CN112485530A - System and method for testing resistance value of high-voltage arm of direct-current voltage transformer - Google Patents
System and method for testing resistance value of high-voltage arm of direct-current voltage transformer Download PDFInfo
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- CN112485530A CN112485530A CN202011354654.6A CN202011354654A CN112485530A CN 112485530 A CN112485530 A CN 112485530A CN 202011354654 A CN202011354654 A CN 202011354654A CN 112485530 A CN112485530 A CN 112485530A
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- 238000000034 method Methods 0.000 title claims abstract description 23
- 238000009413 insulation Methods 0.000 claims description 8
- 238000005259 measurement Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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Abstract
The system and the method for testing the resistance value of the high-voltage arm of the direct-current voltage transformer comprise a direct-current high-voltage generator, a standard direct-current voltage transformer, a direct-current voltage transformer to be tested, a digital multimeter and a microprocessor; the output end of the direct current high voltage generator is electrically connected with a standard direct current voltage transformer; one end of the standard direct current voltage transformer is connected with the direct current voltage transformer to be tested, and the other end of the standard direct current voltage transformer is connected with one end of the microprocessor; one end of a digital multimeter is connected with a low-voltage branch of the direct-current voltage transformer to be tested, and the other end of the digital multimeter is connected with the other end of the microprocessor; the microprocessor is used for calculating the resistance value of the high-voltage branch circuit according to the resistance value of the low-voltage branch circuit, the voltage values at two ends of the low-voltage circuit after the direct-current voltage is applied and the direct-current voltage value output by the direct-current high-voltage generator. The accuracy of the high-voltage branch resistance value obtained by calculation is higher, and the test and calculation processes are simpler.
Description
Technical Field
The application relates to the technical field of test tests of high-voltage direct-current voltage transformers, in particular to a system and a method for testing resistance values of high-voltage arms of a direct-current voltage transformer.
Background
The primary body of the high-voltage direct-current voltage transformer is mainly a resistor divider, and the resistance value of the resistor divider has great influence on the accuracy of the high-voltage direct-current voltage transformer, so that the high-voltage branch resistance and the low-voltage branch resistance (high-voltage arm resistance and low-voltage arm resistance) of the resistor divider must be accurately measured before the high-voltage direct-current voltage transformer is put into use.
The high-voltage branch resistance (namely, high-voltage arm resistance) of the high-voltage direct-current voltage transformer is measured under low voltage, the precision of measuring equipment is not lower than 0.1%, and the resistance values of the high-voltage branch under positive and negative polarities are measured and averaged. Before and after the insulation test, the high-voltage branch resistance of the resistance voltage divider needs to be measured, and the deviation of the high-voltage branch resistance value obtained by twice measurement before and after the insulation test is not more than 0.1% on the premise of meeting the measurement precision.
The resistance value of a high-voltage branch of the high-voltage direct-current voltage transformer is in the hundred megaohms level, the highest test precision of the existing digital megameters is in the 0.5 level, the precision requirement on detection equipment when the high-voltage branch resistance of the high-voltage direct-current voltage transformer is tested cannot be met, and the test values of a direct-current resistance tester and a digital multimeter with the precision of more than 0.1 level are only in the kiloohm level. Therefore, the prior art lacks a detection device meeting the corresponding precision requirement, so that the resistance value of the high-voltage branch of the high-voltage direct-current voltage transformer cannot be accurately measured.
Disclosure of Invention
The application provides a system and a method for testing the resistance value of a high-voltage arm of a direct-current voltage transformer, which aim to solve the problem that the resistance value of a high-voltage branch of the direct-current voltage transformer cannot be accurately measured in the prior art.
In one aspect, the present application provides a system for testing a resistance value of a high voltage arm of a dc voltage transformer, the system comprising:
the system comprises a direct current high voltage generator, a standard direct current voltage transformer, a direct current voltage transformer to be tested, a digital multimeter and a microprocessor;
the output end of the direct current high voltage generator is electrically connected with the standard direct current voltage transformer and used for providing direct current voltage for the standard direct current voltage transformer;
one end of the standard direct current voltage transformer is connected with the direct current voltage transformer to be detected and used for providing direct current voltage for the direct current voltage transformer to be detected, and the other end of the standard direct current voltage transformer is connected with one end of the microprocessor;
one end of the digital multimeter is connected with a low-voltage branch of the direct-current voltage transformer to be measured and is used for measuring the resistance value of the low-voltage branch and the voltage values of two ends of the low-voltage branch after the direct-current voltage is applied, and the other end of the digital multimeter is connected with the other end of the microprocessor;
and the microprocessor is used for calculating the resistance value of the high-voltage branch circuit according to the resistance value of the low-voltage branch circuit, the voltage values at two ends of the low-voltage circuit after the direct-current voltage is applied and the direct-current voltage value output by the direct-current high-voltage generator.
In the above technical solution, the accuracy grade of the standard dc voltage transformer is two-level higher than the accuracy grade of the dc voltage transformer to be measured.
In a preferred embodiment of the present application, further, the dc voltage value output by the dc high voltage generator is calculated according to the secondary side output voltage value of the standard dc voltage transformer.
In a preferred embodiment of the present application, the system further includes a display screen, and the display screen is used for displaying the resistance value information of the high-voltage branch circuit calculated and analyzed by the microprocessor.
On the other hand, the application also provides a method for testing the resistance value of the high-voltage arm of the direct-current voltage transformer, and the method specifically comprises the following steps:
s101, starting a resistance gear of the digital multimeter, adjusting a measuring range to the measuring range of a low-voltage branch resistance rated value of the direct-current voltage transformer to be measured, testing the resistance value of the low-voltage branch, and transmitting and storing data to a microprocessor;
s102, starting a direct-current high-voltage generator, outputting direct-current voltage through the direct-current high-voltage generator, and inputting the direct-current voltage into a standard direct-current voltage transformer and the direct-current voltage transformer to be tested;
s103, transmitting the secondary side output voltage of the standard direct current voltage transformer to the microprocessor, and calculating and storing an output direct current voltage value of the direct current high voltage generator by using the microprocessor;
s104, starting a direct-current voltage gear of the digital multimeter, testing voltage values at two ends of the low-voltage branch resistance, and inputting and storing the voltage values at two ends of the low-voltage branch resistance into the microprocessor;
and S105, calculating a high-voltage branch resistance value according to the low-voltage branch resistance value, the voltage values at two ends of the low-voltage branch resistance and the input direct-current voltage value, and storing the high-voltage branch resistance value into the microprocessor, wherein the microprocessor judges the high-voltage branch resistance value, and the input direct-current voltage value is calculated according to the secondary side output voltage value of the standard direct-current voltage transformer.
In a preferred embodiment of the present application, further, the formula for calculating the resistance value of the high-voltage branch is as follows:
wherein R isxExpressing the resistance value of the high-voltage branch, K is the voltage division ratio of the standard direct-current voltage transformer, RNRepresenting the resistance value, U, of the low-voltage branch2Represents the secondary side output voltage value, U, of the standard DC voltage transformer1And the voltage value of two ends of the low-voltage branch circuit resistor is represented.
In a preferred embodiment of the present application, the determining process of the resistance value of the high-voltage branch further includes:
and calculating resistance deviation of the high-voltage branch resistance values measured before and after the insulation test through a microprocessor, comparing the deviation value with 0.1%, and if the deviation value is greater than 0.1%, displaying that the high-voltage branch resistance value is unqualified in a display screen.
In a preferred embodiment of the present application, the process of determining the resistance value of the high-voltage branch further includes:
and calculating resistance deviation of the high-voltage branch resistance values measured before and after the insulation test through a microprocessor, comparing the deviation value with 0.1%, and if the deviation value is less than 0.1%, displaying that the high-voltage branch resistance value is qualified in a display screen.
The system and the method for testing the resistance value of the high-voltage arm of the direct-current voltage transformer have the following beneficial effects:
(1) the measuring method and the measuring device can realize the measurement of the high-voltage arm resistance of the direct-current voltage transformer, and the accuracy of the high-voltage arm resistance obtained through measurement is higher.
(2) The data interface of the microprocessor in the application adopts a universal interface, so that the microprocessor can carry out information transmission with external equipment through the data interface, and can also be connected with a charger to charge the microprocessor, thereby avoiding the problem that the microprocessor cannot be connected with the external equipment or is complicated to connect.
(3) The microprocessor is internally provided with a software program, so that the accurate value of the high-voltage arm resistance of the direct-current voltage transformer to be detected can be automatically calculated according to input data, and the calculated high-voltage arm resistance value is displayed on a display screen.
Drawings
In order to more clearly explain the technical solution of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious to those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic diagram of a system for testing a resistance value of a high-voltage arm of a dc voltage transformer according to the present application;
FIG. 2 is a schematic diagram of a system for measuring a low voltage arm resistance value in an embodiment of the present application;
fig. 3 is a flowchart of a method for testing a resistance value of a high voltage arm of a dc voltage transformer according to the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present application, it is also to be noted that, unless otherwise explicitly specified or limited, the term "connected" is to be interpreted broadly, e.g. as a fixed connection, a detachable connection, or an integral connection; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present application can be understood in a specific case by those of ordinary skill in the art.
Furthermore, the terms "comprises" and "comprising," as well as any variations thereof, are intended to cover a non-exclusive inclusion, such that a product or device that comprises a list of elements is not necessarily limited to those elements explicitly listed, but may include other elements not expressly listed or inherent to such product or device.
Example 1
Referring to fig. 1, a schematic diagram of a system for testing a resistance value of a high-voltage arm of a dc voltage transformer is shown.
As shown in fig. 1, the present application provides a system for testing a resistance value of a high-voltage arm of a dc voltage transformer, the system comprising:
the system comprises a direct current high voltage generator, a standard direct current voltage transformer, a direct current voltage transformer to be tested, a digital multimeter and a microprocessor;
the output end of the direct current high voltage generator is electrically connected with the standard direct current voltage transformer and used for providing direct current voltage for the standard direct current voltage transformer;
one end of the standard direct current voltage transformer is connected with the direct current voltage transformer to be detected and used for providing direct current voltage for the direct current voltage transformer to be detected, and the other end of the standard direct current voltage transformer is connected with one end of the microprocessor;
one end of the digital multimeter is connected with a low-voltage branch of the direct-current voltage transformer to be measured and is used for measuring the resistance value of the low-voltage branch and the voltage values of two ends of the low-voltage branch after the direct-current voltage is applied, and the other end of the digital multimeter is connected with the other end of the microprocessor;
and the microprocessor is used for calculating the resistance value of the high-voltage branch circuit according to the resistance value of the low-voltage branch circuit, the voltage values at two ends of the low-voltage circuit after the direct-current voltage is applied and the direct-current voltage value output by the direct-current high-voltage generator.
In the above technical solution, the accuracy grade of the standard dc voltage transformer is two-level higher than the accuracy grade of the dc voltage transformer to be measured.
In this embodiment 1, further, the dc voltage value output by the dc high voltage generator is calculated according to the secondary side output voltage value of the standard dc voltage transformer.
It should be noted that, in this embodiment 1, first, the test circuit is connected according to the connection relationship shown in fig. 2, so as to obtain the resistance value of the low-voltage branch; secondly, connecting each component according to a loop shown in fig. 1, adjusting the direct-current voltage input by the direct-current high-voltage generator, multiplying the input direct-current voltage to a test voltage value required by a test through a voltage doubling circuit, keeping the operation of the direct-current high-voltage generator and maintaining stable high-voltage direct-current output; inputting the secondary side output voltage of the standard direct current voltage transformer into a microprocessor, and calculating and storing the direct current voltage output by the direct current high voltage generator by using the microprocessor; thirdly, starting a direct-current voltage gear of the digital multimeter, testing voltage values at two ends of the low-voltage branch, and transmitting the voltage values to the microprocessor for storage; and finally, the microprocessor calculates the resistance value of the high-voltage branch, namely the resistance value of the high-voltage arm, according to the measured resistance value of the low-voltage branch, the voltage values at two ends of the low-voltage circuit after the direct-current voltage is applied and the direct-current voltage value output by the direct-current high-voltage generator, analyzes the obtained calculation result to judge whether the deviation resistance value meets the specification or not, if the deviation value is less than 0.1%, the high-voltage branch is displayed in a display screen to be qualified in resistance value, if the deviation value is more than 0.1%, the high-voltage branch is displayed in the display screen to be unqualified in resistance value, and the high-voltage branch is displayed in.
In this embodiment 1, further, the system further includes a display screen (not shown in the figure), and the display screen (not shown in the figure) is used for displaying the resistance value information of the high-voltage branch circuit calculated and analyzed by the microprocessor.
Example 2
As shown in fig. 3, the present application further provides a method for testing a resistance value of a high-voltage arm of a dc voltage transformer, where the method specifically includes the following steps:
s101, starting a resistance gear of the digital multimeter, adjusting a measuring range to the measuring range of a low-voltage branch resistance rated value of the direct-current voltage transformer to be measured, testing the resistance value of the low-voltage branch, and transmitting and storing data to a microprocessor;
s102, starting a direct-current high-voltage generator, outputting direct-current voltage through the direct-current high-voltage generator, and inputting the direct-current voltage into a standard direct-current voltage transformer and the direct-current voltage transformer to be tested;
s103, transmitting the secondary side output voltage of the standard direct current voltage transformer to the microprocessor, and calculating and storing an output direct current voltage value of the direct current high voltage generator by using the microprocessor;
s104, starting a direct-current voltage gear of the digital multimeter, testing voltage values at two ends of the low-voltage branch resistance, and inputting and storing the voltage values at two ends of the low-voltage branch resistance into the microprocessor;
and S105, calculating a high-voltage branch resistance value according to the low-voltage branch resistance value, the voltage values at two ends of the low-voltage branch resistance and the input direct-current voltage value, and storing the high-voltage branch resistance value into the microprocessor, wherein the microprocessor judges the high-voltage branch resistance value, and the input direct-current voltage value is calculated according to the secondary side output voltage value of the standard direct-current voltage transformer.
It should be noted that in this embodiment 2, when the resistance value of the low-voltage branch is tested in step S101, a test loop needs to be connected according to the connection relationship shown in fig. 2.
In this embodiment 2, further, the formula for calculating the resistance value of the high-voltage branch is as follows:
wherein R isxExpressing the resistance value of the high-voltage branch, K is the voltage division ratio of the standard direct-current voltage transformer, RNRepresenting the resistance value, U, of the low-voltage branch2Represents the secondary side output voltage value, U, of the standard DC voltage transformer1And the voltage value of two ends of the low-voltage branch circuit resistor is represented.
In this embodiment 2, further, the process of determining the resistance value of the high-voltage branch includes:
and calculating resistance deviation of the high-voltage branch resistance values measured before and after the insulation test through a microprocessor, comparing the deviation value with 0.1%, and if the deviation value is greater than 0.1%, displaying that the high-voltage branch resistance value is unqualified in a display screen.
In this embodiment 2, further, the process of determining the resistance value of the high-voltage branch further includes:
and calculating resistance deviation of the high-voltage branch resistance values measured before and after the insulation test through a microprocessor, comparing the deviation value with 0.1%, and if the deviation value is less than 0.1%, displaying that the high-voltage branch resistance value is qualified in a display screen.
The embodiments provided in the present application are only a few examples of the general concept of the present application, and do not limit the scope of the present application. Any other embodiments extended according to the scheme of the present application without inventive efforts will be within the scope of protection of the present application for a person skilled in the art.
Claims (7)
1. A system for testing the resistance of a high voltage arm of a dc voltage transformer, the system comprising:
the system comprises a direct current high voltage generator, a standard direct current voltage transformer, a direct current voltage transformer to be tested, a digital multimeter and a microprocessor;
the output end of the direct current high voltage generator is electrically connected with the standard direct current voltage transformer and used for providing direct current voltage for the standard direct current voltage transformer;
one end of the standard direct current voltage transformer is connected with the direct current voltage transformer to be detected and used for providing direct current voltage for the direct current voltage transformer to be detected, and the other end of the standard direct current voltage transformer is connected with one end of the microprocessor;
one end of the digital multimeter is connected with a low-voltage branch of the direct-current voltage transformer to be measured and is used for measuring the resistance value of the low-voltage branch and the voltage values of two ends of the low-voltage branch after the direct-current voltage is applied, and the other end of the digital multimeter is connected with the other end of the microprocessor;
and the microprocessor is used for calculating the resistance value of the high-voltage branch circuit according to the resistance value of the low-voltage branch circuit, the voltage values at two ends of the low-voltage circuit after the direct-current voltage is applied and the direct-current voltage value output by the direct-current high-voltage generator.
2. The system for testing the resistance value of the high-voltage arm of the direct-current voltage transformer as claimed in claim 1, wherein the direct-current voltage value outputted by the direct-current high-voltage generator is calculated according to the secondary side output voltage value of the standard direct-current voltage transformer.
3. The system according to claim 1, further comprising a display screen for displaying the resistance information of the high voltage branch after the microprocessor calculates and analyzes the resistance information.
4. A method for testing the resistance value of the high-voltage arm of the direct-current voltage transformer, which is applied to the system for testing the resistance value of the high-voltage arm of the direct-current voltage transformer according to any one of claims 1 to 3, and is characterized by comprising the following steps:
s101, starting a resistance gear of the digital multimeter, adjusting a measuring range to the measuring range of a low-voltage branch resistance rated value of the direct-current voltage transformer to be measured, testing the resistance value of the low-voltage branch, and transmitting and storing data to a microprocessor;
s102, starting a direct-current high-voltage generator, outputting direct-current voltage through the direct-current high-voltage generator, and inputting the direct-current voltage into a standard direct-current voltage transformer and the direct-current voltage transformer to be tested;
s103, transmitting the secondary side output voltage of the standard direct current voltage transformer to the microprocessor, and calculating and storing an output direct current voltage value of the direct current high voltage generator by using the microprocessor;
s104, starting a direct-current voltage gear of the digital multimeter, testing voltage values at two ends of the low-voltage branch resistance, and inputting and storing the voltage values at two ends of the low-voltage branch resistance into the microprocessor;
and S105, calculating a high-voltage branch resistance value according to the low-voltage branch resistance value, the voltage values at two ends of the low-voltage branch resistance and the input direct-current voltage value, and storing the high-voltage branch resistance value into the microprocessor, wherein the microprocessor judges the high-voltage branch resistance value, and the input direct-current voltage value is calculated according to the secondary side output voltage value of the standard direct-current voltage transformer.
5. The method for testing the resistance value of the high-voltage arm of the direct-current voltage transformer as claimed in claim 4, wherein the formula for calculating the resistance value of the high-voltage branch circuit is as follows:
wherein R isxExpressing the resistance value of the high-voltage branch, K is the voltage division ratio of the standard direct-current voltage transformer, RNRepresenting the resistance value, U, of the low-voltage branch2Represents the secondary side output voltage value, U, of the standard DC voltage transformer1And the voltage value of two ends of the low-voltage branch circuit resistor is represented.
6. The method for testing the resistance value of the high-voltage arm of the direct-current voltage transformer as claimed in claim 4, wherein the judgment process of the resistance value of the high-voltage arm comprises:
and calculating resistance deviation of the high-voltage branch resistance values measured before and after the insulation test through a microprocessor, comparing the deviation value with 0.1%, and if the deviation value is greater than 0.1%, displaying that the high-voltage branch resistance value is unqualified in a display screen.
7. The method for testing the resistance value of the high-voltage arm of the direct-current voltage transformer as claimed in claim 6, wherein the determining process of the resistance value of the high-voltage arm further comprises:
and calculating resistance deviation of the high-voltage branch resistance values measured before and after the insulation test through a microprocessor, comparing the deviation value with 0.1%, and if the deviation value is less than 0.1%, displaying that the high-voltage branch resistance value is qualified in a display screen.
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| CN202011354654.6A CN112485530A (en) | 2020-11-26 | 2020-11-26 | System and method for testing resistance value of high-voltage arm of direct-current voltage transformer |
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Application publication date: 20210312 |
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