CN102081037A - Method for testing coating infrared emittance with spectral reflectance method - Google Patents
Method for testing coating infrared emittance with spectral reflectance method Download PDFInfo
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- CN102081037A CN102081037A CN2009102179570A CN200910217957A CN102081037A CN 102081037 A CN102081037 A CN 102081037A CN 2009102179570 A CN2009102179570 A CN 2009102179570A CN 200910217957 A CN200910217957 A CN 200910217957A CN 102081037 A CN102081037 A CN 102081037A
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Abstract
The invention relates to a method for testing coating infrared emittance with a spectral reflectance method, which is characterized in that light emitted by an infrared source is divided into two paths by a splitter, wherein one path serves as a measuring light beam, and the other path serves as a reference light beam; a standard sample with the known infrared reflectivity rho is placed in a test light path to store and record the measurement value rho' of a grating spectrum instrument; the sample to be tested, which is sprayed, is placed in the test light path; the plane of the sample to be tested and the incident light direction form an angle of 45 degrees, and the measurement value rho of the grating spectrum instrument is stored and recorded; a reflectivity spectrum is obtained by the grating spectrum instrument; and according to alpha=rho0/rho0', 1-rho*alpha is obtained by calculation and is the infrared reflectivity of the surface of the sample to be measured. The test device is simple, and the test condition is wide; errors brought by reflection on surrounding irradiation by a tested sample can be eliminated, the sample with low emissivity can be measured, and emissivity at different temperatures can be measured; and thus the method is a practical test method.
Description
Technical field
The present invention relates to a kind of method of utilizing spectral reflectivity method testing coating infrared emittance, be particularly related to a kind of infrared emittance of transmission spectrum method testing coating, estimate the infrared property of coating, and then the method for reflection coating infrared camouflage performance, technical field of measurement and test belonged to.
Background technology
According to different test philosophies, usually the emissivity measurement method is divided into calorimetry, reflectivity method, radiated energy method and multi-wavelength mensuration etc.; Some proving installation complex structures, and it is consistent with the sample temperature to be strict with standard model, need the heating standard model, the test condition harshness, can not eliminate the error of the reflection of ambient radiation being brought because of sample, some cannot measure the low sample of emissivity, also cannot measure the emissivity under the different temperatures, does not newly see research and the bibliographical information identical with this method both at home and abroad by looking into.
Summary of the invention
The object of the present invention is to provide a kind of method of utilizing spectral reflectivity method testing coating infrared emittance, it can be fast, simply, testing coating infrared emittance exactly, estimate the infrared property of coating, instruct the design that is coated with film system, the infrared camouflage of reaction coating.
Technical scheme of the present invention is achieved in that the method for utilizing spectral reflectivity method testing coating infrared emittance, it is characterized in that: test macro is made up of infrared light supply, multi-functional echelette spectroanalysis instrument, computing machine; Wherein echelette spectrometer analysis instrument is made up of grating monochromator, receiving element, scanning system, electron-amplifier, A/D collecting unit, computing machine; The entrance slit of spectro-metre, the exit slit value of being slit, width range 0-2mm is adjustable continuously;
The concrete steps that detect are as follows: the light that infrared light supply sends is divided into two-way behind beam-splitter, the one tunnel as measuring beam; Another road is as the reference light beam; With known infrared reflectivity ρ
0Standard model be placed in the optical system for testing, the measured value of stored record grating spectrum view is designated as ρ
0'; To be placed in the optical system for testing through the good testing sample of spraying, testing sample plane and incident light direction are 45 degree places again, and the measured value of stored record grating spectrum view is designated as ρ; The reflectance spectrum that obtains by grating spectrograph is according to α=ρ
0/ ρ '
0, calculate the infrared emittance that 1-ρ * α is the testing sample surface.
Its proving installation of good effect of the present invention is simple, and it is consistent with the sample temperature not to be strict with standard model, also need not heat standard model, test condition is loose, can eliminate the error of the reflection of ambient radiation being brought because of sample, can measure the low sample of emissivity, also can measure the emissivity under the different temperatures, be a kind of practical method of testing.
Description of drawings:
The light path principle figure that Fig. 1 detects for infrared stealth coating infrared emittance of the present invention
Embodiment:
The present invention will be further described below in conjunction with drawings and Examples; Utilize the method for spectral reflectivity method testing coating infrared emittance, it is characterized in that: test macro is made up of infrared light supply, multi-functional echelette spectroanalysis instrument, computing machine; Wherein echelette spectrometer analysis instrument is made up of grating monochromator, receiving element, scanning system, electron-amplifier, A/D collecting unit, computing machine; The entrance slit of spectro-metre, the exit slit value of being slit, width range 0-2mm is adjustable continuously;
The concrete steps that detect are as follows: the light that infrared light supply sends is divided into two-way behind beam-splitter, the one tunnel as measuring beam; Another road is as the reference light beam; With known infrared reflectivity ρ
0Standard model be placed in the optical system for testing, the measured value of stored record grating spectrum view is designated as ρ
0'; To be placed in the optical system for testing through the good testing sample of spraying, testing sample plane and incident light direction are 45 degree places again, and the measured value of stored record grating spectrum view is designated as ρ; The reflectance spectrum that obtains by grating spectrograph is according to α=ρ
0/ ρ '
0, calculate the infrared emittance that 1-ρ * α is the testing sample surface.
As shown in Figure 1, at first measure the reflectivity of sample under the normal temperature, to light transmissive material, measure the transmissivity of sample again, deduct (reflectivity+transmissivity) with 100% (or 1.0), rate is absorbed; According to Kirchhoff's law, emissivity equals absorptivity, then can be by calculating material emissivity at normal temperatures;
The light that infrared light supply sends is divided into two-beam by an infrared beamsplitter, and a branch of conduct is surveyed the intensity of infrared incident light source with reference to light by the infrared light power meter; Another bundle incides the 1# print and is received by an infrared spectrometer by sample reflection back; Because sample is non-transmission-type, therefore only need can try to achieve the infrared emittance of sample with the infrared reflectivity of infrared spectrometer 1 measuring samples; Detected sample board plane and incident light direction are 45 degree and place;
When a branch of modulated light incided nontransparent sample surface, receiver received only the luminous energy P=ρ * P of measured object surface reflection
0Filtering self radiation on measured object surface and the radiation effect of reflect ambient; Utilize the standard model of a known reflectivity ρ 0, if the reflectivity that spectro-metre measures is ρ
0', make α=ρ
0/ ρ '
0, changing sample again into, the apparatus measures value is ρ, then 1-ρ * α is the emissivity of this material surface.
According to top step, continue to measure 2#, 3#, prints such as 4#......; Be divided into two-beam for the light that infrared light supply sends by an infrared beamsplitter as Fig. 1, a branch of conduct is surveyed the intensity of infrared incident light source with reference to light by the infrared light power meter; Another bundle incides testing sample and is received by an infrared spectrometer by sample reflection back.Because sample is non-transmission-type, therefore only need can try to achieve the infrared emittance of sample with the infrared reflectivity of infrared spectrometer 1 measuring samples.In the experiment, detected sample board plane and incident light direction are 45 degree and place.
When a branch of modulated light incided nontransparent measured object surface, receiver received only the luminous energy P=ρ * P of measured object surface reflection
0Its filtering self radiation on measured object surface and the radiation effect of reflect ambient.Utilize a known reflectivity ρ
0Standard model, if the reflectivity that spectro-metre measures is ρ
0', make α=ρ
0/ ρ '
0, changing sample again into, the apparatus measures value is ρ, then 1-ρ * α is the emissivity of this material surface.
Claims (1)
1. utilize the method for spectral reflectivity method testing coating infrared emittance, it is characterized in that: test macro is made up of infrared light supply, multi-functional echelette spectroanalysis instrument, computing machine; Wherein echelette spectrometer analysis instrument is made up of grating monochromator, receiving element, scanning system, electron-amplifier, A/D collecting unit, computing machine; The entrance slit of spectro-metre, the exit slit value of being slit, width range 0-2mm is adjustable continuously;
The concrete steps that detect are as follows: the light that infrared light supply sends is divided into two-way behind beam-splitter, the one tunnel as measuring beam; Another road is as the reference light beam; With known infrared reflectivity ρ
0Standard model be placed in the optical system for testing, the measured value of stored record grating spectrum view is designated as ρ '
0To be placed in the optical system for testing through the good testing sample of spraying, testing sample plane and incident light direction are 45 degree places again, and the measured value of stored record grating spectrum view is designated as ρ; The reflectance spectrum that obtains by grating spectrograph is according to α=ρ
0/ ρ '
0, calculate the infrared emittance that 1-ρ * α is the testing sample surface.
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Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103063312A (en) * | 2012-12-29 | 2013-04-24 | 南京理工大学 | Measuring system and method for measuring object emissivity |
CN104062097A (en) * | 2014-06-30 | 2014-09-24 | 中国科学院西安光学精密机械研究所 | Device and method for calibrating return light characteristic of corner reflector |
CN104749127A (en) * | 2015-03-19 | 2015-07-01 | 中国计量学院 | Infrared textile emissivity measuring device and method |
CN106996922A (en) * | 2016-01-25 | 2017-08-01 | 杭州海康威视数字技术股份有限公司 | A kind of target object infrared reflectivity measurement method and device |
CN110763657A (en) * | 2019-11-20 | 2020-02-07 | 江苏赛诺格兰医疗科技有限公司 | Photoelectric digital conversion system for reflective material reflectivity test system |
CN111103228A (en) * | 2018-10-26 | 2020-05-05 | 宁波方太厨具有限公司 | Method for testing anti-discoloration protection effect of high-temperature-resistant coating on stainless steel surface |
CN111579488A (en) * | 2020-06-16 | 2020-08-25 | 烟台艾睿光电科技有限公司 | Method, device and equipment for measuring surface emissivity of object and storage medium |
CN112945867A (en) * | 2021-02-03 | 2021-06-11 | 中国测试技术研究院 | Reflection type gray scale test card measuring system and method |
CN112946014A (en) * | 2021-01-29 | 2021-06-11 | 中国人民解放军国防科技大学 | Method for rapidly evaluating infrared stealth performance of high-temperature stealth component based on energy contrast method |
CN113884464A (en) * | 2021-09-27 | 2022-01-04 | 西安空天能源动力智能制造研究院有限公司 | Coating waveband emissivity external field measuring method based on thermal infrared imager |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1059205A (en) * | 1991-05-30 | 1992-03-04 | 中国科学院上海技术物理研究所 | A kind of method of emissivity in-site measurement |
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2009
- 2009-11-30 CN CN2009102179570A patent/CN102081037A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1059205A (en) * | 1991-05-30 | 1992-03-04 | 中国科学院上海技术物理研究所 | A kind of method of emissivity in-site measurement |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103063312A (en) * | 2012-12-29 | 2013-04-24 | 南京理工大学 | Measuring system and method for measuring object emissivity |
CN104062097A (en) * | 2014-06-30 | 2014-09-24 | 中国科学院西安光学精密机械研究所 | Device and method for calibrating return light characteristic of corner reflector |
CN104749127A (en) * | 2015-03-19 | 2015-07-01 | 中国计量学院 | Infrared textile emissivity measuring device and method |
CN106996922A (en) * | 2016-01-25 | 2017-08-01 | 杭州海康威视数字技术股份有限公司 | A kind of target object infrared reflectivity measurement method and device |
CN106996922B (en) * | 2016-01-25 | 2019-08-23 | 杭州海康威视数字技术股份有限公司 | A kind of target object infrared reflectivity measurement method and device |
CN111103228A (en) * | 2018-10-26 | 2020-05-05 | 宁波方太厨具有限公司 | Method for testing anti-discoloration protection effect of high-temperature-resistant coating on stainless steel surface |
CN111103228B (en) * | 2018-10-26 | 2021-07-16 | 宁波方太厨具有限公司 | Method for testing anti-discoloration protection effect of high-temperature-resistant coating on stainless steel surface |
CN110763657A (en) * | 2019-11-20 | 2020-02-07 | 江苏赛诺格兰医疗科技有限公司 | Photoelectric digital conversion system for reflective material reflectivity test system |
CN110763657B (en) * | 2019-11-20 | 2022-05-13 | 江苏赛诺格兰医疗科技有限公司 | Photoelectric digital conversion system for reflective material reflectivity test system |
CN111579488A (en) * | 2020-06-16 | 2020-08-25 | 烟台艾睿光电科技有限公司 | Method, device and equipment for measuring surface emissivity of object and storage medium |
CN112946014A (en) * | 2021-01-29 | 2021-06-11 | 中国人民解放军国防科技大学 | Method for rapidly evaluating infrared stealth performance of high-temperature stealth component based on energy contrast method |
CN112945867A (en) * | 2021-02-03 | 2021-06-11 | 中国测试技术研究院 | Reflection type gray scale test card measuring system and method |
CN113884464A (en) * | 2021-09-27 | 2022-01-04 | 西安空天能源动力智能制造研究院有限公司 | Coating waveband emissivity external field measuring method based on thermal infrared imager |
CN113884464B (en) * | 2021-09-27 | 2024-04-26 | 西安空天能源动力智能制造研究院有限公司 | Coating band emissivity outfield measurement method based on thermal infrared imager |
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Application publication date: 20110601 |