CN113092074A - Optical device aging test device and method - Google Patents
Optical device aging test device and method Download PDFInfo
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- CN113092074A CN113092074A CN202110351937.3A CN202110351937A CN113092074A CN 113092074 A CN113092074 A CN 113092074A CN 202110351937 A CN202110351937 A CN 202110351937A CN 113092074 A CN113092074 A CN 113092074A
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- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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Abstract
The invention relates to the technical field of communication, and provides an optical device aging test device and a method, wherein the device comprises a temperature control system, a detection light path selector, an optical device connected with the detection light path selector and a detection optical power meter; the temperature control system automatically controls the working temperatures of the detection light path selector, the optical device and the detection optical power meter; the detection optical path selector is used for controlling the light emitted by the optical device to be connected to the detection optical power meter; the detection optical power meter is used for recording and transmitting the detected light-emitting power value in real time. The invention ensures that the light-emitting power value of the optical device is not influenced by temperature factors through the temperature control system, monitors the change of the light-emitting power value of the optical device on line by connecting the optical device and the detection optical power meter into a whole, can finish the aging test of the optical device only by plugging and unplugging once, does not need to plug and unplugging for many times to measure the light-emitting power value of the optical device before and after aging, avoids the influence of the plugging and unplugging for many times on the change of the light-emitting power value, and improves the aging test efficiency.
Description
Technical Field
The invention relates to the technical field of communication, in particular to an optical device aging test device and method.
Background
The core device of the optical module, the optical chip is in the studio, the temperature in the laser device rises continuously, if the laser chip is defective, in the high temperature aging process, under the same working current, larger heat can be generated locally, the laser device has larger temperature gradient due to the increase of the heat, the chip aging is accelerated, the output optical power is reduced obviously, generally speaking, the output optical power of an aged current optical device after the normal optical device is aged for about 24 hours tends to a stable state, the optical power change before and after aging is less than 1dB (the chip aging time, the aging current and the allowed optical power change of different manufacturers are slightly different), the optical power change before and after aging is more than 1dB or no optical failure occurs after the abnormal optical device is aged at high temperature, the bad optical device can be identified effectively by the aging mode, and the early failure optical module can be removed in time, and the quality of the optical module is ensured.
The traditional optical device mainly comprises a COB device and a TOSA device, an optical port for connecting the device is generally provided with MPO, LC and the like, the optical power change before and after aging is tested, the optical power of the optical device needs to be tested for 2 times at different periods at least, and factors influencing the optical power of the optical device comprise temperature, working current, optical port connection and the like. Because 2 tests are carried out at different periods, in order to ensure the accuracy of measurement, the working temperature, the working current and the optical port connection state of the device need to be strictly controlled, the working temperature of an optical chip needs to be stable for a relatively long time, different insertion losses can be brought by optical port plugging and unplugging at different periods, the extra losses brought by temperature and plugging and unplugging can influence the judgment of optical power change, and the judgment of qualified aged optical devices by optical device production enterprises brings serious challenges.
Disclosure of Invention
The technical problem to be solved by the invention is as follows:
the working temperature of the optical chip can be stabilized only in a long time, the condition is often ignored in the existing aging test, and different insertion losses can be caused by the insertion and extraction of optical ports in different periods; the instability of temperature and the repeated plugging and unplugging of the optical port can bring extra optical power loss, influence the judgment of the optical power change, and bring serious challenges to the judgment of qualified products of the aged optical devices for optical device production enterprises.
The invention achieves the above purpose by the following technical scheme:
in a first aspect, the present invention provides an optical device aging testing apparatus, including: the optical power meter comprises a temperature control system, a detection light path selector, an optical device connected with the detection light path selector and a detection light power meter; the temperature control system automatically controls the working temperatures of the detection light path selector, the optical device and the detection optical power meter; the detection optical path selector is used for controlling the light emitted by the optical device to be connected to the detection optical power meter; the detection optical power meter is used for recording and transmitting the detected light-emitting power value in real time.
Preferably, the optical device aging test device further comprises a standard light path selector, and a standard stable light source and a standard light power meter connected with the standard light path selector; the standard light path selector is used for controlling the light emitted by the standard stable light source to be accessed to the standard optical power meter or the detection optical power meter; the standard optical power meter is used for recording and transmitting the detected light-emitting power value in real time.
Preferably, the optical device aging test apparatus further includes a working power supply and a PC, and the PC is configured to receive and process the light output power value transmitted by the standard optical power meter and the detection optical power meter in real time.
Preferably, the optical device aging test apparatus further includes a current driver for adjusting the voltage provided by the operating power supply to a constant current value according to the type of the optical device.
Preferably, the optical device aging test apparatus further includes a communication interface; and the detection optical power meter and the standard optical power meter transmit the detected light output power value to the PC in real time through the communication interface.
Preferably, the communication interface comprises one or more of a 458, RJ45, USB and I2C interface.
In a second aspect, the present invention provides a method for testing the aging of an optical device, using the above apparatus for testing the aging of an optical device, the method comprising: the detection light path selector, the optical device connected with the detection light path selector and the detection optical power meter are arranged in the temperature control system for automatically controlling the working temperature, the PC monitors the working temperature of the optical device through the communication interface, and when the working temperature of the optical device is stabilized within a set temperature range, the PC starts to record time and the light output power value detected by the detection optical power meter;
if the change of the light-emitting power value exceeds a preset range within the set aging duration, judging that the corresponding optical device aging test result is unqualified;
and if the change of the light-emitting power value is within a preset range after the set aging duration is reached, judging that the corresponding optical device aging test result is qualified.
Preferably, in the aging test process of the optical device, the stability test is performed on the detection optical power meter in stages; and in the stability testing process, the PC machine only judges the stability testing result, and selects to continue the aging test or stop the aging test according to the stability testing result, and the aging test is regarded as unqualified.
Preferably, the step-by-step stability test of the detection optical power meter is specifically:
before a stability test is prepared, the optical path of the standard optical path selector is accessed to the standard optical power meter, and the PC records the light emitting power value detected by the standard optical power meter in real time;
when the stability test is started, the detection light path selector is closed, meanwhile, the light path of the standard light path selector is switched to the detection light power meter, and the PC records the light emitting power value detected by the detection light power meter in real time;
if the difference value between the light-emitting power value detected by the detection optical power meter and the light-emitting power value detected by the standard optical power meter is within a preset difference value range, the stability test of the corresponding detection optical power meter is qualified, and the aging test is continued;
otherwise, the stability test of the corresponding detection optical power meter is unqualified, and the aging test is stopped.
Preferably, the aging test is continued, specifically:
switching the light path of the standard light path selector back to the standard optical power meter, simultaneously opening the detection light path selector, and recording the light emergent power value detected by the standard optical power meter and the light emergent power value detected by the detection optical power meter in real time by the PC;
if the change of the light-emitting power value detected by the detection optical power meter exceeds a preset range within the set aging duration, judging that the corresponding optical device aging test result is unqualified;
and if the change of the light-emitting power value detected by the detection optical power meter is within a preset range after the set aging duration is reached, judging that the corresponding optical device aging test result is qualified.
Compared with the prior art, the invention has the beneficial effects that:
the invention ensures that the light-emitting power value of the optical device is not influenced by temperature factors through the temperature control system, monitors the change of the light-emitting power value of the optical device on line by connecting the optical device and the detection optical power meter into a whole, can finish the aging test of the optical device only by plugging and unplugging once, does not need to plug and unplugging for many times to measure the light-emitting power value of the optical device before and after aging, avoids the influence of the plugging and unplugging for many times on the change of the light-emitting power value, and improves the aging test efficiency.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required to be used in the embodiments of the present invention will be briefly described below. It is obvious that the drawings described below are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
Fig. 1 is a schematic structural diagram of an optical device aging testing apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of an optical device aging testing apparatus according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of another optical device aging testing apparatus provided in an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of another optical device aging testing apparatus provided in the embodiment of the present invention;
FIG. 5 is a flow chart of a method for burn-in testing according to an embodiment of the present invention;
FIG. 6 is a flowchart of a method for performing a stability test during a burn-in test according to an embodiment of the present invention;
fig. 7 is a flowchart of a method for continuing the burn-in test according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In the embodiments of the present invention, the symbol "/" indicates the meaning of having both functions, and the symbol "a and/or B" indicates that the combination between the preceding and following objects connected by the symbol includes three cases of "a", "B", "a and B".
In addition, the technical features involved in the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other. The invention will be described in detail below with reference to the figures and examples.
Example 1:
embodiment 1 of the present invention provides an optical device aging test apparatus, as shown in fig. 1, including: the optical power meter comprises a temperature control system, a detection light path selector, an optical device connected with the detection light path selector and a detection light power meter; the temperature control system automatically controls the working temperatures of the detection light path selector, the optical device and the detection optical power meter, so that the working temperatures of the detection light path selector, the optical device and the detection optical power meter are stabilized within a set temperature range; the detection optical path selector is used for controlling the light emitted by the optical device to be connected to the detection optical power meter; the optical device, the detection light path selector and the detection optical power meter are always in a connected state, and the detection optical power meter is used for recording and transmitting a detected light-emitting power value in real time.
Prepare right before the optical device carries out aging testing, insert the power supply line the optical device, it is right to accomplish after the aging testing of optical device, extract the power supply line the optical device, in-process, the optical device only needs once plug can accomplish aging testing, has avoided the different period right the insertion loss influence that the multitime plug of optical device brought changes the judgement to the light power value.
The optical device, the detection light path selector and the detection light power meter are always in a connection state, and the method specifically comprises the following steps: the detection light path selector and the detection light power meter are packaged in the optical device to complete a structure which is always connected, or the optical device, the detection light path selector and the detection light power meter are sequentially connected through a circuit to complete a structure which is always connected.
When the detection light path selector is in an open state, light emitted by the optical device is accessed to the detection light power meter through a light path of the detection light path selector; when the detection light path selector is in a closed state, light emitted by the optical device cannot be accessed to the detection light power meter through a light path of the detection light path selector.
As shown in fig. 2, the optical device aging test apparatus may perform an aging test on 1, 2,. or n optical devices at the same time, where the optical device 1 is connected to the detection optical power meter 1 through an optical path of the detection optical path selector 1, the optical device 2 is connected to the detection optical power meter 2 through an optical path of the detection optical path selector 2,. and the optical device n is connected to the detection optical power meter n through an optical path of the detection optical path selector n, where a dashed box indicates that the optical device 1, the optical device 2,. and the optical device n are located in the same temperature control system and are controlled by the same temperature control system to operate at a temperature; the PC is used for receiving the light-emitting power values transmitted by the optical device 1, the optical device 2,. and the optical device n in real time.
In the embodiment of the present invention, as shown in fig. 3, in order to avoid the influence of the temperature on the stability of the detection optical power meter, and further influence the reliability of the aging test result, the optical device aging test apparatus further includes a standard optical path selector, and a standard stable light source and a standard optical power meter connected thereto; the standard light path selector is used for controlling the light emitted by the standard stable light source to be accessed to the standard optical power meter or the detection optical power meter; the standard optical power meter is used for recording and transmitting the detected light-emitting power value in real time.
The standard light path selector is configured to control access of light emitted by the standard stable light source to the standard optical power meter or the detection optical power meter, and specifically includes: when the optical path of the standard optical path selector is connected to the standard optical power meter, the standard optical power meter detects the light output power value of the standard stable light source in real time; and under the condition that the light path of the standard light path selector is switched to the detection light power meter, the detection light path selector is in a closed state, and the detection light power meter detects the light emitting power value of the standard stable light source in real time.
In the embodiment of the present invention, the optical device aging test apparatus further includes a working power supply and a PC, and the PC is configured to receive and process the light output power values transmitted by the standard optical power meter and the detection optical power meter in real time.
The working power supply is used for providing working voltage for the optical device aging test device, and the common voltage is 3.3V; and the PC scans the working temperature of the online optical device in real time, and starts to record time and the light output power value transmitted by the standard optical power meter and/or the detection optical power meter in real time when the working temperature of the optical device is stabilized within a set temperature range.
The PC is used for receiving and processing the light emitting power values transmitted by the standard optical power meter and the detection optical power meter in real time, and specifically comprises the following steps:
and the PC is used for receiving the light output power value of the standard stable light source detected by the standard optical power meter in real time and the light output power value of the optical device detected by the detection optical power meter.
And the PC is used for receiving the light output power value of the standard stable light source detected by the detection optical power meter in real time.
And the PC judges the stability of the detection optical power meter by comparing the light output power value of the standard stable light source detected by the standard optical power meter in real time in the open state of the optical path selector with the light output power value of the standard stable light source detected by the detection optical power meter in real time in the closed state of the optical path selector in adjacent time periods.
As shown in fig. 3, the optical device aging test apparatus may perform an aging test on 1, 2,. or n optical devices at the same time, where the optical device 1 is connected to the detection optical power meter 1 through an optical path of the detection optical path selector 1, and the optical device 2 is connected to the detection optical power meter 2 through an optical path of the detection optical path selector 2,. and the optical device n is connected to the detection optical power meter n through an optical path of the detection optical path selector n, where a dashed box indicates that the optical device 1, the optical device 2,. and the optical device n are located in the same temperature control system and are controlled by the same temperature control system, and the standard stable light source, the standard optical path selector and the standard optical power meter are outside the temperature control system and do not change in temperature due to the control of the temperature control system; the PC is used for receiving the light-emitting power values transmitted by the optical device 1, the optical device 2,. and the optical device n in real time.
In the embodiment of the present invention, as shown in fig. 4, for an optical device without a current driver, such as a TOSA device, because a dynamic range of a common operating power supply is too large, the optical device without the current driver cannot be directly driven to operate, and the optical device aging test apparatus further includes a current driver for adjusting a voltage provided by the operating power supply to a constant current value according to a type of the optical device.
The current value that different types of optical devices required is different, and for example the current value that the COB device required is 10mA, and the fluctuation range about the current value can not exceed 10% of required current value, the current driver is used for with the voltage adjustment that operating power supply provided is 10 mA's current value, ensures that the COB device can normally work.
Generally, a current driver, a detection light path selector and a detection optical power meter are often packaged in the COB device, and if the current driver is packaged in the COB device, the current driver does not need to be additionally arranged in the optical device aging test device; similarly, when a COB device is internally packaged with a detection light path selector and a detection light power meter, the detection light path selector and the detection light power meter do not need to be additionally connected outside the COB device.
If the cost factor is not considered, the ordinary working power supply can be replaced by a high-precision power supply, and in this case, the voltage can be adjusted to a constant current value according to the type of the optical device only by the high-precision power supply without the current driver.
Common types of optical devices include COB, TOSA, or ROSA optical devices.
And the PC controls the current driver to load corresponding driving current for the optical device by issuing and inquiring the type of the optical device, namely the current driver is used for receiving an instruction of the PC and adjusting the voltage of the working power supply to be a constant current value according to the type of the optical device.
In the embodiment of the invention, the device also comprises a communication interface; the detection optical power meter and the standard optical power meter transmit the detected light output power value to the PC in real time through the communication interface, the PC issues and inquires the type of the optical device through the communication interface, and the communication interface controls the current driver to load corresponding driving current for the optical device.
In the embodiment of the invention, the communication interfaces comprise one or more of 458 interfaces, RJ45 interfaces, USB interfaces and I2C interfaces, different communication interfaces are selected according to the types of the light outlets, and common types of the light outlets comprise MPO and LC.
Example 2:
in step 201, the detection optical path selector, the optical device connected to the detection optical path selector, and the detection optical power meter are placed in the temperature control system for automatically controlling the working temperature.
In step 202, the PC monitors the operating temperature of the optical device through the communication interface, and starts to record time and the light output power value detected by the detection optical power meter when the operating temperature of the optical device is stabilized within a set temperature range.
In step 203, if the variation of the light output power value exceeds the preset range within the set aging duration, it is determined that the corresponding aging test result of the optical device is not qualified.
In step 204, if the variation of the light output power value is within the preset range after the set aging duration is reached, it is determined that the corresponding aging test result of the optical device is qualified.
The set temperature range is adjusted according to the performance requirements of different optical devices and is a preset working temperature range.
The set aging duration is adjusted according to the performance requirements of different optical devices, and the set aging duration is a fixed value; and if the variation of the light-emitting power value detected by the detection optical power meter is within a preset range after the aging test time plus the stability test time reaches a set aging duration, judging that the corresponding optical device aging test result is qualified.
The preset range is set according to the performance requirements of different optical devices and is a preset change range of the light output power value.
In the embodiment of the present invention, in order to avoid the influence of the temperature on the stability of the detection optical power meter and further influence the reliability of the aging test result, the stability test is performed on the detection optical power meter in stages in the aging test process of the optical device; and in the stability testing process, the PC machine only judges the stability testing result, and selects to continue the aging test or stop the aging test according to the stability testing result, and the aging test is regarded as unqualified.
In the embodiment of the present invention, as shown in fig. 6, the step of performing the stability test on the detection optical power meter specifically includes:
in step 301, before a stability test is prepared, the optical path of the standard optical path selector is accessed to the standard optical power meter, and the PC records the light output power value of the standard stable light source detected by the standard optical power meter in real time.
In step 302, when the stability test is started, the detection optical path selector is closed, and the optical path of the standard optical path selector is switched to the detection optical power meter, and the PC records the light output power value of the standard stable light source detected by the detection optical power meter in real time.
In step 303, the PC calculates a difference between the light output power value of the standard stable light source detected by the detection optical power meter and the light output power value of the standard stable light source detected by the standard optical power meter.
In step 304, if the difference is within the preset difference range, the stability test of the corresponding detection optical power meter is qualified, and the aging test is continued.
In step 305, if the difference exceeds the preset difference range, the stability test of the corresponding detection optical power meter is not qualified, and the aging test is stopped.
The preset difference range is a preset difference range between the light output power value of the standard stable light source detected by the standard optical power meter and the light output power value of the standard stable light source detected by the detection optical power meter, and is generally positive or negative 0.5dB precision, and the difference belongs to an absolute value calibration difference and does not influence the relative change precision requirement of an aging power test; in an adjacent time period, theoretically, the difference between the light output power value of the standard stabilized light source and the light output power value of the standard stabilized light source detected by the detection optical power meter should be 0, but in an actual test process, fluctuation of the light output power value is inevitably generated, so that the stability of the detection optical power meter in an aging test process is judged according to whether the difference between the light output power value of the standard stabilized light source detected by the detection optical power meter and the light output power value of the standard stabilized light source detected by the standard optical power meter is within a preset difference range.
In the embodiment of the present invention, as shown in fig. 7, the continuing of the aging test specifically includes:
in step 401, the optical path of the standard optical path selector is switched back to the standard optical power meter, the detection optical path selector is turned on, and the PC switches back to the aging test mode.
In step 402, the PC records the light output power value detected by the standard optical power meter and the light output power value detected by the detection optical power meter in real time.
In step 403, if the variation of the output optical power value of the optical device detected by the detection optical power meter exceeds a preset range within a set aging duration, it is determined that the corresponding optical device aging test result is not qualified.
In step 404, if the variation of the output optical power value of the optical device detected by the detection optical power meter is within a preset range after the set aging duration is reached, it is determined that the corresponding aging test result of the optical device is qualified.
In the whole testing process, the PC machine has two judging modes of an aging test and a stability test:
and when the detection light path selector is in an open state, the PC enters an aging test judging mode, and the PC judges whether an aging test result is qualified according to whether the change of the light output power value of the optical device is within a preset range.
When the detection light path selector is in a closed state, the PC enters a stability test judging mode, the PC judges whether a stability test result is qualified according to whether the difference value between the light output power value of the standard stable light source detected by the detection light power meter and the light output power value of the standard stable light source detected by the standard light power meter is within a preset difference value range, if the stability test is qualified, the aging test is continued, if the stability test is unqualified, the aging test is stopped, and the aging test is stopped to judge that the aging test result is unqualified.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. An optical device burn-in test apparatus, comprising: the optical power meter comprises a temperature control system, a detection light path selector, an optical device connected with the detection light path selector and a detection light power meter; the temperature control system automatically controls the working temperatures of the detection light path selector, the optical device and the detection optical power meter; the detection optical path selector is used for controlling the light emitted by the optical device to be connected to the detection optical power meter; the detection optical power meter is used for recording and transmitting the detected light-emitting power value in real time.
2. The optical device aging test apparatus according to claim 1, further comprising a standard optical path selector, and a standard stable light source and a standard optical power meter connected thereto; the standard light path selector is used for controlling the light emitted by the standard stable light source to be accessed to the standard optical power meter or the detection optical power meter; the standard optical power meter is used for recording and transmitting the detected light-emitting power value in real time.
3. The optical device aging testing apparatus as claimed in claim 2, further comprising an operating power supply and a PC, wherein the PC is configured to receive and process the light output power values transmitted by the standard optical power meter and the detection optical power meter in real time.
4. The device aging test apparatus according to claim 3, further comprising a current driver for adjusting the voltage supplied from the operating power supply to a constant current value according to the type of the optical device.
5. The optical device burn-in apparatus according to claim 3 or 4, further comprising a communication interface; and the detection optical power meter and the standard optical power meter transmit the detected light output power value to the PC in real time through the communication interface.
6. The device burn-in apparatus of claim 5, wherein the communication interface comprises one or more of 458, RJ45, USB, and I2C interfaces.
7. An optical device burn-in test method using the optical device burn-in test apparatus of claim 5, the method comprising: the detection light path selector, the optical device connected with the detection light path selector and the detection optical power meter are arranged in the temperature control system for automatically controlling the working temperature, the PC monitors the working temperature of the optical device through the communication interface, and when the working temperature of the optical device is stabilized within a set temperature range, the PC starts to record time and the light output power value detected by the detection optical power meter;
if the change of the light-emitting power value exceeds a preset range within the set aging duration, judging that the corresponding optical device aging test result is unqualified;
and if the change of the light-emitting power value is within a preset range after the set aging duration is reached, judging that the corresponding optical device aging test result is qualified.
8. The method of claim 7, wherein the testing optical power meter is tested for stability in a staged manner during the burn-in test of the optical device; and in the stability testing process, the PC machine only judges the stability testing result, and selects to continue the aging test or stop the aging test according to the stability testing result, and the aging test is regarded as unqualified.
9. The method according to claim 8, wherein the step-wise performing the stability test on the detection optical power meter includes:
before a stability test is prepared, the optical path of the standard optical path selector is accessed to the standard optical power meter, and the PC records the light emitting power value detected by the standard optical power meter in real time;
when the stability test is started, the detection light path selector is closed, meanwhile, the light path of the standard light path selector is switched to the detection light power meter, and the PC records the light emitting power value detected by the detection light power meter in real time;
if the difference value between the light-emitting power value detected by the detection optical power meter and the light-emitting power value detected by the standard optical power meter is within a preset difference value range, the stability test of the corresponding detection optical power meter is qualified, and the aging test is continued;
otherwise, the stability test of the corresponding detection optical power meter is unqualified, and the aging test is stopped.
10. The method for burn-in testing of optical devices according to claim 9, wherein the continuing burn-in testing is performed by:
switching the light path of the standard light path selector back to the standard optical power meter, simultaneously opening the detection light path selector, and recording the light emergent power value detected by the standard optical power meter and the light emergent power value detected by the detection optical power meter in real time by the PC;
if the change of the light-emitting power value detected by the detection optical power meter exceeds a preset range within the set aging duration, judging that the corresponding optical device aging test result is unqualified;
and if the change of the light-emitting power value detected by the detection optical power meter is within a preset range after the set aging duration is reached, judging that the corresponding optical device aging test result is qualified.
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| CN114199515A (en) * | 2021-12-09 | 2022-03-18 | 中海石油(中国)有限公司 | Method for testing hydrogen loss aging of underground optical fiber |
| CN114301522A (en) * | 2021-12-25 | 2022-04-08 | 长飞光纤光缆股份有限公司 | Optical module aging test method and system |
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