CN113111506A - Electric connector contact reliability modeling method with multiple apertures - Google Patents

Electric connector contact reliability modeling method with multiple apertures Download PDF

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CN113111506A
CN113111506A CN202110378475.4A CN202110378475A CN113111506A CN 113111506 A CN113111506 A CN 113111506A CN 202110378475 A CN202110378475 A CN 202110378475A CN 113111506 A CN113111506 A CN 113111506A
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contact
resistance
electric connector
aperture
reed
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林敏�
钱萍
陈文华
王哲
钟立强
张通
郭明达
姚华军
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Zhejiang University of Technology ZJUT
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Abstract

The invention discloses a modeling method for contact reliability of an electric connector with multiple apertures, which comprises the steps of firstly establishing a relation model between contact pressure and contact pin radius; then respectively calculating the contraction resistance and the film resistance of all contact spots of the contact area, and establishing a relation model between the contact resistance and the contact pressure by combining the body resistance of the contact pair; then, obtaining a relational expression among the contact resistance degradation rate, temperature, contact pressure and other factors through failure degradation analysis of the multi-aperture electric connector; and finally, calculating the time of the multi-aperture electric connector reaching the failure threshold, obtaining the failure distribution of the electric connector by means of a test, and obtaining a finally-established multi-aperture electric connector contact reliability model through the failure distribution. The invention overcomes the defect that the prior art has no service life evaluation model specially aiming at the multi-aperture electric connector.

Description

Electric connector contact reliability modeling method with multiple apertures
Technical Field
The invention belongs to the technical field of electric connectors, and particularly relates to a multi-aperture electric connector contact reliability modeling method.
Background
The electric connector is an indispensable electronic component of various electric and electronic systems, is mainly used for realizing signal transmission and control and electric connection among electrical equipment, is widely applied to civil and military systems such as aviation, aerospace, national defense and the like, and has considerable quantity and important position. According to the statistics of the failure rate of the aerospace, the failure rate of electronic components in the system is about 40%, wherein the failure rate of the electric connector accounts for about 20% -30%, and the electric connector is classified as one of four elements with poor reliability in a model system.
The contact pair material of the electric connector is the gold plating of the copper substrate surface, and in the long-term storage process, the oxide film with higher resistivity is generated on the contact pair surface, the jack can creep, the contact pair pressure is reduced, and the contact failure of the electric connector is caused by the increase of contact resistance, poor electric contact and the like. Therefore, the evaluation of the contact reliability of the electrical connector is important to ensure the reliability of the model system.
At present, for failure mechanism analysis, statistical modeling and service life evaluation related to electric connector contact reliability research, most of the electric connectors focus on the electric connectors with the same contact-to-aperture size, when the electric connectors with various contact-to-aperture sizes are subjected to service life evaluation, because the performance degradation trends of contact pairs with different sizes are different, if the difference between the contact pair sizes is neglected, the reliability models of the electric connectors with the same aperture size are still evaluated by adopting the contacts, and inaccuracy of evaluation results is difficult to avoid.
Disclosure of Invention
To overcome the above-mentioned deficiencies of the prior art, the present invention provides a method for modeling contact reliability of an electrical connector with multiple apertures, which provides a theoretical support for life evaluation of an electrical connector product with multiple aperture contact pairs.
In order to achieve the purpose, the invention adopts the following technical scheme:
the invention discloses a contact reliability modeling method of an electric connector with multiple apertures, which comprises the following steps:
step one, establishing a relation model between contact pressure and pin radius, which comprises the following steps:
the contact pressure expression of the contact pair is as follows:
Figure BDA0003011810830000021
wherein E is the elastic modulus of the reed material, IzIs the moment of inertia of the cross section of the reed with respect to the neutral layer z, L is the length of the reed, f is the amount of contraction of the reed, R2The radius of curvature of the inner wall of the free end face of the reed before closing up, and R is the radius of the contact pin.
Step two, establishing a relation model between the contact resistance and the contact pressure, which is concretely as follows:
dividing the contact element into n sections, analyzing the resistance of the combination body, the shrinkage resistance and the film layer resistance to obtain a specific expression of the contact resistance r:
Figure BDA0003011810830000022
where ρ represents the resistivity (Ω · m) of the contact at standard temperature, α1Δ t represents the difference between the ambient temperature and the standard temperature, L, which is the temperature coefficient of resistanceoDenotes the length of the o-th segment, SoDenotes the o thThe cross-sectional area of the segments,
Figure BDA0003011810830000023
influencing the calibration coefficient for surface roughness, R3Is the radius of a fillet at the inner wall of the free end of the reed,
Figure BDA0003011810830000024
E1、E2the elastic modulus of the materials of the pin and the jack respectively, E1＝E，v1、v2Respectively the poisson ratio of the materials of the pin and the jack,
Figure BDA0003011810830000025
is the average area of the pores in the contact region between the spring and the contact pin, t is the time, k1Q is a constant, H represents the hardness of the material with lower hardness in the pin and the jack, and N is the number of reeds in the jack.
k2Is the reaction constant under temperature stress, expressed as:
Figure BDA0003011810830000026
wherein AE is activation energy; k is a radical ofbBoltzmann constant; t is the temperature; and Λ is a frequency factor.
Since the body resistance and the shrinkage resistance are determined after the multi-aperture electric connector leaves the factory, the multi-aperture electric connector has the advantages of simple structure, low cost and high reliability
Figure BDA0003011810830000031
For a fixed value, the contact resistance r of the contact pair is expressed as:
Figure BDA0003011810830000032
step three, establishing a relation model between the contact resistance degradation rate and the temperature, which comprises the following specific steps:
in formula (4), the contact resistance r is reduced to:
r＝r0+αtq/3 (5)
carrying out an accelerated degradation life test on the multi-aperture electric connector to obtain contact resistance r and contact resistance degradation rate alpha at different times, and then fitting to obtain q, wherein the contact resistance degradation rate alpha is expressed as:
Figure BDA0003011810830000033
will k2Substituting the formula (6) to obtain:
Figure BDA0003011810830000034
step four, establishing a contact reliability model of the multi-aperture electric connector, which comprises the following steps:
the contact resistance r of a multi-aperture electrical connector contact pair varies over time, the lifetime of an individual contact pair is the time at which the contact resistance reaches a failure threshold D:
Figure BDA0003011810830000035
wherein r is0The parameter β is an initial value of the contact resistance, and q/3.
Order to
Figure BDA0003011810830000036
Logarithmically deriving lnU, lnU for U follows a normal distribution, and thus the rate of degradation α of contact-to-contact resistance follows a lognormal distribution LN (μ)α，σ2) Wherein, muαAnd σ represents a logarithmic mean and a logarithmic standard deviation of the contact resistance degradation rate distribution, respectively. The degradation failure distribution of a contact pair is expressed as:
Figure BDA0003011810830000037
Figure BDA0003011810830000041
where P is the probability of failure of the contact pair.
There are x groups of contact pairs with different apertures in the multi-aperture electric connector, each group has nyThe lifetime of the contact pair, y being 1, 2, …, x, the jth contact pair of the jth group is shown as
Figure BDA0003011810830000042
u＝1，2，…，nyThen the life T of the y-th group of contact pairsyThe expression is as follows:
Figure BDA0003011810830000043
the contact pairs are independent of each other, so the lifetime distribution function of the y-th group of contact pairs is:
Figure BDA0003011810830000044
the contact reliability life span distribution function of the multi-aperture electrical connector is:
Figure BDA0003011810830000045
the contact reliability of the multi-aperture electrical connector is:
Figure BDA0003011810830000046
compared with the prior art, the invention has the following beneficial effects:
the invention provides a contact reliability modeling method of an electric connector with multiple apertures, which establishes contact pair mechanical structure parameters (F) -contact resistance (r) -contact pair service life (T) by analyzing failure modes and researching failure mechanisms of the electric connectory) -electrical connector contacts mayAnd obtaining the reliability of the multi-aperture electric connector at the time t by a reliability (R (t)) model. Meanwhile, by comprehensively considering the body resistance, the shrinkage resistance and the film resistance, the influence of different apertures on the contact action force and the influence of environmental temperature factors on the degradation failure of the multi-aperture electric connector are combined, a method is provided for the service life evaluation of the multi-aperture electric connector, and the defect that the service life evaluation model specially aiming at the multi-aperture electric connector is not available in the prior art is overcome.
Drawings
FIG. 1 is an overall flow chart of the present invention;
FIG. 2 is a schematic view of a four-slot jack and spring plate;
FIG. 3 is a cross-sectional view A-A of FIG. 2;
FIG. 4 is a cross-sectional view of the pin and socket in the mated state;
FIG. 5 is a schematic view of a mechanical model of the inner wall of the reed and the pin;
FIG. 6 is a simplified diagram of the contact between the spring and the pin;
fig. 7 is a sectional view B-B of fig. 6.
Detailed Description
The invention is further described with reference to the following figures and detailed description.
The invention adopts the four-slot jack shown in fig. 2 and 3 to form a contact pair with a contact pin and establishes a model between the contact pressure and the aperture of the contact pair after the contact pair reaches a stable state. Wherein, as shown in fig. 4, the change of the spring plate on the jack can be clearly seen after the pin and the jack are mutually inserted.
As shown in figure 1, the invention provides a modeling method for contact reliability of an electric connector with multiple apertures, in the insertion state, the acting force between a contact pin and a reed is equivalently simplified into a concentrated force acting on the end part of the reed, so that the reed can be simplified into a cantilever beam mechanical model, as shown in figure 5, the deflection of the end part of the free end of the reed is delta, the radius of the contact pin is R, and the curvature radius of the inner wall of the end surface of the free end of the reed before closing up is R2The closing amount of the reed is f, and the deflection formula delta is f- (R)2-R)＝f-R2+ R, thereby obtaining contact pressure and contact to apertureAnd then establishing a relation model between the contact resistance and the contact pressure, and respectively calculating the shrinkage resistance of all contact spots of the contact area, the film resistance and the body resistance of the contact to the contact. And then, obtaining a relational expression among the contact resistance degradation rate, the environmental temperature, the contact pressure and other factors through failure degradation analysis of the multi-aperture electric connector, finally calculating the time for the electric connector to reach a failure threshold value, obtaining failure distribution of the electric connector by means of a test, and obtaining a finally-established electric connector contact reliability model through the failure distribution.
The series-parallel resistance model of the pin and the jack is first explained below:
when the current flows through the contact spots to realize electric conduction, the contact resistance at the single contact spot i can be regarded as the series connection of the contraction resistance and the film layer resistance, and the microscopic expression of the contact resistance at the single contact spot of the contact area is obtained as follows:
Figure BDA0003011810830000061
wherein the content of the first and second substances,
Figure BDA0003011810830000062
is the pinch resistance at the contact patch;
Figure BDA0003011810830000063
is the film resistance at the contact spot; in the macroscopic aspect, because the shape difference of each contact spot is extremely small, the contact resistance at a single reed j (j is 1, 2, …, N is the number of reeds of the jack) can be regarded as the parallel connection of the contact resistances of all the contact spots, namely the contact resistance at the single reed can be obtained
Figure BDA0003011810830000064
Expression:
Figure BDA0003011810830000065
assuming that there is no difference in contact resistance between each reed and the contact pin, the shrinkage resistance and the film resistance of a single contact pair of the multi-aperture electrical connector are parallel values of the shrinkage resistance and the film resistance of each reed, and an expression can be obtained:
Figure BDA0003011810830000066
wherein r iss，jIs the shrinkage resistance at a single reed, rm，jIs the film resistance at a single reed.
Taking into account the bulk resistance r of the contact pairvThen the contact resistance of the single contact pair can be obtained as:
Figure BDA0003011810830000067
the method for modeling the contact reliability of the electric connector with multiple apertures specifically comprises the following steps:
step 1, establishing a relation model between contact pressure and pin radius, and specifically comprising the following steps:
the expression for the contact pressure is:
Figure BDA0003011810830000068
as shown in fig. 5, the deflection δ is expressed as:
δ＝f-(R2-R)＝f-R2+R (6)
in the formula (6), f is the closing amount of the reed (displacement before and after closing of the free end face of the reed), R2The radius of curvature of the inner wall of the end face of the free end of the reed before closing up, and R is the radius of the contact pin.
Substituting equation (6) for equation (5), the relationship model of contact pressure and contact-to-aperture size of the multi-aperture electrical connector contact pair is:
Figure BDA0003011810830000071
wherein E is the elastic modulus of the reed material, IzIs the moment of inertia of the cross section of the reed with respect to the neutral layer z, and L is the length of the reed.
Step 2, establishing a relation model between the contact resistance r and the contact pressure, and specifically comprising the following steps:
experimentally, the bulk resistance of the contact (including all contact pairs) is determined by the resistivity, length and cross-sectional area of the material, and since the resistivity is affected by temperature, the resistivity can be expressed as ρ (1+ α |)1Δ t), where ρ represents the resistivity (Ω. m) of the contact at standard temperature (20 ℃), α1Δ t represents the difference between the ambient temperature and the standard temperature, which is the temperature coefficient of resistance.
Dividing the contact element into n sections to obtain a bulk resistance rvThe expression of (a) is:
Figure BDA0003011810830000072
wherein L isoDenotes the length of the o-th segment, SoThe cross-sectional area of the o-th section is indicated (n is sufficiently large that the cross-sectional area of each section is considered constant).
The calculated expression for the pinch resistance is:
Figure BDA0003011810830000073
wherein the content of the first and second substances,
Figure BDA0003011810830000074
to account for the calibration factor for the surface roughness effect, w represents the contact patch envelope radius.
And the contact patch envelope radius is calculated as follows:
Figure BDA0003011810830000075
wherein R is3Contact modulus is the radius of the fillet at the inner wall of the free end of the spring as shown in figures 6 and 7
Figure BDA0003011810830000076
E1、E2The elastic modulus, v, of the materials of the pin and the jack respectively1、v2Respectively, the poisson's ratio of the pin and jack materials.
Substituting w into
Figure BDA0003011810830000081
Expression of the resulting shrinkage resistance:
Figure BDA0003011810830000082
the calculation expression of the film layer resistance is as follows:
Figure BDA0003011810830000083
wherein sigmamFor tunnel resistivity, H represents the hardness of the less hard material in the pin and socket.
According to the tunnel effect theory and the test result of Hall, the tunnel resistivity is characterized as follows:
Figure BDA0003011810830000084
wherein
Figure BDA0003011810830000085
Average thickness of oxide film layer, k, of contact area between reed and contact pin1And q are constants.
The average thickness of the oxide film layer is:
Figure BDA0003011810830000086
wherein the content of the first and second substances,
Figure BDA0003011810830000087
the average area of the pores of the contact area of the reed and the contact pin can be measured by an instrument,
Figure BDA0003011810830000088
the average radius of the voids at the contact area of the spring and the pin, and t is the time.
k2The reaction constant under temperature stress is expressed as follows according to the Arrhenius equation:
Figure BDA0003011810830000089
where Δ E is activation energy (energy difference between the activated state and the normal state); k is a radical ofbIs boltzmann constant (8.617 × 10)-5eV/K); t is temperature (. degree. C.); Λ is a frequency factor (used to characterize the reaction constant versus frequency across the energy barrier).
The expression of the film resistance is:
Figure BDA00030118108300000810
the specific expression of the contact resistance r is:
Figure BDA00030118108300000811
Figure BDA0003011810830000091
wherein N is the number of reeds of the jack; due to the bulk resistance rvAnd a shrinkage resistance rsIs mainly determined by the material, structure and process parameters, and the parameters are determined after the product leaves the factory, so the method has the advantages of simple process, low cost and the like
Figure BDA0003011810830000092
Figure BDA0003011810830000093
For a fixed value, the contact resistance r of the contact pair is expressed as:
Figure BDA0003011810830000094
step 3, establishing a relation model between the contact resistance degradation rate and the temperature T, and specifically comprising the following steps:
in the formula (17), the contact pressure F is substituted, and the contact resistance r is simplified as follows:
r＝r0+αtq/3 (18)
selecting a multi-aperture electric connector in the same batch as that for reliability modeling, carrying out an accelerated degradation life test on the multi-aperture electric connector to obtain contact resistance r and contact resistance degradation rate alpha at different time, and further fitting to obtain q.
The contact resistance degradation rate α can be expressed as:
Figure BDA0003011810830000095
will k2Substituting formula (19) to obtain:
Figure BDA0003011810830000096
step 4, establishing a contact reliability model of the multi-aperture electric connector, which comprises the following specific steps:
the contact resistance r of a multi-aperture electrical connector contact pair varies with time, which can be denoted as r (t), and the lifetime of an individual contact pair is the time at which the contact resistance reaches a failure threshold D:
Figure BDA0003011810830000097
wherein r is0The parameter β is an initial value of the contact resistance (contact resistance value at the time of shipment), and is q/3.
From equation (20), it can be seen that the contact resistance degradation rate of the contact pair is influenced by the hardness, elastic modulus, porosity, reed length, deflection, second moment of area, and average pore radius of the material. Order to
Figure BDA0003011810830000101
The logarithm of U is lnU, and lnU is the synthesis of more random variables, according to the central limit theorem, lnU can be approximately considered to follow the normal distribution, so that the contact resistance degradation rate alpha of the contact pair follows the log normal distribution LN (mu)α，σ2). Wherein, muαAnd σ represents a logarithmic mean and a logarithmic standard deviation, respectively, of the contact resistance degradation rate distribution, and the logarithmic standard deviation σ is independent of the level of acceleration stress applied by the life test, i.e., σ does not change with a change in the level of acceleration stress. Performing accelerated degradation life test on the multi-aperture electric connector at different temperatures to obtain a distribution rule graph of the contact resistance and the temperature of the multi-aperture electric connector, and performing linear fitting on a linear relation a + bT' of the contact resistance and the temperature of the multi-aperture electric connector, wherein the parameters are
Figure BDA0003011810830000102
Figure BDA0003011810830000103
And log mean μαCan be expressed as:
Figure BDA0003011810830000104
where E is the mathematical expectation of the contact resistance degradation rate distribution.
The degradation failure distribution due to contact pair is expressed as:
Figure BDA0003011810830000105
where P is the probability of failure of the contact pair.
Substitution log mean μαObtaining:
Fe(t)＝Φ{[βlnt-[ln(D-r0)-E(lnL3)-E[lnIz]-E[lnδ]-ln(N)+a+bT′]/σ} (24)
the corresponding contact is as follows for the contact reliability function at time t:
Re(t)＝1-Fe(t)＝1-Φ{[βlnt-[ln(D-r0)-E(lnL3)-E[lnIz]-E[lnδ]-ln(N)+a+bT′]/σ} (25)
the multi-aperture electrical connector includes a plurality of sets of contact pairs with different apertures, and the contact pairs with the same aperture can be regarded as a subsystem, and since the contact lifetime of the multi-aperture electrical connector depends on the subsystem with the shortest lifetime, and the lifetime of the subsystem depends on the lifetime of the contact pair which first exceeds the failure threshold.
Assuming that there are x sets of contact pairs with different apertures in the multi-aperture electrical connector, each set has ny(y is 1, 2, …, x) contact pairs, the u (u is 1, 2, …, n) of the y groupy) The life of a contact pair is expressed as
Figure BDA0003011810830000111
The life T of the y-th set of aperture contact pairsyThe expression is as follows:
Figure BDA0003011810830000112
assuming that the contact pairs are independent of each other, the life distribution function of the y-th group of contact pairs of the subsystem is as follows:
Figure BDA0003011810830000113
the contact life distribution function of the multi-aperture electrical connector is:
Figure BDA0003011810830000114
the contact reliability of the multi-aperture electrical connector is:
Figure BDA0003011810830000115

Claims (1)

1. a method for modeling contact reliability of an electrical connector having multiple apertures, comprising: the method comprises the following steps:
step one, establishing a relation model between contact pressure and pin radius, which comprises the following steps:
the contact pressure expression of the contact pair is as follows:
Figure FDA0003011810820000011
wherein E is the elastic modulus of the reed material, IzIs the moment of inertia of the cross section of the reed with respect to the neutral layer z, L is the length of the reed, f is the amount of contraction of the reed, R2The radius of curvature of the inner wall of the free end face of the reed before closing up is R, and the radius of the contact pin is R;
step two, establishing a relation model between the contact resistance and the contact pressure, which is concretely as follows:
dividing the contact element into n sections, analyzing the resistance of the combination body, the shrinkage resistance and the film layer resistance to obtain a specific expression of the contact resistance r:
Figure FDA0003011810820000012
where ρ represents the resistivity of the contact at standard temperature, α1Δ t represents the difference between the ambient temperature and the standard temperature, L, which is the temperature coefficient of resistanceoIs shown asLength of o segment, SoThe cross-sectional area of the o-th section is shown,
Figure FDA0003011810820000013
influencing the calibration coefficient for surface roughness, R3Is the radius of a fillet at the inner wall of the free end of the reed,
Figure FDA0003011810820000014
E1、E2the elastic modulus of the materials of the pin and the jack respectively, E1＝E，v1、v2Respectively the poisson ratio of the materials of the pin and the jack,
Figure FDA0003011810820000015
is the average area of the pores in the contact region between the spring and the contact pin, t is the time, k1Q is a constant, H represents the hardness of the material with lower hardness in the contact pin and the jack, and N is the number of reeds in the jack;
k2is the reaction constant under temperature stress, expressed as:
Figure FDA0003011810820000016
wherein Δ E is activation energy; k is a radical ofbBoltzmann constant; t is the temperature; Λ is a frequency factor;
since the body resistance and the shrinkage resistance are determined after the multi-aperture electric connector leaves the factory, the multi-aperture electric connector has the advantages of simple structure, low cost and high reliability
Figure FDA0003011810820000021
For a fixed value, the contact resistance r of the contact pair is expressed as:
Figure FDA0003011810820000022
step three, establishing a relation model between the contact resistance degradation rate and the temperature, which comprises the following specific steps:
in formula (4), the contact resistance r is reduced to:
r＝r0+αtq/3 (5)
carrying out an accelerated degradation life test on the multi-aperture electric connector to obtain contact resistance r and contact resistance degradation rate alpha at different times, and then fitting to obtain q, wherein the contact resistance degradation rate alpha is expressed as:
Figure FDA0003011810820000023
will k2Substituting the formula (6) to obtain:
Figure FDA0003011810820000024
step four, establishing a contact reliability model of the multi-aperture electric connector, which comprises the following steps:
the contact resistance r of a multi-aperture electrical connector contact pair varies over time, the lifetime of an individual contact pair is the time at which the contact resistance reaches a failure threshold D:
Figure FDA0003011810820000025
wherein r is0The parameter beta is q/3;
order to
Figure FDA0003011810820000026
Logarithmically deriving lnU, lnU for U follows a normal distribution, and thus the rate of degradation α of contact-to-contact resistance follows a lognormal distribution LN (μ)α,σ2) Wherein, muαAnd σ represents a logarithmic mean and a logarithmic standard deviation of the contact resistance degradation rate distribution, respectively; the degradation failure distribution of a contact pair is expressed as:
Figure FDA0003011810820000027
Figure FDA0003011810820000031
wherein, P is the failure probability of the contact pair;
there are x groups of contact pairs with different apertures in the multi-aperture electric connector, each group has nyThe lifetime of the contact pair, y being 1, 2, …, x, the jth contact pair of the jth group is shown as
Figure FDA0003011810820000032
Figure FDA0003011810820000033
The life T of the y-th group of contact pairsyThe expression is as follows:
Figure FDA0003011810820000034
the contact pairs are independent of each other, so the lifetime distribution function of the y-th group of contact pairs is:
Figure FDA0003011810820000035
the contact reliability life span distribution function of the multi-aperture electrical connector is:
Figure FDA0003011810820000036
the contact reliability of the multi-aperture electrical connector is:
Figure FDA0003011810820000037
CN202110378475.4A 2021-04-08 2021-04-08 Electric connector contact reliability modeling method with multiple apertures Withdrawn CN113111506A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113567744A (en) * 2021-07-27 2021-10-29 浙江理工大学 Method for calculating contact resistance of electric connector under storage condition
CN115980635A (en) * 2022-12-30 2023-04-18 哈尔滨工业大学 Method for predicting contact reliability of electric connector considering stress relaxation
CN116776631A (en) * 2023-07-05 2023-09-19 深圳市精微康投资发展有限公司 Connector performance evaluation method and system based on data analysis

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113567744A (en) * 2021-07-27 2021-10-29 浙江理工大学 Method for calculating contact resistance of electric connector under storage condition
CN113567744B (en) * 2021-07-27 2024-02-27 浙江理工大学 Method for calculating contact resistance of electric connector under storage condition
CN115980635A (en) * 2022-12-30 2023-04-18 哈尔滨工业大学 Method for predicting contact reliability of electric connector considering stress relaxation
CN115980635B (en) * 2022-12-30 2023-08-29 哈尔滨工业大学 Method for predicting contact reliability of electric connector by considering stress relaxation
CN116776631A (en) * 2023-07-05 2023-09-19 深圳市精微康投资发展有限公司 Connector performance evaluation method and system based on data analysis
CN116776631B (en) * 2023-07-05 2024-02-02 深圳市精微康投资发展有限公司 Connector performance evaluation method and system based on data analysis

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