws of a transparent panel with opposed illumination, which adopts a novel opposed illumination mode, can enable light rays to enter the transparent panel, and then illuminates the flaws on the panel from the inside of the transparent panel; the camera position and the illumination light source on the automatic detection station can be reduced, and the detection efficiency and stability can be improved; the device can also be applied to manual detection stations to improve the detection efficiency and stability.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the description of the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without inventive labor.
FIG. 1 is a schematic diagram of an opposed illumination source for transparent panel defect detection according to an embodiment of the present invention;
FIG. 2 is a cross-sectional view of an individual light source of an opposed illumination source provided by an embodiment of the present invention;
fig. 3 is a schematic structural diagram of an independent light source of an opposed illumination light source provided in an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.
In the description of the present embodiment, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings or orientations or positional relationships that the products of the invention are usually placed in when used, and are only used for convenience of describing the invention and simplifying the description, but do not indicate or imply that the devices or elements that are referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
Furthermore, the terms "horizontal", "vertical", "overhang" and the like do not imply that the components are required to be absolutely horizontal or overhang, but may be slightly inclined. For example, "horizontal" merely means that the direction is more horizontal than "vertical" and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.
In the description of the present embodiment, it should also be noted that, unless explicitly stated or limited otherwise, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in this particular embodiment may be specifically understood by those of ordinary skill in the art.
As shown in fig. 1 to 3, the present invention provides a method for detecting a defect in an oppositely illuminated transparent panel, comprising the following steps:
the method comprises the following steps: the camera 100 faces the panel 200 to be detected (the panel 200 is a transparent panel, such as glass, plexiglass, or other transparent and translucent medium, which enables light to be transmitted from the inside), the distance between the camera 100 and the panel 200 to be detected is adjusted, and the focal length and aperture of the camera 100 are adjusted to make the image thereof clear.
Step two: the opposed illumination light sources 300 are placed on the front and back of the panel 200 to be detected and are overlapped, and the opposed illumination light sources 300 are located outside the field of view of the camera 100. That is, the opposed illumination light sources 300 are disposed to overlap and are respectively disposed on the front and back sides of the panel 200 to be inspected, so that light emitted from the light sources can be reflected back and forth between the opposed illumination light sources 300. In the preferred embodiment, the opposed illumination light source 300 includes two independent light sources, which have the same structure and are symmetrically disposed along the panel 200 to be detected. The opposed illumination light source 300 should be disposed out of the field of view of the camera 100 to prevent the light from the opposed illumination light source 300 from entering the lens of the camera 100, thereby affecting the detection accuracy.
Step three: when the opposed illumination light sources 300 are turned on, a part of light rays changes direction and transmits along the panel 200 to the periphery when meeting the panel 200, other light rays are reflected among the opposed illumination light sources for multiple times and finally change direction and transmit along the panel 200 to the periphery, the light rays are transmitted to each surface of the panel 200 through the inside of the panel 200, but the light rays cannot be directly emitted into the camera 100 from the light sources. Specifically, the light emitted from the opposed illumination light sources 300 partially enters the panel 200 and then is emitted along the panel 200 to the periphery, and other light is reflected and refracted multiple times between the opposed illumination light sources and finally still enters the panel 200 and is transmitted to all surfaces of the panel 200. But the light itself does not enter the camera 100 in between.
Step four: the flaws on the panel 200 to be detected are irradiated by the light field inside the panel 200, and the generated scattered light enters the camera 100 to form an image with higher contrast for flaw detection, so that the detection is more convenient and accurate; the defects on the panel 200 are clearly revealed, and the defects can be judged without observing from a specific angle.
As shown in fig. 1 to 3, the independent light source preferably includes a housing 1, a reflective coating 2, a sealing rubber strip 5, a plurality of light emitting diodes 3, and a power cord 4 connecting the light emitting diodes 3 with an external power supply device so as to be able to provide electric power.
As shown in fig. 1 to 3, the housing 1 includes a recess (not numbered) and the light reflecting coating 2 is disposed on an inner wall of the recess, the light emitting diode 3 is mounted in the recess, and the sealing rubber strip 5 is disposed on an outer circumferential side of the recess. The bottom level of recess sets up, and reflection of light coating 2 sets up in the bottom of recess and surveys all around, realizes recess inner wall full coverage for improve reflection of light efficiency.
As shown in fig. 1 to 3, preferably, the sealing rubber strip 5 is partially located in the housing 1 and partially protrudes from the surface of the housing 1; namely, the sealing rubber strip 5 is fixed in the shell 1 around the groove, and meanwhile, part of the sealing rubber strip protrudes out of the shell 1 and is higher than the end face where the groove is located. The vertical distance from the end part of the sealing rubber strip 5 to the bottom of the groove is larger than the vertical distance from the end part of the light-emitting diode 3 to the bottom of the groove, so that the use convenience and the sealing effect are ensured. In the preferred embodiment, the light emitting diodes 3 are arranged in a matrix.
As shown in fig. 1 to 3, during detection, the end of the sealing rubber strip 5 is tightly attached to the panel 200 to be detected, the sealing rubber strip 5 is made of an opaque material, and the light of the light emitting diode 3 cannot be transmitted out of the sealing rubber strip 5.
As shown in fig. 1 to 3, the independent light sources disposed on the upper side and the lower side of the panel 200 to be detected are symmetrically disposed; the groove of the independent light source on the upper side is opened downwards, and the groove of the independent light source on the lower side is opened upwards, so that the light emitting diode 3 of the independent light source on the upper side and the light emitting diode 3 of the independent light source on the lower side clamp the panel 200 to be detected in the middle, light formed by the two independent light sources can be injected into the panel 200, and a light field is formed in the panel 200, so that the panel 200 is an object to be detected and also a light source, flaws on the panel 200 are obviously displayed, and detection can be completed without observing from a specific angle.
In summary, the method for detecting the flaws of the oppositely-arranged illuminated transparent panel provided by the invention adopts a novel oppositely-arranged illumination mode, so that light can be emitted into the transparent panel, and then the flaws on the panel can be illuminated from the inside of the transparent panel; the camera position and the illumination light source on the automatic detection station can be reduced, and the detection efficiency and stability can be improved; the device can also be applied to manual detection stations to improve the detection efficiency and stability.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims (4)

1. The method for detecting the flaws of the oppositely-illuminated transparent panel is characterized by comprising the following steps of:
the method comprises the following steps: the camera faces the panel to be detected, the distance between the camera and the panel to be detected is adjusted, and the focal length and the aperture of the camera are adjusted to enable the imaging of the camera to be clear;
step two: placing the oppositely-arranged illumination light sources on the front side and the back side of the panel to be detected, and overlapping, wherein the oppositely-arranged illumination light sources are positioned outside the field of vision of the camera;
step three: lighting the opposed illumination light sources, wherein when a part of light rays meet the panel, the direction of the light rays is changed and the light rays are transmitted to the periphery along the panel, other light rays are reflected among the opposed illumination light sources for multiple times and finally the direction of the light rays is changed and the light rays are transmitted to the periphery along the panel, the light rays are transmitted to each surface of the panel through the interior of the panel, but the light rays cannot be directly emitted into the camera from the light sources;
step four: the flaws on the panel are irradiated by a light field in the panel, and the generated scattered light enters the camera to form an image with higher contrast for flaw detection;
the oppositely-arranged illumination light sources comprise two independent light sources, the two independent light sources are identical in structure and are symmetrically arranged along the panel to be detected; the independent light source comprises a shell, a light reflecting coating, a sealing rubber strip and a plurality of light emitting diodes; the shell comprises a groove, the reflective coating is laid on the inner wall of the groove, the light-emitting diode is installed in the groove, and the sealing rubber strip is arranged on the outer peripheral side of the groove.
2. The opposed illumination transparent panel flaw detection method as set forth in claim 1, wherein: the plurality of light emitting diodes are arranged in a matrix.
3. The method of detecting flaws in an oppositely illuminated transparent panel as set forth in claim 1, wherein: the sealing rubber strip is partially positioned in the shell, and partially protrudes out of the surface of the shell.
4. The opposed illuminated transparent panel defect detection method of claim 3, wherein: the vertical distance from the end of the sealing rubber strip to the bottom of the groove is larger than that from the end of the light-emitting diode to the bottom of the groove.
CN202110501445.8A 2021-05-08 2021-05-08 Opposite lighting transparent panel flaw detection method Expired - Fee Related CN113203741B (en)

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CN202110501445.8A CN113203741B (en) 2021-05-08 2021-05-08 Opposite lighting transparent panel flaw detection method

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Application Number Priority Date Filing Date Title
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CN113203741B true CN113203741B (en) 2023-02-17

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1048138A (en) * 1996-08-06 1998-02-20 Nkk Corp Input device for flaw information on metal plate surface
JP2001066262A (en) * 1999-06-25 2001-03-16 Nkk Corp Surface scratch marking device, and metal belt with marking and its manufacturing method
CN204556517U (en) * 2015-05-11 2015-08-12 沈阳准则精密技术有限公司 Hot rolled sheet metal surface quality on-line detecting device
CN109283197A (en) * 2018-08-27 2019-01-29 杭州元色科技有限公司 The detection method and detection device of clear sheet surface and internal flaw
CN109856049A (en) * 2018-12-14 2019-06-07 杭州元色科技有限公司 Clear sheet Defect Detection total internal reflection light gatherer and slide glass method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1048138A (en) * 1996-08-06 1998-02-20 Nkk Corp Input device for flaw information on metal plate surface
JP2001066262A (en) * 1999-06-25 2001-03-16 Nkk Corp Surface scratch marking device, and metal belt with marking and its manufacturing method
CN204556517U (en) * 2015-05-11 2015-08-12 沈阳准则精密技术有限公司 Hot rolled sheet metal surface quality on-line detecting device
CN109283197A (en) * 2018-08-27 2019-01-29 杭州元色科技有限公司 The detection method and detection device of clear sheet surface and internal flaw
CN109856049A (en) * 2018-12-14 2019-06-07 杭州元色科技有限公司 Clear sheet Defect Detection total internal reflection light gatherer and slide glass method

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