CN113049667A - 一种碳化硼中硼-10丰度的热电离质谱检测方法 - Google Patents

一种碳化硼中硼-10丰度的热电离质谱检测方法 Download PDF

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CN113049667A
CN113049667A CN201911362897.1A CN201911362897A CN113049667A CN 113049667 A CN113049667 A CN 113049667A CN 201911362897 A CN201911362897 A CN 201911362897A CN 113049667 A CN113049667 A CN 113049667A
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boron
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boron carbide
thermal ionization
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杨永明
陈艳宏
张博涵
李歆
杨利春
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China North Nuclear Fuel Co Ltd
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Abstract

本发明涉及热电离质谱检测技术领域,具体公开了一种碳化硼中硼‑10丰度的热电离质谱检测方法,包括以下步骤:步骤1:样品处理;步骤2:样品测定;步骤3:样品丰度计算。本发明建立了碳化硼粉末及芯块中硼‑10丰度的热电离质谱检测方法,检测精密度优于0.1%。

Description

一种碳化硼中硼-10丰度的热电离质谱检测方法
技术领域
本发明属于热电离质谱检测技术领域,具体涉及一种碳化硼中硼-10丰度的热电离质谱检测方法。
背景技术
目前国内无碳化硼中硼-10丰度测定的标准,现有文献报道的碳化硼粉末中硼丰度检测方法采用热电离质谱仪在未加入稳定剂情况下检测硼-10丰度,且无具体升温条件,实际应用中硼的蒸发速度较快,方法稳定性差,且碳化硼样品检测结果精密度在0.5%以上,不能满足生产用碳化硼粉末、芯块的检测需求。
因此,亟需设计一种碳化硼中硼-10丰度的检测方法,以解决上述问题。
发明内容
本发明的目的在于提供一种碳化硼中硼-10丰度的热电离质谱检测方法,实现碳化硼粉末及芯块中硼-10丰度的检测。
本发明的技术方案如下:
一种碳化硼中硼-10丰度的热电离质谱检测方法,包括以下步骤:
步骤1:样品处理
1.1样品制备及称量
称取碳化硼粉末,作为分析用样品;
1.2悬浊液制备
将样品置于烧杯中,加入碳酸钠溶液,搅拌摇匀;
1.3涂样
选用钽作为样品带,吸取1μL搅拌均匀的悬浊液,滴加至样品带中部,加热蒸干;
再吸取1μL甘露醇溶液滴加在样品带中部,加热蒸干;
步骤2:样品测定
将已装载样品的转盘装到热电离质谱仪离子源内,抽真空,向冷阱加入液氮,增大磁场电压,将样品检测模式设置为静态多接收方式;
先做检测器增益校正,再按升温程序分析样品;
升温程序:在400~800s内将样品带的电流升至1.8A以上,打开分析室阀门,检测质量数为89或88的离子流强度,并升温使质量数为89或88的离子流强度达到0.1V以上,进行离子流聚焦,调节透镜使质量数为89或88的信号达到当前条件下的最高值;继续升温使质量数为89或88的离子流强度达到0.5V以上,并当信号在1min内波动小于1%时,开始采集至少30组数据;
步骤3:样品丰度计算
按公式(1)计算10B丰度;
Figure BDA0002337673710000021
式中:
W——10B丰度;
R10/11——硼同位素10B与11B的原子丰度比;
10.0129——10B的摩尔质量,单位为g/mol;
11.0093——11B的摩尔质量,单位为g/mol。
步骤1.1中,首先将碳化硼芯块研磨过筛,再称取0.100~0.500g粒度小于200目的粉末。
步骤1.2中,加入10mL 5~20μg/μL的碳酸钠溶液。
步骤1.3中,将样品带在1.0~2.0A电流下加热蒸干。
步骤2中,抽真空使得离子源真空度小于5.0×10-8mbar、分析室真空度小于6.0×10-9mbar,向冷阱加入3L液氮,将磁场电压加到8000V。
对不同丰度碳化硼样品检测精密度优于0.1%。
本发明的显著效果在于:
本发明建立了碳化硼粉末及芯块中硼-10丰度的热电离质谱检测方法,检测精密度优于0.1%。
具体实施方式
下面结合具体实施例对本发明作进一步详细说明。
一种碳化硼中硼-10丰度的热电离质谱检测方法,包括以下步骤:
步骤1:样品处理
1.1样品制备及称量
将碳化硼芯块研磨过筛,选取粒度小于200目的粉末,称取0.100~0.500g,作为分析用样品;
1.2悬浊液制备
将样品置于烧杯中,加入10mL 5~20μg/μL碳酸钠溶液,搅拌摇匀;
1.3涂样
选用钽作为样品带,吸取1μL搅拌均匀的悬浊液,滴加至样品带中部,在1.0~2.0A电流下加热蒸干;
再吸取1μL甘露醇溶液滴加在样品带中部,在1.0~2.0A电流下加热蒸干;
步骤2:样品测定
将已装载样品的转盘装到热电离质谱仪离子源内,抽真空,使离子源真空度小于5.0×10-8mbar,分析室真空度小于6.0×10-9mbar,向冷阱加入3L液氮,将磁场电压加到8000V,将样品检测模式设置为静态多接收方式;
先做检测器增益校正,再按升温程序分析样品;
升温程序:在400~800s内将样品带的电流升至1.8A以上,打开分析室阀门,检测质量数为89或88的离子流强度,并升温使质量数为89或88的离子流强度达到0.1V以上,进行离子流聚焦,调节透镜使质量数为89或88的信号达到当前条件下的最高值;继续升温使质量数为89或88的离子流强度达到0.5V以上,并当信号在1min内波动小于1%时,开始采集至少30组数据;
步骤3:样品丰度计算
按公式(1)计算10B丰度。
Figure BDA0002337673710000041
式中:
W——10B丰度;
R10/11——硼同位素10B与11B的原子丰度比;
10.0129——10B的摩尔质量,单位为g/mol;
11.0093——11B的摩尔质量,单位为g/mol。
实施例
采用一种碳化硼中硼-10丰度的热电离质谱检测方法,对样品的丰度和精密度进行检测。
选取天然丰度的碳化硼样品,重复步骤1至步骤3,记录测定结果,计算硼-10丰度值与精密度,天然硼10B的丰度值范围为18.93%~20.39%,结果见表1。
表1碳化硼中硼同位素丰度测量结果
Figure BDA0002337673710000042
Figure BDA0002337673710000051
选取53%碳化硼样品,重复步骤1至步骤3,记录测定结果,计算硼-10丰度值与精密度,测定结果见表2。
表2碳化硼样品精密度测定结果
Figure BDA0002337673710000052
从表1和表2可以看出,对不同丰度碳化硼样品检测精密度能够达到0.1%以下。

Claims (6)

1.一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:包括以下步骤:
步骤1:样品处理
1.1样品制备及称量
称取碳化硼粉末,作为分析用样品;
1.2悬浊液制备
将样品置于烧杯中,加入碳酸钠溶液,搅拌摇匀;
1.3涂样
选用钽作为样品带,吸取1μL搅拌均匀的悬浊液,滴加至样品带中部,加热蒸干;
再吸取1μL甘露醇溶液滴加在样品带中部,加热蒸干;
步骤2:样品测定
将已装载样品的转盘装到热电离质谱仪离子源内,抽真空,向冷阱加入液氮,增大磁场电压,将样品检测模式设置为静态多接收方式;
先做检测器增益校正,再按升温程序分析样品;
升温程序:在400~800s内将样品带的电流升至1.8A以上,打开分析室阀门,检测质量数为89或88的离子流强度,并升温使质量数为89或88的离子流强度达到0.1V以上,进行离子流聚焦,调节透镜使质量数为89或88的信号达到当前条件下的最高值;继续升温使质量数为89或88的离子流强度达到0.5V以上,并当信号在1min内波动小于1%时,开始采集至少30组数据;
步骤3:样品丰度计算
按公式(1)计算10B丰度;
Figure FDA0002337673700000011
式中:
W——10B丰度;
R10/11——硼同位素10B与11B的原子丰度比;
10.0129——10B的摩尔质量,单位为g/mol;
11.0093——11B的摩尔质量,单位为g/mol。
2.如权利要求1所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:步骤1.1中,首先将碳化硼芯块研磨过筛,再称取0.100~0.500g粒度小于200目的粉末。
3.如权利要求2所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:步骤1.2中,加入10mL 5~20μg/μL的碳酸钠溶液。
4.如权利要求3所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:步骤1.3中,将样品带在1.0~2.0A电流下加热蒸干。
5.如权利要求4所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:步骤2中,抽真空使得离子源真空度小于5.0×10-8mbar、分析室真空度小于6.0×10-9mbar,向冷阱加入3L液氮,将磁场电压加到8000V。
6.如权利要求1~5任一项所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:对不同丰度碳化硼样品检测精密度优于0.1%。
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Cited By (1)

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CN116818954A (zh) * 2023-07-31 2023-09-29 大连博恩坦科技有限公司 一种采用gc-ms检测硼-10同位素丰度的方法

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柳永恒等: "直接熔样正热电离质谱法测定 二硼化锆中硼同位素丰度", 《质谱学报》, vol. 36, no. 6, pages 565 - 570 *
汤书婷等: "直接熔融热电离质谱法测定核电用硼硅玻璃中硼同位素比值", pages 711 *
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116818954A (zh) * 2023-07-31 2023-09-29 大连博恩坦科技有限公司 一种采用gc-ms检测硼-10同位素丰度的方法

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