CN113049667A - 一种碳化硼中硼-10丰度的热电离质谱检测方法 - Google Patents
一种碳化硼中硼-10丰度的热电离质谱检测方法 Download PDFInfo
- Publication number
- CN113049667A CN113049667A CN201911362897.1A CN201911362897A CN113049667A CN 113049667 A CN113049667 A CN 113049667A CN 201911362897 A CN201911362897 A CN 201911362897A CN 113049667 A CN113049667 A CN 113049667A
- Authority
- CN
- China
- Prior art keywords
- sample
- boron
- abundance
- boron carbide
- thermal ionization
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- INAHAJYZKVIDIZ-UHFFFAOYSA-N boron carbide Chemical compound B12B3B4C32B41 INAHAJYZKVIDIZ-UHFFFAOYSA-N 0.000 title claims abstract description 32
- 229910052580 B4C Inorganic materials 0.000 title claims abstract description 31
- 238000001514 detection method Methods 0.000 title claims abstract description 25
- ZOXJGFHDIHLPTG-BJUDXGSMSA-N Boron-10 Chemical compound [10B] ZOXJGFHDIHLPTG-BJUDXGSMSA-N 0.000 title claims abstract description 20
- 238000001819 mass spectrum Methods 0.000 title description 2
- 238000000176 thermal ionisation mass spectrometry Methods 0.000 claims abstract description 14
- 239000000843 powder Substances 0.000 claims abstract description 10
- 238000012545 processing Methods 0.000 claims abstract description 4
- 150000002500 ions Chemical class 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 13
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 10
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 claims description 10
- 238000004458 analytical method Methods 0.000 claims description 9
- 238000010438 heat treatment Methods 0.000 claims description 9
- 239000000725 suspension Substances 0.000 claims description 9
- 238000005303 weighing Methods 0.000 claims description 8
- 229910052796 boron Inorganic materials 0.000 claims description 7
- 238000001704 evaporation Methods 0.000 claims description 7
- FBPFZTCFMRRESA-KVTDHHQDSA-N D-Mannitol Chemical compound OC[C@@H](O)[C@@H](O)[C@H](O)[C@H](O)CO FBPFZTCFMRRESA-KVTDHHQDSA-N 0.000 claims description 6
- 229930195725 Mannitol Natural products 0.000 claims description 6
- 239000000594 mannitol Substances 0.000 claims description 6
- 235000010355 mannitol Nutrition 0.000 claims description 6
- 238000002360 preparation method Methods 0.000 claims description 6
- 239000007788 liquid Substances 0.000 claims description 5
- 229910052757 nitrogen Inorganic materials 0.000 claims description 5
- 229910000029 sodium carbonate Inorganic materials 0.000 claims description 5
- 238000003556 assay Methods 0.000 claims description 3
- 238000004364 calculation method Methods 0.000 claims description 3
- 238000012937 correction Methods 0.000 claims description 3
- 238000000227 grinding Methods 0.000 claims description 3
- 230000000630 rising effect Effects 0.000 claims description 3
- 238000007873 sieving Methods 0.000 claims description 3
- 230000003068 static effect Effects 0.000 claims description 3
- 238000003756 stirring Methods 0.000 claims description 3
- 229910052715 tantalum Inorganic materials 0.000 claims description 3
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 3
- 239000008188 pellet Substances 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 5
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 4
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000000155 isotopic effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/626—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
本发明涉及热电离质谱检测技术领域,具体公开了一种碳化硼中硼‑10丰度的热电离质谱检测方法,包括以下步骤:步骤1:样品处理;步骤2:样品测定;步骤3:样品丰度计算。本发明建立了碳化硼粉末及芯块中硼‑10丰度的热电离质谱检测方法,检测精密度优于0.1%。
Description
技术领域
本发明属于热电离质谱检测技术领域,具体涉及一种碳化硼中硼-10丰度的热电离质谱检测方法。
背景技术
目前国内无碳化硼中硼-10丰度测定的标准,现有文献报道的碳化硼粉末中硼丰度检测方法采用热电离质谱仪在未加入稳定剂情况下检测硼-10丰度,且无具体升温条件,实际应用中硼的蒸发速度较快,方法稳定性差,且碳化硼样品检测结果精密度在0.5%以上,不能满足生产用碳化硼粉末、芯块的检测需求。
因此,亟需设计一种碳化硼中硼-10丰度的检测方法,以解决上述问题。
发明内容
本发明的目的在于提供一种碳化硼中硼-10丰度的热电离质谱检测方法,实现碳化硼粉末及芯块中硼-10丰度的检测。
本发明的技术方案如下:
一种碳化硼中硼-10丰度的热电离质谱检测方法,包括以下步骤:
步骤1:样品处理
1.1样品制备及称量
称取碳化硼粉末,作为分析用样品;
1.2悬浊液制备
将样品置于烧杯中,加入碳酸钠溶液,搅拌摇匀;
1.3涂样
选用钽作为样品带,吸取1μL搅拌均匀的悬浊液,滴加至样品带中部,加热蒸干;
再吸取1μL甘露醇溶液滴加在样品带中部,加热蒸干;
步骤2:样品测定
将已装载样品的转盘装到热电离质谱仪离子源内,抽真空,向冷阱加入液氮,增大磁场电压,将样品检测模式设置为静态多接收方式;
先做检测器增益校正,再按升温程序分析样品;
升温程序:在400~800s内将样品带的电流升至1.8A以上,打开分析室阀门,检测质量数为89或88的离子流强度,并升温使质量数为89或88的离子流强度达到0.1V以上,进行离子流聚焦,调节透镜使质量数为89或88的信号达到当前条件下的最高值;继续升温使质量数为89或88的离子流强度达到0.5V以上,并当信号在1min内波动小于1%时,开始采集至少30组数据;
步骤3:样品丰度计算
按公式(1)计算10B丰度;
式中:
W——10B丰度;
R10/11——硼同位素10B与11B的原子丰度比;
10.0129——10B的摩尔质量,单位为g/mol;
11.0093——11B的摩尔质量,单位为g/mol。
步骤1.1中,首先将碳化硼芯块研磨过筛,再称取0.100~0.500g粒度小于200目的粉末。
步骤1.2中,加入10mL 5~20μg/μL的碳酸钠溶液。
步骤1.3中,将样品带在1.0~2.0A电流下加热蒸干。
步骤2中,抽真空使得离子源真空度小于5.0×10-8mbar、分析室真空度小于6.0×10-9mbar,向冷阱加入3L液氮,将磁场电压加到8000V。
对不同丰度碳化硼样品检测精密度优于0.1%。
本发明的显著效果在于:
本发明建立了碳化硼粉末及芯块中硼-10丰度的热电离质谱检测方法,检测精密度优于0.1%。
具体实施方式
下面结合具体实施例对本发明作进一步详细说明。
一种碳化硼中硼-10丰度的热电离质谱检测方法,包括以下步骤:
步骤1:样品处理
1.1样品制备及称量
将碳化硼芯块研磨过筛,选取粒度小于200目的粉末,称取0.100~0.500g,作为分析用样品;
1.2悬浊液制备
将样品置于烧杯中,加入10mL 5~20μg/μL碳酸钠溶液,搅拌摇匀;
1.3涂样
选用钽作为样品带,吸取1μL搅拌均匀的悬浊液,滴加至样品带中部,在1.0~2.0A电流下加热蒸干;
再吸取1μL甘露醇溶液滴加在样品带中部,在1.0~2.0A电流下加热蒸干;
步骤2:样品测定
将已装载样品的转盘装到热电离质谱仪离子源内,抽真空,使离子源真空度小于5.0×10-8mbar,分析室真空度小于6.0×10-9mbar,向冷阱加入3L液氮,将磁场电压加到8000V,将样品检测模式设置为静态多接收方式;
先做检测器增益校正,再按升温程序分析样品;
升温程序:在400~800s内将样品带的电流升至1.8A以上,打开分析室阀门,检测质量数为89或88的离子流强度,并升温使质量数为89或88的离子流强度达到0.1V以上,进行离子流聚焦,调节透镜使质量数为89或88的信号达到当前条件下的最高值;继续升温使质量数为89或88的离子流强度达到0.5V以上,并当信号在1min内波动小于1%时,开始采集至少30组数据;
步骤3:样品丰度计算
按公式(1)计算10B丰度。
式中:
W——10B丰度;
R10/11——硼同位素10B与11B的原子丰度比;
10.0129——10B的摩尔质量,单位为g/mol;
11.0093——11B的摩尔质量,单位为g/mol。
实施例
采用一种碳化硼中硼-10丰度的热电离质谱检测方法,对样品的丰度和精密度进行检测。
选取天然丰度的碳化硼样品,重复步骤1至步骤3,记录测定结果,计算硼-10丰度值与精密度,天然硼10B的丰度值范围为18.93%~20.39%,结果见表1。
表1碳化硼中硼同位素丰度测量结果
选取53%碳化硼样品,重复步骤1至步骤3,记录测定结果,计算硼-10丰度值与精密度,测定结果见表2。
表2碳化硼样品精密度测定结果
从表1和表2可以看出,对不同丰度碳化硼样品检测精密度能够达到0.1%以下。
Claims (6)
1.一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:包括以下步骤:
步骤1:样品处理
1.1样品制备及称量
称取碳化硼粉末,作为分析用样品;
1.2悬浊液制备
将样品置于烧杯中,加入碳酸钠溶液,搅拌摇匀;
1.3涂样
选用钽作为样品带,吸取1μL搅拌均匀的悬浊液,滴加至样品带中部,加热蒸干;
再吸取1μL甘露醇溶液滴加在样品带中部,加热蒸干;
步骤2:样品测定
将已装载样品的转盘装到热电离质谱仪离子源内,抽真空,向冷阱加入液氮,增大磁场电压,将样品检测模式设置为静态多接收方式;
先做检测器增益校正,再按升温程序分析样品;
升温程序:在400~800s内将样品带的电流升至1.8A以上,打开分析室阀门,检测质量数为89或88的离子流强度,并升温使质量数为89或88的离子流强度达到0.1V以上,进行离子流聚焦,调节透镜使质量数为89或88的信号达到当前条件下的最高值;继续升温使质量数为89或88的离子流强度达到0.5V以上,并当信号在1min内波动小于1%时,开始采集至少30组数据;
步骤3:样品丰度计算
按公式(1)计算10B丰度;
式中:
W——10B丰度;
R10/11——硼同位素10B与11B的原子丰度比;
10.0129——10B的摩尔质量,单位为g/mol;
11.0093——11B的摩尔质量,单位为g/mol。
2.如权利要求1所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:步骤1.1中,首先将碳化硼芯块研磨过筛,再称取0.100~0.500g粒度小于200目的粉末。
3.如权利要求2所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:步骤1.2中,加入10mL 5~20μg/μL的碳酸钠溶液。
4.如权利要求3所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:步骤1.3中,将样品带在1.0~2.0A电流下加热蒸干。
5.如权利要求4所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:步骤2中,抽真空使得离子源真空度小于5.0×10-8mbar、分析室真空度小于6.0×10-9mbar,向冷阱加入3L液氮,将磁场电压加到8000V。
6.如权利要求1~5任一项所述的一种碳化硼中硼-10丰度的热电离质谱检测方法,其特征在于:对不同丰度碳化硼样品检测精密度优于0.1%。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201911362897.1A CN113049667A (zh) | 2019-12-26 | 2019-12-26 | 一种碳化硼中硼-10丰度的热电离质谱检测方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201911362897.1A CN113049667A (zh) | 2019-12-26 | 2019-12-26 | 一种碳化硼中硼-10丰度的热电离质谱检测方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN113049667A true CN113049667A (zh) | 2021-06-29 |
Family
ID=76505285
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201911362897.1A Pending CN113049667A (zh) | 2019-12-26 | 2019-12-26 | 一种碳化硼中硼-10丰度的热电离质谱检测方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN113049667A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116818954A (zh) * | 2023-07-31 | 2023-09-29 | 大连博恩坦科技有限公司 | 一种采用gc-ms检测硼-10同位素丰度的方法 |
-
2019
- 2019-12-26 CN CN201911362897.1A patent/CN113049667A/zh active Pending
Non-Patent Citations (5)
Title |
---|
杨彬;邓辉;梁帮宏;张舸;: "碳化硼中硼同位素丰度的质谱测量", 核动力工程, no. 01 * |
柳永恒等: "直接熔样正热电离质谱法测定 二硼化锆中硼同位素丰度", 《质谱学报》, vol. 36, no. 6, pages 565 - 570 * |
汤书婷等: "直接熔融热电离质谱法测定核电用硼硅玻璃中硼同位素比值", pages 711 * |
蔡光明;: "反应堆一回路可溶硼~(10)B丰度的跟踪计算", 核科学与工程, no. 03 * |
邓辉;许川;张舸;: "硼同位素丰度质谱测量方法的研究", 核动力工程, no. 04 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116818954A (zh) * | 2023-07-31 | 2023-09-29 | 大连博恩坦科技有限公司 | 一种采用gc-ms检测硼-10同位素丰度的方法 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Kita et al. | High precision SIMS oxygen isotope analysis and the effect of sample topography | |
Zhang et al. | Simultaneous quantitation of nucleosides, nucleobases, amino acids, and alkaloids in mulberry leaf by ultra high performance liquid chromatography with triple quadrupole tandem mass spectrometry | |
CN110146584B (zh) | 一种应用于热电离质谱Nd同位素分析的Nd和Sm分离方法 | |
Eichelberger et al. | Reference compound to calibrate ion abundance measurements in gas chromatography-mass spectrometry systems | |
Mollahosseini et al. | Zeolite/Fe3O4 as a new sorbent in magnetic solid‐phase extraction followed by gas chromatography for determining phthalates in aqueous samples | |
CN110702771B (zh) | 多离子计数器动态多接收锆石ID-TIMS Pb同位素测定方法 | |
Wu et al. | Combination of solid‐phase micro‐extraction and direct analysis in real time‐Fourier transform ion cyclotron resonance mass spectrometry for sensitive and rapid analysis of 15 phthalate plasticizers in beverages | |
CN111257478B (zh) | 一种磷霉素氨丁三醇基因毒性杂质的分析方法 | |
CN113049667A (zh) | 一种碳化硼中硼-10丰度的热电离质谱检测方法 | |
CN103033555A (zh) | 一种以碳纳米管作为离子发射剂的铀同位素丰度测量方法 | |
Djozan et al. | Modified polypyrrole with tetrasulfonated nickel phthalocyanine as a fiber for solid-phase microextraction. Application to the extraction of BTEX compounds from water samples | |
Hong et al. | Analysis of trace‐level volatile compounds in fresh turf crop (Lolium perenne L.) by gas chromatography quadrupole time‐of‐flight mass spectrometry | |
CN116413328A (zh) | 一种二硼化锆中硼-10丰度测定方法 | |
Xiao et al. | A new method for the high precision isotopic measurement of bromine by thermal ionization mass spectrometry | |
Gong et al. | Quantitative ToF‐SIMS depth profiling of a multi‐phased III–V semiconductor matrix via the analysis of secondary cluster ions | |
Wang et al. | Investigation of the crucial factors affecting accurate measurement of strontium isotope ratios by total evaporation thermal ionization mass spectrometry | |
Kaloudis et al. | Determination of Geosmin and 2‐Methylisoborneol in Water by HS‐SPME‐GC/MS | |
Lee et al. | Determination of enantiomeric compositions of DOPA by tandem mass spectrometry using the kinetic method with fixed ligands | |
Aoyama et al. | Influence of primary electron energy and take‐off angle of scanning electron microscopy on backscattered electron contrast of iron oxide | |
CN114062570A (zh) | 一种基于有机酸评价半夏和鹞落坪半夏品质的方法 | |
CN113125584A (zh) | 一种hs-gc/ms联用检测利伐沙班中苯的方法 | |
Chang et al. | Chromatographic retention assisted Deconvolution of liquid chromatography-mass spectrometry chromatogram of natural products | |
Zhao et al. | Absolute isotopic composition and atomic weight of neodymium using thermal ionization mass spectrometry | |
Kajcsos et al. | Positronium trapping in porous solids: means and limitations for structural studies | |
Jolly et al. | Elemental analysis by elastic scattering |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |