CN113188494B - 一种标定系统与标定系统的测量方法 - Google Patents

一种标定系统与标定系统的测量方法 Download PDF

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CN113188494B
CN113188494B CN202110423764.1A CN202110423764A CN113188494B CN 113188494 B CN113188494 B CN 113188494B CN 202110423764 A CN202110423764 A CN 202110423764A CN 113188494 B CN113188494 B CN 113188494B
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guide rail
circle
calibration system
rotary table
receiving device
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CN113188494A (zh
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张鹏
肖田
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Chotest Technology Inc
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Chotest Technology Inc
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Priority to PCT/CN2021/139707 priority patent/WO2022222521A1/fr
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN202110423764.1A 2021-04-20 2021-04-20 一种标定系统与标定系统的测量方法 Active CN113188494B (zh)

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CN202110423764.1A CN113188494B (zh) 2021-04-20 2021-04-20 一种标定系统与标定系统的测量方法
PCT/CN2021/139707 WO2022222521A1 (fr) 2021-04-20 2021-12-20 Système d'étalonnage et procédé de mesure par ce dernier

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CN113188494B true CN113188494B (zh) 2023-03-10

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WO (1) WO2022222521A1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113188494B (zh) * 2021-04-20 2023-03-10 深圳市中图仪器股份有限公司 一种标定系统与标定系统的测量方法
CN117008104B (zh) * 2023-09-28 2023-12-22 武汉市品持科技有限公司 一种传感器标定补偿方法

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US4873449A (en) * 1987-02-04 1989-10-10 Michel Paramythioti Process and apparatus for three-dimensional surveying
CN107024751A (zh) * 2016-02-01 2017-08-08 深圳市睿晟自动化技术有限公司 一种高精度对准光学元件和玻璃平板的装置与方法
CN107101597A (zh) * 2017-05-31 2017-08-29 天津大学 一种旋转角测量系统的误差标定方法
CN109520446A (zh) * 2018-12-14 2019-03-26 中国航空工业集团公司北京长城航空测控技术研究所 一种高速回转轴系动态倾角误差的测量方法
CN211085268U (zh) * 2020-01-10 2020-07-24 合肥富煌君达高科信息技术有限公司 一种用于光学导轨测距装置的调节系统

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SU1755043A1 (ru) * 1990-03-29 1992-08-15 Томский политехнический институт им.С.М.Кирова Способ выставлени отражател перпендикул рно оси поворота вала
US6409345B1 (en) * 2000-08-08 2002-06-25 Tracey Technologies, Llc Method and device for synchronous mapping of the total refraction non-homogeneity of the eye and its refractive components
CN203241031U (zh) * 2012-12-07 2013-10-16 浙江师范大学 直线导轨偏摆角和俯仰角的测量装置
CN103411545B (zh) * 2013-08-13 2016-04-20 天津大学 基于光学自由曲面的多轴系统误差建模及测量装置和方法
AT515521B1 (de) * 2014-07-23 2015-10-15 Trumpf Maschinen Austria Gmbh Biegewinkelmessvorrichtung und Verfahren zum Messen eines Biegewinkels mittels der Biegewinkelmessvorrichtung
CN105698713B (zh) * 2016-01-27 2019-03-29 西安应用光学研究所 一种标定精密轴系回转轴线的装置及标定方法
CN207763655U (zh) * 2017-12-18 2018-08-24 中国航空工业集团公司洛阳电光设备研究所 一种旋转轴系径向回转误差检测系统
CN112596258B (zh) * 2020-12-04 2021-09-14 中国科学院西安光学精密机械研究所 一种二维转台折转光学组件的调试方法
CN113188494B (zh) * 2021-04-20 2023-03-10 深圳市中图仪器股份有限公司 一种标定系统与标定系统的测量方法

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* Cited by examiner, † Cited by third party
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US4873449A (en) * 1987-02-04 1989-10-10 Michel Paramythioti Process and apparatus for three-dimensional surveying
CN107024751A (zh) * 2016-02-01 2017-08-08 深圳市睿晟自动化技术有限公司 一种高精度对准光学元件和玻璃平板的装置与方法
CN107101597A (zh) * 2017-05-31 2017-08-29 天津大学 一种旋转角测量系统的误差标定方法
CN109520446A (zh) * 2018-12-14 2019-03-26 中国航空工业集团公司北京长城航空测控技术研究所 一种高速回转轴系动态倾角误差的测量方法
CN211085268U (zh) * 2020-01-10 2020-07-24 合肥富煌君达高科信息技术有限公司 一种用于光学导轨测距装置的调节系统

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* Cited by examiner, † Cited by third party
Title
星载周扫式跟踪转台运动轴与光轴关系的建模分析;杨恭勇等;《机械工程师》;20150310(第03期);全文 *

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