CN113063563A - Distance induction-based factory assembly line test auxiliary method - Google Patents
Distance induction-based factory assembly line test auxiliary method Download PDFInfo
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- CN113063563A CN113063563A CN202110277649.8A CN202110277649A CN113063563A CN 113063563 A CN113063563 A CN 113063563A CN 202110277649 A CN202110277649 A CN 202110277649A CN 113063563 A CN113063563 A CN 113063563A
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- 238000012360 testing method Methods 0.000 title claims abstract description 107
- 238000000034 method Methods 0.000 title claims abstract description 23
- 230000006698 induction Effects 0.000 title claims description 5
- 230000000694 effects Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 208000001491 myopia Diseases 0.000 description 1
- 230000004379 myopia Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
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Abstract
The invention discloses a distance sensing-based factory assembly line test auxiliary method, which comprises the steps of arranging baffles arranged according to a certain combination mode on a test station, coding each test item, sensing the height of each baffle by utilizing the inherent distance sensing function of a student flat plate and generating the test item code, and enabling the student flat plate to automatically identify the test item responsible for the current test station and automatically switch to a corresponding test program, so that the process of manually switching the test program can be omitted, the working efficiency of factory assembly line test is effectively improved, and the method has higher flexibility.
Description
Technical Field
The invention relates to the technical field of assembly line production, in particular to a distance sensing-based factory assembly line test auxiliary method.
Background
The dull and stereotyped people that uses of Android student are more and more, and the student is dull and stereotyped generally all to be equipped with the eyeshield function, prevents that bad use habit from leading to the student myopia, and the monitoring of distance between eyes and the screen is a basic function of eyeshield, and in order to realize this function, the dull and stereotyped effective detection distance of sensing of student is all surpassed 30 centimetres basically.
The traditional assembly line test of mill is generally that a station is equipped with a tester and tests an item, for example, the station of test display screen tests display screen effect specially, and the station of test camera tests camera effect specially, and the flat board that is surveyed is carried to next station from a station on the conveyer belt of assembly line. After the tester at each station takes the flat plate, the tester needs to manually switch to a specific test subroutine and then test the flat plate. Manual switching between test items wastes a significant amount of time. If the flat plate on the assembly line flows through one station, the tester can directly test the flat plate, so that the working efficiency is greatly improved.
Disclosure of Invention
Aiming at the defects of the prior art, the invention aims to provide a distance sensing-based factory assembly line test auxiliary method, which provides a new auxiliary method for factory assembly line test by utilizing the distance sensing function of a student flat plate.
In order to achieve the purpose, the invention adopts the following technical scheme:
a distance induction-based factory assembly line test auxiliary method comprises the following specific processes:
s1, taking a value M in an effective sensing distance range of a distance sensing function of the student flat plate, dividing a distance from 0 to M into N distance intervals, wherein N is an integer, and then respectively representing the N distance intervals by using 0, 1, 2, … and N-1; exceeding M is in an invalid state; pre-storing the N distance intervals and the corresponding relation between the N distance intervals and each number in an MCU of a student tablet;
s2, coding each test item to be implemented by the student tablet, wherein each test item code is a digital string with set digits and consists of one or more of 0, 1, 2, … and N-1; the obtained test item codes are prestored in the MCU of the student tablet;
s3, placing a plurality of baffles in parallel above each testing station of the factory assembly line conveyor belt, wherein the number of the baffles above each testing station is the same as the number of the coded bits of each testing item; each test station is responsible for a test item so as to correspond to a test item code, and the baffle above the test station corresponds to each digit of the corresponding test item code one by one along the conveying direction of the conveying belt of the factory assembly line; according to the number corresponding to each baffle and the distance interval corresponding to the number, the vertical height of each baffle from the student flat plate on the testing station is set to be a certain numerical value in the distance interval corresponding to the corresponding number;
s4, when the student flat plate to be tested is transmitted to a certain testing station through the conveyor belt, the student flat plate sequentially passes through each baffle plate on the testing station, the height of each baffle plate is sensed by utilizing the self distance sensing function and is transmitted to the MCU, and the MCU converts the height of each baffle plate into corresponding numbers according to the N distance intervals and the corresponding numbers set in the step S1 and sequentially generates a number string; and then matching the generated digital string with each pre-stored test item code to obtain a test item corresponding to the digital string, and then automatically switching the test program to the test program of the test item.
Further, in the method, the value of M is 30 cm, the distance of 0-30 cm is divided into three distance intervals of (0, 10 cm ], (10 cm, 20 cm ], (20 cm, 30 cm), the three distance intervals are respectively represented by three values of 0, 1 and 2, the invalid state is obtained when the distance exceeds 30 cm, and the test item code is composed of 0, 1 and 2 and has set digits.
Further, in the above method, adjacent numbers in the test item code are different, and therefore the heights of adjacent baffles above the test station are different.
Further, in the above method, the vertical height of each baffle from the student flat plate at the test station is set to be 5 cm, 15 cm or 25 cm according to the corresponding number.
The invention has the beneficial effects that: the method can avoid the procedure of manually switching the test program, effectively improve the working efficiency of the factory assembly line test and have higher flexibility.
Detailed Description
The present invention will be further described below, and it should be noted that the present embodiment is based on the technical solution, and a detailed implementation manner and a specific operation process are provided, but the protection scope of the present invention is not limited to the present embodiment.
The embodiment provides a distance induction-based factory assembly line test auxiliary method, which specifically comprises the following processes:
s1, taking a value M in an effective sensing distance range of a distance sensing function of the student flat plate, dividing a distance from 0 to M into N distance intervals, wherein N is an integer, and then respectively representing the N distance intervals by using 0, 1, 2, … and N-1; exceeding M is in an invalid state; pre-storing the N distance intervals and the corresponding relation between the N distance intervals and each number in an MCU of a student tablet;
s2, coding each test item to be implemented by the student tablet, wherein each test item code is a digital string with set digits and consists of one or more of 0, 1, 2, … and N-1; the obtained test item codes are prestored in the MCU of the student tablet;
s3, placing a plurality of baffles in parallel above each testing station of the factory assembly line conveyor belt, wherein the number of the baffles above each testing station is the same as the number of the coded bits of each testing item; each test station is responsible for a test item so as to correspond to a test item code, and the baffle above the test station corresponds to each digit of the corresponding test item code one by one along the conveying direction of the conveying belt of the factory assembly line; according to the number corresponding to each baffle and the distance interval corresponding to the number, the vertical height of each baffle from the student flat plate on the testing station is set to be a certain numerical value in the distance interval corresponding to the corresponding number;
it should be noted that when the height of the baffle is set, a student flat plate can be placed on the test station, and the height is used as a reference.
S4, when the student flat plate to be tested is transmitted to a certain testing station through the conveyor belt, the student flat plate sequentially passes through each baffle plate on the testing station, the height of each baffle plate is sensed by utilizing the self distance sensing function and is transmitted to the MCU, and the MCU converts the height of each baffle plate into corresponding numbers according to the N distance intervals and the corresponding numbers set in the step S1 and sequentially generates a number string; and then matching the generated digital string with each pre-stored test item code to obtain a test item corresponding to the digital string, and then automatically switching the test program to the test program of the test item.
Specifically, in this embodiment, the value of M is 30 cm, the distance of 0-30 cm is divided into three distance intervals (0, 10 cm ], (10 cm, 20 cm ], (20 cm, 30 cm), and the three distance intervals (low, middle and high distance intervals) are respectively represented by three values 0, 1 and 2, and if the distance exceeds 30 cm, the invalid state is determined, the test item code is composed of 0, 1 and 2 and has a set number of bits.
More specifically, in this embodiment, it is required that the adjacent numbers in the test item code are different, and therefore the heights of the adjacent shutters above the test stations are different.
In this embodiment, based on the three divided distance intervals of (0, 10 cm ], (10 cm, 20 cm ], (20 cm, 30 cm ]), the vertical height of each baffle from the student flat plate on the test station can be 5 cm (corresponding to 0)/15 cm (corresponding to 1)/25 cm (corresponding to 2) according to the corresponding number.
It should be noted that the number of bits of the test item code and the number of bits of the baffle can be determined according to the number of test items to be performed by the student tablet, if the number of the test items is too small, the test requirements cannot be met, if the number of the test items is too large, redundant baffle installation work is generated, and the calculation speed of generating the digital string is also reduced. If the test station is divided into three distance intervals according to the requirement that the adjacent numbers of the test item codes cannot be the same, when two baffles are arranged above the test station, the baffle on each test station can have C1 at most3*C12In 6 arrangements, i.e. up to 6 items can be tested, a maximum of C1 can be tested when three baffles are placed3*C12*C1212 items and so on.
It should be noted that, if the test items in charge of each test station are changed (for example, the sequence of the two test stations needs to be exchanged), the baffles above the two test stations may be directly exchanged, and the height arrangement mode of the baffles above the test stations may also be adjusted.
It should be noted that the baffles may be arranged in advance, combined and fixed together, and then integrally fixed above the test station, or individually arranged above the test station in a manner of moving up and down, which may be specifically determined according to the actual conditions of the test station.
Various corresponding changes and modifications can be made by those skilled in the art based on the above technical solutions and concepts, and all such changes and modifications should be included in the protection scope of the present invention.
Claims (4)
1. A distance induction-based factory assembly line test auxiliary method is characterized by comprising the following specific processes:
s1, taking a value M in an effective sensing distance range of a distance sensing function of the student flat plate, dividing a distance from 0 to M into N distance intervals, wherein N is an integer, and then respectively representing the N distance intervals by using 0, 1, 2, … and N-1; exceeding M is in an invalid state; pre-storing the N distance intervals and the corresponding relation between the N distance intervals and each number in an MCU of a student tablet;
s2, coding each test item to be implemented by the student tablet, wherein each test item code is a digital string with set digits and consists of one or more of 0, 1, 2, … and N-1; the obtained test item codes are prestored in the MCU of the student tablet;
s3, placing a plurality of baffles in parallel above each testing station of the factory assembly line conveyor belt, wherein the number of the baffles above each testing station is the same as the number of the coded bits of each testing item; each test station is responsible for a test item so as to correspond to a test item code, and the baffle above the test station corresponds to each digit of the corresponding test item code one by one along the conveying direction of the conveying belt of the factory assembly line; according to the number corresponding to each baffle and the distance interval corresponding to the number, the vertical height of each baffle from the student flat plate on the testing station is set to be a certain numerical value in the distance interval corresponding to the corresponding number;
s4, when the student flat plate to be tested is transmitted to a certain testing station through the conveyor belt, the student flat plate sequentially passes through each baffle plate on the testing station, the height of each baffle plate is sensed by utilizing the self distance sensing function and is transmitted to the MCU, and the MCU converts the height of each baffle plate into corresponding numbers according to the N distance intervals and the corresponding numbers set in the step S1 and sequentially generates a number string; and then matching the generated digital string with each pre-stored test item code to obtain a test item corresponding to the digital string, and then automatically switching the test program to the test program of the test item.
2. The method of claim 1, wherein M is 30 cm, the distance of 0-30 cm is divided into three distance intervals of (0, 10 cm ], (10 cm, 20 cm ], (20 cm, 30 cm ], and the three distance intervals are respectively represented by three values of 0, 1 and 2, the invalid state is found when the distance exceeds 30 cm, and the test item code is composed of 0, 1 and 2 and has a set number of bits.
3. The method of claim 1 wherein adjacent numbers in the test item code are different so that adjacent baffles above the test station have different heights.
4. A method according to claim 2, wherein the vertical height of each baffle from the student's flat plate at the test station is set to 5 cm or 15 cm or 25 cm depending on the number to which it corresponds.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202110277649.8A CN113063563B (en) | 2021-03-15 | 2021-03-15 | Auxiliary method for factory pipeline test based on distance induction |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110277649.8A CN113063563B (en) | 2021-03-15 | 2021-03-15 | Auxiliary method for factory pipeline test based on distance induction |
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| CN113063563B CN113063563B (en) | 2024-02-06 |
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