CN113066412B - Circuit control method, detection method and preparation method of array substrate - Google Patents
Circuit control method, detection method and preparation method of array substrate Download PDFInfo
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- CN113066412B CN113066412B CN202110344715.9A CN202110344715A CN113066412B CN 113066412 B CN113066412 B CN 113066412B CN 202110344715 A CN202110344715 A CN 202110344715A CN 113066412 B CN113066412 B CN 113066412B
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- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
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Abstract
The invention provides a circuit control method, a detection method and a preparation method of an array substrate, belongs to the technical field of display, and can solve the problems that an existing OLED display panel is prone to poor display phenomena of bright spot type with lines and bright spot clusters, the poor display phenomena are intelligently detected in a panel detection stage, and repair cannot be carried out. The circuit control method of the array substrate is used for controlling the circuit of the array substrate in the detection stage process of the array substrate; the circuit control method comprises the following steps: writing a turn-off signal into a control end of the pixel circuit to turn off the pixel circuit; an initialization stage: writing a first charge signal to at least a part of the signal lines; writing a first control signal into the control end of the sensing unit, and writing a first sensing signal into the second end of the sensing unit so as to turn off the sensing unit; a detection stage: and writing a second control signal into the control end of the sensing unit to start the sensing unit, and writing the second sensing signal into the pixel voltage output end.
Description
Technical Field
The invention belongs to the technical field of display, and particularly relates to a circuit control method and a detection method of an array substrate and a preparation method of a display panel.
Background
An Organic Light-Emitting Diode (OLED) is a display device having characteristics of self-luminescence, wide viewing angle, fast response, wide color gamut, high definition and contrast, and capability of realizing flexible display. Therefore, the OLED display panel has strong competitiveness in the display panel of a new age, and is considered as the display panel with the most potential development by the industry.
In the prior art, in order to ensure the factory yield of the OLED display panel, display detection is performed before the OLED display panel leaves the factory.
The inventor finds that the OLED display panel is prone to have a bad display phenomenon of a bright spot strip line bright spot cluster type, the bad display phenomenon can be found in a ct (cell test) stage and a module detection stage, but the bad display phenomenon cannot be repaired or compensated in the module stage, even if the bad problem is detected, the OLED display panel is scrapped, and the improvement of the product yield of the OLED display panel is not facilitated.
Disclosure of Invention
The present invention is directed to solve AT least one of the problems of the related art, and provides a circuit control method for an array substrate, which can be used for performing a failure detection in an AT detection.
The technical scheme adopted for solving the technical problem is a circuit control method of the array substrate, which is used for controlling a circuit of the array substrate in the detection stage process of the array substrate; the array substrate includes: a pixel circuit, a signal line, and a sensing unit; the pixel voltage output end of the pixel circuit is connected with the light-emitting unit; the first end of the sensing unit is connected with the pixel voltage output end; the circuit control method includes:
writing a turn-off signal into a control end of the pixel circuit to turn off the pixel circuit;
an initialization stage: writing a first charge signal to at least a part of the signal lines; writing a first control signal into a control end of the sensing unit, and writing a first sensing signal into a second end of the sensing unit so as to turn off the sensing unit;
a detection stage: and writing a second control signal into the control end of the sensing unit so as to start the sensing unit, and writing the second sensing signal into the pixel voltage output end.
Optionally, the signal line includes: a data line and a first signal line; the pixel circuit includes: the control module and the driving module; the first end of the control module is connected with the data line, and the second end of the control module is connected with the control end of the driving module; the first end of the control module is connected with the first signal wire, and the second end of the control module is the pixel voltage output end;
the writing of the first charge signal to at least part of the signal lines includes: writing a first charging signal to one of the first signal line and the data line; at the same time, the other is suspended.
Further optionally, the writing the first charging signal to at least a part of the signal lines includes: writing a first charging signal to the first signal line; and meanwhile, suspending the data line.
Optionally, after writing the second control signal to the control terminal of the sensing unit and maintaining the first time period, the method further includes:
writing a second sensing signal to a second end of the sensing unit to turn off the sensing unit.
Further optionally, the second sensing signal and the second control signal have the same voltage.
Further optionally, the range of the first period of time includes 800-.
Optionally, the circuit control method further includes:
a reset stage: and writing reset signals into the signal lines, the sensing units and the pixel circuits so as to reset each circuit structure on the array substrate.
The technical scheme adopted for solving the technical problem of the invention is a detection method of an array substrate, which comprises any one of the circuit control methods.
Optionally, the detection method further includes:
in the detection stage: detecting the voltage of the signal line of the array substrate and the pixel voltage of the pixel voltage output end;
performing optical imaging according to the voltage difference between the voltage of the signal line and the pixel voltage; the optical imaging brightness is related to the voltage difference;
and determining the bad position of the array substrate according to the optical imaging result.
The technical scheme adopted for solving the technical problem of the invention is a preparation method of a display panel, which comprises the following steps:
preparing an array substrate; the array substrate includes: a pixel circuit, a signal line, a light emitting unit, and a sensing unit; a pixel voltage output end of the pixel circuit is connected with the light emitting unit; the first end of the sensing unit is connected with the pixel voltage output end;
and detecting the array substrate according to any one of the detection methods.
Drawings
Fig. 1 is a schematic circuit diagram of an array substrate according to an embodiment of the invention;
fig. 2 is a circuit timing diagram of a circuit control method of an array substrate according to an embodiment of the invention;
fig. 3 is a schematic diagram of a detection result of the VIOS system of the detection method according to the embodiment of the invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
Example 1:
in the prior art, after the display product structures such as the array substrate, the display panel and the display module are prepared, the display product structures need to be detected, defects existing in the display product structures are found in time, repair is carried out in time, and the delivery yield of the display product structures is improved. In the Array substrate detection (AT) stage, the Array substrate may be detected by a VIOS (voltage imaging optical subsystem) system, so as to detect whether each signal line in the Array substrate has a short circuit or an open circuit, but the bad display phenomenon of the bright spot cluster type with the line bright spot in the Array substrate cannot be detected.
The embodiment provides a circuit control method of an array substrate, which can be used for controlling a circuit of the array substrate in a detection stage process of the array substrate. The circuit control method provided by the embodiment is particularly suitable for performing circuit control on the OLED display array substrate when the OLED display array substrate is detected. The array substrate may include: pixel circuits, signal lines, and sensing units, light emitting units, and the like. The pixel voltage output end of the pixel circuit is connected with the light-emitting unit; the first end of the sensing unit is connected with the pixel voltage output end. Wherein, the pixel circuit can include: the control module and the driving module; the first end of the control module is connected with the data line Vdata, and the second end of the control module is connected with the control end of the driving module; the first end of the control module is connected with the first signal line VDD, and the second end is a pixel voltage output end. The signal lines may include a data line Vdata, a first signal line VDD, a gate line, a sensing line Sense, and the like. In the array substrate, the pixel circuit can be controlled by the gate line, the first signal line VDD, the data line Vdata and the like, so that the display light-emitting unit is controlled to perform light-emitting display. In addition, the sensing unit can Sense the pixel voltage of the pixel voltage output end of the pixel circuit and output the pixel voltage through the sensing line Sense, so that the pixel circuit is compensated according to the sensed pixel voltage, and the uniform display of all the pixel units of the whole array substrate is ensured.
The circuit control method provided by the embodiment includes an initialization stage and a detection stage, and may specifically include:
and writing a turn-off signal into the control end of the pixel circuit to turn off the pixel circuit.
An initialization stage: writing a first charge signal to at least a part of the signal lines; and writing the first control signal into the control end of the sensing unit, and writing the first sensing signal into the second end of the sensing unit so as to turn off the sensing unit.
A detection stage: and writing a second control signal into the control end of the sensing unit to start the sensing unit, and writing the second sensing signal into the pixel voltage output end.
The circuit control method provided by the embodiment is used for controlling the circuit of the array substrate in the AT stage, so that the array substrate is detected by using the VIOS system, and the detection of the bad display phenomenon of the bright spot strip line bright spot cluster type of the array substrate is further realized. Specifically, when the array substrate is detected, the voltage of each signal line of the array substrate and the pixel voltage at the pixel voltage output terminal of the pixel circuit can be detected by the VIOS system. The VIOS system can detect the average voltage of the signal lines and the pixel voltage in each pixel circuit in the array substrate, perform optical imaging according to the voltage difference between the pixel voltage and the average voltage of the signal lines, and find out the poor display phenomenon of the bright spot with the line bright spot cluster type of the array substrate according to different luminance converted from different voltage differences.
It is found through research that the defective display phenomenon of the bright dot strip line bright dot cluster type of the array substrate is caused by the influence of the weak migration between the gate and the active layer of the sensing transistor T3 in the sensing unit on the pixel voltage. That is, in a plurality of pixel circuits on the same array substrate, even if the same data voltage is written to each pixel circuit, the pixel voltage in the pixel cell in which weak migration occurs is different from the pixel voltage in the pixel cell in which weak migration does not occur. Therefore, by detecting the voltage (i.e., the second sensing signal) written to the pixel voltage output terminal of the pixel circuit via the sensing unit in each pixel unit, the defective display phenomenon position of the bright dot cluster type of the bright dot strip line of the array substrate can be detected (as shown in fig. 3). In the circuit control method provided by this embodiment, each pixel circuit on the array substrate is turned off through circuit control, and the pixel circuit does not output the pixel voltage to the pixel voltage output terminal.
It is understood that, in the present embodiment, the sensing unit generally includes a sensing transistor T3, and the turn-on and turn-off of the sensing unit are related to the voltage difference between the control signal written to the control terminal of the sensing unit and the sensing signal written to the second terminal of the sensing unit. Therefore, in the present embodiment, in the initialization stage, the sensing unit is controlled to be turned off by controlling the pressure difference between the first control signal and the first sensing signal; in the detection phase, the control signal of the control end of the sensing unit is changed (from the first control signal to the second control signal) to control the conduction of the sensing unit, and the second sensing signal is written into the state of the pixel voltage output end. Therefore, whether the sensing units of the pixel units in the array substrate are weakly migrated or not can be determined according to the voltage of the voltage output end of each pixel on the array substrate. Meanwhile, the pixel circuit is in a turn-off non-working state, and voltage cannot be supplied to the pixel voltage output end, so that the pixel circuit cannot influence a detection result.
The circuit control method provided by the embodiment is preferably used in the detection process of the array substrate by the VIOS system. It should be noted that, when the VIOS system detects the array substrate, the VIOS system does not directly detect the value of the pixel voltage in each pixel circuit of the array substrate, but detects the difference between the average voltage of the signal line and the pixel voltage of each pixel circuit, and directly performs optical imaging according to the voltage difference, and the display brightness converted from different voltage differences is different. Therefore, as shown in fig. 3, the defective position of the array substrate can be determined according to the brightness abnormal point in the image presented by the VIOS system when detecting the array substrate. Specifically, in this embodiment, the pixel circuit is controlled to be turned off, and the charging signal is input to at least a part of the signal lines, and the sensing signal is input to the sensing unit through the sensing line Sense and is transmitted to the pixel voltage output terminal, so that the VIOS system detects the array substrate, and the optical image can be normally displayed.
Optionally, in this embodiment, the signal line includes: a data line Vdata and a first signal line VDD; the pixel circuit includes: the device comprises a control module and a driving module; the first end of the control module is connected with the data line Vdata, and the second end of the control module is connected with the control end of the driving module; the first end of the control module is connected with a first signal wire VDD, and the second end of the control module is a pixel voltage output end; writing the first charge signal to at least a portion of the signal lines includes: writing a first charging signal to one of the first signal line VDD and the data line Vdata; at the same time, the other is suspended.
In the VIOS system, an electro-optical image is displayed based on a voltage difference between an average voltage of a signal line and a pixel voltage. It can be understood that the number of signal lines in the array substrate is large. In this embodiment, only the charge signal is written into some of the signal lines. Meanwhile, the rest signal wires are suspended, so that the influence on the normal charging of the charging signal wires can be avoided.
Further optionally, in this embodiment, writing the first charging signal to at least part of the signal lines includes: writing a first charging signal to a first signal line VDD; meanwhile, the data line Vdata is suspended. In this embodiment, the first signal line VDD is connected to an input terminal of a driving unit of the pixel circuit, and generally, the first signal line VDD has a wider line width and a better signal transmission effect.
Optionally, as shown in fig. 2, in this embodiment, after writing the second control signal to the control terminal of the sensing unit and maintaining the first time period, the method further includes: and writing a second sensing signal into the second end of the sensing unit so as to turn off the sensing unit.
It is understood that in a normal manufacturing process of the display panel, after the array substrate is inspected, other operations are also performed on the array substrate. In this embodiment, the sensing unit may be turned off by writing the second sensing signal to the second end of the sensing unit.
Preferably, the range of the first period of time includes 800-. It can be understood that the duration of the first time period is not required to be too long as the detection requirement can be met.
Optionally, the voltage of the second sensing signal is the same as the voltage of the second control signal. It is understood that, in the present embodiment, the sensing unit generally includes a sensing transistor T3. Taking the sensing transistor T3 as an N-type transistor, the sensing transistor T3 can be turned on when the voltage difference between the control electrode and the input electrode of the sensing transistor T3 is greater than the threshold voltage. In this embodiment, the control of the working state of the sensing unit can be realized by only controlling the differential pressure between the control signal and the sensing signal of the sensing unit. In this embodiment, the sensing unit can be controlled to be turned off by controlling the second sensing signal to have the same voltage as the second control signal, and the voltage writing to the output end of the pixel electrode is stopped.
Preferably, the circuit control method provided in this embodiment further includes: a reset stage: and writing reset signals into the signal lines, the sensing units and the pixel circuits so as to reset each circuit structure on the array substrate.
Specifically, as shown in fig. 1 and 2, in this embodiment, the storage capacitor C1 in the pixel circuit is controlled to discharge by writing a low-level signal to each signal line, so that the electric signal residue of the previous frame is eliminated.
As shown in fig. 1, the pixel circuit of the array substrate may include: the control transistor T1, the driving transistor T2, and the storage capacitor C1. Preferably, the control transistor T1 and the driving transistor T2 are N-type transistors. Specifically, as shown in fig. 2, in the circuit control method provided in this embodiment, in the initialization stage, a first charging signal (for example, an 8V voltage signal) is written into the first signal line VDD, and meanwhile, the data line Vdata is suspended. At the same time, a non-operating voltage (for example, -20V voltage signal) is written to the gate G1 of the control transistor T1, controlling the control transistor T1 to turn off; the voltage of the control electrode of the driving transistor T2 is the same as the voltage of the output end of the control transistor T1, and the driving transistor T2 is turned off; a first control voltage (e.g., -25V voltage signal) is written to the control electrode G2 of the sense transistor T3, a first sense voltage (e.g., -20V voltage signal) is written to the first electrode of the sense transistor T3, and the sense transistor T3 is controlled to turn off. In the detection phase, the voltage supplied to the first signal line VDD is kept constant while the control transistor T1 is kept in the off state. The sensing transistor T3 is controlled to be turned on by the sensing line Sense continuing to write the first sensing voltage to the first pole of the sensing transistor T3 and writing the second control signal (e.g., -10V voltage signal) to the control pole of the sensing transistor T3. At this time, the first sensing voltage is written in the pixel voltage output terminal and is detected by the VIOS system (the voltage transmitted to the pixel voltage output terminal is less than the first sensing voltage). The VIOS system detects a voltage difference between an average voltage (namely, a first charging voltage) of the first signal line on the array substrate and a pixel voltage output end of each pixel unit, and performs photon imaging display according to the voltage difference. After the first time end, a second sensing voltage (e.g., -10V voltage signal) is written to the first pole of the sensing transistor T3 through the sensing line Sense, the sensing transistor T3 is controlled to turn off, and the detection is ended.
It is understood that, in the embodiment, during the detection phase, the driving transistor T2 is turned off, the sensing transistor T3 is turned on, and the sensing transistor T3 writes the second sensing voltage into the pixel voltage output terminal. Here, it can be understood that, due to the characteristics of the sensing transistor T3, the voltage actually output by the sensing unit is smaller than the first sensing voltage output by the sensing line Sense. If the sensing unit has weak transition, the voltage at the pixel voltage output terminal is equal to the voltage of the gate of the sensing transistor T3. That is, the pixel voltage of the normal pixel unit is different from the pixel voltage of the pixel unit with weak transition, so the brightness of the corresponding different pixel unit converted by the VIOS system is also different, thereby confirming whether the array is basically in failure.
Example 2:
the present embodiment provides a method for detecting an array substrate, including any one of the way control methods provided in embodiment 1.
Optionally, in the detection method provided in this embodiment, the method further includes:
in the detection stage: and detecting the voltage of the signal line of the array substrate and the pixel voltage of the pixel voltage output end. Performing optical imaging according to the voltage difference between the voltage of the signal line and the pixel voltage; the optical imaging brightness is related to the voltage difference; and determining the bad position of the array substrate according to the optical imaging result.
In the detection method provided by the embodiment, the voltage of each signal line of the array substrate and the pixel voltage at the pixel voltage output terminal of the pixel circuit can be detected by the VIOS system. The VIOS system can detect the average voltage of the signal lines and the pixel voltage in each pixel circuit in the array substrate, perform optical imaging according to the voltage difference between the pixel voltage and the average voltage of the signal lines, and find out the poor display phenomenon of the bright spot with the line bright spot cluster type of the array substrate according to different luminance converted from different voltage differences.
Example 3;
the embodiment provides a preparation method of a display panel, which comprises the following steps:
s1, preparing an array substrate; the array substrate includes: a pixel circuit, a signal line, a light emitting unit, and a sensing unit; the pixel voltage output end of the pixel circuit is connected with the light-emitting unit; the first end of the sensing unit is connected with the pixel voltage output end.
And S2, detecting the array substrate.
Specifically, in this step, the array substrate can be detected according to the detection method provided in embodiment 2, and a poor display phenomenon of the bright spot with line bright spot cluster type of the array substrate can be discovered.
Optionally, in the preparation method provided in this embodiment, when the array substrate is detected to have the above-mentioned adverse condition, a step of repairing the array substrate may also be included, and related data may be specifically referred to, which is not described in this embodiment again.
It will be understood that the above embodiments are merely exemplary embodiments adopted to illustrate the principles of the present invention, and the present invention is not limited thereto. It will be apparent to those skilled in the art that various modifications and improvements can be made without departing from the spirit and substance of the invention, and these modifications and improvements are also considered to be within the scope of the invention.
Claims (9)
1. A circuit control method of an array substrate is used for controlling a circuit of the array substrate in the detection stage process of the array substrate; the array substrate includes: a pixel circuit, a signal line, and a sensing unit; the pixel voltage output end of the pixel circuit is connected with the light-emitting unit; the first end of the sensing unit is connected with the pixel voltage output end; the circuit control method is characterized by comprising the following steps:
writing a turn-off signal to a control terminal of the pixel circuit to turn off the pixel circuit;
an initialization stage: writing a first charge signal to at least a part of the signal lines; writing a first control signal into a control end of the sensing unit, and writing a first sensing signal into a second end of the sensing unit so as to turn off the sensing unit;
a detection stage: writing a second control signal into the control end of the sensing unit to enable the sensing unit to be started, and writing a second sensing signal into the pixel voltage output end;
after the writing of the second control signal to the control terminal of the sensing unit and the maintaining for the first time period, the method further includes:
writing a second sensing signal to a second end of the sensing unit to turn off the sensing unit.
2. The circuit control method according to claim 1, wherein the signal line includes: a data line and a first signal line; the pixel circuit includes: the control module and the driving module; the first end of the control module is connected with the data line, and the second end of the control module is connected with the control end of the driving module; the first end of the control module is connected with the first signal wire, and the second end of the control module is the pixel voltage output end;
the writing of the first charge signal to at least part of the signal lines includes: writing a first charging signal to one of the first signal line and the data line; at the same time, the other is suspended.
3. The circuit control method according to claim 2, wherein the writing of the first charge signal to at least part of the signal lines comprises: writing a first charging signal to the first signal line; and meanwhile, suspending the data line.
4. The circuit control method according to claim 1, wherein the second sensing signal and the second control signal have the same voltage.
5. The circuit control method as claimed in claim 1, wherein the range of the first period comprises 800-1500 μ sec.
6. The circuit control method according to claim 1, further comprising:
a reset stage: and writing reset signals into the signal lines, the sensing units and the pixel circuits so as to reset each circuit structure on the array substrate.
7. An inspection method for an array substrate, comprising the circuit control method according to any one of claims 1 to 6.
8. The detection method according to claim 7, further comprising:
in the detection stage: detecting the voltage of the signal line of the array substrate and the pixel voltage of the pixel voltage output end;
performing optical imaging according to the voltage difference between the voltage of the signal line and the pixel voltage; the optical imaging brightness is related to the voltage difference;
and determining the bad position of the array substrate according to the optical imaging result.
9. A method for manufacturing a display panel, comprising:
preparing an array substrate; the array substrate includes: a pixel circuit, a signal line, a light emitting unit, and a sensing unit; a pixel voltage output end of the pixel circuit is connected with the light emitting unit; the first end of the sensing unit is connected with the pixel voltage output end;
the method of claim 7 or 8, wherein the array substrate is inspected.
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107516483A (en) * | 2017-09-28 | 2017-12-26 | 京东方科技集团股份有限公司 | Electrical detection method, device and the display module of device fault |
| CN107705737A (en) * | 2017-09-28 | 2018-02-16 | 京东方科技集团股份有限公司 | The detection method and device of poor short circuit |
| CN108877611A (en) * | 2018-07-16 | 2018-11-23 | 深圳市华星光电半导体显示技术有限公司 | Pixel-driving circuit method for sensing and pixel-driving circuit |
| EP3605511A1 (en) * | 2017-03-31 | 2020-02-05 | Boe Technology Group Co. Ltd. | Circuit and method for detecting invalid pixel, and display device |
| CN110969989A (en) * | 2019-12-20 | 2020-04-07 | 京东方科技集团股份有限公司 | Driving method and control driving method for pixel circuit |
| CN111785195A (en) * | 2019-04-04 | 2020-10-16 | 合肥鑫晟光电科技有限公司 | Driving method of pixel circuit, compensation device and display equipment |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105118438B (en) * | 2015-09-21 | 2017-07-25 | 京东方科技集团股份有限公司 | Pixel-driving circuit, method, image element circuit and display device |
| CN108417169B (en) * | 2018-03-27 | 2021-11-26 | 京东方科技集团股份有限公司 | Detection method of pixel circuit, driving method of display panel and display panel |
-
2021
- 2021-03-29 CN CN202110344715.9A patent/CN113066412B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3605511A1 (en) * | 2017-03-31 | 2020-02-05 | Boe Technology Group Co. Ltd. | Circuit and method for detecting invalid pixel, and display device |
| CN107516483A (en) * | 2017-09-28 | 2017-12-26 | 京东方科技集团股份有限公司 | Electrical detection method, device and the display module of device fault |
| CN107705737A (en) * | 2017-09-28 | 2018-02-16 | 京东方科技集团股份有限公司 | The detection method and device of poor short circuit |
| CN108877611A (en) * | 2018-07-16 | 2018-11-23 | 深圳市华星光电半导体显示技术有限公司 | Pixel-driving circuit method for sensing and pixel-driving circuit |
| CN111785195A (en) * | 2019-04-04 | 2020-10-16 | 合肥鑫晟光电科技有限公司 | Driving method of pixel circuit, compensation device and display equipment |
| CN110969989A (en) * | 2019-12-20 | 2020-04-07 | 京东方科技集团股份有限公司 | Driving method and control driving method for pixel circuit |
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