TW535051B - On screen display automatic switching test method - Google Patents

Abstract

The present invention is an on screen display automatic switching test method. Firstly, a test item quotation mark is received, and, by analyzing the test item quotation mark, a test item set consisting of one or more test items is obtained. Then, in accordance with the test items in the test item set, on screen display tests are carried out in sequence.

Description

535051 V. Description of the invention (1) The present invention relates to a screen display test method, and particularly relates to an automatic switch screen display test method that can speed up the test process on the production line. For the convenience of presentation of notebook computers, system operators usually have built-in functions that can display multiple screens at the same time, such as any of LCD screen (LCM), cathode ray screen (CRT), and TV screen (τν). Group people show. ",,

For example, LCD screens, cathode ray screens, and TV screens are displayed separately, or LCD screens and cathode ray screens, cathode ray dusk and TV screens, LCD screens and TV screens, and LCD screens, The TV screen together. κ However, in the test method t for different screen display item functions, for different screen test items, the items to be tested are usually manually tested 'and the display screen must be switched manually. $ For the user ’s test method, which lacks an automated mechanism, slows down the overall startup speed and indirectly causes the user to learn

This reduces the willingness to use. In addition, on the other hand, for the production notebook computer test process, because for each #n 向 σ in the production of Tianshi ^ m ^ ^ ^, the same test must be carried out on the electrical,

Therefore, if there is no automatic detection mechanism, the efficiency will be great. In addition, the overall production of the production inspection field 1 is also _ If Beibei-M ^ ^ House testing computer, but also a computer that is not U, if there is no key, it will not be able to target different test items. The author said. ※ The goal of manual detection is to achieve switching detection.

535051 V. Description of the invention (2) In view of this, the main purpose of the present invention is to provide-insert 1 +) 丨 can be automatically switched when entering and operating, and it is necessary for the user to make a mistake. Testing and accelerating computer life. In order to achieve the above purpose, the production test flow can be achieved by switching the screen display test method. Fortunately, this test item argument will be automatically analyzed and the test item argument will be obtained, so as to obtain the test item argument. … Including one or more test items: a test item group, of which the test is performed according to the tests in the test item group. Finally, the output corresponds to different tests: the test results are displayed on the screen. The method of analysing the test item argument is changed to -binary argument, and the binary argument is used to match: in: the value of the turn determines the test item corresponding to the test item argument. = Should be displayed in different bits 4: Timebook = You can also receive a display time argument. When the screen is tested ^ Except, when you type, m can switch to the test item = The state of the screen connection cable, and according to the received two Screen display. Μ 丁 一 间 Argument will refer to the following diagram to briefly explain the following: ΐ i 2, the above purpose, characteristics and advantages can be more obvious and easy to understand, the following is a practical example, with the accompanying drawings, the detailed description is as follows : According to the embodiment of the present invention, an automatic switching screen ... Operator does not test the method. Figure 2 shows the operation flow for testing the test items. Page 5 0549-6630TW f; y i anhou.p t d 535051

V. Description of the invention (3) Figure 3a shows an example command. Figure 3b is a block diagram showing an example of execution of the command in Figure 3a. Figure 4 shows an example of a screen for executing an embodiment of the present invention. Explanation of symbols S100, S200, ..., S9 0 0 ~ operation steps;

SnO, S720, S730 ~ operation steps; A ~ software name; B ~ test item argument; C ~ time display argument;-1 0 0 0, 1 1 0 0 ~ operation flow. Embodiment Next, switch the display of the labor display. The details of the embodiment are first, step S200, receiving which measurement screens to measure. Next, the step parameters, and whether they meet respectively. If not, the user knows. Fig. 1 shows the operation flow of an automatic test method according to an embodiment of the present invention. Referring to Fig. 1, the operation of the present invention will be explained. Step s 1 0 0 ′ receives a test item argument and displays the time bow number as in step. The test item argument is used to determine the "style" item for testing, and the display time argument is used to determine the time that the screen needs to display. 0 0 ’Check the received test item argument and display time Second step = 〇〇 Determine the test item argument and display time argument Internal item argument format and an internal time argument format

If it is, L ~ As in step S50 0, a usage method is displayed to the user.

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V. Description of the invention (4) If it meets, then according to step S600, a test item group is obtained, and the profit item argument is included to include one or more test items, i ^ this test item The screens in the group, the cathode ray screens, and the absolute test items can be one of the LCD screens. , ^, LCD screen and cathode ray In step S600, the osmium bismuth clock s is converted into a binary binary parameter: the method of the binary parameter is to test the test items. Where the value is used to determine this test item group, for example, as shown in Table 纟 夂 1 »^ ^, bits are included. To the bit 3 points, "Don't do it again and again. The argument includes four bits. 0 represents the test item of the LCD screen and Li Liyuan t :::. In the #, the bit is shown. It represents the screen and The cathode ray screen displays the table 1 bit at the same time. 3 2 1 η Test item LCD screen and cathode ray screen TV screen cathode ray screen U liquid, and if the test item argument is 1, the binary index after analysis is 0. 0 0 1, because only the value at bit 0 is i, it means that the LCD screen only needs to be checked; if the test item argument is 3, the parsed binary one argument is 0 0 11, which means it needs to be switched Checking LCD and Cathode Ray Screens

535051

After analysis, the binary arguments are TV screen, LCD screen, and cathode ray; if the test item argument is 2 and then 1100, it means that the test items that need to be checked at the same time are checked on the screen. Then, step S700. The test items included in the test group # 逭 # 1, 隹 f 目 are sequentially performed-the screen display test. Among them, the operation procedure for the test test can be as shown in FIG. 2. First, step: 7 redundant ~ switch to the screen specified in the test project, then, such as step by step, check the status of the connection cable of this screen, and finally, according to step S73l, according to the display time argument received before, Screen display:

= i For example, if the display time argument is 5, after displaying this screen, step S800 outputs the test result of one of the screen tests corresponding to the test item. Among them, the test result may be a failure of f, and step S800 may be displayed after all the test items in the test item group such as 疋 or 疋 are rotated after the test item is tested. Obviously, at step S900, after all the test items in the test project group have been tested, a test end signal is output. In the above operation steps, S100 and S2 0 0 can be received at the same time before and after one step. For example, corresponding to the test item, and the display time arguments are 7 and 5 β. In addition, the present invention can also be operated without the display time parameter, but the glory time when the screen is tested is determined by a preset value. In addition, the embodiments of the present invention can actually be implemented as an executable software

^ 5051 V. Description of the invention (6) > "The middle and the bottom are the same as the time to enter can be placed under the instruction input prompt (command line), such as," C · Enter about this in ten batches-Ge C · The invention of invention. For example, the name of the executive and the number of related bows can be used to achieve the switching method of the screen display test method. 4 & / 丁 本本 明 's order is listed in the approval list-/ 、 Gongyue b Day guard, the user can perform the function on p ^ to display the parameters between the cylinders, as shown in Figure 3a. U-shaped item arguments and the command format shown in Figure 3a is software Name 5 ί: 7 =: In the figure 3a, this command is ^ /, C ·> is the prompt for the deduction input, SWDSP " is the implementation too much: r force generation Λ soft coffee represents the time display argument C Since the test item argument is 3, the basis is two.) This test item argument can be parsed as a binary argument. According to the bit value definition of Table 1, we can know that the command, C, &SW; 3 5 〃 represents switching between the inspection LCD screen and the cathode ray screen, and the inspection display time of each screen is 5 seconds. Note that this example The order of the mentioned test item ▲ head argument B and time display argument c can be changed according to different usage patterns, and it is not applied to limit the present invention. A Figure 3 b, showing the implementation of the third a The block diagram of the command example in the figure After the user enters the command, the system will check and display the process as shown in the flow. 〇 Saint computer LCD screen, and the display time is 5 seconds (ie, execute the test test item ^ LCM) 'and S After the inspection is completed, it will switch to the process 1100, and continue to check the CRT Rong_screen 'fans display time for 5 seconds (that is, the inspection test project CRT is executed), and after the inspection is completed, it switches back to the process 1000 and ends the test flow

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Noodles page 9 limited to god fan 535〇5i

V. Description of the Invention (7) In addition, FIG. 4 shows an example of a screen for executing an embodiment of the present invention. When the embodiment of the present invention is executed, the system may display a screen 2000 as shown in FIG. 4, where the daytime surface 2000 includes the types of inspection test items and the corresponding inspection results. Therefore, the method for automatically switching the screen display test proposed by the present invention can automatically switch the test screen display without human intervention, thereby facilitating the user to perform the screen test and speed up the production test process on the computer production line. ~ Although the present invention has been disclosed as above with a preferred embodiment, it is not a mere invention. Anyone who is familiar with this art can make some changes and retouches without departing from the scope and scope. The garden shall be subject to the definition of the scope of patent application attached. ^ Protection of Ming

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Claims (1)

535051 6. Scope of patent application — 1 · An automatic switching screen display test method, the method includes the steps: N receives a test item argument; parses the test item argument to obtain a test top and only a day group, and then the The test item group includes at least one test item; / 'γ depends on the test item in the test item group; 隹 / a test; and Jin Jin 仃 ~ screen display output corresponds to the details of the screen display test corresponding to the test item _ Results. … Project should-test 2 · The method described in item 1 of the scope of patent application, which includes more packages + the test items in the test project group have been tested by Jiedong, and the signal to end the test. Then output a test 3. The method described in item 1 of the scope of the patent application, wherein the method of solving the test item argument is to convert the test item argument to a binary ^ 'number, and based on the binary argument Corresponding to the test item group corresponding to the value of 2 $ 1 test item argument in different bits. 2. Test 4. The method described in item 3 of the scope of patent application, wherein different bits represent different test items. 5. The method as described in item 1 of the scope of patent application, wherein the method of performing the screen display test according to the test item in the test item group includes: 'switch to the screen designated by the test item; check the screen The status of the connection cable. 6 · The method described in item 5 of the scope of patent application, wherein according to the test and 0549-6630TWf; y i anhou.p t d p. 11 535051 Sixth, the scope of patent application The test items in the test project group to perform the screen display test include checking the display status of the screen. 7. The method as described in item 6 of the patent application scope, wherein a display time argument is received. 8. The method as described in item 7 of the scope of patent application, wherein checking the display status of the screen includes displaying the screen according to the display time argument. 9. The method according to item 1 of the scope of patent application, which further comprises checking the test item argument, and if the test item number does not conform to an internal item argument format ', a method of use is displayed. 10. The method described in item 丨 of the scope of patent application, which further includes inspecting the display time parameter, and displaying the usage method if the display time bow number does not conform to an internal time parameter format. 11 · The method as described in item 1 of the scope of patent application, wherein the test item is a liquid crystal display (LCM). 1 2 · The method as described in item 1 of the scope of patent application, wherein the test item is a cathode ray screen (CRT). 1 3 · The method described in item 1 of the scope of patent application, wherein the test item is a television screen (TV). 14. The method as described in item 1 of the scope of patent application, wherein the test items are a liquid crystal display (LCM) and a cathode ray display (CRT). 0549-6630TW; y i anhou. P t d p. 12