CN112945867B - Reflective gray-scale test card measuring system and method - Google Patents
Reflective gray-scale test card measuring system and method Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
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- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
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- G06T7/90—Determination of colour characteristics
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- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30121—CRT, LCD or plasma display
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
The invention discloses a measuring system and a measuring method of a reflective gray-scale test card, wherein the measuring system comprises a light source system, a collimation system, a corner system and a receiver, the collimation system is a light track, the light source system and a sample frame are arranged on the light track and on the same straight line, and a diaphragm is arranged between the light source system and the sample frame; the corner system 45/0 is a corner platform of geometric measurement conditions and is used for controlling the rotation of the measurement wall and the sample rack; the receiver is a spectral spectroradiometer mounted on a measuring wall; a collimator is additionally arranged around the halogen lamp as a light source, and a double-shaft stepping motor and a microcomputer built-in PCI test card based on a PCI interface are adopted to realize the automatic control of a 45/0 corner system; a standard white board with a known standard value is used as a standard, and a relative measurement method is used for realizing the non-contact measurement of the reflective optical density.
Description
Technical Field
The invention relates to the technical field of gray-scale test card parameter testing, in particular to a reflective gray-scale test card measuring system and method.
Background
Today, we enter the screen age, and every day we are crossing various screens, watching television at home, watching mobile phones at home, and facing computers at the unit. With the development of display technology, the pixels of various electronic screens are also higher and higher, and the original purpose of the pixels is not seen. But if we carefully observe, we can see the end through the LED advertising screen on each large square. It is not a monolithic piece but consists of a block of luminous points. In general, a dot, i.e., a pixel, on a liquid crystal display is composed of three primary colors of red, green, and blue (RGB). The light source behind each primary color may exhibit a different brightness level. And gray scale represents the gradation level of different brightness from darkest to brightest. The change level of each of the three primary colors in the process of continuously darkening from pure colors to black is divided into gray levels of the colors, and the gray levels are represented by numbers, which is the most common color storage principle. The more such intermediate levels, the finer the picture effect that can be presented.
The gray-scale test card is a test chart card tool for detecting the image fineness, and distinguishes the quality of images shot by different scanners or digital camera products. The gray-scale test cards commonly used at present can be classified into transmission gray-scale test cards or reflection gray-scale test cards according to the principle, and can be classified into 20 gray-scale test cards, 11 gray-scale test cards and the like according to the number of the gray-scale test cards.
As the only tool for detecting the image fineness, the quality of the gray-scale test card plays a decisive role in evaluating the quality of a scanner or a digital camera product. At present, the parameter indexes of gray-scale test cards in the industry have no uniform measurement standard, and the product evaluation system is inconsistent, which is very unfavorable for the development of the digital camera industry.
The optical density is measured by a reflective densitometer in the traditional method, but the method is contact measurement, the reflective gray-scale test card is formed by spraying special materials on a drawing according to different thicknesses and concentrations, and marks are left on the measurement surface to destroy the performance of the test card by the traditional contact measurement. In addition, the area of each image on the reflective gray scale test card is too small, the measuring port of the reflective densitometer is generally larger and can not be matched with the reflective gray scale test card, and a special small hole base is needed to be customized, so that the measuring cost is increased. After the computer is matched with color, each image is printed on a drawing with larger area, the optical density of each image is measured by a reflective densitometer and then printed on the same drawing, but the method can only make factory value setting, and the calibration cannot be implemented in the later period.
Disclosure of Invention
In view of the foregoing, an object of the present invention is to provide a reflective gray-scale test card measurement system and method, which can perform contactless measurement on optical density of a reflective gray-scale test card, and is used for evaluating quality of the gray-scale test card by processing and analyzing measurement data. The technical proposal is as follows:
a method for measuring a reflective gray-scale test card comprises the following steps:
s1: build reflective gray scale test card test platform
1) A light source system and a sample rack are arranged on a light track, and the light source system and the sample rack are ensured to be on a straight line; a diaphragm is arranged between the light source system and the sample frame, so that light rays can be clearly irradiated on the sample to be measured;
2) Constructing a corner system of 45/0 geometric measurement condition, which is used for controlling the rotation of the measurement wall and the sample rack to form an included angle of 45 degrees with the light track;
3) A spectral spectroradiometer is arranged on the measuring wall and used as a receiving unit for receiving optical signals reflected by the to-be-measured reflective gray scale test card and the standard white board;
s2: through the reflective gray-scale test card test platform, the brightness value L of the reflective gray-scale test card to be tested is measured 1 And standard whiteboard brightness value L 2 ;
S3: calculating a light reflection factor R of the reflective gray-scale test card to be tested;
wherein R is S Light reflection factor for a known standard whiteboard;
s4: calculating the reflection density D of the reflection type gray-scale test card to be tested: d= -log R.
Further, the S2 specifically is: the height of the measured sample is adjusted by a laser collimator, so that the photometry axis of the sample and the photometry axis of the optical track are positioned in the same horizontal plane; the eyepiece of the spectrum spectroradiometer aims at the center of a standard whiteboard or a reflective gray scale test card, and the eyepiece and the objective lens are adjusted while observation is carried out, so that an aperture diaphragm in the instrument is clearly visible, and the surface of a measured object is clearly imaged; after the instrument is preheated, adjusting the sample frame to form a 45-degree angle with the measuring axis of the optical track through a corner system, and starting measurement; the standard white board is measured first, and then the brightness of each image on the reflective gray-scale test card to be tested is measured in sequence.
Further, the light source system is a halogen lamp; a collimator is additionally arranged around the halogen lamp to manufacture a parallel light beam similar to the target spotlight.
Furthermore, an ultraviolet/infrared cut-off filter is additionally arranged in the light source system, so that the influence of ultraviolet light and near infrared light is eliminated.
A reflective gray-scale test card measurement system comprises a light source system, a collimation system, a corner system and a receiver; the collimation system is a light track, the light source system and the sample frame are arranged on the light track and on the same straight line, and a diaphragm is arranged between the light source system and the sample frame; the corner system 45/0 is a corner platform of geometric measurement conditions and is used for controlling the rotation of the measurement wall and the sample rack; the receiver is a spectroradiometer mounted on a measurement wall.
Further, the corner system comprises a biaxial stepping motor and a PCI test card; the PCI test card can be directly inserted into a PCI slot of the computer, and the computer controls the double-shaft stepping motor to operate through the driving controller so as to drive the measuring wall and the sample rack to rotate.
The beneficial effects of the invention are as follows: according to the invention, an optical platform is built according to the existing laboratory test instrument, and a test scheme is designed; a collimator is additionally arranged around a halogen lamp as a light source, a double-shaft stepping motor and a microcomputer built-in PCI test card based on a PCI interface are adopted to realize automatic control of a 45/0 corner system, a spectrum spectroradiometer is selected as a receiving unit, a standard white board with a known standard value is used as a standard, and a relative measurement method is used to realize non-contact measurement of reflection optical density.
Drawings
FIG. 1 is a block diagram of a reflective gray scale test card test system.
FIG. 2 is a schematic diagram of a test light path of a reflective gray-scale test card.
Fig. 3 is a structural diagram of an automatic control unit of the corner system.
FIG. 4 is a schematic diagram showing linearity of a tested reflective gray-scale test card.
Detailed Description
The invention will now be described in further detail with reference to the drawings and to specific examples. The invention adopts a relative measurement method, firstly measures the brightness ratio of each level of the standard white board and the reflective gray scale test card, then calculates the reflection factor of each level of the reflective gray scale test card according to the reflection factor of the standard white board, and finally calculates the reflection optical density value of each level according to the reflection factor.
According to the definition of the reflection density, it is known that the reflection density has a one-to-one correspondence with the light reflection factor, and thus the corresponding reflection optical density can be calculated by measuring the light reflection factor. The light reflection factor of the reflective gray-scale test card adopts a relative measurement method, and the light reflection factor of the tested gray-scale test card is obtained by multiplying the brightness ratio of the gray-scale test card to the standard white board by the standard white board with the known light reflection factor.
The test system of the invention adopts the calibration thought of the traditional luminance meter, uses a halogen lamp as a light source, uses a light rail as a collimation system and uses a spectrum spectroradiometer as a receiving unit, and the main working principle is shown in figure 1.
The invention relates to a measuring method of a reflective gray-scale test card, which comprises the following steps:
s1: build reflective gray scale test card test platform
1) A light source system and a sample rack are arranged on a light track, and the light source system and the sample rack are ensured to be on a straight line; a diaphragm is arranged between the light source system and the sample frame, so that light rays can be clearly irradiated on the sample to be measured;
2) Constructing a corner system of 45/0 geometric measurement condition, which is used for controlling the rotation of the measurement wall and the sample rack to form an included angle of 45 degrees with the light track;
3) A spectral spectroradiometer is arranged on the measuring wall and used as a receiving unit for receiving optical signals reflected by the to-be-measured reflective gray scale test card and the standard white board;
s2: through the reflective gray-scale test card test platform, the brightness value L of the reflective gray-scale test card to be tested is measured 1 And standard whiteboard brightness value L 2 ;
S3: calculating a light reflection factor R of the reflective gray-scale test card to be tested;
wherein R is S Light reflection factor for a known standard whiteboard;
s4: calculating the reflection density D of the reflection type gray-scale test card to be tested:
D=-log R (2)
in this embodiment, when the test platform is set up, the light source system and the sample holder are installed on one optical track, so that they are ensured to be on one straight line. According to the use environment of reflection density, we also need to build a corner platform of 45/0 (namely 45 degree direction illumination, normal direction receiving) geometric measurement condition. And a spectral spectroradiometer is arranged on the measuring wall and used as a receiving unit for receiving the light signals reflected by the reflective gray scale test card, and the reflected brightness is displayed after calculation. And (3) calculating the reflected optical density of the tested sample according to the formulas (1) and (2) by using EXCEL software. A schematic diagram of the test light path is shown in fig. 2.
The principle that the use environment of a sample to be measured is simulated as much as possible around a measuring system is adopted, the spectral energy distribution of luminous flux falling on the surface of the sample is in accordance with CIE standard illuminant A according to the specification in GB/T23649-2009 in the aspect of light source selection, the corresponding distribution color temperature is 2856K, the tolerance is +/-100K, and therefore a halogen lamp is adopted as an illumination light source in the design. In order to obtain the effect similar to sunlight, a collimator is additionally arranged around the halogen lamp, so that a parallel beam similar to the target spotlight is manufactured. The halogen lamp belongs to solid luminescence, can emit continuous spectrum, has a luminescence wavelength range of (350-2500) nm, and has a spectrum range required by reflection density measurement of (380-700) nm, and the receiver adopted in the system is sensitive to ultraviolet light and near infrared light. In order to eliminate the influence of the two lights, an ultraviolet/infrared cut filter is also required to be added in the light source system. In order to shield stray light, a diaphragm is arranged between the light source and the sample holder, so that light rays can be clearly irradiated on a tested sample.
And in the corner system part, a corner device is required to be constructed, so that an included angle of 45 degrees is formed between the light rail and the measuring wall (comprising the sample rack). In the traditional method, the angle after rotation is measured by using an angle gauge after the measuring wall is manually rotated, but the angle gauge and the measuring wall cannot be well matched due to the structural limitation of mechanical parts, so that the measuring error is larger. The angle of rotation of the measuring wall can be measured by reading the scale disc by using the principle of angle scale disc, but because the test experiment is carried out in a darkroom, each time the scale disc is read, the operation is inconvenient because the flashlight is used for illumination. The invention designs an automatic control corner system based on a double-shaft stepping motor and a PCI test card, wherein the test card can be directly inserted into any PCI slot of a computer and is directly connected to a testing device through a simple connecting line. The device adopts a 51 single chip microcomputer with the model of AT89C51 (crystal oscillator frequency is 12 MHz) to control a double-output-shaft six-wire stepping motor QK28STH32-0956B (internal resistance 33 ohms, step angle 1.8 degrees and rated current 0.95A). The square wave with time sequence output through the I/O port is used as a control signal of the stepping motor, and the signal drives the stepping motor through a chip ULN 2003. The rotation of the measuring wall and the sample rack is automatically controlled by a computer, so that the framework of the 45/0 corner system is realized. The structure of the automatic control unit of the corner system is shown in figure 3.
Testing process and data analysis: and (3) according to the test scheme, switching on a stabilized voltage supply, and adjusting the voltage until the halogen lamp reaches 2856K. The height of the measured sample is adjusted by a laser collimator, so that the photometric axis of the sample and the photometric axis of the optical track are in the same horizontal plane. The eyepiece of the spectrum spectroradiometer aims at the center of a standard whiteboard or a reflective gray-scale test card, and the eyepiece and the objective lens are adjusted while observation is performed, so that an aperture diaphragm in the instrument is clearly visible, and the surface of a measured object is clearly imaged. After the instrument is preheated for 30 minutes, an automatic rotation angle system is used for adjusting the angle of 45 degrees between the sample rack and the measuring axis of the optical track, and measurement is started. The standard white board is measured firstly, then the brightness of each image on the reflective gray scale test card is measured sequentially, and then the reflective optical density value of each image of the reflective gray scale test card is calculated according to the brightness ratio of the standard white board and the reflective factor of the standard white board by using the calculation function of EXCEL. Experiments were performed on a TE-108 reflective gray-scale test card manufactured by Germany Image Engineering company, and the experimental data are shown in Table 1.
TABLE 1 optical density test data for reflective gray scale test cards
Note that: the colors are respectively 1 st, 2 nd and 3 … th orders from light to dark, and the first row is the upper row when the test card is upright; the indication error is expressed as an absolute value of the difference between the measured value and the factory value.
And (3) calculating the reflection optical density of each stage of the tested reflection gray scale test card by using the formulas (1) and (2). As can be seen from Table 1, the reflected optical density value measured by the device is relatively close to the factory value of the test card, the maximum value of the indicating value error is 0.02, and the test effect is satisfactory.
The reflective gray-scale test card is used as a tool for detecting the image fineness, and the optimal design state is that the optical density of each level is in a linear relation. Thus, the print quality of the test card can be evaluated by the linearity of the optical density, which is usually a method using a linear regression equation. By utilizing the chart function of EXCEL, a scatter diagram of optical density is drawn first, and then a linear regression equation and the correlation coefficient of the equation are obtained by utilizing the calculation function of EXCEL. The correlation coefficients of the optical density linearity and the linear regression equation of the tested reflective gray scale test card are shown in fig. 4.
As can be seen from fig. 4, the linear regression equation of the optical density parameter of the tested reflective gray-scale test card is: y= 0.2035x-0.2169, the square of the correlation coefficient of the regression equation is: r2= 0.9261. The square of R is in the range of 0 to 1, and the closer the value is to 1, the better the linearity is. As can be seen from the numerical value, the optical density parameters of the card are basically in linear relation, and the linearity effect is satisfactory.
Verification of test results:
to verify the reliability of the calibration results, the measurement data is verified. Because the expansion uncertainty of the measured result marked in the tested reflective gray scale test card instruction book is as follows: u=0.02, k=2. The expansion uncertainty evaluated in this experiment was: u=0.03, k=2. A transfer comparison method is used to verify the measurement results. If the measurement result meets the formula 6, the measurement result is accurate and reliable.
Wherein: y is lab -the present laboratory measurement;
y ref -the reflective gray scale test card leaves the factory for optical density value;
U lab -extended uncertainty of the present laboratory measurement;
U ref -the extended uncertainty of the measurement results given by the manufacturer.
Substituting the measurement data in table 1 into equation 3 leads to the conclusion shown in table 2 below.
TABLE 2 conclusion of the test
Aiming at the magnitude traceability problem of the reflective gray scale test card, the invention designs a test scheme and builds an optical platform by utilizing devices such as a halogen lamp, a light track, a diaphragm, a spectrum spectroradiometer and the like existing in a laboratory based on the actual use environment of a tested sample. The reflection density of each image of the tested card is tested, and the idea of examining the printing quality of the tested card by using the linearity of the test data is provided. And the accuracy and reliability of the test data are verified by a transfer comparison method. The scheme solves the defects of the traditional optical density contact measurement, and can be used for special difficult contact measurement and small-area optical density measurement in the industries of printing, photography, pharmacy and the like.
Claims (2)
1. The measuring method of the reflective gray-scale test card is characterized by comprising the following steps of:
s1: build reflective gray scale test card test platform
1) A light source system and a sample rack are arranged on a light track, and the light source system and the sample rack are ensured to be on a straight line; a diaphragm is arranged between the light source system and the sample frame, so that light rays can be clearly irradiated on the sample to be measured; the method is carried out in a darkroom; the light source system adopts a halogen lamp; a collimator is additionally arranged around the halogen lamp; an ultraviolet/infrared cut-off filter is additionally arranged in the light source system so as to eliminate the influence of ultraviolet light and near infrared light;
2) Constructing a corner system of 45/0 geometric measurement condition, which is used for controlling the rotation of the measurement wall and the sample rack to form an included angle of 45 degrees with the light track;
3) A spectral spectroradiometer is arranged on the measuring wall and used as a receiving unit for receiving optical signals reflected by the to-be-measured reflective gray scale test card and the standard white board;
s2: through the reflective gray-scale test card test platform, the brightness value L of the reflective gray-scale test card to be tested is measured 1 And standard whiteboard brightness value L 2 ;
S3: calculating a light reflection factor R of the reflective gray-scale test card to be tested;
wherein R is S Light reflection factor for a known standard whiteboard;
s4: calculating the reflection optical density D of each step of the reflection type gray scale test card to be tested: d= -log r;
s5: and drawing a scatter diagram of the optical density, solving a linear regression equation and a correlation coefficient of the equation, and judging the linearity of the optical density according to the square value of the correlation coefficient, thereby judging the printing quality of the reflective gray scale test card.
2. The method for measuring a reflective gray-scale test card according to claim 1, wherein S2 is specifically: the height of the measured sample is adjusted by a laser collimator, so that the photometry axis of the sample and the photometry axis of the optical track are positioned in the same horizontal plane; the eyepiece of the spectrum spectroradiometer aims at the center of a standard whiteboard or a reflective gray scale test card, and the eyepiece and the objective lens are adjusted while observation is carried out, so that an aperture diaphragm in the instrument is clearly visible, and the surface of a measured object is clearly imaged; after the instrument is preheated, adjusting the sample frame to form a 45-degree angle with the measuring axis of the optical track through a corner system, and starting measurement; the standard white board is measured first, and then the brightness of each image on the reflective gray-scale test card to be tested is measured in sequence.
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