CN112964621A - Rock-soil body temperature-seepage coupling device for industrial CT scanning - Google Patents

Rock-soil body temperature-seepage coupling device for industrial CT scanning Download PDF

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CN112964621A
CN112964621A CN202110188924.9A CN202110188924A CN112964621A CN 112964621 A CN112964621 A CN 112964621A CN 202110188924 A CN202110188924 A CN 202110188924A CN 112964621 A CN112964621 A CN 112964621A
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temperature
seepage
water tank
sample chamber
water
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姜茜慧
李长冬
周佳庆
王睿
刘洪斌
朱文宇
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China University of Geosciences
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China University of Geosciences
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/08Investigating permeability, pore-volume, or surface area of porous materials
    • G01N15/082Investigating permeability by forcing a fluid through a sample
    • G01N15/0826Investigating permeability by forcing a fluid through a sample and measuring fluid flow rate, i.e. permeation rate or pressure change
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/08Investigating permeability, pore-volume, or surface area of porous materials
    • G01N15/0806Details, e.g. sample holders, mounting samples for testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/03Investigating materials by wave or particle radiation by transmission
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/31Accessories, mechanical or electrical features temperature control
    • G01N2223/3103Accessories, mechanical or electrical features temperature control cooling, cryostats
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/31Accessories, mechanical or electrical features temperature control
    • G01N2223/3106Accessories, mechanical or electrical features temperature control heating, furnaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/616Specific applications or type of materials earth materials

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Abstract

The invention provides a rock-soil mass temperature-seepage coupling device for industrial CT scanning, which comprises a temperature control system and a seepage system, wherein the temperature control system is connected with the seepage system through a pipeline; the temperature control system comprises a sample chamber, a sample sleeve and a sample chamber temperature adjusting module, wherein the sample chamber temperature adjusting module comprises a flow guide fan, a first heating sheet, a first semiconductor refrigerating sheet, a heat radiating fan, a first temperature sensor and a first temperature controller, wherein the flow guide fan penetrates through the outer wall of the sample chamber from inside to outside; the seepage system comprises a water tank, a water tank temperature adjusting module and a seepage pipeline, wherein the water tank temperature adjusting module comprises a second heating sheet, a second semiconductor refrigerating sheet, a water tank fan, a second temperature controller and a second temperature sensor which penetrate through the outer wall of the water tank from inside to outside, the seepage pipeline comprises a water pump, a water inlet branch and a water outlet branch, a water inlet pressure gauge is arranged on the water inlet branch, and a water outlet pressure gauge and a flowmeter are arranged on the water outlet branch. The invention has the beneficial effects that: the seepage process at different temperatures from below zero to above zero can be simulated, and the change process of the soil shape under the action of temperature and seepage is explored.

Description

Rock-soil body temperature-seepage coupling device for industrial CT scanning
Technical Field
The invention relates to the technical field of soil permeability measuring equipment, in particular to a rock-soil mass temperature-seepage coupling device for industrial CT scanning.
Background
When the Sichuan-Tibet railway passes through a Tibet alpine region, due to the influence of weather factors, ice and snow are ablated by temperature rise and precipitation in summer and autumn, surface runoff and subsurface runoff are increased, the structure of the tillite is damaged, the physical and mechanical properties are changed, geological disasters such as landslide and debris flow are easily caused, and the construction and operation safety of the railway is threatened. Because the tillite in the area is at the subzero environmental temperature for a long time, the gravel and the sandy soil are mixed, the particle size is very different, and the difference is larger than that of a common soil body, the conventional permeameter cannot reflect the in-situ seepage characteristic of the tillite. In the seepage process, the ice particles in the moraine soil are gradually melted under the room temperature environment, the obtained permeability cannot reflect the actual condition, and the correct parameters have important significance for researching the slip starting mechanism of the landslide debris flow in the glacier area. Therefore, according to the in-situ environmental condition, the change rule of the physical and mechanical properties of the tillite under the temperature-seepage coupling condition needs to be researched urgently.
With the development of science and technology, industrial CT scanning is widely applied to the field of geotechnical engineering due to its advantages of high resolution imaging, nondestructive scanning, three-dimensional perspective, and the like. The technology is used for exploring the microscopic physical and mechanical characteristics of void distribution, deformation characteristics, freeze-thaw change, damage mechanism, infiltration characteristics and the like in the rock-soil body. Due to the limitation of experimental instruments, the following methods are mainly adopted for exploring the change of rock-soil bodies in the seepage process at present: and (3) performing seepage experiments under a constant temperature condition on the multi-field coupling tester, and then taking out the sample for CT scanning after the experiments are finished. However, this method can only obtain one image after the experiment is finished, and cannot reflect the dynamic change process in the seepage process, and the sample is disturbed in the process of taking out the sample and placing the sample in the CT room. The CT scanning divides the detected object into a plurality of layers for scanning and imaging, the required scanning time is long, and rock and soil mass with higher requirements on environmental temperature is easy to change in the scanning process. Based on the limitations of the above experimental conditions, a temperature-seepage experimental platform capable of directly performing CT scanning is urgently needed.
Disclosure of Invention
In view of this, in order to realize a seepage experiment under a constant temperature condition, obtain dynamic changes of a rock-soil body in a seepage process, and avoid influences of environmental conditions and manual disturbances on experiment reliability, embodiments of the present invention provide a rock-soil body temperature-seepage coupling device for industrial CT scanning.
The embodiment of the invention provides a rock-soil body temperature-seepage coupling device for industrial CT scanning, which comprises a temperature control system and a seepage system, wherein the temperature control system comprises a temperature sensor, a temperature sensor;
the temperature control system comprises a sample chamber, a sample sleeve and a sample chamber temperature adjusting module, wherein the sample chamber temperature adjusting module is arranged in the sample chamber and used for accommodating rock-soil samples, and comprises a flow guide fan, a first heating sheet, a first semiconductor refrigerating sheet, a heat radiating fan, a first temperature sensor and a first temperature controller, the flow guide fan, the first heating sheet, the first semiconductor refrigerating sheet and the heat radiating fan penetrate through the outer wall of the sample chamber from inside to outside, the first temperature sensor and the first temperature controller are arranged in the sample chamber, the heat absorbing end of the first semiconductor refrigerating sheet is in contact with the first heating sheet, the first temperature controller is respectively connected with the first heating sheet, the first semiconductor refrigerating sheet and the first temperature sensor, and the first temperature controller controls the first heating sheet to heat or the first semiconductor refrigerating sheet to refrigerate so;
the seepage system comprises a water tank for storing seepage water, a water tank temperature regulating module and a seepage pipeline, wherein the water tank temperature regulating module is arranged on the outer wall of the water tank and comprises a second heating sheet, a second semiconductor refrigerating sheet, a water tank fan and a second temperature controller which penetrate through the outer wall of the water tank from inside to outside, and a second temperature sensor arranged in the water tank, the heat absorbing end of the second semiconductor refrigerating sheet is contacted with the second heating sheet, the seepage pipeline comprises a water pump arranged in the water tank, a water inlet branch for connecting the water pump with one end of the sample sleeve and a water outlet branch for connecting the other end of the sample sleeve with the water tank, the water inlet branch is also provided with a water inlet pressure gauge, the water outlet branch is also provided with a water outlet pressure gauge and a flow meter, and the second temperature controller is respectively connected with the second heating sheet, the second semiconductor refrigerating sheet, the water tank fan and the second temperature sensor, and the water temperature in the water tank is kept at the target temperature by controlling the second heating sheet to heat or the second semiconductor refrigerating sheet to refrigerate, and the water pump pumps seepage water at the target temperature into the sample sleeve.
Further, the sample sleeve is vertically arranged in the sample chamber, the water inlet branch is connected with the lower end of the sample sleeve, and the water outlet branch is connected with the upper end of the sample sleeve.
Furthermore, the upper end of the sample sleeve is provided with an upper permeable stone, and the lower end of the sample sleeve is provided with a lower permeable stone.
Furthermore, a hollow support is arranged at the bottom of the sample chamber, the sample sleeve is arranged in the middle of the sample chamber, the lower end of the sample sleeve is fixed on the hollow support, and the lower end of the water inlet branch passes through the hollow support and is connected with the lower end of the sample sleeve.
Furthermore, the surface of the sample chamber is provided with a heat insulation layer, the upper end of the sample chamber is provided with an opening, and the upper end of the sample chamber is provided with a heat insulation cover for sealing the upper end port of the sample chamber.
Further, the water tank is of a double-layer structure and comprises an inner metal copper layer and an outer polyurethane foam layer.
Furthermore, a clamping groove is formed in the upper end of the water tank, the sample chamber is supported at the upper end of the water tank, and the lower end of the sample chamber is embedded in the clamping groove.
The technical scheme provided by the embodiment of the invention has the following beneficial effects: the rock-soil body temperature-seepage coupling device for industrial CT scanning is suitable for soil body seepage experiments with high requirements on environmental temperature, can simulate seepage processes at different temperatures from below zero to above zero, explores the change process of the soil body shape under the action of temperature and seepage, can realize the control of the temperature in a sample chamber and the temperature of circulating water flow through the adjustment of a temperature control system, and can set different or same sample chamber temperatures and circulating water flow temperatures so as to simulate seepage processes under various temperature conditions; the device can be placed in a CT scanning room to perform real-time scanning of the seepage process under different environmental temperature conditions, and the change rule of the permeability coefficient and the evolution process of the internal properties of the sample along with time are explored; the device has the advantages of light weight, small volume, simple structure, convenient operation and wide application, overcomes the defect that the conventional permeameter cannot perform experiments under the constant temperature condition, and provides technical support for research on rock and soil body seepage in alpine regions or high-temperature regions.
Drawings
FIG. 1 is a front view of a rock-soil mass temperature-seepage coupling device for industrial CT scanning according to the present invention;
FIG. 2 is a top view of a rock-soil mass temperature-seepage coupling device for industrial CT scanning according to the present invention;
FIG. 3 is a schematic diagram of the attachment of a sample chamber temperature conditioning module;
fig. 4 is a schematic diagram of the connection of a tank trim module.
In the figure: 1-a radiating fan, 2-a first semiconductor refrigerating sheet, 3-a first heating sheet, 4-a flow guiding fan, 5-a flow meter, 6-a first temperature sensor, 7-a heat insulating layer, 8-a heat insulating cover, 9-a water outlet branch, 10-a water outlet pressure gauge, 11-an upper permeable stone, 12-a sample sleeve, 13-a sample chamber, 14-a lower permeable stone, 15-a hollow support, 16-a water inlet pressure gauge, 17-a water inlet branch, 18-a water tank, 19-a second temperature sensor, 20-a water pump, 21-a water tank fan, 22-a second semiconductor refrigerating sheet, 23-a second heating sheet, 24-a polyurethane foam layer, 25-a first semiconductor refrigerating sheet, 26-a socket, 27-a second temperature controller, 28-a socket, 29/30-Cable.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention will be further described with reference to the accompanying drawings.
Referring to fig. 1 and 2, an embodiment of the present invention provides a rock-soil mass temperature-seepage coupling device for industrial CT scanning, which includes a temperature control system and a seepage system.
The temperature control system comprises a sample chamber 13, a sample sleeve 12 arranged in the sample chamber 13 and used for containing a rock-soil sample, and a sample chamber temperature adjusting module. The sample chamber 13 is hollow and cylindrical, the surface of the sample chamber is provided with a heat insulation layer 7, the upper end of the sample chamber 13 is open, and the upper end of the sample chamber 13 is provided with a heat insulation cover 8 for sealing the upper end opening of the sample chamber. The heat preservation cover 8 is fixedly connected with the upper port of the sample chamber 13 in a threaded connection mode, and the heat preservation layer 7 is made of polystyrene foam and plays a role in heat insulation. The polystyrene foam is a material with good heat preservation performance and low density, and can be used for CT scanning without interfering the image of a detected sample.
The sample sleeve 12 is arranged in the middle of the sample chamber 13, the bottom of the sample chamber 13 is provided with a hollow support 15, the lower end of the sample sleeve 12 is fixed on the hollow support 15, and the hollow support 15 is of a hollow structure made of a light acrylic plate and plays a role in supporting and fixing the sample sleeve 12.
The sample room temperature adjusting module comprises a flow guide fan 4, a first heating sheet 3, a first semiconductor refrigerating sheet 2, a heat radiating fan 1, a first temperature sensor 6 and a first temperature controller 25, wherein the flow guide fan 4, the first heating sheet 3, the first semiconductor refrigerating sheet 2 and the heat radiating fan 1 penetrate through the outer wall of the sample room 13 from inside to outside. The first heating sheet 3 and the diversion fan 4 are arranged on one side of the inner wall of the sample chamber 13, the first heating sheet 3 heats air on the inner side of the sample chamber, and the diversion fan 4 accelerates the air flow in the sample chamber 13 through blowing so as to uniformly diffuse heat into the sample chamber 13.
The first semiconductor refrigeration piece 2 is arranged outside the first heating piece 3, the heat absorption end of the first semiconductor refrigeration piece 2 is in contact with the first heating piece 3, the heat absorption end of the first semiconductor refrigeration piece 2 is bonded with the first heating piece 3 through heat conduction silica gel with good heat conduction performance, the heat dissipation end of the first semiconductor refrigeration piece 2 faces the heat dissipation fan 1, when the first semiconductor refrigeration piece 2 is used for refrigerating, heat in the sample chamber 13 is transferred to the heat absorption end of the first semiconductor refrigeration piece 2 through the first heating piece 3, and therefore the heat is absorbed, and the temperature in the sample chamber 13 is reduced.
Referring to fig. 3, the first temperature controller 25 is connected to the first heating plate 3, the guiding fan 4, the first semiconductor cooling plate 2, the cooling fan 1 and the first temperature sensor 6 through cables 29, respectively, and the first temperature sensor 6 is fixed on the hollow support 15. The first temperature controller 25 is provided with a plug 26, is connected with an external power supply through the plug 26, and is respectively powered by the first heating plate 3, the diversion fan 4, the first semiconductor refrigerating plate 2, the heat radiation fan 1 and the first temperature sensor 6, and controls the start and stop of the first heating plate, the diversion fan 4, the first semiconductor refrigerating plate and the first temperature sensor.
The first temperature sensor 6 is used to measure the temperature in the sample chamber 13 and compare it with a target temperature required for the experiment. When the temperature in the sample chamber 13 is lower than the target temperature, the first temperature controller 25 controls the first heating sheet 3 and the flow guide fan 4 to be started, the interior of the sample chamber 13 is heated until the target temperature is reached, and then the first temperature controller 25 controls the first heating sheet 3 and the flow guide fan 4 to be stopped. When the temperature in the sample chamber 13 is higher than the target temperature, the first temperature controller 25 controls the first semiconductor refrigeration sheet 2 and the cooling fan 1 to be started, the interior of the sample chamber 13 is cooled until the target temperature is reached, and then the first temperature controller 25 controls the first semiconductor refrigeration sheet 2 and the cooling fan 1 to be shut down.
The seepage system comprises a water tank 18 for storing seepage water, a water tank temperature adjusting module arranged on the outer wall of the water tank 18 and a seepage pipeline connected with the sample sleeve. The upper end of the water tank 18 is provided with a clamping groove, the lower end of the sample chamber 13 is matched with the clamping groove, the sample chamber 13 is supported at the upper end of the water tank 18, and the lower end of the sample chamber 13 is embedded with the clamping groove. The water tank 18 has a double-layer structure, and includes an inner copper layer and an outer polyurethane foam layer 24, the copper layer has good heat conductivity and is beneficial to heat transfer in the water tank 18, and the polyurethane foam layer 24 is heat-insulating and heat-preserving and reduces heat exchange between the inside and the outside of the water tank 18.
The water tank temperature adjusting module comprises a second heating sheet 23, a second semiconductor refrigerating sheet 22, a water tank fan 21, a second temperature sensor 19 and a second temperature controller 27, wherein the second heating sheet 23, the second semiconductor refrigerating sheet 22, the water tank fan 21, the second temperature sensor 19 and the second temperature controller 27 penetrate through the outer wall of the water tank 18 from inside to outside, and a heat absorption end of the second semiconductor refrigerating sheet 22 is in contact with the second heating sheet 23. The second heating plate 23 is arranged on the inner wall of the water tank 18, and the second semiconductor refrigeration plate 22 is arranged on the outer side of the second heating plate 23. The heat absorption end of the second semiconductor refrigeration piece 22 is bonded with the second heating piece 23 through heat conduction silica gel with good heat conduction performance, and the heat dissipation end of the second semiconductor refrigeration piece 22 faces the water tank fan 21.
The seepage pipeline comprises a water pump 20 arranged in the water tank 18, a water inlet branch 17 connected with the water pump 20 and one end of the sample sleeve 12, and a water outlet branch 9 connected with the other end of the sample sleeve 12 and the water tank 18. The water pump 20 pumps seepage water to be input into the sample sleeve 12 through the water inlet branch 17, and then the seepage water in the sample sleeve 12 flows back to the water tank 18 through the water outlet branch 9, so that a closed circulation loop is formed, water is saved, and the water supply by a large water tank is avoided.
The lower end of the water inlet branch 17 penetrates through the hollow support 15 to be connected with the lower end of the sample sleeve 12, and the water outlet branch 9 is connected with the upper end of the sample sleeve 12. Here, the upper end of the sample sleeve 12 is further provided with an upper permeable stone 11, the lower end is provided with a lower permeable stone 14, and the upper permeable stone 11 and the lower permeable stone 14 are used for enabling water to uniformly and stably flow through rock and soil samples.
In addition, the water inlet branch 17 is also provided with a water inlet pressure gauge 16, and the water outlet branch 9 is also provided with a water outlet pressure gauge 10 and a flowmeter 5. The water inlet pressure gauge 16 can measure the water pressure at the water inlet of the sample sleeve 12, the water outlet pressure gauge 10 can measure the water pressure at the water outlet of the sample sleeve 12, and the flow meter 5 can measure the flow value at the water outlet of the sample sleeve 12. The permeability coefficient of the rock soil sample can be calculated according to Darcy's law by reading the pressure value and the flow value of the pressure gauges at the water inlet and the water outlet of the sample sleeve 12 and combining the cross-sectional area and the length of the sample sleeve 12.
Referring to fig. 4, the second temperature controller 27 is connected to the second heating plate 23, the second semiconductor cooling plate 22, the water tank fan 21 and the second temperature sensor 19 through cables 30, respectively, and the second temperature sensor 19 is fixed on the inner wall of the water tank 18. The second temperature controller 27 is provided with a plug 28, connected with an external power supply through the plug 28, and respectively supplies power to the second heating plate 23, the second semiconductor cooling plate 22, the water tank fan 21 and the second temperature sensor 19, and controls the start and stop of the second heating plate, the second semiconductor cooling plate 22, the water tank fan 21 and the second temperature sensor 19.
The second temperature sensor 19 measures the temperature of the seepage water in the water tank 18 and compares it with a target temperature required for the experiment. When the temperature in the water tank 18 is lower than the target temperature, the second temperature controller 27 controls the second heating sheet 23 to start, heats the interior of the water tank 18 until the target temperature is reached, and the second temperature controller 27 controls the second heating sheet 23 to stop. When the temperature in the water tank 18 is higher than the target temperature, the second temperature controller 27 controls the second semiconductor refrigeration sheet 22 and the water tank fan 21 to be started, the seepage water in the water tank 18 is cooled until the target temperature is reached, and the second temperature controller 27 controls the second semiconductor refrigeration sheet 22 and the water tank fan 21 to be shut down.
Therefore, different or same target temperatures and seepage water target temperatures in the sample chamber 13 can be set to simulate seepage processes under various temperature conditions, the temperature-seepage device is placed in a CT scanning chamber to perform real-time scanning of the seepage processes under constant temperature conditions, the change process inside a sample is explored, the defect that a conventional permeameter cannot perform experiments under constant temperature conditions is overcome, and technical support is provided for rock and soil body seepage research in alpine regions or high-temperature regions.
In this document, the terms front, back, upper and lower are used to define the components in the drawings and the positions of the components relative to each other, and are used for clarity and convenience of the technical solution. It is to be understood that the use of the directional terms should not be taken to limit the scope of the claims.
The features of the embodiments and embodiments described herein above may be combined with each other without conflict.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims (7)

1. A rock-soil body temperature-seepage flow coupling device for industrial CT scanning is characterized in that: comprises a temperature control system and a seepage system;
the temperature control system comprises a sample chamber, a sample sleeve and a sample chamber temperature adjusting module, wherein the sample chamber temperature adjusting module is arranged in the sample chamber and used for accommodating rock-soil samples, and comprises a flow guide fan, a first heating sheet, a first semiconductor refrigerating sheet, a heat radiating fan, a first temperature sensor and a first temperature controller, the flow guide fan, the first heating sheet, the first semiconductor refrigerating sheet and the heat radiating fan penetrate through the outer wall of the sample chamber from inside to outside, the first temperature sensor and the first temperature controller are arranged in the sample chamber, the heat absorbing end of the first semiconductor refrigerating sheet is in contact with the first heating sheet, the first temperature controller is respectively connected with the first heating sheet, the first semiconductor refrigerating sheet and the first temperature sensor, and the first temperature controller controls the first heating sheet to heat or the first semiconductor refrigerating sheet to refrigerate so;
the seepage system comprises a water tank for storing seepage water, a water tank temperature regulating module and a seepage pipeline, wherein the water tank temperature regulating module is arranged on the outer wall of the water tank and comprises a second heating sheet, a second semiconductor refrigerating sheet, a water tank fan and a second temperature controller which penetrate through the outer wall of the water tank from inside to outside, and a second temperature sensor arranged in the water tank, the heat absorbing end of the second semiconductor refrigerating sheet is contacted with the second heating sheet, the seepage pipeline comprises a water pump arranged in the water tank, a water inlet branch for connecting the water pump with one end of the sample sleeve and a water outlet branch for connecting the other end of the sample sleeve with the water tank, the water inlet branch is also provided with a water inlet pressure gauge, the water outlet branch is also provided with a water outlet pressure gauge and a flow meter, and the second temperature controller is respectively connected with the second heating sheet, the second semiconductor refrigerating sheet, the water tank fan and the second temperature sensor, and the water temperature in the water tank is kept at the target temperature by controlling the second heating sheet to heat or the second semiconductor refrigerating sheet to refrigerate, and the water pump pumps seepage water at the target temperature into the sample sleeve.
2. The geotechnical body temperature-seepage coupling device for industrial CT scanning according to claim 1, wherein: the sample sleeve is vertically arranged in the sample chamber, the water inlet branch is connected with the lower end of the sample sleeve, and the water outlet branch is connected with the upper end of the sample sleeve.
3. The geotechnical body temperature-seepage coupling device for industrial CT scanning according to claim 2, wherein: the upper end of the sample sleeve is provided with an upper permeable stone, and the lower end of the sample sleeve is provided with a lower permeable stone.
4. The geotechnical body temperature-seepage coupling device for industrial CT scanning according to claim 2, wherein: the sample chamber is characterized in that a hollow support is arranged at the bottom of the sample chamber, the sample sleeve is arranged in the middle of the sample chamber, the lower end of the sample sleeve is fixed on the hollow support, and the lower end of the water inlet branch penetrates through the hollow support to be connected with the lower end of the sample sleeve.
5. The geotechnical body temperature-seepage coupling device for industrial CT scanning according to claim 1, wherein: the surface of the sample chamber is provided with a heat insulation layer, the upper end of the sample chamber is provided with an opening, and the upper end of the sample chamber is provided with a heat insulation cover for sealing the upper end opening of the sample chamber.
6. The geotechnical body temperature-seepage coupling device for industrial CT scanning according to claim 1, wherein: the water tank is of a double-layer structure and comprises a metal copper layer on an inner layer and a polyurethane foam layer on an outer layer.
7. The geotechnical body temperature-seepage coupling device for industrial CT scanning according to claim 1, wherein: the upper end of the water tank is provided with a clamping groove, the sample chamber is supported at the upper end of the water tank, and the lower end of the sample chamber is embedded with the clamping groove.
CN202110188924.9A 2021-02-19 2021-02-19 Rock-soil body temperature-seepage coupling device for industrial CT scanning Pending CN112964621A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115931675A (en) * 2022-12-08 2023-04-07 中国地质大学(武汉) Rock-soil mass temperature-seepage-settlement visual observation test system and method
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Application publication date: 20210615