CN112986888A - Method and device for calibrating transformer short-circuit impedance tester - Google Patents
Method and device for calibrating transformer short-circuit impedance tester Download PDFInfo
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- CN112986888A CN112986888A CN202110448482.7A CN202110448482A CN112986888A CN 112986888 A CN112986888 A CN 112986888A CN 202110448482 A CN202110448482 A CN 202110448482A CN 112986888 A CN112986888 A CN 112986888A
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Abstract
The invention discloses a method and a device for calibrating a transformer short-circuit impedance tester, which relate to the field of calibration, calibration and detection of power test instruments, and comprise the following steps: measuring a plurality of basic parameters of a transformer short-circuit impedance tester to be tested by using a standard source, and then respectively carrying out short-circuit impedance test on the selected transformer by using the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested to obtain a first impedance value and a second impedance value of the selected transformer; and judging whether the relative error between each basic parameter and the set value of the basic parameter is within a preset relative error, if so, judging whether the relative error between the second impedance value and the first impedance value is within the preset relative error, and if so, determining that the short-circuit impedance tester of the transformer to be tested is qualified. The verification method and the verification device of the transformer short-circuit impedance tester can improve the reliability of the verification result of the transformer short-circuit impedance tester.
Description
Technical Field
The invention relates to the field of calibration, verification and detection of power test instruments, in particular to a verification method and a verification device of a transformer short-circuit impedance tester.
Background
At present, a transformer is the most commonly used main power equipment of a power system, and the transformer is used for converting low voltage into high voltage for long-distance power transmission; or the high voltage is converted into the low voltage to supply power for the terminal customer. The quality of the transformer is good, and the operation safety is related to the reliability and safety of power supply, so that before the transformer leaves a factory, various performances of the transformer need to be detected through a series of standards, regulations and specifications, and the short-circuit impedance is an important test component.
The transformer short-circuit impedance tester is used for measuring the short-circuit impedance of a transformer, low-voltage short-circuit impedance measurement is a basic item in a conventional test item, short-circuit impedance values measured before and after the transformer is impacted by short-circuit current are compared, and the winding deformation degree can be preliminarily estimated according to the change size of the short-circuit impedance values. The low-voltage short-circuit impedance test is the most direct method for identifying whether a transformer is impacted by short-circuit current in operation or whether a winding of the transformer is deformed after the transformer is impacted by mechanical force in transportation and installation, has important significance for judging whether the transformer can be put into operation or not, and is also one of the bases for judging whether the transformer is required to be disassembled for inspection.
The short-circuit impedance tester of the transformer measures physical quantities such as voltage, current, power factor and the like of each phase under the condition of applying short-circuit voltage to the transformer, and then calculates the short-circuit impedance value of the transformer through a corresponding algorithm. The common method for calibrating the instrument is to provide the instrument with standard basic quantities such as voltage, current and phase by a standard source method, measure the quantities by a transformer short-circuit impedance tester and check the measurement error.
However, the final measurement result of the transformer short-circuit impedance tester is not the voltage, current and power factor, but the short-circuit impedance, so that the measurement of the voltage, the current, the phase and the like can meet the error requirement, but after the operation processing, the impedance value error can be unqualified, and the standard source law cannot verify the situation. Therefore, it is necessary to improve the existing method for calibrating the transformer short-circuit impedance tester to solve the technical problem of low reliability of the calibration result when the transformer short-circuit impedance tester is calibrated by using the standard source method.
Disclosure of Invention
The embodiment of the invention provides a calibration method and a calibration device for a transformer short-circuit impedance tester, which aim to solve the technical problem that the reliability of a calibration result is low when a standard source method is adopted to calibrate the transformer short-circuit impedance tester in the related technology.
In a first aspect, a method for calibrating a short-circuit impedance tester of a transformer is provided, which is used for calibrating the short-circuit impedance tester of the transformer to be tested, and comprises the following steps:
measuring a plurality of basic parameters of a standard source by using a transformer short-circuit impedance tester to be tested to obtain measured values of the plurality of basic parameters, and then respectively carrying out short-circuit impedance test on the selected transformer by using the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested to obtain a first impedance value and a second impedance value of the selected transformer;
and judging whether the relative error between the measured value of each basic parameter and the set value of each basic parameter is within a preset relative error, if so, judging whether the relative error between the second impedance value and the first impedance value is within the preset relative error, and if so, judging that the short-circuit impedance tester of the transformer to be tested is qualified.
In some embodiments, when the short-circuit impedance test is performed on the selected transformer by using a standard transformer short-circuit impedance tester and a transformer short-circuit impedance tester to be tested, the time period, the temperature, the humidity and the atmospheric pressure of the two tests are the same.
In some embodiments, when the short-circuit impedance test is performed on the selected transformer by using a standard transformer short-circuit impedance tester and a transformer short-circuit impedance tester to be tested, one transformer is randomly selected from a plurality of transformer samples as the selected transformer.
In some embodiments, the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested are preheated within a set time before the short-circuit impedance tester performs short-circuit impedance test on the selected transformer.
In some embodiments, the accuracy level of the standard transformer short circuit impedance tester is at least one level higher than the accuracy level of the transformer short circuit impedance tester under test.
In some embodiments, the predetermined relative error is no greater than 2%.
In a second aspect, a calibrating apparatus for calibrating a transformer short-circuit impedance tester to be tested is provided, which includes: the system comprises a standard source, a standard transformer short-circuit impedance tester, a selected transformer and a data processing center;
the standard transformer short-circuit impedance tester is used for measuring the short-circuit impedance of the selected transformer to obtain a first impedance value of the selected transformer;
the transformer short circuit impedance tester to be tested is used for measuring a plurality of basic parameters of a standard source to obtain measurement values of the plurality of basic parameters; the short-circuit impedance measurement is also carried out on the selected transformer to obtain a second impedance value of the selected transformer;
the data processing center is used for acquiring the measurement data of the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested, and is also used for judging whether the relative error between the measurement value of each basic parameter and the set value of the basic parameter is within a preset relative error, if so, judging whether the relative error between the second impedance value and the first impedance value is within the preset relative error, and if so, judging that the transformer short-circuit impedance tester to be tested is qualified.
In some embodiments, the selected transformer is a randomly selected transformer from a plurality of transformer samples.
In some embodiments, the accuracy level of the standard transformer short circuit impedance tester is at least one level higher than the accuracy level of the transformer short circuit impedance tester under test.
In some embodiments, the predetermined relative error is no greater than 2%.
The technical scheme provided by the invention has the beneficial effects that:
the embodiment of the invention provides a method and a device for calibrating a transformer short-circuit impedance tester, which are characterized in that when the transformer short-circuit impedance tester to be tested tests a transformer, basic parameters measured by the transformer short-circuit impedance tester to be tested are accurate through a standard source method, then the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested are used for respectively carrying out short-circuit impedance test on a selected transformer, impedance results obtained after internal operation processing of the transformer short-circuit impedance tester to be tested are also accurate, and the reliability of the calibration results of the transformer short-circuit impedance tester is improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a flowchart of a method for calibrating a short-circuit impedance tester of a transformer according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a standard source connected to a short-circuit impedance tester of a transformer to be tested according to an embodiment of the present invention;
fig. 3 is a schematic diagram of a selected transformer tested by the transformer short-circuit impedance tester to be tested according to the embodiment of the invention;
FIG. 4 is a schematic diagram of a standard transformer short-circuit impedance tester testing selected transformers according to an embodiment of the present invention;
in the figure: 1. a standard source; 2. a short-circuit impedance tester of the transformer to be tested; 3. a selected transformer; 4. a voltage regulator; 5. a standard transformer short circuit impedance tester.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
The embodiment of the invention provides a method for calibrating a transformer short-circuit impedance tester, which can solve the technical problem that the reliability of a calibration result is low when a standard source method is adopted to calibrate the transformer short-circuit impedance tester in the related art.
Referring to fig. 1, a method for calibrating a short-circuit impedance tester of a transformer, which is used for calibrating the short-circuit impedance tester of the transformer to be tested, includes the following steps:
Specifically, referring to fig. 2, the output end of the standard source 1 is correspondingly connected to the input end of the transformer short-circuit impedance tester 2 to be tested to form a standard source method test circuit, and the transformer short-circuit impedance tester to be tested measures the measured values of a plurality of basic parameters of the standard source. Referring to fig. 3, the short-circuit impedance tester 2 for the transformer to be tested is connected to the selected transformer 3, and the second impedance value of the selected transformer is obtained through testing. Similarly, referring to fig. 4, a standard transformer short-circuit impedance tester 5 is connected to the selected transformer 3 to form a transformer short-circuit impedance test circuit, and a first impedance value of the selected transformer is obtained through testing.
Specifically, the relative error between the measured value of each basic parameter and the set value thereof (i.e. the set value of the basic parameter output by the standard source) is within the preset relative error, which indicates that the measured basic parameter is accurate when the transformer short-circuit impedance tester to be tested tests the transformer. And if the relative error between the second impedance value and the first impedance value is within the preset relative error, the impedance result obtained after the operation processing of the transformer short-circuit impedance tester to be tested is also accurate.
Therefore, in the method for calibrating the transformer short-circuit impedance tester in the embodiment of the invention, the standard source method is firstly used for verifying that the basic parameters measured by the transformer short-circuit impedance tester to be tested are accurate when the transformer is tested by the transformer short-circuit impedance tester to be tested, then the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested are used for respectively carrying out short-circuit impedance test on the selected transformer, the impedance result obtained after the internal operation processing of the transformer short-circuit impedance tester to be tested is verified to be accurate, and the reliability of the verification result of the transformer short-circuit impedance tester is improved.
As an optional implementation manner, when the short-circuit impedance test is performed on the selected transformer by using the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested, the time period, the temperature, the humidity and the atmospheric pressure of the two tests are the same, so that the short-circuit impedance test is performed on the selected transformer by using the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested under the same condition as much as possible, and the interference of external factors on the test is reduced.
As an optional implementation manner, when the short-circuit impedance test is performed on the selected transformer by using a standard transformer short-circuit impedance tester and a to-be-tested transformer short-circuit impedance tester, one transformer is randomly selected from a plurality of transformer samples as the selected transformer, and the universality of the test can be embodied by randomly selecting one transformer as the selected transformer, so that the reliability of the test can be embodied.
As an optional implementation manner, the standard transformer short-circuit impedance tester and the to-be-tested transformer short-circuit impedance tester preheat the selected transformer within a set time before performing the short-circuit impedance test on the selected transformer, so that the measurement accuracy of the standard transformer short-circuit impedance tester or the to-be-tested transformer short-circuit impedance tester can be improved.
As an optional implementation, the accuracy grade of the standard transformer short-circuit impedance tester is higher than the accuracy grade of the transformer short-circuit impedance tester to be tested by at least one grade. Specifically, the accuracy grade of the transformer short-circuit impedance tester to be tested is generally 0.2 grade or 0.5 grade, and the accuracy grade of the standard transformer short-circuit impedance tester is 0.1 grade, so that the measurement error caused by the self error of the standard transformer short-circuit impedance tester can be reduced to the minimum, and the influence quantity of the self error is reduced to the minimum.
The embodiment of the invention provides a calibrating device of a transformer short-circuit impedance tester, which is used for calibrating the transformer short-circuit impedance tester to be tested and comprises the following components: the system comprises a standard source, a standard transformer short circuit impedance tester, a selected transformer and a data processing center.
The standard source is used for measuring a plurality of basic parameters of the transformer short-circuit impedance tester to be tested.
And the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested are respectively used for carrying out short-circuit impedance measurement on the selected transformer to obtain a first impedance value and a second impedance value of the selected transformer.
The data processing center is used for acquiring measurement data of the standard source, the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested, and is also used for judging whether the relative error of each basic parameter and the set value thereof is within a preset relative error, if so, judging whether the relative error of the second impedance value and the first impedance value is within the preset relative error, and if so, judging that the transformer short-circuit impedance tester to be tested is qualified. Preferably, the preset relative error is not greater than 2%.
According to the calibrating device of the transformer short-circuit impedance tester in the embodiment of the invention, when the transformer is tested by the transformer short-circuit impedance tester to be tested, the basic parameters measured by the transformer short-circuit impedance tester to be tested are accurate through a standard source method, then the short-circuit impedance test is respectively carried out on the selected transformer by using the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested, the impedance result obtained after the internal operation processing of the transformer short-circuit impedance tester to be tested is also accurate, and the reliability of the calibrating result of the transformer short-circuit impedance tester is improved.
As an optional implementation manner, the selected transformer is one transformer randomly selected from a plurality of transformer samples, and the randomly selected transformer can represent the universality of the test and further represent the reliability of the test.
As an optional implementation, the accuracy grade of the standard transformer short-circuit impedance tester is higher than the accuracy grade of the transformer short-circuit impedance tester to be tested by at least one grade. Specifically, the accuracy grade of the transformer short-circuit impedance tester to be tested is generally 0.2 grade or 0.5 grade, and the accuracy grade of the standard transformer short-circuit impedance tester is 0.1 grade, so that the measurement error caused by the self error of the standard transformer short-circuit impedance tester can be reduced to the minimum, and the influence quantity of the self error is reduced to the minimum.
In the description of the present invention, it should be noted that the terms "upper", "lower", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, which are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and operate, and thus, should not be construed as limiting the present invention. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
It is to be noted that, in the present invention, relational terms such as "first" and "second", and the like, are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The foregoing are merely exemplary embodiments of the present invention, which enable those skilled in the art to understand or practice the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A method for calibrating a transformer short-circuit impedance tester is used for calibrating the transformer short-circuit impedance tester to be tested, and is characterized by comprising the following steps:
measuring a plurality of basic parameters of a standard source by using a transformer short-circuit impedance tester to be tested to obtain measured values of the plurality of basic parameters, and respectively carrying out short-circuit impedance test on the selected transformer by using the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested to obtain a first impedance value and a second impedance value of the selected transformer;
and judging whether the relative error between the measured value of each basic parameter and the set value of each basic parameter is within a preset relative error, if so, judging whether the relative error between the second impedance value and the first impedance value is within the preset relative error, and if so, judging that the short-circuit impedance tester of the transformer to be tested is qualified.
2. The method for calibrating a transformer short-circuit impedance tester as claimed in claim 1, wherein:
when the short-circuit impedance test is carried out on the selected transformer by using a standard transformer short-circuit impedance tester and a transformer short-circuit impedance tester to be tested respectively, the time period, the temperature, the humidity and the atmospheric pressure of the two tests are the same.
3. The method for calibrating a transformer short-circuit impedance tester as claimed in claim 1, wherein:
when the short-circuit impedance test is respectively carried out on the selected transformer by using a standard transformer short-circuit impedance tester and a transformer short-circuit impedance tester to be tested, one transformer is randomly selected from a plurality of transformer samples to serve as the selected transformer.
4. The method for calibrating a transformer short-circuit impedance tester as claimed in claim 1, wherein:
and the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested are preheated within set time before short-circuit impedance testing is respectively carried out on the selected transformer.
5. The method for calibrating a transformer short-circuit impedance tester as claimed in claim 1, wherein:
the accuracy grade of the standard transformer short-circuit impedance tester is higher than that of the to-be-tested transformer short-circuit impedance tester by at least one grade.
6. The method for calibrating a transformer short-circuit impedance tester as claimed in claim 1, wherein: the preset relative error is not more than 2%.
7. The utility model provides a calibrating installation of transformer short circuit impedance tester for examine and determine the transformer short circuit impedance tester that awaits measuring, its characterized in that includes: the system comprises a standard source, a standard transformer short-circuit impedance tester, a selected transformer and a data processing center;
the standard transformer short-circuit impedance tester is used for measuring the short-circuit impedance of the selected transformer to obtain a first impedance value of the selected transformer;
the transformer short circuit impedance tester to be tested is used for measuring a plurality of basic parameters of a standard source to obtain measurement values of the plurality of basic parameters; the short-circuit impedance measurement is also carried out on the selected transformer to obtain a second impedance value of the selected transformer;
the data processing center is used for acquiring the measurement data of the standard transformer short-circuit impedance tester and the transformer short-circuit impedance tester to be tested, and is also used for judging whether the relative error between the measurement value of each basic parameter and the set value of the basic parameter is within a preset relative error, if so, judging whether the relative error between the second impedance value and the first impedance value is within the preset relative error, and if so, judging that the transformer short-circuit impedance tester to be tested is qualified.
8. The calibrating apparatus for transformer short-circuit impedance tester as claimed in claim 7, wherein:
the selected transformer is one randomly selected from a plurality of transformer samples.
9. The calibrating apparatus for transformer short-circuit impedance tester as claimed in claim 7, wherein:
the accuracy grade of the standard transformer short-circuit impedance tester is higher than that of the to-be-tested transformer short-circuit impedance tester by at least one grade.
10. The calibrating apparatus for transformer short-circuit impedance tester as claimed in claim 7, wherein: the preset relative error is not more than 2%.
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Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040095145A1 (en) * | 2002-11-14 | 2004-05-20 | Ali Boudiaf | Method and apparatus for performing multiport through-reflect-line calibration and measurement |
| JP2004226105A (en) * | 2003-01-20 | 2004-08-12 | Murata Mfg Co Ltd | Method for compensation of measurement error, method for quality decision of electronic component and electronic component characteristics measuring system |
| CN201654130U (en) * | 2010-04-19 | 2010-11-24 | 中国兵器工业集团第五三研究所 | Automatic measuring and calibrating device of high-impedance measuring apparatus |
| CN103513211A (en) * | 2013-10-25 | 2014-01-15 | 国家电网公司 | Detecting device for alternating-current impedance tester |
| TW201734497A (en) * | 2016-03-16 | 2017-10-01 | 加斯凱德微科技公司 | Test standards and methods for impedance calibration of a probe system, and probe systems that include the test standards or utilize the methods |
| CN107991637A (en) * | 2016-10-26 | 2018-05-04 | 北大方正集团有限公司 | impedance measuring instrument calibration method and device |
| CN208270746U (en) * | 2018-06-30 | 2018-12-21 | 吉林省国绘仪器测试有限公司 | A kind of grounding electric resistance meter detecting device |
| CN110161448A (en) * | 2019-04-26 | 2019-08-23 | 云南电网有限责任公司电力科学研究院 | A kind of 10kV portable high-pressure wideband electric energy on-site calibrating method and device |
| CN211123238U (en) * | 2019-10-30 | 2020-07-28 | 河南省计量科学研究院 | Double-standard calibration device for electric energy meter |
-
2021
- 2021-04-25 CN CN202110448482.7A patent/CN112986888B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040095145A1 (en) * | 2002-11-14 | 2004-05-20 | Ali Boudiaf | Method and apparatus for performing multiport through-reflect-line calibration and measurement |
| JP2004226105A (en) * | 2003-01-20 | 2004-08-12 | Murata Mfg Co Ltd | Method for compensation of measurement error, method for quality decision of electronic component and electronic component characteristics measuring system |
| CN201654130U (en) * | 2010-04-19 | 2010-11-24 | 中国兵器工业集团第五三研究所 | Automatic measuring and calibrating device of high-impedance measuring apparatus |
| CN103513211A (en) * | 2013-10-25 | 2014-01-15 | 国家电网公司 | Detecting device for alternating-current impedance tester |
| TW201734497A (en) * | 2016-03-16 | 2017-10-01 | 加斯凱德微科技公司 | Test standards and methods for impedance calibration of a probe system, and probe systems that include the test standards or utilize the methods |
| CN107991637A (en) * | 2016-10-26 | 2018-05-04 | 北大方正集团有限公司 | impedance measuring instrument calibration method and device |
| CN208270746U (en) * | 2018-06-30 | 2018-12-21 | 吉林省国绘仪器测试有限公司 | A kind of grounding electric resistance meter detecting device |
| CN110161448A (en) * | 2019-04-26 | 2019-08-23 | 云南电网有限责任公司电力科学研究院 | A kind of 10kV portable high-pressure wideband electric energy on-site calibrating method and device |
| CN211123238U (en) * | 2019-10-30 | 2020-07-28 | 河南省计量科学研究院 | Double-standard calibration device for electric energy meter |
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