CN211478808U - Substrate glass defect detection device - Google Patents
Substrate glass defect detection device Download PDFInfo
- Publication number
- CN211478808U CN211478808U CN202020242221.0U CN202020242221U CN211478808U CN 211478808 U CN211478808 U CN 211478808U CN 202020242221 U CN202020242221 U CN 202020242221U CN 211478808 U CN211478808 U CN 211478808U
- Authority
- CN
- China
- Prior art keywords
- substrate glass
- side lens
- light source
- unit
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The utility model relates to a substrate glass defect detection device, which comprises a control unit, a light source for illuminating the defect position of the substrate glass and a zoom camera unit for collecting the image of the defect position, wherein the control unit is used for controlling the camera unit to zoom along the thickness direction of the substrate glass and collect the image; the central line of the light source is superposed with the central line of the object side lens of the camera unit, so that the light beam emitted by the light source is emitted to the defect position along the image acquisition path of the camera unit. The central line of the light source is coincided with the central line of the object side lens, so that light beams emitted by the light source can irradiate to the defect position along the image acquisition path of the camera unit, and the lighting effect and the imaging effect are good in the process of acquiring images by the camera unit.
Description
Technical Field
The disclosure relates to the field of substrate glass manufacturing and processing, in particular to a substrate glass defect detection device.
Background
Liquid crystal substrate glass is a substrate in the display field and is widely applied to various displays. As the requirements for pixels and contrast in the display field increase, the defects of the liquid crystal substrate glass are also smaller and smaller. The defects of the liquid crystal substrate glass are mainly represented by bubbles, platinum, dust, stones, and the like on the surface of the glass and inside the glass. The surface inspection camera is used for inspecting the whole piece of liquid crystal substrate glass, only the approximate appearance of the defect can be obtained, the specific size and the level of the defect cannot be confirmed, and whether the detected liquid crystal substrate glass is qualified or not cannot be judged. Therefore, when the liquid crystal substrate glass is inspected, an inspector needs to perform reinspection on the defects found by the surface inspection, and the defect detection device for reinspection in the prior art has poor imaging effect and is inconvenient for the inspector to measure and analyze the images collected at the positions of the defects.
SUMMERY OF THE UTILITY MODEL
The purpose of the present disclosure is to provide a substrate glass defect detecting device, which has a good imaging effect and is convenient for the detection personnel to measure and analyze the image collected by the defect position.
In order to achieve the above object, the present disclosure provides a substrate glass defect detection apparatus, including a control unit, a light source for illuminating a defect position of a substrate glass, and a variable focus imaging unit for image-capturing the defect position, the control unit being configured to control the imaging unit to zoom in a thickness direction of the substrate glass and to perform image-capturing; the central line of the light source is superposed with the central line of the object side lens of the camera unit, so that the light beam emitted by the light source is emitted to the defect position along the image acquisition path of the camera unit.
Optionally, the substrate glass defect detecting device further includes a distance measuring unit, the distance measuring unit is configured to measure a distance between the detecting device and the substrate glass, and the control unit is configured to control the image pickup unit to focus on a surface of the substrate glass close to the detecting device according to distance information measured by the distance measuring unit.
Optionally, the ranging unit includes a laser emitter and a photoelectric receiver for receiving laser emitted from the laser emitter and reflected by the substrate glass.
Optionally, the image pickup unit further includes a driving portion, a fixedly disposed image pickup unit body, and an image side lens fixedly connected to the image pickup unit body, and the driving portion drives the object side lens to move along a central line direction thereof according to a control instruction sent by the control unit, so as to realize multiple focusing on the substrate glass.
Optionally, the image capturing unit further includes a first reflection mechanism and a second reflection mechanism, a central line of the object-side lens is configured to be parallel to the substrate glass, a central line of the image-side lens is configured to be perpendicular to the substrate glass, the first reflection mechanism is configured to reflect the image information of the defect position to the object-side lens, and the second reflection mechanism is configured to reflect the image information received by the object-side lens to the image-side lens.
Alternatively, the first reflecting mechanism and the second reflecting mechanism are respectively configured as a first right triangular prism and a second right triangular prism, and inclined surfaces of the first right triangular prism and the second right triangular prism are respectively configured as a first reflecting surface and a second reflecting surface.
Optionally, the light source is disposed adjacent to the right-angle surface of the second right-angle triple prism, so that a light beam emitted by the light source sequentially passes through the second right-angle triple prism and the object-side lens and then is emitted to the defect position through the first reflecting surface.
Optionally, the object side lens is configured as a convex lens, the image side lens is configured as a concave lens, and centers of curvature of the convex lens and the concave lens coincide.
Optionally, the light source is an LED (light emitting diode) which emits light with a wavelength of 400-800nm, a beam divergence of 37 DEG and a radiation area of more than 10mm2Of the light source.
Optionally, the substrate glass defect detecting device further comprises a housing, and the control unit, the light source and the camera unit are all disposed in the housing.
The central line of the light source is coincided with the central line of the object side lens, so that light beams emitted by the light source can irradiate to the defect position along the image acquisition path of the camera unit, and the lighting effect and the imaging effect are good in the process of acquiring images by the camera unit.
Additional features and advantages of the disclosure will be set forth in the detailed description which follows.
Drawings
The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of this specification, illustrate embodiments of the disclosure and together with the description serve to explain the disclosure without limiting the disclosure. In the drawings:
fig. 1 is a schematic view of the structure of a substrate glass defect detecting apparatus according to an embodiment of the present disclosure, in which a substrate glass is also shown.
Description of the reference numerals
21 drive unit 22 object side lens
23 image pickup unit body 24 image side lens
25 first reflecting mechanism 251 first reflecting surface
26 second reflecting mechanism 261 second reflecting surface
3 distance measuring unit 4 light source
10 casing 100 substrate glass
Detailed Description
The following detailed description of specific embodiments of the present disclosure is provided in connection with the accompanying drawings. It should be understood that the detailed description and specific examples, while indicating the present disclosure, are given by way of illustration and explanation only, not limitation.
In the present disclosure, unless otherwise specified, terms of orientation such as "inner and outer" are used to indicate that the particular structure is inner and outer, and terms such as "first, second, etc. are used merely to distinguish one element from another, and are not sequential or significant.
As shown in fig. 1, the present disclosure provides a substrate glass defect detection apparatus, including a control unit, a light source 4 for illuminating a defect position of a substrate glass 100, and a variable focus camera unit for image-capturing the defect position, the control unit being configured to control the camera unit to zoom in a thickness direction of the substrate glass 100 and to perform image-capturing; the center line of the light source 4 coincides with the center line of the object-side lens 22 of the image pickup unit, so that the light beam emitted from the light source 4 is emitted to the defect position along the image pickup path a of the image pickup unit.
The central line of the light source 4 is coincided with the central line of the object side lens 22, so that the light beam emitted by the light source 4 can be emitted to the defect position along the image acquisition path A of the camera unit, and the lighting effect and the imaging effect are good in the process of acquiring the image by the camera unit.
In one embodiment, as shown in fig. 1, the substrate glass defect detecting device may further include a distance measuring unit 3, the distance measuring unit 3 may be configured to measure a distance between the detecting device and the substrate glass 100, and the control unit is configured to control the image capturing unit to focus on a side of the substrate glass 100 close to the detecting device according to the distance information measured by the distance measuring unit 3. In other words, the imaging unit is focused on the reference surface (the surface close to the detection device) of the substrate glass 100 by the distance measuring unit 3, so that the detection device can automatically focus, and the degree of automation is high. Of course, the focusing of the reference plane may also be performed manually, and the present disclosure is not limited thereto.
Specifically, the ranging unit 3 may include a laser emitter, and a photo receiver for receiving laser light emitted from the laser emitter and reflected by the substrate glass 100. For example, the laser emitter may emit a laser with a wavelength of 650nm, and the laser is a continuous wave with a power less than 1mw, and reaches the photo receiver after being reflected by a surface of the substrate glass 100 close to the detection device. The distance between the detection device and the reference surface is determined by detecting the time taken for the laser to emit the laser from the laser emitter and the photoelectric receiver to receive the laser. The measurement accuracy is high and the cost of components is low. In another embodiment, the distance measuring unit 3 may also be configured as an ultrasonic distance sensor, which is not limited by the present disclosure.
In one embodiment, as shown in fig. 1, the image capturing unit may further include a driving portion 21, a fixedly disposed image capturing unit body 23, and an image side lens 24 fixedly connected to the image capturing unit body 23, the driving portion 21 drives the object side lens 22 to move along a central line direction thereof according to a control command sent by the control unit, so as to achieve multiple focusing on the substrate glass 100, and an amount of change of each focusing may be the same, so that the image capturing unit may focus and capture the substrate glass uniformly along a thickness direction of the substrate glass, so as to detect defects at different thicknesses of the substrate glass, and determine whether the substrate glass is qualified.
Alternatively, the driving part 21 may be configured as a linear motor, which is inexpensive and stably driven. However, the present disclosure does not limit the specific type of the driving unit 21, and other types of driving mechanisms may be used.
Optionally, the camera unit body 23 may be configured as a CCD matrix color camera, which has a good imaging effect and is convenient for image acquisition. Of course, the present disclosure does not limit the specific structure of the camera unit body 23.
In addition, as shown in fig. 1, the image capturing unit may further include a first reflection mechanism 25 and a second reflection mechanism 26, a central line of the object side lens 22 may be used to be parallel to the substrate glass 100, a central line of the image side lens 24 may be used to be perpendicular to the substrate glass 100, the first reflection mechanism 25 is used to reflect image information of a defect position to the object side lens 22, and the second reflection mechanism 26 is used to reflect image information received by the object side lens 22 to the image side lens 24, so as to capture an image through the image capturing unit body 23. By providing the first reflection mechanism 25 and the second reflection mechanism 26, the image acquisition is realized under the condition that the central line of the object side lens 22 and the central line of the image side lens 24 are not coincident, so that the specific arrangement mode of the object side lens 22 and the image side lens 24 is more flexible and the structure arrangement is more convenient.
Further, the first and second reflection mechanisms 25 and 26 may be respectively configured as first and second right triangular prisms, and inclined surfaces thereof are respectively configured as the first and second reflection surfaces 251 and 261. The two right-angle triple prisms are low in cost and good in reflection effect.
Furthermore, the light source 4 is disposed adjacent to the right-angled surface of the second right-angled triangular prism, so that the light beam emitted from the light source 4 sequentially passes through the second right-angled triangular prism and the object-side lens 22 and then is emitted to the defect position through the first reflecting surface 251. When the light beam passes through the second right triangular prism, the light beam passes through the transparent right triangular prism in parallel without refraction or reflection, but when the light beam passes through the object side lens 22 and is emitted to the first reflection surface 251, the light beam is reflected, specifically, the incident angle of the light beam to the first reflection surface 251 is 45 degrees, so that the light beam can be emitted perpendicularly to the defect position of the substrate glass 100, and a good illumination effect can be realized.
Alternatively, the above-described object side lens 22 may be configured as a convex lens, the image side lens 24 may be configured as a concave lens, centers of curvature of the convex lens and the concave lens coincide, and a radius of curvature of the concave lens may be twice that of the convex lens to further improve the effect of imaging.
The light source 4 can be an LED to emit light with a wavelength of 400-800nm, a beam divergence of 37 DEG and a radiation area of more than 10mm2To ensure that the light beam emitted by the light source 4 is as parallel as possible, so as to improve the illumination effect.
As shown in fig. 1, the substrate glass defect detecting apparatus may further include a housing 10, and the control unit, the light source 4, and the imaging unit may be disposed in the housing 10 to protect optical components of the apparatus through the housing 10.
The specific working process of the substrate glass defect detection device is as follows:
firstly, the detection device is arranged at a position which is 4cm to 8cm away from the substrate glass so as to ensure that a camera unit in the detection device can work normally;
secondly, the control unit can firstly control the light source 4 to illuminate the defect position;
furthermore, the control unit can control the distance measurement unit 3 to measure the distance between the detection device and the substrate glass 100, after the distance measurement is completed, the distance measurement unit 3 feeds back the distance information to the control unit, the control unit performs algorithm operation according to the distance information to control the camera unit to focus on one surface of the substrate glass 100 close to the detection device, and after the focusing is completed, the camera unit performs image acquisition on the surface;
then, the control unit sends a control instruction to the driving part 21 to drive the object side lens 22 to move along the central line direction thereof so as to realize multiple times of focusing on the substrate glass 100, and the variation amount of each time of focusing can be the same, so that the image pickup unit can uniformly focus along the thickness direction of the substrate glass and perform shooting;
and finally, the image pickup unit feeds back the information of the plurality of shot images to the control unit, and the control unit detects the defects of the image information at different thicknesses of the substrate glass so as to judge whether the substrate glass is qualified.
The preferred embodiments of the present disclosure are described in detail with reference to the accompanying drawings, however, the present disclosure is not limited to the specific details of the above embodiments, and various simple modifications may be made to the technical solution of the present disclosure within the technical idea of the present disclosure, and these simple modifications all belong to the protection scope of the present disclosure.
It should be noted that, in the foregoing embodiments, various features described in the above embodiments may be combined in any suitable manner, and in order to avoid unnecessary repetition, various combinations that are possible in the present disclosure are not described again.
In addition, any combination of various embodiments of the present disclosure may be made, and the same should be considered as the disclosure of the present disclosure, as long as it does not depart from the spirit of the present disclosure.
Claims (10)
1. A substrate glass defect detection device is characterized by comprising a control unit, a light source (4) for illuminating the defect position of substrate glass (100), and a zoom camera unit for collecting the image of the defect position,
the control unit is used for controlling the camera shooting unit to zoom along the thickness direction of the substrate glass (100) and acquiring images;
the central line of the light source (4) is superposed with the central line of an object side lens (22) of the camera unit, so that the light beam emitted by the light source (4) is emitted to the defect position along an image acquisition path (A) of the camera unit.
2. The substrate glass defect detecting device according to claim 1, further comprising a distance measuring unit (3), wherein the distance measuring unit (3) is used for measuring the distance between the detecting device and the substrate glass (100), and the control unit is used for controlling the camera unit to focus on one side of the substrate glass (100) close to the detecting device according to the distance information measured by the distance measuring unit (3).
3. The substrate glass defect detecting apparatus according to claim 2, wherein the ranging unit (3) includes a laser emitter, and a photo receiver for receiving laser light emitted from the laser emitter and reflected by the substrate glass (100).
4. The substrate glass defect detecting device according to claim 1, wherein the image pickup unit further comprises a driving portion (21), a fixedly arranged image pickup unit body (23), and an image side lens (24) fixedly connected with the image pickup unit body (23), and the driving portion (21) drives the object side lens (22) to move along a central line direction thereof according to a control command sent by the control unit so as to realize multiple focusing on the substrate glass (100).
5. The apparatus according to claim 4, wherein the imaging unit further comprises a first reflecting mechanism (25) and a second reflecting mechanism (26), a center line of the object side lens (22) is configured to be parallel to the substrate glass (100), a center line of the image side lens (24) is configured to be perpendicular to the substrate glass (100), the first reflecting mechanism (25) is configured to reflect image information of the defect position to the object side lens (22), and the second reflecting mechanism (26) is configured to reflect the image information received by the object side lens (22) to the image side lens (24).
6. The substrate glass defect detecting apparatus according to claim 5, wherein the first reflecting mechanism (25) and the second reflecting mechanism (26) are respectively configured as a first right triangular prism and a second right triangular prism, and inclined surfaces of the first right triangular prism and the second right triangular prism are respectively configured as a first reflecting surface (251) and a second reflecting surface (261).
7. The substrate glass defect detecting device according to claim 6, wherein the light source (4) is disposed adjacent to the right-angled surface of the second right triangular prism, so that the light beam emitted from the light source (4) sequentially passes through the second right triangular prism, the object-side lens (22), and then is emitted to the defect position through the first reflecting surface (251).
8. The substrate glass defect detection apparatus according to claim 4, wherein the object side lens (22) is configured as a convex lens, the image side lens (24) is configured as a concave lens, and centers of curvature of the convex lens and the concave lens coincide.
9. The apparatus as claimed in any one of claims 1 to 8, wherein the light source (4) is an LED for emitting light with a wavelength of 400-800nm, a beam divergence of 37 ° and a radiation area greater than 10mm2Of the light source.
10. The substrate glass defect detecting apparatus according to any one of claims 1 to 8, further comprising a housing (10), wherein the control unit, the light source (4), and the imaging unit are all disposed within the housing (10).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020242221.0U CN211478808U (en) | 2020-02-28 | 2020-02-28 | Substrate glass defect detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020242221.0U CN211478808U (en) | 2020-02-28 | 2020-02-28 | Substrate glass defect detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211478808U true CN211478808U (en) | 2020-09-11 |
Family
ID=72364398
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020242221.0U Active CN211478808U (en) | 2020-02-28 | 2020-02-28 | Substrate glass defect detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211478808U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113933319A (en) * | 2021-09-01 | 2022-01-14 | 郑州旭飞光电科技有限公司 | Glass defect detection device |
-
2020
- 2020-02-28 CN CN202020242221.0U patent/CN211478808U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113933319A (en) * | 2021-09-01 | 2022-01-14 | 郑州旭飞光电科技有限公司 | Glass defect detection device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100793182B1 (en) | Apparatus and method for detecting defects in wafer using line sensor camera | |
| US8223326B2 (en) | Dark-field examination device | |
| CN110389021B (en) | Lens image generating system, diopter power and thickness determining and defect detecting method | |
| KR101317947B1 (en) | Apparatus for inspecting cylinder | |
| WO2020048148A1 (en) | Surface defect measurement method based on spectral confocal sensor | |
| US20150362417A1 (en) | Contact Angle Measuring Instrument | |
| JP3205511B2 (en) | Seal inspection device | |
| KR20160004099A (en) | Defect inspecting apparatus | |
| CN111239161A (en) | Method and device for detecting defects of substrate glass | |
| CN211478808U (en) | Substrate glass defect detection device | |
| KR101416860B1 (en) | Particle inspecting system for camera lens module | |
| TWI580930B (en) | Tilt angle and distance measurement method | |
| CN110082361B (en) | Object appearance and crack detection device and detection method | |
| CN112834462A (en) | Method for measuring reflectivity of reflector | |
| CN212207144U (en) | Apparatus for detecting surface defects on glass sheets | |
| KR101447857B1 (en) | Particle inspectiing apparatus for lens module | |
| CN210604416U (en) | Object appearance and crack detection device | |
| CN210321640U (en) | Optical path structure and equipment for rapidly measuring curvature radius of optical lens | |
| CN1936497A (en) | Outline measurement projector with picture treatment system | |
| US20100321558A1 (en) | Apparatus and method for detecting spatial movement of object | |
| CN219016120U (en) | Detection device | |
| KR101744149B1 (en) | Apparatus for inspecting substrate | |
| CN218995177U (en) | Visual inspection device of multiaspect formation of image | |
| CN211263958U (en) | High-sensitivity transparent object pulse texture and surface defect observation device | |
| JP2000333047A (en) | Optical image pickup device and optical image pickup method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |