Background
The fifth generation mobile communication (5G) proposes two large communication frequency bands: FR 1: sub-6GHz and FR 2: although only the FR1 frequency band is put forward in the 5G business process in china, europe and other countries, the development trend of 5G in the future is inevitably toward millimeter wave wireless communication. This means that the situation that the Sub-6GHz band antenna and the millimeter wave band antenna coexist inevitably occurs in the future 5G smart phones. Because the available space of the smart phone is smaller and smaller, the realization of the Sub-6GHz band antenna and the millimeter wave band antenna in a common-caliber mode is the most effective design scheme, but the test modes of the Sub-6GHz band antenna and the millimeter wave band antenna are different, and the space of the smart phone is limited, which brings huge problems to the test of the common-caliber antenna integrating the Sub-6GHz band and the millimeter wave band.
At present, in the design of a Sub-6GHz mobile phone antenna, two common passive test schemes are available: 1) a low-frequency band SMA connector with a long coaxial line is directly welded at the feed position of the mobile phone antenna; 2) the antenna is fed by a microstrip transmission line; the low-frequency band SMA connector and the microstrip transmission line have two connection modes in the test: I. vertically penetrating a probe extending out of the low-frequency band SMA joint from top to bottom (or from bottom to top) through a dielectric plate to be connected to a microstrip transmission line (bottom feed); and II, connecting the low-frequency band SMA joint to a microstrip transmission line (side feed) at the side end of the dielectric slab. In the passive test of the millimeter wave mobile phone antenna, an End transmitting Connector (End Launch Connector) of the high frequency band SMA is usually used, and the End transmitting Connector of the high frequency SMA can be repeatedly used for many times, so that the design and test cost of the millimeter wave antenna is reduced, and the End transmitting Connector is widely applied to the test of the millimeter wave band antenna. However, the connector can not realize a test scheme such as low-frequency band SMA connector bottom feed, but can only realize a test scheme of side feed. According to the comparison of the test schemes of the existing Sub-6GHz and millimeter wave frequency band mobile phone antennas, in the millimeter wave frequency band:
1. the low-frequency band SMA connector testing scheme with a long coaxial line is not suitable any more, because the low-frequency band SMA connector testing scheme can cause large loss and strong radiation interference;
the scheme of the SMA joint bottom feed microstrip transmission line is not suitable any more, firstly, the bottom feed test scheme cannot be realized due to the SMA tail end transmitting joint commonly used for testing the millimeter wave antenna, secondly, the bottom feed mode is not suitable for a thicker dielectric plate, the inductance benefit introduced by the length of the probe penetrating through the dielectric plate cannot be ignored along with the sharp reduction of the wavelength of the millimeter wave frequency band, and the strong inductance benefit introduced by the probe can cause serious impedance mismatch under the condition that the dielectric plate is thicker;
3. if the scheme of a side-fed microstrip transmission line of an SMA tail end transmitting joint is adopted in the test of the millimeter wave antenna of the mobile phone, the feeding path is relatively long, and strong insertion loss is introduced.
At present, 5G smart phones are equipped with millimeter wave frequency band antennas, and Sub-6GHz antennas in low frequency bands still exist. In the design process of the multi-band and large-frequency-ratio mobile phone antenna, the test link has to meet the above mentioned problems, and researchers develop respective intelligence and propose different solutions:
for a design scheme of a non-common-caliber mobile phone antenna, a low-frequency Sub-6GHz antenna adopts a low-frequency band common test scheme, a high-frequency millimeter wave band adopts a test scheme of a side feed microstrip transmission line of an SMA terminal transmitting joint, but in order to shorten a feed path of the millimeter wave microstrip transmission line, a notch needs to be dug on a floor to reserve a position for installation of the SMA terminal transmitting joint. The problem of long feed path is solved by digging a notch on the floor, but the scheme not only destroys the integrity of the floor, but also the notch is generally close to the antenna, and the notch is easy to generate strong current accumulation, thereby introducing strong radiation interference in the test;
for the design scheme of the Common-Aperture mobile phone antenna, as in the scheme disclosed in Common-Aperture Sub-6GHz and Millimeter-Wave 5GAntenna System (muhamrod IKRAM, etc.' research gate, volume 8), the low-frequency Sub-6GHz antenna adopts the test scheme of side-feed and bottom-feed microstrip transmission lines respectively, wherein the microstrip transmission line of the side-feed mode is longer, and the microstrip transmission line of the bottom-feed mode is shorter; the antenna of the high-frequency millimeter wave frequency band adopts a bottom feed test scheme, so that the problem of the 2 nd point of the millimeter wave frequency band can occur, namely the SMA connector adopted by the scheme is disposable, and the test cost is higher; meanwhile, the test scheme is not suitable for the design scheme using the thicker dielectric plate. The test scheme is only applicable to the antenna design of this document and has no general applicability.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: how to simultaneously realize the test of the Sub-6GHz antenna and the millimeter wave mobile phone antenna which are designed by common caliber radiation and achieve the effects of reducing the test cost, reducing interference radiation, reducing transmission loss, having simple structure and having universal applicability.
In order to solve the technical problems, the invention adopts the technical scheme that:
a structure applied to the test of a common-caliber antenna body comprises the common-caliber antenna body, a feed component group, a dielectric plate and a metal floor; the common-caliber antenna body comprises at least one Sub-6GHz antenna and at least one millimeter wave antenna; the feeding component group comprises first feeding components the number of which is matched with that of Sub-6GHz antennas and second feeding components the number of which is matched with that of millimeter wave antennas; the first feed part is provided with a first port and a first microstrip line, and the first port feeds power to the Sub-6GHz antenna through the first microstrip line; the second feed part is provided with a microstrip group, two groups of metal column groups and a second port; the microstrip group consists of a second microstrip line, a third microstrip line and two fourth microstrip lines; the dielectric plate is positioned between the metal floor and the microstrip group; the second port is positioned at the edge of the dielectric plate and feeds power to the millimeter wave antenna after sequentially passing through the third microstrip line and the second microstrip line; the two fourth microstrip lines are respectively arranged on two sides of the third microstrip line and are respectively connected with the metal floor through a group of metal column groups; the extending direction of the fourth microstrip line is consistent with the extending direction of the third microstrip line.
Further, the distance from the first port to the center of the common-caliber antenna body is less than 0.5 times of the distance from the second port to the center of the common-caliber antenna body.
Further, the length of the third microstrip line is greater than 2 times the length of the second microstrip line.
Furthermore, along the extending direction of the fourth microstrip line, the metal posts in the metal post group are sequentially arranged; the distance between the metal columns is A, and the radius is R; the working medium wavelength of the millimeter wave antenna is lambda, wherein A is more than or equal to 0.05 lambda and less than or equal to 0.2 lambda, and R is more than or equal to 0.005 lambda and less than or equal to 0.025 lambda.
Furthermore, the distances from all the positions of the fourth microstrip line to the third microstrip line are all B, wherein B is more than or equal to 0.005 lambda and less than or equal to 0.02 lambda.
Further, the width of the third microstrip line is smaller than that of the second microstrip line; the width of the third microstrip line is C, wherein C is more than or equal to 0.005 lambda and less than or equal to 0.02 lambda.
Further, the first port is connected with a first SMA joint; the first microstrip line is in impedance matching with the first SMA connector; at the first port, an inner conductor of a first SMA connector sequentially penetrates through a metal floor and a dielectric plate and then is connected with the first microstrip line, and an outer conductor of the first SMA connector is connected with the metal floor.
Further, a second SMA joint is connected to the second port; the total impedance of the second microstrip line and the third microstrip line is matched with the impedance of a second port; at the second port, the third microstrip line is connected with the inner conductor of the second SMA connector; the fourth microstrip line and the metal floor are both connected with an outer conductor of a second SMA joint; the second SMA connector is secured at the second port by a screw.
Furthermore, the dielectric plate is rectangular, the common-caliber antenna body is located beside one edge of the dielectric plate, and the second port is located beside the other edge of the dielectric plate; the metal posts in the metal post group are metalized through holes.
Furthermore, the common-caliber antenna body is composed of two Sub-6GHz antennas and a millimeter wave antenna, and the feeding component group comprises two first ports and a second port; the two first ports are respectively arranged at two sides of the third microstrip line.
The invention has the beneficial effects that: the third microstrip line, the fourth microstrip line, the metal column group and the metal floor are combined to form a coplanar waveguide transmission line for feeding the millimeter wave antenna, so that the loss of millimeter wave transmission can be reduced, and the feeding position of the millimeter wave antenna can be far away from the radiation aperture; the second port is arranged at the edge of the dielectric slab, and a feed probe of the second port does not need to penetrate through the dielectric slab, so that the problem of impedance mismatch between the microstrip transmission line and the second port caused by introducing a large inductance effect is solved.
Drawings
The detailed structure of the invention is described in detail below with reference to the accompanying drawings
Fig. 1 is a partial structural diagram of a structure applied to a common aperture antenna body test according to the present invention;
fig. 2 is a schematic diagram of a part of a reversed structure of a structure applied to a common-aperture antenna body test according to the present invention;
fig. 3 is a detailed view of a structure at a second port position of a structure applied to a common aperture antenna body test according to the present invention;
fig. 4 is a diagram showing a plurality of placement examples of the structure applied to the test of the common-aperture antenna body according to the present invention in practical application;
fig. 5 is a schematic diagram of a reversed structure of a plurality of placement examples of the structure applied to the common aperture antenna body test of the present invention shown in fig. 4 in practical application;
fig. 6 is a schematic structural diagram of an access SMA connector of a placement example of a plurality of structures applied to a common aperture antenna body test of the present invention in practical application in fig. 4;
the microstrip line comprises a first microstrip line 1, a second microstrip line 2 and a third microstrip line 3. 4-a fourth microstrip line, 5-a metal floor, 6-a dielectric slab, 7-a common-caliber antenna body, 8-a metal column, 9-a second port, 10-a first port, 11-a first SMA joint and 12-a second SMA joint;
fig. 7 is a graph of loss values of a first microstrip line to two sub-6GHz antennas varying with frequency in a test example of a structure applied to a common aperture antenna body test according to the present invention;
fig. 8 is a graph showing the total loss value of the second microstrip line and the third microstrip line feeding the millimeter wave antenna as a function of frequency in a test example of a structure applied to a common aperture antenna body test according to the present invention;
FIG. 9 is a diagram illustrating a variation of transmission coefficients between three antenna ports in a sub-6GHz band according to an exemplary test of the structure applied to a common-aperture antenna test;
fig. 10 is a diagram of a transmission coefficient variation between three antenna ports in a millimeter wave frequency band according to an example of the structure applied to a common aperture antenna test of the present invention.
Detailed Description
The technical contents, the structural features, the objects and the effects of the present invention will be described in detail with reference to the accompanying drawings.
Example 1
Referring to fig. 1, fig. 2 and fig. 3, a structure for testing a common-aperture antenna includes a common-aperture antenna 7, a feeding component set, a dielectric plate 6 and a metal floor 5; the common-caliber antenna body 7 comprises at least one Sub-6GHz antenna and at least one millimeter wave antenna; the feeding component group comprises first feeding components the number of which is matched with that of Sub-6GHz antennas and second feeding components the number of which is matched with that of millimeter wave antennas; the first feed part is provided with a first port 10 and a first microstrip line 1, and the first port 10 feeds power to the Sub-6GHz antenna through the first microstrip line 1; the second feed part is provided with a microstrip group, two groups of metal column groups and a second port 9; the microstrip group consists of a second microstrip line 2, a third microstrip line 3 and two fourth microstrip lines 4; the medium plate 6 is positioned between the metal floor 5 and the microstrip group; the second port 9 is located at the edge of the dielectric plate 6, and feeds power to the millimeter wave antenna after sequentially passing through the third microstrip line 3 and the second microstrip line 2; the two fourth microstrip lines 4 are respectively arranged at two sides of the third microstrip line 3, and the two fourth microstrip lines 4 are respectively connected with the metal floor 5 through a group of metal column groups; the extending direction of the fourth microstrip line 4 is consistent with the extending direction of the third microstrip line 3.
The third microstrip line 3, the fourth microstrip line 4, the metal column group and the metal floor 5 are combined to form a coplanar waveguide transmission line for feeding the millimeter wave antenna, so that the loss of millimeter wave transmission can be reduced, and the feeding position of the millimeter wave antenna can be far away from the radiation aperture; the second port 9 is arranged at the edge of the dielectric plate 6, and a feed probe of the second port does not need to penetrate through the dielectric plate 6, so that the problem of impedance mismatch between the microstrip transmission line and the second port 9 caused by introducing a large inductance effect is solved.
Example 2
On the basis of the structure, the distance from the first port 10 to the center of the common-caliber antenna body 7 is less than 0.5 time of the distance from the second port 9 to the center of the common-caliber antenna body 7.
The feed port of the Sub-6GHz antenna is arranged at a position close to the common-caliber antenna body 7, and the feed port of the millimeter wave antenna is arranged at a position far away from the common-caliber antenna body 7, so that the feed ports of two different frequency bands are far away from each other, and signal interference between the ports is avoided.
Example 3
On the basis of the structure, the length of the third microstrip line 3 is greater than 2 times that of the second microstrip line 2. When the length of the second microstrip line 2 is far less than that of the third microstrip line 3 (that is, when the total length of the second microstrip line 2 and the third microstrip line 3 is constant, the coplanar waveguide transmission line is as long as possible), the better the loss effect is when the millimeter wave antenna feeds, and further, the feed ports of two different frequency bands are ensured to be far away from each other without interference.
Example 4
On the basis of the structure, the metal posts 8 in the metal post group are sequentially arranged along the extending direction of the fourth microstrip line 4; the distance between the metal columns 8 is A, and the radius is R; the working medium wavelength of the millimeter wave antenna is lambda, wherein A is more than or equal to 0.05 lambda and less than or equal to 0.2 lambda, and R is more than or equal to 0.005 lambda and less than or equal to 0.025 lambda. The distances from all the positions of the fourth microstrip line 4 to the third microstrip line 3 are all B, wherein B is more than or equal to 0.005 lambda and less than or equal to 0.02 lambda. The loss of the formed coplanar waveguide transmission line is ensured to be small when the coplanar waveguide transmission line is used for feeding millimeter wave antennas. Further, the width of the third microstrip line 3 is smaller than that of the second microstrip line 2; the width of the third microstrip line 3 is C, wherein C is more than or equal to 0.005 lambda and less than or equal to 0.02 lambda.
Example 5
On the basis of the structure, the first port 10 is connected with a first SMA joint 11; the first microstrip line 1 is in impedance matching with the first SMA connector 11; at the first port 10, an inner conductor of the first SMA joint 11 sequentially passes through the metal floor 5 and the dielectric plate 6 and then is connected with the first microstrip line 1, and an outer conductor of the first SMA joint 11 is connected with the metal floor 5. The second port 9 is connected with a second SMA joint 12; the total impedance of the second microstrip line 2 and the third microstrip line 3 is matched with the impedance of the second port 9; at the second port 9, the third microstrip line 3 is connected with the inner conductor of the second SMA joint 12; the fourth microstrip line 4 and the metal floor 5 are both connected with an outer conductor of a second SMA joint 12; the second SMA joint 12 is fixed at the second port 9 by screws. At this time, the inner conductor (probe) of the second SMA contact 12 is perpendicular to the edge of the dielectric plate 6. Because the second port 9 is far away from the co-aperture antenna body 7, and the coplanar waveguide transmission line has a good isolation effect, uncertainty of an antenna directional diagram cannot be caused during testing, and impedance mismatch caused by a large inductance effect cannot be caused. The frequency of the Sub-6GHz antenna working wavelength is lower than that of millimeter waves, and the adopted first SMA connector 11 is a common SMA connector, so that the cost is lower; the working frequency of the millimeter wave antenna is far higher than that of a Sub-6GHz antenna, the requirement for stabilizing the performance of the millimeter wave antenna cannot be met by adopting a common SMA connector, a special SMA connector (a second SMA connector 12) for the millimeter wave is required to be adopted, and the manufacturing cost of the special SMA connector for the millimeter wave is far higher than that of the common SMA connector. Because the invention adopts the side feeding mode, the SMA connector (the second SMA connector 12) special for millimeter waves can be tested by adopting the screw structure for fixing during the test, and can be simply disassembled after the test is finished, the feed network can not be influenced, and the disassembled second SMA connector 12 can be reused. If the millimeter wave antenna adopts bottom feed, the millimeter wave antenna must be accessed by adopting a welding mode, so that the SMA connector special for the millimeter wave is a disposable connector, and the feed network performance of the millimeter wave antenna can be seriously influenced after the SMA connector is detached and welded. Therefore, the scheme of the application has excellent advantages in test cost and antenna performance influence.
Example 6
On the basis of the structure, the dielectric plate 6 is rectangular, the common-caliber antenna body 7 is positioned beside one edge of the dielectric plate 6, and the second port 9 is positioned beside the other edge of the dielectric plate 6; and the metal posts 8 in the metal post group are metalized through holes. Preferably, the common-caliber antenna body 7 and the second port 9 are located at two adjacent edges of the dielectric plate 6, so that four non-interfering common-caliber antenna bodies 7 can be arranged in a limited space of the mobile terminal, and a multiple-input multiple-output (MIMO) technology can be used to improve channel capacity, as shown in fig. 4, 5 and 6, the test is convenient, uncertainty of a radiation pattern of the antenna is not caused, and the radiation interference is small. In fig. 4, 5 and 6, preferably, two adjacent common-caliber antenna bodies 7 are mirror-symmetrical, and at this time, the coplanar waveguide transmission line formed by combining the third microstrip line 3, the fourth microstrip line 4, the metal column group and the metal floor 5 is in an L-shaped configuration.
Example 7
On the basis of the structure, the common-caliber antenna body 7 consists of two Sub-6GHz antennas and a millimeter wave antenna, and the feeding component group comprises two first ports 10 and a second port 9; the two first ports 10 are respectively arranged at two sides of the third microstrip line 3. The millimeter wave feed path composed of the second microstrip line 2 and the third microstrip line 3 separates the feed ports (the first ports 10) of the two Sub-6GHz antennas, so that interference between the two feed ports for feeding the Sub-6GHz antennas is avoided, and separation of the three feed ports is also realized.
To further illustrate the effects of the present invention, the following test examples were used for the test, and the test results are shown in fig. 7 to 10:
test examples
A structure applied to the test of a common-caliber antenna body comprises a common-caliber antenna body 7, a feed component group, a dielectric plate 6 and a metal floor 5; the common-caliber antenna body 7 consists of two Sub-6GHz antennas and a millimeter wave antenna; the feeding component group comprises first feeding components the number of which is matched with that of Sub-6GHz antennas and second feeding components the number of which is matched with that of millimeter wave antennas; the first feed part is provided with a first port 10 and a first microstrip line 1, and the first port 10 feeds power to the Sub-6GHz antenna through the first microstrip line 1; the second feed part is provided with a microstrip group, two groups of metal column groups and a second port 9, namely the common-caliber antenna body 7 is provided with three antenna ports; the microstrip group consists of a second microstrip line 2, a third microstrip line 3 and two fourth microstrip lines 4; the medium plate 6 is positioned between the metal floor 5 and the microstrip group; the second port 9 is located at the edge of the dielectric plate 6, and feeds power to the millimeter wave antenna after sequentially passing through the third microstrip line 3 and the second microstrip line 2; the two fourth microstrip lines 4 are respectively arranged at two sides of the third microstrip line 3, and the two fourth microstrip lines 4 are respectively connected with the metal floor 5 through a group of metal column groups; the extending direction of the fourth microstrip line 4 is consistent with the extending direction of the third microstrip line 3. The two first ports 10 are respectively arranged at two sides of the third microstrip line 3.
The length of the first microstrip line 1 is 10.6mm, the length of the second microstrip line 2 is 6mm, and the length of the third microstrip line 3 is 43 mm.
Along the extending direction of the fourth microstrip line 4, the metal posts 8 in the metal post group are arranged in sequence; the spacing of the metal columns 8 is 1.1mm, and the radius is 0.15 mm.
The distance from each position of the fourth microstrip line 4 to the third microstrip line 3 is 0.1 mm.
The width of the second microstrip line 2 is 1 mm; the width of the third microstrip line 3 is 0.3 mm.
The first port 10 is connected with a first SMA joint 11; the first microstrip line 1 is in impedance matching with the first SMA connector 11; at the first port 10, an inner conductor of the first SMA joint 11 sequentially passes through the metal floor 5 and the dielectric plate 6 and then is connected with the first microstrip line 1, and an outer conductor of the first SMA joint 11 is connected with the metal floor 5. The second port 9 is connected with a second SMA joint 12; the total impedance of the second microstrip line 2 and the third microstrip line 3 is matched with the impedance of the second SMA connector 12; at the second port 9, the third microstrip line 3 is connected with the inner conductor of the second SMA joint 12; the fourth microstrip line 4 and the metal floor 5 are both connected with an outer conductor of a second SMA joint 12; the second SMA joint 12 is fixed at the second port 9 by screws.
The dielectric plate 6 is rectangular, the common-caliber antenna body 7 is positioned beside one edge of the dielectric plate 6, the second port 9 is positioned beside the other adjacent edge of the dielectric plate 6, and a coplanar waveguide transmission line formed by combining the third microstrip line 3, the fourth microstrip line 4, the metal column group and the metal floor 5 is L-shaped; and the metal posts 8 in the metal post group are metalized through holes.
Fig. 7 is a curve of the loss value of the first microstrip line 1 feeding two sub-6GHz antennas along with the frequency change in the test example, and it can be seen from fig. 7 that the loss values of the first microstrip line 1 feeding the sub-6GHz antennas are both less than 0.2 dB. Because the common-caliber antenna body 7 is correspondingly provided with two sub-6GHz antennas, namely two first microstrip lines 1, the loss value result of the first microstrip line 1 arranged between the position of the second microstrip line 2 and the position of the second port 9 is the result corresponding to the first microstrip line a in fig. 7, and the loss value result of the other first microstrip line 1 is the result corresponding to the first microstrip line B in fig. 7.
Fig. 8 is a curve of the total loss value of the second microstrip line 2 and the third microstrip line 3 feeding the millimeter wave antenna with frequency change in the test example, and it can be seen from fig. 8 that the total loss value of the second microstrip line 2 and the third microstrip line 3 feeding the millimeter wave antenna is smaller than 1.5 dB.
Fig. 9 is a diagram of transmission coefficient changes among three antenna ports in the sub-6GHz band in the test example, and it can be seen from fig. 9 that the three antenna ports have good isolation in the sub-6GHz band.
Fig. 10 is a diagram of transmission coefficient variation among three antenna ports in a millimeter wave frequency band in a test example, and it can be seen from fig. 10 that the three antenna ports also have good isolation in the millimeter wave frequency band.
In fig. 9 and 10, S12 is a transmission coefficient between port 1 and port 2, S13 is a transmission coefficient between port 1 and port 3, and S23 is a transmission coefficient between port 2 and port 3, wherein two of the first ports 10 are denoted by "1" and "2", respectively, and the second port 9 is denoted by "3".
In summary, according to the structure applied to the test of the common-aperture antenna body provided by the invention, the third microstrip line, the fourth microstrip line, the metal pillar group and the metal floor are combined to form the coplanar waveguide transmission line for feeding the millimeter wave antenna, so that the loss of millimeter wave transmission can be reduced, and the feeding position of the millimeter wave antenna can be far away from the radiation aperture; the second port is arranged at the edge of the dielectric slab, and a feed probe of the second port does not need to penetrate through the dielectric slab, so that the problem of impedance mismatch between the microstrip transmission line and the second port caused by introducing a large inductance effect is solved. In the transmission process, the loss of the microstrip line used for feeding is small, the plurality of ports are separated, good isolation is achieved in sub-6GHz frequency bands and millimeter wave frequency bands, and when the microstrip line is applied to the test of the common-caliber antenna body, the effects of keeping the antenna stable, reducing interference radiation and reducing transmission loss are achieved. In addition, each microstrip line in the structure applied to the common-caliber antenna body test has no excessive branches, the structure is simple, appropriate position adjustment can be carried out according to the positions of other parts of an electronic product, and the flexibility is high.
The first … … and the second … … are only used for name differentiation and do not represent how different the importance and position of the two are.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.